Interface assembly for testing and testing system

Abstract

The invention discloses an interface assembly for testing and a testing system. The interface assembly comprises a DP clamp and an adapter. The adapter interface is used for connecting to-be-tested equipment and the DP clamp, and the DP clamp is used for being connected with detection equipment; the adapter interface comprises a Type-C male head and a DP female head, and a specified pin end of the Type-C male head is directly connected with a specified pin end of the DP female head; and the adapter interface is used for allowing communication with the detection equipment according to a protocol configured by the to-be-tested equipment when the detection equipment is connected with the to-be-tested equipment through the DP clamp and the adapter interface. By using the interface assembly provided by the invention, the to-be-tested device can understand the communication protocol of the detection device, so that when the detection device and the to-be-tested device are connected through the interface assembly, the preset test item can be automatically executed.

Description

Technical Field

[0001] The embodiments of the present invention relate to testing technology, and more particularly to an interface component and a testing system for testing. Background Technology

[0002] With the development of new energy vehicles, the DP screen projection function in car cockpits has become a standard feature. Users can use this interface to connect VR glasses or other mobile devices with DP interfaces to watch video content on the car's driving screen via a USB Type-C cable.

[0003] Vehicle systems or devices, such as automotive cockpits, require physical layer conformance testing. Currently, there are two types of test fixtures: one with a Type-C interface and the other with a standard DP interface. The appropriate test fixture is selected based on the interface type of the DUT (Device Under Test).

[0004] When using a Type-C interface fixture, the SOC used by the DUT must support the DP Alt Mode protocol; when using a standard DP fixture, the SOC used by the DUT must support the DP1.4 standard protocol.

[0005] Due to cost considerations, the SOC supplier for the vehicle infotainment system does not support all protocols included in DP Alt Mode, but only the standard DP1.4 protocol. Therefore, when directly connecting the DUT to the oscilloscope using a Type-C fixture for testing, the DUT cannot automatically complete the DP1.4 physical layer conformance test by sending specific test patterns to the oscilloscope according to the DP Alt Mode protocol requirements. The DUT's DP signal transmission interface type is Type-C, but it can only be tested using a standard DP interface test fixture. The two interface types are different and cannot be connected, which poses a challenge to DP1.4 physical layer conformance testing. Summary of the Invention

[0006] This invention provides an interface component and testing system for testing, in order to solve the problem that the device under test only supports the standard DP1.4 protocol, the interface type of the DP signal transmission of the device under test is Type-C, but it can only be tested using a standard DP interface test fixture, and when the device under test is directly connected to the test device using a Type-C fixture, the device under test cannot send specific test codes according to the DP Alt Mode protocol to complete the automated test.

[0007] In a first aspect, embodiments of the present invention provide an interface component for testing, including a DP fixture and an adapter;

[0008] The adapter is used to connect the device under test and the DP fixture, and the DP fixture is used to connect to the testing device.

[0009] The adapter includes a Type-C male connector and a DP female connector, with designated pins of the Type-C male connector directly connected to designated pins of the DP female connector;

[0010] The adapter is used to allow the testing device to communicate with the testing device using the protocol configured on the testing device when the testing device is connected to the device under test via the DP fixture and the adapter.

[0011] Optionally, the first high-speed differential signal positive terminal, the first high-speed differential signal negative terminal, the second high-speed differential signal positive terminal, the second high-speed differential signal negative terminal, the third high-speed differential signal positive terminal, the third high-speed differential signal negative terminal, the fourth high-speed differential signal positive terminal, and the fourth high-speed differential signal negative terminal of the Type-C male connector are respectively connected to the first channel signal positive terminal, the first channel signal negative terminal, the second channel signal positive terminal, the second channel signal negative terminal, the third channel signal positive terminal, the third channel signal negative terminal, the fourth channel signal positive terminal, and the fourth channel signal negative terminal of the DP female connector;

[0012] The first SUB terminal and the second SUB terminal of the Type-C male connector are respectively connected to the positive terminal of the auxiliary channel signal and the negative terminal of the auxiliary channel signal of the DP female connector;

[0013] The first channel configuration terminal of the Type-C male connector is connected to the hot-plug detection terminal of the DP female connector;

[0014] The first configuration terminal, the second configuration terminal, and the DP_PWR terminal of the DP female connector are grounded.

