Device for detecting performance of plurality of samples comprising wire and at least one crimping element, and corresponding method
By designing a multi-sample performance testing device, the problem of complex and lengthy testing of press-fit samples was solved, and rapid and accurate resistance measurement was achieved, which is applicable to the testing of electrical equipment in the field of nuclear reactors.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- FRAMATOME SA
- Filing Date
- 2024-10-10
- Publication Date
- 2026-05-19
AI Technical Summary
In the existing technology, the performance testing of crimped specimens is complex and lengthy, and there is a lack of simple and fast solutions, especially in the nuclear field where hundreds of specimens may be involved.
A performance testing device for multiple samples was designed, including a test area, a programmable current source and circuitry, capable of various circuit configurations, supporting individual or combined current direction switching, and equipped with a control panel and electrical contacts for rapid and accurate resistance measurement.
It enables rapid and accurate resistance measurement of press-fit samples, simplifies the testing process, improves testing efficiency and the repeatability of results, and is applicable to the testing of electrical equipment in the field of nuclear reactors.
Smart Images
Figure CN122070489A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to an apparatus for performing performance testing on multiple samples, each sample comprising a wire and at least one element crimped onto the wire.
[0002] The present invention also relates to a test method for implementing such a device. Background Technology
[0003] In this case, the sample corresponds to a wire type that is associated, on the one hand, with the type of element crimped onto the wire (e.g., lug, pin, collar, coaxial or triaxial contact) and on the other hand with the crimping tool (e.g., pliers with a given jaw).
[0004] Performance testing of crimping is particularly important in industry. In the field of pressurized water nuclear reactors, guidelines are provided, for example, by the 2019 RCC-E standard (Code for Design and Construction of Electrical Equipment for Nuclear Island). RCC-E 2019 references the following sequence of electrical tests performed according to §5.3.2.3.2 of IEC 60352-2:
[0005] • Contact resistance
[0006] • Circulating current load
[0007] • Contact resistance.
[0008] The standard specifies two resistance measurements for each specimen: one between the crimping element and the lead wire, and another between two points on the lead wire, specifically to assess the contact resistance between the crimping element and the lead wire. If the specimen is double, in other words, if it includes two crimping elements located at the two ends of the lead wire respectively, then the number of resistance measurements is therefore four.
[0009] For each specimen, the standard also requires a first resistance measurement, followed by a second resistance measurement with a higher load current passed through the specimen. Furthermore, the implementation of the RCC-E 2019 standard requires both accuracy and repeatability of the tests.
[0010] In the nuclear field, the number of possible test specimens can be in the hundreds. Therefore, performance testing of press-fit specimens is complex and lengthy. To date, there is no satisfactory solution for performing these tests in a simple and faster manner.
[0011] Therefore, one object of the present invention is to facilitate the performance testing of press-fitted specimens. Summary of the Invention
[0012] Therefore, the present invention provides an apparatus for performance testing of multiple samples, each sample comprising a wire and at least one element crimped onto the wire, the apparatus comprising:
[0013] - Test areas, which are formed at multiple locations designed to accommodate the sample to be tested.
[0014] - Programmable current source, and
[0015] - A circuit capable of electrically connecting the location to the current source, the circuit including a plurality of contactors capable of opening or closing and capable of being combined with each other to define a plurality of circuit configurations, the plurality of circuit configurations including a first type of configuration, in which:
[0016] Only one of the locations is selectively electrically connected to the current source.
[0017] - Other locations are disconnected from the current source, and
[0018] - Only one of the samples is configured to carry current.
[0019] According to other advantageous aspects of the invention, the device includes one or more of the following features, either individually or in any technically possible combination:
[0020] - The plurality of circuit configurations include at least one second type of configuration in which: all said locations are connected in series to the current source, and all said samples are configured to have current flowing through them in series;
[0021] - The device includes a control panel that includes a plurality of switches that can individually control the contactor and switch the circuit from any one of the plurality of configurations to any other configuration;
[0022] - The current source is switchable between a first power supply configuration and a second power supply configuration, wherein in the first power supply configuration the current source is configured to deliver current in the circuit in a first direction, and in the second power supply configuration the current source is configured to deliver current in a second direction opposite to the first direction, and the control panel includes a changeover switch that is capable of selectively switching the power supply from one of the first power supply configuration and the second power supply configuration to the other.
