Passive element measurement system and method

Abstract

A passive component measuring system comprises a feeding hopper, a feeding track, a receiving platform, a pick-and-place head module, a switcher and a computing device. The feeding hopper is used for containing a passive element to be detected. The feeding track is used for conveying the passive element to a to-be-taken position. And the receiving platform is used for collecting the tested passive elements. The pick-and-place head module comprises a first area suction nozzle used for sucking the passive component from the to-be-taken position and placing the passive component in the measuring area, and a second area suction nozzle used for sucking the passive component from the measuring area and placing the passive component on the material receiving platform. The switcher is used for switching the measuring instrument to measure the passive element arranged in the measuring area. The computing device is used for controlling the pick-and-place head module to suck and place the passive element, and controlling the switcher to switch the measuring instrument to measure the passive element so as to obtain an electrical measurement result. According to the invention, the electrical property of the passive element can be more effectively traced when the electrical property measurement item of the passive element is invalid and the electrical property measurement result is abnormal, and the labor cost for manual electrical property measurement is saved.

Description

Technical Field

[0001] This invention relates to an inspection system and method, and more particularly to an inspection system and method for an optical element assembly. Background Technology

[0002] Electronic components can be divided into two categories: active electronic components and passive electronic components. The difference between the two lies in whether or not they require a power source. Active electronic components include transistors and diodes, while passive electronic components include resistors, capacitors, and inductors. Among these passive electronic components, capacitors have the largest market share. They can be further divided into ceramic capacitors, aluminum capacitors, and tantalum capacitors. Currently, the most popular type is the MLCC (multi-layer ceramic capacitor), also known as a surface mount capacitor.

[0003] Before being shipped from the manufacturing plant, multilayer ceramic capacitors require electrical sampling and testing by factory operators. However, the current method of manually sampling and testing electrical components has several drawbacks, including the need for a large workforce and a large workspace, the time-consuming nature of insulation resistance measurements, the difficulty in distinguishing and tracing electrical failures when withstand voltage measurements fail, the need for manual rearrangement of failed samples, the lack of a sample-to-electrical-data comparison method, and concerns about sample contamination. Therefore, overcoming these drawbacks in the measurement of passive components has become an important issue. Summary of the Invention

[0004] The purpose of this invention is to provide a passive component measurement system and method, which automates the measurement of the electrical properties of passive components through a pick-and-place head module, and establishes a sample electrical property comparison table based on the electrical measurement results. Furthermore, it can more effectively trace the electrical properties of passive components when electrical measurement items fail or the results are abnormal. This overcomes the disadvantages of current manual electrical measurement methods, such as the need for large manpower and workspace, time-consuming insulation impedance measurements, difficulty in distinguishing and tracing electrical properties when withstand voltage measurements fail, the need for manual rearrangement of failed samples, lack of sample-to-electrical-data comparison mode, and concerns about sample contamination.

[0005] One aspect of the present invention provides a passive component measurement system, comprising an infeed funnel, a feeding track, a receiving platform, a pick-and-place head module, a switcher, and a computing device. The infeed funnel is configured to hold at least one passive component to be tested. The feeding track is configured to transport the passive components to be tested from the infeed funnel to a pick-up position on the pick-and-place head travel track. The receiving platform is configured to collect the passive components after testing. The pick-and-place head module includes a first-zone nozzle and a second-zone nozzle, wherein the first-zone nozzle is configured to pick up the passive components from the pick-up position and place them in a measurement area, and the second-zone nozzle is configured to pick up the passive components from the measurement area and place them on the receiving platform. The switcher is configured to switch at least one measuring instrument to measure the passive components placed in the measurement area. The computing device is coupled to the pick-and-place head module, the receiving platform and the switcher, and is configured to control the pick-and-place head module to pick up and place these passive components, and to control the switcher to switch these measuring instruments to measure these passive components in order to obtain at least one electrical measurement result.

