Communication method of semiconductor chip testing system and semiconductor chip testing system

Abstract

The application provides a communication method of a semiconductor chip testing system and the semiconductor chip testing system. The communication method comprises the following steps: monitoring a first trigger document by using a monitoring module; starting to run a serial port module when the monitoring module monitors the first trigger document; obtaining a configuration template file and the first trigger document by using the serial port module; matching and setting the first trigger document and the configuration template file by using the serial port module, forming a target configuration file comprising configuration information, and opening a communication port; transmitting and storing test data of a test unit to a host computer through a communication port corresponding to the test unit according to the configuration information; monitoring a second trigger document by using the monitoring module; and stopping running the serial port module and closing the communication port when the monitoring module monitors the second trigger document. The application can realize automatic on-off control of multiple communication ports, does not need manual setting, can improve the accuracy and efficiency of data input, and avoids manual operation errors.

Description

Technical Field

[0001] This application relates to the field of semiconductor testing technology, and in particular to a communication method and a semiconductor chip testing system. Background Technology

[0002] System Level Test (SLT) is a crucial supplementary test to finished semiconductor product testing after packaging. It verifies chips that have passed basic electrical tests in an environment that highly simulates real-world applications. Its core is to mount the chip on a custom test board, run the actual operating system, firmware, and applications, and verify the chip's system-level interaction, hardware-software collaboration, and I / O protocol stack characteristics through "use scenario-based testing." However, current SLT systems suffer from low accuracy and efficiency in test data entry. Summary of the Invention

[0003] In view of this, the purpose of this application is to propose a communication method for a semiconductor chip testing system to solve the above-mentioned technical problems.

[0004] To achieve the above objectives, this application provides a communication method for a semiconductor chip testing system, characterized in that the semiconductor chip testing system includes a host and a testing machine, the host including a monitoring module, a serial port module, and multiple communication ports, and the testing machine including multiple testing units; the communication method of the semiconductor chip testing system includes:

[0005] The monitoring module monitors the first trigger document. When the monitoring module detects the first trigger document, it starts running the serial port module. The first trigger document includes the chip batch number, chip test item name, chip tester number, and chip test procedure. The serial port module is used to obtain the configuration template file and the first trigger document; The serial port module is used to match and set the first trigger document with the configuration template file to form a target configuration file including configuration information, and the communication port is opened. The test data of the test unit is transmitted and stored in the host through the communication port corresponding to the test unit according to the configuration information; The monitoring module monitors the second trigger document. When the monitoring module detects the second trigger document, it stops running the serial port module and closes the communication port; wherein, the second trigger document is an empty document.

[0006] Optionally, the step of using the serial port module to match and set the first trigger document with the configuration template file to form a target configuration file including configuration information, and opening the communication port, includes: The serial port module is used to allocate a communication port for each test unit according to the configuration template file and the first trigger document, and the port baud rate and archive path are configured. The serial port module is used to combine the configured items to form the target configuration file, which includes the configuration information; wherein, the configuration information includes test unit number, port baud rate, port number, and archive path; Open the communication port corresponding to the test unit.

[0007] Optionally, the step of using the serial port module to match and set the first trigger document with the configuration template file to form a target configuration file including configuration information, and opening the communication port, then includes: The serial port module is used to record and save the first trigger document and the target configuration file.

[0008] Optionally, transmitting and storing the test data of the test unit to the host via the communication port corresponding to the test unit according to the configuration information includes: The test data of the test unit is transmitted to the corresponding communication port at the corresponding port baud rate; The test data is stored in the host according to the corresponding archive path.

[0009] Optionally, the step of monitoring the first triggering document using the monitoring module includes, prior to: The configuration template file is generated using the host's configuration module.

[0010] Optionally, the step of monitoring the first triggering document using the monitoring module further includes: The chip batch information is entered into the memory of the testing machine; When the test machine receives a batch opening instruction, it uses the memory to generate the first trigger document based on the chip batch information.

[0011] Optionally, the step of transmitting and storing the test data of the test unit to the host via the communication port corresponding to the test unit according to the configuration information includes: When the test machine receives the batch completion instruction, it uses the memory to generate the second trigger document.

