Whole machine storage life acceleration factor calculation method, related device and program product

Abstract

The application provides a whole machine storage life acceleration factor calculation method, related equipment and program products, wherein the method comprises: for each sensitive component on the whole machine, constructing its reliability function under the reference stress condition and its reliability function under the acceleration stress condition; based on the reliability functions of all sensitive components on the whole machine under the reference stress condition, constructing the reliability function of the whole machine under the reference stress condition; based on the reliability functions of all sensitive components on the whole machine under the acceleration stress condition, constructing the reliability function of the whole machine under the acceleration stress condition; and based on the reliability functions of the whole machine under the reference stress condition and the acceleration stress condition, determining the storage life acceleration factor of the whole machine. The application provides a whole machine storage life acceleration factor calculation method, related equipment and program products, which realizes accurate determination of the whole machine storage life acceleration factor, and the determined storage life acceleration factor has high credibility and high reliability.

Description

Technical Field

[0001] This application relates to the field of life testing and evaluation technology, and in particular to a method for calculating the acceleration factor of whole machine storage life, related equipment and program products. Background Technology

[0002] Currently, the overall storage life of a device is mainly calculated by conducting accelerated storage tests on components to obtain their lifespan under accelerated stress, which is then used to indirectly estimate the overall storage life of the device. However, these existing methods can only estimate the overall device lifespan by conducting accelerated storage tests on components; they cannot directly conduct accelerated storage tests on the entire device. Consequently, the accuracy and reliability of lifespan qualification tests are relatively low. Summary of the Invention

[0003] In view of this, the purpose of this application is to propose a method for calculating the acceleration factor of the overall storage life, related equipment and program products.

[0004] To achieve the above objectives, this application provides a method for calculating the acceleration factor of overall system storage life, including: For each sensitive component on the whole machine, based on its corresponding lifetime distribution type, its reliability function under reference stress conditions and its reliability function under accelerated stress conditions are constructed, wherein the sensitive component includes sensitive devices and sensitive materials; Based on the reliability functions of all sensitive components on the whole machine under the reference stress condition, the reliability function of the whole machine under the reference stress condition is constructed. Based on the reliability functions of all sensitive components on the machine under accelerated stress conditions, the reliability function of the whole machine under accelerated stress conditions is constructed. Based on the reliability function of the whole machine under reference stress conditions and the reliability function under accelerated stress conditions, the storage life acceleration factor of the whole machine is determined.

[0005] Optionally, the lifetime distribution type includes an exponential distribution; For each sensitive component on the entire machine, based on its corresponding lifespan distribution type, a reliability function under reference stress conditions and a reliability function under accelerated stress conditions are constructed, including: In response to the exponential distribution of the lifespan distribution of the sensitive components, the failure rate under reference stress conditions and the stress acceleration factor under accelerated stress conditions for each sensitive component are obtained. For each sensitive component, a reliability function under reference stress conditions is constructed based on the reliability function corresponding to the exponential distribution and the failure rate of the sensitive component. For each sensitive component, a reliability function under accelerated stress conditions is constructed based on the reliability function corresponding to the exponential distribution, the failure rate of the sensitive component, and the stress acceleration factor.

[0006] Optionally, the lifetime distribution type includes the Weibull distribution; For each sensitive component on the entire machine, based on its corresponding lifespan distribution type, a reliability function under reference stress conditions and a reliability function under accelerated stress conditions are constructed, including: In response to the Weibull distribution of the lifetime distribution of the sensitive component, the characteristic lifetime, shape parameters and stress acceleration factor under accelerated stress conditions corresponding to each sensitive component are obtained. For each sensitive component, a reliability function under reference stress conditions is constructed based on the reliability function corresponding to the Weibull distribution, the characteristic lifetime and shape parameters of the sensitive component. For each sensitive component, a reliability function under accelerated stress conditions is constructed based on the reliability function corresponding to the Weibull distribution, the characteristic lifetime, shape parameters, and stress acceleration factor of the sensitive component.

[0007] Optionally, the lifetime distribution type includes a log-normal distribution; For each sensitive component on the entire machine, based on its corresponding lifespan distribution type, a reliability function under reference stress conditions and a reliability function under accelerated stress conditions are constructed, including: In response to the fact that the lifetime distribution type of the sensitive component is the log-normal distribution, the logarithmic mean, logarithmic standard deviation, and stress acceleration factor under accelerated stress conditions are obtained for each sensitive component. For each sensitive component, a reliability function under reference stress conditions is constructed based on the reliability function corresponding to the log-normal distribution, the logarithmic mean and standard deviation of the sensitive component. For each sensitive component, a reliability function under accelerated stress conditions is constructed based on the reliability function corresponding to the log-normal distribution, the logarithmic mean, logarithmic standard deviation, and stress acceleration factor corresponding to the sensitive component.

[0008] Optionally, the stress acceleration factor for each sensitive component under accelerated stress conditions is obtained by the following methods: For each sensitive component, the stress acceleration factor under accelerated stress conditions is determined based on its corresponding activation energy.

[0009] Optionally, the reliability function under quasi-stress conditions includes: The reliability function of the whole machine under the reference stress condition is obtained by multiplying the reliability function of each sensitive material under the reference stress condition and the reliability function of each sensitive component under the reference stress condition.

[0010] Optionally, the construction of the overall reliability function under accelerated stress conditions based on the reliability functions of all sensitive components on the machine under accelerated stress conditions includes: The reliability function of the whole machine under accelerated stress is obtained by multiplying the reliability function of each sensitive material under accelerated stress and the reliability function of each sensitive component under reference stress.

[0011] Optionally, determining the storage life acceleration factor of the entire machine based on the reliability function of the entire machine under reference stress conditions and the reliability function under accelerated stress conditions includes: Based on the reliability function of the whole machine under the reference stress condition, the first life value of the whole machine under the reference stress condition is determined; Based on the reliability function of the whole machine under accelerated stress, the second life value of the whole machine under accelerated stress is determined; The ratio of the first lifetime value to the second lifetime value is determined as the storage lifetime acceleration factor of the whole machine.

[0012] Optionally, determining the first life value of the entire machine under the reference stress based on the reliability function of the entire machine under the reference stress condition includes: When the calculated result of the reliability function of the whole machine under the reference stress condition is determined as the target reliability, the corresponding lifetime value is the first lifetime value.

[0013] Optionally, determining the second lifetime value of the entire machine under accelerated stress based on the reliability function of the entire machine under accelerated stress includes: When the calculated result of the reliability function of the whole machine under accelerated stress conditions is determined as the target reliability, the corresponding lifetime value is the second lifetime value.

