Test apparatus, circuit test method, device and medium

Abstract

This invention provides a testing device, circuit testing method, equipment, and medium. The testing device includes a control component, a circuit detection unit, a communication testing unit, a converter, and a connection port. The connection port is used for electrical connection to the circuit under test of a communication device. The circuit detection unit is electrically connected to the connection port via the converter. The communication testing unit includes a signal generator, which is electrically connected to the connection port. The control component is electrically connected to both the signal generator and the connection port. The testing device has a signal acquisition function, capable of acquiring voltage signals and communication signals from the circuit under test. Based on the acquired voltage signals, it determines whether the circuit has electrical connectivity defects; simultaneously, by analyzing the acquired communication signals and according to established communication quality standards, it determines whether the communication quality of the communication signals meets the corresponding communication requirements.

Description

Technical Field

[0001] This invention belongs to the field of communication technology, specifically relating to a testing device, circuit testing method, equipment, and medium. Background Technology

[0002] In today's rapidly developing communication technology, electronic phase-shifting antennas, as core components for precise signal phase control, play a crucial role in wireless communication, radar detection, satellite communication, and other fields. Their performance and stability directly affect the signal transmission quality, coverage, and anti-interference capabilities of communication systems; therefore, ensuring their high-quality manufacturing is of paramount importance.

[0003] Currently, surface mount technology (SMT) has become the mainstream process for soldering electronic phase-shifting antennas due to its high efficiency, precision, and high degree of automation. However, many problems exist in the testing process after SMT soldering. The commonly used testing methods in the industry mainly include X-ray testing for random inspection and S-parameter verification.

[0004] X-ray testing, based on the principle of X-ray penetration, can image the welded area and detect internal defects such as porosity, cold solder joints, and short circuits. However, it has significant limitations. Firstly, X-ray testing equipment is expensive and time-consuming, allowing only random sampling in actual production. A large number of antennas cannot be comprehensively inspected, and potentially defective products may flow into subsequent stages, creating hidden quality problems. Secondly, it focuses on inspecting the physical structure of the weld, and cannot provide direct and effective information on the electrical connection status of critical components such as chip control pins and RF pins. Issues such as increased contact resistance of chip control pins and RF pins affecting signal transmission characteristics are difficult for X-ray testing to detect.

[0005] S-parameter testing assesses the electrical performance of an antenna by measuring its scattering parameters at the input and output ports, such as reflection coefficient and transmission coefficient. It reflects the signal transmission and reflection characteristics at a specific frequency and determines whether the antenna's basic performance meets standards. However, it has limitations. While primarily focusing on the overall electrical performance of the antenna, it often struggles to accurately identify localized soldering abnormalities on chip control pins and RF pins. For example, an abnormality on a chip control pin may not initially affect the S-parameters, but it will gradually impact the antenna's phase control function; similarly, an abnormality on an RF pin may have a small initial impact on the S-parameters, but it can later lead to increased signal attenuation and enhanced interference.

[0006] Existing testing methods cannot effectively rule out problems such as abnormal chip control pins and RF pin soldering, resulting in some defective electronic phase-shifting antennas not being detected and addressed in a timely manner after production. These defective products entering subsequent stages of operation can lead to a series of adverse consequences. During assembly, they may cause communication equipment to malfunction, requiring significant time and manpower for troubleshooting and rework, increasing costs and timelines. During system debugging, unstable antenna performance complicates and hinders debugging, reducing efficiency and affecting on-time system delivery. In actual operation, they may also cause signal interruptions, data transmission errors, and other malfunctions, severely impacting the reliability and stability of the communication system and causing substantial losses to users.

[0007] Therefore, developing a new testing method that can effectively detect the soldering status of the control pins and RF pins of electronic phase-shifting antenna chips is a key issue that urgently needs to be addressed. Summary of the Invention

[0008] The primary objective of this invention is to solve one of the aforementioned problems by providing a testing apparatus, circuit testing method, device, and medium.

[0009] To achieve one of the objectives of this invention, a testing apparatus is provided, comprising a control component, a circuit detection unit, a communication testing unit, a converter, and a connection port. The connection port is used for electrical connection to the circuit under test of a communication device. The circuit detection unit is electrically connected to the connection port via the converter. The communication testing unit includes a signal generator, which is electrically connected to the connection port. The control component is electrically connected to both the signal generator and the connection port.

[0010] In one embodiment, the control component includes a control unit, the current detection unit further includes a power control circuit, a current detection circuit, and a first protection current, the converter is electrically connected to the control unit and the power detection circuit respectively, the current detection circuit is electrically connected to the power control circuit and the connection port respectively, and the first protection circuit is electrically connected to the converter and the connection port respectively.

[0011] In one embodiment, the communication test unit includes a feedback circuit, which includes a detection circuit, a second protection circuit, a first filter circuit, and a second filter circuit connected in series. The control component is electrically connected to the detection circuit, and the second filter circuit is electrically connected to the connection port.

[0012] In one embodiment, the communication test unit further includes an isolation circuit, through which the signal generator is electrically connected to the connection port.

[0013] In one embodiment, the control component further includes a controller, the communication test unit is a network analyzer, the controller is electrically connected to the control unit, and the network analyzer is electrically connected to both the controller and the connection port.

[0014] To achieve one of the objectives of this invention, a circuit testing method is provided, implemented based on the testing apparatus described in the preceding objective, comprising the following steps: Respond to test commands; The control converter switches to digital-to-analog conversion mode, and the drive circuit detection unit collects the voltage data of the circuit under test of the communication device. If the voltage data is within the preset voltage threshold range, the circuit under test is determined to have passed the electrical test; otherwise, it fails the electrical test. Once the electrical test is passed, the control converter switches to general input / output mode, and the drive signal generator outputs a test signal to the circuit under test. The system receives the response signal from the circuit under test, analyzes the response signal, and if the response signal meets the preset communication test conditions, the circuit under test passes the communication test and is determined to be a good product.

[0015] In one embodiment, the step of the drive signal generator outputting a test signal to the circuit under test further includes the following steps: The control signal generator performs frequency sweeping, sequentially outputting test signals at different frequency points to the circuit under test; If the response signals corresponding to all frequency points meet the preset communication test conditions, the circuit under test passes the communication test; otherwise, it fails the communication test.

[0016] In one embodiment, the step of receiving a response signal from the circuit under test, analyzing the response signal, and determining if the response signal meets preset communication test conditions, and then the circuit under test passes the communication test, includes the following steps: Based on the test signal and the response signal at the corresponding frequency point, calculate the S-parameters of the circuit under test at the corresponding frequency point; The preset communication test conditions include an S-parameter threshold range. The S-parameter is compared with the S-parameter threshold range. If the S-parameter is within the S-parameter threshold range, it is determined that the circuit under test has passed the S-parameter test.

[0017] To achieve one of the objectives of the present invention, a computer device is provided, comprising a central processing unit and a memory, wherein the central processing unit is configured to invoke a computer program stored in the memory to perform the steps of the method as described in any of the preceding objectives.

