A test matrix instant stop method based on target result triggering

Abstract

The application belongs to the technical field of semiconductor chip testing, and particularly relates to a test matrix instant stop method based on target result triggering, which is suitable for a test matrix scene, and realizes instant termination of a test process by relying on a preset hardware signal line designed by connecting a pull-up resistor to Vcc and comprises the following steps: S1, a pre-test configuration stage, S2, a test matrix preparation execution stage, S3, a test matrix execution stage, and S4, an instant stop stage. A flexible configuration mechanism of test target event registration and stop event binding is constructed, and a special hardware signal line of connecting a pull-up resistor to Vcc is matched to realize global synchronous triggering and stopping across a board card, the traditional fixed sequence test mode is abandoned, and the core problems of executing redundant test items after a test target is achieved in the prior art, causing invalid consumption of test time and equipment resources, and lacking of unified synchronous stopping capability in multi-board card cooperative testing and high parallel / multi-station test period being greatly lengthened are solved.

Description

Technical Field

[0001] This invention belongs to the field of semiconductor chip testing technology, specifically a test matrix instantaneous stopping method based on target result triggering. Background Technology

[0002] With the rapid development of semiconductor technology and integrated circuits, chips are becoming increasingly integrated and complex, leading to a growing demand for testing chips and related measurement systems. In semiconductor chip testing, communication equipment testing, and other measurement systems, automated test equipment (ATE) is typically used to comprehensively verify the electrical parameters, functions, and performance of the device under test (DUT). The testing process often involves a large number of test items, requiring a test matrix composed of one or more test boards, including various test items such as current parameter testing, voltage parameter testing, functional testing, and timing testing. These test items are usually performed sequentially according to a predetermined order to ensure that the DUT meets design specifications.

[0003] In existing technologies, the execution of test matrices generally adopts a fixed sequence mode. That is, regardless of whether the device under test has shown obvious defects or passed the test in the early test items, all subsequent test items must be run completely until the test matrix ends. Although this approach can ensure the comprehensiveness of the test, it has significant drawbacks: First, for devices with clear test results (pass or fail), continuing to execute the remaining test items will result in a significant waste of test time and equipment resources. Especially in mass production testing scenarios, test time is directly related to production efficiency and manufacturing costs, and such waste will significantly increase production costs and reduce production capacity. Second, in highly parallel testing or multi-station collaborative testing environments, devices with confirmed test results must wait until the entire test board or test batch has been tested before they can be removed. This will further lengthen the overall testing cycle and restrict the turnaround efficiency of the testing process. Third, the continuous execution of subsequent redundant test items may also cause additional unnecessary damage to the chip, affecting the original performance or reliability of the device.

[0004] In summary, the core contradiction in existing technologies when dealing with large-scale test matrices lies in the contradiction between the "blindness" of test execution and the "limited resources." The test system lacks a "brain" that can perceive in real time and make intelligent decisions, enabling it to immediately stop useless subsequent tests once it determines that it has obtained enough information to meet the test objectives, thereby focusing valuable test resources on obtaining key information or moving on to the next item to be tested.

[0005] Therefore, there is an urgent need for a lightweight, intelligent, and integrable method that can transform clear testing objectives into real-time decision logic, embed it into the test execution engine, and achieve an efficient testing paradigm of "stopping when the objective is achieved".

[0006] Therefore, the present invention provides a method for immediate stopping of a test matrix based on a target result trigger. Summary of the Invention

[0007] In order to overcome the shortcomings of the prior art, at least one technical problem raised in the background art is solved.

[0008] The technical solution adopted by this invention to solve its technical problem is as follows: A test matrix instant termination method based on target result triggering, applicable to test matrix scenarios, relies on a preset hardware signal line designed with pull-up resistors connected to Vcc to achieve instant termination of the test process, including the following steps: S1. Pre-test configuration phase: Register test target events and specify the stopping conditions for a single target or a combination of multiple targets; bind test stop events and define the linkage logic between achieving the test target and starting and stopping the test, and the configuration supports flexible modification throughout to adapt to different test scenario requirements; S2, Test Matrix Preparation and Execution Phase: After each test board is configured, it pulls the configuration ready signal line high. After the main control board receives the high signal from all the boards, it sends the test start signal to all functional boards, and the system enters the test execution phase. S3, Test Matrix Execution Phase: Each board performs current parameters, voltage parameters, functions, timing and other tests synchronously or step by step according to the preset division of labor, and provides real-time feedback on test progress and key data. When the test target event meets the preset judgment rules, the target board responsible for the target judgment will pull the global stop trigger signal line high and generate a unified stop command across boards. S4, Immediate Stop Phase: Each test board monitors the level of the global stop trigger signal line in real time. Upon detecting a change in its level, it immediately terminates the currently executing test item and does not start any subsequent unexecuted test items. After all boards complete the stop operation, the test end feedback signal line goes high, and the main control board sends a measurement end signal to the host computer.

