A diode surge current test method, system, device and storage medium

Abstract

This invention relates to the field of surge testing technology, and more particularly to a diode surge current testing method, system, device, and storage medium. The method involves acquiring the rated AC voltage of the circuit under test and controlling the AC power supply connection; using differential and voltage probes to acquire the bus capacitor voltage and relay control voltage, and then disconnecting the power after determining the lowest instantaneous voltage; calculating the target test range based on the lowest instantaneous voltage and a preset test gradient; controlling the AC power supply to reconnect based on a preset test scenario, and disconnecting the power when the bus capacitor voltage reaches the rated voltage; when the bus capacitor voltage drops to the target test range, controlling the AC power supply connection, and simultaneously acquiring the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform at the moment of power-on using current, voltage, and differential probes; and generating test results based on the acquired waveforms. This method can simulate actual harsh operating conditions and trigger tests, improving the accuracy and repeatability of surge testing.

Description

Technical Field

[0001] This invention relates to the field of surge testing technology, and in particular to a diode surge current testing method, system, device, and storage medium. Background Technology

[0002] In switching power supplies, especially those with BOOST-PFC (Power Factor Correction) circuitry, the large-capacity electrolytic capacitor on the DC side is rapidly charged upon AC power-on, generating an extremely high inrush current. This current primarily flows through the rectifier bridge, the PFC inductor, and the boost diode (typically an SBD Schottky diode). To suppress this current, conventional circuits connect a negative temperature coefficient thermistor in series on the input side, or employ a relay bypass scheme.

[0003] Currently, assessments of SBD surge current capability are mostly limited to theoretical calculations or simple power-on tests, failing to effectively simulate the most severe operating conditions in real-world applications. The most severe surge currents typically occur during repeated power-on failures and when the PTC thermistor is bypassed by a relay. Existing testing methods lack a controllable and repeatable mechanism to accurately trigger this specific state, leading to biased test results that fail to accurately reflect the reliability of SBDs under extreme conditions, thus creating potential quality risks for the product.

[0004] It is evident that existing technologies still need improvement and enhancement. Summary of the Invention

[0005] In order to overcome the shortcomings of the prior art, the present invention aims to provide a diode surge current testing method, system, device and storage medium, which pre-obtains the lowest instantaneous voltage of the bus capacitor and triggers the power-on action based on the lowest instantaneous voltage to repeatedly stimulate the maximum surge current, so as to make the test results more accurate.

[0006] The first aspect of this invention provides a diode surge current testing method, applied to a diode surge current testing system. The diode surge current testing system includes: an AC power supply electrically connected to a control device, a circuit under test (DUT), a current probe, a voltage probe, and a differential probe. The diode surge current testing method includes: acquiring the rated AC voltage of the DUT, and connecting the AC power supply to the DUT based on the rated AC voltage; during the power-on process of the DUT, acquiring the bus capacitor voltage and relay control voltage of the DUT through the differential probe and voltage probe, and determining the minimum instantaneous voltage of the DUT based on the bus capacitor voltage and relay control voltage. The system controls the AC power supply to be cut off when the voltage reaches the minimum instantaneous voltage and the preset test gradient. The target test range is calculated based on the minimum instantaneous voltage and the preset test gradient. The AC power supply is connected to the circuit under test based on the preset test scenario. When the bus capacitor voltage reaches the preset rated voltage, the AC power supply is cut off. When the bus capacitor voltage drops to the target test range, the AC power supply is connected to the circuit under test. The surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform of the circuit under test at the moment of power-on are collected by the current probe, voltage probe, and differential probe, respectively. The test results are generated based on the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform.

[0007] Optionally, in a first implementation of the first aspect of the present invention, determining the minimum instantaneous voltage of the circuit under test based on the bus capacitor voltage and the relay control voltage includes: when the relay control voltage undergoes a level transition, obtaining the voltage of the bus capacitor at the moment of the transition as the minimum instantaneous voltage of the circuit under test.

