General test system for electrical system equipment of carrier rocket

By constructing a universal testing system for the electrical systems of launch vehicles and using components such as multi-core processors and GPU acceleration boards, the problem of traditional testing systems being unable to adapt to testing multiple models has been solved, achieving efficient, accurate, and reliable testing results.

CN122017378APending Publication Date: 2026-05-12SHANGHAI HUANYU QIANKUN AEROSPACE TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHANGHAI HUANYU QIANKUN AEROSPACE TECH CO LTD
Filing Date
2025-03-05
Publication Date
2026-05-12

AI Technical Summary

Technical Problem

Traditional electrical system equipment testing systems designed for a single model or specific device are insufficient to meet the testing needs of multiple models and multiple tasks, resulting in low testing efficiency, high cost, and insufficient reliability.

Method used

A general-purpose test system for the electrical system equipment of a launch vehicle was designed. It adopts a multi-core processor, a GPU acceleration board, a redundant power supply design, an analog signal acquisition module, a digital signal receiving module, and a multi-bus interface module. Combined with a system-level scheduling and control strategy and a modular combination algorithm, a highly compatible test platform is constructed.

Benefits of technology

It enables efficient and accurate testing of electrical system equipment for different models and types of launch vehicles, improving testing efficiency, reducing costs, and enhancing the reliability and accuracy of testing.

✦ Generated by Eureka AI based on patent content.

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Patent Text Reader

Abstract

The invention discloses a general test system for electrical system equipment of a carrier rocket, and the system constructs a comprehensive test platform with high compatibility through a system-level scheduling control strategy, a modular combined algorithm collaborative design and an ultra-wide threshold hardware interface signal conditioning technology. Comprising a system logic processing platform, a system parallel computing platform, a system power supply module, a system analog quantity acquisition module, a system bus interface module and a system digital quantity receiving module. The test system can meet the test requirements of different models and different types of carrier rocket electrical system equipment, and can realize the general test of various mainstream carrier rocket electrical equipment.
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Description

Technical Field

[0001] This application relates to the field of rocket technology, specifically, it is a general testing system for electrical system equipment of launch vehicles. Background Technology

[0002] With the increasing demand for space travel, the variety of launch vehicle models is growing, especially reusable rockets which are becoming mainstream, leading to a continuous increase in the complexity of electrical systems. Traditional testing systems for electrical systems of single models or specific equipment are no longer sufficient to meet the testing needs of multiple models and missions. Developing a universal testing system capable of efficiently and accurately testing the electrical systems of various launch vehicles has become an urgent need in the aerospace field. This system would not only improve testing efficiency and reduce costs but also enhance reliability and accuracy, providing strong support for the successful launch of launch vehicles. Summary of the Invention

[0003] To address the aforementioned aerospace requirements, this application provides a general testing system for the electrical system equipment of a launch vehicle. It includes a system logic processing platform, a system parallel computing platform, a system power supply module, a system analog signal acquisition module, a system bus interface module, and a system digital signal receiving module. The system logic processing platform is equipped with a multi-core processor, employs a real-time operating system, and has microsecond-level task scheduling capabilities. Combined with a visual test script editor, it enables dynamic configuration and real-time monitoring of the test process. The system parallel computing platform is equipped with a GPU acceleration card, employs a message queue mechanism and a distributed computing architecture, and performs parallel real-time computation and fusion processing of test data. The system power supply module adopts an AC / DC redundant power supply design and has a built-in intelligent power management system that can dynamically adjust the power supply strategy according to the load. The system analog signal acquisition module is equipped with a high-bit analog-to-digital converter, supporting a wide range of current and voltage signal inputs and high sampling rates. The system bus interface module supports multiple mainstream bus protocols and multi-bus hybrid communication. The system digital signal receiving module is used to acquire digital signals, supports level adaptive input, and has electrical isolation protection capabilities.

[0004] This application constructs a highly compatible integrated test platform through system-level scheduling and control strategies, modular and combined algorithmic collaborative design, and ultra-wide threshold hardware interface signal conditioning technology. This test system can adapt to the testing requirements of electrical system equipment of different models and types of launch vehicles. By flexibly configuring the corresponding test modules and parameters according to the characteristics of the equipment under test, universal testing of various devices can be achieved.

[0005] The aforementioned general testing system for the electrical systems of launch vehicles also includes: a system display module, a converter, and the device under test; the system display module provides a user interaction platform for users to set parameters and obtain experimental results; the converter is used to design corresponding converter modules for different types of signals. Attached Figure Description

[0006] Figure 1 According to some embodiments of this application, a schematic diagram of the overall architecture of a general testing system for electrical system equipment of a launch vehicle is provided.

[0007] Figure 2 According to some embodiments of this application, a schematic diagram of the hardware architecture of a general test system for electrical system equipment of a launch vehicle is provided.