[0009] Preferably, the test target event includes qualitative targets and quantitative targets. The qualitative target is that the device under test has a fatal defect or passes the functional verification. The quantitative target is that the electrical parameters of the device under test, such as current, voltage, and timing, reach a preset threshold. When multiple targets are combined, the judgment rules are defined by AND / OR / NOT logical operators. The configuration method of single target or multi-target combination can be selected as needed.

[0010] Preferably, the preset hardware signal lines include a configuration ready signal line, a test end feedback signal line, a global stop trigger signal line, and transmission lines corresponding to the test start signal. All signal lines adopt a hardware design with pull-up resistors connected to Vcc, possessing wire and logic compatibility capabilities. Furthermore, the signal lines are selected as AWG28-AWG30 shielded signal lines, and the pull-up resistors are selected as 10Ω. -100 It is compatible with 3.3V-12V Vcc power supply, and the shielding layer is grounded to reduce electromagnetic interference.

[0011] Preferably, each test board is equipped with a dedicated signal interface, which includes pins, power pins, and ground pins for each hardware signal line. The interface is gold-plated and supports hot-swapping to ensure stable signal contact. The main control board integrates a signal monitoring module, a command issuing module, and a status feedback module, which respectively realize the acquisition of the level status of each signal line, the transmission of commands such as test start / stop, and the reporting and feedback of test status to the host computer.

[0012] Preferably, the pre-test configuration phase also includes a system initialization step. After the main control board and each functional board complete the communication handshake, the line connectivity is verified by the level self-test of each hardware signal line. If a fault such as abnormal line level is detected, an alarm signal is immediately sent to the host computer and the specific location of the fault is displayed.

[0013] Preferably, during the test matrix execution phase, the test data sampling frequency of each board is ≥1MHz, and the judgment period of the target board for the test target event is ≤1. The trigger delay when the global stop trigger signal line goes high is ≤0.5 seconds. The stop response speed triggered by the hardware signal line is in the microsecond range, and the accuracy of cross-board synchronous stop can reach tens of nanoseconds.

[0014] Preferably, during the immediate stop phase, each board monitors the global stop trigger signal line level through its built-in signal monitoring module, and the sampling frequency of the signal monitoring module is ≥10MHz; after each board completes the stop operation, it needs to... The system sends a stop completion feedback signal containing the board ID and the reason for stopping to the main control board. If the feedback is not received within the specified time threshold, the board is deemed to be malfunctioning.

[0015] Preferably, it also includes a signal interference fault tolerance mechanism: when the global stop trigger signal line experiences instantaneous level fluctuations due to electromagnetic interference, and the fluctuation duration is ≤100... When this happens, the board's built-in anti-jitter module automatically filters out the interference signal to prevent accidental triggering of the stop command; if the level fluctuation lasts for more than 100 seconds... The system immediately paused the test and reported the signal abnormality fault to the host computer.

[0016] Preferably, if any test board goes offline during the test, i.e., the main control board has more than 50 offline cards... If no status feedback signal is received from the board, the main control board marks the board as a faulty board and triggers a partial stop command, which only stops the test link corresponding to the faulty board. The other normally operating boards continue to perform tests according to the preset judgment rules to avoid the global test being interrupted due to a single board failure.

[0017] Preferably, when multiple test target events are achieved simultaneously, a stop logic is executed according to a preset priority, with the priority ordered from high to low as follows: stop for fatal defects > stop for qualified results > stop for partial target achievement; the threshold of the quantitative target can be dynamically adjusted based on historical test data of similar devices under test, with an adjustment range of ≤±5%, to improve the adaptability of test target determination.

[0018] The beneficial effects of this invention are as follows: 1. The present invention provides a test matrix instant stop method based on target result triggering. By constructing a flexible configuration mechanism for registering test target events and binding stop events, and using a dedicated hardware signal line with pull-up resistors connected to Vcc, it achieves cross-board global synchronous triggering stop. It abandons the traditional fixed sequence test mode and solves the core problems in the prior art, such as the execution of redundant test items after the test target is achieved, resulting in the ineffective consumption of test time and equipment resources, as well as the lack of unified synchronous stop capability in multi-board collaborative testing and the significant extension of the high parallel / multi-station test cycle.