[0012] Based on the same inventive concept, this application also provides a semiconductor chip testing system, which includes a host and a testing machine. The testing machine includes multiple testing units, and the host includes multiple communication ports. Each testing unit transmits test data to the host through a corresponding communication port. The host further includes: The monitoring module is used to monitor the first trigger document and the second trigger document generated by the test machine; wherein, the first trigger document includes the chip batch number, the chip test item name, the chip test machine number, and the chip test procedure, and the second trigger document is an empty document; The serial port module is configured to start running when the monitoring module detects the first trigger document, and to acquire the first trigger document and open the communication port; the serial port module is also configured to stop running and close the communication port when the monitoring module detects the second trigger document.

[0013] Optionally, the host further includes: A configuration module is used to generate and store a configuration template file. The serial port module is used to obtain the configuration template file and match the first trigger document with the configuration template file to form a target configuration file. The target configuration file includes the test unit number, port baud rate, port number, and archive path.

[0014] Optionally, the testing machine further includes: The memory is used to store chip batch information, generate the second trigger document, and generate the first trigger document based on the chip batch information.

[0015] The communication method of the semiconductor chip testing system provided in this application includes: using a monitoring module to monitor a first trigger document; when the monitoring module detects the first trigger document, starting the serial port module; using the serial port module to obtain a configuration template file and the first trigger document; using the serial port module to match and set the first trigger document with the configuration template file to form a target configuration file including configuration information, and opening the communication port; transmitting and storing the test data of the test unit to the host through the communication port corresponding to the test unit according to the configuration information; using the monitoring module to monitor a second trigger document; when the monitoring module detects the second trigger document, stopping the serial port module and closing the communication port. The above technical solution automatically detects trigger documents through the monitoring module, realizing automated on / off control of multiple communication ports. The serial port module automatically configures storage parameters and storage paths. The entire process requires no manual setting, automating the testing process, improving the accuracy and efficiency of data entry, and avoiding human error. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in this application or related technologies, the drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a schematic flowchart of a communication method for a semiconductor chip testing system according to an embodiment of this application; Figure 2 This is a schematic block diagram of a semiconductor chip testing system according to an embodiment of this application.

[0018] Marker explanation: 100. Semiconductor chip testing system; 10. Host; 11. Communication port; 12. Monitoring module; 13. Serial port module; 14. Configuration module; 20. Test machine; 21. Test unit; 22. Memory. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with specific embodiments and the accompanying drawings.

[0020] It should be noted that, unless otherwise defined, the technical or scientific terms used in the embodiments of this application should have the ordinary meaning understood by one of ordinary skill in the art to which this application pertains. The terms "comprising" or "including," or similar words used in the embodiments of this application, mean that the element or object preceding the word covers the element or object listed after the word and its equivalents, without excluding other elements or objects. The terms "connected" or "linked," or similar words, are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect.

[0021] The inventors discovered that current SLT systems require manual port settings based on batches, with ports being manually closed at the end of each batch. This consumes significant manpower for multiple settings, and manual settings cannot guarantee accuracy. Manual parameter input is prone to errors such as incorrect port numbers and mismatched parameters, posing a risk of setup errors and requiring secondary confirmation. This results in low accuracy and efficiency in test data entry.

[0022] like Figure 1 and Figure 2 As shown, this application embodiment provides a communication method for a semiconductor chip testing system 100. The semiconductor chip testing system 100 includes a host 10 and a testing machine 20. The host 10 includes a monitoring module 12, a serial port module 13, and multiple communication ports 11. The testing machine 20 includes multiple testing units 21. The communication method of the semiconductor chip testing system 100 includes: Step S100: The monitoring module 12 monitors the first trigger document. When the monitoring module 12 detects the first trigger document, the serial port module 13 starts running. The first trigger document includes the chip batch number, chip test item name, chip tester number, and chip test procedure. Step S200: Use serial port module 13 to obtain the configuration template file and the first trigger document; Step S300: Use serial port module 13 to match and set the first trigger document with the configuration template file to form a target configuration file including configuration information, and open communication port 11; Step S400: The test data of the test unit 21 is transmitted to the host 10 through the communication port 11 corresponding to the test unit 21 according to the configuration information. Step S500: The monitoring module 12 monitors the second trigger document. When the monitoring module 12 detects the second trigger document, it stops running the serial port module 13 and closes the communication port 11. The second trigger document is an empty document.

[0023] In this embodiment, the monitoring module 12 automatically detects the trigger file to achieve automated switching control of multiple communication ports 11. The serial port module 13 automatically configures the storage parameters and storage path. The entire process does not require manual setting, thus automating the testing process, improving the accuracy and efficiency of data entry, and avoiding human error.