[0015] Optionally, the Type-C male connector and the DP female connector are mounted on the PCB board, and the Type-C male connector and the DP female connector are connected through traces on the PCB board.

[0016] Optionally, the adapter is used for DP1.4 physical layer conformance testing of the device under test.

[0017] Secondly, embodiments of the present invention also provide a testing system, including any of the interface components described in the embodiments of the present invention.

[0018] Optionally, the device may also include an oscilloscope, wherein the adapter in the interface assembly is used to connect the device under test and the DP fixture, and the DP fixture is used to connect to the oscilloscope.

[0019] Optionally, the DP fixture includes an SMA interface for connecting the oscilloscope.

[0020] Optionally, the device under test is configured to store test code.

[0021] Optionally, the device under test is configured to support the DP1.4 protocol.

[0022] Optionally, the device to be tested includes on-board equipment of new energy vehicles.

[0023] Compared with existing technologies, the advantages of this invention are as follows: This invention proposes an interface component, which includes a DP fixture and an adapter. The adapter includes a Type-C male connector and a DP female connector. Based on the adapter, the device under test (DUT) can understand the communication protocol of the testing device. Therefore, when the testing device and the DUT are connected through the interface component, preset test items can be automatically executed. Type-C and DP interfaces have different protocol specifications and signal definitions. The adapter can convert the signals of the Type-C interface into signals conforming to the DP1.4 protocol for transmission and testing in a DP1.4 environment. This solves the problem that the DUT's DP signal transmission interface type is Type-C, but it can only be tested using a standard DP interface test fixture. Due to the different interface type from the testing device, the two cannot automatically perform DP1.4 physical layer conformance testing. In DP1.4 physical layer conformance testing, the DUT and the testing device need to be connected for signal measurement and analysis. The Type-C / DP adapter, as a connection medium, conveniently connects the DUT with a Type-C interface to the (DP1.4) testing device, enabling the test to proceed smoothly. When testing on devices lacking a native DP1.4 interface, an adapter can be used to connect them to a DP1.4 testing environment, enabling testing of the physical layer signals of the device under test. For example, due to cost considerations, automotive SoC suppliers may not support all protocols included in DP Alt Mode, but only the standard DP1.4 protocol. When using an interface component to connect the device under test and the testing equipment, since the interface component includes a DP female header, the device under test can automatically complete the DP1.4 physical layer conformance test by sending specific test codes to the testing equipment according to the DP Alt Mode protocol requirements. Furthermore, due to the widespread use of Type-C interfaces in various electronic devices, using a Type-C / DP adapter can conveniently perform DP1.4 physical layer conformance testing on various types of devices under test, thus expanding the testing coverage. Attached Figure Description

[0024] Figure 1 This is a block diagram of the interface component structure in the embodiment;

[0025] Figure 2 This is a schematic diagram of the adapter pin connections in the embodiment;

[0026] Figure 3 This is the PCB schematic diagram in the embodiment;

[0027] Figure 4 This is a schematic diagram of the adapter structure in the embodiment. Detailed Implementation

[0028] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and not intended to limit it. Furthermore, it should be noted that, for ease of description, the accompanying drawings show only the parts relevant to the present invention, and not all of the structures.

[0029] Example 1

[0030] Figure 1 This is a block diagram of the interface component structure in the embodiment, for reference. Figure 1 This solution proposes an interface component, which includes a DP fixture and an adapter.

[0031] The adapter is used to connect the device under test and the DP fixture, and the DP fixture is used to connect to the testing equipment.

[0032] The adapter includes a Type-C male connector and a DP female connector. The designated pins of the Type-C male connector are directly connected to the designated pins of the DP female connector.

[0033] An adapter is used to allow communication between the testing device and the device under test using the protocol configured on the device under test when the testing device is connected to the device under test via a DP fixture or adapter.