[0014] Based on the same inventive concept, this disclosure also provides a device for calculating the acceleration factor of the overall storage life, comprising: The sensitive component calculation module is used to construct the reliability function under the reference stress condition and the reliability function under the accelerated stress condition for each sensitive component on the whole machine, based on its corresponding lifetime distribution type. The sensitive components include sensitive devices and sensitive materials. The first whole-machine calculation module is used to construct the whole-machine reliability function under the reference stress condition based on the reliability function of each sensitive component on the whole machine under the reference stress condition; The second whole-machine calculation module is used to construct the whole-machine reliability function under accelerated stress conditions based on the reliability function of each sensitive component on the whole machine under accelerated stress conditions; The acceleration factor calculation module is used to determine the storage lifetime acceleration factor of the entire machine based on the reliability function of the entire machine under reference stress conditions and the reliability function under accelerated stress conditions.

[0015] Based on the same inventive concept, this disclosure also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and running on the processor, wherein the processor implements the whole-device storage lifetime acceleration factor calculation method as described above when executing the computer program.

[0016] Based on the same inventive concept, this disclosure also provides a non-transitory computer-readable storage medium storing computer instructions for causing a computer to execute the overall storage lifetime acceleration factor calculation method as described above.

[0017] Based on the same inventive concept, this disclosure also provides a computer program product, including computer program instructions, which, when run on a computer, cause the computer to execute the whole machine storage lifetime acceleration factor calculation method as described above.

[0018] As can be seen from the above, the method, related equipment, and program products for calculating the storage lifetime acceleration factor of a complete machine provided in this application first construct the reliability functions of sensitive devices and sensitive materials under reference stress conditions and accelerated stress conditions. Then, the reliability function of the entire machine under reference stress conditions is constructed using the reliability functions of all sensitive components under reference stress conditions. The reliability function of the entire machine under accelerated stress conditions is then constructed using the reliability functions of all sensitive components under accelerated stress conditions. Finally, based on the reliability functions of the entire machine under reference stress conditions and accelerated stress conditions, the storage lifetime acceleration factor of the entire machine is determined. Through the above steps, on the one hand, the reliability functions of sensitive components under reference stress conditions and accelerated stress conditions are determined according to their corresponding lifetime distribution types, thus ensuring that the accuracy of the calculation is consistent with the actual storage lifetime acceleration factor. The determined reliability function better reflects the actual situation of sensitive components. Furthermore, based on the reliability functions of all sensitive materials and devices in the entire machine, a reliability function for the entire machine under both baseline and accelerated stress conditions is constructed. This enables accurate calculation of the storage life acceleration factor for the entire machine, effectively considering the impact of material aging on the overall machine lifespan, effectively avoiding acceleration factor deviations caused by material aging, and more objectively reflecting the true degradation characteristics of the entire machine during long-term storage. The determined storage life acceleration factor has higher reliability and credibility, supporting the implementation of whole-machine-level storage life tests and improving the accuracy of whole-machine storage life tests. This supports applications such as equipment life determination, life extension, health management, and reliability verification, enabling a more refined and comprehensive evaluation of the storage life of complex electromechanical systems. This application achieves accurate determination of the whole-machine storage life acceleration factor, and the determined storage life acceleration factor has high credibility and reliability, thereby effectively improving the accuracy of whole-machine storage life tests. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in this application or related technologies, the drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of a method for calculating the acceleration factor of the overall storage life of a device according to an embodiment of this application; Figure 2 This is a schematic diagram of a whole-machine storage life acceleration factor calculation device according to an embodiment of this application; Figure 3 This is a schematic diagram of an electronic device according to an embodiment of this application. Detailed Implementation

[0021] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with specific embodiments and the accompanying drawings.

[0022] It should be noted that, unless otherwise defined, the technical or scientific terms used in the embodiments of this application should have the ordinary meaning understood by one of ordinary skill in the art to which this application pertains. The terms "first," "second," and similar terms used in the embodiments of this application do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. Terms such as "upper," "lower," "left," and "right" are only used to indicate relative positional relationships; when the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0023] Most complex electromechanical equipment exhibits the typical service characteristics of "long-term storage, single-use." With the deepening of equipment life-cycle management, higher requirements are placed on the qualification tests for equipment storage life. Because such equipment is typically in a non-operating, low-stress environment during long-term storage, its design reliability is often high, resulting in a very long actual storage life. To evaluate the storage reliability of equipment within an acceptable timescale, accelerated storage life testing must be employed to equivalently simulate the long-term storage aging process.

[0024] Acceleration factor is a quantitative indicator used to describe the difference in aging rate of a product under different stress levels. It is usually defined as the ratio of the characteristic life under baseline stress conditions to that under accelerated stress conditions. Using the acceleration factor, life data obtained from accelerated testing can be equivalently converted to life under real storage conditions, thereby reconstructing the long-term storage aging process in a shorter time. In accelerated storage life testing of components, the aging behavior of components in non-operating states is accelerated by applying intensified stresses such as high temperature and high humidity, and combined with the acceleration factor, a rapid assessment of long-term storage performance is achieved. This type of testing provides a quantifiable and verifiable technical means for determining the storage life of equipment, making life extension decisions, and managing in-stock reliability.

[0025] Currently, research and testing methods for accelerated storage life primarily focus on individual components, lacking methods for calculating acceleration factors for the entire device. This prevents direct accelerated storage life testing of the entire device. The current method for calculating the storage life of the entire device mainly involves conducting accelerated storage tests on components to obtain their lifespan under accelerated stress, indirectly extrapolating the overall device lifespan. This approach assumes that the overall device lifespan is primarily determined by the components, but it neglects the slow aging effects of raw materials (such as rubber, coatings, sealants, and adhesives) during long-term storage. For complex electromechanical devices with diverse material compositions, material aging often co-determines the overall device lifespan with component aging; extrapolating the overall device lifespan solely from the component level will result in significant errors. For example, in 1986, an O-ring on the right side of the solid rocket booster of the US Space Shuttle Challenger hardened and lost its elasticity under cryogenic stress, leading to flight failure; in 2003, the Columbia space shuttle's thermal insulation material aged, causing it to disintegrate upon re-entry into the atmosphere; and in 2010, the US F-22 Raptor fighter jet suffered serious flight safety threats due to aging materials and peeling coatings in its oxygen generation system. Materials are a crucial factor affecting the performance of an entire aircraft. Current calculations of the overall storage life of an aircraft do not consider the impact of the materials used in its lifespan, resulting in low accuracy and reliability of storage life qualification tests.

[0026] The natural storage testing cycle for equipment is too long; many important pieces of equipment need to be stored for more than 20 years. Therefore, there is an urgent need to conduct accelerated storage tests on the entire machine to directly calculate its storage life. Determining the acceleration factor of the entire machine under high stress levels is crucial by increasing the stress level applied to the product to approximate its lifespan under normal stress. Therefore, how to construct an accelerated storage life factor that can simultaneously characterize the effects of material aging and component aging has become a key issue in conducting whole-machine-level storage life qualification.

