A composite centralized axle temperature alarm comprehensive test bench

Abstract

The application provides a kind of composite centralized axle temperature alarm comprehensive test bench, comprising: host computer, axle temperature alarm test unit, temperature sensor test unit, aging test unit, comprehensive detection bench body.The composite centralized axle temperature alarm comprehensive test bench provided by the application is cooperated with host computer, axle temperature alarm test unit, temperature sensor test unit, aging test unit, comprehensive detection bench body and power unit and other structures, each unit is integrated in the same body, without splitting test control display, sensor and recorder, so as to solve the problem of function dispersion, reduce the detection cost;the power unit dynamically adjusts voltage and flow, the host computer automatically collects and analyzes data and generates report, without manual intervention, reduces the error risk;at the same time, the aging test unit simulates long-term operation environment, the fault injection module covers multiple fault scenarios, adapts to different series of axle temperature alarms, realizes full-dimension detection, improves the comprehensiveness and reliability of detection.

Description

Technical Field

[0001] This invention relates to the field of rail transit equipment testing technology, and in particular to a comprehensive test bench for a composite centralized axle temperature alarm. Background Technology

[0002] With the development of railway construction in my country, the number of passenger cars in use has increased dramatically, and the safe operation of passenger cars has become increasingly important. Passenger car wheel axles play a crucial role in the load-bearing and moving parts of passenger cars. During passenger car operation, it is necessary to monitor the wheel axles in real time, and the axle temperature alarm is a key device for real-time feedback on the wheel axle operating status.

[0003] With the commissioning of 160 km / h centralized power electric multiple units and the upgrading and transformation of conventional trains, the maintenance of the composite axle temperature alarms used will continue.

[0004] However, because the composite centralized shaft temperature alarm is more powerful and redundant than the KZS / M type shaft temperature alarm, it has the following problems: Dispersed functions: Different equipment is needed to test and control the display, sensor and recorder, which is inefficient and costly; Low level of automation: It relies on manual operation and cannot realize automatic data analysis and storage, which leads to a high risk of error; Lack of aging verification: There is a lack of simulation tests on the long-term operational stability of the equipment (such as communication performance and data storage reliability); Insufficient compatibility: It is difficult to adapt to shaft temperature alarms from different manufacturers and with different protocols, so the existing integrated test bench can no longer meet the testing requirements.

[0005] Therefore, it is necessary to provide a comprehensive test bench for a composite centralized shaft temperature alarm to solve the above-mentioned technical problems. Summary of the Invention

[0006] This invention provides a comprehensive test bench for composite centralized shaft temperature alarms, which solves the problems of existing test benches having scattered functions, low automation level, lack of aging verification, and insufficient compatibility, and cannot meet the full-dimensional testing needs of composite centralized shaft temperature alarms.

[0007] To solve the above-mentioned technical problems, the present invention provides a composite centralized shaft temperature alarm integrated test bench, comprising: a host computer, a shaft temperature alarm test unit, a temperature sensor test unit, an aging test unit, an integrated test bench body, and a power supply unit;

[0008] The power supply unit is a programmable DC power supply module with an input of AC220V±10% and an output of DC0-200V (0.1V step) and current of 0-2A (0.1A step). It communicates with the host computer via RS-485 bus using ModbusRTU protocol and a baud rate of 9600bps. It features dynamic voltage / current regulation and status feedback functions. One shaft temperature alarm test unit and one aging test unit are each configured.

[0009] The shaft temperature alarm test unit is connected to the control display component and recorder component under test. It is used to test the stand-alone performance and network communication performance of the control display and recorder of KZF and KZS / M series shaft temperature alarms. The test items include power test, digital accuracy test, analog accuracy test, and safety loop test.

[0010] The temperature sensor testing unit is connected to the temperature sensor component under test and includes a constant temperature bath, an adapter plate, and an insulation resistance tester.

[0011] The aging test unit includes an aging test rack, an FSK communication module, a USB flash drive, and a fault injection module;

[0012] The integrated testing platform adopts an aluminum alloy frame structure and integrates various unit modules.

[0013] Preferably, the shaft temperature alarm test unit includes a simulated temperature module, an ARM microcontroller simulation module, and a main control microcontroller module;

[0014] The simulated temperature module is implemented using a precision voltage conditioning circuit, which includes a digital-to-analog converter unit, a high-precision conditioning unit, and a passive device unit. The digital-to-analog converter unit receives digital instructions from the host computer and generates an electrical signal that matches the target resistance value after signal conditioning.

[0015] The ARM microcontroller simulation module uses GD32F407VGT6 as the main control chip and nine GD32E230F8P6TR chips to build a 3×3 output matrix, realizing the parallel output of nine high-precision digital temperature signals. It supports the Modbus RTU protocol, and each GD32E230F8P6TR slave chip can be independently configured with an address.

[0016] The main control microcontroller module is used to coordinate the work between different modules and to interact with the host computer.

[0017] Preferably, the temperature control range of the constant temperature bath of the temperature sensor test unit is -10℃ to +100℃, the temperature fluctuation is ±0.05℃, and it has a built-in XMF analog-digital PID temperature controller with a heating rate ≥5℃ / min and a cooling rate ≥3℃ / min.

[0018] The adapter board features gold-plated contacts with a thickness ≥3μm, supports the installation of 36 sensors at a time, and allows switching of detection channels via a multiplexing circuit with a channel switching time ≤10ms and a contact resistance ≤0.1Ω.

[0019] Preferably, the aging test rack of the aging test unit supports simultaneous access to 20 control displays and 1 recorder, and simulates a train control unit through RS-485 bus to send periodic commands with a period of 2 seconds. The communication protocol is compatible with the ModbusRTU standard, and the baud rate can be configured as needed.

[0020] The FSK communication module uses frequency shift keying modulation technology, and the carrier frequency can be set to 1200Hz and 2400Hz.

[0021] The USB flash drive is formatted as FAT32 and has a storage capacity of ≥8GB.

[0022] The fault injection module can simulate communication interference faults, power supply abnormality faults, and sensor faults, and supports programmable fault injection strategies.

[0023] Preferably, the communication interference fault simulation of the fault injection module includes EFT pulse interference, THD harmonic interference, bus short circuit and bus open circuit. The amplitude of the EFT pulse interference is ±2kV, the rise time is 5ns, and the duration is adjustable from 10μs to 1ms. The harmonic order of the THD harmonic interference is 2-30 and the distortion rate is continuously adjustable from 0-50%. The equivalent resistance of the bus short circuit is ≤1Ω. The bus open circuit is achieved by relay switching, and the switching time is ≤10ms.