[0018] To achieve one of the objectives of the present invention, a computer-readable storage medium is provided, which stores, in the form of computer-readable instructions, a computer program implemented according to any one of the preceding objectives, wherein the computer program, when invoked by a computer, performs the steps included in the corresponding method.

[0019] Compared with existing technologies, the present invention has many advantages, including but not limited to: The testing device of this invention can acquire voltage signals and communication signals from the circuit under test of a communication device. In actual communication device circuit testing, voltage signals reflect the electrical connection status and power supply of the circuit, while communication signals reflect whether the circuit's communication function is normal. Specifically: The testing device of this invention evaluates the electrical connectivity of a circuit based on the acquired voltage signal and employs preset judgment rules and algorithms to determine whether electrical connectivity defects exist. It identifies common electrical connectivity problems such as open circuits, short circuits, and poor contacts. Furthermore, the testing device performs in-depth analysis of the acquired communication signals and, based on established communication quality standards, determines whether the communication quality of the signal meets the corresponding communication requirements. Attached Figure Description

[0020] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the following description of the embodiments taken in conjunction with the accompanying drawings, wherein: Figure 1 This is a schematic diagram of the test device according to a typical embodiment of the present invention.

[0021] Figure 2 This is a schematic diagram of the structure of a testing device according to an embodiment of the present invention.

[0022] Figure 3 This is a schematic flowchart of a circuit testing method according to a typical embodiment of the present invention.

[0023] Figure 4 This is a schematic diagram illustrating the specific process of a drive signal generator outputting a test signal to the circuit under test according to an embodiment of the present invention.

[0024] Figure 5 This is a schematic diagram illustrating the specific process of receiving the response signal fed back by the circuit under test in one embodiment of the present invention, analyzing the response signal, and determining if the response signal meets preset communication test conditions, and then the circuit under test passes the communication test.

[0025] Figure 6 This is a schematic diagram of the structure of a computer device according to one embodiment of the present invention. Detailed Implementation

[0026] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention and should not be construed as limiting the present invention.

[0027] Those skilled in the art will understand that, unless specifically stated otherwise, the singular forms “a,” “an,” “the,” and “the” used herein may also include the plural forms. It should be further understood that the term “comprising” as used in this specification means the presence of the stated features, integers, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, and / or components, nor does it exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof. It should be understood that when we say an element is “connected” or “coupled” to another element, it can be directly connected or coupled to the other element, or there may be intermediate elements. Furthermore, “connected” or “coupled” as used herein can include wireless connections or wireless coupling. The term “and / or” as used herein includes all or any units and all combinations of one or more associated listed items.

[0028] It will be understood by those skilled in the art that, unless otherwise defined, all terms used herein (including technical and scientific terms) have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. It should also be understood that terms such as those defined in general dictionaries should be understood to have the same meaning as in the context of the prior art, and should not be interpreted in an idealized or overly formal sense unless specifically defined as herein.

[0029] This invention provides a testing device for inspecting the circuitry of communication equipment. Specifically, the testing device has a signal acquisition function, capable of acquiring voltage signals and communication signals from the circuit under test. During the testing process, based on the acquired voltage signals, the testing device uses a preset judgment algorithm to evaluate the electrical connectivity of the circuit, thereby determining whether electrical connectivity defects exist. Simultaneously, the testing device also has a communication quality analysis function, which, through in-depth analysis of the acquired communication signals and based on established communication quality standards, determines whether the communication quality of the communication signals meets the corresponding communication requirements.

[0030] In a typical embodiment of the present invention, the test device 100 includes a control component, a circuit detection unit, a communication test unit, and a connection port.

[0031] The control component is electrically connected to the circuit detection unit and the communication test unit, respectively, thereby establishing a control and data interaction channel for the circuit detection unit and the communication test unit. This ensures that the control component can accurately regulate the working status of the circuit detection unit and the communication test unit and obtain the feedback data information.

[0032] The connection port is also electrically connected to the circuit testing unit and the communication testing unit, respectively. This connection port is used to establish an electrical connection with the circuit in the communication device that needs to be tested (hereinafter referred to as the circuit under test 200 for ease of description). Through this electrical connection method, the circuit under test 200 can form a complete electrical circuit with the entire testing device 100 via the connection port, thereby providing the necessary electrical connection basis for subsequent testing work.

[0033] During the specific testing process, after the circuit under test 200 is electrically connected to the test device 100 through the connection port, the circuit detection unit can collect parameters such as the voltage signal of the circuit under test 200, and analyze and judge whether there are electrical connection defects in the circuit under test 200 according to the preset judgment algorithm. At the same time, the communication test unit can collect the communication signal of the circuit under test 200, and through in-depth analysis of the communication signal, such as the detection and evaluation of indicators such as signal strength, bit error rate, and transmission rate, judge whether the communication quality of the circuit under test 200 meets the preset communication requirements.

[0034] In this embodiment, the communication devices include, but are not limited to, various common communication devices such as phase shifters, combiners, power dividers, duplexers, multiplexers, and filters. The types of communication devices listed herein are merely illustrative and are not intended to limit the scope of the invention; that is, the application of the invention is not limited to these listed communication devices.

[0035] To clearly illustrate the specific embodiments and technical effects of the present invention, this embodiment takes an electronic phase shifter as the specific communication device and the testing device 100 performing circuit testing on the electronic phase shifter as an example for detailed description. It should be emphasized that this example is merely a specific application scenario illustration and should not be construed as limiting the scope of application or technical solution of the present invention. The present invention is also applicable to other types of communication device circuit testing scenarios.

[0036] In this embodiment, the control component includes a control unit 111, which is electrically connected to the converter 112. The control unit 111 can regulate the working state of the converter 112 so that the control unit 111 can detect the electrical and communication performance of the circuit under test 200 in a time-division manner.

[0037] The circuit detection unit includes a power control circuit 121, a current detection circuit 122, and a protection circuit (for ease of subsequent description, this protection circuit is defined as the first protection circuit 123). The converter 112 is electrically connected to the power detection circuit 132, the current detection circuit 122 is electrically connected to both the power detection circuit 132 and the connection port, and the first protection circuit 123 is electrically connected to both the converter 112 and the connection port.

[0038] In this embodiment, the first protection circuit 123 has multiple protection functions. On the one hand, for instantaneous high-voltage electrostatic pulses generated between the circuit under test 200 and the connection port due to plugging / unplugging operations or external environment, the first protection circuit 123 quickly guides these pulse energies to a safe path, avoiding impact damage to the control unit 111 and ensuring the stable and reliable operation of the control unit 111. On the other hand, at the electrical level, the first protection circuit 123 can effectively isolate the test device 100 from the circuit under test 200, not only cutting off the ground loop and eliminating its interference to the signal and the increase in measurement error, thus improving the measurement accuracy and signal transmission quality of the test device 100; it can also block common-mode interference, ensuring the purity and accuracy of the signals received by the test device 100. In addition, when the circuit under test 200 experiences a power failure, the first protection circuit 123 can prevent the fault current from spreading to the test device 100, avoiding damage to the test device 100, and comprehensively protecting the safety of the test device 100.