[0023] - The control panel includes a visual representation of the circuit and a plurality of female sockets respectively connected to electrical contacts at each of the locations, the electrical contacts being configured to contact the sample;
[0024] - Each location includes: two end electrical contacts belonging to the circuit and configured to contact two ends of one of the specimens; and one or more intermediate electrical contacts configured to contact the middle portion of one of the specimens;
[0025] - Each of the end electrical contacts and the one or more intermediate electrical contacts includes: at least two tin-plated copper strips configured to be located on both sides in a clamping direction of one of the samples; and a system for bringing the two tin-plated copper strips close to each other in the clamping direction;
[0026] - Each location includes one or more fastening members that enable the conductor of one of the specimens to be fixed relative to the test area;
[0027] - The circuit includes a first main branch and a second main branch that are electrically connected to two terminals of the current source, and each of the said locations is connected in parallel to the first main branch and the second main branch. The plurality of contactors includes a first set of contactors located between each of the said locations and the second main branch.
[0028] - The plurality of contactors includes a second set of contactors located in the first main branch and the second main branch, wherein when all of the second set of contactors are open and all of the first set of contactors are closed, the second set of contactors is capable of defining an "S"-shaped path through all positions and alternately through the first main branch and the second main branch. This path is configured such that current originating from one of the two terminals of the current source flows in series through all of the samples from the first sample to the last sample. The circuit includes a return branch configured to electrically connect the last sample to the other terminal of the two terminals of the current source; and
[0029] - The device includes a frame, which is preferably equipped with wheels, and the test area, the current source and the control panel are fixed to the frame, for example in the form of compartments preferably stacked in the vertical direction, and the device is capable of forming a mobile test platform.
[0030] The invention also includes a component for its purposes, comprising the device as described above and one or more measuring devices, particularly a voltmeter, connected to or capable of being connected to the device.
[0031] The present invention also includes, as its object, a method for performance testing of an apparatus or component as described above, a method for performance testing of multiple samples, each sample comprising a wire and at least one element crimped onto the wire, the method comprising the following steps:
[0032] - Obtain the device,
[0033] - Place the sample to be tested at the plurality of locations.
[0034] - The circuit is placed in each of the first type of configurations such that only one of the locations is electrically connected to the current source, while the other locations are disconnected from the current source, so that only one sample in the sample is subjected to current flow.
[0035] - The sample is measured.
[0036] - The sample is held in the position during the measurement. Attached Figure Description
[0037] The invention will become more apparent from the following description, given by way of non-limiting example only and with reference to the accompanying drawings, in which:
[0038] - Figure 1 This is a schematic perspective view of the components according to the present invention.
[0039] - Figure 2 yes Figure 1 The diagram shows a top view of the test area of the component, which schematically illustrates a portion of the component's circuitry.
[0040] - Figure 3 yes Figure 1 and Figure 2 The diagram shows a top and side view of one location in the test area, where one of the test specimens is housed.
[0041] - Figure 4 yes Figure 3 A schematic diagram of one of the contacts at the indicated location, and
[0042] - Figure 5 yes Figure 1 The diagram shows a control panel for the components shown, which includes... Figure 2 The circuit shown in the middle section is a planar representation. Figure 5 This refers to, for example, the HMI strip (human-machine interface) of a test device. Detailed Implementation
[0043] refer to Figure 1 and Figure 2 The present invention describes component 10.
[0044] Component 10 includes a plurality of specimens 14 (in Figure 2 and Figure 3 The performance testing device 12 (visible in the middle) Figure 1), and one or more measuring devices 16 external to the device ( Figure 1 , Figure 2 and Figure 5 In this example, these measuring devices are portable voltmeters.
[0045] As an alternative (not shown), the measuring device 16 is integrated into the device 12, and is therefore located inside the device.
