Aging test device and aging test method thereof

Abstract

The embodiment of the invention relates to the technical field of equipment testing, and discloses an aging test device and an aging test method thereof. The aging test device is used for testing two inverters of the same model, and comprises a first connection circuit, a battery simulation circuit providing a first output voltage and a switching circuit. And the switching circuit and the first connecting circuit take the output of one inverter as the input of the other inverter to form a first closed-loop test loop or a second closed-loop test loop. According to the testing device, energy can be recycled in a closed-loop system, and electric energy consumption and heat productivity are remarkably reduced. Moreover, the two inverters to be tested can be matched with each other in voltage and frequency, so that the strict requirement on the voltage output range of the battery simulation circuit is reduced.

Description

Technical Field

[0001] This application relates to the field of equipment testing technology, and in particular to an aging test device and an aging test method thereof. Background Technology

[0002] An inverter is a device that converts alternating current (AC) to direct current (DC). It is widely used in various technological fields, including renewable energy and uninterruptible power supplies (UPS).

[0003] To ensure product reliability and performance stability, inverter products need to undergo aging tests before leaving the factory, simulating long-term use with one or more simulation devices. This ensures the reliability of the inverter products during long-term use and identifies potential faults and design defects.

[0004] However, existing inverter aging test methods have many drawbacks, such as high energy consumption, excessive heat generation, and high overall cost of simulation equipment. Therefore, there is an urgent need to provide an aging test method that can effectively eliminate these adverse effects. Summary of the Invention

[0005] This application provides an aging test device and aging test method, which aims to solve at least some of the defects in traditional inverter aging test schemes.

[0006] Firstly, this application provides an aging test apparatus. This aging test apparatus is applied to two inverters of the same model and includes: a first connection circuit, which establishes electrical connections with the battery connection terminals of the first inverter under test and the second inverter under test, respectively; a switching circuit; the switching circuit having a first connection terminal, a second connection terminal, a third connection terminal, and a fourth connection terminal; the first connection terminal being electrically connected to the grid connection terminal of the first inverter under test; the second connection terminal being electrically connected to the grid connection terminal of the second inverter under test; the third connection terminal being electrically connected to the inverter output terminal of the first inverter under test; and the fourth connection terminal being connected to the inverter output terminal of the second inverter under test; a battery simulation circuit; and so on. The battery simulation circuit establishes an electrical connection with the battery connection terminal of the first inverter under test or the second inverter under test through the first connection circuit to provide a first output voltage; wherein, when an electrical connection is established between the first connection terminal and the fourth connection terminal of the switching circuit, and the second connection terminal of the switching circuit is disconnected from the third connection terminal, the first inverter under test and the second inverter under test form a first closed-loop test circuit; when the first connection terminal and the fourth connection terminal of the switching circuit are disconnected, and the second connection terminal of the switching circuit is established with the third connection terminal, the first inverter under test and the second inverter under test form a second closed-loop test circuit.

[0007] At least one advantage of the aging test apparatus of this application embodiment is that: by utilizing a switching circuit and a first connection circuit, a back-to-back connection is established between a first inverter under test and a second inverter under test, and the output of one inverter is used as the input of another inverter to form a first closed-loop test circuit or a second closed-loop test circuit. Thus, energy can be recycled within the closed-loop test circuit, significantly reducing the electrical energy consumed in the aging test and consequently reducing heat generation.

[0008] Moreover, two identical inverters under test can match each other's voltage and frequency, enabling them to work together more stably in a closed-loop system with higher compatibility. This reduces the stringent requirements on the voltage output range of the battery simulation circuit, thereby reducing the implementation cost of the aging test device.

[0009] In some embodiments, the first connection circuit includes: a first electrical switch and a second electrical switch; wherein the battery connection terminal of the first inverter under test is electrically connected to the battery connection terminal of the second inverter under test through the first electrical switch; and the battery simulation circuit is electrically connected to the battery connection terminal of the first inverter under test through the second electrical switch.

[0010] At least one advantage of the aging test apparatus of this application embodiment is that by setting an electrical switch, the aging test apparatus can conveniently form or disconnect the electrical connection between corresponding devices or nodes according to the received instruction information, thereby meeting the control needs of the aging test process.

[0011] In some embodiments, the switching circuit includes: a third electrical switch and a fourth electrical switch that are independent of each other; wherein, the two ends of the third electrical switch form the first connection terminal and the fourth connection terminal respectively; the two ends of the fourth electrical switch form the second connection terminal and the third connection terminal respectively; in response to the third electrical switch being closed and the fourth electrical switch being open, the first inverter under test and the second inverter under test form a first closed-loop test circuit; in response to the third electrical switch being open and the fourth electrical switch being closed, the first inverter under test and the second inverter under test form a second closed-loop test circuit.

[0012] At least one advantage of the aging test apparatus of this application embodiment is that the function of switching circuit is simply realized by the combination of two electrical switches. It is convenient and simple to control the closing / opening of the two electrical switches so that the first inverter under test and the second inverter under test can operate in different modes respectively to perform aging tests of corresponding functions.

[0013] In some embodiments, the aging test apparatus further includes: a second connection circuit, which establishes an electrical connection with the photovoltaic connection terminals of the first inverter under test and the second inverter under test, respectively; a photovoltaic simulation circuit, which is connected to the photovoltaic connection terminals of the first inverter under test and / or the second inverter under test through the second connection circuit, for providing a preset second output voltage; the second output voltage is adjustable within a preset second voltage range; and a load circuit, which is electrically connected to the first inverter under test and the second inverter under test, for providing at least one AC load state.

[0014] At least one advantage of the aging test apparatus of this application embodiment is that, by additionally setting up a photovoltaic simulation circuit and a load circuit, aging tests on the photovoltaic output function of the inverter under test can be realized, thus enriching the test functions of the aging test apparatus.

[0015] In some embodiments, the photovoltaic simulation circuit includes: a first photovoltaic simulation circuit and a second photovoltaic simulation circuit; the third connection circuit includes: a fifth electrical switch and a sixth electrical switch; the load circuit includes: a first load circuit and a second load circuit; wherein, the photovoltaic connection terminal of the first inverter under test is electrically connected to the first photovoltaic simulation circuit through the fifth electrical switch; the photovoltaic connection terminal of the second inverter under test is electrically connected to the second photovoltaic simulation circuit through the sixth electrical switch; the first load circuit is electrically connected to the first inverter under test, and the second load circuit is electrically connected to the second inverter under test.