[0008] Figure 3 According to some embodiments of this application, a schematic diagram of a general test system software architecture for launch vehicle electrical system equipment is provided. Detailed Implementation

[0009] The present application will now be described in detail with reference to specific embodiments. These embodiments will help those skilled in the art to further understand the present application, but do not limit the present application in any way. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present application. These all fall within the protection scope of the present application.

[0010] The present application will now be described in further detail with reference to the accompanying drawings. Figure 1 A schematic diagram of the overall architecture of a general testing system for launch vehicle electrical system equipment is shown, such as... Figure 1 As shown, the general testing system adopts a layered distributed architecture, mainly consisting of an electrical system equipment testing management layer 101, an algorithm implementation and decision-making layer 102, a data processing and persistence layer 103, an interface adaptation and signal conditioning layer 104, and an electrical system device under test layer 105.

[0011] Among them, the electrical system equipment test management layer 101 accepts user operations, completes the planning, scheduling and management of test tasks, issues test instructions and sets test parameters through this layer, and monitors the test process and results in real time.

[0012] The algorithm implementation and decision-making layer 102, according to the settings of the test management layer, calls the execution algorithm and decision-making method of the corresponding test item to further process the data preprocessed by the data processing layer, and returns the processing results to the test management layer.

[0013] The data processing and persistence layer 103 is responsible for preprocessing various signals acquired from the device under test, facilitating algorithm implementation and further use by the decision-making layer, and persistently storing the acquired data.

[0014] The interface adaptation and signal conditioning layer 104 belongs to the hardware interface adaptation layer. It conditions, converts and adapts the signal according to the interface type and signal characteristics of the device under test, so as to ensure reliable connection and signal transmission between the test system and the device under test.

[0015] The electrical system tested equipment layer 105 includes various launch vehicle electrical system equipment, such as power distribution controllers, onboard computers, inertial navigation systems, servo mechanisms, telemetry equipment, and external security equipment.

[0016] The following is combined Figure 2 The hardware architecture of this application is described. Figure 2 A schematic diagram of a general test system hardware architecture for launch vehicle electrical system equipment is shown, such as... Figure 2 As shown: The hardware architecture of the general test system for the electrical system equipment of the launch vehicle includes a system logic processing platform 201, a system parallel computing platform 202, a system display module 203, a system power supply module 204, a system analog quantity acquisition module 205, a system bus interface module 206, a system digital quantity receiving module 207, a converter device 208, a device under test 209, and a VPX backplane 210.

[0017] The system logic processing platform 201 uses a server-grade logic processing chip as the core of the test system, possessing powerful data processing capabilities and stable operating performance. It is equipped with an RTOS operating system, test software, and related drivers to implement functions such as test task control, result display, and storage.

[0018] The system's parallel computing platform 202 performs rapid processing of big data interfaces such as bus, image, and digital data, and obtains calculation results in real time.

[0019] The system display module 203 provides a user interaction platform for users to set parameters and obtain experimental results. It is characterized by its ease of operation and intuitiveness.

[0020] The system power module 204 provides a stable power supply for the test system and the device under test. The power module features overvoltage, overcurrent, and short-circuit protection to ensure power safety during testing.

[0021] The system analog signal acquisition module 205 uses a multi-channel, high-precision data acquisition card to acquire analog signals.

[0022] The system bus interface module 206 is equipped with a variety of communication interfaces, such as 1553B and CAN bus interfaces, to realize data communication between the test system and the device under test.

[0023] The system's digital signal receiving module 207 uses a multi-channel, high-precision digital signal board to acquire digital signals.

[0024] The adapter 208 is designed with corresponding adapter modules for different types of signals, such as voltage conditioning modules, current conditioning modules, and isolation conditioning modules. The adapter modules are responsible for amplifying, filtering, isolating, and converting the measured signal to meet the input requirements.

[0025] In terms of hardware design, this application selects highly reliable industrial-grade equipment and devices, and adopts comprehensive electromagnetic compatibility design and anti-interference measures to ensure that the system can operate stably in complex electromagnetic environments.

[0026] The following is combined Figure 3 The software architecture of this application is described. Figure 3 A schematic diagram of a general test system software architecture for launch vehicle electrical system equipment is shown, such as... Figure 3 As shown: The general test system software architecture for launch vehicle electrical system equipment includes: test management software 301, data acquisition and processing software 302, driver program 303, and database management system 304.

[0027] Among them, Test Management Software 301 is developed based on C# WinForms and features simple operation and intuitiveness. Its main functions include test task management, test parameter setting, test process control, real-time display and analysis of test data, and test report generation.

[0028] Data Acquisition and Processing Software 302: This software controls the data acquisition card to acquire data and performs real-time processing on the acquired data, such as digital filtering, signal transformation, and feature extraction. It also stores both raw and processed data in a database for subsequent analysis and querying.

