Resistive load-based power device testing apparatus and method of use

Abstract

This invention provides a power device testing apparatus and method based on a resistive load. The apparatus includes an adjustable temperature test container for housing the power device under test (DUT), a test circuit, a drive circuit, and a power supply circuit. The test circuit includes one or at least two test sub-circuits connected in parallel. Each test sub-circuit includes a resistive load unit, a first switching unit, and a second switching unit. The drive circuit can apply a drive signal to the control terminal of the DUT and, based on the conductivity direction of the DUT in the test sub-circuit, control the connection and disconnection states of the first, second, and third terminals of the first switching unit and the first, second, and third terminals of the second switching unit, thereby forming a power loop with the power supply, the resistive load unit, the first switching unit, and the DUT. This invention can effectively simulate real-world application scenarios for power devices, enabling unidirectional, bidirectional HTOL / LTOL, and DHTOL / DLTOL testing of power devices.

Description

Technical Field

[0001] This invention relates to the field of semiconductor testing technology, and in particular to a power device testing apparatus and method based on resistive load. Background Technology

[0002] The research and application of GaN (gallium nitride) materials are currently at the forefront and a hot topic in semiconductor research. As a novel semiconductor material for developing microelectronic and optoelectronic devices, GaN is gradually becoming an important component of strategic emerging industries. However, due to the differences in physical properties (such as bandgap and electron mobility) between GaN and Si (silicon), traditional testing and reliability testing of Si-based devices cannot fully characterize and screen GaN devices. Therefore, dynamic reliability testing is necessary for GaN devices.

[0003] Currently, reliability testing of power devices (such as Si-based devices) often involves HTOL (High Temperature Operating Life Test) and LTOL (Low Temperature Operating Life Test). These tests are conducted under simulated high / low temperature operating environments, typically applying the maximum operating voltage or slightly higher to the power device under test to assess its durability under high / low temperature and overvoltage conditions. However, existing HTOL / LTOL tests primarily target the characteristics of logic and memory chips themselves and do not address the operating state of the power device under test. As mentioned earlier, some failures in GaN devices require dynamic testing to characterize; therefore, existing power device testing equipment based on resistive loads is not suitable for GaN devices.

[0004] It should be noted that the information disclosed in the background section of this invention is intended only to enhance the understanding of the general background of this invention, and should not be construed as an admission or in any way implying that the information constitutes prior art known to those skilled in the art. Summary of the Invention

[0005] The purpose of this invention is to provide a power device testing device and method based on resistive load. This invention can well simulate the real application scenarios of power devices and can realize the testing of parasitic elements, test board and the characteristics of the power device under test (such as GaN device) itself. Furthermore, it can also realize unidirectional and bidirectional HTOL / LTOL testing of power devices as well as DHTOL (Dynamic High Temperature Operating Life Test) / DLTOL (Dynamic Low Temperature Operating Life Test) to comprehensively and realistically evaluate the switching behavior and stability of the power device under test.

[0006] To achieve the above objectives, the present invention provides the following technical solution: a power device testing device based on a resistive load, comprising: an adjustable temperature testing container for accommodating the power device under test, a testing circuit, a driving circuit, and a power supply; wherein the testing circuit includes one or at least two test sub-circuits connected in parallel; the test sub-circuit includes a resistive load unit, a first switching unit, and a second switching unit; a first end of the resistive load unit is coupled to the positive terminal of the power supply; a second end of the resistive load unit, a first end of the first switching unit, and a first end of the second switching unit are coupled; a second end of the first switching unit and a second end of the second switching unit are coupled to the negative terminal of the power supply; a third end of the first switching unit is used to couple to the first end of the power device under test; and a third end of the second switching unit is used to couple to the second end of the power device under test; the first output terminal of the driving circuit is configured to be coupled to the control terminal of the power device under test.

[0007] The power supply is also configured to supply power to the drive circuit;

[0008] The driving circuit is configured to apply a driving signal to the control terminal of the power device under test and, based on the conductivity direction of the power device under test in the test sub-circuit, control the connection and disconnection states of the first, second, and third terminals of the first switching unit and the first, second, and third terminals of the second switching unit, so that the power supply, the resistive load unit, the first switching unit, the power device under test, and the second switching unit form a power loop.

[0009] Optionally, the resistive load unit includes a first resistor and a second resistor connected in parallel.

[0010] Optionally, the power supply has a power greater than or equal to the number of test sub-circuits, the product of the preset test shutdown voltage and the preset test on-current, and the resistance of the resistive load unit is the quotient of the preset test shutdown voltage divided by the preset test on-current.

[0011] Optionally, the first switching unit includes a first switch, a second switch, and a third switch; the second switching unit includes a fourth switch, a fifth switch, and a sixth switch; the first terminal of the first switch and the first terminal of the fourth switch are coupled to the second terminal of the resistive load unit; the second terminal of the first switch, the first terminal of the second switch, and the first terminal of the third switch are coupled to a first node; the first node is used to connect to the first terminal of the power device under test; the second terminal of the second switch and the first terminal of the fifth switch are coupled to the negative terminal of the power supply; the second terminal of the fourth switch, the second terminal of the fifth switch, and the first terminal of the sixth switch are coupled to a second node; the second node is used to connect to the second terminal of the power device under test; and the second terminal of the third switch and the second terminal of the sixth switch are coupled to a first reference ground.

[0012] The control terminals of the first switch, the second switch, the third switch, the fourth switch, the fifth switch, and the sixth switch are coupled to the drive circuit.

[0013] Optionally, the driving circuit is configured to control the connection and disconnection states of the first, second, and third terminals of the first switching unit and the first, second, and third terminals of the second switching unit according to the conductivity direction of the power device under test in the test sub-circuit, so that the power supply, the resistive load unit, the first switching unit, the power device under test, and the second switching unit form a power loop, including:

[0014] The driving circuit is configured to, when the first terminal of the power device under test is the drain and the second terminal is the source, control the third switch to be open and the sixth switch to be open, and control the first switch and the fifth switch to be open and the second switch and the fourth switch to be open; when the first terminal of the power device under test is the source and the second terminal is the drain, control the third switch to be open and the sixth switch to be open, and control the second switch and the fourth switch to be open and the first switch and the fifth switch to be open.

[0015] Optionally, the first switch, the second switch, the fourth switch, and the fifth switch include power relays or power switches; the third switch and the sixth switch include optocoupler relays.

[0016] Optionally, the driving circuit includes an isolated power supply, a main control unit, and a driving unit. The first terminal of the main control unit is coupled to the first terminal of the driving unit, the second, third, and fourth terminals of the main control unit are coupled to the first switching unit, the fifth, sixth, and seventh terminals of the main control unit are coupled to the second switching unit, and the eighth terminal of the main control unit is coupled to the control terminal of the power device under test.

[0017] The isolated power supply is configured to convert the supply voltage of the power supply to supply power to the main control unit and the drive unit.

