A tantalum capacitor and its preparation method
By using a split frame structure and electrochemical deposition of copper foil cathode internal connectors, the problems of volumetric efficiency and conductivity of tantalum capacitors have been solved, achieving higher capacitance density and lower equivalent series resistance, simplifying the manufacturing process, and improving the reliability and high-frequency filtering performance of capacitors.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- NINGXIA KEPAISI ELECTRONIC TECHNOLOGY CO LTD
- Filing Date
- 2026-03-31
- Publication Date
- 2026-05-26
AI Technical Summary
Existing tantalum capacitors face difficulties in improving volumetric efficiency. Iron-nickel alloy materials cannot meet the requirements for conductivity and support, while copper materials lead to decreased insulation and increased leakage current when at the anode. Combinations of heterogeneous materials also contradict the structure, and traditional packaging processes are complex and uneconomical.
It adopts a split frame structure, uses copper foil as the cathode internal connector, and forms the external electrode through electrochemical deposition. Combined with the positive electrode internal connector and the package, it simplifies the production process, omits the sandblasting process, and improves the compactness of the package.
It improves the volume utilization and capacitance density of capacitors, reduces the equivalent series resistance, enhances the reliability and sealing of capacitors, simplifies the manufacturing process, and improves the high-frequency filtering performance of capacitors.
Smart Images

Figure CN122091402A_ABST