[0006] In some embodiments, each of the at least one passive element is a multi-layer ceramic capacitor (MLCC).

[0007] In some embodiments, the computing device is also configured to control the receiving platform to use a receiving tray or a reel-to-reel tape platform to collect these passive components after testing.

[0008] In some embodiments, the at least one measuring instrument includes at least one of a capacitance tolerance specification and loss angle measuring instrument, an insulation resistance measuring instrument, and a withstand voltage measuring instrument.

[0009] In some embodiments, the computing device controls a switch to switch the measuring instruments to measure the passive components according to a sampling measurement program.

[0010] In some embodiments, the computing device includes a user interface (UI) configured to display electrical measurement results of the passive components measured using the measuring instruments.

[0011] In some embodiments, the computing device is further configured to create a sample electrical comparison table based on the electrical measurements corresponding to each of the passive elements.

[0012] Another aspect of the present invention provides a method for measuring passive components, comprising the following steps: a computing device controlling a pick-and-place head module to pick up at least one passive component from a position to be picked up on a pick-and-place head travel track, the pick-and-place head module comprising a first area suction nozzle and a second area suction nozzle, wherein the first area suction nozzle is configured to pick up the passive components from the position to be picked up and place them in a measurement area, and the second area suction nozzle is configured to pick up the passive components from the measurement area and place them in a receiving platform; and the computing device controlling a switch to switch at least one measuring instrument to measure the passive components placed in the measurement area to obtain at least one electrical measurement result.

[0013] In some embodiments, the computing device is further configured to control the receiving platform to use a receiving tray or roll-to-roll tape platform to collect these passive components after testing.

[0014] In some embodiments, the computing device is further configured to create a sample electrical comparison table based on the electrical measurements corresponding to each of the passive elements. Attached Figure Description

[0015] To make the above and other objects, features, advantages and embodiments of the present invention more apparent and understandable, the accompanying drawings are described below:

[0016] Figure 1 This is a schematic diagram of the architecture of a passive component measurement system according to an embodiment of the present invention;

[0017] Figure 2 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0018] Figure 3 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0019] Figure 4 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0020] Figure 5 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0021] Figure 6 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0022] Figure 7 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0023] Figure 8 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0024] Figure 9 This is a top view of the measurement area according to an embodiment of the present invention;

[0025] Figure 10 This is a top view of the measurement area according to an embodiment of the present invention;

[0026] Figure 11 This is a schematic diagram of a user interface according to an embodiment of the present invention;

[0027] Figure 12 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0028] Figure 13 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0029] Figure 14 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0030] Figure 15 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0031] Figure 16 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0032] Figure 17 This is a schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention;

[0033] Figure 18 A schematic diagram of the operation procedure of the pick-and-place head module according to an embodiment of the present invention; and

[0034] Figure 19 This is a flowchart of a passive component measurement method according to an embodiment of the present invention. Detailed Implementation

[0035] The embodiments of the present invention will now be discussed in detail. It will be understood that the embodiments provide many applicable concepts that can be implemented in a wide variety of specific contexts. The discussed and disclosed embodiments are for illustrative purposes only and are not intended to limit the scope of the invention.

[0036] It is understood that although terms such as "first" and "second" may be used in this invention to describe various elements, these terms should not be limiting of these elements. These terms are used only to distinguish one element from another.