[0039] The power control circuit 121 is equipped with a power source to provide electrical energy. The power control circuit 121 controls the power supply to the circuit under test 200, and the power supply process is uniformly regulated by the control unit 111. When the control unit 111 outputs a first control signal, the power control circuit 121 accordingly starts the power supply to the circuit under test 200, creating conditions for subsequent circuit testing and communication testing. When the control unit outputs a second control signal, the power control circuit 121 cuts off the power supply to the circuit under test 200. Furthermore, if an external short circuit occurs during testing, the abnormal current and voltage changes generated by the short circuit will be fed back to the power control circuit 121 and transmitted to the control unit 111. The control unit 111 then shuts off the power supply via the power control circuit 121 to prevent damage to the electronic components and circuits in the test device 100, thus protecting the test device 100, ensuring its stability and reliability, and extending its service life.

[0040] In this embodiment, when electrical testing of the circuit under test 200 is required, the control unit 111 sends a control command to the converter 112, causing the converter 112 to switch to analog-to-digital conversion mode (ADC mode). In this mode, the converter 112 has the ability to convert analog signals into digital signals, providing a basis for subsequent electrical test data processing. Simultaneously, the control unit 111, through the power control circuit 121, controls the power supply to the circuit under test 200, ensuring that the circuit under test 200 receives a stable power input that meets the test requirements.

[0041] After power is supplied to the circuit under test 200, the current detection circuit 122 immediately starts working. The current detection circuit 122 uses a current sensor, which can collect current data from the circuit under test 200 in real time and accurately. Since the control unit 111 typically processes voltage signals, to facilitate subsequent data processing and analysis, the current detection circuit 122 integrates a current-to-voltage conversion module. This module, based on Ohm's law and other electrical principles, converts the collected current data into corresponding voltage data according to a preset conversion ratio. After the conversion is complete, the current detection circuit 122 outputs the processed voltage data to the control unit 111 through a specific signal transmission line.

[0042] After receiving the voltage data from the current detection circuit 122, the control unit 111 compares it in detail with a pre-set voltage threshold range. This voltage threshold range is set based on the operating voltage characteristics that the circuit under test 200 should possess under normal operating conditions. Specifically, considering that the operating voltage of the circuit under test 200 will be affected by various factors and experience normal fluctuations during actual operation, such as minor fluctuations in power supply and individual differences in circuit components, the voltage threshold range is set with the operating voltage of the circuit under test 200 under normal operation as the center, combined with its normal fluctuation range, to reasonably determine the left and right endpoints of the voltage threshold range.

[0043] If the control unit 111 finds that the received voltage data falls within the preset voltage threshold range after comparison, it can be determined that the circuit contact state of the circuit under test 200 is normal, the electrical connection points are reliably connected, and there is no obvious contact problem. Conversely, if the voltage data exceeds the preset voltage threshold range, it indicates that the circuit under test 200 has an electrical connection defect. Such electrical connection defects may be caused by a variety of reasons. For example, during the soldering process of the circuit under test 200, poor soldering conditions such as porosity and cold solder joints may occur. Porosity will reduce the conductive area at the solder joint and increase the resistance, thus causing abnormal voltage data; cold solder joints will make the solder joint contact unstable, sometimes conducting and sometimes disconnecting, which will also cause voltage fluctuations to exceed the normal range; in addition, short circuits will also cause the current in the circuit to increase abnormally, thus causing the voltage data to exceed the threshold range.

[0044] In a typical embodiment of the present invention, the communication test unit includes an isolation circuit 131 and a feedback circuit. The isolation circuit 131 is electrically connected to both the signal generator 136 and the connection port. Specifically, in this embodiment, the isolation circuit 131 is a DC isolation circuit 131. The DC isolation circuit 131 effectively isolates DC signals. If a DC signal enters the signal generator 136 directly without isolation, it may cause irreversible damage to the internal electronic components of the signal generator 136 due to abnormal characteristics of the DC signal (such as excessively high DC levels, DC bias, etc.), thereby affecting the normal operation and service life of the signal generator 136. The DC isolation circuit 131 can prevent DC signals from passing through while allowing AC test signals to pass smoothly, thus providing reliable protection for the signal generator 136 and ensuring that the signal generator 136 can stably and accurately generate the required test signals.

[0045] The feedback circuit consists of a detection circuit 132, a protection circuit (for ease of subsequent description, this protection circuit is defined as the second protection circuit 133), and two filter circuits (defined as the first filter circuit 134 and the second filter circuit 135, respectively). The detection circuit 132, the second protection circuit 133, the first filter circuit 134, and the second filter circuit 135 are connected in series in sequence.

[0046] The second protection circuit 133, characterized by low parasitic capacitance and connected in series with the RF signal path, can quickly discharge electrostatic pulses generated at the connection port due to environmental electrostatic discharge, while minimizing the insertion loss and phase impact on the test signal during the discharge process. This ensures accurate test signal strength and phase information, improving test accuracy and reliability. Furthermore, the second protection circuit 133, connected in series with the connection port, can monitor and limit the supply voltage applied to the circuit under test 200 in real time, preventing high-voltage backflow from damaging the test device 100 due to internal short circuits, component breakdowns, or other faults in the circuit under test 200. Additionally, the overvoltage protection unit, located in the RF signal path, can monitor abnormal DC voltage or overpower signals from the circuit under test 200 in real time. It clamps the signal voltage or power to a safe range or blocks the signal transmission path, ensuring stable and reliable operation of the test device 100.

[0047] The first filter circuit 134 is an active filter amplifier circuit, mainly used to process the weak response signal output by the circuit under test 200, which may contain stray noise. It possesses excellent frequency selectivity, accurately filtering out interference and noise outside the operating frequency band based on preset operating frequency band parameters. This noise may originate from external electromagnetic radiation, power supply ripple, etc. Filtering ensures a clean test signal spectrum, providing a foundation for accurately evaluating the communication performance of the circuit under test 200. Simultaneously, the first filter circuit 134 also has a signal amplification function. Considering the amplitude requirements of the control unit 111 for the input signal, it amplifies the amplitude of the filtered signal to the optimal test range of the control unit 111. This significantly improves the signal-to-noise ratio of the test device 100, making the useful signal stand out more in the noise, and also improves measurement accuracy and sensitivity. This enables the device to reliably detect and analyze minute changes in the insertion loss, phase, and other performance characteristics of the circuit under test 200, providing reliable technical support for its performance evaluation.