[0018] The main control unit is configured to send an initial drive signal to the drive unit, and to control the connection and disconnection states of the first, second and third terminals of the first switch unit and the first, second and third terminals of the second switch unit according to the conductivity direction of the power device under test in the test sub-circuit.

[0019] The driving unit is configured to amplify the initial driving signal to obtain the driving signal, and send the driving signal to the power device under test.

[0020] Optionally, the main control unit is further coupled to the first switching unit and the second switching unit, respectively, including:

[0021] The second, third, and fourth terminals of the main control unit are respectively coupled to the first, second, and third switches of the first switch unit, and the fifth, sixth, and seventh terminals of the main control unit are respectively coupled to the fourth, fifth, and sixth switches of the second switch unit.

[0022] When the first terminal of the power device under test is the drain and the second terminal is the source, the main control unit is configured to control the third switch to be open and the sixth switch to be closed, and to control the first switch and the fifth switch to be closed and the second switch and the fourth switch to be open.

[0023] When the first terminal of the power device under test is the source and the second terminal is the drain, the main control unit is configured to control the third switch to be turned on and the sixth switch to be turned off, and to control the second switch and the fourth switch to be turned on and the first switch and the fifth switch to be turned off.

[0024] Optionally, the power device under test includes a GaN device.

[0025] To achieve the above objectives, the present invention also provides a method of using the power device testing apparatus based on resistive load as described in any of the preceding claims, the method comprising:

[0026] The output voltage of the power supply is determined based on the preset test shutdown voltage, and the resistance value of the resistive load unit is determined based on the preset test shutdown voltage and the preset test conduction current.

[0027] The first terminal of the power device under test is coupled to the third terminal of the first switching unit, the second terminal of the power device under test is coupled to the third terminal of the second switching unit, and the control terminal of the power device under test is coupled to the second terminal of the driving unit of the driving circuit.

[0028] Set the temperature of the adjustable temperature test container to the preset test temperature;

[0029] The driving circuit is activated according to the conductivity direction of the power device under test in the test sub-circuit and the preset test parameters, so that the power device under test is in a conducting or turning-off state.

[0030] Compared with the prior art, the power device testing device and its usage method based on resistive load provided by the present invention have the following advantages:

[0031] The present invention provides a power device testing device based on resistive load, comprising an adjustable temperature test container, a test circuit, a drive circuit, and a power supply. The adjustable temperature test container can stabilize the temperature of the power device under test located within it at the test temperature (e.g., setting a high temperature value or a low temperature value), thereby enabling not only HTOL / LTOL testing of the power device under test, but also effectively simulating the temperature scenario of the power device under test in real-world applications. Furthermore, the test circuit can include at least two test sub-circuits connected in parallel. This configuration allows for parallel testing of multiple groups of power devices under test, and the parallel connection design of each test sub-circuit ensures that each test sub-circuit operates independently without mutual interference. Even if one test sub-circuit fails, it will not affect the other test sub-circuits, thus making the test results more accurate. Further still, each test sub-circuit includes a first switching unit and a second switching unit, thereby controlling the first, second, and third terminals of the first switching unit and the second... The connection and disconnection states of the first, second, and third terminals of the two-switch unit enable both unidirectional and bidirectional HTOL / LTOL and DHTOL / DLOTL testing of the power device under test (DUT), thus giving the resistive load-based power device testing device of this invention excellent applicability. Furthermore, each of the test sub-circuits has an independent resistive load unit, which significantly improves the stability of the resistive load-based power device testing device. Moreover, in the power circuit, the resistive load unit is positioned close to the positive terminal of the power supply, while the DUT is positioned close to the negative terminal. This design better protects the DUT and effectively improves the safety of the resistive load-based power device testing device. Additionally, the drive circuit provides a stable drive signal to the DUT, further enhancing the stability and reliability of the resistive load-based power device testing device provided by this invention. Finally, the resistive load-based power device testing device provided by this invention includes an adjustable temperature test container, a test circuit, and a drive circuit. This modular design also has the advantages of clear logic and ease of implementation. In summary, this invention can effectively simulate real-world application scenarios of power devices, enabling the testing of parasitic components, test boards, and the characteristics of the power device under test (such as GaN devices). Furthermore, it can also perform unidirectional, bidirectional HTOL / LTOL, and DHTOL / DLTOL tests on power devices to comprehensively and realistically evaluate the switching behavior and stability of the power device under test.

[0032] Since the method of using the power device test apparatus based on resistive load provided by this invention belongs to the same inventive concept as the power device test apparatus based on resistive load provided by this invention, the method of using the power device test apparatus based on resistive load provided by this invention has at least all the advantages of the power device test apparatus based on resistive load provided by this invention. For details on the beneficial effects of the method of using the power device test apparatus based on resistive load provided by this invention, please refer to the above description of the beneficial effects of the power device test apparatus based on resistive load provided by this invention, which will not be repeated here. Attached Figure Description

[0033] Figure 1 A block diagram of the power device testing device based on resistive load provided by the present invention;

[0034] Figure 2 This is a schematic diagram of the topology of the test circuit of the power device test device based on resistive load provided in Embodiment 1 of the present invention;

[0035] Figure 3 This is a schematic diagram of the topology of the driving circuit of the power device testing device based on resistive load provided in Embodiment 1 of the present invention.

[0036] Figure 4 This is a schematic diagram of the topology of the test circuit of the power device test device based on resistive load provided in Embodiment 2 of the present invention;

[0037] Figure 5 This is a schematic diagram of the topology of the driving circuit of the power device testing device based on resistive load provided in Embodiment 2 of the present invention;

[0038] Figure 6 This is a schematic diagram of the overall process for using the power device testing apparatus based on resistive load provided in Embodiment 3 of the present invention;

[0039] The reference numerals in the attached figures are as follows:

[0040] Adjustable temperature test container -100;

[0041] Test circuit-200, test sub-circuit-210, resistive load unit-211, first resistor-R1, second resistor-R2, first switch unit-212, first switch-K1, second switch-K2, third switch-K3, second switch unit-213, fourth switch-K4, fifth switch-K5, sixth switch-K6;

[0042] Drive signal - PWM, first reference ground - GND1, second reference ground - GND2;

[0043] Drive circuit-300, isolation power supply-310, main control unit-MCU, drive unit-320;

[0044] Power supply -400;

[0045] The device under test (DUT) is connected to the control terminal of the DUT, the first terminal of the DUT is connected to the control terminal of the DUT, and the second terminal of the DUT is connected to the control terminal of the DUT. Detailed Implementation