[0037] Figure 1This is a schematic diagram of the architecture of a passive component measurement system 100 according to an embodiment of the present invention. The passive component measurement system 100 is performed on a workbench B and includes an infeed funnel 104, a feeding track 106, a receiving platform 128, a pick-and-place head module 134, a switcher 120, and a computing device 112. The infeed funnel 104 is used to hold at least one passive component P to be tested. In one embodiment of the present invention, the passive component P is a multi-layer ceramic capacitor (MLCC). The feeding track 106 is used to transport the passive components P to be tested contained in the infeed funnel 104 to the pick-and-place head travel track R1 to the pick-up position. Figure 1(Not shown in the diagram), this position to be picked up can also be considered as the starting position of the pick-and-place head travel track R1. In one embodiment of the invention, the feeding track 106 is a linear vibration feeding track. The receiving platform 128 is used to collect the passive components P that have been tested. The pick-and-place head module 134 includes a first zone nozzle 134-1 and a second zone nozzle 134-2, wherein the first zone nozzle 134-1 is used to pick up the passive components P from the position to be picked up and place them in the measurement area M, and the second zone nozzle 134-2 is used to pick up the passive components P from the measurement area M and place them in the receiving platform 128. The switcher 120 is used to switch at least one measuring instrument to measure the passive components P in the measurement area M, wherein the measuring instruments include at least one of the following: capacitance tolerance specification and loss angle measuring instrument 114, insulation resistance measuring instrument 116, and withstand voltage measuring instrument 118. The computing device 112 is coupled to the pick-and-place head module 134, the receiving platform 128 and the switch 120 to control the pick-and-place head module 134 to pick up and place the passive components P, and to control the switch 120 to switch the measuring instruments to measure the passive components P, so as to obtain at least one electrical measurement result for each passive component P. Generally, computing device 112 includes a processor and memory, wherein the processor may be a central processing unit (CPU), graphics processing unit (GPU), microcontroller unit (MCU), microprocessor, system-on-chip (SoC), digital signal processor (DSP), application-specific integrated circuit (ASIC), programmable logic controller (PLC), or a combination thereof, but is not limited thereto; and the memory may be random access memory (RAM), read-only memory (ROM), flash memory, solid-state drive (SSD), or other similar components or combinations thereof, but is not limited thereto.

[0038] It should be noted that, Figure 1 The system operation of the pick-and-place head module 134 illustrated in the figure will be Figures 2-8 A detailed explanation will be provided; it should also be noted that, Figure 1 The system operation of the measurement area M shown in the figure will be Figures 9-10 Please provide a detailed explanation.

[0039] In one embodiment of the invention, the computing device 112 is further configured to control the receiving platform 128 to use a large receiving tray to collect the passive components P that have completed testing. Specifically, the passive components P that have completed electrical measurements are moved to the receiving platform 128 by the pick-and-place module 134 for collection, and the collection method is to sequentially attach the passive components P to the large receiving tray. In another embodiment of the invention, the computing device 112 is further configured to control the receiving platform 128 to use a reel-to-reeltape platform to collect the passive components P that have completed testing. Specifically, the passive components P that have completed electrical measurements are moved to the receiving platform 128 by the pick-and-place module 134 for collection, and the collection method is to sequentially attach the passive components P row by row to the reel-to-reeltape platform, and the power delivered by the drive motor 126 to the reel 124 is used to collect the passive components P that have completed electrical measurements in a reeling mode on the travel track R2 of the receiving platform.

[0040] Figures 2-8 This is a schematic diagram of the operation procedure of the pick-and-place head module 134 according to an embodiment of the present invention. Figures 2-8 In the illustrated embodiment, the pick-and-place head module 134 includes a first zone suction nozzle 134-1 and a second zone suction nozzle 134-2, and the first zone suction nozzle 134-1 and the second zone suction nozzle 134-2 further include one or more suction nozzles. Figures 2-8 The illustration shows that the first zone suction nozzle 134-1 and the second zone suction nozzle 134-2 each contain 5 suction nozzles. At the beginning of the operation of the pick-and-place head module, the feeding track 106 feeds the material into the inlet funnel 104 (…). Figure 2 (Not shown in the diagram) The passive component P to be tested, contained within, is conveyed to the pick-up position W1 on the pick-up head travel track R1, and the number of these pick-up positions W1 must be the same as the number of nozzles individually present in the first zone nozzle 134-1 and the second zone nozzle 134-2. Figures 2-8 For example, the number of positions W1 to be taken is the same as the number of nozzles that each of the first zone nozzle 134-1 and the second zone nozzle 134-2 has, which is 5.