[0029] Driver 303: For hardware devices in the test system, develop stable or use mature commercial drivers to achieve communication and control between hardware devices and the software system. The driver has good compatibility and stability, and can ensure the normal operation of the hardware device.

[0030] Database Management System 304: A relational database management system is selected to store the large amounts of data generated during the testing process, such as test parameters, test results, and equipment status information. The database management system has data storage, query, and backup functions, facilitating user management and analysis of test data.

[0031] In terms of software design, this application employs techniques such as redundancy and fault tolerance, and adheres to the principles of high cohesion and low coupling to improve the reliability and stability of the software system. Simultaneously, the system possesses comprehensive health diagnostic functions, capable of monitoring its own operational status in real time, promptly identifying and eliminating faults, and ensuring the smooth progress of testing.

[0032] This application constructs a highly compatible integrated test platform through system-level scheduling and control strategies, modular and combined algorithm co-design, and ultra-wide threshold hardware interface signal conditioning technology. This test system can adapt to the testing requirements of electrical system equipment for different models and types of launch vehicles.

[0033] The system-level scheduling and control strategy used in this application achieves efficient coordination of multiple tasks and resources through intelligent scheduling algorithms and real-time feedback mechanisms. The algorithm system is decomposed into the smallest functional units (preprocessing, feature extraction, decision logic, etc.), with modules cohesively encapsulated into standard interfaces, resulting in loose coupling between modules. Module chaining is implemented through configuration files, supporting complex processes such as conditional branching and parallel execution. The modular, combinable algorithm collaborative design used in this application decomposes the scheduling and control steps into independently developable, testable, and replaceable functional units. These units are deployed using Docker containers, dynamically allocating computing power and uniformly implementing load balancing management. This application supports ultra-wide threshold hardware interface signal conditioning technology, supporting analog input of wide-range current and voltage signals, multiple mainstream bus protocols and multi-bus hybrid communication, and adaptive input of digital signal interface levels.

[0034] This universal testing system for launch vehicle electrical systems has been applied in the development of a new type of launch vehicle with good results. During the development, production, and testing of the rocket's electrical system equipment, this universal testing system was used to comprehensively test various key components, including the power distribution controller, onboard computer, inertial navigation system, servo mechanisms, telemetry equipment, and external safety devices. Through testing, weaknesses in the design and manufacturing processes were promptly identified and resolved. During the final assembly and testing phase before rocket launch, the system again rigorously tested the electrical system equipment. Practice has shown that this universal testing system can effectively improve testing efficiency, reduce testing costs, and enhance testing quality.

[0035] This application presents a universal test system for launch vehicle electrical systems, an advanced test platform that provides an efficient, accurate, and reliable solution for testing launch vehicle electrical systems through innovative architecture, powerful functionality, and superior performance. The application of this system not only meets the current testing needs of multiple models and missions in the aerospace field but is also particularly suitable for the testing needs of future reusable launch vehicle electrical systems.

[0036] The specific embodiments of this application have been described above. It should be understood that this application is not limited to the specific embodiments described above, and those skilled in the art can make various changes or modifications within the scope of the claims, which do not affect the substantive content of this application. Unless otherwise specified, the embodiments and features described in the embodiments of this application can be arbitrarily combined with each other.

Claims

1. A universal testing system for electrical system equipment of a launch vehicle, characterized in that, It includes a system logic processing platform, a system parallel computing platform, a system power supply module, a system analog signal acquisition module, a system bus interface module, and a system digital signal receiving module; The system logic processing platform is equipped with a multi-core processor, adopts a real-time operating system, has microsecond-level task scheduling capabilities, and, combined with visual test script editing, enables dynamic configuration and real-time monitoring of the test process. The system's parallel computing platform is used to configure GPU acceleration cards on the platform, and adopts a message queue mechanism and a distributed computing architecture to perform real-time solution and fusion processing of test data in parallel. The system power module adopts an AC / DC redundant power supply design and has a built-in intelligent power management system that can dynamically adjust the power supply strategy according to the load. The system's analog signal acquisition module is equipped with a high-bit analog-to-digital converter, supporting a wide range of current and voltage signal inputs and a high sampling rate; The system bus interface module supports multiple mainstream bus protocols and multi-bus hybrid communication; The system's digital signal receiving module is used to acquire digital signals, supports level adaptive input, and has electrical isolation protection capabilities.

2. The universal testing system for launch vehicle electrical system equipment according to claim 1, characterized in that, The general testing system for the electrical system equipment of the launch vehicle also includes: a system display module, a converter, and the device under test; The system display module is used to provide a user interaction platform for users to set parameters and obtain experimental results; The adapter is designed to adapt to different types of signals.