Switch loop resistance testing method based on environment temperature compensation

Abstract

The invention discloses a switch loop resistance testing method based on environment temperature compensation, which relates to the technical field of loop resistance testing, and comprises the following steps of: performing analysis and calculation by combining an environment compensation index of a switch loop and an inhibition index of environment influence to obtain a dynamic compensation coefficient of the environment temperature; the initial resistance value of the switch loop is dynamically adjusted according to the dynamic compensation coefficient; the environment compensation index is calculated through a formula, the problems that a traditional method lacks an effective temperature compensation mechanism and measurement results are large in deviation and poor in comparability under different environment temperatures are effectively solved, the influence of the environment on the test is quantitatively judged, meanwhile, the suppression current threshold value is determined under high-degree environment interference and a switch loop state, and the measurement accuracy is improved. The suppression index of the environmental influence is calculated by combining suppression data such as current data of the loop to be tested, current output duration and contact surface temperature of the loop and the test lead, and linkage consideration of the test current and environmental factors is realized.

Description

Technical Field

[0001] This invention relates to the field of loop resistance testing technology, and in particular to a method for testing the resistance of a switch loop based on ambient temperature compensation. Background Technology

[0002] In the vast architecture of a power system, switching equipment acts as a crucial node in a transportation hub, undertaking the important mission of controlling the on / off state of circuits and ensuring the orderly distribution and transmission of power. The resistance of the switching circuit, as a core parameter reflecting the health status of the switching equipment, reveals crucial information about its operating condition even in minute changes, directly impacting the operational safety and stability of the entire power system.

[0003] From a fundamental perspective, the resistance of a switch circuit is primarily composed of the resistance of the conductor itself and the contact resistance of each connection point. Conductor resistance depends on inherent factors such as the conductor's material, length, and cross-sectional area. While these factors remain relatively stable during long-term operation of the switchgear, they can gradually change due to conductor aging and material deterioration. Contact resistance mainly occurs at switch contacts and connection terminals, and its magnitude is closely related to factors such as the pressure, cleanliness, and oxidation level of the contact surfaces. During normal operation, these resistances remain within a relatively stable range, allowing current to flow smoothly through the switch circuit and ensuring the stable operation of the power system. However, when the switch circuit resistance increases abnormally, it can easily lead to circuit overheating, increased electrical losses, and in severe cases, equipment burnout or power outages. Therefore, accurate measurement of switch circuit resistance has significant engineering implications.

[0004] However, traditional switching circuit resistance measurement often uses the DC voltage drop method, but this method has obvious drawbacks: on the one hand, changes in ambient temperature will significantly affect the conductor resistance value, and the conductor resistance increases with the increase of temperature. Traditional methods have not established an effective temperature compensation mechanism, resulting in a lack of comparability of measurement results under different ambient temperatures and large deviations; on the other hand, when the test current is large enough, it can effectively suppress the interference of environmental factors, but traditional methods do not take into account the linkage between the test current and environmental factors, and rely only on fixed current testing, which makes it difficult to meet the measurement accuracy requirements under different scenarios.

[0005] To address the aforementioned technical deficiencies, a solution is proposed. Summary of the Invention

[0006] The purpose of this invention is to address the shortcomings of traditional switching circuit resistance measurement methods, which often employ DC voltage drop. Firstly, changes in ambient temperature significantly affect conductor resistance, which increases with temperature. Traditional methods lack an effective temperature compensation mechanism, leading to incomparability and significant deviations in measurement results under different ambient temperatures. Secondly, while sufficiently large test currents can effectively suppress environmental interference, traditional methods do not consider the test current in conjunction with environmental factors, relying solely on fixed current testing, making it difficult to meet the measurement accuracy requirements of different scenarios.

[0007] To achieve the above objectives, the present invention adopts the following technical solution: a switching circuit resistance testing method based on ambient temperature compensation, comprising the following steps: Step 1: Using an adjustable DC constant current source, connect the test current lead and voltage measurement lead to the two ends of the switch circuit under test, respectively, and obtain the current and voltage data. Calculate the initial resistance value of the switch circuit according to Ohm's law. Step 2: Collect environmental data of the surrounding environment of the switch circuit under test through an environmental sensor array, analyze and calculate the environmental compensation index of the switch circuit, and classify the degree of influence of the surrounding environment of the switch circuit into high degree influence and low degree influence. Step 3: Establish an impact suppression model, test the suppression effect of current on environmental factors, obtain the suppression current threshold, obtain suppression data from the database, and perform analysis and calculation to obtain the suppression index of environmental impact. Step 4: Combine the environmental compensation index and the environmental impact suppression index of the switching circuit to perform analysis and calculation, obtain the dynamic compensation coefficient of the ambient temperature, and dynamically adjust the initial resistance value of the switching circuit according to the dynamic compensation coefficient.