[0019] 2. The test matrix instant stop method based on target result triggering described in this invention establishes a real-time dynamic intelligent judgment system for test targets, adds anomaly handling mechanisms such as signal interference fault tolerance and partial offline stop of the board, and achieves microsecond-level response and tens of nanosecond-level synchronization accuracy by relying on hardware triggering. It solves the problems in the prior art of lacking real-time perception and intelligent decision-making logic in test execution, high latency in software triggering stop response, and the fact that local anomalies can easily lead to global test interruption and redundant tests can easily cause additional electrical stress damage to the device under test. Attached Figure Description

[0020] The invention will now be further described with reference to the accompanying drawings.

[0021] Figure 1 This is a flowchart of the overall system for immediate stop of the test matrix in this invention; Figure 2 This is a flowchart of the test target registration and stop event binding process in this invention; Figure 3 This is a flowchart illustrating the priority execution process for achieving multiple objectives simultaneously in this invention. Figure 4 This is a flowchart of signal interference and offline processing of the board in this invention; Figure 5 This is a flowchart of the cross-board synchronization stop process in this invention; Figure 6 This is a diagram of the instantaneous stop system of the test matrix triggered by the target result in this invention; Figure 7 This is a flowchart of the instantaneous stop system in this invention; Figure 8 This is the timing diagram of the instantaneous stop system in this invention. Detailed Implementation

[0022] To make the technical means, creative features, objectives and effects of this invention easier to understand, the invention will be further described below in conjunction with specific embodiments.

[0023] like Figures 1 to 8 As shown in the embodiment of the present invention, a test matrix instant termination method based on target result triggering is applicable to test matrix scenarios. It relies on a preset hardware signal line designed with pull-up resistors connected to Vcc to achieve instant termination of the test process, and includes the following steps: S1. Pre-test configuration phase: Register test target events and specify the stopping conditions for a single target or a combination of multiple targets; bind test stop events and define the linkage logic between achieving the test target and starting and stopping the test, and the configuration supports flexible modification throughout to adapt to different test scenario requirements; The core of this stage is to bind the test objective with the stop logic. First, based on the actual measurement requirements of the device under test, test objective events are registered. These events support single-objective configuration or multi-objective combination configuration and can be flexibly modified according to the test scenario. At the same time, test stop events are bound to clarify the unique linkage logic between "test objective achieved" and "start test stop", providing a clear basis for the stop determination of the subsequent test process. The flexibility of this configuration method can adapt to different scenarios of different devices under test and different test requirements. S2, Test Matrix Preparation and Execution Phase: After each test board is configured, it pulls the configuration ready signal line high. After the main control board receives the high signal from all the boards, it sends the test start signal to all functional boards, and the system enters the test execution phase. After each test board completes the above configuration, it pulls the configuration ready signal line high. The main control board only sends the test start signal to all functional boards after receiving the configuration ready signal line high signal from all boards, ensuring that all boards are configured and in a ready state, avoiding test process abnormalities caused by some boards not being configured. Then the system officially enters the test execution phase. S3, Test Matrix Execution Phase: Each board performs current parameters, voltage parameters, functions, timing and other tests synchronously or step by step according to the preset division of labor, and provides real-time feedback on test progress and key data. When the test target event meets the preset judgment rules, the target board responsible for the target judgment will pull the global stop trigger signal line high and generate a unified stop command across boards. Each board performs current parameters, voltage parameters, functions, timing and other tests in a synchronous or step-by-step manner according to its preset division of labor. During the execution, it continuously and in real time feeds back the test progress and key test data to the target board. The target board, as the sole criterion for determining the test target, continuously analyzes the received test data. When the test target event meets the preset judgment rules, the target board immediately pulls the global stop trigger signal line high and generates a unified stop command across boards. This command is hardware-level triggered and has the characteristics of fast response speed and stable transmission. S4, Immediate Stop Phase: Each test board monitors the level of the global stop trigger signal line in real time. Upon detecting a change in its level, it immediately terminates the currently executing test item and does not start any subsequent unexecuted test items. After all boards complete the stop operation, the test end feedback signal line goes high, and the main control board sends a measurement end signal to the host computer. All test boards monitor the level of the global stop trigger signal line in real time. When a level change is detected on this signal line, two core operations are immediately executed: first, the currently executing test item is terminated; second, the test execution queue is locked, and no further unexecuted test items are started. After all boards have completed the above stop operations, the test end feedback signal line is pulled high. Based on this signal, the main control board sends a measurement end signal to the host computer, completing the execution process of the entire test matrix.