[0008] Optionally, in a second implementation of the first aspect of the present invention, the step of calculating the target test range based on the lowest instantaneous voltage and a preset test gradient includes: setting the lowest instantaneous voltage as an upper limit threshold, and determining a lower limit threshold based on the upper limit threshold and the preset test gradient; and generating the target test range based on the upper limit threshold and the lower limit threshold.

[0009] Optionally, in a third implementation of the first aspect of the present invention, the step of controlling the AC power supply to the circuit under test based on a preset test scenario includes: the preset test scenario includes an ambient temperature threshold and a heat preservation time threshold; the ambient temperature of the circuit under test is obtained; when the ambient temperature reaches the ambient temperature threshold, the circuit under test is kept at the current ambient temperature until the heat preservation time reaches the heat preservation time threshold, and then the AC power supply is controlled to be connected to the circuit under test.

[0010] Optionally, in the fourth implementation of the first aspect of the present invention, when the bus capacitor voltage drops to the target test range, the AC power supply is controlled to be connected to the circuit under test, and the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform of the circuit under test at the time of power-on are collected by the current probe, voltage probe, and differential probe, respectively. This includes: generating multiple continuous acquisition stages according to the target test range; when the bus capacitor voltage drops to any acquisition stage, the AC power supply is triggered to power on the circuit under test, and the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform of the circuit under test at the time of power-on are collected by the current probe, voltage probe, and differential probe, respectively, until all acquisition stages have completed the power-on action.

[0011] Optionally, in a fifth implementation of the first aspect of the present invention, the step of generating test results based on surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform includes: acquiring surge current change waveforms, bus capacitor voltage change waveforms, and relay control voltage change waveforms for all acquisition stages; extracting surge current peak values ​​from the surge current change waveforms for each acquisition stage; generating a relationship curve based on the bus capacitor voltage and the corresponding surge current peak value for each acquisition stage; and generating test results based on the bus capacitor voltage change waveforms, the relay control voltage waveforms, and the relationship curves for each acquisition stage.

[0012] Optionally, in the sixth implementation of the first aspect of the present invention, after controlling the AC power supply to be connected to the circuit under test when the bus capacitor voltage drops to the target test range, and acquiring the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform of the circuit under test at the moment of power-on through a current probe, a voltage probe, and a differential probe, and generating test results based on the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform, the method further includes: at each acquisition stage, when the AC power supply is connected to the circuit under test, acquiring the forward voltage drop value of the diode of the circuit under test, and comparing the forward voltage drop value of the diode with a preset reference voltage drop value to obtain the diode performance results at each acquisition stage.

[0013] A second aspect of the present invention provides a diode surge current testing system, comprising: an AC power supply electrically connected to a control device, a circuit under test, a current probe, a voltage probe, and a differential probe, wherein the circuit under test is electrically connected to the AC power supply, the current probe, the voltage probe, and the differential probe, respectively.

[0014] A third aspect of the present invention provides a diode surge current testing device, the diode surge current testing device comprising: a memory and at least one processor, the memory storing instructions; the at least one processor calling the instructions in the memory to cause the diode surge current testing device to perform the various steps of the diode surge current testing method described in any of the preceding claims.

[0015] A fourth aspect of the present invention provides a computer-readable storage medium storing instructions that, when executed by a processor, implement the steps of the diode surge current testing method described in any of the preceding claims.

[0016] The technical solution of this invention enables automatic and precise control, allowing repeated power-on operations on the circuit under test under the most severe operating conditions, and systematically collecting surge data at different starting voltage points. This method improves the automation and repeatability of the test, making the assessment of surge current stress more comprehensive and accurate, and helping to reveal the potential failure risks of diodes in practical applications. Attached Figure Description

[0017] Figure 1 A flowchart of a diode surge current testing method provided in an embodiment of the present invention; Figure 2 This is a schematic diagram of the diode surge current testing system provided in an embodiment of the present invention; Figure 3 This is a schematic diagram of the structure of the diode surge current testing device provided in an embodiment of the present invention. Detailed Implementation

[0018] This invention provides a method, system, device, and storage medium for diode surge current testing. This invention enables automatic and precise control of repeated power-on operations on the circuit under test under the most severe operating conditions, and systematically collects surge data at different starting voltage points. This method improves the automation and repeatability of the test, making the assessment of surge current stress more comprehensive and accurate, and helping to reveal potential failure hazards of diodes in practical applications.