[0027] In view of this, this application provides a method for calculating the storage life acceleration factor of a complete machine, which can effectively calculate the storage life acceleration factor of the complete machine. Using this storage life acceleration factor can effectively improve the accuracy and reliability of the storage life qualification test of the complete machine, and provide technical support for the life determination and extension of complex electromechanical equipment.

[0028] Reference Appendix Figure 1 The method includes: S101. For each sensitive component on the whole machine, according to its corresponding lifetime distribution type, construct its reliability function under the reference stress condition and its reliability function under the accelerated stress condition, wherein the sensitive component includes sensitive devices and sensitive materials. Specifically, accelerated stress includes environmentally intensified stresses such as high-temperature stress, high-humidity stress, and combined high-temperature and high-humidity stress. In reliability engineering, the lifespan of products or devices typically exhibits certain statistical patterns, with different failure mechanisms corresponding to different lifespan distribution types. During actual equipment storage, humidity is generally well controlled, and the most sensitive stress affecting storage life is temperature. Therefore, accelerated stress is generally high-temperature stress, but it can also be combined high-temperature and high-humidity stress, etc., without specific limitations.

[0029] Common lifetime distribution types include exponential, Weibull, and log-normal distributions. Different distribution types correspond to different failure trends and probability structures, thus requiring different reliability functions to be constructed for sensitive components with different lifetime distribution types. Therefore, based on the lifetime distribution type followed by the sensitive component, an accurate reliability function can be established, providing a data foundation for calculating the reliability acceleration factor.

[0030] S102. Based on the reliability functions of all sensitive components on the whole machine under the reference stress condition, construct the reliability function of the whole machine under the reference stress condition; Specifically, the sensitive components on the entire machine include sensitive devices and sensitive materials, and each type of sensitive device may have multiple instances in the entire machine. For example, there may be 5, 6 or more sensitive component electrical connectors on the entire machine, and the number of sensitive component resistors may be even greater, such as 40 or 50. Each sensitive component may affect the lifespan of the entire machine. Therefore, when calculating the reliability function of the entire machine under the reference stress condition, it is necessary to consider the reliability function of all sensitive components (i.e., each sensitive device and each sensitive material) under the reference stress condition. That is, the reliability function of the entire machine under the reference stress condition is constructed by using the reliability function of each sensitive device and each sensitive material under the reference stress condition.

[0031] S103. Based on the reliability functions of all sensitive components on the whole machine under accelerated stress conditions, construct the reliability function of the whole machine under accelerated stress conditions; Specifically, when calculating the reliability function of the whole machine under accelerated stress conditions, it is necessary to consider the reliability function of all sensitive components (i.e., each sensitive device and each sensitive material) under accelerated stress conditions. That is, the reliability function of the whole machine under accelerated stress conditions is constructed by using the reliability function of each sensitive device and each sensitive material under accelerated stress conditions.

[0032] S104. Based on the reliability function of the whole machine under the reference stress condition and the reliability function under the accelerated stress condition, determine the storage life acceleration factor of the whole machine.

[0033] Specifically, based on the reliability function of the entire machine under reference stress conditions and the reliability function under accelerated stress conditions, the storage life acceleration factor of the entire machine under accelerated stress relative to the reference stress can be calculated by comparing the difference in the characteristic life of the entire machine under the two stress levels. This acceleration factor is used to characterize the degree of improvement in the aging rate of the entire machine in a strengthened environment and serves as a key parameter for converting the accelerated test life into the actual storage life.

[0034] Before step S101, a database of sensitive components can also be built in advance.

[0035] Electromechanical products, including electronic components and electromechanical structural components, are further subdivided into electronic components, metallic materials, and non-metallic raw materials. Metallic materials remain virtually unchanged during storage and have no impact on functionality or performance. Therefore, the electronic components and non-metallic raw materials have the greatest impact on the overall product's lifespan. Various electronic components are connected to form electronic circuits, constituting the product's main functions. Non-metallic raw materials, primarily polymers and composites, support the product's internal environment and structure, such as ensuring its airtightness. Electronic components are mainly categorized as follows: discrete semiconductor devices, monolithic integrated circuits, inductors, transformers and magnetic components, cable assemblies and connectors, capacitors, resistors, optocouplers, hybrid integrated circuits, crystal oscillators, filters, sensitive elements, and sensors. By analyzing the impact of the actual storage environment on product performance and failure modes under the current environment, combined with product failure mechanisms and failure data during the storage period, and integrating historical usage and existing experience data, electronic components with a significant impact on storage performance were selected as sensitive components. Non-metallic raw materials are mainly divided into the following categories: greases, heat shrink tubing, rubber, adhesives, coatings, wires, alkali-free glass fibers, etc. Based on historical usage and existing experience data, non-metallic raw materials with the greatest impact on storage performance were selected as sensitive materials. Specifically, sensitive components include digital circuits, hybrid integrated circuits, oscillators, discrete semiconductor devices, electrical connectors, resistors, capacitors, etc.; sensitive materials include greases, adhesives, rubber, etc.

[0036] By analyzing the types of sensitive devices and materials obtained, a database of sensitive components can be constructed. When it is necessary to calculate the storage lifetime acceleration factor of the whole machine, the sensitive component database and the component information of the whole machine can be queried to determine the various types of sensitive components of the whole machine.

[0037] In this application, based on steps S101-S104, reliability functions for sensitive devices and sensitive materials under reference stress and accelerated stress conditions are first constructed. Then, the reliability function of the entire device under reference stress conditions is constructed using the reliability functions of all sensitive components under reference stress conditions. Similarly, the reliability function of the entire device under accelerated stress conditions is constructed using the reliability functions of all sensitive components under accelerated stress conditions. Finally, based on the reliability functions of the entire device under reference stress and accelerated stress conditions, the storage lifetime acceleration factor of the entire device is determined. Through these steps, the reliability functions of sensitive components under reference stress and accelerated stress conditions are determined according to their corresponding lifetime distribution types, making the determined reliability functions more consistent with the sensitive device's reliability. On the one hand, based on the actual situation of the components, and on the other hand, based on the reliability functions of all sensitive materials and sensitive devices in the whole machine, the reliability functions of the whole machine under the reference stress condition and accelerated stress condition are constructed, realizing the accurate calculation of the storage life acceleration factor of the whole machine, effectively considering the impact of material aging on the life of the whole machine, effectively avoiding the deviation of the acceleration factor caused by material aging, and more objectively reflecting the true degradation characteristics of the whole machine during long-term storage; the determined storage life acceleration factor has higher reliability and credibility, which can support the implementation of whole machine-level storage life test, improve the accuracy of whole machine storage life test, support application scenarios such as equipment life determination, life extension, health management, and reliability verification, and realize a more refined and comprehensive evaluation of the storage life of complex electromechanical whole machines. This application realizes the accurate determination of the whole machine storage life acceleration factor, and the determined storage life acceleration factor has high credibility and high reliability, thereby effectively improving the accuracy of whole machine storage life test.