[0008] Furthermore, the environmental sensor array includes a temperature and humidity sensor and a barometric pressure sensor. The environmental data includes the temperature, humidity, and atmospheric pressure data of the environment surrounding the switch circuit under test. The suppression data includes the current in the switch circuit under test, the duration of the current output, and the temperature data of the contact surface between the switch circuit under test and the test lead.

[0009] Furthermore, the calculation process for the environmental compensation index of the switching circuit is as follows: S11. Obtain and analyze the temperature, humidity and atmospheric pressure data of the environment surrounding the switch circuit under test. S12. Calculate the environmental compensation index of the switching circuit according to the following formula. : , in, The ambient temperature surrounding the switch circuit under test. The standard temperature of the ambient environment surrounding the preset switching circuit. The humidity of the environment surrounding the switch circuit under test. for, for, This represents the atmospheric pressure surrounding the switch circuit under test. The standard atmospheric pressure of the environment surrounding the preset switch circuit. The preset humidity weighting coefficient, This is a preset atmospheric pressure weighting coefficient; S13. Obtain the preset environmental compensation lower limit threshold. and environmental compensation upper limit threshold Environmental compensation index of switching circuit Comparative analysis, when If the value is within a certain range, it indicates that the environment surrounding the switching circuit has a low degree of influence on the circuit resistance test, and is classified as a low-level influence, so there is no need to dynamically adjust the initial resistance value of the switching circuit. S14, when If the resistance value is high, it indicates that the environment surrounding the switching circuit has a high degree of influence on the circuit resistance test. Further analysis of the environmental suppression is needed, and the initial resistance value of the switching circuit should be dynamically adjusted.

[0010] Furthermore, the process of establishing the influence suppression model is as follows: under the same high-level environmental interference and the same switching circuit state, different test current values ​​are applied to the switching circuit under test, and the corresponding switch circuit test resistance values ​​are calculated. The difference between the switch circuit test resistance value and the preset standard switch circuit resistance value is compared, and the switch circuit test resistance value with the smallest difference is obtained. The corresponding test current value is used as the suppression current threshold.

[0011] Furthermore, the calculation process for the environmental impact mitigation index is as follows: S21. Acquire the current, current output duration, and contact surface temperature data between the switch circuit under test and the test lead in the switch circuit under test, and perform analysis and calculation. S22. Calculate the environmental impact mitigation index using the following formula. : ,in, The number of times the current data in the switch circuit under test is sampled. For the first The actual current in the switch circuit under test. To suppress the current threshold, For the actual current output duration, The preset standard current output duration, The temperature of the contact surface between the switch circuit under test and the test lead. The preset standard contact surface temperature is used to indicate the degree to which the test current inhibits the influence of environmental factors. The higher the value of the inhibition index, the higher the degree to which the test current inhibits the influence of environmental factors.

[0012] Furthermore, the calculation process for the dynamic compensation coefficient of ambient temperature is as follows: S31. Obtain the environmental compensation index and the environmental impact suppression index of the switching circuit and perform analysis and calculation; S32. Calculate the dynamic compensation coefficient for ambient temperature using the following formula. : ,in, This is a preset upper limit threshold for environmental compensation. The preset lower limit threshold for environmental compensation. The environmental compensation index is for switch circuits that are highly affected. The environmental impact mitigation index. The preset weighting coefficients for environmental impact. These are the preset weighting coefficients for environmental suppression; S33, Dynamic compensation coefficient for ambient temperature Substituting into the correction formula, we obtain the final accurate resistance value. : ,in, This is the initial resistance value of the switching circuit. This is the dynamic compensation coefficient for ambient temperature.