[0048] The second filter circuit 135 is an LC filter circuit. Utilizing the passive resonant characteristics of inductors and capacitors, it presents low impedance to specific signals at the resonant frequency, allowing them to pass through, while presenting high impedance to non-resonant frequencies, especially out-of-band signals, for strong attenuation. In actual communication signal testing, the test device 100 and communication equipment introduce out-of-band spurious noise and harmonic interference. If not filtered out, this will drown out weak effective signals, damage the spectral purity of the response signal, and affect the analysis of basic signal characteristics and advanced testing functions. The second filter circuit 135, by setting the resonant frequency and passband range, can effectively filter out out-of-band interference. This is of great significance for ensuring test accuracy, reducing external interference, making measured parameters closer to true values; improving test repeatability, making the response signals from multiple tests more consistent; and ensuring a smooth and accurate S-parameter curve, providing a reliable basis for analyzing RF network performance. It is a key foundational element for ensuring test accuracy, repeatability, and a smooth and reliable S-parameter curve.

[0049] The detection circuit 132 converts physical quantities (such as S-parameters) reflecting the performance of the circuit under test 200 under its operating state into standard electrical signals that can be accurately identified and processed by the control unit 111 or the host computer. The detection circuit 132 transmits the raw data from amplitude detection and current monitoring to the control unit 111 as standard electrical signals, providing it with comprehensive and accurate information for scientifically judging the performance of the circuit under test 200. This is a crucial step in ensuring that the testing device 100 accurately and reliably evaluates circuit performance. In the testing process of this invention, after the circuit under test 200 successfully passes the electrical testing stage, it will enter the subsequent communication testing stage.

[0050] At the start of the communication test, the control unit 111 performs a mode switching operation, controlling the converter 112 to switch from digital-to-analog conversion mode to general purpose input / output (GPIO) mode. This mode switching is a key prerequisite for communication testing. GPIO mode provides a flexible and universal interface for signal interaction between the control unit 111 and subsequent test equipment, enabling the control unit 111 to control and transmit data to other devices in a standardized manner.

[0051] After completing the mode conversion, the control unit 111 drives the signal generator 136 to output a test signal to the circuit under test 200 according to preset test parameters and procedures. The parameters of this test signal, such as frequency, amplitude, and phase, are all preset to ensure a comprehensive and accurate evaluation of the communication performance of the circuit under test 200. For example, in communication testing, the frequency of the test signal will cover the operating frequency band of the circuit under test 200, the amplitude will simulate signal strength changes in actual communication scenarios, and the phase will be used to detect the circuit under test 200's ability to process signal phase.

[0052] Upon receiving the test signal, the circuit under test (TBD) 200 processes the test signal based on its own circuit characteristics and communication functions, and outputs a response signal to the feedback circuit. This response signal contains the processing result of the TBD 200 on the test signal, reflecting the performance of the TBD 200 in actual communication. For example, the amplitude variation of the response signal can reflect the gain characteristics of the TBD 200, the phase variation can reflect its phase delay, and the spectral characteristics can be used to analyze the frequency selectivity and anti-interference capability of the TBD 200.

[0053] The feedback circuit, acting as an intermediate link in signal transmission, primarily functions to accurately and stably transmit the response signal output by the circuit under test 200 to the control unit 111. The feedback circuit employs appropriate signal conditioning techniques, such as amplification and filtering, to ensure that the response signal is not affected by external interference during transmission and maintains its original signal characteristics.

[0054] Upon receiving the response signal, the control unit 111 employs a pre-set analysis algorithm to perform a comprehensive and in-depth analysis of the response signal. Among these analyses, the S-parameters of the response signal are a core component of communication testing. S-parameters are crucial parameters describing the input-output relationship of an RF network port, including S11 (input reflection coefficient), S21 (forward transmission coefficient), S12 (reverse transmission coefficient), and S22 (output reflection coefficient). By measuring and analyzing these S-parameters, key performance indicators such as impedance matching, transmission loss, and isolation of the circuit under test 200 can be accurately evaluated.

[0055] The control unit 111 compares the analyzed S-parameters with preset judgment conditions in detail. These preset judgment conditions are formulated according to the design requirements of the circuit under test 200 and industry standards, and have clear numerical ranges and performance indicators. For example, for the input reflection coefficient S11, the preset judgment condition may require it to be less than -10dB in the operating frequency band to ensure good impedance matching and reduce signal reflection; for the forward transmission coefficient S21, the preset judgment condition may require it to be greater than -3dB in the operating frequency band to ensure sufficient signal transmission gain.

[0056] If the S-parameters obtained from the analysis meet the preset judgment conditions, it indicates that the circuit under test 200 has met the design requirements in terms of communication performance and has successfully passed the communication test. At this time, the control unit 111 will determine that the circuit under test 200 is a good product and can further perform subsequent operations, such as recording test results, marking product status, and transferring good products to qualified product areas.

[0057] Therefore, the communication testing process of this invention, through the precise control and coordinated operation of the converter 112, signal generator 136, feedback circuit, and other devices by the control unit 111, and the detailed analysis and judgment of the S-parameters in the response signal, achieves accurate evaluation and reliable determination of the communication performance of the circuit under test 200. Based on this, the control unit 111 will further determine that the circuit under test 200 is a good product, and can take corresponding subsequent operations, such as recording the test results, marking the product status, and transferring the good product to the qualified product storage area.

[0058] In this embodiment, the control component also includes a controller 113 electrically connected to the control unit 111. After completing a comprehensive test of the circuit 200 under test, the control unit 111 generates test information, which covers the test results of various performance indicators such as electrical and communication performance. This test information is then accurately uploaded to the controller 113. To facilitate timely and intuitive access to test results for users, the controller 113 provides multiple display methods: its information display module can present test information in the form of numbers, charts, and text using a display screen; it is equipped with a speaker module that can convert test results into voice information for playback according to preset rules, allowing users to understand the results without looking at the display screen; and it is also equipped with a lighting module that conveys test information through light signals of different colors and flashing frequencies, providing a clear and eye-catching feature that allows users to quickly understand the results from a distance or in low light conditions. In short, these display methods greatly facilitate users in obtaining test results, improving testing efficiency and user experience.

[0059] In one embodiment, the controller 113 is equipped with a USB interface that conforms to standard communication protocols and has high-speed and stable transmission capabilities. To achieve effective communication between the control unit 111 and the controller 113, a USB-to-UART circuit 140 is set between them. This circuit plays a key role in data format conversion in the communication architecture. When the controller 113 sends instructions and data to the control unit 111, it first encapsulates the data into data packets according to the USB protocol and sends them through the USB interface. The USB-to-UART circuit 140 parses and converts the data into simple UART serial data based on TTL level that the control unit 111 can recognize and process, ensuring accuracy and reliability through transmission with specific parameters. When the control unit 111 sends back test information, it encapsulates data frames according to the UART protocol and sends them. The USB-to-UART circuit 140 reverses the conversion, re-encapsulating the UART serial data into data packets conforming to the USB protocol and sending them back to the controller 113. This utilizes the advantages of the USB interface, meets the communication needs of the control unit 111, improves the compatibility and flexibility of the test system, and ensures stable system operation and efficient data interaction.