[0024] The power supply fault simulation includes voltage instantaneous drop, voltage surge, and ripple injection. The voltage instantaneous drop is as low as 70% of the rated voltage, with an adjustable duration of 10ms-1s. The voltage surge is as high as 120% of the rated voltage, with an adjustable pulse width of 50μs-10ms. The ripple injection ripple frequency is 100Hz-1MHz, and the amplitude is 0-2Vpp adjustable.

[0025] The sensor fault simulation supports multi-channel synchronous / asynchronous fault simulation of 18 sensors, including sensor open circuit, sensor short circuit, and sensor temperature drift. The equivalent resistance of the sensor short circuit is ≤1Ω, and the sensor temperature drift is adjustable from ±0.5℃ to ±5℃.

[0026] The programmable fault injection strategy includes programmable sequences, random fault injection, and time / event-triggered injection.

[0027] Preferably, the testing software of the host computer includes a comprehensive performance testing module, an aging data analysis module, a fault injection control and data analysis module, a network communication performance intelligent analysis module, a full-link data integrity verification module, and an intelligent expert diagnosis rule base module;

[0028] The comprehensive performance testing module can control the shaft temperature alarm testing unit and the temperature sensor testing unit to complete the testing and generate exportable reports.

[0029] The aging data analysis module can parse shaft temperature data transferred from a USB flash drive and supports visualization of data trend charts.

[0030] The fault injection control and data analysis module supports fault-related parameter settings, fault response data acquisition, and fault analysis report generation.

[0031] The intelligent analysis module for network communication performance can statistically analyze communication delay and bit error rate, and introduce the ARIMA time series analysis model for trend prediction.

[0032] The end-to-end data integrity verification module integrates CRC-16 check, sliding window comparison algorithm, and USB flash drive bad block detection function;

[0033] The intelligent expert diagnostic rule base module has a built-in fault mode knowledge base, which supports users to add custom fault modes.

[0034] Preferably, the ModbusRTU protocol of the programmable DC power supply module supports address encoding, with the device address range being 1-15, and supports broadcast mode with an address of 0x00; the data frame format is 8 data bits, 1 stop bit, no parity check, and the CRC check code is 16 bits, with the low byte first and the high byte last.

[0035] The programmable DC power supply module supports switching between constant voltage and constant current modes, with a response time of ≤100ms and a data sampling rate of ≥10Hz.

[0036] Preferably, the host computer's test software has a built-in power management module that automatically switches operating conditions via the Modbus RTU protocol and supports preset operating condition templates.

[0037] Preferably, the data frame format of the ARM microcontroller simulation module is 1 start bit, 8 data bits, and 1 stop bit, with no parity check. The GD32F407VGT6 master chip communicates with 9 GD32E230F8P6TR slave chips via the SPI bus, adopting a "master transmit, slave receive" timing mode. Each slave chip is assigned an independent chip select pin, and the timing deviation of the 9 signal outputs is ≤10μs.

[0038] The shaft temperature alarm test unit's 9-channel digital resistance simulation module is controlled by relays for switching on and off, with relay switching life ≥10. 6 Second-rate.

[0039] Preferably, the aging test frame includes a main body, two mounting components, two filter components, and two heat dissipation components. The two mounting components are respectively disposed on both sides of the main body, the two filter components are respectively disposed on the sides of the two mounting components, and the two heat dissipation components are respectively disposed on the inner sides of the two mounting components. Each mounting component includes a mounting frame, a mounting groove, a connector groove, and a ventilation groove. The mounting frame is fixedly mounted inside the side of the main body, the mounting groove is opened inside one side of the mounting frame, the connector groove is opened inside the other side of the mounting frame, and the ventilation groove is opened... The filter assembly is located on the side of the insertion slot and communicates with the mounting slot; each of the two filter assemblies includes a mounting plate, a filter screen, a sealing gasket, and a pull groove. The mounting plate is inserted into the inner side of the insertion slot, the filter screen is fixedly installed on the inner side of the mounting plate, the sealing gasket is fixedly installed on one side of the mounting plate, and one side abuts against one side of the inner side of the insertion slot. The pull groove is opened inside the top of the mounting plate; each of the two heat dissipation assemblies includes a support frame and a cooling fan. The support frame is fixedly installed on the inner side of the mounting slot, and the cooling fan is fixedly installed inside the support frame.

[0040] Compared with related technologies, the composite centralized shaft temperature alarm integrated test bench provided by the present invention has the following beneficial effects:

[0041] This invention provides a composite centralized shaft temperature alarm integrated test bench. It integrates a host computer, shaft temperature alarm testing unit, temperature sensor testing unit, aging test unit, integrated testing platform, and power supply unit, with all units integrated into a single platform. This eliminates the need to separate the test control display, sensors, and recorders, thus solving the problem of functional dispersion and reducing testing costs. The power supply unit dynamically adjusts voltage and current, and the host computer automatically collects and analyzes data and generates reports without manual intervention, reducing error risks. Simultaneously, the aging test unit simulates long-term operating environments, and the fault injection module covers multiple fault scenarios, adapting to different series of shaft temperature alarms to achieve comprehensive testing and improve the comprehensiveness and reliability of testing. Attached Figure Description

[0042] Figure 1 A system structure block diagram of a composite centralized shaft temperature alarm integrated test bench provided by the present invention;

[0043] Figure 2 This is a structural diagram of the shaft temperature alarm test unit provided by the present invention;

[0044] Figure 3 A schematic diagram of the temperature sensor test unit provided by the present invention;

[0045] Figure 4 The aging test unit operation flowchart provided by the present invention;

[0046] Figure 5 A diagram of the simulated temperature module provided by this invention;

[0047] Figure 6 This is a schematic diagram of the structure of each body of the test bench provided by the present invention;

[0048] Figure 7 Block diagram of the fault injection module provided by the present invention;

[0049] Figure 8 This is a schematic diagram of the aging test rack structure provided by the present invention;

[0050] Figure 9 for Figure 8 The diagram shows a cross-sectional view of the mounting components.

[0051] Figure 10 for Figure 9 The enlarged schematic diagram of part A is shown.