[0019] The terms "first," "second," "third," "fourth," etc. (if present) in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" or "having" and any variations thereof are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0020] For ease of understanding, the specific process of the embodiments of the present invention is described below. Please refer to [link / reference]. Figure 1 One embodiment of the diode surge current testing method in this invention includes: A diode surge current testing method is applied to a diode surge current testing system, which includes: an AC power supply electrically connected to a control device, a circuit under test (DUT), a current probe, a voltage probe, and a differential probe. The DUT is electrically connected to the AC power supply, the current probe, the voltage probe, and the differential probe, respectively. The DUT is a switching power supply module with a BOOST-PFC topology, a bus electrolytic capacitor connected to its DC side, and a relay bypass circuit for suppressing power-on surges. The current probe measures the current flowing through the diode under test (e.g., a boost SBD Schottky diode), the voltage probe measures the bus capacitor voltage, and the differential probe measures the voltage signal at the relay control terminal.

[0021] The diode surge current testing method includes: 101. Obtain the rated AC voltage of the circuit under test, and connect the AC power supply to the circuit under test according to the rated AC voltage; 102. During the power-on process of the circuit under test, the bus capacitor voltage and relay control voltage of the circuit under test are obtained through differential probe and voltage probe. The minimum instantaneous voltage of the circuit under test is determined based on the bus capacitor voltage and relay control voltage, and the AC power supply is controlled to be cut off. In this embodiment, the electrical state of the circuit under test is dynamically captured at the moment the relay bypass operation occurs during the initial power-up process. By synchronously monitoring the relay control voltage (reflecting the relay drive signal) and the bus capacitor voltage, the bus capacitor voltage value is recorded at the instant when the relay control voltage level changes (usually indicating that the relay coil is energized and the contacts are about to close to bypass the thermistor), and this value is defined as the lowest instantaneous voltage. This method automatically identifies and locks the critical operating point that may generate the maximum inrush current in actual circuit operation. Because at the moment of relay bypass, the current-limiting component (such as the NTC) will be short-circuited, and if the bus capacitor voltage is low at this time, a huge voltage difference will be formed upon re-energization, causing the inrush current to increase sharply. This provides a data basis for constructing the trigger threshold for subsequent repeatable tests, replacing the inaccuracies that may arise from manual estimation or simply fixing thresholds.

[0022] 103. The target test range is calculated based on the lowest instantaneous voltage and the preset test gradient; In this embodiment, considering that in practical applications, the residual voltage of the bus capacitor may fluctuate within a certain range when an abnormal power-on occurs, testing only a single voltage point may not fully cover the risks. By setting a target test range and performing gradient testing, the surge withstand capability of the diode under different levels of adverse conditions (i.e., different initial bus voltages) can be systematically scanned, making the evaluation conclusions more comprehensive and robust, and helping to discover the boundaries of device performance.

[0023] 104. Based on a preset test scenario, control the AC power supply to be connected to the circuit under test. When the bus capacitor voltage reaches the preset rated voltage, control the AC power supply to be cut off. 105. When the bus capacitor voltage drops to the target test range, the AC power supply is connected to the circuit under test, and the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform of the circuit under test at the moment of power-on are collected by the current probe, voltage probe, and differential probe, respectively. The test results are generated based on the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform.

[0024] In this embodiment, under a preset test scenario (such as a specific temperature), the AC power supply is first powered on to charge the bus capacitor to a preset rated voltage, simulating the steady state of normal operation. Then, the power is cut off, allowing the bus capacitor to discharge naturally through the load. The bus capacitor voltage during the discharge process is monitored in real time. When it falls within the target test range, the AC power supply is immediately powered on. Simultaneously, multiple probes are used to synchronously capture the transient waveforms of the surge current, bus capacitor voltage, and relay control voltage at the moment of power-on. This reproduces the harsh operating conditions of the circuit under test in actual operation, solving the problem of traditional methods failing to reliably trigger this state. Secondly, the simultaneous acquisition of multiple waveform data makes it possible to analyze the circuit state at the time of surge current generation (such as the initial capacitor voltage and relay action sequence), facilitating in-depth failure mechanism analysis. Finally, test results are generated based on these waveform data (such as extracting the surge current peak and plotting its relationship curve with the initial bus voltage), transforming the test data into intuitive and quantitative performance charts, providing a direct basis for evaluating the diode's surge current tolerance and its dependence on the operating voltage.

