Fault injection parameter processing method and device based on test process context
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
- Filing Date
- 2025-12-29
- Publication Date
- 2026-05-12
AI Technical Summary
In existing technologies, the generation of fault injection parameters is disconnected from the global context of the test process and cannot be dynamically coordinated with the real-time system resource status. This results in low test automation, poor parameter adaptability, and insufficient robustness, especially inefficient in complex multi-step test scenarios.
By receiving test descriptions from the Automated Test Markup Language (ATML), extracting process context information, determining fault injection parameters using the Constraint Satisfaction Problem (CSP) model, and scheduling based on real-time resource status using a multi-objective optimizer, hardware resource instructions are generated to achieve dynamic adaptive fault injection.
It improves the accuracy and reliability of testing, ensures consistency between fault injection and test logic, enhances the robustness of complex test processes, optimizes resource utilization efficiency, reduces resource idleness and conflicts, and improves overall test throughput.
Smart Images

Figure CN122019137A_ABST