[0034] For example, in this solution, the DP fixture is configured to include at least a DP female connector. The DP fixture may also include an interface or clamp for direct connection with the testing equipment, wherein the type of the interface or clamp configured in the DP fixture is the same as the interface supported by the testing equipment.

[0035] For example, in this solution, the DP (DisplayPort) interface (including male and female connectors) represents an interface that supports computer display interface standards for digital video and audio transmission;

[0036] The specific DP interface is a digital video interface standard developed by the PC and chip manufacturers alliance and standardized by the Video Electronics Standards Association (VESA).

[0037] The DP interface includes the standard DP interface and the Mini DP interface. In this solution, the DP interface adopts the standard DP interface. The standard DP interface is the most common type of DP interface, used to connect devices such as desktop computers, laptops and monitors.

[0038] The Mini DP interface is mainly used in Apple's laptop computers such as MacBook, MacBook Air and MacBook Pro. It is smaller in size and easier to use on thin and light devices, but its functions are the same as the standard DP interface.

[0039] The signal transmission components of the DP interface include the main link, auxiliary channels, and hot-plug detection signal lines. The main link is a unidirectional, high-bandwidth, low-latency channel used to transmit synchronous uncompressed video and audio data streams. It is generally composed of 1, 2, or 4 pairs of AC-coupled, bidirectional terminated differential pairs. Different link configurations can meet different bandwidth requirements.

[0040] The Aux Channel is a half-duplex, bidirectional channel used for link management and device control. Its one-way data rate is approximately 1 Mbit / s, and it can be used to transmit setting and control commands, such as reading Extended Display Identification Data (EDID) and setting various display configuration registers.

[0041] The Hot-Plug Detection (HPD) signal line is a unidirectional interrupt signal emitted by the receiving device, active high. When a device is plugged in, this signal goes high, and the source device monitors this signal to determine the device's connection status and perform corresponding operations.

[0042] For example, in this solution, the Type-C interface is configured to use a 24-pin full-function Type-C interface. The functions of the 24-pin pins will not be detailed here.

[0043] For example, in this solution, the specified pins of the Type-C male connector and the specified pins of the DP female connector are directly connected according to preset rules (such as the multiplexing rules of Type-C interface pins and DP interface pins) to form a Type-C / DP adapter for a specified test item.

[0044] In this scheme, the pin segments used by the Type-C male connector are set to include at least the TX / RX terminal (high-speed differential signal terminal), the SBU terminal (auxiliary signal terminal), and the CC terminal (control and configuration terminal);

[0045] The pin segments used in the DP female connector include at least the main link differential signal terminal, the auxiliary channel signal terminal, and the hot-plug detection terminal.

[0046] Currently, new energy vehicles widely use DP1.4 to transmit video signals because the video signal rate output by DP1.4 can reach up to 8.1Gbps. In order to ensure that users can get the best experience, vehicle hardware R&D engineers must ensure that the signal quality output by the DP interface meets the requirements of the VESA Association's "VESA Proposed DisplayPort Standard". Since the DP signal is generally emitted by vehicle components, it is necessary to conduct a conformance test on the physical layer of the vehicle's DP interface in accordance with the "VESA DisplayPort v1.4a PHY Layer Compliance Test Specification (PHY CTS)".

[0047] For example, in this solution, the adapter is used to allow communication between the testing device and the device under test using the protocol configured by the device under test when the testing device is connected to the device under test through the DP fixture and the adapter.

[0048] For example, for DP1.4 physical layer conformance testing of a certain device, the SoC (System on Chip) of the device under test can be configured to support the DP Alt Mode protocol and / or the DP1.4 standard protocol;

[0049] When the device under test is configured with a Type-C interface and transmits DP signals through the Type-C interface, and the device under test is configured to only support the standard DP1.4 protocol, when the device under test is directly connected to the test device using a Type-C fixture for testing, the device under test cannot send specific test codes to the testing device in accordance with the DP Alt Mode protocol requirements to automatically complete the DP1.4 physical layer conformance test.