[0038] In some embodiments, the lifetime distribution type includes an exponential distribution; For each sensitive component on the entire machine, based on its corresponding lifespan distribution type, a reliability function under reference stress conditions and a reliability function under accelerated stress conditions are constructed, including: In response to the exponential distribution of the lifespan distribution of the sensitive components, the failure rate under reference stress conditions and the stress acceleration factor under accelerated stress conditions for each sensitive component are obtained. For each sensitive component, a reliability function under reference stress conditions is constructed based on the reliability function corresponding to the exponential distribution and the failure rate of the sensitive component. For each sensitive component, a reliability function under accelerated stress conditions is constructed based on the reliability function corresponding to the exponential distribution, the failure rate of the sensitive component, and the stress acceleration factor.

[0039] Specifically, the reliability function corresponding to the exponential distribution for: ; in, For failure rate, For lifespan.

[0040] When the life distribution of a sensitive component is an exponential distribution, the reliability function corresponding to the exponential distribution can be used to determine its reliability function under reference stress conditions and under accelerated stress conditions.

[0041] When sensitive components When the lifetime distribution type is exponential, its reliability function under reference stress conditions is... and its reliability function under accelerated stress conditions This can be expressed by the following formula: ; ; in Sensitive components Failure rate under reference stress conditions, Sensitive components Stress acceleration factor under accelerated stress conditions. The corresponding stress acceleration factor when the accelerated stress is high-temperature stress. That is, sensitive components The high-temperature stress acceleration factor (i.e., the acceleration factor relative to the reference stress under high-temperature stress).

[0042] In some embodiments, the lifetime distribution type includes the Weibull distribution; For each sensitive component on the entire machine, based on its corresponding lifespan distribution type, a reliability function under reference stress conditions and a reliability function under accelerated stress conditions are constructed, including: In response to the Weibull distribution of the lifetime distribution of the sensitive component, the characteristic lifetime, shape parameters and stress acceleration factor under accelerated stress conditions corresponding to each sensitive component are obtained. For each sensitive component, a reliability function under reference stress conditions is constructed based on the reliability function corresponding to the Weibull distribution, the characteristic lifetime and shape parameters of the sensitive component. For each sensitive component, a reliability function under accelerated stress conditions is constructed based on the reliability function corresponding to the Weibull distribution, the characteristic lifetime, shape parameters, and stress acceleration factor of the sensitive component.

[0043] Specifically, the two-parameter Weibull distribution is usually denoted as... W(m, η) ,in η > 0 , for characteristic lifetime, m＞0， The shape parameter. The reliability function corresponding to the Weibull distribution. for: ; in, For lifespan.

[0044] When the life distribution of a sensitive component is a Weibull distribution, the reliability function corresponding to the Weibull distribution can be used to determine its reliability function under reference stress conditions and under accelerated stress conditions.

[0045] When sensitive components When the lifetime distribution type is Weibull distribution, its reliability function under reference stress conditions is... and its reliability function under accelerated stress conditions This can be expressed by the following formula: ; ; in, Sensitive components Characteristic lifetime, Sensitive components Shape parameters, Sensitive components Stress acceleration factor under accelerated stress conditions. The corresponding stress acceleration factor when the accelerated stress is high-temperature stress. That is, sensitive components The high-temperature stress acceleration factor (i.e., the acceleration factor relative to the reference stress under high-temperature stress).

[0046] In some embodiments, the lifetime distribution type includes a log-normal distribution; For each sensitive component on the entire machine, based on its corresponding lifespan distribution type, a reliability function under reference stress conditions and a reliability function under accelerated stress conditions are constructed, including: In response to the fact that the lifetime distribution type of the sensitive component is the log-normal distribution, the logarithmic mean, logarithmic standard deviation, and stress acceleration factor under accelerated stress conditions are obtained for each sensitive component. For each sensitive component, a reliability function under reference stress conditions is constructed based on the reliability function corresponding to the log-normal distribution, the logarithmic mean and standard deviation of the sensitive component. For each sensitive component, a reliability function under accelerated stress conditions is constructed based on the reliability function corresponding to the log-normal distribution, the logarithmic mean, logarithmic standard deviation, and stress acceleration factor corresponding to the sensitive component.

[0047] Specifically, the log-normal distribution has two parameters, denoted as . LN(μ, σ 2) .in μ The logarithmic mean is... σ The standard deviation is the logarithm. When the lifespan... t obey LN(μ, σ 2 ) At that time, the logarithm of its lifespan lnt Also obey LN(μ, σ 2 ) .

[0048] Reliability function corresponding to log-normal distribution for: ; in, The cumulative distribution function (CDF) of the standard normal distribution. .

[0049] When the life distribution of a sensitive component is a log-normal distribution, the reliability function corresponding to the log-normal distribution can be used to determine its reliability function under reference stress conditions and under accelerated stress conditions.

[0050] When sensitive components When the lifetime distribution is a log-normal distribution, its reliability function under the reference stress condition is... and its reliability function under accelerated stress conditions This can be expressed by the following formula: ; ; in, Sensitive components The logarithmic mean, Sensitive components The logarithmic standard deviation, Sensitive components Stress acceleration factor under accelerated stress conditions. The corresponding stress acceleration factor when the accelerated stress is high-temperature stress. That is, sensitive components The high-temperature stress acceleration factor (i.e., the acceleration factor relative to the reference stress under high-temperature stress). Sensitive components. The logarithmic mean, logarithmic standard deviation, characteristic lifetime, shape parameters, and failure rate under reference stress conditions can be obtained by analyzing historical data and experimental data of sensitive components, without any specific limitations.

[0051] In some embodiments, the stress acceleration factor for each sensitive component under accelerated stress conditions is obtained by the following methods: For each sensitive component, the stress acceleration factor under accelerated stress conditions is determined based on its corresponding activation energy.

[0052] Specifically, when the accelerated stress is high-temperature stress, the stress acceleration factor under accelerated stress conditions can be determined based on the Arrhenius model using the activation energy of the sensitive component. The Arrhenius model is an empirical model used to describe the effect of temperature on the aging rate or failure rate of materials, and can be applied to component aging prediction, material thermal aging analysis, and accelerated life test design.