[0024] like Figures 1 to 8 As shown, the test target events mentioned above are divided into two categories: qualitative targets and quantitative targets. Both types of targets can be used individually or in combination as stopping criteria. Specific characteristics are as follows: The qualitative objectives are qualitative judgment conditions based on the test results of the device under test, mainly including two situations: first, the device under test has a fatal defect during the test and there is no need to continue the subsequent test; second, the core function of the device under test has been verified and the core objective of the test has been met. The quantitative objective is a quantitative judgment condition based on the electrical parameters of the device under test. It mainly targets quantifiable test items such as current, voltage, and timing. Clear parameter thresholds need to be set. When the test data reaches the threshold, the objective is judged to have been achieved. When using a multi-target combination configuration, the joint determination rules of multiple targets are defined by the "AND / OR / NOT" logical operators. Technical personnel in the relevant technical field can freely choose the single-target configuration or the multi-target combination configuration method according to actual testing needs, without any restrictions on the configuration form.

[0025] like Figures 1 to 8 As shown, the aforementioned preset hardware signal lines include the configuration ready signal line, the test end feedback signal line, the global stop trigger signal line, and the transmission lines corresponding to the test start signal. All signal lines continue the hardware design of pull-up resistors connected to Vcc and have wire and logic compatibility. To further improve the stability of signal transmission and reduce the impact of electromagnetic interference on the test process, the specific specifications of the signal lines, the selection of accessories, and the power supply adapter are limited as follows: The signal cable is a shielded signal cable of AWG28-AWG30 specification. Its shielding layer is grounded, which can effectively block external electromagnetic interference and avoid level fluctuations during signal transmission. The pull-up resistor is selected as 10. -100 The resistance value of this resistor can be adapted to a Vcc power supply of 3.3V-12V. Those skilled in the art can select a matching pull-up resistor within the above range according to the actual power supply specifications of the test system to ensure the stability of the signal line level.

[0026] like Figures 1 to 8 As shown, to achieve stable connection between each hardware signal line and the test board, and to ensure unified control of the entire test process by the main control board, the signal interfaces of the test board and the functional modules of the main control board are designed as follows: Each test board is equipped with a dedicated signal interface, which integrates the pins of all preset hardware signal lines, power pins, and ground pins. The interface is gold-plated to improve the stability of signal contact and supports hot-swapping, which facilitates on-site debugging of the test system and board replacement. The main control board integrates three core modules: a signal monitoring module, an instruction issuing module, and a status feedback module. The signal monitoring module is used to collect the level status of all hardware signal lines in real time, providing signal basis for process judgment; the instruction issuing module is used to uniformly send test start, partial stop and other instructions to each functional board; the status feedback module is used to report and provide real-time feedback to the host computer on the running status and test results of the entire test system, realizing visualized control of the test process.

[0027] like Figures 1 to 8As shown, the above-mentioned pre-test configuration phase also includes a pre-test system initialization step, which provides a basic guarantee for the normal execution of the test process. Specifically, after the main control board and each functional board are powered on, a two-way communication handshake is first completed to confirm that the communication link between the boards is unobstructed. Then, the line connectivity is fully verified by the level self-test of each preset hardware signal line. If a fault such as abnormal line level, open circuit, or short circuit is detected during the self-test, the main control board will immediately send an alarm signal to the host computer and clearly display the specific location of the fault in the alarm information, so as to facilitate the technicians to quickly troubleshoot. After the fault is eliminated, the subsequent target registration and event binding steps will be entered.

[0028] like Figures 1 to 8 As shown, the above test matrix execution phase specifies clear parameter limits for the efficiency of test data acquisition, target determination, and signal triggering, ensuring the high efficiency of the test process and the rapid triggering of stop commands. Specific technical features include: The test data sampling frequency of each board is ≥1MHz to ensure the real-time performance and integrity of the test data, providing accurate data support for the determination of the target board; The target board's decision period for the test target event is ≤1. This enables real-time dynamic determination of test targets, avoiding redundant testing caused by determination delays; Once the test objective is determined to be achieved, the trigger delay of the global stop trigger signal line going high is ≤0.5 seconds. This ensures the rapid generation of stop commands; Based on the physical triggering characteristics of hardware signal lines, the stop response speed of this method is at the microsecond level, which is far superior to the traditional software-triggered stop method. Moreover, in the scenario of multi-board collaborative testing, the accuracy of cross-board synchronous stop can reach the tens of nanosecond level, ensuring that the stop actions of all boards are highly synchronized.

[0029] like Figures 1 to 8 As shown, during the aforementioned immediate stop phase, the following limitations are imposed on the signal monitoring frequency of the board and the feedback requirements after the stop to ensure accurate response to the stop command and timely feedback on the test status: Each board monitors the level of the global stop trigger signal line in real time through its built-in signal monitoring module. The sampling frequency of this module is ≥10MHz, which can accurately capture the level changes of the signal line and avoid missing the stop command due to the sampling frequency being too low. After each board completes the stop operation to terminate the current test and block subsequent tests, it must be within 10 seconds. The main control board sends a "stop completed" feedback signal. This feedback signal must include core information such as the board ID and the reason for stopping, so that the main control board can accurately identify the operating status of each board. If a board fails to send a feedback signal within the above time threshold, the main control board will automatically determine that the board is operating abnormally and send an abnormal alarm message to the host computer.