[0050] By using the interface components proposed in this solution, the device under test and the testing device can be connected through an adapter interface. This can solve the problem that the interface types configured on the testing device and the device under test are different, which leads to the device under test and the testing device being unable to interact with each other through the same protocol, and thus the DP1.4 physical layer consistency test of the device under test cannot be performed automatically.

[0051] Specifically, the Type-C interface of the device under test is connected to the DP interface of the testing device through an adapter. Based on the adapter, when the Type-C interface of the device under test is connected to the DP interface of the testing device, the device under test determines that the Type-C interface is connected to the correct communication interface. Then, the device under test can send a specific test code to the testing device according to the DP Alt Mode protocol requirements to automatically complete the DP1.4 physical layer conformance test.

[0052] For example, in this solution, the DP1.4 physical layer conformance test is a series of tests to ensure that the device's DisplayPort interface conforms to the DP1.4 standard specification in terms of physical signal transmission. Its main purpose is to guarantee compatibility and signal transmission reliability between different devices. This test specifically includes:

[0053] Verify whether the device's DP1.4 interface meets the DP1.4 standard requirements set by VESA (Video Electronics Standards Association) in terms of physical layer signal transmission and electrical characteristics, and ensure that the device can correctly send and receive DisplayPort signals.

[0054] Through testing, we ensure that devices from different manufacturers are compatible with each other, enabling normal data transmission of video, audio, and other data, and avoiding problems such as signal mismatch and transmission errors.

[0055] The integrity, stability, and accuracy of the detected signals are ensured to provide high-quality video and audio output, delivering a superior visual and auditory experience for users.

[0056] This test can specifically include:

[0057] Eye diagram testing: Eye diagrams are an important tool for measuring the quality of high-speed digital signals. In DP1.4 physical layer compliance testing, analyzing the signal's eye diagram can assess noise, jitter, distortion, and other aspects of the signal. For example, the wider the "eye" of the eye diagram is open, the better the signal quality, and the higher the probability that the device can correctly identify the signal.1

[0058] Jitter testing: Jitter refers to the minute variations in a digital signal over time. Excessive jitter can lead to signal transmission errors and affect the playback quality of video and audio. The test measures parameters such as the amplitude and frequency of the jitter and compares them with standard requirements to determine if the jitter is within an acceptable range.

[0059] Rise and fall time testing: The rise and fall times of a signal refer to the time it takes for the signal to transition from a low level to a high level and from a high level to a low level. These two parameters have a significant impact on the signal transmission speed and accuracy, and testing must ensure that they comply with the DP1.4 standard.

[0060] Voltage testing: Measure the voltage values ​​on various signal lines of the DP1.4 interface, including differential signal voltage and power supply voltage. For example, the voltage amplitude of the differential signal needs to be within a certain range to ensure correct signal transmission;

[0061] Current testing: This test measures the current consumption of the interface during operation to ensure that the device's power consumption meets standard requirements. Excessive current consumption may lead to problems such as overheating and energy waste.

[0062] Impedance testing: Measure the impedance of the signal lines of the DP1.4 interface, including differential impedance and common-mode impedance. Impedance mismatch can cause signal reflection, affecting signal transmission quality; therefore, it is necessary to ensure that the impedance is within the range specified in the standard.

[0063] Bandwidth Testing: The DP1.4 standard supports high bandwidth, enabling high-resolution, high-refresh-rate video transmission. Testing verifies whether the device's bandwidth meets the requirements of the DP1.4 standard, such as whether it can support video transmission at resolutions and refresh rates like 4K 120Hz and 8K 30Hz.

[0064] Data transmission rate testing: This measures the rate at which the device transmits data during actual data transfer to ensure it meets the data transmission rate requirements specified in the DP1.4 standard. Data transmission rate testing typically uses specific test patterns or data files.

[0065] Hot-swap test: Simulates the insertion and removal of the device while it is powered on, verifying the signal stability and reliability of the device during the hot-swap process. For example, during hot-swap, can the device correctly identify changes in connection status, and are there any problems such as signal interruption or device damage?