[0046] The following detailed description, in conjunction with the accompanying drawings, provides a further detailed account of the power device testing apparatus and its usage method based on resistive load proposed in this invention. The advantages and features of this invention will become clearer from the following description. It should be noted that the drawings are in a very simplified form and use non-precise proportions, intended only to facilitate and clearly illustrate the embodiments of this invention. Please refer to the drawings to make the objectives, features, and advantages of this invention more apparent and understandable. It should be understood that the structures, proportions, sizes, etc., depicted in the accompanying drawings are only for illustrative purposes and to enable those skilled in the art to understand and read them, and are not intended to limit the implementation conditions of this invention. Any modifications to the structure, changes in proportions, or adjustments to the size, provided they produce the same or similar effects and achieve the same objectives as this invention, should still fall within the scope of the technical content disclosed in this invention. Specific design features of the invention disclosed herein, including, for example, specific dimensions, orientations, positions, and shapes, will be determined in part by the specific application and usage environment. Furthermore, in the embodiments described below, the same reference numerals are sometimes used across different drawings to denote the same parts or parts with the same function, omitting repeated descriptions. In this specification, similar reference numerals and letters are used to denote similar items; therefore, once an item is defined in one figure, it need not be discussed further in subsequent figures. Furthermore, if the methods described herein involve a series of steps, and the order of these steps presented herein is not necessarily the only possible order in which they can be performed, some of the described steps may be omitted and / or other steps not described herein may be added to the method.

[0047] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element. The singular forms “a,” “an,” and “the” include plural objects. The term “or” is generally used to mean “and / or,” the term “several” is generally used to mean “at least one,” and the term “at least two” is generally used to mean “two or more.” Furthermore, the terms “first,” “second,” and “third” are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated.

[0048] Additionally, unless specifically stated or obvious from the context, as used herein, the term “about” is understood to mean within the normal tolerance range in the field, such as within 2 standard deviations of the mean. “About” can be understood as within 10%, 9%, 8%, 7%, 6%, 5%, 4%, 3%, 2%, 1%, 0.5%, 0.1%, 0.05%, or 0.01% of the stated value. Unless otherwise specified from the context, all numerical values ​​provided herein are modified by the term “about”.

[0049] It should be understood that when a component is referred to as "connected," "connected to," or "coupled to" other components, it may be directly connected to other components, or there may be intermediary components. Conversely, when a component is referred to as "directly connected" or "directly connected to" other components, there are no intermediary components.

[0050] The core idea of ​​this invention is to provide a power device testing device and method based on resistive load. This invention can well simulate the real application scenario of power devices and can realize the testing of parasitic elements, test board and the characteristics of the power device under test (such as GaN device) itself. Furthermore, it can also realize unidirectional, bidirectional HTOL / LTOL testing and DHTOL / DLTOL testing of power devices to comprehensively and realistically evaluate the switching behavior and stability of the power device under test.

[0051] To achieve the above-mentioned goals, this invention provides a power device testing apparatus based on a resistive load. For an example, please refer to... Figure 1 , Figure 1 This is a block diagram of the power device testing apparatus based on resistive load provided by the present invention. Figure 1 As can be seen, the power device testing apparatus based on resistive load provided by the present invention includes: an adjustable temperature test container 100 for accommodating the power device under test (DUT), a test circuit 200, a drive circuit 300, and a power supply 400. The test circuit 200 includes one or at least two test sub-circuits 210 connected in parallel. Each test sub-circuit 210 includes a resistive load unit 211, a first switching unit 212, and a second switching unit 213. The first end of the resistive load unit 211 is coupled to the positive terminal of the power supply 400. The second end of the resistive load unit 211 and the first end of the first switching unit 212 are connected... The first terminal of the first switching unit 212 and the second terminal of the second switching unit 213 are coupled to the negative terminal of the power supply 400. The third terminal of the first switching unit 212 is used to couple to the first terminal D1 of the power device under test (DUT), and the third terminal of the second switching unit 213 is used to couple to the second terminal D2 of the power device under test (DUT). The first output terminal of the drive circuit 300 is configured to couple to the control terminal G of the power device under test (DUT), and the fourth terminal of the first switching unit 212 and the fourth terminal of the second switching unit 213 are coupled to the first reference ground GND1. More specifically, the power supply 400 is also configured to supply power to the drive circuit 300; the drive circuit 300 is configured to apply a drive signal PWM to the control terminal G of the power device under test (DUT) and control the connection and disconnection states of the first, second, and third terminals of the first switching unit 212 and the first, second, and third terminals of the second switching unit 213 according to the conductivity direction of the DUT in the test sub-circuit 210, so that the power supply 400, the resistive load unit 211, the first switching unit 212, the DUT, and the second switching unit 213 form a power loop.

[0052] The power device testing apparatus based on resistive load provided by this invention includes an adjustable temperature test container 100, a test circuit 200, a drive circuit 300, and a power supply 400. The adjustable temperature test container 100 can stabilize the temperature of the power device under test (DUT) located within it at the test temperature (e.g., setting a high temperature value or a low temperature value), thereby enabling not only HTOL / LTOL testing of the DUT but also effectively simulating the temperature scenario of the DUT in real-world applications. Furthermore, the test circuit 200 can include at least two parallel-connected test sub-circuits 210. This configuration allows for parallel testing of multiple DUTs, and the parallel connection of the test sub-circuits 210 ensures independent operation without mutual interference. Even if one test sub-circuit 210 fails, it will not affect the others, resulting in more accurate test results. Further still, each test sub-circuit 210 includes a first switching unit 212 and a second switching unit 213, thereby controlling the first switching unit 212... The connection and disconnection states of the first, second, and third terminals of 12 and the first, second, and third terminals of the second switching unit 213 can realize unidirectional, bidirectional HTOL / LTOL testing and DHTOL / DLOTL testing of the power device under test (which can be a unidirectional or bidirectional device), thereby making the power device testing device based on resistive load provided by the present invention have good applicability. Furthermore, each of the test sub-circuits 210 has an independent resistive load unit 211, which can significantly improve the stability of the power device testing device based on resistive load. Furthermore, in the power circuit, the resistive load unit 211 is close to the positive terminal of the power supply 400 and the power device under test (DUT) is close to the negative terminal of the power supply 400. This design can better protect the power device under test (DUT) and effectively improve the safety of the power device testing device based on resistive load. In addition, the driving circuit 300 can provide a stable driving signal PWM to the power device under test (DUT), further improving the stability and reliability of the power device testing device based on resistive load provided by the present invention. Finally, the power device testing device based on resistive load provided by the present invention includes an adjustable temperature test container 100, a test circuit 200, and a drive circuit 300. This modular design also has the advantages of clear logic and ease of implementation.In summary, this invention can effectively simulate real-world application scenarios of power devices, enabling the testing of parasitic components, test boards, and the characteristics of the power device under test (DUT) itself (such as GaN devices). Furthermore, it can also perform unidirectional, bidirectional HTOL / LTOL, and DHTOL / DLTOL tests on power devices to comprehensively and realistically evaluate the switching behavior and stability of the power device under test (DUT).