[0025] In this embodiment of the invention, the present application can automatically and accurately control the repeated power-on of the circuit under test under the worst operating conditions (i.e., when the relay is bypassed and the bus capacitor voltage is low), and systematically collect surge data at different starting voltage points. This method improves the automation and repeatability of the test, making the assessment of surge current stress more comprehensive and accurate, and helps to reveal the potential failure risk of diodes in practical applications.

[0026] In the second embodiment of the diode surge current testing method of the present invention, step S102 includes: 201. When the relay control voltage experiences a level jump, the voltage of the bus capacitor at that jump moment is obtained as the lowest instantaneous voltage of the circuit under test.

[0027] In this embodiment, when a level transition is detected in the relay control voltage (e.g., from low to high, indicating that the relay is driven and about to bypass the current-limiting element), the instantaneous value of the bus capacitor voltage at this moment is immediately captured and recorded. This instantaneous voltage value reflects the voltage maintained on the bus capacitor at the critical moment when the relay bypass operation is about to occur, and this voltage is defined as the lowest instantaneous voltage of this test. After acquiring this voltage value, the control device disconnects the AC power supply, causing the circuit under test to stop working.

[0028] In the third embodiment of the diode surge current testing method of the present invention, step S103 includes: 301. Set the lowest instantaneous voltage as the upper limit threshold, and determine the lower limit threshold based on the upper limit threshold and the preset test gradient; 302. Generate the target test range based on the upper and lower threshold values.

[0029] In this embodiment, a target test voltage range is calculated based on the acquired lowest instantaneous voltage and a preset test gradient (e.g., the test voltage decreases by 5V or a fixed percentage each time). To ensure more comprehensive test condition coverage, the lowest instantaneous voltage is set as the upper limit threshold of the target test range. Then, the lower limit threshold is calculated step by step by subtracting the preset test gradient from the upper limit threshold, thereby generating a continuous voltage interval from the upper limit threshold to the lower limit threshold, i.e., the target test range.

[0030] In the fourth embodiment of the diode surge current testing method of the present invention, step S104 includes: The preset test scenario includes an ambient temperature threshold and a heat preservation time threshold; 401. Obtain the ambient temperature of the circuit under test. When the ambient temperature reaches the ambient temperature threshold, keep the circuit under test at the current ambient temperature until the holding time reaches the holding time threshold, then control the AC power supply to be connected to the circuit under test.

[0031] In this embodiment, before entering the formal repeated power-on test phase, to simulate different environmental conditions that may exist in actual applications, the test can be based on a preset test scenario. The preset test scenario includes an ambient temperature threshold and a heat preservation time threshold. The control device acquires the ambient temperature of the circuit under test. When the ambient temperature reaches the set ambient temperature threshold (e.g., 85°C high temperature or -10°C low temperature), the control device keeps the circuit under test at that temperature for a period of time until the heat preservation time reaches the preset heat preservation time threshold (e.g., 20 minutes) to ensure that the temperature of the internal components of the circuit under test, especially the diode and the bus capacitor, stabilizes. Afterward, the control device controls the AC power supply to be reconnected to the circuit under test.

[0032] In the fifth embodiment of the diode surge current testing method of the present invention, step S105 includes: 501. Generate multiple consecutive acquisition phases based on the target test range; 502. When the bus capacitor voltage drops to any acquisition stage, the AC power supply is triggered to power on the circuit under test. The surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform of the circuit under test at the moment of power-on are collected by the current probe, voltage probe, and differential probe, respectively, until the power-on action is completed in all acquisition stages.