[0024] Specifically, by linking the monitoring module 12 and the serial port module 13 of the host 10, the automatic configuration and start / stop of the communication port 11 can be realized, replacing the traditional manual operation process, saving the time of multiple manual switching and manual parameter input, reducing setting time, reducing labor costs, and reducing the risk of errors in manual setting, thereby improving the efficiency and accuracy of test data entry.

[0025] The monitoring module 12 automatically identifies the first and second trigger documents, and the serial port module 13 automatically completes the configuration and starts / stops the communication port 11, achieving seamless connection between test batches and communication processes, significantly shortening the preparation and completion time for a single batch of tests. Multiple test units 21 correspond one-to-one with the communication port 11, eliminating the need for manual data transmission settings and further improving data upload efficiency.

[0026] In addition, the target configuration file automatically generated by the semiconductor chip testing system 100 can preset the verification logic to ensure that the configuration information is accurate and error-free, without the need for manual secondary confirmation, and at the same time avoid errors caused by omissions in secondary confirmation.

[0027] Here, the test machine 20 is used to test semiconductor chips, and it includes multiple test units 21. A test unit 21 is the smallest functional unit on the test machine 20 capable of independently completing the entire testing process for a single chip. It is the core carrier for achieving parallelization of chip mass production testing and improving testing efficiency. Each test unit 21 is equipped with an independent test channel, signal driving / acquisition module, power supply module, and interface circuits corresponding to the chip pins. These independent resources allow multiple chips to execute the exact same test program simultaneously on the same test machine 20, and the test data from each test unit 21 does not interfere with each other, essentially "breaking down" a single test machine 20 into multiple small test devices.

[0028] For example, in the chip testing phase, the wafer or packaged chip is placed on a test carrier board, and each chip location on the test carrier board corresponds to an interface of a test unit 21. After the test is started, the test machine 20 synchronously sends test commands to all test units 21. Each test unit 21 independently applies test stimulus signals (such as voltage, current, digital logic signals) to the chip it is connected to, and simultaneously collects the chip's output response signals. Then, it uses a built-in algorithm to determine whether the chip's electrical performance and functions meet the design specifications. After the test is completed, each test machine 20 generates an independent test report for the corresponding chip, marking the chip as "Pass" or "Fail".

[0029] After each test unit 21 completes the test, a test data sheet will be generated. This test data sheet includes the chip batch number, chip test item name, chip tester number, chip test procedure, and may also include test station, test temperature, test time, test line number, etc.

[0030] Communication port 11 is an interface used to transmit test data generated by test unit 21. After each test unit 21 completes the test, it transmits the test data through the corresponding communication port 11 and stores it in the designated location of host 10.

[0031] In step S100, the monitoring module 12 continuously monitors the first trigger document. The detection of the first trigger document indicates the start of a new batch of chip testing. When the monitoring module 12 detects the first trigger document, it immediately triggers the process start command, and the serial port module 13 begins operation. The first trigger document can be understood as a configuration text file used to start serial communication.

[0032] In step S200, upon detecting the first trigger document, the serial port module 13 starts and synchronously acquires the configuration template file and the first trigger document. The configuration template file is a preset set of standardized communication parameters, such as port baud rate, data format, and mapping rules between test unit 21 and communication port 11.

[0033] In step S300, the serial port module 13 matches the configuration template file and the first trigger document, automatically generates a target configuration file adapted to the current batch, and automatically opens the corresponding communication port 11 according to the target configuration file, replacing the manual setting of the port.

[0034] In step S400, the test data generated by the multiple test units 21 of the test machine 20 during the test is transmitted to the host 10 through the corresponding communication ports 11 according to the parameters of the target configuration file, so as to ensure the relevance and orderliness of data transmission and avoid data mistransmission caused by port confusion.

[0035] In step S500, when the monitoring module 12 detects the second trigger document, it indicates that the batch test is complete. It immediately triggers a process termination command, stops the serial port module 13 from running, and automatically closes the corresponding communication port 11, completing the communication process loop for this batch without requiring manual port closure. The second trigger document can be understood as a text file used to close serial communication, which can record the operation instructions for the serial communication termination phase.