[0053] Preferably, in some exemplary embodiments, the power supply 400, the test circuit 200, and the drive circuit 300 are all located outside the adjustable temperature test container 100. This avoids the high or low temperature environment during testing from affecting the performance stability of the power supply 400, the test circuit 200, and the drive circuit 300, or even damaging them, thereby effectively extending the service life of the power device test apparatus based on resistive load. Furthermore, the adjustable temperature test container 100 includes an insulated box. This configuration makes the insulated box readily available and allows for setting the test temperature (high or low temperature) according to testing needs and maintaining a constant temperature after setting, thus laying a solid foundation for realizing HTOL and LTOL testing.

[0054] It should be noted that the present invention does not impose excessive limitations on the number of adjustable temperature test containers 100. For example, in some embodiments, the number of adjustable temperature test containers 100 may be the same as the number of test sub-circuits 210, that is, the adjustable temperature test containers 100 and the test sub-circuits 210 correspond one-to-one; in other embodiments, the number of adjustable temperature test containers 100 may be less than the number of test sub-circuits 210. In this scenario, by sharing the same adjustable temperature test container 100 with power devices under test (DUTs) that have the same preset test temperature, the cost of power device testing equipment based on resistive loads can be reduced.

[0055] Preferably, in some exemplary embodiments, the power device under test (DUT) comprises a GaN device. Therefore, the power device testing apparatus based on resistive load provided by this invention can effectively perform dynamic testing, unidirectional and bidirectional HTOL / LTOL testing, and DHTOL / DLTOL testing on GaN devices. It should be particularly noted that, as those skilled in the art will understand, the power device testing apparatus based on resistive load provided by this invention does not impose excessive limitations on the power device under test (DUT). For example, the power device under test (DUT) can be a bidirectional device or a unidirectional device. Furthermore, this invention does not limit the material of the power device under test (DUT); the power device can also be other devices besides GaN. For example, the power device under test (DUT) can also be, but is not limited to, a SiC device, etc.

[0056] To facilitate understanding and explanation of the present invention, Embodiments 1 and 2 below provide exemplary descriptions of the power device testing apparatus based on resistive load provided by the present invention, and Embodiment 3 provides exemplary descriptions of the method of using the power device testing apparatus based on resistive load provided by the present invention. Embodiment 1 uses an example where the test circuit of the power device testing apparatus based on resistive load has one test sub-circuit, and Embodiment 2 uses an example where the test circuit of the power device testing apparatus based on resistive load has three test sub-circuits.

[0057] It should be understood that although this article uses the test circuit of the power device test device based on resistive load with one test sub-circuit and three test sub-circuits as examples respectively, it is obvious that the present invention does not impose too much limitation on the number of test sub-circuits. The number of test sub-circuits can be reasonably set according to actual needs. For example, the test sub-circuit can be 1, 2, 3, 4 or more.

[0058] Example 1

[0059] This embodiment provides a power device testing apparatus based on a resistive load. For an example, please refer to... Figure 2 , Figure 2 This is a schematic diagram of the test circuit topology for the power device test apparatus based on a resistive load provided in this embodiment. From... Figure 2 As can be seen, the test circuit 200 of the power device test apparatus based on resistive load provided in this embodiment includes a test sub-circuit 210. Preferably, as Figure 2As shown, in some exemplary embodiments, the resistive load unit 211 of the test subcircuit 210 includes a first resistor R1 and a second resistor R2 connected in parallel. Specifically, the first common junction of the first resistor R1 and the second resistor R2 is coupled to the positive terminal of the power supply 400, and the second common junction of the first resistor R1 and the second resistor R2 is coupled to the first terminal of the first switching unit 212 and the first terminal of the second switching unit 213.

[0060] Because the power device testing device based on resistive load provided by the present invention includes a first resistor R1 and a second resistor R2 connected in parallel in the resistive load unit 211, if the first resistor R1 or the second resistor R2 (i.e., a single resistor) fails, the resistance of the entire resistive load will increase, and the current in the power circuit will decrease, thereby protecting the power device testing device and the power device under test (DUT). If the power device under test (DUT) is short-circuited, the voltage will fall on the resistive load unit 211, thereby effectively preventing further failure of the power device under test (DUT). Thus, the safety and stability of the power device testing device are significantly improved.

[0061] Preferably, in some exemplary embodiments, the power supply 400 has a power greater than or equal to the number of test sub-circuits 210 and the product of a preset test turn-off voltage and a preset test on-current. Therefore, the power device testing apparatus based on resistive load provided by the present invention uses a power supply 400 with sufficient driving capability, which not only ensures the ability to drive the power device under test (DUT), but also has wider applicability.

[0062] It should be understood that this invention does not impose excessive limitations on the number of the test sub-circuits 210, the specific values ​​of the preset test shutdown voltage and the preset test conduction current. When implementing this invention, these values ​​should be selected reasonably according to actual needs. Taking the preset test shutdown voltage as an example, the preset test shutdown voltage can be the maximum operating voltage of the power device under test (DUT), or it can be slightly higher than the maximum operating voltage of the DUT, in order to evaluate the durability of the DUT under high / low temperature and overvoltage conditions.

[0063] Preferably, in some exemplary embodiments, the resistance value of the resistive load unit 211 is the quotient of the preset test off-voltage divided by the preset test on-current. This effectively improves the testing accuracy of the power device under test (DUT) and the safety of the power device testing apparatus based on the resistive load.

[0064] For example, if the preset test turn-off voltage is V and the preset test conduction current is I, then the resistance value R of the resistive load unit 211 is V / I; if the resistive load unit 211 is obtained by connecting the first resistor R1 and the second resistor R2 in parallel, in a preferred embodiment, the resistance values ​​of the first resistor R1 and the second resistor R2 are both 2R.

[0065] Please continue reading Figure 2 ,from Figure 2 As can be seen, in some exemplary embodiments, the first switching unit 212 includes a first switch K1, a second switch K2, and a third switch K3, and the second switching unit 213 includes a fourth switch K4, a fifth switch K5, and a sixth switch K6; the first end of the first switch K1 and the first end of the fourth switch K4 are coupled to the second end of the resistive load unit 211, and the second end of the first switch K1, the first end of the second switch K2, and the first end of the third switch K3 are coupled to the first node ( Figure 2 (Not shown in the image, the first node is also the third terminal of the first switching unit 212). The first node is used to connect to the first terminal D1 of the power device under test (DUT). The second terminal of the second switch K2 and the first terminal of the fifth switch K5 are coupled to the negative terminal of the power supply 400. The second terminal of the fourth switch K4, the second terminal of the fifth switch K5, and the first terminal of the sixth switch K6 are coupled to the second node. Figure 2 (Not shown in the text, the second node is also the third terminal of the second switch unit 213), the second node is used to connect to the second terminal D2 of the power device under test (DUT), the second terminal of the third switch K3 and the second terminal of the sixth switch K6 are coupled to the first reference ground GND1; the control terminals of the first switch K1, the second switch K2, the third switch K3, the fourth switch K4, the fifth switch K5 and the sixth switch K6 are coupled to the drive circuit 300.