[0033] In this embodiment, after the AC power supply is powered on, the bus capacitor voltage of the circuit under test begins to rise. When the bus capacitor voltage reaches its preset rated operating voltage (e.g., 400VDC), the control device immediately controls the AC power supply to be powered off. After power-off, the bus capacitor discharges through the load in the circuit under test, and its voltage begins to drop. The control device continuously monitors this drop in bus capacitor voltage. To make the distribution and triggering of test points more precise, the target test range is divided into multiple continuous, equally spaced, or unequally spaced acquisition stages. When the bus capacitor voltage is detected to drop to any preset acquisition stage voltage value (for example, if the target range is 300V to 200V, with each stage being 20V, then triggering is done when the voltage drops to 300V, 280V, 260V, etc.), the control device immediately triggers a power-on action, controlling the AC power supply to be instantly connected to the circuit under test.

[0034] At each triggered power-on moment, the current probe, voltage probe, and differential probe operate synchronously, respectively acquiring the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform in the circuit under test. This process is repeated in a loop of "power off - voltage drop - reaching the trigger point - power on - acquisition" until all preset acquisition stages have been completed for one power-on test.

[0035] In the sixth embodiment of the diode surge current testing method of the present invention, step S105 includes: 601. Acquire the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform at all acquisition stages; 602. Extract the peak value of the surge current from the surge current change waveforms at each acquisition stage; 603. Generate a relationship curve based on the bus capacitor voltage and the corresponding surge current peak value at each acquisition stage; 604. Generate test results based on the bus capacitor voltage change waveform, relay control voltage waveform, and relationship curve of each acquisition stage.

[0036] In this embodiment, the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform corresponding to all acquisition stages are acquired. From the surge current change waveform of each acquisition stage, the peak surge current generated during power-on is extracted. Then, with the bus capacitor voltage value corresponding to the power-on trigger at each acquisition stage as the x-axis and the peak surge current measured during that power-on as the y-axis, a "peak surge current - initial bus voltage at power-on" relationship curve is generated. Finally, the test results can comprehensively present the complete waveforms (bus capacitor voltage, relay control voltage waveforms) of each acquisition stage and the aforementioned relationship curve, thereby fully demonstrating the ability of the diode under test to withstand surge current under different residual voltages.

[0037] In the seventh embodiment of the diode surge current testing method of the present invention, after step S105, the method further includes: 701. During each acquisition stage, when the AC power supply is connected to the circuit under test, the forward voltage drop value of the diode of the circuit under test is obtained, and the forward voltage drop value of the diode is compared with the preset reference voltage drop value to obtain the diode performance results of each acquisition stage.

[0038] In this embodiment, to further evaluate the diode's performance under surge impact, the forward voltage drop of the diode under test is obtained by analyzing the voltage waveform across the diode during each acquisition stage, while simultaneously triggering power-on. The forward voltage drop value obtained in each measurement is compared with a preset reference voltage drop value (e.g., a typical value from the diode's datasheet). By observing the trend of the diode's forward voltage drop after multiple surge impacts (e.g., whether it increases significantly), it is possible to help determine whether the diode's performance has degraded, thereby obtaining the diode performance evaluation results after each acquisition stage or cumulative testing.

[0039] It should be noted that the circuit under test is based on a typical BOOST-PFC boost circuit, which mainly consists of the following parts connected in sequence: AC input unit: Receives AC power from the mains.

[0040] Buffer and current limiting unit: Includes a PTC thermistor connected in parallel with the relay. During the initial power-on phase, the relay is disconnected, and current flows through the PTC resistor, utilizing its positive temperature coefficient characteristic to suppress the initial surge current.

[0041] Rectifier unit: Consists of a rectifier bridge, used to rectify AC input into pulsating DC.

[0042] PFC Inductor and Switching Unit: Includes a PFC inductor and a power switch (such as a MOSFET) to implement power factor correction and boost functions.

[0043] Boost and freewheeling unit: This includes the Schottky barrier diode under test (SBD) and the bus electrolytic capacitor. The SBD plays a crucial role in boosting voltage, providing freewheeling current, and enabling unidirectional conduction in the circuit.