[0013] In summary, due to the adoption of the above technical solution, the beneficial effects of the present invention are: This method for testing the resistance of a switch circuit based on environmental temperature compensation accurately obtains the initial resistance value of the switch circuit using an adjustable DC constant current source combined with Ohm's law, laying a solid foundation for subsequent compensation adjustments. Secondly, it utilizes an environmental sensor array including temperature, humidity, and air pressure sensors to comprehensively collect temperature, humidity, and atmospheric pressure data of the environment surrounding the switch circuit under test. An environmental compensation index is calculated using a formula, and the degree of environmental influence is clearly defined. This effectively solves the problems of traditional methods lacking an effective temperature compensation mechanism and having large deviations and poor comparability of measurement results under different environmental temperatures, allowing for a quantitative assessment of the environmental impact on the test. Simultaneously, by establishing an influence suppression model, under the same high level of environmental interference and switch circuit... By determining the suppression current threshold under circuit conditions and combining suppression data such as the current data of the circuit under test, the duration of current output, and the temperature of the contact surface between the circuit and the test lead, the suppression index of environmental influence is calculated. This realizes the linkage between test current and environmental factors, overcoming the shortcomings of traditional fixed current testing in terms of measurement accuracy in different scenarios. This makes the suppression effect of current on environmental interference more intuitive and controllable. In addition, by constructing a dynamic compensation coefficient calculation model through environmental compensation index and suppression index, the initial resistance value is dynamically adjusted in a targeted manner. This can accurately correct errors when the degree of environmental influence is high, and avoid unnecessary adjustments when the degree of influence is low, which greatly improves the accuracy and scenario adaptability of switching circuit resistance measurement. Attached Figure Description

[0014] Figure 1 A schematic diagram of the method flow of the present invention is shown. Detailed Implementation

[0015] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0016] Examples, such as Figure 1 As shown, a method for testing the resistance of a switch circuit based on ambient temperature compensation is proposed. First, an adjustable DC constant current source is used to connect the test current lead and the voltage measurement lead to the two ends of the switch circuit under test, respectively, and the current and voltage data are acquired. According to Ohm's law, the initial resistance value of the switch circuit is calculated. Then, the surrounding environmental data of the switch circuit under test is collected through the environmental sensor array and analyzed and calculated to obtain the environmental compensation index of the switch circuit. The degree of influence of the surrounding environment of the switch circuit is divided into high degree influence and low degree influence. It should be noted that the environmental sensor array includes temperature and humidity sensors and air pressure sensors. The environmental data includes the temperature, humidity and atmospheric pressure data of the environment around the switch circuit under test. The calculation process for the environmental compensation index of the switching circuit is as follows: S11. Obtain and analyze the temperature, humidity and atmospheric pressure data of the environment surrounding the switch circuit under test. S12. Calculate the environmental compensation index of the switching circuit according to the following formula. : ,in, The ambient temperature surrounding the switch circuit under test. The standard temperature of the ambient environment surrounding the preset switching circuit. The humidity of the environment surrounding the switch circuit under test. for, for, This represents the atmospheric pressure surrounding the switch circuit under test. The standard atmospheric pressure of the environment surrounding the preset switch circuit. The preset humidity weighting coefficient, This is a preset atmospheric pressure weighting coefficient; S13. Obtain the preset environmental compensation lower limit threshold. and environmental compensation upper limit threshold Environmental compensation index of switching circuit Comparative analysis, when If the value is within a certain range, it indicates that the environment surrounding the switching circuit has a low degree of influence on the circuit resistance test, and is classified as a low-level influence, so there is no need to dynamically adjust the initial resistance value of the switching circuit. S14, when If the resistance value is high, it indicates that the environment surrounding the switching circuit has a high degree of influence on the circuit resistance test. Further analysis of the environmental suppression is needed, and the initial resistance value of the switching circuit should be dynamically adjusted.

[0017] Next, an impact suppression model was established to test the suppression effect of current on environmental factors, obtain the suppression current threshold, and obtain suppression data from the database. The suppression data includes the current in the switch circuit under test, the duration of current output, and the temperature data of the contact surface between the switch circuit under test and the test lead. The data was then analyzed and calculated to obtain the suppression index of environmental impact. The process of establishing the influence suppression model is as follows: Under the same high-level environmental interference and the same switch circuit state (the switch circuit state includes but is not limited to the model and temperature of the switching equipment), different test current values ​​are applied to the switch circuit to be tested, the test resistance value of the switch circuit corresponding to different currents is calculated, the difference between the switch circuit test resistance value and the preset standard switch circuit resistance value is compared, and the switch circuit test resistance value with the smallest difference is obtained. The corresponding test current value is used as the suppression current threshold.