[0041] After the passive component P to be tested has been conveyed by the feeding track 106 to the position W1 to be picked up on the pick-up head travel track R1, the pick-up head module 134 will simultaneously lower the first zone suction nozzle 134-1 and the second zone suction nozzle 134-2, and the five suction nozzles of the first zone suction nozzle 134-1 will perform a suction action on the passive component P in the five positions W1 to be picked up, such as... Figure 3 drawn.

[0042] Next, the pick-and-place module 134 retracts the first zone suction nozzle 134-1 and the second zone suction nozzle 134-2. It can be observed that the five nozzles of the first zone suction nozzle 134-1 have successfully picked up the five passive components P that were originally placed in the waiting position W1, such as... Figure 4As illustrated. It should be noted that, since no passive element P is placed at any of the test positions W2 in the measurement area M at this time, although the pick-and-place head module 134 lowers the first zone suction nozzle 134-1 and the second zone suction nozzle 134-2 at the same time, the five nozzles of the second zone suction nozzle 134-2 do not perform a suction action in the measurement area M.

[0043] After the five passive components P to be tested are successfully picked up by the first zone suction nozzle 134-1, the pick-and-place head module 134 will simultaneously translate the first zone suction nozzle 134-1 and the second zone suction nozzle 134-2. The translation will stop when the first zone suction nozzle 134-1 is aligned with the measurement area M and the second zone suction nozzle 134-2 is aligned with the receiving platform 128. Figure 5 As illustrated. Specifically, the alignment of the first zone nozzle 134-1 with the measurement zone M means that one or more nozzles of the first zone nozzle 134-1 are aligned with one or more test positions W2 in the measurement zone M. The number of test positions W2 must be the same as the number of nozzles individually present in the first zone nozzle 134-1 and the second zone nozzle 134-2. Figures 2-8 For example, the number of test positions W2 is the same as the number of nozzles individually present in the first zone nozzle 134-1 and the second zone nozzle 134-2, which is 5. It should be noted that while the pick-and-place head module 134 is translating the first zone nozzle 134-1 and the second zone nozzle 134-2, the feeding track 106 will replenish the test positions W1, that is, refill the 5 test positions W2 with passive components P, so that the passive component measurement system 100 can repeatedly perform the passive component P picking procedure (performed by the pick-and-place head module 134), the electrical measurement procedure (performed by the switcher 120 switching the measuring instrument), and the receiving procedure (performed by the receiving platform 128).

[0044] Next, the pick-and-place module 134 lowers the first zone nozzle 134-1 and the second zone nozzle 134-2, and the five nozzles of the first zone nozzle 134-1 place the five passive components P into the five test positions W2, as shown. Figure 6 As illustrated. It should be noted that since the second zone suction nozzle 134-2 is not picking up any passive component P at this time, although the pick-and-place head module 134 lowers the first zone suction nozzle 134-1 and the second zone suction nozzle 134-2 at the same time, the second zone suction nozzle 134-2 is not placed on the receiving platform 128.

[0045] After placing the five passive components P to be tested at the five test positions W2, the pick-and-place module 134 retracts the first zone nozzle 134-1 and the second zone nozzle 134-2, as follows. Figure 7 As shown in the diagram. Next, the pick-and-place module 134 translates back to the starting position of the pick-and-place travel track R1, as... Figure 8As illustrated. Since each position W1 to be picked up has been previously filled with passive element P, the pick-and-place head module 134 can continue to perform the next round of picking up passive element P.