[0066] Therefore, the power device testing device based on resistive load provided by the present invention, with the first switching unit 212 including a first switch K1, a second switch K2, and a third switch K3, and the second switching unit 213 including a fourth switch K4, a fifth switch K5, and a sixth switch K6, has clear logic and is easy to implement. Furthermore, the control terminals of the first switch K1, the second switch K2, the third switch K3, the fourth switch K4, the fifth switch K5, and the sixth switch K6 are coupled to the drive circuit 300, laying a good foundation for the automatic control of the power device testing device based on resistive load, thereby effectively improving the testing efficiency of the power device testing device based on resistive load provided by the present invention.

[0067] It should be understood that the first switching unit 212, comprising a first switch K1, a second switch K2, and a third switch K3, and the second switching unit 213, comprising a fourth switch K4, a fifth switch K5, and a sixth switch K6, are merely illustrative examples of preferred embodiments and not limitations of the present invention. The present invention does not impose excessive limitations on the specific implementation of the first switching unit 212 and the second switching unit 213. Taking the first switch K1 and the second switch K2 in the first switching unit 212 as examples, in some exemplary embodiments, the first switch K1 and the second switch K2 may also be, but are not limited to, integrated into a single-pole double-throw switch, etc.

[0068] Correspondingly, the driving circuit 300 is configured to control the connection and disconnection states of the first, second, and third terminals of the first switching unit 212 and the first, second, and third terminals of the second switching unit 213 according to the conductivity direction of the power device under test (DUT) in the test sub-circuit 210, so that the power supply 400, the resistive load unit 211, the first switching unit 212, the power device under test (DUT), and the second switching unit 213 form a power loop, including:

[0069] The driving circuit 300 is configured to, when the first terminal D1 of the power device under test (DUT) is the drain and the second terminal D2 is the source, control the third switch K3 to be open and the sixth switch K6 to be open, and control the first switch K1 and the fifth switch K5 to be open and the second switch K2 and the fourth switch K4 to be open; when the first terminal D1 of the power device under test (DUT) is the source and the second terminal is the drain, control the third switch K3 to be open and the sixth switch K6 to be open, and control the second switch K2 and the fourth switch K4 to be open and the first switch K1 and the fifth switch K5 to be open.

[0070] Therefore, the power device testing device based on resistive load provided by the present invention controls the on and off states of the first switch K1, the second switch K2, the third switch K3, the fourth switch K4, the fifth switch K5 and the sixth switch K6 through the driving circuit 300. This not only enables unidirectional and bidirectional HTOL / LTOL testing and DHTOL / DLOTL testing of the power device under test (DUT), but also has a simple circuit structure and is easy to implement.

[0071] For example, please combine Figure 2When the first terminal D1 of the power device under test (DUT) is the drain and the second terminal D2 is the source: the driving circuit 300 drives the third switch K3 to turn off and the sixth switch K6 to turn on. The driving circuit consists of the driving signal PWM, the gate (i.e., control terminal G) of the power device under test (DUT), the source (i.e., the second terminal D2) of the power device under test (DUT), the sixth switch K6, and the first reference ground GND1; the driving circuit 300 drives the first switch K1 and the fifth switch K5 to turn on and the second switch K2 and the fourth switch K4 to turn off. The power circuit consists of the power supply 400 (i.e., the positive terminal of the power supply 400), the resistive load unit 211, the first switch K1, the drain (i.e., the first terminal D1) of the power device under test (DUT), the source (i.e., the second terminal D2) of the power device under test (DUT), the fifth switch K5, and the power supply 400 (i.e., the negative terminal of the power supply 400). Similarly, when the first terminal D1 of the power device under test (DUT) is the source and the second terminal D2 is the drain: the driving circuit 300 drives the third switch K3 to conduct and the sixth switch K6 to open. The driving circuit consists of the driving signal PWM, the gate (i.e., control terminal G) of the power device under test (DUT), the source (i.e., the first terminal D1) of the power device under test (DUT), the third switch K3, and the first reference ground GND1; the driving circuit 300 drives the second switch K2 and the fourth switch K4 to conduct and the first switch K1 and the fifth switch K5 to open. The power circuit consists of the power supply 400 (i.e., the positive terminal of the power supply 400), the resistive load unit 211, the fourth switch K4, the drain (i.e., the second terminal D2) of the power device under test (DUT), the source (i.e., the first terminal D1) of the power device under test (DUT), the second switch K2, and the power supply 400 (i.e., the negative terminal of the power supply 400).

[0072] Preferably, in some exemplary embodiments, the first switch K1, the second switch K2, the fourth switch K4, and the fifth switch K5 comprise power relays or power switches; the third switch K3 and the sixth switch K6 comprise optocoupler relays. Thus, the present invention employs optocoupler relays as the third switch K3 and the sixth switch K6 for the drive circuit 300, fully utilizing the advantages of fast response time, low power consumption, miniaturized design, and high reliability of optocoupler relays. This results in the power device testing device based on resistive load provided by the present invention having good reliability and low power consumption. Using power relays or power switches as the first switch K1, the second switch K2, the fourth switch K4, and the fifth switch K5 for the power circuit leverages the advantages of power relays or power switches in carrying high current, high voltage, and high power, thereby better protecting the power device under test (DUT). Furthermore, the long service life and low failure rate of power relays or power switches are typically utilized, thereby extending the service life of the power device testing device based on resistive load.

[0073] It should be understood that the first switch K1, the second switch K2, the fourth switch K4, and the fifth switch K5 in this article include power relays or power switches, and the third switch K3 and the sixth switch K6 include optocoupler relays. These are merely illustrative examples of preferred embodiments and not limitations of the present invention. The present invention does not impose excessive limitations on the specific implementation of the first switch K1, the second switch K2, the third switch K3, the fourth switch K4, the fifth switch K5, and the sixth switch K6.

[0074] Preferably, in some exemplary embodiments, the drive signal PWM applied by the drive circuit 300 to the control terminal G of the power device under test (DUT) includes a pulse width modulation (PWM) signal. Therefore, by using a pulse width modulation signal for the drive signal PWM, the dynamic characteristics of the DUT can be better tested, thereby providing a more comprehensive and realistic evaluation of the switching behavior and stability of the DUT. Obviously, the use of a pulse width modulation signal for the drive signal PWM is merely an illustrative example of a preferred embodiment and not a limitation of the invention; it can be reasonably selected according to actual needs.