[0016] At least one advantage of the aging test apparatus of this application embodiment is that: an independent set of photovoltaic simulation circuits and load circuits are set for the two inverters under test, so that the aging test of the photovoltaic input function of the first inverter under test and the second inverter under test can be completed independently.

[0017] In some embodiments, the aging test apparatus further includes a seventh electrical switch; wherein the photovoltaic simulation circuit is electrically connected to the battery connection terminal of the first inverter under test or the second inverter under test via the seventh electrical switch.

[0018] At least one advantage of the aging test apparatus of this application embodiment is that: by establishing an electrical connection between the photovoltaic simulation circuit and the battery connection terminal of one of the inverters under test through an additionally provided seventh electrical switch, the photovoltaic simulation circuit can also have the function of providing DC power to the battery connection terminal of the inverter under test, as a backup for the battery simulation circuit.

[0019] In some embodiments, the AC load state includes: a grid-connected load state and an off-grid load state; the load circuit includes: a grid connection unit configured to: form a power transmission path between the grid connection terminal of the first inverter under test or the second inverter under test and the grid, so that the grid-connected load state is applied to the grid connection terminal; and an energy feedback unit disposed between the inverter output terminal of the first inverter under test or the second inverter under test and the grid, configured to: apply the off-grid load state to the inverter output terminal.

[0020] At least one advantage of the aging test device in this application embodiment is that by setting up a grid connection unit and an energy feedback unit, the aging test device can be compatible with the aging test of the photovoltaic input function of grid-connected inverters and off-grid inverters, further enriching the functions of the aging test device.

[0021] In some embodiments, the power grid connection unit further includes an air switch; wherein the air switch is disposed on the power transmission path and configured to automatically disconnect the power transmission path in response to a fault.

[0022] At least one advantage of the aging test device in this application embodiment is that: setting an additional air switch on the power transmission path connected to the power grid can play a protective role, and in the event of an accident or fault such as a short circuit or overload, the electrical connection between the inverter under test and the power grid can be cut off in a timely manner.

[0023] Secondly, this application also provides an aging test method. This aging test method is applied to the aging test apparatus described above. It includes the following steps: controlling a first connection circuit and a switching circuit to form a first closed-loop test circuit between a first inverter under test and a second inverter under test; controlling a battery simulation circuit to provide a first output voltage to the first closed-loop test circuit for a first aging test; after the first aging test has elapsed for a preset time, obtaining the charging function aging test result of the first inverter under test and the discharging function aging test result of the second inverter under test; controlling the switching circuit to form a second closed-loop test circuit between the first inverter under test and the second inverter under test; controlling the battery simulation circuit to provide a first output voltage to the second closed-loop test circuit for a second aging test; after the second aging test has elapsed for the preset time, obtaining the discharging function aging test result of the first inverter under test and the charging function aging test result of the second inverter under test.

[0024] At least one advantage of the aging test method in this application is that by controlling the various functional circuits in the aging test device, the first inverter under test and the second inverter under test form a closed-loop test circuit and work alternately in different modes to complete the aging test of the charging and discharging functions of the two inverters under test.

[0025] Throughout the aging test, the two inverters under test maintained similar voltages and frequencies, enabling them to operate stably and collaboratively within the closed-loop system. Furthermore, the overall testing method was simple and required minimal skill from technical personnel.

[0026] In some embodiments, the method further includes: controlling the photovoltaic simulation circuit to provide a second output voltage to the photovoltaic connection terminals of the first inverter under test and the second inverter under test through the second connection circuit, while controlling the load circuit to provide a preset AC load state to the first inverter under test and the second inverter under test, and performing a third aging test; after the third aging test has elapsed for the preset duration, obtaining the photovoltaic input function aging test results of the first inverter under test and the second inverter under test.

[0027] At least one advantage of the aging test method in this application is that by controlling the photovoltaic simulation circuit to provide photovoltaic DC power input and controlling the load circuit to form a corresponding inverter load, the aging test of the photovoltaic input function of the inverter under test is realized, thereby realizing the complete aging test of all functions and ports of the inverter under test, and ensuring the stability of the product. Attached Figure Description

[0028] One or more embodiments are illustrated by way of example with reference to the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements having the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the drawings are not to be limited by scale.

[0029] Figure 1 This is a typical schematic diagram of an inverter product;

[0030] Figure 2 This is a schematic diagram of a typical inverter aging test equipment;

[0031] Figure 3 This is a schematic diagram of the aging test apparatus provided in the embodiments of this application;

[0032] Figure 4 This is a schematic diagram of an aging test apparatus provided in another embodiment of this application, showing another scenario of the circuit connection mode switching circuit;

[0033] Figure 5 This is a schematic diagram of an aging test apparatus provided in another embodiment of this application;

[0034] Figure 6 This is a schematic diagram of the load circuit provided in an embodiment of this application;

[0035] Figure 7 This is a schematic diagram of the aging test apparatus provided in the embodiments of this application, showing the configuration of two photovoltaic simulation circuits and two load circuits;

[0036] Figure 8 This is a flowchart of the aging test method provided in the embodiments of this application;

[0037] Figure 9 This is a flowchart of an aging test method provided in another embodiment of this application;

[0038] Figure 10 This is a schematic diagram of the electronic device provided in the embodiments of this application. Detailed Implementation

[0039] The present application will now be described in detail with reference to specific embodiments. It should be emphasized that the following description is merely exemplary and is not intended to limit the scope and application of the present application.

[0040] It should be noted that, unless otherwise expressly specified and limited, the terms "center," "longitudinal," "lateral," "upper," "lower," "vertical," "horizontal," "inner," and "outer," etc., used in this specification to indicate orientation or positional relationships are based on the orientation or positional relationships shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on this application. The terms "installed," "connected," "linked," and "fixed," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features; thus, features defined with "first" or "second" may explicitly or implicitly include one or more of that feature; "multiple" means two or more; and "and / or" includes any and all combinations of one or more related listed items. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0041] The term "inverter under test" refers to an inverter product that has not yet undergone aging tests to verify its performance, stability, and durability. An inverter is an electrical device used to convert AC and DC power between each other. It needs to pass a series of aging tests to ensure that the performance, stability, and durability of inverters in the production or research and development stage meet the standards.

[0042] To clarify the definition and concept of inverters, the following will combine... Figure 1 The functions and usage of a typical inverter are described in detail.