[0030] like Figures 1 to 8 As shown, to avoid false triggering of the stop command due to electromagnetic interference, this method adds a signal interference fault tolerance mechanism. This mechanism is designed for the global stop trigger signal line mentioned above and further optimizes the stability of hardware signal triggering. The specific implementation is as follows: When the global stop trigger signal line experiences a momentary level fluctuation due to external electromagnetic interference, and the fluctuation duration is ≤100ns, the fluctuation is determined to be an invalid interference signal. The anti-jitter module built into the board will automatically filter the signal to ensure that the test process will not be erroneously stopped due to invalid interference. If the level fluctuation of the global stop trigger signal line lasts for more than 100ns, it is determined to be a signal transmission abnormality. The system will immediately suspend all current test processes and report the signal abnormality fault to the host computer. The test can only be restarted after the technicians have investigated and resolved the interference problem.

[0031] like Figures 1 to 8 As shown, to avoid the interruption of the entire test matrix process due to the failure of a single board, this method adds an offline emergency handling mechanism for boards. This mechanism is a further optimization of the multi-board collaborative testing scenario mentioned above, and its specific implementation is as follows: During the test process, the main control board continuously receives status feedback signals from each board. If any test board goes offline (i.e., the main control board has more than 50 offline cards), the test will be terminated. If no status feedback signal is received from the board, the main control board marks the board as a faulty board; For a faulty board, the main control board will trigger a partial stop command, stopping only the test link corresponding to the faulty board. For the other normally operating boards, no operation will be performed, allowing them to continue to execute the test process according to the preset test target judgment rules. Information about faulty boards will be reported to the host computer in real time. Technicians can then troubleshoot and replace faulty boards on-site without affecting the testing of other normal boards, effectively improving the overall fault tolerance of the test matrix.

[0032] like Figures 1 to 8 As shown, this feature is a further optimization of the multi-objective combination configuration mentioned above. For scenarios where multiple test objective events are achieved simultaneously, the execution priority of the stopping logic is clarified, and the threshold configuration for quantitative objectives is optimized for flexibility. Specifically, the implementation is as follows: Multi-target priority execution rule: When multiple test target events are achieved simultaneously, the stop logic is executed according to the preset priority. The priority from high to low is: fatal defect stop > pass stop > partial target achievement stop. This priority rule can ensure that when the device under test has a fatal defect, the test can be terminated with the highest priority, avoiding redundant testing from causing additional damage to the device. Quantitative target threshold dynamic adjustment rules: For the quantitative targets mentioned above, the parameter thresholds can be dynamically adjusted based on historical test data of similar devices under test, with an adjustment range of ≤±5%. Technical personnel in the relevant technical field can refine the thresholds according to the actual data distribution of batch tests to improve the adaptability and accuracy of test target determination. This adjustment operation can be completed in the pre-test configuration stage and supports flexible modification.

[0033] Example 1 Single-target test scenario for single-board RF chip 1. Test subjects and requirements The object under test is a certain type of RF chip. The test matrix includes four test items: voltage parameters, current parameters, RF function, and timing response. The test objective is a single qualitative objective: if the RF function test item fails, it is judged as a fatal defect, and the test is stopped immediately to avoid redundant testing causing additional electrical stress damage to the chip. 2. Implementation steps of the method of the present invention Pre-test configuration: After the system initializes and completes the line self-test, and there are no faults, the test target event is registered as "RF function test failed = fatal defect stop", and the stop event is bound as "terminate the current test item + block subsequent test items + feedback status + report to host computer". The configuration does not need to be modified throughout the process and is suitable for single target test requirements. Preparation for execution: After the single measurement board is configured, pull the configuration ready signal line high. After receiving the signal, the main control board sends a test start signal and enters the test execution phase. Test Execution: The board executes the test items sequentially. First, the voltage and current parameters are tested (both meet the standards). Then, the RF function test is performed. If the chip's RF function fails, the target board immediately pulls the global stop trigger signal line high, with a trigger delay of 0.4 seconds. ; Immediate Stop: Upon detecting a change in the global stop trigger signal line level, the board immediately terminates the RF function test and blocks any unexecuted timing response test items. The main control board sends a feedback signal (board ID: 01, reason for stop: radio frequency function test failed, fatal defect) to the internal main control board. Then the test ends and the feedback signal line is pulled high. The main control board reports the test results to the host computer. 2. Implementation Results The total test duration for the RF chip was 45ms. The test was stopped immediately after the fatal defect appeared, and no subsequent timing response test items were executed, thus avoiding approximately 30ms of redundant test time. At the same time, no additional electrical stress was generated due to the redundant test, and the chip maintained its original performance state.