[0075] Preferably, in some exemplary embodiments, please refer to Figure 3 , Figure 3 This is a schematic diagram of the topology of the drive circuit for the power device testing apparatus based on a resistive load provided in this embodiment. From... Figure 3As can be seen, the driving circuit 300 includes an isolation power supply 310, a main control unit MCU, and a driving unit 320. The first terminal of the main control unit MCU is coupled to the first terminal of the driving unit 320, the second, third, and fourth terminals of the main control unit MCU are coupled to the first switching unit 212, the fifth, sixth, and seventh terminals of the main control unit MCU are coupled to the second switching unit 213, and the eighth terminal of the main control unit MCU is coupled to the control terminal G of the power device under test (DUT). More specifically, the isolation power supply 310 is configured to convert the supply voltage of the power supply 400 to supply power to the main control unit MCU and the drive unit 320; the main control unit MCU is configured to send an initial drive signal PWM to the drive unit 320, and control the connection and disconnection states of the first, second, and third terminals of the first switching unit 212 and the first, second, and third terminals of the second switching unit 213 according to the conduction direction of the power device under test (DUT) in the test sub-circuit 210; the drive unit 320 is configured to amplify the initial drive signal PWM to obtain the drive signal PWM, and send the drive signal PWM to the power device under test (DUT).

[0076] The power device testing device based on resistive load provided by the present invention includes a driving circuit 300 comprising a main control unit (MCU). The MCU provides control signals to drive the testing circuit 200 for automated testing. Furthermore, the driving circuit 300 includes a driving unit 320, which amplifies and enhances the initial driving signal PWM to obtain the final driving signal PWM, thereby better driving the power device under test (DUT) and effectively improving the stability and reliability of the power device testing device based on resistive load provided by the present invention.

[0077] For example, such as Figure 3 As shown, the input terminal of the isolation power supply 310 is coupled to the power supply 400, the ground terminal of the isolation power supply 310 is coupled to the second reference ground GND2, the output terminal of the isolation power supply 310 is coupled to the main control unit MCU and the drive unit 320 respectively, the first terminal of the main control unit MCU is coupled to the first terminal of the drive unit 320, the second terminal of the drive unit 320 is coupled to the control terminal G of the power device under test (DUT), and the third terminal of the drive unit 320 is coupled to the first reference ground GND1.

[0078] It should be understood that the present invention does not impose excessive limitations on the voltage value of the isolation power supply 310. For example, the output voltage of the isolation power supply 310 can be 5V. Furthermore, the present invention does not impose excessive limitations on the specific implementation of the driving unit 320. For example, in some embodiments, the driving unit 320 can be implemented using a driving chip and peripheral circuitry.

[0079] For ease of understanding and explanation, Figure 3 In this context, EN1, EN2, EN3, EN4, EN5, and EN6 represent the control signals output from the second, third, fourth, fifth, sixth, and seventh terminals of the main control unit (MCU), respectively. Based on this, from... Figure 3 As can be seen, in some exemplary embodiments, the main control unit MCU is also coupled to the first switch unit 212 and the second switch unit 213 respectively, including: the second, third and fourth terminals of the main control unit MCU are respectively coupled to the first switch K1, the second switch K2 and the third switch K3 of the first switch unit 212, and the fifth, sixth and seventh terminals of the main control unit MCU are respectively coupled to the fourth switch K4, the fifth switch K5 and the sixth switch K6 of the second switch unit 213. Correspondingly, when the first terminal D1 of the power device under test (DUT) is the drain and the second terminal D2 is the source, the main control unit (MCU) is configured to control the third switch K3 to be open and the sixth switch K6 to be open, and to control the first switch K1 and the fifth switch K5 to be open and the second switch K2 and the fourth switch K4 to be open; when the first terminal D1 of the power device under test (DUT) is the source and the second terminal D2 is the drain, the main control unit (MCU) is configured to control the third switch K3 to be open and the sixth switch K6 to be open, and to control the second switch K2 and the fourth switch K4 to be open and the first switch K1 and the fifth switch K5 to be open.

[0080] It should be understood that this invention does not impose excessive limitations on the specific implementation of the main control unit (MCU). For example, the main control unit (MCU) can be a microcontroller unit, or it can be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or any conventional processor.

[0081] For example, when using the power device testing device based on resistive load provided in this embodiment, firstly, the resistance value of the resistive load unit 211 is determined according to the preset test turn-off voltage and the predicted test current value (for example, if the resistance value is R, then two resistors with a resistance value of 2R can be connected in parallel as the resistive load unit 211); then, the Ton (output period) and Toff (stop output period) of the drive signal PWM are set through the main control unit MCU, and the temperature of the adjustable temperature test container 100 (for example, the preset test temperature) and the output voltage of the power supply 400 (for example, the preset test temperature) are set. A preset test shutdown voltage is used. During time Toff, the power device under test (DUT) is turned off, and there is a voltage across the DUT (e.g., the voltage magnitude is the preset test shutdown voltage). During time Ton, the DUT is turned on, and the output voltage (i.e., the preset test shutdown voltage) will fall across the resistor. A current (e.g., the current magnitude is the preset test on current) flows through the DUT. This process of turning on and off is repeated continuously to achieve the purpose of DHTOL / DLTOL reliability of the DUT.

[0082] Example 2

[0083] This embodiment provides another power device testing apparatus based on resistive load. For example, please refer to [link to relevant documentation]. Figure 4 and Figure 5 ,in, Figure 4 This is a schematic diagram of the test circuit topology of the power device test apparatus based on resistive load provided in this embodiment. Figure 5 This is a schematic diagram of the topology of the drive circuit for the power device testing device based on a resistive load provided in this embodiment. Compared with Embodiment 1, Figure 4 and Figure 5 Simplified illustration of each of the power devices under test (DUT1, DUT2, DUT3), where the first terminal D1 is the drain and the second terminal D2 is the source. From... Figure 4 and Figure 5 It can be seen that the power device testing device based on resistive load provided in this embodiment differs from that in Embodiment 1 in that the test circuit of the power device testing device based on resistive load provided in this embodiment includes three sets of test sub-circuits connected in parallel. To avoid redundancy, the following only describes the differences from Embodiment 1. For parts not mentioned in this embodiment, please refer to the relevant descriptions in Embodiment 1 for an adaptive understanding.

[0084] from Figure 4As can be seen, these three test sub-circuits are connected in parallel, and each test sub-circuit has its own independent resistive load unit. Therefore, not only can multiple sets of power devices under test be tested in parallel, thus improving testing efficiency, but the parallel connection design of each test sub-circuit also ensures that each test sub-circuit operates independently without interfering with each other. Even if one test sub-circuit fails, it will not affect the other test sub-circuits, thus making the test results more accurate.

[0085] Specifically, Figure 5 In this context, EN11, EN21, and EN31 represent the control signals output from the second terminal of the main control unit to the first switches K11, K21, and K31, respectively; EN14, EN24, and EN34 represent the control signals output from the fifth terminal of the main control unit to the fourth switches K14, K24, and K34, respectively; and EN16, EN26, and EN36 represent the control signals output from the seventh terminal of the main control unit to the sixth switches K16, K26, and K36, respectively. Based on this, the power devices under test (DUT1, DUT2, and...) are... For example, to test these three sets of power devices under test simultaneously, the main control unit drives the first switch K11, K21, K31, the fourth switch K14, K24, and K34, and the sixth switch K16, K26, and K36 to close, and applies a drive signal PWM to each power device under test, DUT1, DUT2, and DUT3, thereby realizing the DHTOL / DLTOL test of the three sets of power devices under test, DUT1, DUT2, and DUT3.