[0066] For example, in this solution, the usage methods of the interface component include:

[0067] Connect its Type-C male connector to the Type-C female connector of the device under test, connect the DP female connector to the matching DP fixture (male connector) of the testing equipment, connect the DP fixture to the testing equipment, and the testing equipment guides the testing equipment into the preset test mode to complete the specified test items.

[0068] This embodiment proposes an interface component including a DP fixture and an adapter. The adapter includes a Type-C male connector and a DP female connector. Based on the adapter, the device under test (DUT) can understand the communication protocol of the testing device. Therefore, when the testing device and the DUT are connected through the interface component, preset test items can be automatically executed. Type-C and DP interfaces have different protocol specifications and signal definitions. The adapter can convert Type-C interface signals into signals conforming to the DP1.4 protocol for transmission and testing in a DP1.4 environment. This solves the problem that the DUT's DP signal transmission interface type is Type-C, but it can only be tested using a standard DP interface test fixture. Due to the different interface type between the DUT and the testing device, automatic DP1.4 physical layer conformance testing cannot be achieved. In DP1.4 physical layer conformance testing, the DUT and the testing device need to be connected for signal measurement and analysis. The Type-C / DP adapter, as a connection medium, conveniently connects the DUT with a Type-C interface to the (DP1.4) testing device, enabling successful testing. When testing on devices lacking a native DP1.4 interface, an adapter can be used to connect them to a DP1.4 testing environment, enabling testing of the physical layer signals of the device under test. For example, due to cost considerations, automotive SoC suppliers may not support all protocols included in DP Alt Mode, but only the standard DP1.4 protocol. When using an interface component to connect the device under test and the testing equipment, since the interface component includes a DP female header, the device under test can automatically complete the DP1.4 physical layer conformance test by sending specific test codes to the testing equipment according to the DP Alt Mode protocol requirements. Furthermore, due to the widespread use of Type-C interfaces in various electronic devices, using a Type-C / DP adapter can conveniently perform DP1.4 physical layer conformance testing on various types of devices under test, thus expanding the testing coverage.

[0069] Figure 2 This is a schematic diagram of the adapter pin connections in the embodiment, for reference. Figure 2 ,exist Figure 1 Based on the scheme shown, in one feasible implementation,

[0070] The first high-speed differential signal positive terminal TX1+, the first high-speed differential signal negative terminal TX1-, the second high-speed differential signal positive terminal RX2+, the second high-speed differential signal negative terminal RX2-, the third high-speed differential signal positive terminal RX1+, the third high-speed differential signal negative terminal RX1-, the fourth high-speed differential signal positive terminal TX2+, and the fourth high-speed differential signal negative terminal TX2- of the Type-C male connector are respectively connected to the first channel signal positive terminal ML_Lane_2_P, the first channel signal negative terminal ML_Lane_2_N, the second channel signal positive terminal ML_Lane_0_P, the second channel signal negative terminal ML_Lane_0_N, the third channel signal positive terminal ML_Lane_3_P, the third channel signal negative terminal ML_Lane_3_N, the fourth channel signal positive terminal ML_Lane_1_P, and the fourth channel signal negative terminal ML_Lane_1_N of the DP female connector;

[0071] The first SUB terminal SUB1 and the second SUB terminal SUB2 of the Type-C male connector are connected to the positive terminal AUX_CH_P and the negative terminal AUX_CH_N of the auxiliary channel signal of the DP female connector, respectively.

[0072] The first channel configuration terminal CC1 of the Type-C male connector is connected to the hot-plug detection terminal HPD of the DP female connector;

[0073] The first configuration terminal CONFIG1, the second configuration terminal CONFIG1, and the DP_PWR terminal DP_PWR of the DP female connector are grounded.

[0074] For example, in this solution, based on the above pin connection method, the pins of the Type-C interface and the DP interface can be multiplexed, thereby achieving the purpose of transmitting DP video signals using the Type-C interface. In addition, it is also possible to use the smaller Type-C interface to replace the DP interface for DP signal transmission.