[0036] In some embodiments, the communication method of the semiconductor chip testing system 100 can be applied to SLT testing. The core of SLT testing is to simulate a real application environment. The automated communication process of this solution will not interfere with the scenario-based verification of the operating system and firmware running on the test machine 20, while ensuring the stable and accurate transmission of test data during complex interactions. In addition, this communication method can achieve standardized and automated management of the communication process, making it easy to trace the port configuration parameters and data transmission records of each batch, thereby improving the manageability and traceability of the entire SLT testing process.

[0037] The communication method of the semiconductor chip testing system 100 in this application embodiment can significantly improve testing efficiency and reduce the risk of human error. Traditional manual setting takes 10 to 15 minutes, while the automated setting of this solution only takes about 10 seconds, and avoids the problem of batch scrapping due to input errors.

[0038] In some embodiments, the number of test units 21 and communication ports 11 can be set according to actual needs. Preferably, the number of communication ports 11 is greater than or equal to the number of test units 21, so that test data can be transmitted through multiple channels at the same time, thereby improving the efficiency of data entry.

[0039] In some embodiments, step S300 may involve using the serial port module 13 to match and set the first trigger document with the configuration template file to form a target configuration file including configuration information, and opening the communication port 11, including: Step S310: Using the serial port module 13, allocate a communication port 11 to each test unit 21 according to the first trigger document and configuration template file, and configure the port baud rate and archive path. Step S320: Use the serial port module 13 to combine the configured configuration items to form a target configuration file including configuration information; wherein, the configuration information includes test unit number, port baud rate, port number, and archive path; Step S330: Open the communication port 11 corresponding to the test unit 21.

[0040] Here, the configuration template file is a pre-defined set of standardized parameters, containing built-in general communication rules required for testing, such as the selectable range of port baud rates, the mapping logic between test unit 21 and the port, and the data archiving path specifications. The first trigger document can include personalized information for the current test batch, such as the number of test units 21 in the batch and the communication parameter requirements corresponding to the model of the chip under test. The serial port module 13 logically matches the first trigger document with the configuration template file, binding the settings in the general template with the actual needs of the current batch, generating a unique and suitable target configuration file, and automatically enabling communication port 11 based on the configuration result, avoiding the subjectivity and error rate of manual settings.

[0041] In step S310, the serial port module 13 first reads the information in the first trigger document, then retrieves the preset rules in the configuration template file to assign an independent communication port 11 to each test unit 21, ensuring that the data transmission channels of different test units 21 do not interfere with each other. Simultaneously, the serial port module 13 sets the corresponding baud rate parameters for the assigned communication ports 11 according to the port baud rate matching the chip model in the configuration template file, ensuring that the communication parameters of each test unit 21 meet standardization requirements and guaranteeing a stable data transmission rate. Furthermore, the serial port module 13 also sets a dedicated archiving path for the test data of each test unit 21 according to the preset path rules in the configuration template file, avoiding confusion between test data from different units.

[0042] In some embodiments, see Figure 2 The test machine 20 includes 6 test units 21, and the host 10 includes 8 communication ports 11. Each test unit 21 is automatically and randomly assigned one communication port 11.

[0043] In step S320, after completing the port allocation, baud rate setting, and archive path configuration for all test units 21, the serial port module 13 integrates these scattered configuration items to form a structured target configuration file. This target configuration file clearly records the one-to-one correspondence between "test unit number - port number - port baud rate - archive path," containing both personalized configuration information for the current batch and adhering to the standardized specifications of the configuration template. This provides a clear and traceable execution basis for subsequent data transmission, facilitating accurate connection between the test unit 21 and the communication port 11 and preventing data mistransmission or confusion.

[0044] In step S330, after the target configuration file is generated, the serial port module 13 automatically opens the corresponding communication port 11 according to the port number recorded in the target configuration file, thereby establishing a stable and effective communication link between the test unit 21 of the test machine 20 and the host 10. In this way, the communication port 11 is configured according to preset parameters and can directly receive test data transmitted by the test unit 21.

[0045] In some embodiments, step S300 may involve using the serial port module 13 to match and set the first trigger document with the configuration template file to form a target configuration file including configuration information, and opening the communication port 11, followed by: Step S350: Use serial port module 13 to record and save the first trigger document and target configuration file.