[0086] It should be noted that when using a power device testing apparatus based on a resistive load and having multiple test sub-circuits, all the power devices under test can be tested simultaneously, or only some of the power devices under test can be tested; this invention does not impose excessive limitations in this regard. Furthermore, although... Figure 5 In one example, the driving unit drives three power devices under test (DUT1, DUT2) respectively through a single driving signal PWM. However, this is not a limitation of the present invention. In other embodiments, the driving unit may also drive the three power devices under test respectively through three driving signals.

[0087] For example, such as Figure 4 As shown, taking three power devices under test as an example, if the preset test shutdown voltage is 20V and the preset test conduction current is 4A, then a power supply with an output voltage of 20V and an output power of 240W is selected. Based on the preset test conduction current, the resistive load unit 211 can be calculated to be 5 ohms (i.e., impedance 5 ohms). Figure 4 and Figure 5In the configuration: R11 = R12 = R21 = R22 = R31 = R32 = 10 ohms, select six 10-ohm resistors, and connect them in parallel in pairs; the isolation power supply converts 20V to 5V to supply the main control unit MCU and the drive unit 320. The output signal of the main control unit MCU closes K11, K21, K31, K14, K24, K34, K16, K26 and K36. The drive signal PWM is provided by the drive unit 320, which can realize the simultaneous opening and closing of the three sets of power devices under test DUT1, DUT2 and DUT3. During the Ton (output period) time of the drive signal PWM, a current of 4A flows through the three sets of power devices under test DUT1, DUT2 and DUT3. During the Toff (stop output period) time of the drive signal PWM, a voltage of 20V is applied across the three sets of power devices under test DUT1, DUT2 and DUT3. By repeatedly turning the device on and off, the reliability of the DHTOL / DLTOL of the power device under test can be enhanced.

[0088] Example 3

[0089] This embodiment provides a method of using a power device testing apparatus based on a resistive load as described herein. For example, please refer to... Figure 6 , Figure 6 This is a schematic diagram illustrating the overall flow of the method for using the power device testing apparatus based on resistive load provided in this embodiment. From Figure 6 As can be seen, the method of use includes:

[0090] S100: Determine the output voltage of the power supply 400 according to the preset test shutdown voltage, and determine the resistance value of the resistive load unit 211 according to the preset test shutdown voltage and the preset test conduction current.

[0091] S200: The first terminal D1 of the power device under test (DUT) is coupled to the third terminal of the first switching unit 212, the second terminal D2 of the power device under test (DUT) is coupled to the third terminal of the second switching unit 213, and the control terminal G of the power device under test (DUT) is coupled to the second terminal of the driving unit 320 of the driving circuit 300.

[0092] S300: Set the temperature of the adjustable temperature test container 100 to a preset test temperature;

[0093] S400: The drive circuit 300 is activated according to the conductivity direction of the power device under test (DUT) in the test sub-circuit 210 and the preset test parameters, so that the power device under test (DUT) is in a conducting or turning-off state.

[0094] Since the method of using the power device test apparatus based on resistive load provided by this invention belongs to the same inventive concept as the power device test apparatus based on resistive load provided by this invention, the method of using the power device test apparatus based on resistive load provided by this invention has at least all the advantages of the power device test apparatus based on resistive load provided by this invention. For details on the beneficial effects of the method of using the power device test apparatus based on resistive load provided by this invention, please refer to the above description of the beneficial effects of the power device test apparatus based on resistive load provided by this invention, which will not be repeated here.

[0095] It should be understood that the present invention does not impose excessive limitations on the preset test parameters. For example, the preset test parameters include, but are not limited to, the Ton (output period) and Toff (stop output period) of the PWM drive signal, and the polarity (source or drain) connection of the first terminal D1 and the second terminal of the power device under test (DUT). Furthermore, the present invention does not impose excessive limitations on the order of steps S100 and S200. For example, in some embodiments, step S100 can be executed before step S200; in other embodiments, step S200 can be executed before step S100.

[0096] Compared with the prior art, the power device testing device and its usage method based on resistive load provided by the present invention have the following advantages:

[0097] (1) The power device testing device based on resistive load provided by the present invention includes an adjustable temperature test container, a test circuit, a drive circuit and a power supply. The adjustable temperature test container can stabilize the temperature of the power device under test located therein at the test temperature (for example, setting a high temperature value or setting a low temperature value), so that not only can the HTOL / LTOL test of the power device under test be realized, but also the temperature scenario of the power device under test in real application can be well simulated.

[0098] (2) The test circuit may include at least two test sub-circuits connected in parallel. With this configuration, not only can multiple groups of power devices under test be tested in parallel, but the parallel connection between the test sub-circuits also allows each test sub-circuit to operate independently without interfering with each other. Even if one test sub-circuit fails, it will not affect the other test sub-circuits, thus making the test results more accurate.

[0099] (3) Each of the test sub-circuits includes a first switch unit and a second switch unit. By controlling the connection and disconnection states of the first, second and third ends of the first switch unit and the first, second and third ends of the second switch unit, both unidirectional HTOL / LTOL and DHTOL / DLOTL tests of the power device under test and bidirectional HTOL / LTOL and DHTOL / DLOTL tests of the power device under test can be realized, thereby making the power device test device based on resistive load provided by the present invention have good applicability.

[0100] (4) Each of the test sub-circuits has an independent resistive load unit. The resistive load unit can significantly improve the stability of the power device test device based on resistive load. Furthermore, in the power circuit, the resistive load unit is close to the positive terminal of the power supply and the power device under test is close to the negative terminal of the power supply. This design can better protect the power device under test and effectively improve the safety of the power device test device based on resistive load.

[0101] (5) The driving circuit can provide a stable driving signal for the power device under test, which further improves the stability and reliability of the power device test device based on resistive load provided by the present invention.

[0102] (6) The power device testing device based on resistive load provided by the present invention includes an adjustable temperature test container, a test circuit and a drive circuit. This modular design also has the advantages of clear logic and easy implementation.

[0103] In summary, this invention can effectively simulate real-world application scenarios of power devices, enabling the testing of parasitic components, test boards, and the characteristics of the power device under test (such as GaN devices). Furthermore, it can also perform unidirectional, bidirectional HTOL / LTOL, and DHTOL / DLTOL tests on power devices to comprehensively and realistically evaluate the switching behavior and stability of the power device under test.

[0104] It should be noted that the apparatus and methods disclosed in the embodiments herein can also be implemented in other ways. The apparatus embodiments described above are merely illustrative; for example, the flowcharts and block diagrams in the accompanying drawings show the architecture, functionality, and operation of possible implementations of apparatus, methods, and computer program products according to various embodiments herein. In this regard, each block in a flowchart or block diagram may represent a module, program, or part of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions marked in the blocks may occur in a different order than those marked in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in a block diagram and / or flowchart, and combinations of blocks in block diagrams and / or flowcharts, can be implemented using a dedicated hardware-based system to perform the specified function or action, or can be implemented using a combination of dedicated hardware and computer instructions.