[0046] "Apparatus for performance testing" means an apparatus that facilitates the performance testing but does not necessarily include all the elements involved in the performance testing (e.g., measuring device 14).
[0047] The sample to be tested
[0048] Sample 14 ( Figure 2 and Figure 3 The sample 14 includes a conductor 18 and at least one element 20, such as a lug, pin, collar, coaxial, or triaxial contact, which is crimped onto the conductor. In this example, the sample 14 is "double," meaning it includes two elements 20, 22 located at both ends of the conductor. The sample 14 may vary from one another depending on the type of conductor 18, the type of elements(multiple) 20, 22, or the crimping method (particularly the crimping tool used, such as pliers).
[0049] The performance testing of sample 14 involves performing certain electrical tests to determine whether these samples meet certain standards, such as those defined by the RCC-E 2019 standard.
[0050] The test specimens 14 are located at a plurality of positions 24 defined by the apparatus 12, for example, parallel to each other. For example, all of the test specimens 14 extend along the same longitudinal direction L. The test specimens 14 are arranged in rows 26, for example, in a transverse direction T perpendicular to the longitudinal direction L.
[0051] When the device 12 is placed on a horizontal surface S, such as a laboratory floor (not shown), the longitudinal direction L and the transverse direction T are substantially horizontal, for example.
[0052] Each conductor 18 has, for example, four bare intermediate portions 18A, 18B, 18C, 18D, each of which advantageously extends longitudinally by slightly more than 10 mm. The four intermediate portions 18A to 18D and the elements 20, 22 are intended to form contact points for testing.
[0053] Because of the bare middle portion of specimen 14, specimen 14 is not intended for use after its performance test. The performance test is used to indicate that the connecting wires (not shown) corresponding to a given specimen 14 that has successfully passed the performance test are suitable for use.
[0054] Device
[0055] Device 12 includes test area 28 ( Figure 1 and Figure 2 The test area 28 forms positions 24 respectively configured to accommodate the sample 14 to be tested, and the sample is configured to remain in these positions during testing. The device 12 includes a programmable current source 30 and circuitry 32 capable of electrically connecting the positions 24 to the current source 30. Advantageously, the device 12 includes a control panel 34. Figure 1 and Figure 5 (This is to facilitate the use of the device.)
[0056] In this example, the device 12 includes a frame 36, which is advantageously equipped with wheels 38. The test area 28, the current source 30, and the control panel 34 are fixed to the frame 36, for example in the form of compartments 40 that are advantageously stacked in the vertical direction V. Thus, the device 12 forms a mobile test bench that can be advantageously moved within a building (not shown) or between two buildings.
[0057] According to an alternative not shown, compartment 40 is arranged in a manner other than vertical stacking.
[0058] Still in this example, the device 12 includes a cover 42 capable of covering the test area 28 to prevent unintentional mechanical or electrical contact between an object or user (not shown) and the specimen 14 or location 24 during performance testing.
[0059] Advantageously, the device 12 includes a ventilation panel 44 located between the control panel 34 and the test area 28. In this example, the device 12 includes a row of sockets 46 and a power distribution compartment 48 located between the current source 30 and the control panel 34, as well as a storage drawer 50, for example, located below the current source.
[0060] The cover 42 is, for example, transparent and advantageously made of poly(methyl methacrylate). The cover 42 advantageously includes side openings 52 that allow air to circulate in the test area 28.
[0061] The cover 42 is rotatably mounted on the frame 36, for example, and a low-pressure piston (not shown) allows the cover 42 to remain open when the sample 14 is placed.
[0062] Test area and location
[0063] In this example, the test area 28 is located at the upper end 54 of the device 12, so that the operator can easily place the sample 14 to be tested there and then remove it after the test.
[0064] In this example, test area 28 forms a rectangular and essentially horizontal platform.
[0065] Alternatively, test area 28 may have a different shape and / or possible tilt.
[0066] Test area 28 includes a support 56 made of, for example, an electrically insulating material (e.g., polyoxymethylene).
[0067] In this example, positions 24 are structurally identical to each other.