[0034] Example 2 Batch testing of multi-board communication modules in multi-target combination scenarios 1. Test subjects and requirements The object under test is a certain type of communication module. Eight measurement boards are used to form a test matrix for batch testing. Each board tests one module at the same time. The test matrix includes eight electrical and functional test items. The test objective is a quantitative combination of multiple objectives: if the working voltage (3.3V±0.01V) AND working current (0.6A-0.8A) meets the standard, the test is judged to be qualified and the test is stopped immediately to improve the efficiency of batch testing. 2. Implementation steps of the method of the present invention Pre-test configuration: The system initializes and completes the communication handshake and line self-test between the 8 boards and the main control board. The registered test target events are the above multi-target "AND" logic combinations. The bound stop event is the core stop action. The configuration supports flexible modification and the threshold can be fine-tuned according to the batch module parameters. Preparation for execution: After all 8 boards have been configured, the configuration ready signal line is pulled high in sequence. After receiving the signals from all boards, the main control board sends a test start signal and enters the test execution phase simultaneously. Test execution: Each board executes the test items synchronously, collects voltage and current data in real time and feeds it back to the target board. When a board detects that the voltage and current parameters of the tested module have reached the preset threshold and meet the combined judgment rules, the target board immediately pulls up the global stop trigger signal line. The cross-board signal transmission synchronization accuracy is 20ns. Instant Stop: All 8 boards monitor the global stop trigger signal line in real time. Upon detecting a change in level, the current test item is simultaneously terminated, and subsequent test items are blocked. All boards stop at 5... The stop operation is completed within the time limit, and a feedback signal is sent to the main control board. The test ends and the feedback signal line goes high. The main control board then reports the batch test results. 3. Implementation Results The average test time for a single communication module has been reduced from the traditional 120ms to 72ms, improving test efficiency by 40%. The synchronous stop accuracy of the collaborative testing of 8 boards reaches the 20ns level, eliminating board response delay issues. When batch testing 1,000 qualified communication modules, the total test time is reduced by approximately 48,000ms compared to the traditional method, equipment utilization is increased by 35%, and production line capacity is increased by 35% simultaneously, significantly reducing the time cost of batch production testing.

[0035] Example 3 Power chip testing: simultaneous achievement of multiple objectives with priority execution scenarios 1. Test subjects and requirements The test object is a certain type of power chip. The test matrix contains 6 test items. The test objectives are set with two objectives: one is the quantitative objective "current meets the standard under rated power = pass and stop", and the other is the qualitative objective "overcurrent protection function failure = fatal defect and stop". In the special case of multiple objectives being achieved at the same time during the test, the preset stop logic priority is: fatal defect stop > pass and stop. 2. Implementation steps of the method of the present invention Pre-test configuration: Register dual test target events, bind stop events and set priority rules. After the system completes self-testing upon initialization, dynamically adjust the quantitative target current threshold by 0.5% based on historical test data (original threshold 1.2A, adjusted to 1.206A) to improve judgment adaptability. Preparation and test execution: The test items are executed on a single board. During the rated power test phase, the current meets the standard (pass target) and the overcurrent protection function fails (fatal defect target) at the same time. Priority determination and immediate stop: The target board is determined according to the preset priority. If "fatal defect stop" is the result, the global stop trigger signal line is immediately pulled high. The board terminates the current test item and blocks the subsequent test items. The reason for the stop is "overcurrent protection function failure, fatal defect (multiple targets are achieved at the same time, executed according to priority)". 3. Implementation Results The power chip test lasted 60ms. When multiple objectives were achieved simultaneously, the system executed the stop logic according to a clear priority, without any decision confusion. At the same time, the threshold was dynamically adjusted based on historical data, which improved the accuracy of current parameter determination and avoided misjudgment. The accuracy of the test results was 100%.

[0036] Example 4 Fault tolerance scenarios for offline testing of the board 1. Test scenarios and exception settings Based on the batch testing scenario of the multi-board communication module in Example 2, during the collaborative testing of 8 boards, an offline anomaly was artificially simulated: the signal line of the 5th board was temporarily disconnected, and the main control board exceeded 50. No status feedback signal was received for this board.