[0043] like Figure 1 As shown, based on the functions of the ports, the inverter 20 can have a grid connection terminal AC, an inverter output terminal INV, a battery connection terminal BAT, and a photovoltaic connection terminal PV.

[0044] The AC terminal is the port connecting the inverter to the power grid. It can serve as the inverter's output / input terminal, providing alternating current to the grid or drawing power from the grid.

[0045] The inverter output terminal INV is the port where the inverter connects to other load devices. As the inverter output terminal, it can provide the necessary AC power to one or more load devices to support their operation.

[0046] The battery connection terminal (BAT) is the port where the inverter connects to the energy storage device. It is a DC input / output terminal that can charge the energy storage device or draw electrical energy from the energy storage device and convert it into AC output.

[0047] The photovoltaic (PV) connector is the port where the inverter connects to the photovoltaic (PV) modules. As a DC input, it can receive electrical energy from one or more PV modules and convert it into AC power to be fed back to the grid or to support the operation of other load devices.

[0048] In actual use, the inverter 20 has the function of converting DC power to AC power. It can obtain DC power from the battery connection terminal BAT, convert it into AC power, and output it from the inverter output terminal INV.

[0049] Inverter 20 also has an AC-to-DC charging function. It can obtain AC power from the grid connection terminal, convert it into DC power, and then output it from the battery connection terminal BAT to charge energy storage devices.

[0050] In addition, inverter 20 also has a photovoltaic output function that uses photovoltaic modules as a power supply. It can receive electrical energy generated by photovoltaic modules from the photovoltaic connection terminal PV and convert it into alternating current (AC) and / or output it from the grid connection terminal AC and / or inverter output terminal INV to feed electrical energy back to the grid or support the operation of load equipment.

[0051] It should be noted that, Figure 1 The examples illustrate various ports and functions that an inverter may possess, but are not intended to specifically limit the inverters to which this application applies. Those skilled in the art will understand that an inverter product may only have... Figure 1 Some of the functions or ports shown may also have Figure 1 No functions or ports are displayed.

[0052] The term "aging test" refers to the process used to assess and identify the performance and reliability of electrical equipment during long-term use. It involves providing a specific simulated operating environment, causing one or more functions of the electrical equipment to operate for an extended period, to identify potential faults and performance degradation. For example, providing a simulated operating environment allows an inverter to operate for an extended period under specific load and / or environmental conditions, performing its charging, discharging, and / or photovoltaic output functions, and observing the inverter's power conversion to identify potential performance degradation.

[0053] In classic inverter aging test methods, resistors are typically used as the inverter output load to consume the electrical energy output by the inverter during the aging test. This method results in significant energy waste and generates substantial heat due to the Joule effect of the resistor, putting considerable stress on the ambient temperature of the factory and production line, and may even require additional cooling equipment to ensure a suitable temperature.

[0054] To overcome the shortcomings of traditional resistive load simulation, sometimes... Figure 2 The diagram shows a typical aging test setup. This setup mainly consists of a bidirectional DC power source 1, a charging module 2, and a grid simulator 3. The bidirectional DC power source 1 is connected to the battery connection terminal of the inverter under test (UDT) to simulate a battery pack used as an energy storage device, providing the UDT with the battery output voltage. The charging module 2 is connected to the photovoltaic connection terminal of the UDT to simulate a photovoltaic module, providing the UDT with the photovoltaic output voltage. The grid simulator 3 is connected to both the grid connection terminal and the inverter output terminal of the UDT to simulate inverter load conditions and provide power to the bidirectional DC power source 1 and the charging module 2.

[0055] After connecting to the inverter under test (UUT) product 20, the system is controlled according to a preset method. The connection between the bidirectional DC power source 1, the charging pile module 2, and the grid simulator 3 is established by opening or closing a switch, completing an aging test of one or more functions of the UUT product. During the aging test, relevant data from the inverter product is acquired via the COM port through a corresponding terminal device 4 (e.g., a personal computer or other control terminal).

[0056] In the process of developing this application, the applicant discovered that existing aging test equipment is costly to implement. Moreover, due to limitations of the bidirectional DC power source 1, charging pile module 2, and grid simulator 3, the range of test voltage output and input is limited, making it unable to adequately test various inverter models or to test the photovoltaic input function of off-grid inverters.

[0057] In response to the aforementioned defects and problems, the aging test device provided in this application ingeniously forms a closed-loop system by establishing a back-to-back connection between two inverters with the same design performance characteristics and using the output of one inverter as the input of the other.

[0058] This closed-loop system can significantly reduce energy consumption during the aging test of the inverter's charging and discharging functions. It can also reduce the voltage range requirements of the DC voltage provided by the analog equipment by utilizing the voltage and frequency matching of the two inverters.

[0059] In addition, the aging test device is equipped with appropriate load circuit settings, enabling it to be compatible with photovoltaic input function testing of both grid-connected and off-grid inverters, thus providing richer and more complete functionality.

[0060] Figure 3 This application provides an aging test device. This aging test device can simultaneously connect two inverters of the same model or with the same technical parameters to perform aging tests.

[0061] like Figure 3 As shown, for ease of description, the two inverters under test are referred to as "first inverter under test 21" and "second inverter under test 22", respectively. The aging test device 10 includes: a first connection circuit 11, a battery simulation circuit 12, and a switching circuit 14.

[0062] Here, "connection circuit" refers to electrical components used to form connection lines between multiple devices or nodes, including but not limited to switches or connecting cables. The specific connection circuit used can be selected according to the actual needs, and no specific limitation is made here.

[0063] For details, please continue reading. Figure 3 The first connection circuit 11 may include: a first electrical switch S1 and a second electrical switch S2.

[0064] In this circuit, the battery connection terminal BAT1 of the first inverter under test 21 is electrically connected to the battery connection terminal BAT2 of the second inverter under test 22 via the first electrical switch S1. The output terminal of the battery simulation circuit 12 is electrically connected to the battery connection terminal BAT1 of the first inverter under test via the second electrical switch S2.

[0065] Therefore, by outputting corresponding control signals or applying corresponding control actions, closing the first electrical switch S1 establishes an electrical connection between the battery terminals of the two inverters under test, while closing the second electrical switch S2 establishes an electrical connection between the battery simulation circuit 12 and the first inverter under test. When it is not necessary to establish the corresponding electrical connection, the first electrical switch S1 and the second electrical switch S2 can be opened.