[0046] Figures 9-10 This is a top view of the measurement area M according to an embodiment of the present invention. (By observing...) Figure 9 It is known that the measurement area M has an upper probe 122-1 and a lower probe 122-2. After the pick-and-place module 134 places the five passive components P into the five test positions W2 in the measurement area M, the calculation device 112 controls the switch 120 to switch the measuring instrument (e.g., capacitance tolerance specification and loss angle measuring instrument 114, insulation impedance measuring instrument 116, or withstand voltage measuring instrument 118, etc., but not limited to these) according to the sampling measurement program to measure the five passive components P to be measured. Specifically, the upper probe 122-1 and the lower probe 122-2 will retract to clamp the five passive components P to be measured for electrical measurement, such as... Figure 10 As illustrated, the electrical measurements may include, for example, capacitance tolerance specifications and loss angle measurements, insulation resistance measurements, or withstand voltage measurements, but are not limited to these, and the order in which the electrical measurements are performed is also not restricted. It should be further noted that the upper probe 122-1 and lower probe 122-2 perform electrical measurements on the passive component P to be measured using a suspended clamp measurement method. Specifically, after the upper probe 122-1 and lower probe 122-2 are retracted to clamp the passive component P to be measured, the placement stage T of the measurement area M (refer to...) Figure 2 The device will be lowered to allow the passive component P under test to be suspended in the air for electrical measurement.

[0047] In one embodiment of the invention, the computing device 112 is further configured to establish a sample electrical property comparison table based on the electrical measurement results corresponding to each passive element P. Further, the computing device 112 also includes a user interface (UI) for displaying the electrical measurement results of the passive element P measured using a measuring instrument. Figure 11 As illustrated, the computing device 112 can display, via the user interface S, the passive components P on the receiving platform 128 whose electrical measurement results are normal and abnormal. Combined with the establishment of the sample electrical property comparison table and the implementation of the user interface S, the user of the passive component measurement system 100 can observe this sample electrical property comparison table established based on the electrical measurement results on the user interface S, which facilitates more effective tracing of the electrical properties of the passive component P when electrical measurement items fail or electrical measurement results are abnormal.

[0048] Figures 12-18 To continue Figures 2-8 A schematic diagram of the operation procedure of the pick-and-place head module. After translating back to the starting position of the pick-and-place head travel track R1, the pick-and-place head module 134 will prepare for the next round of the passive component P pick-up procedure, such as... Figure 12as shown ( Figure 12 and Figure 8 The state of the pick-and-place head module 134 shown is actually the same. The pick-and-place head module 134 simultaneously lowers the first zone suction nozzle 134-1 and the second zone suction nozzle 134-2. The five nozzles of the first zone suction nozzle 134-1 pick up the passive components P in the five positions W1 to be picked up, and the five nozzles of the second zone suction nozzle 134-2 pick up the passive components P (whose electrical measurements have been completed) in the five positions W2 to be measured in the measurement area M. Figure 13 drawn.

[0049] Next, the pick-and-place module 134 retracts the first zone nozzle 134-1 and the second zone nozzle 134-2. It can be observed that the five nozzles of the first zone nozzle 134-1 have successfully picked up the five passive components P originally placed at the waiting position W1, and the five nozzles of the second zone nozzle 134-2 have successfully picked up the five passive components P originally placed at the test position W2. Figure 14 drawn.

[0050] After the five passive components P to be tested are successfully picked up by the first zone suction nozzle 134-1 and the five passive components P that have been measured are successfully picked up by the second zone suction nozzle 134-2, the pick-and-place head module 134 will simultaneously translate the first zone suction nozzle 134-1 and the second zone suction nozzle 134-2. The translation will stop when the first zone suction nozzle 134-1 is aligned with the measurement area M and the second zone suction nozzle 134-2 is aligned with the receiving platform 128. Figure 15 As illustrated. Specifically, the alignment of the first zone nozzle 134-1 with the measurement zone M means that one or more nozzles of the first zone nozzle 134-1 are aligned with one or more test positions W2 in the measurement zone M. The number of test positions W2 must be the same as the number of nozzles individually present in the first zone nozzle 134-1 and the second zone nozzle 134-2. Figures 12-18 For example, the number of test positions W2 is the same as the number of nozzles individually present in the first zone nozzle 134-1 and the second zone nozzle 134-2, which is 5. It should be noted that while the pick-and-place head module 134 is translating the first zone nozzle 134-1 and the second zone nozzle 134-2, the feeding track 106 will replenish the test positions W1, that is, refill the 5 test positions W2 with passive components P, so that the passive component measurement system 100 can repeatedly perform the passive component P picking procedure (performed by the pick-and-place head module 134), the electrical measurement procedure (performed by the switcher 120 switching the measuring instrument), and the receiving procedure (performed by the receiving platform 128).