[0053] In the Arrhenius model, the stress acceleration factor It can be calculated using the following formula: ; in, Stress at room temperature The characteristic lifetime below, For high temperature stress The characteristic lifetime below, E a Here, K represents the activation energy of the sensitive component, and K is the Boltzmann constant. The more sensitive the sensitive device or material is to temperature, the higher the activation energy, and the more significant the acceleration effect under high-temperature stress.

[0054] In some embodiments, constructing the reliability function of the entire machine under reference stress conditions based on the reliability functions of all sensitive components on the entire machine under reference stress conditions includes: The reliability function of the whole machine under the reference stress condition is obtained by multiplying the reliability function of each sensitive material under the reference stress condition and the reliability function of each sensitive component under the reference stress condition.

[0055] Specifically, the whole machine X Reliability function under reference stress conditions It can be expressed by the following formula: ; Among them, the complete machine X Sensitive components include p Sensitive devices and q Sensitive materials; k e {1, 2, 3,..., p}, j ∈{1,2,3,…,q} , For the first k The reliability function of a sensitive device under reference stress conditions. For the first j The reliability function of a sensitive material under reference stress conditions. Combining the reliability functions of each sensitive component and each sensitive material under the reference stress, the reliability function of the entire machine X under the reference stress condition can be further refined into the following formula: ; Among them, the number of sensitive devices with an exponential lifetime distribution is [number missing]. A There are , and the Weibull distribution has a total of . B There are a total of [number] log-normal distributions. C indivual, p = A + B + C , a e {1, 2, 3,..., A} , b e {1, 2, 3,..., B} , c e {1, 2, 3,..., C} ; For lifespan, For the first a Failure rate of a sensitive device under reference stress conditions. For the first b The characteristic lifetime of each sensitive device For the first b The shape parameters of a sensitive device For the first c The logarithmic mean of each sensitive device, For the first c The logarithmic standard deviation of each sensitive device.

[0056] There are a total of sensitive materials with an exponential lifetime distribution. D The total number of species in the Weibull distribution G There are a total of [number] log-normal distributions. N indivual, q = D + G + N , d e {1, 2, 3,..., D} , g e {1, 2, 3,..., G} , n e {1, 2, 3,..., N} . For the first d Failure rate of a sensitive material under reference stress conditions For the first g Characteristic lifetime of sensitive materials For the first g The shape parameters of the sensitive device For the first n The logarithmic mean of the sensitive devices, For the first n The logarithmic standard deviation of a type of sensitive device.

[0057] There may be multiple sensitive devices, such as resistors, in the entire device; there may be 20, 30, or more. The lifespan of each sensitive device can affect the overall storage lifespan of the device. Therefore, when calculating the reliability function of the entire device under reference stress conditions, the number of sensitive devices needs to be considered, i.e., the total number of sensitive devices needs to be multiplied together. In this embodiment, the reliability function of the entire device under reference stress conditions is determined by using the reliability functions of each sensitive material and each sensitive device. This enables a holistic and systematic assessment of the overall device lifespan characteristics under reference stress, improving the accuracy and reliability of the overall device lifespan prediction under reference stress, and laying a reliable data foundation for the subsequent calculation of the overall device storage acceleration factor.

[0058] In some embodiments, constructing the reliability function of the entire machine under accelerated stress conditions based on the reliability functions of all sensitive components on the machine under accelerated stress conditions includes: The reliability function of the whole machine under accelerated stress is obtained by multiplying the reliability function of each sensitive material under accelerated stress and the reliability function of each sensitive component under reference stress.

[0059] Complete machine X Reliability function under accelerated stress conditions It can be expressed by the following formula: ; in, For the first k The reliability function of a sensitive device under accelerated stress conditions. For the first j The reliability function of a sensitive material under accelerated stress conditions. Combining the reliability functions of each sensitive device and each sensitive material under accelerated stress conditions, the entire system... X The reliability function under accelerated stress conditions can be further refined into the following formula: ; in, , , The first a , b , c The stress acceleration factor of a sensitive device under accelerated stress conditions. , , The first d , g , n The stress acceleration factor of a sensitive material under accelerated stress conditions.

[0060] In this embodiment, when calculating the reliability function of the whole machine under accelerated stress conditions, the number of sensitive devices is considered. That is, the reliability functions of all sensitive devices under accelerated stress conditions need to be multiplied together, and then multiplied with the reliability function of each sensitive material under accelerated stress conditions. This enables a holistic and systematic evaluation of the whole machine's life characteristics under accelerated stress, improves the accuracy and reliability of the whole machine's life prediction under accelerated stress, and lays a reliable data foundation for the subsequent calculation of the whole machine's storage acceleration factor.

[0061] In some embodiments, determining the storage lifetime acceleration factor of the entire machine based on the reliability function of the entire machine under reference stress conditions and the reliability function under accelerated stress conditions includes: Based on the reliability function of the whole machine under the reference stress condition, the first life value of the whole machine under the reference stress condition is determined; Based on the reliability function of the whole machine under accelerated stress, the second life value of the whole machine under accelerated stress is determined; The ratio of the first lifetime value to the second lifetime value is determined as the storage lifetime acceleration factor of the whole machine.

[0062] Specifically, the storage life acceleration factor of the entire machine can be calculated using the following formula: ; in, This is an acceleration factor for the overall storage life of the machine. This is the first lifespan value. This is the second lifespan value.

[0063] In this embodiment, a first lifetime value is determined based on the reliability function of the whole machine under reference stress conditions, and a second lifetime value is determined based on the reliability function of the whole machine under accelerated stress conditions. The ratio of the first lifetime value to the second lifetime value is used as the storage lifetime acceleration factor of the whole machine. By using the storage lifetime acceleration factor of the whole machine, the lifetime performance of the whole machine under actual storage conditions can be accurately estimated from the measurable accelerated lifetime. This effectively solves the problem that it is difficult to directly test the real lifetime of long-cycle systems, making the evaluation of the storage lifetime of the whole machine more efficient and reliable.

[0064] In some embodiments, determining the first life value of the entire machine under reference stress based on the reliability function of the entire machine under reference stress includes: When the calculated result of the reliability function of the whole machine under the reference stress condition is determined as the target reliability, the corresponding lifetime value is the first lifetime value.

[0065] Specifically, the target reliability is 0.368. When the reliability calculated using the reliability function of the entire machine under reference stress conditions is 0.368, the corresponding lifespan is the first lifespan value. That is, let... At that time, the calculated t The value is the first lifespan value.

[0066] In some embodiments, determining the second lifetime value of the entire machine under accelerated stress based on the reliability function of the entire machine under accelerated stress includes: When the calculated result of the reliability function of the whole machine under accelerated stress conditions is determined as the target reliability, the corresponding lifetime value is the second lifetime value.