[0044] To achieve the surge current test described in this invention, key test points of the circuit under test were modified and brought out: Current test point: A notch is cut in the copper foil path between the PFC inductor and the SBD Schottky diode, and a high-precision, high-range current probe is connected in series. This probe is used to directly capture and measure the surge current waveform flowing through the SBD.

[0045] Voltage test points: First voltage test point: Leading out from the positive and negative terminals of the bus electrolytic capacitor, it is connected to a differential voltage probe for precise monitoring of the voltage across the capacitor.

[0046] The second voltage test point is led out from the control coil or power supply terminal of the relay and connected to a voltage probe for real-time monitoring of the relay's switching status.

[0047] Brief description of the test principle: By monitoring the discharge process of the voltage across the capacitor, and when it drops to a specific low range (e.g., 20V-50V) while the relay's switching status signal indicates that the relay is still in the energized state, AC input is reapplied. At this time, the PTC resistor is short-circuited by the relay, losing its current-limiting function. The rectified current will directly charge the low-voltage bus capacitor without suppression, thereby generating the maximum surge current on the SBD, which is accurately captured by the current probe.

[0048] The diode surge current testing method in the embodiments of the present invention has been described above. The diode surge current testing system in the embodiments of the present invention is described below. Please refer to [link / reference]. Figure 2 One embodiment of the diode surge current testing system in this invention includes: an AC power supply 802 electrically connected to a control device 801, a circuit under test 803, a current probe 804, a voltage probe 805, and a differential probe 806. The circuit under test 803 is electrically connected to the AC power supply 802, the current probe 804, the voltage probe 805, and the differential probe 806, respectively.

[0049] above Figure 2 The diode surge current testing system in this embodiment of the invention is described in detail from the perspective of modular functional entities. The diode surge current testing device in this embodiment of the invention is described in detail from the perspective of hardware processing.

[0050] Figure 3This is a schematic diagram of the structure of a diode surge current testing device 900 provided in an embodiment of the present invention. The diode surge current testing device 900 can vary significantly due to different configurations or performance. It may include one or more central processing units (CPUs) 910 (e.g., one or more processors) and a memory 920, and one or more storage media 930 (e.g., one or more mass storage devices) storing application programs 933 or data 932. The memory 920 and storage media 930 can be temporary or persistent storage. The program stored in the storage media 930 may include one or more modules (not shown in the diagram), each module may include a series of instruction operations on the diode surge current testing device 900. Furthermore, the processor 910 may be configured to communicate with the storage media 930 and execute the series of instruction operations in the storage media 930 on the diode surge current testing device 900 to implement the steps of the diode surge current testing method provided in the above-described method embodiments.

[0051] The diode surge current testing device 900 may also include one or more power supplies 940, one or more wired or wireless network interfaces 950, one or more input / output interfaces 960, and / or one or more operating systems 931, such as Windows Server, Mac OS X, Unix, Linux, FreeBSD, etc. Those skilled in the art will understand that... Figure 3 The diode surge current test equipment structure shown does not constitute a limitation on the diode surge current test equipment, and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0052] The present invention also provides a computer-readable storage medium, which can be a non-volatile computer-readable storage medium or a volatile computer-readable storage medium, wherein the computer-readable storage medium stores instructions that, when executed on a computer, cause the computer to perform the steps of the diode surge current testing method.

[0053] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working process of the system or system / unit described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0054] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0055] Finally, it should be noted that the above descriptions are merely preferred embodiments of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A method for testing diode surge current, characterized in that, An application is provided in a diode surge current testing system, the diode surge current testing system comprising: an AC power supply electrically connected to a control device, a circuit under test, a current probe, a voltage probe, and a differential probe; the diode surge current testing method comprises: Obtain the rated AC voltage of the circuit under test, and connect the AC power supply to the circuit under test according to the rated AC voltage; During the power-on process of the circuit under test, the bus capacitor voltage and relay control voltage of the circuit under test are obtained through differential probe and voltage probe. The minimum instantaneous voltage of the circuit under test is determined based on the bus capacitor voltage and relay control voltage, and the AC power supply is controlled to be cut off. The target test range is calculated based on the lowest instantaneous voltage and the preset test gradient; Based on a preset test scenario, the AC power supply is connected to the circuit under test. When the bus capacitor voltage reaches the preset rated voltage, the AC power supply is cut off. When the bus capacitor voltage drops to the target test range, the AC power supply is connected to the circuit under test, and the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform of the circuit under test at the moment of power-on are collected by the current probe, voltage probe, and differential probe, respectively. The test results are generated based on the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform.