[0075] In this solution, the first channel configuration terminal CC1 of the Type-C male connector is connected to the hot-plug detection terminal HPD of the DP female connector, and the second channel configuration terminal CC2 of the Type-C male connector is disabled. This reduces the complexity of the adapter, makes the signal path clearer and simpler, and thus simplifies the circuit design and manufacturing process, reducing the manufacturing cost of the adapter.

[0076] In scenarios involving DP1.4 physical layer conformance testing, connecting only one CC terminal allows the test equipment to better determine the connection status and power requirements, thereby enabling more efficient power allocation and management.

[0077] Based on any of the aforementioned solutions, in this solution, the Type-C male connector U1 and DP female connector U2 of the adapter are set on the PCB board, and the Type-C male connector U1 and DP female connector U2 are connected through traces on the PCB board.

[0078] Figure 3 This is the PCB schematic diagram in the embodiment. Figure 4 This is a schematic diagram of the adapter structure in the embodiment, combined with Figures 2-4 In this solution, the adapter PCB can be designed in the following way:

[0079] Given the pinout of the Type-C and DP interfaces, use EDA schematic design software to select appropriate Type-C male connectors and standard DP male connectors from the component library, and draw the schematic as shown below. Figure 3 The schematic diagram of the Type-C to DP fixture shown is shown below.

[0080] Use EDA schematic design software to import the schematic for PCB design. During the design process, ensure that the differential lines are of equal length, with a length error of less than 10 mil. High-speed signal traces should be as short as possible to avoid transmission loss.

[0081] After exporting the PCB BOM using EDA schematic design software, the adapter is fabricated using PCB manufacturing. The final designed adapter is as follows: Figure 4 As shown.

[0082] In this solution, the adapter is designed as a PCB. The PCB allows for precise routing and impedance control, supporting high-speed signal transmission and meeting the requirements of high-resolution video and fast data transmission. This ensures stable and reliable signal transmission during the Type-C to DP conversion process. The PCB design can be customized to specific application needs. The interface and electronic components can be flexibly laid out according to the size, shape, and functional requirements of the device. Furthermore, PCB manufacturing can utilize automated production processes, and mass production can reduce costs, making the Type-C to DP interface more economical to manufacture.

[0083] Example 2

[0084] This embodiment proposes a testing system, including any of the interface components described in Embodiment 1. The implementation method and beneficial effects of the interface components are the same as the corresponding content described in Embodiment 1, and the specific details will not be repeated.

[0085] In one possible implementation, the test system further includes an oscilloscope, and an adapter in the interface assembly for connecting the device under test and a DP fixture, the DP fixture being used to connect to the oscilloscope.

[0086] For example, in this embodiment, the device under test is configured to support the DP1.4 protocol, and the test system is used for DP1.4 physical layer consistency testing of the device under test.

[0087] In this embodiment, the model of the oscilloscope can be selected according to the requirements. The oscilloscope is used for eye diagram analysis, jitter measurement, voltage measurement, protocol decoding and analysis, etc. in DP1.4 physical layer conformance testing.

[0088] Specifically, in the DP1.4 test, the oscilloscope can capture the DP signal and generate an eye diagram. By observing parameters such as the eye opening, eye height, and eye width of the eye diagram, the signal quality can be judged intuitively.

[0089] An oscilloscope can measure key parameters of an eye diagram, such as eye height and eye width, which directly reflect the signal's noise margin and timing headroom. For example, eye height represents the amplitude difference between a high and low signal level, determining the voltage range that the receiver can correctly identify. If the eye height is too small, the signal may be more susceptible to noise interference during transmission, leading to bit errors.

[0090] Oscilloscopes can also detect the rise and fall times of signals through eye diagram analysis, which is crucial for ensuring signal accuracy during high-speed transmission. Excessively long rise and fall times can lead to blurred signal edges, increasing transmission delay and bit error rate.