[0052] The following are the labels in the diagram: 1. Main body, 2. Mounting components, 21. Mounting frame, 22. Mounting slot, 23. Plug-in slot, 24. Ventilation slot, 3. Filter components, 31. Mounting plate, 32. Filter screen, 33. Sealing gasket, 34. Pull-out slot, 4. Heat dissipation components, 41. Support frame, 42. Cooling fan. Detailed Implementation

[0053] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0054] Please refer to the following: Figure 1 , Figure 2 , Figure 3 , Figure 4 , Figure 5 , Figure 6 , Figure 7 , same 8, Figure 9 and Figure 10 ,in, Figure 1 A system structure block diagram of a composite centralized shaft temperature alarm integrated test bench provided by the present invention; Figure 2 This is a structural diagram of the shaft temperature alarm test unit provided by the present invention; Figure 3 A schematic diagram of the temperature sensor test unit provided by the present invention; Figure 4 The aging test unit operation flowchart provided by the present invention; Figure 5 A diagram of the simulated temperature module provided by this invention; Figure 6 This is a schematic diagram of the structure of each body of the test bench provided by the present invention; Figure 7 Block diagram of the fault injection module provided by the present invention; Figure 8 This is a schematic diagram of the aging test rack structure provided by the present invention; Figure 9 for Figure 8The diagram shows a cross-sectional view of the mounting components. Figure 10 for Figure 9 The enlarged schematic diagram of part A is shown.

[0055] A composite centralized shaft temperature alarm integrated test bench includes: a host computer, a shaft temperature alarm test unit, a temperature sensor test unit, an aging test unit, an integrated test bench body, and a power supply unit;

[0056] The power supply unit is a programmable DC power supply module with an input of AC220V±10% and an output of DC0-200V (0.1V step) and current of 0-2A (0.1A step). It communicates with the host computer via RS-485 bus using ModbusRTU protocol and a baud rate of 9600bps. It features dynamic voltage / current regulation and status feedback functions. One shaft temperature alarm test unit and one aging test unit are each configured.

[0057] The shaft temperature alarm test unit is connected to the control display component and recorder component under test. It is used to test the stand-alone performance and network communication performance of the control display and recorder of KZF and KZS / M series shaft temperature alarms. The test items include power test, digital accuracy test, analog accuracy test, and safety loop test.

[0058] The temperature sensor testing unit is connected to the temperature sensor component under test and includes a constant temperature bath, an adapter plate, and an insulation resistance tester.

[0059] The aging test unit includes an aging test rack, an FSK communication module, a USB flash drive, and a fault injection module;

[0060] The integrated testing platform adopts an aluminum alloy frame structure and integrates various unit modules.

[0061] The shaft temperature alarm test unit includes a simulated temperature module, an ARM microcontroller simulation module, and a main control microcontroller module.

[0062] The simulated temperature module is implemented using a precision voltage conditioning circuit, which includes a digital-to-analog converter unit, a high-precision conditioning unit, and a passive device unit. The digital-to-analog converter unit receives digital instructions from the host computer and generates an electrical signal that matches the target resistance value after signal conditioning.

[0063] The ARM microcontroller simulation module uses GD32F407VGT6 as the main control chip and nine GD32E230F8P6TR chips to build a 3×3 output matrix, realizing the parallel output of nine high-precision digital temperature signals. It supports the Modbus RTU protocol, and each GD32E230F8P6TR slave chip can be independently configured with an address.

[0064] The main control microcontroller module is used to coordinate the work between different modules and to interact with the host computer.

[0065] Digital-to-analog converter unit: including U21, which is a 16-bit resolution digital-to-analog converter, configured with an SPI control interface consisting of SYN, DIN and CLK pins to receive digital commands from the host computer;

[0066] High-precision conditioning unit: including U20 and U22 high-precision operational amplifiers, and precision resistors R69, R70, R71, R72, R73, and R74, to achieve low-noise and high-precision signal conditioning;

[0067] Passive component unit: includes filter capacitors C91, C92, C93, C94, C95, and C96, of which C92, C93, C95, and C96 are power supply decoupling capacitors (compatible with -5V power supply), and C91 and C94 are signal filter capacitors.

[0068] The temperature control range of the constant temperature bath of the temperature sensor test unit is -10℃ to +100℃, with a temperature fluctuation of ±0.05℃. It has a built-in XMF analog-digital PID temperature controller with a heating rate ≥5℃ / min and a cooling rate ≥3℃ / min.

[0069] The adapter board features gold-plated contacts with a thickness ≥3μm, supports the installation of 36 sensors at a time, and allows switching of detection channels via a multiplexing circuit with a channel switching time ≤10ms and a contact resistance ≤0.1Ω.

[0070] The adapter board is treated with anti-oxidation to enable simultaneous access and detection of multiple sensors, improving detection efficiency; the low contact resistance and anti-oxidation design ensure stable signal transmission and accurate detection results.

[0071] The aging test unit supports simultaneous access to 20 control displays and 1 recorder. It simulates a train control unit via RS-485 bus, sending periodic commands with a period of 2 seconds. The communication protocol is compatible with the ModbusRTU standard, and the baud rate can be configured as needed.

[0072] The FSK communication module uses frequency shift keying modulation technology, and the carrier frequency can be set to 1200Hz and 2400Hz.

[0073] The USB flash drive is formatted as FAT32 and has a storage capacity of ≥8GB.

[0074] The fault injection module can simulate communication interference faults, power supply abnormality faults, and sensor faults, and supports programmable fault injection strategies.

[0075] The aging test unit can simulate the train control unit by sending and receiving commands every 2 seconds, monitoring the communication amplitude (2V~10V) and the number of interruptions (≤3 times / 24h), simulating the communication scenario in actual train operation, verifying the long-term communication stability of the control display, and ensuring reliable data transmission when the equipment is networked; using a USB flash drive to transfer axle temperature data, the host computer 1 verifies the data integrity through CRC check and timestamp comparison, simulating the data storage and transfer process of the recorder, ensuring that the data is not lost or damaged during long-term storage and transfer, and ensuring data traceability.

[0076] The communication interference fault simulation of the fault injection module includes EFT pulse interference, THD harmonic interference, bus short circuit and bus open circuit. The amplitude of EFT pulse interference is ±2kV, the rise time is 5ns, and the duration is adjustable from 10μs to 1ms. The harmonic order of THD harmonic interference is 2-30 and the distortion rate is continuously adjustable from 0-50%. The equivalent resistance of bus short circuit is ≤1Ω. Bus open circuit is achieved by relay switching, and the switching time is ≤10ms.