2. The diode surge current testing method according to claim 1, characterized in that, The determination of the minimum instantaneous voltage of the circuit under test based on the bus capacitor voltage and the relay control voltage includes: When the relay control voltage experiences a level transition, the voltage of the bus capacitor at that moment of transition is obtained as the lowest instantaneous voltage of the circuit under test.

3. The diode surge current testing method according to claim 1, characterized in that, The calculation of the target test range based on the lowest instantaneous voltage and the preset test gradient includes: Set the lowest instantaneous voltage as the upper limit threshold, and determine the lower limit threshold based on the upper limit threshold and the preset test gradient; The target test range is generated based on the upper and lower thresholds.

4. The diode surge current testing method according to claim 1, characterized in that, The method of controlling the AC power supply to the circuit under test based on a preset test scenario includes: The preset test scenario includes an ambient temperature threshold and a heat preservation time threshold; The ambient temperature of the circuit under test is obtained. When the ambient temperature reaches the ambient temperature threshold, the circuit under test is kept at the current ambient temperature until the holding time reaches the holding time threshold. Then, the AC power supply is connected to the circuit under test.

5. The diode surge current testing method according to claim 1, characterized in that, When the bus capacitor voltage drops to the target test range, the AC power supply is connected to the circuit under test, and the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform of the circuit under test at the moment of power-on are collected by the current probe, voltage probe, and differential probe, respectively, including: Multiple consecutive acquisition phases are generated based on the target test range; When the bus capacitor voltage drops to any acquisition stage, the AC power supply is triggered to power on the circuit under test. The surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform of the circuit under test at the moment of power-on are collected by the current probe, voltage probe, and differential probe, respectively, until all acquisition stages have completed the power-on action.

6. The diode surge current testing method according to claim 5, characterized in that, The test results generated based on the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform include: Acquire the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform during all acquisition phases; The peak value of the surge current is extracted from the surge current change waveform at each acquisition stage; Based on the relationship curve between the bus capacitor voltage and the corresponding surge current peak value at each acquisition stage; Test results are generated based on the bus capacitor voltage change waveform, relay control voltage waveform, and relationship curves at each acquisition stage.

7. The diode surge current testing method according to claim 5, characterized in that, When the bus capacitor voltage drops to the target test range, the AC power supply is connected to the circuit under test. The surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform of the circuit under test at the moment of power-on are collected using a current probe, voltage probe, and differential probe, respectively. After generating test results based on the surge current change waveform, bus capacitor voltage change waveform, and relay control voltage change waveform, the process further includes: During each acquisition stage, when the AC power supply is connected to the circuit under test, the forward voltage drop value of the diode in the circuit under test is obtained, and the forward voltage drop value of the diode is compared with the preset reference voltage drop value to obtain the diode performance results of each acquisition stage.

8. A diode surge current testing system, characterized in that, include: The control device is electrically connected to an AC power supply, a circuit under test, a current probe, a voltage probe, and a differential probe. The circuit under test is electrically connected to the AC power supply, the current probe, the voltage probe, and the differential probe, respectively.

9. A diode surge current testing device, characterized in that, The diode surge current testing device includes: a memory and at least one processor, wherein the memory stores instructions; At least one of the processors invokes the instructions in the memory to cause the diode surge current testing device to perform the steps of the diode surge current testing method as described in any one of claims 1-7.

10. A computer-readable storage medium storing instructions thereon, characterized in that, When the instructions are executed by the processor, they implement the steps of the diode surge current testing method as described in any one of claims 1-7.

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