[0046] In step S350, the serial port module 13 associates and binds the first trigger document of the current batch with the generated target configuration file and saves it. During archiving, a dedicated folder can be created according to the batch number, ensuring a correspondence between the first trigger document and the target configuration file. When data anomalies or configuration problems occur subsequently, the archived file can be directly retrieved for verification and analysis, reducing the difficulty of troubleshooting. In this way, by associating and saving the first trigger document with the target configuration file, a correspondence between "chip batch information and configuration parameters" is established, providing a complete basis for subsequent test data tracing and configuration error troubleshooting.

[0047] In some embodiments, step S400, which involves transmitting and storing the test data of the test unit 21 to the host 10 according to the configuration information via the communication port 11 corresponding to the test unit 21, may include: Step S410: The test data of the test unit 21 is transmitted to the corresponding communication port 11 at the corresponding port baud rate; Step S420: Store the test data to host 10 according to the corresponding archive path.

[0048] In step S410, each test unit 21 of the test machine 20 continuously generates test data during the test. Each test unit 21 can retrieve the port baud rate parameter bound to it in the target configuration file and send the test data to the corresponding communication port 11 at the transmission rate of that baud rate. Precise baud rate matching can avoid data packet loss, transmission stuttering, or data distortion caused by rate incompatibility, ensuring that the data streams of different test units 21 are stably transmitted in their respective independent communication ports 11 without interference.

[0049] In step S420, after the test data is transmitted to the host 10 through the corresponding communication port 11, the system will automatically store the test data in the specified location of the host 10 according to the exclusive archive path set for the test unit 21 in the target configuration file.

[0050] Here, the target configuration file generated in step S320 clearly defines the one-to-one correspondence between "test unit 21 - communication port 11 - baud rate - archive path," which serves as the basis for the execution of step S400. In this embodiment, data transmission follows preset configuration rules, eliminating manual intervention in data transmission parameters and storage path selection. It ensures data transmission stability through a matched port baud rate and ensures data storage standardization through a fixed archive path, avoiding the problems of data mistransmission and storage failure in traditional manual methods.

[0051] The archive path is associated with test unit 21 and chip batch information, enabling precise mapping from "batch to test unit 21 to data file," eliminating the need for manual folder creation, storage location selection, or file renaming. This standardized storage method not only improves data storage efficiency but also facilitates rapid retrieval, analysis, and traceability of test data.

[0052] In some embodiments, monitoring module 12 may be used to monitor the first triggering document, prior to which: Step S10: Use the configuration module 14 of the host 10 to generate a configuration template file.

[0053] Semiconductor chip testing needs to be adapted to different chip models, the number of test units 21, and communication requirements. Traditional manual operation is prone to problems such as chaotic parameter settings and repetitive work due to the lack of unified standards. In step S10, the configuration module 14 first sorts out the general technical requirements and communication specifications for semiconductor chip testing, and determines the core configuration items of the configuration template file by combining past testing experience, chip testing protocols, and host 10 hardware parameters (such as the number of communication ports 11 and the supported baud rate range).

[0054] The core configuration items can include the mapping rules between communication port 11 and test unit 21, default baud rate parameters, hierarchical archive path format, parameter verification logic, etc., making the configuration template file universal and adaptable. Configuration module 14 integrates the above rules and parameters, generates a structured configuration template file, and stores it in a specified location on host 10. It is also associated with serial port module 13 for quick retrieval in subsequent step S200. The configuration template file can serve as the basic configuration for the operation of serial port module 13.

[0055] The configuration template file generated in step S10 can be understood as a foundational file that integrates general communication rules and parameter specifications for semiconductor chip testing. This configuration template file can include port allocation logic, baud rate selectable range, archive path format, configuration item verification rules, etc., eliminating the need to redesign the parameter framework for each test batch. This configuration template file serves as the benchmark for the first trigger document matching in subsequent step S300, helping to ensure that the configuration of each batch meets both testing technical requirements and achieves standardization and uniformity.

[0056] After step S10 is completed, the monitoring module 12 monitors the first trigger document and triggers the process in subsequent steps. In step S300, the serial port module 13 can also automatically generate the target configuration file based on the configuration template file and match it with the information in the first trigger document. This embodiment constructs a standardized and reusable configuration template file through the host 10 configuration module 14, providing a unified benchmark for automated parameter matching in subsequent batch tests. This facilitates rapid parameter matching and verification, and improves the configuration efficiency of the automated process.

[0057] In some embodiments, configuration template files can be iteratively optimized according to testing needs, eliminating the need for repeated creation and significantly reducing upfront preparation costs.