[0051] Next, the pick-and-place module 134 lowers the first zone suction nozzle 134-1 and the second zone suction nozzle 134-2. The five nozzles of the first zone suction nozzle 134-1 place the five passive components P into the five test positions W2, and the five nozzles of the second zone suction nozzle 134-2 attach the five passive components P to the receiving platform 128. Figure 16 drawn.

[0052] After placing the five passive components P to be tested at the five test positions W2 and attaching the five measured passive components P to the receiving platform 128, the pick-and-place head module 134 retracts the first zone suction nozzle 134-1 and the second zone suction nozzle 134-2, as follows. Figure 17 As shown in the diagram. Next, the pick-and-place module 134 translates back to the starting position of the pick-and-place travel track R1, as... Figure 18 As illustrated. Since each position W1 to be picked up has been previously filled with passive element P, the pick-and-place head module 134 can continue to perform the next round of picking up passive element P.

[0053] Figure 19 This is a flowchart of a passive component measurement method 1900 according to an embodiment of the present invention, which can be applied to, for example... Figure 1 The illustrated passive component measurement system 100 or other similar system includes a feed hopper 104, a feed track 106, a receiving platform 128, a pick-and-place head module 134, a switcher 120, and a computing device 112. The passive component measurement method 1900 includes steps S1910 to S1920, which are described in the following paragraphs. Figures 1-18 The content explains the implementation methods for each step.

[0054] Step S1910: The computing device controls the pick-and-place head module to pick up the passive component from the position to be picked up on the pick-and-place head travel track. The pick-and-place head module includes a first-zone suction nozzle and a second-zone suction nozzle. The first-zone suction nozzle is configured to pick up the passive component from the position to be picked up and place it in the measuring area. The second-zone suction nozzle is configured to pick up the passive component from the measuring area and place it in the receiving platform. For an explanation of this step, please refer to, for example... Figure 1 The operation of each component in the passive component measurement system 100 shown in the diagram will not be described in detail here.

[0055] Step S1920: The computing device controls the switch to switch the measuring instrument to measure the passive components in the measurement area, thereby obtaining electrical measurement results. For an explanation of this step, please refer to, for example... Figure 1 The operation of each component in the passive component measurement system 100 shown in the diagram will not be described in detail here.

[0056] In summary, the passive component measurement system and method of the present invention achieves automated measurement of the electrical properties of passive components through a pick-and-place head module, and establishes a sample electrical property comparison table based on the electrical measurement results. Furthermore, it can more effectively trace the electrical properties of passive components when electrical measurement items fail or the electrical measurement results are abnormal. It also overcomes the disadvantages of using manual electrical measurement, such as requiring a large amount of manpower and a large working space, time-consuming insulation impedance measurement, difficulty in distinguishing and tracing electrical properties when withstand voltage measurement fails, the need for manual rearrangement of failed samples when electrical measurement items fail, lack of sample-to-electrical-data comparison mode, and concerns about sample contamination.

[0057] Although the present invention has been disclosed above by way of embodiments, it is not intended to limit the scope of the present invention. Any person skilled in the art can make various changes, substitutions and modifications without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention shall be determined by the appended claims.