[0067] Specifically, when the reliability calculated using the reliability function of the entire machine under accelerated stress conditions is 0.368, the corresponding lifespan is the second lifespan value. That is, let... At that time, the calculated t The value is the second lifespan value.

[0068] The formula for calculating the storage life acceleration factor of the entire machine can be further refined into the following formula: ; That is, when the reliability r = 0.368, find the inverse function of the reliability function of the whole machine under the reference stress condition. and the inverse function of the reliability function under accelerated stress conditions. You can then obtain the corresponding first lifespan value. and second life value .

[0069] In this embodiment, by separately calculating the lifespan values ​​(i.e., the first lifespan value and the second lifespan value) of the whole machine under the reference stress and accelerated stress conditions and the same target reliability (r=0.368), and based on the ratio of the two, the storage life acceleration factor of the whole machine is obtained, so that the accelerated test lifespan can be accurately converted into the real lifespan under the reference stress, thereby improving the accuracy and verifiability of the storage life estimation of the whole machine.

[0070] The technical effects of this application will be further illustrated below with reference to a specific embodiment.

[0071] Given the characteristics of long-term equipment storage, products are generally stored in air-conditioned rooms with temperature and humidity control measures, providing a good constant temperature and humidity storage environment. Temperature usually has the greatest impact on storage. Therefore, taking high-temperature stress as an example of accelerated stress, we will calculate the storage life acceleration factor of a certain complete product.

[0072] An analysis of a certain complete product identified its sensitive components, as shown in the table below: Table 1. List of Sensitive Components of a Certain Complete Product

[0073] Based on the accelerated test results of various sensitive devices and materials and the previously accumulated test data, the lifetime distribution type, detailed parameters and activation energy of each sensitive device and material are obtained, as shown in the table below.

[0074] Table 2. List of Sensitive Component Parameters for a Certain Complete Product

[0075] The accelerated stress was set at a high-temperature stress of 80°C, and the baseline stress was set at 21°C. Substituting these parameters into the reliability functions of the entire device under both baseline and accelerated stress conditions, the storage life acceleration factor for a specific product was calculated to be 17.32. Further storage life qualification tests were conducted using a high-temperature stress of 80°C. Combining the life characteristics under this stress with the storage life acceleration factor of 17.32, the storage life could be accurately assessed. Calculating the storage life acceleration factor for a specific device significantly shortens the testing time and allows for direct estimation of the device's storage life. By comprehensively considering the impact of various stress-sensitive electronic components and materials on the device's storage, the obtained acceleration factor is closer to the actual situation, effectively improving the credibility and reliability of the storage life qualification test.

[0076] It should be noted that the method in this embodiment can be executed by a single device, such as a computer or server. The method can also be applied in a distributed scenario, where multiple devices cooperate to complete the task. In such a distributed scenario, one of these devices may execute only one or more steps of the method in this embodiment, and the multiple devices will interact with each other to complete the method described.

[0077] It should be noted that the above description describes some embodiments of this application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in a different order than that shown in the above embodiments and still achieve the desired result. Furthermore, the processes depicted in the drawings do not necessarily require a specific or sequential order to achieve the desired result. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0078] Based on the same inventive concept, and corresponding to any of the above embodiments, this application also provides a device for calculating the acceleration factor of the overall storage life.

[0079] refer to Figure 2 The device includes: Sensitive component calculation module 201 is used to construct, for each sensitive component on the whole machine, its reliability function under reference stress conditions and its reliability function under accelerated stress conditions according to its corresponding lifetime distribution type, wherein the sensitive component includes sensitive devices and sensitive materials; The first whole-machine calculation module 202 is used to construct the whole-machine reliability function under the reference stress condition based on the reliability function of all sensitive components on the whole machine under the reference stress condition; The second whole-machine calculation module 203 is used to construct the whole-machine reliability function under accelerated stress conditions based on the reliability functions of all sensitive components on the whole machine under accelerated stress conditions; The acceleration factor calculation module 204 is used to determine the storage life acceleration factor of the whole machine based on the reliability function of the whole machine under the reference stress condition and the reliability function under the accelerated stress condition.

[0080] In some embodiments, the lifetime distribution type includes an exponential distribution; the sensitive component calculation module 201 is further configured to: In response to the exponential distribution of the lifespan distribution of the sensitive components, the failure rate under reference stress conditions and the stress acceleration factor under accelerated stress conditions for each sensitive component are obtained. For each sensitive component, a reliability function under reference stress conditions is constructed based on the reliability function corresponding to the exponential distribution and the failure rate of the sensitive component. For each sensitive component, a reliability function under accelerated stress conditions is constructed based on the reliability function corresponding to the exponential distribution, the failure rate of the sensitive component, and the stress acceleration factor.

[0081] In some embodiments, the lifetime distribution type includes a Weibull distribution; the sensitive component calculation module 201 is further configured to: In response to the Weibull distribution of the lifetime distribution of the sensitive component, the characteristic lifetime, shape parameters and stress acceleration factor under accelerated stress conditions corresponding to each sensitive component are obtained. For each sensitive component, a reliability function under reference stress conditions is constructed based on the reliability function corresponding to the Weibull distribution, the characteristic lifetime and shape parameters of the sensitive component. For each sensitive component, a reliability function under accelerated stress conditions is constructed based on the reliability function corresponding to the Weibull distribution, the characteristic lifetime, shape parameters, and stress acceleration factor of the sensitive component.

[0082] In some embodiments, the lifetime distribution type includes a log-normal distribution; the sensitive component calculation module 201 is further configured to: In response to the fact that the lifetime distribution type of the sensitive component is the log-normal distribution, the logarithmic mean, logarithmic standard deviation, and stress acceleration factor under accelerated stress conditions are obtained for each sensitive component. For each sensitive component, a reliability function under reference stress conditions is constructed based on the reliability function corresponding to the log-normal distribution, the logarithmic mean and standard deviation of the sensitive component. For each sensitive component, a reliability function under accelerated stress conditions is constructed based on the reliability function corresponding to the log-normal distribution, the logarithmic mean, logarithmic standard deviation, and stress acceleration factor corresponding to the sensitive component.

[0083] In some embodiments, the stress acceleration factor for each sensitive component under accelerated stress conditions is obtained by the following methods: For each sensitive component, the stress acceleration factor under accelerated stress conditions is determined based on its corresponding activation energy.

[0084] In some embodiments, the first overall computing module 202 is further configured to: The reliability function of the whole machine under the reference stress condition is obtained by multiplying the reliability function of each sensitive material under the reference stress condition and the reliability function of each sensitive component under the reference stress condition.