[0068] Each position 24 includes two end contacts 58A, 58B belonging to circuit 32 and capable of contacting two ends 61A, 61B of one of the specimens 14, these ends being formed in this example by two elements 20, 22. Each position 24 includes, for example, four intermediate contacts 58C, 58D, 58E, 58F capable of contacting, for example, intermediate portions 18A, 18B, 18C, 18D of one of the specimens 14. Each position 24 advantageously includes three fastening members 60A, 60B, 60C capable of advantageously holding the wire 18 of one of the specimens 14 in a predetermined position relative to the test area 28.
[0069] According to an alternative (not shown), for example, if specimen 14 is a “single” specimen with a single crimping element, the ends 61A, 61B of the specimen that contact the end contacts are formed by a single element and a bare wire portion. In this case, for example, there is only one intermediate contact and one or two fastening members.
[0070] In this example, intermediate electrical contacts 58C and 58F are spaced 50 mm apart from end contacts 58A and 58B in the longitudinal direction L, and intermediate electrical contacts 58D and 58E are spaced 100 mm apart from intermediate electrical contacts 58C and 58D. The two center intermediate electrical contacts 58D and 58E are spaced at least 150 mm apart.
[0071] Fastening components 60A, 60B, and 60C are advantageously clamps capable of closing on the conductor, such as the PANDUIT FCM1-S6-C14 type clamp.
[0072] Electrical contacts in position
[0073] Advantageously, the end electrical contacts 58A, 58B and the intermediate electrical contacts 58C, 58D, 58E and 58F are structurally identical to each other.
[0074] As in Figure 4As can be seen, the end electrical contacts 58A, 58B and the intermediate electrical contacts 58C, 58D, 58E and 58F include, for example, at least two strips 62, which can be positioned on both sides of a sample 14 in a clamping direction S1 (e.g., substantially vertical). The end electrical contacts and the intermediate electrical contacts include a system 64 for bringing the two strips 62 close to each other in the clamping direction S1, such as two bolts 64A, 64B.
[0075] Strip 62, for example, is made of tin-plated copper and extends advantageously in the transverse direction T.
[0076] For example, 62 is fastened to wire 18 or component 20, 22 with a tightening torque of 1 N·m.
[0077] Current source
[0078] The current source 30 is capable of supplying an adjustable current I in the circuit 32, for example, in the range of 0.5A to 40A, and advantageously supplied according to one or more predetermined time distributions, which will be clearly explained below.
[0079] Advantageously, the current source 30 is essentially switchable between a first power supply configuration and a second power supply configuration, in which the current source is able to deliver current in the circuit 32 along a first direction i1, and in the second power supply configuration, the current source is configured to deliver current along a second direction i2 opposite to the first direction.
[0080] Alternatively, connecting the current source 30 to the reverse circuit of circuit 32 (not shown) allows this function to be obtained.
[0081] The current source 30 is, for example, the EA-PSI 9080-60A 2U type.
[0082] circuit
[0083] Circuit 32 is shown in test area 28 Figure 2 The middle part is shown in the diagram, and the control panel 34 is shown more completely. Figure 5 The diagram illustrates a visual representation 65 of the control panel 34, including the circuitry 32. For convenience, the same reference numerals are used to denote... Figure 2 Part of circuit 32 and Figure 5 The visual representation of circuit 32 in the circuit corresponds to the part of 65.
[0084] Circuit 32 includes multiple contactors C2 to C20 (in Figure 2 (Numbered in ascending order from left to right), the plurality of contactors C2 to C20 are capable of being opened or closed and can be combined with each other to define a plurality of circuit configurations, including a first type of configuration and advantageously including a second type of configuration.
[0085] In the first type of configuration, only one position 24 is selectively electrically connected to the current source 30. The other positions 24 are disconnected from the current source 30, and only one sample 14 is configured to receive current. This allows each sample 14 to be tested individually, for example, by measuring the resistance between the contact points.