[0018] The calculation process for the environmental impact mitigation index is as follows: S21. Acquire the current, current output duration, and contact surface temperature data between the switch circuit under test and the test lead in the switch circuit under test, and perform analysis and calculation. S22. Calculate the environmental impact mitigation index using the following formula. : , in, The number of times the current data in the switch circuit under test is sampled. For the first The actual current in the switch circuit under test. To suppress the current threshold, For the actual current output duration, The preset standard current output duration, The temperature of the contact surface between the switch circuit under test and the test lead. The preset standard contact surface temperature is used to indicate the degree to which the test current inhibits the influence of environmental factors. The higher the value of the inhibition index, the higher the degree to which the test current inhibits the influence of environmental factors.

[0019] Finally, by combining the environmental compensation index and the suppression index of environmental influence of the switching circuit, the dynamic compensation coefficient of the ambient temperature is obtained through analysis and calculation, and the initial resistance value of the switching circuit is dynamically adjusted according to the dynamic compensation coefficient. The calculation process for the dynamic compensation coefficient of ambient temperature is as follows: S31. Obtain the environmental compensation index and the environmental impact suppression index of the switching circuit and perform analysis and calculation; S32. Calculate the dynamic compensation coefficient for ambient temperature using the following formula. : , in, This is a preset upper limit threshold for environmental compensation. The preset lower limit threshold for environmental compensation. The environmental compensation index is for switch circuits that are highly affected. The environmental impact mitigation index. The preset weighting coefficients for environmental impact. These are the preset weighting coefficients for environmental suppression; S33, Dynamic compensation coefficient for ambient temperature Substituting into the correction formula, we obtain the final accurate resistance value. : ,in, This is the initial resistance value of the switching circuit. This is the dynamic compensation coefficient for ambient temperature (when the ambient temperature is 20°C higher than the preset standard temperature). A positive value results in a downward adjustment of the resistance value for compensation; conversely, a negative value results in an upward adjustment of the compensation value.

[0020] This invention accurately obtains the initial resistance value of the switching circuit by combining an adjustable DC constant current source with Ohm's law, laying a solid foundation for subsequent compensation adjustments. Secondly, it utilizes an environmental sensor array including temperature, humidity, and air pressure sensors to comprehensively collect temperature, humidity, and atmospheric pressure data around the switch circuit under test. An environmental compensation index is calculated using a formula, and the degree of environmental influence is clearly defined, effectively solving the problems of traditional methods lacking an effective temperature compensation mechanism and exhibiting large deviations and poor comparability of measurement results under different environmental temperatures. This allows for a quantitative assessment of the environmental impact on the test. Simultaneously, by establishing an influence suppression model, the suppression current is determined under the same high level of environmental interference and switching circuit conditions. The threshold, combined with the current data of the circuit under test, the duration of current output, and the temperature of the contact surface between the circuit and the test lead, calculates the suppression index of environmental influence. This realizes the linkage between test current and environmental factors, overcoming the shortcomings of traditional fixed current testing in terms of measurement accuracy in different scenarios. It makes the suppression effect of current on environmental interference more intuitive and controllable. In addition, by constructing a dynamic compensation coefficient calculation model through environmental compensation index and suppression index, the initial resistance value is dynamically adjusted in a targeted manner. This can accurately correct errors when the degree of environmental influence is high, and avoid unnecessary adjustments when the degree of influence is low, which greatly improves the accuracy and scenario adaptability of switching circuit resistance measurement.

[0021] The size of the interval and threshold is set to facilitate comparison. The size of the threshold depends on the amount of sample data and the number of bases set by those skilled in the art for each set of sample data; as long as it does not affect the ratio between the parameter and the quantized value.

[0022] The above formulas are all dimensionless calculations. The formulas are derived from software simulations based on a large amount of collected data to obtain the most recent real-world results. The preset parameters in the formulas are set by those skilled in the art according to the actual situation. The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A method for testing the resistance of a switching circuit based on ambient temperature compensation, characterized in that, Includes the following steps: Step 1: Using an adjustable DC constant current source, connect the test current lead and voltage measurement lead to the two ends of the switch circuit under test, respectively, and obtain the current and voltage data. Calculate the initial resistance value of the switch circuit according to Ohm's law. Step 2: Collect environmental data of the surrounding environment of the switch circuit under test through an environmental sensor array, analyze and calculate the environmental compensation index of the switch circuit, and classify the degree of influence of the surrounding environment of the switch circuit into high degree influence and low degree influence. Step 3: Establish an impact suppression model, test the suppression effect of current on environmental factors, obtain the suppression current threshold, obtain suppression data from the database, and perform analysis and calculation to obtain the suppression index of environmental impact. Step 4: Combine the environmental compensation index and the environmental impact suppression index of the switching circuit to perform analysis and calculation, obtain the dynamic compensation coefficient of the ambient temperature, and dynamically adjust the initial resistance value of the switching circuit according to the dynamic compensation coefficient.