[0060] In one specific embodiment, the communication test unit uses a network analyzer to perform communication performance testing. The network analyzer integrates a signal generator 136. The network analyzer establishes communication links with both the connection port and the controller 113 via electrical connections. The electrical connection with the connection port ensures that the test signals output by the network analyzer are accurately transmitted to the circuit under test 200, and that the response signals generated by the circuit under test 200 are successfully fed back to the network analyzer. The electrical connection with the controller 113 provides a physical channel for the controller 113 to control the network analyzer and for data interaction.

[0061] In the communication testing process of this embodiment, the controller 113 performs the communication testing function that was originally executed by the control unit 111. Specifically, the controller 113 sends control commands to the network analyzer according to the preset test strategy and parameters, and controls the signal generator 136 in the network analyzer to output test signals to the circuit under test 200.

[0062] Upon receiving the test signal, the circuit under test 200 processes the signal based on its own circuit characteristics and communication functions, generating a corresponding response signal. The network analyzer acquires this response signal in real time and outputs it to the controller 113 via an electrical connection line. During the acquisition of the response signal, the network analyzer employs a preset signal processing algorithm to ensure that the acquired response signal accurately reflects the actual performance of the circuit under test 200.

[0063] Upon receiving a response signal, the controller 113 performs a comprehensive and in-depth analysis of the signal using pre-set analysis algorithms and judgment criteria. These analysis algorithms and judgment criteria are formulated based on the design requirements of the circuit under test 200, industry standards, and actual application scenarios. For example, the controller 113 may analyze key indicators such as the frequency response characteristics, amplitude attenuation, and phase delay of the response signal, and compare these indicators with preset acceptable ranges.

[0064] Once the controller 113, after detailed analysis and judgment, determines that all performance indicators of the circuit under test 200 meet the preset communication test requirements, it determines that the circuit under test 200 has passed the communication test. Based on this, the controller 113 will further determine that the circuit under test 200 is a good product and can take corresponding follow-up operations, such as recording the test results, marking the product status, and transferring the good product to the qualified product storage area.

[0065] This invention also proposes a circuit testing method, which is implemented using the aforementioned testing device 100. In this testing device 100, different execution entities are responsible for implementing the circuit testing method depending on the type of communication test unit. Specifically, when the communication test unit is not a network analyzer, the control unit 111 in the control component assumes the responsibility of executing the circuit testing method; while when the communication test unit is a network analyzer, the controller 113 is responsible for executing the circuit testing method. This fully considers the characteristics of different types of communication test units and the overall architecture of the testing device 100, ensuring that the circuit testing method can be executed efficiently and accurately.

[0066] To clearly illustrate the circuit testing method of the present invention, this embodiment uses the scenario where the communication testing unit is not a network analyzer, and the control unit 111 is responsible for executing the circuit testing method as an example for detailed explanation. It should be clarified that this example is only for more intuitive presentation of the technical solution of the present invention and does not constitute any limitation on the scope of protection of the present invention. In other possible embodiments, when the communication testing unit is a network analyzer, the circuit testing method executed by the controller 113 also falls within the scope of the present invention.

[0067] In a typical embodiment of the present invention, the circuit testing method includes the following steps; Step S1100: Respond to the test command; When testing the circuit under test 200 of a communication device, preparation and execution must be carried out in accordance with the standardized operating procedures. Specifically, the first step is to establish an electrical connection between the circuit under test 200 and the connection port of the testing device 100.

[0068] After completing the electrical connection preparation, the test command acquisition phase begins. The controller 113 can acquire test commands in two ways: first, by receiving test commands input from the outside, or by having an external control system send command signals to the controller 113; second, by automatically generating test commands based on preset program logic, time periods, or specific conditions.

[0069] Upon receiving the test command, the controller 113 accurately outputs the test command to the control unit 111. Upon receiving the test command, the control unit 111 immediately parses and processes it, identifying key information such as the test type and test parameters contained in the command. Subsequently, the control unit 111 initiates the test process for the circuit under test 200 based on the parsing results.

[0070] Step S1200: Control the converter to switch to digital-to-analog conversion mode, and drive the circuit test unit to collect the voltage data of the circuit under test of the communication device; When the test conditions are met and electrical testing of the circuit under test 200 is required, the control unit 111 sends a control signal to the converter 112 to precisely control the converter 112 to switch to digital-to-analog conversion mode. This digital-to-analog conversion mode is preset according to the test requirements. In this mode, the converter 112 can convert digital signals into analog signals, providing a signal form that meets the requirements for subsequent testing.

[0071] Meanwhile, the control unit 111 regulates the power supply through the power control circuit 121, ensuring that the power supply provides stable power to the circuit under test 200 according to preset parameters such as voltage and current. The power control circuit 121 has precise voltage and current regulation functions, and can adjust the power output in real time according to the different needs of the circuit under test 200, ensuring the stability and reliability of the power supply and avoiding adverse effects on the test results due to power fluctuations.

[0072] After the power supply successfully supplies power to the circuit under test 200, the current detection circuit 122 immediately starts working. The current detection circuit 122 can collect the current data in the circuit under test 200 in real time and accurately. Since voltage signals are more convenient and common for transmitting and processing current data, the current detection circuit 122 converts the collected current data into voltage data according to a preset conversion relationship.

[0073] After the data conversion is completed, the current detection circuit 122 will output the converted voltage data to the control unit 111 through a pre-set signal transmission line.

[0074] Step S1300: If the voltage data is within a preset voltage threshold range, the circuit under test is determined to have passed the electrical test; otherwise, it has failed the electrical test. After acquiring and transmitting the voltage data of the circuit under test 200 to the control unit 111, the control unit 111 compares the received voltage data with a preset voltage threshold range. This voltage threshold range is determined based on the operating voltage of the circuit under test 200 under normal operating conditions. Considering that the operating voltage may have a certain normal fluctuation range in actual operation, the left and right endpoints of the voltage threshold range are set based on this normal fluctuation range to ensure the accuracy and reliability of the detection.

[0075] When the voltage data falls within the preset voltage threshold range, it indicates that the circuit contact of the circuit under test 200 is good, all electrical connection points are reliably connected, and there are no electrical connection problems that affect the normal operation of the circuit. At this time, it can be determined that the circuit under test 200 has passed the electrical test and its electrical performance meets the design requirements.

[0076] Conversely, if the voltage data is outside the voltage threshold range, it means that the circuit under test 200 has an electrical connectivity defect. This defect can be caused by various factors, such as porosity or incomplete soldering during the soldering process. Porosity reduces the conductivity of the solder joint, while incomplete soldering leads to poor contact at the connection point. Short circuits can also occur, altering the current path and voltage distribution, thus causing the collected voltage data to deviate from the normal range. These defects severely affect the normal operation of the circuit under test 200, therefore, it can be determined that the circuit under test 200 has failed the electrical test.