[0086] In the second type of configuration, all positions 24 are connected in series to the current source 30, and all specimens 14 are configured to receive current in series, for example according to advantageously pre-programmed cycles. This allows for the simulation of the use of specimens 14, with heating cycles due to the Joule effect when current flows through, and cooling cycles when the current is zero.
[0087] For example, circuit 32 includes a first main branch 32A and a second main branch 32B that are electrically connected to two terminals 66A and 66B of current source 30, respectively, and each position 24 is connected in parallel to the first main branch 32A and the second main branch 32B.
[0088] The multiple contactors C2 to C20 include, for example, a first group of contactors C2, C4, C6...C19 located between each position 24 and the second main branch 32B. As will be seen, the first group of contactors allows for a first type of configuration.
[0089] The multiple contactors C2 to C20 advantageously include a second group of contactors C3, C5, C7...C19 located in the first main branch 32A and the second main branch 32B. When all the second group of contactors is open and all the first group of contactors is closed, the second group of contactors can define an "S"-shaped path 68 through all positions 24 and alternately through the first main branch 32A and the second main branch 32B. This path 68 allows the current originating from one of the two terminals 66A, 66B of the current source to pass in series through all the samples from the first sample 14A to the last sample 14B in the sample 14. Then, the circuit 32 also includes a return branch 32C ( Figure 5 ) and selector C21 ( Figure 5 The return branch 32C is configured to electrically connect the last sample 14B of the sample 14 to the other terminal of the two terminals 66A, 66B of the current source 32, and the selector C21 is used to selectively connect the second main branch 32B or the return branch 32C to the other terminal of the two terminals 66A, 66B.
[0090] Therefore, when the second set of contactors C3, C5...C19 is open, the first set of contactors C2, C4...C20 is closed, and the return branch 32C is connected to the other terminal of the two terminals 66A and 66B, the second type of configuration is obtained.
[0091] Those skilled in the art will understand that the above is merely an example of the architecture of circuit 32. The present invention is not limited to this specific architecture.
[0092] control Panel
[0093] Control panel 34 is located, for example, on the front side 70 of device 12. Figure 1 "Front" refers to the side the operator intends to stand on during the test.
[0094] As in Figure 5 As can be seen, corresponding to the visual representation of circuit 32, control panel 34 includes multiple switches SW2 to SW20, which are capable of controlling contactors C2 to C20 respectively and switching circuit 32 from any one of the multiple configurations to any other configuration.
[0095] The control panel 34 includes, for example, a plurality of female sockets 72, which are respectively connected to electrical contacts 58A to 58F at position 24 to allow connection of measuring device 16.
[0096] The control panel 34 advantageously includes a changeover switch SW1, which is capable of selectively switching the current source 30 from one of the first power supply configuration and the second power supply configuration to the other (under current i1 or i2).
[0097] The control panel 34 also includes a changeover switch SW21 for actuating the selector C21 (which selects the second main branch 32B or the return branch 32C).
[0098] Component Operations
[0099] The operation of component 10 will now be described, particularly in order to illustrate the method for performance testing according to the present invention.
[0100] First, place the sample 14 to be tested in position 24 of the test area 28. Figure 2 and Figure 3 In this example, for each sample 14, two elements 20 and 22 are clamped in end contacts 58A and 58B, respectively. Intermediate portions 18A to 18D are clamped in electrical contacts 58C to 58F. Fastening members 60A to 60C advantageously hold the wire 18 in a predetermined position relative to the test area 28. The wire 18 is advantageously straight.
[0101] To clamp the specimens 14, they are placed between the two bars 62 of each of the electrical contacts 58A to 58F, and the upper bar 62 is brought closer to the lower bar 62 by bolts 64A and 64B. The specimens 14 are held in position 24 for the entire duration of the test, during which time the specimens are subjected to certain currents and electrical measurements are performed on the specimens 14.
[0102] Then, in the first stage, circuit 32 is configured in a first-type configuration, which is equivalent to selecting a position 24. In this example, switches SW3, SW5...SW19 are operated to close all contactors C3, C5...C19 of the second group, and selectively close a single contactor in the first group of contactors C2, C4...C20 corresponding to the sample 14 under consideration. Selector C21 is positioned such that the second main branch 32B is connected to terminal 66B of current source 30.