[0058] [Symbol Explanation]

[0059] 100: Passive Component Measurement System

[0060] 104: Feed funnel

[0061] 106: Feeding Track

[0062] 112: Computing device

[0063] 114: Capacitance tolerance specifications and loss angle measuring instruments

[0064] 116: Insulation resistance measuring instrument

[0065] 118: Withstand pressure measuring instrument

[0066] 120: Switcher

[0067] 122-1: Upper probe

[0068] 122-2: Lower probe

[0069] 124: Scroll

[0070] 126: Drive motor

[0071] 128: Receiving Platform

[0072] 134: Pick-up and Placement Head Module

[0073] 134-1: Zone 1 Suction Nozzle

[0074] 134-2: Second Zone Suction Mouthpiece

[0075] 1900: Passive Component Measurement Methods

[0076] S1910, S1920: Steps

[0077] B: Work Desk

[0078] M: Measurement area

[0079] P: Passive component

[0080] R1: Header travel rail

[0081] R2: Material receiving platform travel track

[0082] S: User Interface

[0083] T: Placement platform

[0084] W1: Location to be retrieved

[0085] W2: Location to be tested.

Claims

1. A passive component measurement system, characterized in that, Include: A feed funnel, configured to hold at least one passive element to be tested; A feeding track is configured to transport the at least one passive element to be tested, contained in the feed funnel, to the pick-up position on the pick-up head travel track. A receiving platform configured to collect at least one passive component after testing; The pick-and-place head module includes a first-area suction nozzle and a second-area suction nozzle, wherein the first-area suction nozzle is configured to pick up the at least one passive component from the pick-up position and place it in the measuring area, and the second-area suction nozzle is configured to pick up the at least one passive component from the measuring area and place it in the receiving platform. A switcher configured to switch at least one measuring instrument to measure at least one passive element located in the measuring area; A computing device, coupled to the pick-and-place head module, the receiving platform and the switcher, is configured to control the pick-and-place head module to pick up and place the at least one passive component, and to control the switcher to switch the at least one measuring instrument to measure the at least one passive component, so as to obtain at least one electrical measurement result.

2. The passive component measurement system according to claim 1, characterized in that, Each of the at least one passive element is a multilayer ceramic capacitor.

3. The passive component measurement system according to claim 1, characterized in that, The computing device is also configured to control the receiving platform to collect the at least one passive element after testing using a receiving tray or a roll-to-roll tape platform.

4. The passive component measurement system according to claim 1, characterized in that, The at least one measuring instrument includes at least one of the following: a capacitance tolerance specification and loss angle measuring instrument, an insulation resistance measuring instrument, and a withstand voltage measuring instrument.

5. The passive component measurement system according to claim 1, characterized in that, The computing device controls the switcher to switch the at least one measuring instrument to measure the at least one passive element according to the sampling measurement program.

6. The passive component measurement system according to claim 1, characterized in that, The computing device includes: The user interface is configured to display the results of at least one electrical measurement of the at least one passive component using the at least one measuring instrument.

7. The passive component measurement system according to claim 1, characterized in that, The computing device is also configured to establish a sample electrical comparison table based on the at least one electrical measurement result corresponding to each of the at least one passive element.

8. A method for measuring passive components, characterized in that, Include: The pick-and-place head module, controlled by a computing device, picks up at least one passive component from the pick-and-place head travel track at the position to be picked up. The pick-and-place head module includes a first area suction nozzle and a second area suction nozzle. The first area suction nozzle is configured to pick up the at least one passive component from the position to be picked up and place it in the measuring area. The second area suction nozzle is configured to pick up the at least one passive component from the measuring area and place it in the receiving platform. as well as A computer-controlled switch switches at least one measuring instrument to measure at least one passive component placed in the measuring area, so as to obtain at least one electrical measurement result.

9. The passive component measurement method according to claim 8, characterized in that, The computing device is also configured to control the receiving platform to collect the at least one passive element after testing using a receiving tray or a roll-to-roll tape platform.

10. The passive component measurement method according to claim 8, characterized in that, The computing device is also configured to establish a sample electrical comparison table based on the at least one electrical measurement result corresponding to each of the at least one passive element.

Images