[0058] In some embodiments, the monitoring module 12 may be used to monitor the first triggering document, and prior to this, the following steps may be included: Step S21: Record the chip batch information into the memory 22 of the test machine 20; Step S22: When the test machine 20 receives the batch opening instruction, it uses the memory 22 to generate a first trigger document based on the chip batch information.

[0059] In traditional semiconductor chip testing, chip batch information is often transmitted verbally or recorded piecemeal, which is prone to omissions and errors, leading to mismatches between port configurations and actual testing requirements. This embodiment addresses this by standardizing chip batch information management. The chip batch information is pre-entered into the memory 22 of the testing machine 20, and then the system automatically generates a first trigger document containing the chip batch information based on the batch opening command. This helps ensure the integrity, accuracy, and consistency of the chip batch information.

[0060] In step S21, before conducting semiconductor chip testing, the staff inputs the chip batch information of the current batch of chips into the memory 22 of the testing machine 20 to ensure that the information is complete and traceable. The input chip batch information provides data support for the subsequent generation of the first trigger document, and the storage characteristics of the memory 22 can ensure that the chip batch information is stably retained, avoiding omissions or errors caused by temporary input, while facilitating subsequent retrieval and verification.

[0061] In some embodiments, a barcode scanner can be used to scan the barcode on the test process card and record the barcode information into the memory 22. The barcode information includes the chip batch information mentioned above.

[0062] In step S22, when the testing machine 20 receives a batch opening command issued manually or automatically triggered by the system, the memory 22 immediately retrieves the previously entered chip batch information and automatically generates a first trigger document according to a preset format. The generated first trigger document includes the chip batch number, chip test item name, chip testing machine number, and chip testing procedure. The chip batch number is the code for the test batch and is used to distinguish different test batches.

[0063] After the memory 22 generates the first trigger document, it will synchronously feed back to the monitoring module 12 of the host 10, and the serial port module 13 will start running. The first trigger document contains information such as the chip test item name and chip tester number, which can be adapted to the general rules in the configuration template file. This helps to ensure that the generated target configuration file matches the current batch test requirements and avoids mismatch between configuration parameters and actual tests.

[0064] In some embodiments, step S400 may involve transmitting the test data of the test unit 21 to the host 10 according to the configuration information via the communication port 11 corresponding to the test unit 21, followed by: In step S450, when the test machine 20 receives the batch closing instruction, it uses the memory 22 to generate a second trigger document.

[0065] Here, the memory 22 generates a second trigger document based on the batch completion instruction received by the test machine 20. This second trigger document serves as the termination instruction for the monitoring module 12 to identify the end of the batch. After the monitoring module 12 detects the second trigger document in real time, it immediately starts the process termination program, stops the serial port module 13 from running, and closes the corresponding communication port 11, completing the closed loop of the communication process for this batch. This helps to improve the automation level of the semiconductor chip testing system 100.

[0066] In some embodiments, the batch completion instruction can be issued manually or automatically generated by the semiconductor chip testing system 100 based on the test completion status.

[0067] In some embodiments, the testing machine 20 is equipped with a start / stop button. When a batch of chips begins testing, and the operator presses the start / stop button for the first time, the memory 22 generates a first trigger document based on the chip batch information. At this time, the button signal is the batch start instruction. When a batch of chips ends testing, and the operator presses the start / stop button again, the memory 22 generates a second trigger document. At this time, the button signal is the batch end instruction.

[0068] This application embodiment also provides a semiconductor chip testing system 100, which includes a host 10 and a testing machine 20. The testing machine 20 includes multiple testing units 21, and the host 10 includes multiple communication ports 11. Each testing unit 21 transmits test data to the host 10 through a corresponding communication port 11. The host 10 also includes a monitoring module 12 and a serial port module 13. The monitoring module 12 is used to monitor a first trigger document and a second trigger document generated by the testing machine 20. The first trigger document includes a chip batch number, a chip test item name, a chip testing machine number, and a chip test procedure. The second trigger document is an empty document. The serial port module 13 is configured to start running when the monitoring module 12 detects the first trigger document, and to acquire the first trigger document and open the communication port 11. The serial port module 13 is also configured to stop running and close the communication port 11 when the monitoring module 12 detects the second trigger document.