[0066] The above-mentioned method of setting up electrical switches to connect circuits allows for easy establishment or disconnection of electrical connections between corresponding components or nodes by controlling the electrical switches, providing convenience for technicians' operation and aging test processes.

[0067] The battery simulation circuit 12 is a functional circuit used to simulate an energy storage battery pack, capable of providing an appropriate DC output voltage. Specifically, it can be any suitable type of power supply circuit, such as a typical switching power supply circuit, as long as it can provide the required DC output voltage, depending on the actual needs.

[0068] In this embodiment, for ease of description and distinction, the DC voltage generated or provided by the battery simulation circuit 12 can be referred to as the "first output voltage". It is understood that the voltage value of the first output voltage can be adjusted within a preset first voltage range to meet the simulation requirements of different models of inverter products or the battery pack output voltage during aging tests of inverter products.

[0069] The switching circuit 14 is a functional circuit with multiple different connection terminals and capable of switching between different electrical connection modes according to different external commands. The "electrical connection mode" refers to the specific connection method between the connection terminals.

[0070] In this embodiment, the electrical connection mode switching circuit 14 can be configured to have a first connection terminal, a second connection terminal, a third connection terminal, and a fourth connection terminal. The first connection terminal is electrically connected to the grid connection terminal of the first inverter under test. The second connection terminal is electrically connected to the grid connection terminal of the second inverter under test. The third connection terminal is electrically connected to the inverter output terminal of the first inverter under test. The fourth connection terminal is connected to the inverter output terminal of the second inverter under test.

[0071] Therefore, an electrical connection is established between the first and fourth connection terminals of the switching circuit. When the second and third connection terminals of the switching circuit are disconnected, the first inverter under test and the second inverter under test will form a first closed-loop test circuit. At this time, the first inverter under test operates in charging mode, serving as the energy receiving end of the circuit, while the second inverter under test operates in discharging mode, serving as the energy output end of the circuit.

[0072] When the first and fourth connection terminals of the switching circuit are disconnected, and the second and third connection terminals of the switching circuit are electrically connected, a second closed-loop test circuit is formed between the first inverter under test and the second inverter under test. At this time, the operating modes of the two inverters under test are interchanged, with the first inverter under test acting as the energy output terminal of the circuit and the second inverter under test acting as the energy receiving terminal of the circuit.

[0073] Specifically, the switching circuit 14 can be implemented in a variety of different ways. For example, as Figure 2 As shown, the switching circuit 14 may include a third electrical switch S3 and a fourth electrical switch S4.

[0074] Specifically, the grid connection terminal AC1 of the first inverter under test 21 is electrically connected to the inverter output terminal INV2 of the second inverter under test 22 via the third electrical switch S3. The inverter output terminal INV1 of the first inverter under test 21 is electrically connected to the grid connection terminal AC2 of the second inverter under test 22 via the fourth electrical switch S4.

[0075] Therefore, when the third electrical switch S3 is closed and the fourth electrical switch S4 is open, the first inverter under test and the second inverter under test will form a first closed-loop test circuit. When the third electrical switch S3 is open and the fourth electrical switch S4 is closed, the first inverter under test and the second inverter under test will form a second closed-loop test circuit.

[0076] The electrical connection mode circuit provided in this application embodiment can be easily implemented by a combination of two electrical switches. The overall topology is simple and the control switching operation is convenient.

[0077] Alternatively, the electrical connection mode switching circuit 14 can also be implemented using a switching electrical switch. For example... Figure 4 As shown, the switching electrical switch S03 has two sets of connection nodes K11 and K12. One set of connection nodes K11 is electrically connected to the grid connection terminal AC1 of the first inverter under test 21 and the inverter output terminal INV2 of the second inverter under test 22, respectively. The other set of connection nodes K12 is connected to the inverter output terminal INV1 of the first inverter under test 21 and the grid connection terminal AC2 of the second inverter under test 22.

[0078] Therefore, by selectively configuring the electrical connection methods of the two sets of connection nodes K11 and K12, the same effect can be achieved, so that the first inverter under test and the second inverter under test form a first closed-loop test circuit or a second closed-loop test circuit.

[0079] In the embodiments of this application, please continue to refer to Figure 3 and Figure 4 Through the first connection circuit 11 and the switching circuit 14, the two inverters under test can be connected back-to-back to form a closed-loop system. When the AC output (i.e., grid connection terminal AC1) of the first inverter under test 21 is connected to the AC input (i.e., inverter output terminal INV2) of the second inverter under test 22, this is called the first closed-loop test circuit. When the AC output (i.e., grid connection terminal AC2) of the second inverter under test 22 is connected to the AC input (i.e., inverter output terminal INV1) of the first inverter under test 21, this is called the second closed-loop test circuit.

[0080] Therefore, in the first closed-loop test circuit, the first inverter under test 21 will be in the discharge function, converting DC voltage into AC voltage output, while the second inverter under test 22 will be in the charging function, serving as the load of the first inverter under test 21.

[0081] Conversely, in the second closed-loop test circuit, the second inverter under test 22 will switch to the discharge function, converting the DC voltage to the AC voltage output, while the first inverter under test 22 will switch to the charging function, serving as the load of the second inverter under test 22.

[0082] During the actual aging test, the battery simulation circuit 12 provides and replenishes power to the entire closed-loop system to maintain the operation of the aging test. By controlling the switching circuit 14, the first inverter under test 21 and the second inverter under test 22 can alternately operate in the discharge and charging functions for an appropriate time, thereby completing the aging test of the charging and discharging functions of the two inverters under test.

[0083] The aging test device in this application embodiment utilizes an electrical connection mode switching circuit and a first connection circuit to realize a back-to-back connection between two inverters under test, forming a closed-loop system.

[0084] Therefore, during the aging test, electrical energy can be recycled within the closed-loop system, significantly reducing energy consumption and heat generation. Furthermore, when the first and second inverters under test are of the same model, their voltage and frequency can be matched, resulting in higher compatibility and more stable collaborative operation within the closed-loop system. This reduces the stringent requirements on the voltage output range of the battery simulation circuit, thereby lowering the implementation cost of the aging test device.

[0085] In addition to aging tests on the charging and discharging functions of the inverter, the aging test device can be further equipped with aging test capabilities for the photovoltaic input function of the inverter by adding appropriate functional circuits. This enables aging tests on all ports and functions of the inverter product, further ensuring the reliability of the product during long-term operation.