[0077] To illustrate this judgment process more clearly, a specific example is given below. Assume the voltage threshold range is set to [3V, 5V], and the collected voltage data is 2V. The control unit 111 compares this 2V voltage data with the [3V, 5V] voltage threshold range. Since 2V is less than 3V, meaning the voltage data is outside the voltage threshold range, according to the above judgment logic, the control unit 111 determines that the circuit under test 200 has an electrical connection defect and fails the electrical test. Based on this, the control unit 111 further determines that the circuit under test 200 is not a good product and can take corresponding follow-up measures, such as marking the circuit and recording defect information, for further repair or processing.

[0078] Step S1400: When the circuit test is passed, the control converter is switched to the general input / output mode, and the drive signal generator outputs a test signal to the circuit under test. Once the electrical test of the circuit under test 200 is completed and it is determined that the circuit under test 200 has passed the test, it indicates that the electrical connection performance of the circuit under test 200 meets the preset requirements. At this time, the subsequent communication test stage can be entered to further evaluate whether the communication function of the circuit under test 200 is normal.

[0079] The control unit 111 sends control commands to the converter 112, which control the switching of the converter 112's operating mode. Upon receiving the command, the converter 112 switches from its current analog-to-digital conversion mode to a general-purpose input / output (GPIO) mode. The GPIO mode offers broader signal processing and transmission capabilities, meeting the diverse signal interaction needs during communication testing.

[0080] After the converter 112 completes the switching of its operating mode, the control unit 111 sends a drive signal to the signal generator 136 according to the preset communication test parameters and procedures. This drive signal contains key information controlling the output test signal of the signal generator 136, such as the frequency, amplitude, and phase of the test signal. Upon receiving the drive signal, the signal generator 136 accurately generates the corresponding test signal according to the instructions and outputs the test signal to the circuit under test 200, thereby initiating the communication test process.

[0081] Step S1500: Receive the response signal of the current under test feedback, analyze the response signal, and if the response signal meets the preset communication test conditions, then the circuit under test has passed the communication test and is determined to be a good product. When the signal generator 136 outputs a test signal to the circuit under test 200, the circuit under test 200 will respond to the test signal according to its own circuit characteristics and communication functions, thereby generating a corresponding response signal. This response signal contains key information about the circuit under test 200 during the communication process and can intuitively reflect the quality of its communication performance.

[0082] After generating a response signal, the circuit under test 200 outputs it to the feedback circuit through a specific signal transmission path. The feedback circuit has the functions of signal reception, processing, and transmission. It performs preliminary conditioning on the received response signal, such as amplification and filtering, to eliminate noise and interference that may be introduced during signal transmission, ensuring signal quality and stability. The conditioned response signal is then accurately output to the control unit 111 by the feedback circuit.

[0083] Upon receiving the response signal, the control unit 111 will conduct a comprehensive and in-depth analysis of the response signal based on a preset communication test algorithm and judgment conditions. The preset communication test conditions are determined comprehensively based on factors such as the design requirements of the circuit under test 200, industry standards, and actual application scenarios.

[0084] If, after analysis, the response signal meets the preset communication test conditions, this indicates that the circuit under test 200 has met the design requirements in terms of communication performance and can perform communication normally and stably. At this point, it can be determined that the circuit under test 200 has passed the communication test. Based on this, the control unit 111 will further determine that the circuit under test 200 is a good product and can take corresponding follow-up measures, such as recording the test results, marking the product status, and transferring the good product to the qualified product storage area.

[0085] To more clearly illustrate the analysis process of the response signal by the control unit 111, a specific example is given below. In communication testing, S-parameters are one of the important indicators for measuring the performance of a circuit network. They can reflect the transmission and reflection characteristics of the circuit at different frequencies. The control unit 111 accurately extracts and analyzes the S-parameters in the response signal, and carefully compares the extracted S-parameter values ​​with preset judgment conditions. The preset judgment conditions may include requirements for multiple aspects such as the amplitude range, phase range, and impedance matching degree of the S-parameters. If the extracted S-parameters meet all the preset judgment conditions, it indicates that the circuit under test 200 performs well in terms of communication transmission and reflection performance, meets the design standards, and thus determines that the circuit under test 200 has passed the communication test. The control unit 111 ultimately determines that the circuit under test 200 is a good product.

[0086] Based on any embodiment of the circuit testing method of the present invention, the step of driving the signal generator to output a test signal to the circuit under test further includes the following step: Step S1410: Control the signal generator to perform frequency sweeping and sequentially output test signals at different frequency points to the circuit under test; During the communication performance test of the circuit under test 200, the control unit 111 sends a control command to the signal generator 136 to perform a frequency sweep operation.

[0087] The frequency sweep operation is based on a pre-set start frequency, end frequency, and frequency step value, and the signal generator 136 begins to operate sequentially. The start frequency marks the beginning of the sweep, the end frequency defines the end point, and the frequency step value determines the frequency interval between two adjacent test frequencies. Based on these parameters, the signal generator 136 sequentially outputs a series of test signals at different frequencies to the circuit under test 200. These test signals have a uniform frequency distribution and cover the entire operating frequency band of the circuit under test 200, ensuring comprehensive testing of the circuit under test 200's performance across the entire operating frequency range.

[0088] During the frequency sweep process, for each discrete frequency point, the output test signal is accurately applied to the circuit under test 200. Upon receiving the test signal, the circuit under test 200 responds and outputs a corresponding response signal. These response signals contain communication performance information of the circuit under test 200 at that frequency point, such as signal gain, loss, and phase change.

[0089] The control unit 111 achieves a systematic scan of the entire operating frequency band by changing the frequency of the test signal point by point. This testing method enables the test device 100 to acquire the communication parameters of the circuit under test 200 completely and continuously across the entire frequency domain. Compared with traditional single-frequency point testing, frequency sweep testing can acquire more comprehensive and richer data information, thereby achieving an accurate evaluation of the communication performance of the circuit under test 200.

[0090] These high-resolution dynamic data provide a solid and reliable foundation for judging the soldering quality, functional consistency, and RF performance of the circuit under test 200. For example, by analyzing the response signals at different frequency points, defects such as cold solder joints and short circuits that may exist during the soldering process can be detected. These defects can cause abnormal signal transmission performance at specific frequency points. At the same time, the functional consistency of the circuit under test 200 at different frequency bands can be evaluated to ensure that it can stably achieve the expected communication function throughout the entire operating frequency band. In addition, for RF performance indicators such as gain flatness and VSWR, frequency sweep testing can provide detailed data to help accurately determine whether they meet the requirements and relevant standards.

[0091] Step S1420: If the response signals corresponding to all frequency points meet the preset communication test conditions, the circuit under test passes the communication test; otherwise, it fails the communication test. After completing the frequency sweep test process for the circuit under test 200, the control unit 111 immediately starts the data processing stage, that is, to perform comprehensive analysis and judgment on the response signals accurately collected at each frequency point.