2. The method for testing the resistance of a switching circuit based on ambient temperature compensation according to claim 1, characterized in that, The environmental sensor array includes a temperature and humidity sensor and a barometric pressure sensor. The environmental data includes the temperature, humidity and atmospheric pressure data of the environment surrounding the switch circuit under test. The suppression data includes the current in the switch circuit under test, the duration of the current output, and the temperature data of the contact surface between the switch circuit under test and the test lead.

3. The method for testing the resistance of a switching circuit based on ambient temperature compensation according to claim 1, characterized in that, The calculation process for the environmental compensation index of the switching circuit is as follows: S11. Obtain and analyze the temperature, humidity and atmospheric pressure data of the environment surrounding the switch circuit under test. S12. Calculate the environmental compensation index of the switching circuit according to the following formula. : , in, The ambient temperature surrounding the switch circuit under test. The standard temperature of the ambient environment surrounding the preset switching circuit. The humidity of the environment surrounding the switch circuit under test. for, for, This represents the atmospheric pressure surrounding the switch circuit under test. The standard atmospheric pressure of the environment surrounding the preset switch circuit. The preset humidity weighting coefficient, This is a preset atmospheric pressure weighting coefficient; S13. Obtain the preset environmental compensation lower limit threshold. and environmental compensation upper limit threshold Environmental compensation index of switching circuit Comparative analysis, when If the value is within a certain range, it indicates that the environment surrounding the switching circuit has a low degree of influence on the circuit resistance test, and is classified as a low-level influence, so there is no need to dynamically adjust the initial resistance value of the switching circuit. S14, when If the resistance value is high, it indicates that the environment surrounding the switching circuit has a high degree of influence on the circuit resistance test. Further analysis of the environmental suppression is needed, and the initial resistance value of the switching circuit should be dynamically adjusted.

4. The method for testing the resistance of a switching circuit based on ambient temperature compensation according to claim 1, characterized in that, The process of establishing the influence suppression model is as follows: Under the same high-level influence of environmental factors and the same switching circuit state, different test current values ​​are applied to the switching circuit to be tested, and the test resistance values ​​of the switching circuit corresponding to different currents are calculated. The difference between the test resistance value of the switching circuit and the preset standard switching circuit resistance value is compared, and the test resistance value of the switching circuit with the smallest difference is obtained. The corresponding test current value is used as the suppression current threshold.

5. The method for testing the resistance of a switching circuit based on ambient temperature compensation according to claim 1, characterized in that, The calculation process for the environmental impact mitigation index is as follows: S21. Acquire the current, current output duration, and contact surface temperature data between the switch circuit under test and the test lead in the switch circuit under test, and perform analysis and calculation. S22. Calculate the environmental impact mitigation index using the following formula. : ,in, The number of times the current data in the switch circuit under test is sampled. For the first The actual current in the switch circuit under test. To suppress the current threshold, For the actual current output duration, The preset standard current output duration, The temperature of the contact surface between the switch circuit under test and the test lead. The preset standard contact surface temperature is used to indicate the degree to which the test current inhibits the influence of environmental factors. The higher the value of the inhibition index, the higher the degree to which the test current inhibits the influence of environmental factors.

6. The method for testing the resistance of a switching circuit based on ambient temperature compensation according to claim 1, characterized in that, The calculation process for the dynamic compensation coefficient of ambient temperature is as follows: S31. Obtain the environmental compensation index and the environmental impact suppression index of the switching circuit and perform analysis and calculation; S32. Calculate the dynamic compensation coefficient for ambient temperature using the following formula. : ,in, This is a preset upper limit threshold for environmental compensation. The preset lower limit threshold for environmental compensation. The environmental compensation index is for switch circuits that are highly affected. The environmental impact mitigation index. The preset weighting coefficients for environmental impact. These are the preset weighting coefficients for environmental suppression; S33, Dynamic compensation coefficient for ambient temperature Substituting into the correction formula, we obtain the final accurate resistance value. : ,in, This is the initial resistance value of the switching circuit. This is the dynamic compensation coefficient for ambient temperature.

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