[0103] The measuring device 16 is connected to a socket 72 on the control panel 34 corresponding to the position 24 of the specimen 14 under consideration. The positions are, for example, numbered SP1 to SP10 on the control panel 34.
[0104] Alternatively, in the absence of control panel 34, measuring device 16 may be directly connected to position 24, for example.
[0105] A current flows through the specimen 14 in the direction i1, for example. The current intensity is, for example, 1.0 A / mm². 2 The cross-sectional area of the conductor is 18. Then measure four voltages U1, U2, U3, and U4, as follows: Figure 5 As shown. Knowing the current intensity, the resistance between end contact 58A and intermediate contact 58C, and between intermediate contact 58C and intermediate contact 58D, is calculated. On the other side of sample 14, the resistance between end contact 58B and intermediate contact 58F, and between intermediate contact 58F and intermediate contact 58E, is calculated symmetrically. This, in particular, allows obtaining the contact resistance at components 20 and 22, as required by, for example, the RCC-E 2019 standard.
[0106] If the measuring device 16 is inside the device 12, the measured voltages U1 to U4 are displayed, for example, on the control panel 34.
[0107] The above operation can also be advantageously performed by passing the current of each sample 14 along the second direction i2.
[0108] These operations are performed, for example, continuously on all the test specimens 14.
[0109] Then, in the second stage, circuit 32 is advantageously configured as a second type of configuration. In this example, switches SW3, SW5…SW19 are operated to disconnect all contactors C3, C5…C19 of the second group and close all contactors C2, C4…C20 of the first group. Selector C21 is positioned such that return branch 32C is connected to terminal 66B of current source 30. Current flows through all samples 14 in series via an “S”-shaped path 68. This current is, for example, 4.0 A / mm². 2The conductor cross-sectional area is 18, advantageously maintained for 45 minutes, then, for example, zero, maintained for 15 minutes. This current distribution is repeated for 20 hours to simulate the use of sample 14.
[0110] If circuit 30 does not have the second type of configuration, the first type of configuration can be used to subject each sample 14 to the aforementioned current distribution continuously. The advantage of the second type of configuration is that it does this simultaneously.
[0111] Then, in the third stage, the operation of the first stage is advantageously repeated to verify that the obtained contact resistance has not changed too much.
[0112] Thanks to the features of the aforementioned device 12, particularly the multiple circuit configurations 32, performance testing of the sample 14 is made easier. Device 12 allows for performance testing of, for example, ten dual samples 14, which is equivalent to processing twenty single samples. Device 12 ensures good reproducibility of results while providing good ergonomics and safety for the user.
[0113] In particular, the second type of configuration allows for significant time savings by subjecting all samples 14 to current distribution (referred to as “cycling”) simultaneously.
Claims
1. An apparatus (12) for performance testing of a plurality of test specimens (14), each of the test specimens (14) comprising a wire (18) and at least one element (20, 22) crimped onto the wire (18), the apparatus (12) comprising: - Test area (28), which is formed at multiple locations (24) respectively designed to accommodate the sample (14) to be tested. - Programmable current source (30), and - A circuit (32) capable of electrically connecting the location (24) to the current source (30), the circuit (32) comprising a plurality of contactors (C1 to C21) capable of opening or closing and capable of defining a plurality of circuit configurations (32) in combination with each other, the plurality of circuit configurations including a first type of configuration, in which: - Only one of the positions (24) is selectively electrically connected to the current source (30). - Other locations (24) are disconnected from the current source (30), and - Only one of the specimens (14) is configured to carry current.
2. The apparatus (12) of claim 1, wherein the plurality of circuit configurations includes at least one second type of configuration, in which: - All of the aforementioned locations (24) are connected in series to the current source (30), and - All of the specimens (14) were configured to be connected in series with current.
3. The apparatus (12) according to claim 1 or 2, comprising a control panel (34) including a plurality of switches (SW1 to SW21) capable of controlling the contactors (C1 to C21) respectively and switching the circuit (32) from any one of the plurality of circuit configurations to any other configuration.