[0092] Specifically, the control unit 111 extracts at least one representative feature parameter for the response signal corresponding to each frequency point. These feature parameters cover multiple key indicators reflecting signal strength, transmission characteristics, signal quality, and communication accuracy. For example, signal amplitude directly reflects the energy level of the signal; S-parameters accurately describe the transmission and reflection characteristics of the circuit network at different frequencies; signal-to-noise ratio reflects the relative proportion of useful information to noise in the signal and is an important indicator for measuring signal quality; and bit error rate directly reflects the accuracy of data transmission during communication.

[0093] After extracting the characteristic parameters, the control unit 111 compares these parameters one by one with the preset communication test conditions. If, after detailed comparison, it is found that the characteristic parameters of the response signals corresponding to all frequency points meet the preset communication test conditions, this indicates that the radio frequency channel function of the circuit under test 200 at each frequency point is complete and its performance fully meets the standards, enabling stable and reliable communication. At this time, the control unit 111 determines that the circuit under test 200 has passed the communication test.

[0094] Conversely, if during the comparison process it is found that the characteristic parameters of the response signal at any frequency point do not meet the preset conditions, this means that the circuit under test 200 has a functional defect or performance degradation problem at the corresponding frequency point or band. Such problems may be caused by various factors, such as poor soldering causing unstable circuit connections and affecting signal transmission; component failures altering the electrical characteristics of the circuit, leading to performance degradation; and design deviations potentially preventing the circuit from achieving the expected performance indicators at the actual operating frequency. In this case, the control unit 111 will determine that the circuit under test 200 has failed the communication test.

[0095] Regardless of whether the test result is pass or fail, the control unit 111 will record the test result and the corresponding frequency point information in detail, and upload it to the upper-level controller 113 through a specific data transmission interface. The upper-level controller 113 will generate a final test report based on this recorded information, providing a comprehensive and accurate basis for subsequent product quality assessment, fault diagnosis, and improvement.

[0096] Based on any embodiment of the circuit testing method of the present invention, the step of receiving the response signal fed back by the circuit under test, analyzing the response signal, and determining whether the circuit under test passes the communication test if the response signal meets preset communication test conditions includes the following steps: Step S1510: Based on the test signal and the response signal at the corresponding frequency point, calculate the S-parameters of the circuit under test at the corresponding frequency point; After performing test signal excitation and corresponding response signal acquisition operations on the circuit under test 200 at each discrete frequency point, the control unit 111 then initiates an in-depth analysis process of the S-parameters.

[0097] Specifically, for each pre-set test frequency, the control unit 111 performs two key data acquisition tasks in parallel. First, it acquires the frequency information of the test signal generated by the signal generator 136. This frequency information clarifies the specific frequency position targeted by the current test, providing an accurate frequency reference for subsequent analysis. Second, it simultaneously acquires the response signal output by the circuit under test 200 at the frequency corresponding to the aforementioned test signal. This response signal carries the response characteristics of the circuit under test 200 to external stimuli at that frequency, and is a key basis for analyzing its internal performance.

[0098] After successfully acquiring these two sets of key signals, the control unit 111 uses them as input parameters and performs calculations using a pre-set algorithm. The pre-set algorithm employs a mature vector operation method, which features high precision and stability, and can accurately process the amplitude and phase information in the signal. Through the calculation of this algorithm, the S-parameters of the circuit under test 200 at the corresponding frequency point can be accurately calculated.

[0099] The S-parameters, as an important set of parameters describing the characteristics of circuit networks, at least cover insertion loss (typically represented by the S21 parameter), which reflects signal transmission characteristics, and return loss (typically represented by the S11 parameter), which reflects the degree of port matching. The insertion loss S21 parameter quantifies the energy loss of a signal as it travels from one port to another in the circuit; its value directly reflects the circuit's transmission efficiency. The return loss S11 parameter measures the reflection of the signal at the circuit's input port; its value reflects the degree of matching between the port and the external source. The calculated S-parameter results are complex numbers containing amplitude and phase information. The amplitude information reflects the signal's energy intensity, while the phase information reflects the signal's phase shift; together, they constitute a comprehensive description of the circuit's performance.

[0100] Through the above calculation process, the macroscopic response characteristics of the circuit under test 200 to external stimuli were successfully transformed into standardized network parameters that can accurately characterize its intrinsic properties such as internal transmission, reflection, and isolation. These standardized network parameters have the significant advantages of being direct, objective, and quantifiable, providing a solid and reliable data foundation for subsequent performance qualification of the circuit under test 200.

[0101] Step S1520: The preset communication test conditions include an S-parameter threshold range. The S-parameter is compared with the S-parameter threshold range. If the S-parameter is within the S-parameter threshold range, it is determined that the circuit under test has passed the S-parameter test. After completing the S-parameter calculation process for the circuit under test 200 at various frequency points, the control unit 111 will perform a judgment on the calculated S-parameters according to the preset communication test conditions.

[0102] The preset communication test conditions include S-parameter threshold ranges set for different performance indicators. Specifically, for insertion loss (S21 parameter), a key parameter characterizing signal path transmission efficiency, a minimum allowable value is set, for example, it must be greater than -3dB. This threshold is set based on the maximum allowable energy loss limit during signal transmission, ensuring that the signal can reach the receiving end with sufficient strength and guaranteeing communication reliability. For return loss (S11 parameter), which characterizes port matching, a maximum allowable value is set, such as requiring it to be less than -10dB. The determination of this threshold aims to ensure good matching characteristics between the port and the external signal source, reduce signal reflection, and improve signal transmission quality.

[0103] During the determination process, the control unit 111 will sequentially extract the calculated S-parameter values ​​of the circuit under test 200 at each test frequency point, and compare these parameter values ​​with the pre-set S-parameter threshold range at the corresponding frequency point one by one in detail.

[0104] If, after comprehensive comparison, it is found that the S-parameter values ​​at all test frequencies strictly fall within their corresponding S-parameter threshold ranges, this indicates that the RF performance of the circuit under test 200 at each frequency meets the design requirements, and key performance indicators such as signal transmission and port matching are all performing well. At this point, the control unit 111 will determine that the circuit under test 200 has passed the S-parameter test.

[0105] Conversely, if during the comparison process, it is found that any S-parameter value at any frequency exceeds the preset threshold range, this means that the circuit under test 200 has a performance defect at that frequency. This performance defect may be caused by various factors, such as parameter deviations of circuit components, changes in contact resistance due to poor soldering, and signal interference caused by unreasonable circuit layout. In this case, the control unit 111 will determine that the circuit under test 200 has failed the test.

[0106] The above-described judgment logic is based on objective and quantifiable S-parameter data, eliminating errors that may arise from subjective judgment and achieving an accurate assessment of the RF performance of the circuit under test 200. It provides a core basis for accurately determining whether the circuit under test 200 is a good or defective product, and plays an important guiding role in ensuring product quality and improving production efficiency.

[0107] Based on any embodiment of the circuit testing method of the present invention, when the communication testing unit is selected as a network analyzer, the entire circuit testing process is executed in a coordinated manner by the controller 113.