[0086] Figure 5 An aging test apparatus is provided for another embodiment of this application. For example... Figure 5 As shown, in addition to the functional circuits related to the aging test of the charging and discharging functions in the above embodiments, the aging test device also includes: a photovoltaic simulation circuit 15, a second connection circuit 16, and a load circuit 17.

[0087] The photovoltaic simulation circuit 15 is a functional circuit used to simulate a photovoltaic module and provide an output voltage similar to that of a photovoltaic module. Similar to the battery simulation circuit 11 described above, it can be selected from any suitable type of power supply circuit according to actual needs, without specific limitations, such as a charging pile module that provides DC power.

[0088] In this embodiment, the output voltage generated or provided by the photovoltaic simulation circuit 15 can be referred to as the "second output voltage". It is understood that the voltage value of the second output voltage can also be adjusted within a preset second voltage range to meet the simulation requirements of photovoltaic module output voltage for different models of inverter products or inverter products during aging tests.

[0089] The second connection circuit 16 is a connection circuit distinct from the first connection circuit 11. It is used to establish an electrical connection between the photovoltaic simulation circuit 15 and the photovoltaic connection terminal of the inverter under test, so that the second output voltage output by the photovoltaic simulation circuit 15 can be provided to the corresponding inverter under test.

[0090] Load circuit 17 is a functional circuit connected to the load output of the inverter under test (UDT). It provides an AC load state to the UDT to enable it to complete the aging test of the photovoltaic input function. In other words, during the actual aging test, load circuit 17 acts as a load on the UDT, consuming its AC output.

[0091] For details, please continue reading. Figure 5 In conjunction with the aging test device, the photovoltaic simulation circuit 15 and the load circuit 17 can be configured as two sets, respectively referred to as the first photovoltaic simulation circuit 15a, the first load circuit 17a, the second photovoltaic simulation circuit 15b, and the second load circuit 17b.

[0092] The second connection circuit 16 includes a fifth electrical switch S5 and a sixth electrical switch S6, which are used to establish electrical connections between two sets of photovoltaic simulation circuits and two inverters under test, respectively.

[0093] The first photovoltaic simulation circuit 15a is electrically connected to the photovoltaic connection terminal PV1 of the first inverter under test 21 via the fifth electrical switch S5, and the first load circuit 17a is electrically connected to the AC output (i.e., the grid connection terminal AC1 and the inverter output terminal INV1) of the first inverter under test. The second photovoltaic simulation circuit 15b is electrically connected to the photovoltaic connection terminal PV2 of the second inverter under test 22 via the sixth electrical switch S6, and the second load circuit 17b is electrically connected to the AC output (i.e., the grid connection terminal AC2 and the inverter output terminal INV2) of the second inverter under test 22.

[0094] Therefore, by controlling the closing and opening of the fifth electrical switch S5 and the sixth electrical switch S6, the photovoltaic input provided by the two photovoltaic simulation circuits to the two inverters under test can be independently controlled, and then the aging test of the photovoltaic input function of the first inverter under test and the second inverter under test can be completed through the corresponding load circuit.

[0095] The aging test device of this application embodiment can realize the aging test of the photovoltaic output function of the inverter under test by additionally setting photovoltaic simulation circuit and load circuit, thus enriching and improving the test function of the aging test device.

[0096] In some embodiments, please continue reading Figure 5 The aging test apparatus may also include an additional seventh electrical switch S7. This seventh electrical switch S7 is connected to one of the photovoltaic analog circuits ( Figure 5 The example shown is a first photovoltaic analog circuit 15a) and the battery connection terminal of one of the inverters under test. Figure 5 The example shown is the electrical connection of the battery terminal (BAT1) of the first inverter under test 21.

[0097] Therefore, after the seventh electrical switch S7 is closed, the DC voltage output by the first photovoltaic simulation circuit 15a can also supply power to the battery connection terminal of the inverter under test, serving as a backup for the battery simulation circuit.

[0098] Traditionally, inverter products are categorized into grid-connected inverters and off-grid inverters. This application further provides a suitably configured load circuit to support testing of the photovoltaic input function for both inverter types.

[0099] Figure 6 This is a schematic diagram of the load circuit provided in an embodiment of this application. For example... Figure 6As shown, the load circuit 17 includes a power grid connection unit 171 and an energy feedback unit 172.

[0100] The grid connection unit 171 is a connection line that connects the AC terminal of the inverter under test to the grid GRID. It can be used to form a fourth power transmission path, connecting the AC terminal of the inverter under test to the grid GRID, thereby allowing the grid GRID to provide grid-connected load status for the inverter under test.

[0101] For details, please continue reading. Figure 6 The power grid connection unit 171 can be composed of an eighth electrical switch 1711 and an air switch 1713 connected in series.

[0102] The eighth electrical switch 1711 is connected at both ends to the AC terminal of the inverter under test and one end of the air switch 1713, respectively. The other end of the air switch 1713 is connected to the grid.

[0103] Therefore, by controlling the closing of the eighth electrical switch 1711, the aforementioned fourth power transmission path can be formed, allowing the AC terminal of the inverter under test to be connected to the grid GRID. When the eighth electrical switch 1711 is disconnected, the fourth power transmission path will be interrupted.

[0104] The circuit breaker 1713 provides additional protection. In the event of an accident or malfunction such as a short circuit or overload, the circuit breaker 1713 will automatically disconnect, thereby promptly cutting off the electrical connection between the inverter under test and the power grid to ensure the safety of the testing process.

[0105] The energy feedback unit 172 is a functional circuit used to realize energy recovery and thus simulate real load conditions. It is located between the inverter output terminal INV of the inverter under test and the grid GRID. When activated, it can provide the inverter under test with an off-grid load state, serving as the load of the off-grid inverter.

[0106] Specifically, any suitable type of AC energy feedback circuit can be selected according to the actual needs, without any specific limitations here.

[0107] Therefore, when the inverter under test is an off-grid inverter, the energy feedback unit 172 can be activated to provide and simulate the off-grid load state required by the off-grid inverter under test, thereby completing the aging test of the photovoltaic input function. When the inverter under test is a grid-connected inverter, the grid connection unit 171 can be controlled to establish a fourth power transmission path to connect the AC terminal of the inverter under test to the grid GRID, and the grid GRID will provide the grid-connected load state required by the inverter under test.

[0108] The aging test device in this application embodiment, by setting up a grid connection unit and an energy feedback unit, enables the aging test device to be compatible with the aging test of the photovoltaic input function of both grid-connected inverters and off-grid inverters, further enriching the functions of the aging test device.