[0085] In some embodiments, the second overall computing module 203 is further configured to: The reliability function of the whole machine under accelerated stress is obtained by multiplying the reliability function of each sensitive material under accelerated stress and the reliability function of each sensitive component under reference stress.

[0086] In some embodiments, the acceleration factor calculation module 204 is further configured to: Based on the reliability function of the whole machine under the reference stress condition, the first life value of the whole machine under the reference stress condition is determined; Based on the reliability function of the whole machine under accelerated stress, the second life value of the whole machine under accelerated stress is determined; The ratio of the first lifetime value to the second lifetime value is determined as the storage lifetime acceleration factor of the whole machine.

[0087] In some embodiments, the acceleration factor calculation module 204 is further configured to: When the calculated result of the reliability function of the whole machine under the reference stress condition is determined as the target reliability, the corresponding lifetime value is the first lifetime value.

[0088] In some embodiments, the acceleration factor calculation module 204 is further configured to: When the calculated result of the reliability function of the whole machine under accelerated stress conditions is determined as the target reliability, the corresponding lifetime value is the second lifetime value.

[0089] For ease of description, the above devices are described in terms of function, divided into various modules. Of course, in implementing this application, the functions of each module can be implemented in one or more software and / or hardware.

[0090] The apparatus of the above embodiments is used to implement a corresponding method for calculating the overall storage life acceleration factor in any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiments, which will not be repeated here.

[0091] Based on the same inventive concept, corresponding to the methods of any of the above embodiments, this application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, it implements the whole machine storage lifetime acceleration factor calculation method described in any of the above embodiments.

[0092] Figure 3 This embodiment illustrates a more specific hardware structure of an electronic device. The device may include a processor 1010, a memory 1020, an input / output interface 1030, a communication interface 1040, and a bus 1050. The processor 1010, memory 1020, input / output interface 1030, and communication interface 1040 are interconnected internally via the bus 1050.

[0093] The processor 1010 can be implemented using a general-purpose CPU (Central Processing Unit), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this specification.

[0094] The memory 1020 can be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory), static storage device, dynamic storage device, etc. The memory 1020 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program code is stored in the memory 1020 and is called and executed by the processor 1010.

[0095] The input / output interface 1030 is used to connect input / output modules to realize information input and output. Input / output modules can be configured as components within the device (not shown in the figure) or externally connected to the device to provide corresponding functions. Input devices may include keyboards, mice, touchscreens, microphones, various sensors, etc., while output devices may include displays, speakers, vibrators, indicator lights, etc.

[0096] The communication interface 1040 is used to connect a communication module (not shown in the figure) to enable communication between this device and other devices. The communication module can communicate via wired means (such as USB, Ethernet cable, etc.) or wireless means (such as mobile network, WIFI, Bluetooth, etc.).

[0097] Bus 1050 includes a pathway for transmitting information between various components of the device, such as processor 1010, memory 1020, input / output interface 1030, and communication interface 1040.

[0098] It should be noted that although the above-described device only shows the processor 1010, memory 1020, input / output interface 1030, communication interface 1040, and bus 1050, in specific implementations, the device may also include other components necessary for normal operation. Furthermore, those skilled in the art will understand that the above-described device may only include the components necessary for implementing the embodiments of this specification, and not necessarily all the components shown in the figures.

[0099] The electronic device described above is used to implement a corresponding method for calculating the overall storage life acceleration factor in any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiments, which will not be repeated here.

[0100] Based on the same inventive concept, corresponding to the methods of any of the above embodiments, this application also provides a non-transitory computer-readable storage medium storing computer instructions for causing the computer to execute a method for calculating the overall storage lifetime acceleration factor as described in any of the above embodiments.

[0101] The computer-readable medium of this embodiment includes permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. Information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transfer medium that can be used to store information accessible by a computing device.

[0102] The computer instructions stored in the storage medium of the above embodiments are used to cause the computer to execute a method for calculating the overall storage lifetime acceleration factor as described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.

[0103] Based on the same concept, corresponding to any of the above embodiments, this application also provides a computer program product, including computer program instructions, which, when run on a computer, cause the computer to perform the method described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.

[0104] It is understood that before using the technical solutions of the various embodiments in this disclosure, users will be informed of the type, scope of use, and usage scenarios of the personal information involved in an appropriate manner, and user authorization will be obtained.

[0105] For example, upon receiving a user's active request, a prompt message is sent to the user to explicitly inform them that the requested operation will require the acquisition and use of the user's personal information. This allows the user to independently choose, based on the prompt message, whether to provide personal information to the software or hardware such as electronic devices, applications, servers, or storage media performing the operations of this disclosed technical solution.

[0106] As an optional but not limited implementation, in response to a user's active request, sending a prompt message to the user can be done via a pop-up window, where the prompt message can be presented in text format. Furthermore, the pop-up window can also include a selection control allowing the user to choose "agree" or "disagree" to provide personal information to the electronic device.

[0107] It is understood that the above notification and user authorization process are merely illustrative and do not constitute a limitation on the implementation of this disclosure. Other methods that comply with relevant laws and regulations may also be applied to the implementation of this disclosure.

[0108] Those skilled in the art should understand that the discussion of any of the above embodiments is merely exemplary and is not intended to imply that the scope of this application is limited to these examples; under the concept of this application, the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations of different aspects of the embodiments of this application as described above, which are not provided in detail for the sake of brevity.

[0109] Additionally, to simplify the description and discussion, and to avoid obscuring the embodiments of this application, the well-known power / ground connections to integrated circuit (IC) chips and other components may or may not be shown in the provided drawings. Furthermore, the apparatus may be shown in block diagram form to avoid obscuring the embodiments of this application, and this also takes into account the fact that the details of the implementation of these block diagram apparatuses are highly dependent on the platform on which the embodiments of this application will be implemented (i.e., these details should be fully understood by those skilled in the art). While specific details (e.g., circuits) have been set forth to describe exemplary embodiments of this application, it will be apparent to those skilled in the art that the embodiments of this application can be implemented without these specific details or with variations thereof. Therefore, these descriptions should be considered illustrative rather than restrictive.

[0110] Although this application has been described in conjunction with specific embodiments thereof, many substitutions, modifications, and variations of these embodiments will be apparent to those skilled in the art from the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may be used with the embodiments discussed.

[0111] The embodiments of this application are intended to cover all such substitutions, modifications, and variations that fall within the broad scope of the claims of this application. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the embodiments of this application should be included within the protection scope of this application.