[0077] The power supply fault simulation includes voltage instantaneous drop, voltage surge, and ripple injection. The voltage instantaneous drop is as low as 70% of the rated voltage, with an adjustable duration of 10ms-1s. The voltage surge is as high as 120% of the rated voltage, with an adjustable pulse width of 50μs-10ms. The ripple injection ripple frequency is 100Hz-1MHz, and the amplitude is 0-2Vpp adjustable.

[0078] The sensor fault simulation supports multi-channel synchronous / asynchronous fault simulation of 18 sensors, including sensor open circuit, sensor short circuit, and sensor temperature drift. The equivalent resistance of the sensor short circuit is ≤1Ω, and the sensor temperature drift is adjustable from ±0.5℃ to ±5℃.

[0079] The programmable fault injection strategy includes programmable sequences, random fault injection, and time / event-triggered injection.

[0080] The programmable sequence supports custom fault combination logic (such as "power supply voltage drop → communication EFT interference → 3-channel sensor synchronous drift"), with precise adjustable timing intervals from 1ms to 1min. The host computer can generate a visual fault sequence flowchart. Random fault injection allows setting the probability distribution of each fault type (such as power supply failure 30%, communication failure 40%, sensor failure 30%) and injection frequency to simulate random sudden fault scenarios. Time / event triggered injection supports time-based triggering (such as triggering at 24h and 72h nodes of aging test) or event-based triggering (such as triggering when communication amplitude is below 2V or power supply current exceeds 1.2 times the rated value), and the triggering conditions can be customized.

[0081] The fault injection module is deeply integrated with the programmable power supply, host computer, and sensor testing unit to achieve a closed-loop process of "fault simulation - dynamic response - data acquisition - analysis and evaluation", ensuring the integrity of test data and the accuracy of evaluation results.

[0082] The host computer's testing software includes a comprehensive performance testing module, an aging data analysis module, a fault injection control and data analysis module, a network communication performance intelligent analysis module, a full-link data integrity verification module, and an intelligent expert diagnosis rule base module.

[0083] The comprehensive performance testing module can control the shaft temperature alarm testing unit and the temperature sensor testing unit to complete the testing and generate exportable reports.

[0084] The aging data analysis module can parse shaft temperature data transferred from a USB flash drive and supports visualization of data trend charts.

[0085] The fault injection control and data analysis module supports fault-related parameter settings, fault response data acquisition, and fault analysis report generation.

[0086] The intelligent analysis module for network communication performance can statistically analyze communication delay and bit error rate, and introduce the ARIMA time series analysis model for trend prediction.

[0087] The end-to-end data integrity verification module integrates CRC-16 check, sliding window comparison algorithm, and USB flash drive bad block detection function;

[0088] The intelligent expert diagnostic rule base module has a built-in fault mode knowledge base, which supports users to add custom fault modes.

[0089] The comprehensive performance testing module generates reports including testing time, error value, alarm threshold, etc.; the aging data analysis module supports trend charts including line charts and bar charts; the fault injection control and data analysis module can display the fault injection status in real time, and collects full fault response data including recording the fault injection time, fault parameter details, and equipment response data (alarm time, fault code, communication status, power adjustment trajectory), and generates special reports including fault sequences, response indicators, and judgment results; the network communication performance intelligent analysis module provides real-time statistics on communication delay, including average delay and maximum delay, with a time accuracy of ≤1ms. The bit error rate is calculated as: Bit Error Rate = Number of Transmitted Error Bits / Total Transmitted Bits, with a preset qualified threshold of ≤10⁻. 6It can synchronously generate indicator curves over time and visualize them in the software interface. The ARIMA time series analysis model builds a prediction model based on historical communication data (communication delay, bit error rate, and number of interruptions in the past 24h / 72h), automatically outputting communication stability trend curves for the next 24h / 72h. When the predicted number of interruptions exceeds 3 times / 24h or the bit error rate exceeds the threshold, a graded warning is triggered. At the same time, it calls the bus communication data collected by the aging test unit in real time, realizing a fully automated closed loop of "indicator calculation - trend prediction - risk warning". The transmission integrity detection of the full-link data integrity verification module adopts sliding... The dynamic window comparison algorithm (window size configurable from 10-100 frames) accurately identifies dropped frames (timestamp breaks within the window) and out-of-order data (timestamp sequence errors) by verifying the continuity of data timestamps within the window. It automatically marks the location, time, and type of abnormal frames. Storage integrity protection adds a USB flash drive storage media health check function, periodically scanning USB flash drive sectors and identifying bad blocks through a dual mechanism of read speed monitoring and data write verification. It automatically marks and isolates bad block addresses (prohibiting data from being written to bad block areas), synchronously records the number, distribution, and growth trend of bad blocks, assesses the storage media's lifespan, and integrates CRC-16 verification. The system includes timestamp sliding window comparison and USB flash drive bad block detection, forming a complete integrity verification system covering the entire "data transmission-storage-verification" chain. The intelligent expert diagnostic rule base module categorizes faults according to a three-dimensional mapping logic of "fault characteristics-fault type-repair suggestions." Typical rules include: a. Repeated fixed errors above ±0.5℃ in digital precision detection → indicating an ADC acquisition module fault → suggesting calibration of the ADC reference voltage or replacement of the chip; b. Communication interruptions concentrated in the data frame transmission phase with abnormal amplitude → indicating a bus driver chip fault → suggesting checking the power supply or replacing the chip; c. Continuously increasing sensor data drift → indicating a sensor... d. Aging of the device or loose wiring → It is recommended to calibrate or check the wiring; d. Multiple signal synchronization errors occur in digital precision detection (such as three signals deviating by more than ±0.3°C at the same time) → This indicates abnormal communication between the GD32F407VGT6 master chip and the GD32E230F8P6TR slave chip → It is recommended to check the SPI communication line of the master and slave chips and restart the ARM emulation module. If the fault persists, check the power supply of the slave chip or replace the faulty slave chip. This module supports user-defined addition of fault modes. When the fault threshold is triggered, it automatically extracts feature matching rule base, outputs fault type, location and maintenance suggestions, and marks the fault level.

[0090] The ModbusRTU protocol of the programmable DC power supply module supports address encoding, with the device address range being 1-15. It supports broadcast mode with an address of 0x00. The data frame format consists of 8 data bits, 1 stop bit, no parity check, and a 16-bit CRC checksum with the low byte first and the high byte last.

[0091] The programmable DC power supply module supports switching between constant voltage and constant current modes, with a response time of ≤100ms and a data sampling rate of ≥10Hz.