[0109] Based on the aging test apparatus provided in the embodiments of this application, this application further provides an aging test method that applies the aging test apparatus of one or more of the above embodiments.

[0110] To fully describe the inventive concept of the aging test method provided in the embodiments of this application, the following is combined with Figure 7 The aging test apparatus shown is described in detail.

[0111] It should be noted that, Figure 7 One or more functional circuits in the aging test apparatus shown can be omitted or adjusted, as long as they can satisfy and implement one or more method steps described in the following embodiments.

[0112] Figure 7 This is merely an illustrative description of the aging test apparatus corresponding to the aging test method, and is not intended to specifically limit the aging test apparatus. For example, Figure 7 The multiple electrical switches S1 to S7 shown can be AC ​​contactors that meet the usage specifications, or other suitable switching devices.

[0113] Figure 8 The aging test method provided in the embodiments of this application. Figure 8 As shown, the method may include the following steps:

[0114] S100: Control the first connection circuit and the switching circuit to form a first closed-loop test circuit between the first inverter under test and the second inverter under test.

[0115] The specific control method for the first connection circuit 11 and the switching circuit can be determined based on their specific implementation. For example, using... Figure 7 When using the electrical switch shown, control can be achieved by configuring the closing / opening of the electrical switch.

[0116] S200 controls the battery simulation circuit to provide the first output voltage for the first closed-loop test circuit and perform the first aging test.

[0117] The operation of the battery simulation circuit 12 can be controlled or configured in any suitable manner. Its specific implementation can also be determined by the form in which the battery simulation circuit 12 is implemented. For example, when the battery simulation circuit 12 is a switching power supply, the DC voltage required for aging testing can be controlled by providing an analog signal.

[0118] S300: After the first aging test has been performed for a preset time, the charging function aging test results of the first inverter under test and the discharging function aging test results of the second inverter under test are obtained.

[0119] The "preset duration" is an empirical value that can be determined by technical personnel based on actual needs.

[0120] As described above, during the first aging test, the first inverter under test 21 performs the charging function, while the second inverter under test 22 performs the discharging function. After a suitable test period, based on the data collected from the two inverters under test, the corresponding aging test results for the charging function and the discharging function can be obtained.

[0121] S400 controls the switching circuit to form a second closed-loop test circuit between the first inverter under test and the second inverter under test.

[0122] The specific method for controlling the switching circuit can be determined by its specific implementation. For example, when using... Figure 7 When the electrical switches shown are open, this can be achieved by changing the closed / open state of the third and fourth electrical switches.

[0123] S500 controls the battery simulation circuit, providing the first output voltage for the second closed-loop test circuit to perform the second aging test.

[0124] The battery simulation circuit provides initial power to the closed-loop test circuit and replenishes the power lost during the cycle, maintaining...

[0125] S600: After the second aging test has been conducted for a preset period of time, the discharge function aging test results of the first inverter under test and the charging function aging test results of the second inverter under test are obtained.

[0126] The preset duration of the second aging test is also an empirical value determined by technicians based on actual needs. Specifically, it can be the same duration as step S300 to ensure the balance of the testing process for the two inverters under test.

[0127] As described above, during the second aging test, the first inverter under test 21 performs the discharging function, while the second inverter under test 22 performs the charging function. After a suitable period of time, based on the data collected from the two inverters under test, the corresponding aging test results for the charging function and the discharging function can be obtained.

[0128] It should be noted that the execution order of steps S100-S300 and S400-S600 can be interchanged, as long as the charging and discharging functions of the two inverters under test have sufficient test duration.

[0129] The aging test method provided in this application embodiment controls the functional circuit in the aging test device to form a closed-loop system between the first inverter under test and the second inverter under test, and by switching the electrical connection mode, the first inverter under test and the second inverter under test alternately work in different modes to complete the aging test of the charging and discharging functions of the two inverters under test.

[0130] Throughout the aging test, the two inverters under test maintained similar voltages and frequencies, enabling them to operate stably and collaboratively within the closed-loop system. Furthermore, the overall testing method was simple and required minimal skill from technical personnel.

[0131] In other embodiments, based on Figure 7 The aging test apparatus shown includes a photovoltaic simulation circuit and a load circuit. The aging test method may also include test steps for aging tests to implement photovoltaic input functionality. For example... Figure 9 As shown, in addition to steps S100 to S600 described above, this aging test method also includes:

[0132] S700, the photovoltaic analog circuit controls the second output voltage to the photovoltaic connection terminal of the inverter under test through the second connection circuit.

[0133] The specific control method for the second connection circuit 16 can also be determined based on the specific implementation of the connection circuit. For example, using... Figure 7 When the fifth electrical switch S5 and the sixth electrical switch S6 are shown, control can be achieved by configuring the closing / opening of the fifth electrical switch and the sixth electrical switch.

[0134] The S800 control load circuit provides a preset AC load state for the inverter under test and performs the third aging test.

[0135] S900: After the third aging test has been conducted for a preset period of time, the aging test results of the photovoltaic input function of the inverter under test are obtained.

[0136] The inverter under test can be either the first inverter under test or the second inverter under test mentioned above. Figure 7 This example demonstrates that, with the first photovoltaic simulation circuit 15a and the second photovoltaic simulation circuit 15b configured, a second output voltage can be provided to the first inverter under test 21 and the second inverter under test 22 by controlling the first photovoltaic simulation circuit 15a and the second photovoltaic simulation circuit 15b, respectively. With the first load circuit 17a and the second load circuit 17b configured, the required AC load state can be provided to the first inverter under test 21 and the second inverter under test 22 by controlling the first load circuit 17a and the second load circuit 17b, enabling the first inverter under test 21 and the second inverter under test 22 to perform photovoltaic input functions.

[0137] In actual testing, after the third photovoltaic test is performed for a sufficiently long time, the aging test results of the photovoltaic input function can be obtained based on the data information collected from the inverter under test.

[0138] The aging test method of this application embodiment provides photovoltaic DC power input by controlling the photovoltaic simulation circuit and controlling the load circuit to form a corresponding inverter load, thereby realizing the aging test of the photovoltaic input function of the inverter under test, thus realizing the complete aging test of all functions and ports of the inverter under test, and ensuring the stability of the product.