Claims

1. A method for calculating the acceleration factor of overall machine storage life, characterized in that, include: For each sensitive component on the whole machine, based on its corresponding lifetime distribution type, its reliability function under reference stress conditions and its reliability function under accelerated stress conditions are constructed, wherein the sensitive component includes sensitive devices and sensitive materials; Based on the reliability functions of all sensitive components on the whole machine under the reference stress condition, the reliability function of the whole machine under the reference stress condition is constructed. Based on the reliability functions of all sensitive components on the machine under accelerated stress conditions, the reliability function of the whole machine under accelerated stress conditions is constructed. Based on the reliability function of the whole machine under reference stress conditions and the reliability function under accelerated stress conditions, the storage life acceleration factor of the whole machine is determined.

2. The method for calculating the acceleration factor of the overall storage life according to claim 1, characterized in that, The lifetime distribution type includes the exponential distribution; For each sensitive component on the entire machine, based on its corresponding lifespan distribution type, a reliability function under reference stress conditions and a reliability function under accelerated stress conditions are constructed, including: In response to the exponential distribution of the lifespan distribution of the sensitive components, the failure rate under reference stress conditions and the stress acceleration factor under accelerated stress conditions for each sensitive component are obtained. For each sensitive component, a reliability function under reference stress conditions is constructed based on the reliability function corresponding to the exponential distribution and the failure rate of the sensitive component. For each sensitive component, a reliability function under accelerated stress conditions is constructed based on the reliability function corresponding to the exponential distribution, the failure rate of the sensitive component, and the stress acceleration factor.

3. The method for calculating the acceleration factor of the overall storage life according to claim 1, characterized in that, The lifetime distribution type includes the Weibull distribution; For each sensitive component on the entire machine, based on its corresponding lifespan distribution type, a reliability function under reference stress conditions and a reliability function under accelerated stress conditions are constructed, including: In response to the Weibull distribution of the lifetime distribution of the sensitive component, the characteristic lifetime, shape parameters and stress acceleration factor under accelerated stress conditions corresponding to each sensitive component are obtained. For each sensitive component, a reliability function under reference stress conditions is constructed based on the reliability function corresponding to the Weibull distribution, the characteristic lifetime and shape parameters of the sensitive component. For each sensitive component, a reliability function under accelerated stress conditions is constructed based on the reliability function corresponding to the Weibull distribution, the characteristic lifetime, shape parameters, and stress acceleration factor of the sensitive component.

4. The method for calculating the acceleration factor of the overall storage life according to claim 1, characterized in that, The lifetime distribution type includes a log-normal distribution; For each sensitive component on the entire machine, based on its corresponding lifespan distribution type, a reliability function under reference stress conditions and a reliability function under accelerated stress conditions are constructed, including: In response to the fact that the lifetime distribution type of the sensitive component is the log-normal distribution, the logarithmic mean, logarithmic standard deviation, and stress acceleration factor under accelerated stress conditions are obtained for each sensitive component. For each sensitive component, a reliability function under reference stress conditions is constructed based on the reliability function corresponding to the log-normal distribution, the logarithmic mean and standard deviation of the sensitive component. For each sensitive component, a reliability function under accelerated stress conditions is constructed based on the reliability function corresponding to the log-normal distribution, the logarithmic mean, logarithmic standard deviation, and stress acceleration factor corresponding to the sensitive component.

5. The method for calculating the acceleration factor of the overall storage life according to any one of claims 2 to 4, characterized in that, The stress acceleration factor for each sensitive component under accelerated stress conditions is obtained through the following methods: For each sensitive component, the stress acceleration factor under accelerated stress conditions is determined based on its corresponding activation energy.

6. The method for calculating the acceleration factor of the overall storage life according to claim 1, characterized in that, The reliability function of the entire machine under reference stress conditions is constructed based on the reliability functions of all sensitive components on the machine under reference stress conditions, including: The reliability function of the whole machine under the reference stress condition is obtained by multiplying the reliability function of each sensitive material under the reference stress condition and the reliability function of each sensitive component under the reference stress condition.

7. The method for calculating the acceleration factor of the overall storage life according to claim 1, characterized in that, The reliability function of the entire machine under accelerated stress conditions is constructed based on the reliability functions of all sensitive components on the machine under accelerated stress conditions, including: The reliability function of the whole machine under accelerated stress is obtained by multiplying the reliability function of each sensitive material under accelerated stress and the reliability function of each sensitive component under reference stress.

8. The method for calculating the acceleration factor of the overall storage life according to claim 1, characterized in that, The determination of the storage life acceleration factor of the entire machine based on the reliability function of the entire machine under reference stress conditions and the reliability function under accelerated stress conditions includes: Based on the reliability function of the whole machine under the reference stress condition, the first life value of the whole machine under the reference stress condition is determined; Based on the reliability function of the whole machine under accelerated stress, the second life value of the whole machine under accelerated stress is determined; The ratio of the first lifetime value to the second lifetime value is determined as the storage lifetime acceleration factor of the whole machine.

9. The method for calculating the acceleration factor of the overall storage life according to claim 8, characterized in that, The determination of the first life value of the entire machine under the reference stress condition based on the reliability function of the entire machine under the reference stress condition includes: When the calculated result of the reliability function of the whole machine under the reference stress condition is determined as the target reliability, the corresponding lifetime value is the first lifetime value.

10. The method for calculating the acceleration factor of the overall storage life according to claim 8, characterized in that, The determination of the second life value of the entire machine under accelerated stress based on the reliability function of the entire machine under accelerated stress includes: When the calculated result of the reliability function of the whole machine under accelerated stress conditions is determined as the target reliability, the corresponding lifetime value is the second lifetime value.

11. A device for calculating the acceleration factor of overall machine storage life, characterized in that, include: The sensitive component calculation module is used to construct the reliability function under the reference stress condition and the reliability function under the accelerated stress condition for each sensitive component on the whole machine, based on its corresponding lifetime distribution type. The sensitive components include sensitive devices and sensitive materials. The first whole-machine calculation module is used to construct the whole-machine reliability function under the reference stress condition based on the reliability function of each sensitive component on the whole machine under the reference stress condition; The second whole-machine calculation module is used to construct the whole-machine reliability function under accelerated stress conditions based on the reliability function of each sensitive component on the whole machine under accelerated stress conditions; The acceleration factor calculation module is used to determine the storage lifetime acceleration factor of the entire machine based on the reliability function of the entire machine under reference stress conditions and the reliability function under accelerated stress conditions.

12. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that, When the processor executes the program, it implements the whole machine storage lifetime acceleration factor calculation method as described in any one of claims 1 to 10.

13. A non-transitory computer-readable storage medium storing computer instructions, characterized in that, The computer instructions are used to cause the computer to execute the whole machine storage life acceleration factor calculation method according to any one of claims 1 to 10.

14. A computer program product comprising computer program instructions, characterized in that, When the computer program instructions are executed on the computer, the computer performs the whole machine storage lifetime acceleration factor calculation method as described in any one of claims 1 to 10.

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