[0105] In addition, the functional modules in the various embodiments of this article can be integrated together to form an independent part, or each module can exist independently, or two or more modules can be integrated to form an independent part.

[0106] The above description is merely a preferred embodiment of the power device testing apparatus and method based on resistive load provided by the present invention, and is not intended to limit the scope of the present invention in any way. Any changes or modifications made by those skilled in the art based on the above disclosure are within the protection scope of the present invention. Obviously, those skilled in the art can make various modifications and variations to the present invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the present invention and its equivalents, the present invention also intends to include these modifications and variations.

Claims

1. A power device testing device based on resistive load, characterized in that, include: An adjustable temperature test container, a test circuit, a drive circuit, and a power supply are used to house a power device under test (DUT). The test circuit includes one or at least two test sub-circuits connected in parallel. Each test sub-circuit includes a resistive load unit, a first switching unit, and a second switching unit. A first terminal of the resistive load unit is coupled to the positive terminal of the power supply. The second terminals of the resistive load unit, the first terminals of the first and second switching units are coupled to the first terminal of the power supply. A third terminal of the first switching unit is coupled to the first terminal of the DUT, and a third terminal of the second switching unit is coupled to the second terminal of the DUT. A first output terminal of the drive circuit is configured to be coupled to the control terminal of the DUT. The power supply is also configured to supply power to the drive circuit; The driving circuit is configured to apply a driving signal to the control terminal of the power device under test and, based on the conductivity direction of the power device under test in the test sub-circuit, control the connection and disconnection states of the first, second, and third terminals of the first switching unit and the first, second, and third terminals of the second switching unit, so that the power supply, the resistive load unit, the first switching unit, the power device under test, and the second switching unit form a power loop.

2. The power device testing apparatus according to claim 1, characterized in that, The resistive load unit includes a first resistor and a second resistor connected in parallel.

3. The power device testing apparatus according to claim 1, characterized in that, The power supply has a power greater than or equal to the number of test sub-circuits, the product of the preset test shutdown voltage and the preset test on-current, and the resistance of the resistive load unit is the quotient of the preset test shutdown voltage divided by the preset test on-current.

4. The power device testing apparatus according to claim 1, characterized in that, The first switching unit includes a first switch, a second switch, and a third switch; the second switching unit includes a fourth switch, a fifth switch, and a sixth switch; the first terminal of the first switch and the first terminal of the fourth switch are coupled to the second terminal of the resistive load unit; the second terminal of the first switch, the first terminal of the second switch, and the first terminal of the third switch are coupled to a first node; the first node is used to connect to the first terminal of the power device under test; the second terminal of the second switch and the first terminal of the fifth switch are coupled to the negative terminal of the power supply; the second terminal of the fourth switch, the second terminal of the fifth switch, and the first terminal of the sixth switch are coupled to a second node; the second node is used to connect to the second terminal of the power device under test; and the second terminal of the third switch and the second terminal of the sixth switch are coupled to a first reference ground. The control terminals of the first switch, the second switch, the third switch, the fourth switch, the fifth switch, and the sixth switch are coupled to the drive circuit.

5. The power device testing apparatus according to claim 4, characterized in that, The driving circuit is configured to control the connection and disconnection states of the first, second, and third terminals of the first switching unit and the first, second, and third terminals of the second switching unit according to the conductivity direction of the power device under test in the test sub-circuit, so that the power supply, the resistive load unit, the first switching unit, the power device under test, and the second switching unit form a power loop, including: The driving circuit is configured to, when the first terminal of the power device under test is the drain and the second terminal is the source, control the third switch to be open and the sixth switch to be open, and control the first switch and the fifth switch to be open and the second switch and the fourth switch to be open; when the first terminal of the power device under test is the source and the second terminal is the drain, control the third switch to be open and the sixth switch to be open, and control the second switch and the fourth switch to be open and the first switch and the fifth switch to be open.

6. The power device testing apparatus according to claim 4, characterized in that, The first switch, the second switch, the fourth switch, and the fifth switch include power relays or power switches; the third switch and the sixth switch include optocoupler relays.

7. The power device testing apparatus according to claim 1, characterized in that, The driving circuit includes an isolated power supply, a main control unit, and a driving unit. The first terminal of the main control unit is coupled to the first terminal of the driving unit, the second, third, and fourth terminals of the main control unit are coupled to the first switching unit, the fifth, sixth, and seventh terminals of the main control unit are coupled to the second switching unit, and the eighth terminal of the main control unit is coupled to the control terminal of the power device under test. The isolated power supply is configured to convert the supply voltage of the power supply to supply power to the main control unit and the drive unit. The main control unit is configured to send an initial drive signal to the drive unit, and to control the connection and disconnection states of the first, second and third terminals of the first switch unit and the first, second and third terminals of the second switch unit according to the conductivity direction of the power device under test in the test sub-circuit. The driving unit is configured to amplify the initial driving signal to obtain the driving signal, and send the driving signal to the power device under test.

8. The power device testing apparatus according to claim 7, characterized in that, The main control unit is also coupled to the first switching unit and the second switching unit respectively, including: The second, third, and fourth terminals of the main control unit are respectively coupled to the first, second, and third switches of the first switch unit, and the fifth, sixth, and seventh terminals of the main control unit are respectively coupled to the fourth, fifth, and sixth switches of the second switch unit. When the first terminal of the power device under test is the drain and the second terminal is the source, the main control unit is configured to control the third switch to be open and the sixth switch to be on, and to control the first switch and the fifth switch to be on and the second switch and the fourth switch to be open. When the first terminal of the power device under test is the source and the second terminal is the drain, the main control unit is configured to control the third switch to be turned on and the sixth switch to be turned off, and to control the second switch and the fourth switch to be turned on and the first switch and the fifth switch to be turned off.

9. The power device testing apparatus according to claim 1, characterized in that, The power device under test includes a GaN device.

10. A method of using a power device testing apparatus based on a resistive load as described in any one of claims 1 to 9, characterized in that, The method of use includes: The output voltage of the power supply is determined based on the preset test shutdown voltage, and the resistance value of the resistive load unit is determined based on the preset test shutdown voltage and the preset test conduction current. The first terminal of the power device under test is coupled to the third terminal of the first switching unit, the second terminal of the power device under test is coupled to the third terminal of the second switching unit, and the control terminal of the power device under test is coupled to the second terminal of the driving unit of the driving circuit. Set the temperature of the adjustable temperature test container to the preset test temperature; The driving circuit is activated according to the conductivity direction of the power device under test in the test sub-circuit and the preset test parameters, so that the power device under test is in a conducting or turning-off state.

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