[0139] In some embodiments, please continue reading Figure 7 Each load circuit may include a grid connection unit 171 that forms a fourth power transmission path between the grid connection terminal of the inverter under test and the grid.

[0140] Figure 7 The example illustrates a scenario where corresponding grid connection units 171 are provided for the first inverter under test 21 and the second inverter under test 22, respectively. The two grid connection units are used to establish connections between the grid connection terminal AC1 of the first inverter under test 21 and the grid GRID, and between the grid connection terminal AC2 of the second inverter under test 22 and the grid GRID, respectively.

[0141] like Figure 9 As shown, when the inverter under test is a grid-connected inverter, step S800 specifically includes:

[0142] S810, Control the power grid connection unit to establish a power transmission path.

[0143] After establishing the power transmission path, the grid connection terminal of the corresponding inverter under test (such as the first inverter under test or the second inverter under test) is connected to the power grid. The power grid acts as the load of the inverter output, providing or applying the required grid-connected load state to the inverter under test.

[0144] Therefore, by controlling the photovoltaic simulation circuit to provide photovoltaic DC power input and controlling the grid connection unit to establish an electrical connection with the grid, the aging test of the photovoltaic input function of the grid-connected inverter can be achieved by simulating the grid-connected load.

[0145] For further information, please refer to [link / reference]. Figure 7 The load circuit also includes an energy feedback unit 172 disposed between the inverter output terminal of the inverter under test and the power grid.

[0146] Figure 7 The example illustrates a scenario where corresponding energy feedback units 172 are provided for the first inverter under test 21 and the second inverter under test 22, respectively. The two energy feedback units 172 are respectively located between the inverter output terminal INV1 of the first inverter under test 21 and the grid GRID, and between the inverter output terminal INV2 of the second inverter under test 22 and the grid GRID.

[0147] Please continue reading. Figure 9 When the inverter under test is an off-grid inverter, step S700 specifically includes:

[0148] S820, enable the energy feedback unit and disconnect the power transmission path.

[0149] With the activation of the energy feedback unit 172, which serves as the load of the inverter output of the corresponding inverter under test, the required off-grid load state can be applied to its inverter output terminal.

[0150] Therefore, by controlling the photovoltaic simulation circuit to provide photovoltaic DC power input and controlling the energy feedback unit to simulate off-grid AC load, aging detection of the photovoltaic input function of the off-grid inverter can also be achieved.

[0151] based on Figure 7 The aging test apparatus shown performs... Figure 9 The aging test method shown is compatible with aging tests of the photovoltaic input function of both off-grid and grid-connected inverters, so as to better meet the testing needs of various types of inverter products.

[0152] Figure 10 This is a schematic diagram of an electronic device provided in an embodiment of this application. The electronic device can be used to perform the aging test methods described in one or more of the above embodiments. The electronic device 30 can represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers, or various forms of mobile devices, such as personal digital assistants, cellular phones, smartphones, and other similar computing devices.

[0153] It should be noted that, Figure 10 The components, their connections and relationships, and their functions shown are for illustrative purposes only and are not intended to impose limitations on the specific implementation of the electronic device.

[0154] like Figure 10 As shown, the electronic device 30 may include a processor 301, a memory 302, a storage device 303, a high-speed interface 305 connected to the memory 302 and a plurality of high-speed expansion ports 304, and a low-speed interface 307 connected to a low-speed expansion port 306 and the storage device 303.

[0155] Each of the processor 301, memory 302, storage device 303, high-speed interface 305, high-speed expansion port 304, and low-speed interface 307 is interconnected using various buses and can be mounted on a common motherboard or other suitable methods.

[0156] The processor 501 can process computer program instructions stored in the memory 302 or on the storage device 303 for displaying graphical information on an external input / output device (e.g., a display 308 coupled to a high-speed interface 305).

[0157] In some embodiments, multiple processors and / or multiple buses may be used in conjunction with multiple memories and multiple types of memory. Furthermore, multiple electronic devices may be connected, each providing a portion of the necessary operation (e.g., as a server group, blade server cluster, or multiprocessor system).

[0158] Memory 302 stores information within an electronic device. It may be one or more volatile memory cells, non-volatile memory cells, or another form of computer-readable media, such as a magnetic disk or optical disk.

[0159] Storage device 303 can provide large-capacity storage for electronic devices. It may contain computer-readable media, such as floppy disk devices, hard disk devices, optical disk devices or magnetic tape devices, flash memory or other similar solid-state storage devices, or device arrays, including devices in storage area networks or other configurations.

[0160] Computer program instructions may be stored in an information carrier. When executed by one or more processing devices (e.g., processor 301), these computer program instructions control the aging test apparatus to implement the aging test method described in one or more of the above embodiments.

[0161] High-speed interface 305 manages bandwidth-intensive operations for electronic devices, while low-speed interface 307 manages lower bandwidth-intensive operations. In some embodiments, high-speed interface 305 is coupled to memory 302, display 308 (e.g., via a graphics processor or accelerator), and high-speed expansion port 304 that accepts various expansion cards. Low-speed interface 307 is coupled to storage device 303 and low-speed expansion port 306.

[0162] The low-speed expansion port 306 includes a communication port (e.g., USB, Ethernet, wireless Ethernet) and can be coupled to one or more input / output devices, such as a keyboard, pointing device, scanner, or a networked device such as a switch (e.g., via a network adapter).

[0163] For example, such as Figure 10 As shown, in order to provide interaction with the user, the electronic device 30 has a display device 308 (e.g., a cathode ray tube or liquid crystal display monitor) for displaying information to the user and a pointing device 309 (e.g., a mouse) that the user can use to provide input to the computer. Other types of devices can also be used to provide interaction with the user;

[0164] Of course, the feedback provided to the user can be any form of sensory feedback (such as visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form, including acoustic, voice, or tactile input.

[0165] The aging test method described in one or more embodiments of this application can be implemented in digital electronic circuits, integrated circuits, specially designed ASICs (Application-Specific Integrated Circuits), computer hardware, firmware, software, and / or combinations thereof. It may include embodiments of one or more computer programs that can be executed and / or interpreted on a programmable system comprising at least one programmable processor, which may be dedicated or general-purpose, coupled to receive data and instructions from a storage system, at least one input device, and at least one output device, and to transmit data and instructions to the storage system, at least one input device, and at least one output device.