[0092] Furthermore, the dynamic voltage / current regulation function of the programmable DC power supply module can receive instructions from the host computer to adjust the output voltage and current in real time, and the status feedback function can transmit voltage, current, temperature and fault codes to the host computer in real time.

[0093] The host computer's test software has a built-in power management module that automatically switches operating conditions via the Modbus RTU protocol and supports preset operating condition templates.

[0094] Furthermore, the power management module can dynamically adjust the power output according to the testing requirements (for example, during power testing, a specific value between 36 and 137.5V needs to be output according to the rated voltage of the product under test), and preset operating condition templates include "48V, 110V", etc.

[0095] The data frame format of the ARM microcontroller simulation module is 1 start bit, 8 data bits, and 1 stop bit, with no parity check. The GD32F407VGT6 master chip communicates with 9 GD32E230F8P6TR slave chips through the SPI bus, adopting a "master transmit, slave receive" timing mode. Each slave chip is assigned an independent chip select pin, and the timing deviation of the 9 signal outputs is ≤10μs.

[0096] The shaft temperature alarm test unit's 9-channel digital resistance simulation module is controlled by relays for switching on and off, with relay switching life ≥10. 6 Second-rate.

[0097] The aging test rack includes a main body 1, two mounting components 2, two filter components 3, and two heat dissipation components 4. The two mounting components 2 are respectively disposed on both sides of the main body 1, the two filter components 3 are respectively disposed on the sides of the two mounting components 2, and the two heat dissipation components 4 are respectively disposed on the inner sides of the two mounting components 2. Each mounting component 2 includes a mounting frame 21, a mounting groove 22, a connector groove 23, and a ventilation groove 24. The mounting frame 21 is fixedly mounted inside the side of the main body 1. The mounting groove 22 is located inside one side of the mounting frame 21, the connector groove 23 is located inside the other side of the mounting frame 21, and the ventilation groove 24 is located inside the connector groove 21. The two filter components 3 each include a mounting plate 31, a filter screen 32, a sealing gasket 33, and a pull groove 34. The mounting plate 31 is inserted into the inner side of the insertion groove 23. The filter screen 32 is fixedly installed on the inner side of the mounting plate 31. The sealing gasket 33 is fixedly installed on one side of the mounting plate 31, and one side abuts against one side of the inner side of the insertion groove 23. The pull groove 34 is opened inside the top of the mounting plate 31. The two heat dissipation components 4 each include a support frame 41 and a cooling fan 42. The support frame 41 is fixedly installed on the inner side of the mounting groove 22, and the cooling fan 42 is fixedly installed inside the support frame 41.

[0098] When in use, the cooling fans 42 on both sides of the main body 1 are turned on. One cooling fan 42 blows outside air into the interior of the main body 1, while the other cooling fan 42 draws air out of the interior of the main body 1, thereby cooling the interior of the main body 1. During the air circulation, the filter screen 32 filters impurities in the air. When the filter screen 32 needs to be cleaned after a long period of use, the user only needs to insert their finger into the inner side of the pull groove 34 and pull the mounting plate 31 upward to pull the mounting plate 31 out from the inner side of the insertion groove 23, making it easy for the user to disassemble and clean the filter screen 32. The sealing gasket 33 increases the sealing between the mounting plate 31 and the inner side of the insertion groove 23 during use.

[0099] The working principle of the composite centralized shaft temperature alarm integrated test bench provided by this invention is as follows:

[0100] In use, connect the control display and recorder to the shaft temperature alarm test unit, and the temperature sensor to the temperature sensor test unit. Start the system through the operation panel of the integrated testing platform or the host computer. The programmable DC power supply module of the power supply unit provides stable power to each unit, and the host computer controls the coordinated operation of each unit through the RS-485 bus.

[0101] The axle temperature alarm testing unit outputs analog temperature signals through an analog temperature simulation module and digital temperature signals through an ARM microcontroller simulation module, testing the accuracy, response speed, and communication performance of the control display and recorder. The temperature sensor testing unit's constant temperature bath provides different temperature environments, the adapter board enables batch testing of sensors, and the insulation resistance tester verifies insulation performance. The aging test unit's aging test rack simulates the train operating environment, testing equipment stability over long periods. The FSK communication module ensures data transmission, a USB flash drive stores axle temperature data, and the fault injection module simulates various fault scenarios to test the equipment's anti-interference capabilities.

[0102] The host computer collects the detection data of each unit in real time, performs intelligent analysis through the built-in software module, and generates detection reports, trend curves and fault diagnosis reports, supporting data export and archiving.

[0103] Compared with related technologies, the composite centralized shaft temperature alarm integrated test bench provided by the present invention has the following beneficial effects:

[0104] The system integrates a host computer, shaft temperature alarm testing unit, temperature sensor testing unit, aging test unit, comprehensive testing platform, and power supply unit. All units are integrated into a single platform, eliminating the need to separate the test control display, sensors, and recorders, thus solving the problem of functional dispersion and reducing testing costs. The power supply unit dynamically adjusts voltage and current, and the host computer automatically collects and analyzes data and generates reports without manual intervention, reducing the risk of errors. Meanwhile, the aging test unit simulates long-term operating environments, and the fault injection module covers multiple fault scenarios, adapting to different series of shaft temperature alarms to achieve full-dimensional testing and improve the comprehensiveness and reliability of testing.

[0105] Example 1: Controlling the accuracy detection of the display

[0106] Connecting the device: Connect the KZS / M series control display to the corresponding interface of the shaft temperature alarm test unit, and ensure that the communication cable has good contact.

[0107] Signal simulation: The host computer sends a command to control the digital resistance simulation module to output a 5kΩ resistance value, which corresponds to a simulated temperature signal of 50℃.

[0108] Error calculation: The displayed value of the control display is 49℃, and the error is calculated to be 1℃. Since the standard requires an error of ≤±2℃, the accuracy of the control display is deemed to be qualified.

[0109] Report generation: The host computer testing software automatically records the testing time, error value and judgment result, and exports it as a PDF report. The report includes the electronic signature of the testing personnel and the system timestamp.

[0110] Example 2: Batch Testing of Temperature Sensors

[0111] Sensor installation: Insert the 36 composite temperature sensors into the gold-plated contact interfaces of the adapter board of the temperature sensor test unit in sequence, ensuring a secure installation.

[0112] Step temperature change test: The temperature of the constant temperature bath is set to rise from -10℃ to 100℃, with each temperature rise being 10℃. The temperature is stabilized for 5 minutes at each temperature point to ensure that the sensor reaches thermal equilibrium.