[0091] In DP1.4 testing, oscilloscopes can accurately measure signal jitter, including random jitter and deterministic jitter. Random jitter is typically caused by random factors such as thermal noise and shot noise, and it is unpredictable. Oscilloscopes can use statistical analysis methods to measure the amplitude and distribution of random jitter to assess signal stability. Deterministic jitter, on the other hand, is caused by factors such as periodic interference and power supply noise, and it exhibits certain regularities. Oscilloscopes can use specific measurement methods, such as period jitter measurement and duty cycle jitter measurement, to identify and analyze the sources and effects of deterministic jitter.

[0092] By measuring jitter, testers can determine whether the jitter of the signal is within the range specified in the DP1.4 standard, thereby ensuring the timing accuracy of the signal and the reliability of data transmission.

[0093] Oscilloscopes can accurately measure parameters such as voltage amplitude and DC bias of DP1.4 signals. For example, the DP1.4 standard specifies the differential voltage range of the signal, and an oscilloscope can verify whether the signal voltage meets the standard requirements by measuring the peak-to-peak value of the differential signal.

[0094] Voltage measurement is crucial to ensure that the signal amplitude is within an acceptable range at the receiving end. If the signal voltage is too high or too low, the receiver may fail to correctly identify the signal, leading to data transmission errors.

[0095] An oscilloscope can also measure the DC bias of a signal to ensure that the DC level of the signal is within the appropriate range. Changes in the DC bias can affect the signal's decision threshold, thus affecting the correct reception of the signal.

[0096] An oscilloscope can perform protocol decoding on DP1.4 signals, converting digital signals into an easily understandable protocol format. For example, an oscilloscope can analyze the data packet structure, control signals, and data fields in a DP1.4 signal to help testers understand the content and meaning of the signal.

[0097] By decoding the protocol, testers can check whether various protocol parameters in the DP1.4 signal meet standard requirements, such as packet format, data length, and checksum. If a protocol error is found, the problem can be located and fixed promptly.

[0098] Protocol decoding can also help testers analyze the transmission process of DP1.4 signals, understand the interaction of signals between different devices, and thus better optimize system design and improve the reliability of signal transmission.

[0099] An oscilloscope can detect errors in DP1.4 signals and provide detailed error information and analysis reports. Through error detection and analysis, testers can quickly locate the root cause of the problem and take corresponding measures to fix it. For example, if the bit error rate is found to be too high, it may be necessary to check the signal transmission path, interface connections, power supply, etc., to determine the cause of the problem and make improvements.

[0100] In this solution, the oscilloscope provides accurate signal measurement and analysis for DP1.4 physical layer compliance testing, aiding in fault detection and diagnosis, compatibility testing and debugging optimization, and verifying device compliance with standard requirements. Using an oscilloscope improves testing accuracy and reliability, ensuring the performance and quality of DP1.4 devices at the physical layer.

[0101] Currently, oscilloscope manufacturers provide two types of test fixtures for DP1.4 physical layer conformance testing: one is a standard DP interface fixture, suitable for DUT (Device Under Test) SOC (System on Chip) that supports the VESA Association's "VESA Proposed DisplayPort Standard V1.4d" protocol; the other is a USB Type-C interface DP fixture, suitable for DUT SOC that supports the VESA Association's "DisplayPort Alt Mode V2.0" protocol.

[0102] However, in actual testing, it was found that when using the USB Type-C interface DP fixture provided by the oscilloscope manufacturer to connect the DUT for testing, the DUT could not enter test mode and could not send the test code required by the protocol. This is because the SOC manufacturer using the DUT, for cost minimization considerations, did not support the USB PD protocol and USB protocol in DP Alt Mode. As a result, when the DUT and the oscilloscope communicate through the CC channel of the USB Type-C interface DP fixture, the VBUS pin of the DUT's USB Type-C DP interface was not connected to a 5V power supply, causing a protocol recognition error, thus interrupting the entry into DP Alt Mode, failing to trigger the specific DP test code, and making testing impossible.

[0103] Using the USB Type-C to DP interface component proposed in this embodiment, the Type-C interface of the DUT is converted into a standard DP interface, thereby enabling the DUT and oscilloscope to be connected using a standard DP fixture. The oscilloscope then induces the DUT to enter the DP standard test mode and emits a specific test code, thereby automatically completing the DP1.4 physical layer conformance test.