[0037] 2. Fault-tolerant processing of the method of the present invention Anomaly detection: The main control board is stuck at 55. If no feedback signal is received from the 5th board, it is immediately marked as a faulty board; Partial Stop: The main control board triggers a partial stop command, stopping only the test link corresponding to the 5th board. The other 7 boards are unaffected and continue to perform tests according to the multi-target combination rules. Status reporting and follow-up processing: The main control board reports the fault information "Board 05 offline, partially stopped" to the host computer. Technicians can then conduct on-site troubleshooting and repair of the faulty board without affecting the testing of other boards. After repair, the board can be reconnected to the system without restarting the global test.

[0038] 3. Implementation Results The batch testing process for the 7 working boards was uninterrupted and continued to be completed efficiently. The average test time for a single module was still 72ms. The global test did not stop due to the failure of a single board. The overall fault tolerance of the test matrix was significantly improved, and the equipment utilization was not affected by local anomalies.

[0039] Comparative Example 1 Traditional fixed sequence testing methods This method lacks any immediate stop function. Regardless of whether the device under test (DUT) meets the pass / fail target beforehand, all test items must be executed completely until the test matrix ends. When batch testing 1000 qualified communication modules, each module undergoes all 8 test items. There is no time saving due to redundant testing, and the equipment is always operating at full load with redundancy. Furthermore, the additional electrical stress generated by redundant testing causes 3.2% of the modules to experience slight performance degradation, becoming defective products. At the same time, the total batch testing time is the longest, and the production line capacity is the lowest.

[0040] Comparative Example 2 Existing software-triggered test matrix stopping method This method determines the test target through software. Once the target is achieved, a stop signal is issued via software command to stop the test. Compared to traditional fixed-sequence testing, this method can save some redundant testing time, but it has significant drawbacks: First, the software command needs to go through multiple stages of "data transmission - system parsing - command issuance," with a response speed of milliseconds, which is much slower than the hardware triggering of this invention. Second, software signal transmission is easily affected by system load, and the synchronization accuracy of multiple boards is at the millisecond level, resulting in board response asynchrony issues. Third, there is still a short period of redundant testing, and although the device failure rate caused by electrical stress is reduced, it is still higher than that of the method of this invention. Fourth, the software parsing process consumes system resources, and the equipment utilization rate is 20% lower than that of this invention.

[0041] By comparing the above embodiments with comparative examples, it is clear that the core advantages of the test matrix instantaneous stopping method based on target result triggering of the present invention compared with the prior art are specifically reflected in: Test efficiency and resource utilization: This invention uses hardware signal lines to quickly trigger and stop tests instantly, effectively saving redundant test time, significantly shortening the test time for a single device under test, increasing equipment utilization to over 95%, and greatly improving production line capacity in batch testing scenarios. It solves the core contradictions of "test blindness" and "limited resources" in existing technologies. Response and synchronization accuracy: The stop command response speed of this invention is in the microsecond range, and the synchronization accuracy of multi-board collaborative testing reaches tens of nanoseconds, which is far superior to the millisecond-level response and synchronization of existing software triggers. This avoids redundant testing caused by command delay and improves the accuracy of the testing process. Device protection and yield improvement: This invention stops testing immediately after a fatal defect occurs or the test passes, avoiding additional electrical stress damage caused by redundant testing. The device defect rate is reduced to below 0.4%, which is far lower than the traditional fixed sequence test and software-triggered stop method, effectively improving the yield and reliability of the device under test. Adaptability and fault tolerance: This invention supports various test target configurations such as single / multiple targets, qualitative / quantitative, and combined targets, and is adaptable to various test scenarios such as single / multiple boards and single / batch. At the same time, it adds signal interference fault tolerance and board offline partial stop mechanism, which significantly improves the fault tolerance and stability of the test system and solves the problems of poor adaptability and easy interruption of global test due to local anomalies in the existing technology. Configuration flexibility: The test target and stop event configuration of this invention can be flexibly modified throughout the process, and the quantitative target threshold can be dynamically adjusted based on historical test data to adapt to different scenarios of different devices under test and different test requirements. No hardware modification of the test system is required, resulting in low implementation cost.

[0042] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of the invention. Various changes and modifications can be made to the invention without departing from its spirit and scope, and all such changes and modifications fall within the scope of the claimed invention.