[0113] Data analysis: The resistance values ​​of each sensor were collected at different temperature points, and the maximum linear deviation was calculated to be 1℃, while the standard requirement is ≤2℃; at the same time, the insulation resistance can be detected to be ≥500MΩ, therefore all sensors passed the test.

[0114] Example 3: Recorder Aging Test

[0115] Simulated operation: Connect a recorder to the aging test rack in the aging test unit and send periodic commands to the train control unit via RS-485 bus. The command period is set to 2 seconds.

[0116] Data verification: After 72 hours of operation, the shaft temperature data was transferred to a USB flash drive and verified using host computer software. The verification result showed normal operation.

[0117] Conclusion: Based on the test results, a report is generated recommending that this batch of recorders does not require maintenance within six months.

[0118] Example 4: Power Supply Interlock Control Test

[0119] Setting operating conditions: Using the test software on the host computer, the output of the programmable DC power supply is adjusted to 48V / 2A using the ModbusRTU protocol to ensure that the power supply is in constant voltage mode.

[0120] Load anomaly simulation: Apply a 3A load to the shaft temperature alarm test unit to make the load current exceed the rated value by 50% to simulate the overload situation in actual operation.

[0121] Protection Trigger: After detecting an overcurrent condition, the power module automatically reduces the output current to 0.15A and sends fault code 0x02 to the host computer. The response time from anomaly detection to protection action is 80ms, meeting the requirement of ≤100ms.

[0122] Report generation: The software records the time of the event, the load current change curve and the fault code, generates an analysis report and suggests checking whether there is a short circuit fault in the load circuit.

[0123] Example 5: Testing the report export function of the host computer

[0124] Testing Execution: A comprehensive test was conducted on the KZF series shaft temperature alarm, including power testing (actual power consumption 2.5W), digital accuracy testing, analog accuracy testing, and other items, to ensure that all test items were completed and the data was accurate.

[0125] Report generation: Click the "Export Report" button in the "Comprehensive Performance Testing Module" of the host computer software, and select either PDF or Excel format to export.

[0126] Content verification: The PDF report includes the testing time (2025-06-25 14:30), various testing error values, alarm threshold (90℃), testing personnel signature, and system watermark. The Excel report automatically generates a line graph of shaft temperature data, with the horizontal axis representing time (0-24h) and the vertical axis representing temperature (-10℃~+100℃), and supports data filtering and sorting functions.

[0127] Format validation: Both report formats maintain data consistency, charts are clear and readable, and can be opened and edited normally in different versions of office software.

[0128] Storage and backup: Reports are automatically stored to the host computer database, and the storage path can be customized. Backups are also performed via USB flash drive to ensure data traceability.

[0129] Example 6: Test of Over-temperature Protection Function of Thermostatic Bath

[0130] Anomaly Simulation: In the host computer control interface of the temperature sensor test unit, the target temperature of the constant temperature bath is set to 110℃. This temperature exceeds the upper limit of the normal operating temperature of the constant temperature bath by 100℃, which is used to simulate the over-temperature situation when the temperature control system fails.

[0131] Protection Trigger: When the temperature of the constant temperature bath rises to 105℃, the built-in over-temperature protection device immediately and automatically cuts off the heating power supply, and simultaneously sends fault code 0x03 to the host computer. The response time from temperature exceeding the threshold to power cutoff is 1.2 seconds, meeting the standard requirement of ≤2 seconds. The host computer interface displays a red alarm prompt and is accompanied by a buzzer alarm.

[0132] Response time: Precise measurement using a timing device confirmed that the protection action response time is 1.2 seconds, which meets the design requirements.

[0133] Recovery Operation: Manually adjust the target temperature of the thermostat bath back to 80℃, click the "Recover" button, and the thermostat bath will restart heating. The actual measured heating rate is 5.2℃ / min, which meets the requirement of ≥5℃ / min. The alarm will be cleared after the temperature stabilizes.

[0134] Record archiving: Over-temperature events and their handling processes are automatically stored in the host computer log. The log includes the over-temperature value, protection time, recovery parameters, and operator information, which facilitates subsequent fault analysis and tracing.

[0135] Example 7: Hot-swap function test of aging test fixture

[0136] Equipment replacement during operation: Under normal operating conditions of the aging test unit, without disconnecting the power, directly unplug one of the control displays being tested and quickly insert the new control display device, ensuring that the interface is aligned and firmly plugged in.

[0137] Communication recovery: Observe the RS-485 bus communication status. The bus will re-identify the new device address (set address to 15) within 300ms and resume periodic command sending. The command period remains unchanged at 1 second.

[0138] Data continuity: Check the data storage of the recorder to confirm that there was no communication interruption during the equipment replacement process, that the timestamps of the data stored on the USB flash drive are continuous and without missing data, and that the CRC check integrity rate remains at 100%, thus ensuring data continuity and integrity.

[0139] Lifetime verification: After 1000 consecutive hot-swap operations, the contact resistance of the aging test fixture interface was tested. The measured value was still ≤0.1Ω, and the relay switching life met the requirement of ≥106 cycles, proving that the interface structure design is reliable.

[0140] Efficiency Comparison: Compared with the traditional method of replacing equipment by powering off, hot-swapping can save about 5 minutes each time, greatly improving the efficiency of batch equipment testing, and is especially suitable for large-scale equipment iteration testing scenarios.

[0141] Example 9: Complex Fault Sequence Injection Test

[0142] 1. Test configuration: Connect a KZS / M series control display and a recorder to the aging test rack of the aging test unit. Configure the fault sequence through the fault injection control module of the host computer (1) - "Power supply voltage drops to 70% of the rated value (lasts 500ms) → superimposed EFT pulse interference (amplitude ±1.5kV, lasts 100μs) → 3-channel sensor synchronous drift ±2℃ (lasts 2s)", set the programmable power supply response time threshold ≤100ms and the control display alarm response time threshold ≤2s;

[0143] 2. Process Monitoring: Real-time data acquisition by the host computer—the measured response time of the programmable power supply is 85ms (≤100ms), the number of communication interruptions to the control display is 0 times / sequence, the alarm response time is 1.2s (≤2s), the fault code recognition accuracy is 100% (matching the preset fault type), and the acquisition error under sensor drift scenarios is ≤0.3%;

[0144] 3. Conclusion and Output: The anti-interference capability, fault handling capability and recovery capability of the control display under multiple fault superposition scenarios are verified to meet the standards and are deemed qualified; the host computer automatically generates a special fault injection report, including fault sequence flowchart, response data curve and judgment result, which supports archiving and traceability.