[0069] This embodiment of the application uses a monitoring module 12 to automatically detect trigger files, thereby achieving automated on / off control of multiple communication ports 11. The serial port module 13 automatically configures storage parameters and storage paths. The entire process requires no manual setup, automating the testing process, improving the accuracy and efficiency of data entry, and avoiding human error. Specifically, the monitoring module 12 and the serial port module 13 of the host 10 work together to automate the configuration and operation of the communication ports 11, replacing the traditional manual operation process. This eliminates the time spent on multiple manual switching and parameter input, reduces setup time, lowers labor costs, and reduces the risk of errors during manual setup, thus improving the efficiency and accuracy of test data entry.

[0070] Before testing, the test machine 20 generates a first trigger document based on the input chip batch information and synchronizes it to the host 10. After the monitoring module 12 of the host 10 detects the first trigger document in real time, it immediately triggers a start command to drive the serial port module 13 to start running. The serial port module 13 then retrieves the preset configuration template file and the first trigger document, completes the matching and parameter setting between the two, randomly and dynamically assigns a communication port 11 to each test unit 21, and configures parameters such as port baud rate and data archive path. Then, it automatically opens all matched communication ports 11 to establish a communication link between the host 10 and the test unit 21, and completes the association and archiving of data such as the first trigger document and target configuration file.

[0071] The multiple test units 21 of the test machine 20 test the chip and generate test data. According to the parameters set by the serial port module 13, the data is transmitted to the host 10 through their respective communication ports 11. The host 10 then classifies and stores the data from different test units 21 according to the preset archiving path, ensuring that there is no packet loss during data transmission and no confusion during storage.

[0072] Once all test units 21 have completed testing and data transmission, the test machine 20 generates a second trigger document and synchronizes it to the host 10. Upon detecting the second trigger document, the monitoring module 12 immediately triggers a termination command, ordering the serial port module 13 to stop operating. The serial port module 13 then performs a port closing operation, uniformly closing all communication ports 11 corresponding to the current batch, releasing port resources. This completes the closed-loop test communication process for this batch.

[0073] In some embodiments, the host 10 may further include a configuration module 14 for generating and storing a configuration template file, and a serial port module 13 for acquiring the configuration template file and matching the first trigger document with the configuration template file to form a target configuration file. The target configuration file includes the test unit number, port baud rate, port number, and archive path.

[0074] Here, the configuration module 14 provides a unified benchmark for batch parameter matching of the serial port module 13 through a preset general configuration template, which is conducive to the standardization and automation of semiconductor test communication configuration. Specifically, the configuration module 14 integrates the mapping rules between the communication port 11 and the test unit 21, the default baud rate parameters, the hierarchical archive path format, parameter verification logic, etc., to generate a structured configuration template file and store it in a specified location on the host 10. At the same time, it is associated with the serial port module 13 for easy retrieval by the serial port module 13 in the future.

[0075] The configuration template file can serve as the basic configuration for running serial software. It integrates common communication rules for semiconductor testing, adapting to the basic communication requirements of different chip models and test batches, enabling the host 10 to be used with different types of testing equipment.

[0076] The serial port module 13 retrieves the configuration template file and matches it with the first trigger document generated by the test machine 20. Finally, it generates a target configuration file containing the test unit number, port baud rate, port number, and archive path. This ensures the standardization of configuration parameters and achieves accurate adaptation to the test requirements of different batches.

[0077] In some embodiments, the test machine 20 may further include a memory 22 for storing chip batch information, generating a second trigger document, and generating a first trigger document based on the chip batch information.

[0078] Here, the memory 22 provides the monitoring module 12 with precise batch start / stop trigger signals through centralized storage of chip batch information and automatic generation of standardized documents. The memory 22 stores this information in a structured manner to ensure that it can be quickly retrieved when subsequent documents are generated.

[0079] The memory 22 also provides structured data for the configuration matching of the serial port module 13. The memory 22 pre-stores information such as chip batch number, chip test item name, chip tester number, and chip test procedure, avoiding information discrepancies caused by manual, scattered recording. Based on the stored chip batch information, a first trigger document is automatically generated in response to a batch start command, and a second trigger document is automatically generated in response to a batch end command.

[0080] It should be noted that some embodiments of this application have been described above. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps described in the claims can be performed in a different order than that shown in the above embodiments and still achieve the desired result. In addition, the processes depicted in the drawings do not necessarily require the specific order or sequential order shown to achieve the desired result.