[0104] Based on any of the aforementioned solutions, the DP fixture includes an SMA interface and a DP male connector, with the SMA interface used to connect to an oscilloscope.

[0105] In this solution, a DP fixture is configured to connect to an oscilloscope via an SMA interface. Since the SMA interface is a standard interface widely used in electronic test and measurement, this makes the DP fixture compatible with various models and brands of oscilloscopes. The SMA interface has low signal loss characteristics. In high-frequency signal transmission, especially for DP signal measurement, low loss ensures high signal integrity during transmission from the fixture to the oscilloscope, which helps in accurately capturing and analyzing various parameters of the DP signal.

[0106] Based on any of the aforementioned solutions, in one possible implementation, the device under test is configured to store test code.

[0107] Based on any of the aforementioned solutions, in one possible implementation, the device to be tested includes on-board equipment for new energy vehicles.

[0108] For example, in this solution, the testing system is specifically applied to equipment testing in the field of new energy vehicles. The equipment to be tested may specifically include in-vehicle displays, infotainment system hosts, in-vehicle cameras and image processing systems, in-vehicle communication modules, electronic control units, etc.

[0109] Note that the above description is merely a preferred embodiment of the present invention and the technical principles employed. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments, and substitutions can be made without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments, and may include many other equivalent embodiments without departing from the concept of the present invention, the scope of which is determined by the scope of the appended claims.

Claims

1. An interface component for testing, characterized in that, Includes DP fixtures and adapters; The adapter is used to connect the device under test and the DP fixture, and the DP fixture is used to connect to the testing device. The adapter includes a Type-C male connector and a DP female connector, with designated pins of the Type-C male connector directly connected to designated pins of the DP female connector; The adapter is used to allow the testing device to communicate with the testing device using the protocol configured on the testing device when the testing device is connected to the device under test via the DP fixture and the adapter.

2. The interface component as described in claim 1, characterized in that, The first high-speed differential signal positive terminal, the first high-speed differential signal negative terminal, the second high-speed differential signal positive terminal, the second high-speed differential signal negative terminal, the third high-speed differential signal positive terminal, the third high-speed differential signal negative terminal, the fourth high-speed differential signal positive terminal, and the fourth high-speed differential signal negative terminal of the Type-C male connector are respectively connected to the first channel signal positive terminal, the first channel signal negative terminal, the second channel signal positive terminal, the second channel signal negative terminal, the third channel signal positive terminal, the third channel signal negative terminal, the fourth channel signal positive terminal, and the fourth channel signal negative terminal of the DP female connector; The first SUB terminal and the second SUB terminal of the Type-C male connector are respectively connected to the positive terminal of the auxiliary channel signal and the negative terminal of the auxiliary channel signal of the DP female connector; The first channel configuration terminal of the Type-C male connector is connected to the hot-plug detection terminal of the DP female connector; The first configuration terminal, the second configuration terminal, and the DP_PWR terminal of the DP female connector are grounded.

3. The interface component as described in claim 2, characterized in that, The Type-C male connector and DP female connector are mounted on the PCB board and are connected by traces on the PCB board.

4. The interface component as described in any one of claims 1 to 3, characterized in that, The adapter is used for DP1.4 physical layer consistency testing of the device under test.

5. A testing system, characterized in that, Includes the interface component described in any one of claims 1 to 4.

6. The testing system as described in claim 5, characterized in that, It also includes an oscilloscope, and the adapter in the interface assembly is used to connect the device under test and the DP fixture, the DP fixture being used to connect to the oscilloscope.

7. The testing system as described in claim 6, characterized in that, The DP fixture includes an SMA interface for connecting the oscilloscope.

8. The testing system as described in claim 6, characterized in that, The device under test is configured to store test code.

9. The testing system as described in claim 6, characterized in that, The device under test is configured to support the DP1.4 protocol.

10. The testing system as described in claim 6, characterized in that, The equipment to be tested includes onboard equipment for new energy vehicles.

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