[0166] These computer programs (also referred to as programs, software, software applications, or code) include machine instructions for a programmable processor and can be implemented using high-level programming and / or goal-oriented programming languages ​​and / or assembly / machine languages. In this embodiment, the terms "machine-readable medium" and "computer-readable medium" refer to any computer program product, device, and / or apparatus (e.g., disk, optical disk, memory, programmable logic device (PLD)) used to provide machine instructions and / or data to a programmable processor, including machine-readable media that receive machine instructions as machine-readable signals. The term "machine-readable signal" can refer to any signal used to provide machine instructions and / or data to a programmable processor.

[0167] The above description, in conjunction with specific / preferred embodiments, provides a further detailed explanation of this application and should not be construed as limiting the specific implementation of this application to these descriptions. Those skilled in the art can make various modifications and improvements without departing from the concept of this application, and all of these fall within the scope of protection of this application.

Claims

1. An aging test apparatus, applied to two inverters under test, characterized in that, The two inverters under test are the first inverter under test and the second inverter under test; The first inverter under test and the second inverter under test have the same model. The aging test device includes: A first connection circuit is established to establish electrical connections with the battery connection terminals of the first inverter under test and the second inverter under test, respectively. A switching circuit; the switching circuit has a first connection terminal, a second connection terminal, a third connection terminal, and a fourth connection terminal; the first connection terminal is electrically connected to the grid connection terminal of the first inverter under test; the second connection terminal is electrically connected to the grid connection terminal of the second inverter under test; the third connection terminal is electrically connected to the inverter output terminal of the first inverter under test; and the fourth connection terminal is connected to the inverter output terminal of the second inverter under test. Battery simulation circuit; the battery simulation circuit establishes an electrical connection with the battery connection terminal of the first inverter under test or the second inverter under test through the first connection circuit, and is used to provide a first output voltage; Wherein, when an electrical connection is established between the first connection terminal and the fourth connection terminal of the switching circuit, and when the second connection terminal of the switching circuit is disconnected from the third connection terminal, the first inverter under test and the second inverter under test form a first closed-loop test circuit. When the first connection terminal and the fourth connection terminal of the switching circuit are disconnected, and the second connection terminal and the third connection terminal of the switching circuit are electrically connected, the first inverter under test and the second inverter under test form a second closed-loop test circuit.

2. The aging test apparatus according to claim 1, characterized in that, The first connection circuit includes: a first electrical switch and a second electrical switch; The battery connection terminal of the first inverter under test is electrically connected to the battery connection terminal of the second inverter under test through the first electrical switch. The battery simulation circuit is electrically connected to the battery connection terminal of the first inverter under test via the second electrical switch.

3. The aging test apparatus according to claim 1, characterized in that, The switching circuit includes: a third electrical switch and a fourth electrical switch that are independent of each other; Wherein, the two ends of the third electrical switch form the first connection end and the fourth connection end respectively; the two ends of the fourth electrical switch form the second connection end and the third connection end respectively; In response to the third electrical switch being closed and the fourth electrical switch being open, the first inverter under test and the second inverter under test form a first closed-loop test circuit; in response to the third electrical switch being open and the fourth electrical switch being closed, the first inverter under test and the second inverter under test form a second closed-loop test circuit.

4. The aging test apparatus according to claim 1, characterized in that, Also includes: The second connection circuit establishes an electrical connection with the photovoltaic connection terminals of the first inverter under test and the second inverter under test, respectively. A photovoltaic simulation circuit is provided, which is connected to the photovoltaic connection terminal of the first inverter under test and / or the second inverter under test via the second connection circuit, and is used to provide a preset second output voltage; the second output voltage is adjustable within a preset second voltage range. A load circuit, which is electrically connected to the first inverter under test and the second inverter under test, is used to provide at least one AC load state.

5. The aging test apparatus according to claim 4, characterized in that, The photovoltaic simulation circuit includes: a first photovoltaic simulation circuit and a second photovoltaic simulation circuit; the third connection circuit includes: a fifth electrical switch and a sixth electrical switch; the load circuit includes: a first load circuit and a second load circuit; The photovoltaic connection terminal of the first inverter under test is electrically connected to the first photovoltaic simulation circuit through the fifth electrical switch; the photovoltaic connection terminal of the second inverter under test is electrically connected to the second photovoltaic simulation circuit through the sixth electrical switch; the first load circuit is electrically connected to the first inverter under test, and the second load circuit is electrically connected to the second inverter under test.

6. The aging test apparatus according to claim 4, characterized in that, Also includes: Seventh electrical switch; The photovoltaic simulation circuit is electrically connected to the battery connection terminal of the first inverter under test or the second inverter under test via the seventh electrical switch.

7. The aging test apparatus according to claim 4, characterized in that, The AC load status includes: grid-connected load status and off-grid load status; the load circuit includes: The grid connection unit is configured to form a power transmission path between the grid connection terminal of the first inverter under test or the second inverter under test and the grid, so that the grid-connected load state is applied to the grid connection terminal. An energy feedback unit is disposed between the inverter output terminal of the first inverter under test or the second inverter under test and the power grid, and is configured to apply an off-grid load state to the inverter output terminal.

8. The aging test apparatus according to claim 7, characterized in that, The power grid connection unit also includes: an air switch; The air switch is located on the power transmission path and is configured to automatically disconnect the power transmission path in response to a fault.

9. An aging test method, applied to the aging test apparatus as described in any one of claims 1-8, characterized in that, include: Control the first connection circuit and the switching circuit to form a first closed-loop test circuit between the first inverter under test and the second inverter under test. The control battery simulation circuit provides a first output voltage to the first closed-loop test circuit to perform the first aging test. After the first aging test has been performed for a preset time, the charging function aging test results of the first inverter under test and the discharging function aging test results of the second inverter under test are obtained. Control the switching circuit to form a second closed-loop test circuit between the first inverter under test and the second inverter under test. The battery simulation circuit is controlled to provide a first output voltage to the second closed-loop test circuit for performing a second aging test. After the second aging test has been conducted for the preset duration, the discharge function aging test results of the first inverter under test and the charging function aging test results of the second inverter under test are obtained.

10. The aging test method according to claim 9, characterized in that, Also includes: The photovoltaic simulation circuit provides a second output voltage to the photovoltaic connection terminals of the first inverter under test and the second inverter under test through the second connection circuit, while the load circuit provides a preset AC load state to the first inverter under test and the second inverter under test for the third aging test. After the preset time has elapsed in the third aging test, the photovoltaic input function aging test results of the first inverter under test and the second inverter under test are obtained.

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