4. The apparatus (12) according to claim 3, wherein the current source (30) is switchable between a first power supply configuration and a second power supply configuration, wherein in the first power supply configuration the current source (30) is configured to deliver current in the circuit (32) along a first direction (i1) and in the second power supply configuration the current source (30) is configured to deliver current along a second direction (i2) opposite to the first direction (i1), and the control panel (34) includes a changeover switch (SW1) that is capable of selectively switching the current source (30) from one of the first power supply configuration and the second power supply configuration to the other.
5. The device (12) according to claim 3 or 4, wherein the control panel (34) includes a visual representation (65) of the circuit (32) and a plurality of female sockets (72) respectively connected to electrical contacts (58) at each of the respective locations (24), the electrical contacts (58) being configured to contact the sample (14).
6. The apparatus (12) according to any one of claims 1 to 5, wherein each of the said positions comprises: - Two end electrical contacts (58A, 58B), which belong to the circuit (32) and are configured to contact the two ends (61A, 61B) of one of the samples, and - One or more intermediate electrical contacts (58C, 58D, 58E, 58F) configured to contact the intermediate portion (18A to 18D) of one of the specimens (14).
7. The apparatus (12) according to claim 6, wherein each of the end electrical contacts (58A, 58B) and the one or more intermediate electrical contacts (58C, 58D, 58E, 58F) comprises: At least two tin-plated copper strips (62) are configured to be located on both sides of the clamping direction (S1) of one of the specimens (14). And a system (64) for bringing the two tin-plated copper strips (62) closer to each other in the clamping direction (S1).
8. The apparatus (12) according to any one of claims 1 to 7, wherein each of the locations (24) includes one or more fastening members (60A, 60B, 60C) that enable the wire (18) of one of the specimens (14) to be fixed relative to the test area (28).
9. The apparatus (12) according to any one of claims 1 to 8, wherein the circuit (32) comprises a first main branch (32A) and a second main branch (32B) electrically connected to two terminals (66A, 66B) of the current source (30), each of the positions (14) being connected in parallel to the first main branch (32A) and the second main branch (32B), and the plurality of contactors (C1 to C21) comprising a first set of contactors (C2, C4...C20) respectively located between each of the positions (14) and the second main branch (32B).
10. The apparatus (12) of claim 9, wherein the plurality of contactors (C1 to C21) includes a second set of contactors (C3, C5...C19) located in the first main branch (32A) and the second main branch (32B), wherein when all the second set of contactors (C3, C5...C19) are open and all the first set of contactors (C2, C4...C19) are closed, the second set of contactors (C3, C5...C19) is capable of defining "S" through all positions (14) and alternately through the first main branch (32A) and the second main branch (32B). A “-shaped path (68) is configured such that current originating from one of the two terminals (66A, 66B) of the current source (30) flows in series from the first sample (14A) of the sample (14) toward the last sample (14B) of the sample (14) through all the samples (14), and the circuit (32) includes a return branch (32C) configured to electrically connect the last sample (14B) of the sample to the other terminal of the two terminals (66A, 66B) of the current source (30).
11. The device (12) according to any one of claims 1 to 10, comprising a frame (36) preferably equipped with wheels (38), wherein the test area (28), the current source (30) and the control panel (34) are fixed to the frame (36), for example in the form of compartments (40) preferably stacked in the vertical direction (V), the device (12) being capable of forming a mobile test platform.
12. A method for performance testing of a plurality of specimens (14), each of the specimens (14) comprising a wire (18) and at least one element (20, 22) crimped onto the wire (18), the method comprising the steps of: - Obtain the apparatus (12) according to any one of claims 1 to 10. - Position the test specimen (14) to be tested at multiple locations (14). - The circuit (32) is placed in each of the first type of configurations such that only one of the locations (14) is electrically connected to the current source (30), while the other locations (14) are disconnected from the current source (30), and only one sample (14) is energized. - The sample (14) was measured. - The sample (14) remains in the position (14) during the measurement.