Claims

1. A method for immediate stopping of a test matrix based on a target result trigger, characterized in that: Suitable for test matrix scenarios, this method utilizes a pre-designed hardware signal line with pull-up resistors connected to Vcc to achieve immediate termination of the test process, including the following steps: S1. Pre-test configuration phase: Register test target events and specify the stopping conditions for a single target or a combination of multiple targets; bind test stop events and define the linkage logic between achieving the test target and starting and stopping the test, and the configuration supports flexible modification throughout to adapt to different test scenario requirements; S2, Test Matrix Preparation and Execution Phase: After each test board is configured, it pulls the configuration ready signal line high. After the main control board receives the high signal from all the boards, it sends the test start signal to all functional boards, and the system enters the test execution phase. S3, Test Matrix Execution Phase: Each board executes test items synchronously or stepwise according to the preset division of labor, and provides real-time feedback on test progress and key data. When the test target event meets the preset judgment rules, the target board responsible for target judgment will pull the global stop trigger signal line high and generate a unified stop command across boards. S4, Immediate Stop Phase: Each test board monitors the level of the global stop trigger signal line in real time. Upon detecting a change in its level, it immediately terminates the currently executing test item and does not start any subsequent unexecuted test items. After all boards complete the stop operation, the test end feedback signal line goes high, and the main control board sends a measurement end signal to the host computer.

2. The instantaneous stopping method for a test matrix based on a target result trigger, as described in claim 1, is characterized in that: The test target events include qualitative and quantitative targets. The qualitative target is that the device under test has a fatal defect or passes the functional verification. The quantitative target is that the electrical parameters of the device under test reach a preset threshold. When multiple targets are combined, the judgment rules are defined by AND / OR / NOT logical operators. The configuration method of single target or multi-target combination can be selected as needed.

3. The instantaneous stopping method for a test matrix based on a target result trigger, as described in claim 1, is characterized in that: The preset hardware signal lines include a configuration ready signal line, a test end feedback signal line, a global stop trigger signal line, and a transmission line corresponding to the test start signal. All signal lines adopt a hardware design with pull-up resistors connected to Vcc, and have wire and logic compatibility.

4. The instantaneous stopping method for a test matrix based on target result triggering according to claim 1, characterized in that: Each test board is equipped with a dedicated signal interface, which includes pins for each hardware signal line, power pins, and ground pins. The interface is gold-plated and supports hot-swapping to ensure stable signal contact. The main control board integrates a signal monitoring module, a command issuing module, and a status feedback module, which respectively realize the transmission of commands for each signal line, the reporting and feedback of test status to the host computer.

5. The instantaneous stopping method for a test matrix based on target result triggering according to claim 1, characterized in that: The pre-test configuration phase also includes system initialization steps. After the main control board and each functional board complete the communication handshake, the line connectivity is verified by the level self-test of each hardware signal line. If a line fault is detected, an alarm signal is immediately sent to the host computer and the specific location of the fault is displayed.

6. The method for immediate stopping of a test matrix based on a target result trigger, as described in claim 1, is characterized in that: During the test matrix execution phase, the test data sampling frequency of each board is ≥1MHz, and the judgment period of the target board for the test target event is ≤1. The trigger delay when the global stop trigger signal line goes high is ≤0.5 seconds. The stop response time triggered by the hardware signal line is in the microsecond range.

7. The instantaneous stopping method for a test matrix based on a target result trigger, as described in claim 1, is characterized in that: During the immediate stop phase, each board monitors the global stop trigger signal line level through its built-in signal monitoring module, and the sampling frequency of the signal monitoring module is ≥10MHz; After each board completes its stop operation, it must be within 10 seconds. The system sends a stop completion feedback signal containing the board ID and the reason for stopping to the main control board. If the feedback is not received within the specified time threshold, the board is deemed to be malfunctioning.

8. The instantaneous stopping method for a test matrix based on target result triggering according to claim 1, characterized in that: It also includes a signal interference tolerance mechanism: when the global stop trigger signal line experiences a momentary level fluctuation due to electromagnetic interference, and the fluctuation duration is ≤100... When this happens, the board's built-in anti-jitter module automatically filters out the interference signal to prevent accidental triggering of the stop command; if the level fluctuation lasts for more than 100 seconds... The system immediately paused the test and reported the signal abnormality fault to the host computer.

9. The instantaneous stopping method for a test matrix based on target result triggering according to claim 1, characterized in that: If any test board goes offline during the test, i.e., the main control board exceeds 50... If no status feedback signal is received from the board, the main control board marks the board as a faulty board and triggers a partial stop command, which only stops the test link corresponding to the faulty board. The other normally operating boards continue to perform tests according to the preset judgment rules to avoid the global test being interrupted due to a single board failure.

10. The instantaneous stopping method for a test matrix based on target result triggering according to claim 2, characterized in that: When multiple test target events are achieved simultaneously, the stop logic is executed according to the preset priority, which is ordered from high to low as follows: fatal defect stop > pass stop > partial target achievement stop; The threshold of the quantitative target can be dynamically adjusted based on historical test data of similar devices under test, with an adjustment range of ≤±5%, in order to improve the adaptability of the test target determination.

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