[0081] Those skilled in the art should understand that the discussion of any of the above embodiments is merely exemplary and is not intended to imply that the scope of this application (including the claims) is limited to these examples; under the concept of this application, the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations of different aspects of the above embodiments of this application, which are not provided in detail for the sake of brevity.

[0082] The embodiments of this application are intended to cover all such substitutions, modifications, and variations that fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the embodiments of this application should be included within the protection scope of this application.

Claims

1. A communication method for a semiconductor chip testing system, characterized in that, The semiconductor chip testing system includes a host computer and a testing machine. The host computer includes a monitoring module, a serial port module, and multiple communication ports. The testing machine includes multiple testing units. The communication method of the semiconductor chip testing system includes: The monitoring module monitors the first trigger document. When the monitoring module detects the first trigger document, it starts running the serial port module. The first trigger document includes the chip batch number, chip test item name, chip tester number, and chip test procedure. The serial port module is used to obtain the configuration template file and the first trigger document; The serial port module is used to match and set the first trigger document with the configuration template file to form a target configuration file including configuration information, and the communication port is opened. The test data of the test unit is transmitted and stored in the host through the communication port corresponding to the test unit according to the configuration information; The monitoring module monitors the second trigger document. When the monitoring module detects the second trigger document, it stops running the serial port module and closes the communication port; wherein, the second trigger document is an empty document.

2. The communication method of the semiconductor chip testing system according to claim 1, characterized in that, The step of matching and setting the first trigger document with the configuration template file using the serial port module to form a target configuration file including configuration information, and opening the communication port, includes: The serial port module is used to allocate a communication port for each test unit according to the configuration template file and the first trigger document, and the port baud rate and archive path are configured. The serial port module is used to combine the configured items to form the target configuration file, which includes the configuration information; wherein, the configuration information includes test unit number, port baud rate, port number, and archive path; Open the communication port corresponding to the test unit.

3. The communication method of the semiconductor chip testing system according to claim 2, characterized in that, The process involves using the serial port module to match and set the first trigger document with the configuration template file to form a target configuration file including configuration information, and then opening the communication port, followed by: The serial port module is used to record and save the first trigger document and the target configuration file.

4. The communication method of the semiconductor chip testing system according to claim 2, characterized in that, The step of transmitting and storing the test data of the test unit to the host via the communication port corresponding to the test unit according to the configuration information includes: The test data of the test unit is transmitted to the corresponding communication port at the corresponding port baud rate; The test data is stored in the host according to the corresponding archive path.

5. The communication method of the semiconductor chip testing system according to claim 1, characterized in that, The monitoring module is used to monitor the first triggering document, which includes the following: The configuration template file is generated using the host's configuration module.

6. The communication method of the semiconductor chip testing system according to claim 1, characterized in that, The process of using a monitoring module to monitor the first triggering document also includes: The chip batch information is entered into the memory of the testing machine; When the test machine receives a batch opening instruction, it uses the memory to generate the first trigger document based on the chip batch information.

7. The communication method of the semiconductor chip testing system according to claim 1, characterized in that, The step of transmitting and storing the test data of the test unit to the host via the communication port corresponding to the test unit according to the configuration information includes: When the test machine receives the batch completion instruction, it uses the memory to generate the second trigger document.

8. A semiconductor chip testing system, characterized in that, The semiconductor chip testing system includes a host and a testing machine. The testing machine includes multiple testing units, and the host includes multiple communication ports. Each testing unit transmits test data to the host through a corresponding communication port. The host also includes: The monitoring module is used to monitor the first trigger document and the second trigger document generated by the test machine; wherein, the first trigger document includes the chip batch number, the chip test item name, the chip test machine number, and the chip test procedure, and the second trigger document is an empty document; The serial port module is configured to start running when the monitoring module detects the first trigger document, and to acquire the first trigger document and open the communication port; the serial port module is also configured to stop running and close the communication port when the monitoring module detects the second trigger document.

9. The semiconductor chip testing system according to claim 8, characterized in that, The host also includes: A configuration module is used to generate and store a configuration template file. The serial port module is used to obtain the configuration template file and match the first trigger document with the configuration template file to form a target configuration file. The target configuration file includes the test unit number, port baud rate, port number, and archive path.

10. The semiconductor chip testing system according to claim 8, characterized in that, The testing machine also includes: The memory is used to store chip batch information, generate the second trigger document, and generate the first trigger document based on the chip batch information.

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