[0108] Specifically, the controller 113 performs dual control functions. On one hand, the controller 113 sends control commands to the control unit 111 to control the control unit 111 to perform electrical testing-related tasks. During this process, the control unit 111 executes steps S1200-S1300 as detailed above, according to the commands from the controller 113. On the other hand, the controller 113 itself directly controls the network analyzer to perform communication tests. The controller 113 establishes a stable data communication connection with the network analyzer, sends test commands to it, and receives test results. During this process, the controller 113 itself is responsible for executing steps S1100, S1400, and S1500.

[0109] Through this clearly defined control method, the controller 113 can efficiently coordinate the work of the control unit 111 and the network analyzer, ensuring that the two key links of electrical testing and communication testing in the circuit testing method are closely coordinated and carried out in an orderly manner, thereby achieving comprehensive and accurate testing and evaluation of circuit performance.

[0110] Based on any embodiment of this application, please refer to Figure 6 Another embodiment of this application also provides a computer device that can test the use of a controller in a testing apparatus, such as... Figure 6 The diagram shows the internal structure of a computer device. The computer device includes a processor, a computer-readable storage medium, a memory, and a network interface connected via a system bus. The computer-readable storage medium stores an operating system, a database, and a computer program encapsulating computer-readable instructions. The database may store a sequence of control information. When the computer-readable instructions are executed by the processor, the processor can implement a circuit testing method. The processor of the computer device provides computing and control capabilities, supporting the operation of the entire computer device. The memory of the computer device may store computer-readable instructions. When these computer-readable instructions are executed by the processor, the processor can execute the circuit testing method of this application. The network interface of the computer device is used for communication with a terminal. Those skilled in the art will understand that… Figure 6 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0111] This application also provides a storage medium storing computer-readable instructions, which, when executed by one or more processors, cause the one or more processors to perform the steps of the circuit testing method described in any embodiment of this application.

[0112] This application also provides a computer program product, including a computer program / instructions that, when executed by one or more processors, implement the steps of the circuit testing method described in any embodiment of this application.

[0113] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments of this application can be implemented by a computer program instructing related hardware. This computer program can be stored in a computer-readable storage medium, and when executed, it can include the processes of the embodiments of the methods described above. The aforementioned storage medium can be a computer-readable storage medium such as a magnetic disk, optical disk, read-only memory (ROM), or random access memory (RAM).

[0114] In summary, the testing device can acquire voltage and communication signals from the circuit under test. On the one hand, based on the acquired voltage signals, it uses a preset judgment algorithm to evaluate the electrical connectivity of the circuit and determine whether there are any defects in electrical connectivity, providing a reliable basis for troubleshooting the electrical performance of the circuit. On the other hand, the testing device analyzes the acquired communication signals and, based on established communication quality standards, strictly judges whether the quality of the communication signals can meet the corresponding communication requirements, thereby comprehensively ensuring the stable operation and communication quality of the communication equipment circuit.

[0115] The above description is merely a preferred embodiment of the present invention and an explanation of the technical principles employed. Those skilled in the art should understand that the scope of the invention is not limited to the specific combination of the above-described technical features, but also includes other technical solutions formed by arbitrary combinations of the above-described technical features or their equivalents without departing from the inventive concept. For example, technical solutions formed by substituting the above-described features with (but not limited to) technical features with similar functions as those in the present invention.

[0116] Although the subject matter has been described using language specific to structural features and / or methodological logic, it should be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or actions described above. Rather, the specific features and actions described above are merely illustrative examples of implementing the claims.

Claims

1. A test device, characterized by The test device comprises a control assembly, a circuit detection unit, a communication test unit, a converter and a connection port, the connection port is used for electrically connecting with a circuit to be tested of a communication device, the circuit detection unit is electrically connected with the connection port through the converter, the communication test unit comprises a signal generator, the signal generator is electrically connected with the connection port, and the control assembly is electrically connected with the signal generator and the connection port respectively.

2. The test device of claim 1, wherein, The control assembly comprises a control unit, the current detection unit further comprises a power supply control circuit, a current detection circuit and a first protection circuit, the converter is electrically connected with the control unit and the power supply detection circuit respectively, the current detection circuit is electrically connected with the power supply control circuit and the connection port respectively, and the first protection circuit is electrically connected with the converter and the connection port respectively.

3. The test device of claim 1, wherein, The communication test unit comprises a feedback circuit, the feedback circuit comprises a detection circuit, a second protection circuit, a first filter circuit and a second filter circuit which are connected in sequence, wherein the control assembly is electrically connected with the detection circuit, and the second filter circuit is electrically connected with the connection port.

4. The test device of claim 1, wherein, The communication test unit further comprises an isolation circuit, and the signal generator is electrically connected with the connection port through the isolation circuit.

5. The test device of claim 2, wherein, The control assembly further comprises a controller, the communication test unit is a network analyzer, the controller is electrically connected with the control unit, and the network analyzer is electrically connected with the controller and the connection port respectively.

6. A method of testing a circuit, characterized by, The test device is implemented based on the test device of claim 1, comprising the following steps: responding to a test instruction; controlling the converter to switch to a digital-analog conversion mode, and driving the circuit detection unit to collect voltage data of the circuit to be tested of the communication device; if the voltage data is within a preset voltage threshold interval, it is determined that the circuit to be tested passes the electrical detection, otherwise, it does not pass the electrical detection; when passing the electrical detection, the converter is controlled to switch to a general input-output mode, and the signal generator is driven to output a test signal to the circuit to be tested; receiving a response signal fed back by the circuit to be tested, analyzing the response signal, and if the response signal meets a preset communication test condition, the circuit to be tested passes the communication test, and it is determined that the circuit to be tested is a good product.

7. The method of claim 6, wherein, In the step of driving the signal generator to output a test signal to the circuit to be tested, the following steps are further included: controlling the signal generator to sweep frequency, and sequentially outputting test signals of different frequency points to the circuit to be tested; if the response signals corresponding to all frequency points all meet the preset communication test condition, the circuit to be tested passes the communication test, otherwise, it does not pass the communication test.

8. The method of claim 6 or 7, wherein, In the step of receiving a response signal fed back by the circuit to be tested, analyzing the response signal, and if the response signal meets a preset communication test condition, the circuit to be tested passes the communication test, the following steps are included: based on the test signal and the response signal corresponding to the frequency point, calculating S parameters of the circuit to be tested at the corresponding frequency point; The preset communication test condition comprises an S parameter threshold interval, the S parameter is compared with the S parameter threshold interval, and if the S parameter is within the S parameter threshold interval, it is determined that the to-be-tested circuit passes the S parameter test.

9. A computer device comprising a central processing unit and a memory, characterized in that The central processing unit is configured to invoke a computer program stored in the memory to execute the steps of the method according to any one of claims 6 to 8.

10. A computer-readable storage medium, characterized in that, The computer program is stored in the form of computer readable instructions and is implemented according to the method of any one of claims 6 to 8, and when the computer program is invoked and run by a computer, the steps included in the corresponding method are executed.

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