[0145] Example 10: Communication Stability Trend Prediction Test

[0146] 1. Test configuration: In Figure 4 The aging test unit is connected to the KZS / M series control display to continuously collect 72h of communication data. The host computer uses the ARIMA model to predict the stability in the next 24h and sets the warning threshold: number of interruptions ≥3 times / 24h, bit error rate ≥10-6.

[0147] 2. Process monitoring: The model predicted an average latency of 0.8ms and a maximum latency of 2.1ms, with a bit error rate of 8×10⁻⁷, 2 interruptions, and no warnings; after 24 hours of actual operation, the measured deviation was ≤5%.

[0148] 3. Conclusion and Output: The model makes accurate predictions and generates a report containing historical curves and predicted curves, indicating good communication stability.

[0149] Example 11: End-to-End Data Integrity Verification Test

[0150] 1. Test configuration: In Figure 4 The aging test unit is connected to a recorder to simulate 3 frames of lost frames and 5 frames of out-of-order frames. The data is stored on a USB flash drive containing 2 bad blocks, and the full-link verification function is enabled.

[0151] 2. Process monitoring: The sliding window algorithm accurately marks abnormal frames, bad blocks on the USB flash drive are identified and isolated, and the CRC-16 check shows no errors;

[0152] 3. Conclusion and output: The verification function is effective, and a report containing anomaly markers and bad block records is generated, indicating that the data integrity guarantee is qualified.

[0153] Example 12: Intelligent Fault Diagnosis Test

[0154] 1. Test configuration: In Figure 2 The shaft temperature alarm test unit is connected to the fault control display (preset ADC module fault, temperature drift exceeds ±0.6℃), and the expert diagnostic rule base is enabled;

[0155] 2. Process monitoring: The host computer extracts the feature matching rule base and outputs "ADC acquisition module fault, it is recommended to calibrate the reference voltage";

[0156] 3. Conclusion Output: The diagnostic results are consistent with the preset values, indicating that the intelligent diagnostic function is qualified, and a report is generated and archived.

[0157] Example 13: Temperature drift trend analysis of 72-hour aging data and ADC module out-of-tolerance prediction test

[0158] 1. Test configuration: In Figure 4 The aging test unit test rack is connected to a control display, and a 72-hour aging test is started. Figure 1 The host computer passes through Figure 2 The shaft temperature alarm test unit collects temperature drift data from the ADC module in real time (at 1-minute intervals), enables the ARIMA model, sets the out-of-tolerance threshold to ±0.5℃, and predicts a period of 3 months (equivalent aging of 720h).

[0159] 2. Process monitoring: 10,080 sets of data were collected over 72 hours. The temperature drift increased steadily from 0.1℃ to 0.25℃. The model fit R² = 0.985. The predicted temperature drift after 3 months is 0.62℃ (exceeding the threshold). A visual trend curve was generated (annotated with historical trajectory, fitted curve, and prediction interval).

[0160] 3. Conclusion Output: The verification software can accurately predict the long-term stability of the ADC module and generate a report containing data details and prediction results. It is recommended to calibrate or replace the chip in advance to avoid the risk of failure.

[0161] Example 14: Verification of Precision Equivalent Resistance Simulation Function

[0162] 1. Test configuration: In Figure 2 In the shaft temperature alarm test unit, enable Figure 5 The precision voltage conditioning (equivalent resistance simulation) circuit shown has a target equivalent resistance of 10kΩ, and the host computer sends the corresponding digital command to U21.

[0163] 2. Process monitoring: A high-precision multimeter with an accuracy of 0.001% was used to detect the electrical characteristics of the output terminal of U22 and calculate the equivalent resistance value. The measured value was 10.001kΩ (relative error 0.01%). The signal was continuously collected for 1 hour, with a noise peak of 8μV and a maximum fluctuation of 3mΩ in the equivalent resistance characteristic.

[0164] 3. Conclusion and Output: After this circuit replaced the original digital resistance simulation module, the simulation accuracy and stability of the equivalent resistance both met the test index requirements of the shaft temperature alarm test unit. The function was deemed qualified, and a report comparing the measured data with the theoretical values ​​was generated and archived.

[0165] The above description is merely an embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent structural or procedural transformations made based on the content of the present invention's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of the present invention.

Claims

1. A comprehensive test bench for a composite centralized shaft temperature alarm, characterized in that, include: The system includes a host computer, a shaft temperature alarm testing unit, a temperature sensor testing unit, an aging test unit, a comprehensive testing platform, and a power supply unit. The power supply unit is a programmable DC power supply module with an input of AC220V±10% and an output of DC0-200V (0.1V step) and current of 0-2A (0.1A step). It communicates with the host computer via RS-485 bus using ModbusRTU protocol and a baud rate of 9600bps. It features dynamic voltage / current regulation and status feedback functions. One shaft temperature alarm test unit and one aging test unit are each configured. The shaft temperature alarm test unit is connected to the control display component and recorder component under test. It is used to test the stand-alone performance and network communication performance of the control display and recorder of KZF and KZS / M series shaft temperature alarms. The test items include power test, digital accuracy test, analog accuracy test, and safety loop test. The temperature sensor testing unit is connected to the temperature sensor component under test and includes a constant temperature bath, an adapter plate, and an insulation resistance tester. The aging test unit includes an aging test rack, an FSK communication module, a USB flash drive, and a fault injection module; The integrated testing platform adopts an aluminum alloy frame structure and integrates various unit modules.

2. The composite centralized shaft temperature alarm integrated test bench according to claim 1, characterized in that, The shaft temperature alarm test unit includes a simulated temperature module, an ARM microcontroller simulation module, and a main control microcontroller module. The simulated temperature module is implemented using a precision voltage conditioning circuit, which includes a digital-to-analog converter unit, a high-precision conditioning unit, and a passive device unit. The digital-to-analog converter unit receives digital instructions from the host computer and generates an electrical signal that matches the target resistance value after signal conditioning. The ARM microcontroller simulation module uses GD32F407VGT6 as the main control chip and nine GD32E230F8P6TR chips to build a 3×3 output matrix, realizing the parallel output of nine high-precision digital temperature signals. It supports the Modbus RTU protocol, and each GD32E230F8P6TR slave chip can be independently configured with an address. The main control microcontroller module is used to coordinate the work between different modules and to interact with the host computer.

3. The composite centralized shaft temperature alarm integrated test bench according to claim 1, characterized in that, The temperature control range of the constant temperature bath of the temperature sensor test unit is -10℃ to +100℃, with a temperature fluctuation of ±0.05℃. It has a built-in XMF analog-digital PID temperature controller with a heating rate ≥5℃ / min and a cooling rate ≥3℃ / min. The adapter board features gold-plated contacts with a thickness ≥3μm, supports the installation of 36 sensors at a time, and allows switching of detection channels via a multiplexing circuit with a channel switching time ≤10ms and a contact resistance ≤0.1Ω.

4. The composite centralized shaft temperature alarm integrated test bench according to claim 1, characterized in that, The aging test unit supports simultaneous access to 20 control displays and 1 recorder. It simulates a train control unit via RS-485 bus, sending periodic commands with a period of 2 seconds. The communication protocol is compatible with the ModbusRTU standard, and the baud rate can be configured as needed. The FSK communication module uses frequency shift keying modulation technology, and the carrier frequency can be set to 1200Hz and 2400Hz. The USB flash drive is formatted as FAT32 and has a storage capacity of ≥8GB. The fault injection module can simulate communication interference faults, power supply abnormality faults, and sensor faults, and supports programmable fault injection strategies.

5. A comprehensive test bench for a composite centralized shaft temperature alarm as described in claim 4, characterized in that, The communication interference fault simulation of the fault injection module includes EFT pulse interference, THD harmonic interference, bus short circuit and bus open circuit. The amplitude of EFT pulse interference is ±2kV, the rise time is 5ns, and the duration is adjustable from 10μs to 1ms. The harmonic order of THD harmonic interference is 2-30 and the distortion rate is continuously adjustable from 0-50%. The equivalent resistance of bus short circuit is ≤1Ω. Bus open circuit is achieved by relay switching, and the switching time is ≤10ms. The power supply fault simulation includes voltage instantaneous drop, voltage surge, and ripple injection. The voltage instantaneous drop is as low as 70% of the rated voltage, with an adjustable duration of 10ms-1s. The voltage surge is as high as 120% of the rated voltage, with an adjustable pulse width of 50μs-10ms. The ripple injection ripple frequency is 100Hz-1MHz, and the amplitude is 0-2Vpp adjustable. The sensor fault simulation supports multi-channel synchronous / asynchronous fault simulation of 18 sensors, including sensor open circuit, sensor short circuit, and sensor temperature drift. The equivalent resistance of the sensor short circuit is ≤1Ω, and the sensor temperature drift is adjustable from ±0.5℃ to ±5℃. The programmable fault injection strategy includes programmable sequences, random fault injection, and time / event-triggered injection.

6. The composite centralized shaft temperature alarm integrated test bench according to claim 1, characterized in that, The host computer's testing software includes a comprehensive performance testing module, an aging data analysis module, a fault injection control and data analysis module, a network communication performance intelligent analysis module, a full-link data integrity verification module, and an intelligent expert diagnosis rule base module. The comprehensive performance testing module can control the shaft temperature alarm testing unit and the temperature sensor testing unit to complete the testing and generate exportable reports. The aging data analysis module can parse shaft temperature data transferred from a USB flash drive and supports visualization of data trend charts. The fault injection control and data analysis module supports fault-related parameter settings, fault response data acquisition, and fault analysis report generation. The intelligent analysis module for network communication performance can statistically analyze communication delay and bit error rate, and introduce the ARIMA time series analysis model for trend prediction. The end-to-end data integrity verification module integrates CRC-16 check, sliding window comparison algorithm, and USB flash drive bad block detection function; The intelligent expert diagnostic rule base module has a built-in fault mode knowledge base, which supports users to add custom fault modes.

7. A comprehensive test bench for a composite centralized shaft temperature alarm as described in claim 1, characterized in that, The ModbusRTU protocol of the programmable DC power supply module supports address encoding, with the device address range being 1-15. It supports broadcast mode with an address of 0x00. The data frame format consists of 8 data bits, 1 stop bit, no parity check, and a 16-bit CRC checksum with the low byte first and the high byte last. The programmable DC power supply module supports switching between constant voltage and constant current modes, with a response time of ≤100ms and a data sampling rate of ≥10Hz.

8. A comprehensive test bench for a composite centralized shaft temperature alarm as described in claim 1, characterized in that, The host computer's test software has a built-in power management module that automatically switches operating conditions via the Modbus RTU protocol and supports preset operating condition templates.

9. A comprehensive test bench for a composite centralized shaft temperature alarm as described in claim 2, characterized in that, The data frame format of the ARM microcontroller simulation module is 1 start bit, 8 data bits, and 1 stop bit, with no parity check. The GD32F407VGT6 master chip communicates with 9 GD32E230F8P6TR slave chips via the SPI bus, adopting a "master transmit, slave receive" timing mode. Each slave chip is assigned an independent chip select pin, and the timing deviation of the 9 signal outputs is ≤10μs. The shaft temperature alarm test unit's 9-channel digital resistance simulation module is controlled by relays for switching on and off, with relay switching life ≥10. 6 Second-rate.

10. A comprehensive test bench for a composite centralized shaft temperature alarm as described in claim 1, characterized in that, The aging test frame includes a main body, two mounting components, two filter components, and two heat dissipation components. The two mounting components are respectively located on both sides of the main body, the two filter components are respectively located on the sides of the two mounting components, and the two heat dissipation components are respectively located on the inner sides of the two mounting components. Each mounting component includes a mounting frame, a mounting slot, a connector slot, and a ventilation slot. The mounting frame is fixedly mounted inside the side of the main body, the mounting slot is located inside one side of the mounting frame, the connector slot is located inside the other side of the mounting frame, and the ventilation slot is located inside the other side of the mounting frame. The side of the insertion slot is connected to the mounting slot; both filter components include a mounting plate, a filter screen, a sealing gasket, and a pull groove. The mounting plate is inserted into the inner side of the insertion slot, the filter screen is fixedly installed on the inner side of the mounting plate, the sealing gasket is fixedly installed on one side of the mounting plate, and one side abuts against one side of the inner side of the insertion slot. The pull groove is opened inside the top of the mounting plate; both heat dissipation components include a support frame and a cooling fan. The support frame is fixedly installed on the inner side of the mounting slot, and the cooling fan is fixedly installed inside the support frame.

Images