A test system and method for analog switches

Abstract

The application discloses a kind of test system and method for analog switch, it is related to electrical performance test technical field, including test control unit, coordinate each module work, parse instruction generation control signal, monitor test state and output result;Analog switch unit, adapt to multiple types of switch, can set on-off frequency and other key parameters restore working characteristic;Signal generation unit, generate a variety of adjustable electrical signal to meet different test requirements;Data acquisition unit, collect on-off response time and other electrical parameters;Fault injection unit, simulate a variety of common fault scenarios;Data analysis unit, process raw data to evaluate switch performance;Communication interaction unit, interact with external equipment data reception configuration instruction.The application adapts to multiple types of switch, test precision is high and anti-interference ability is strong, supports multi-environment test;Improve test efficiency and data reliability, adapt to electronic manufacturing, power operation and other multi-field applications.

Description

Technical Field

[0001] This invention relates to the field of electrical performance testing technology, and in particular to a testing system and method for simulating switches. Background Technology

[0002] As a core control component in electronic equipment and power systems, the performance stability and fault response characteristics of switches directly affect the operational safety and reliability of the entire system. Whether it's a mechanical switch in industrial control, a high-voltage electronic switch in power transmission, or a miniature semiconductor switch in consumer electronics, all switches require precise testing to verify their switching response, contact performance, ultimate load capacity, and fault tolerance before leaving the factory and during operation and maintenance. With the rapid development of electronic technology, the types of switches are constantly increasing, the range of rated parameters is continuously expanding, and application scenarios are becoming increasingly complex, placing higher demands on the adaptability, accuracy, and anti-interference capabilities of testing systems. However, existing analog switch testing systems generally have limitations in adaptability. Most systems can only test specific types of switches with specific parameter ranges, unable to flexibly simulate the switching actions and operating characteristics of different types of switches, and have narrow parameter adjustment ranges, making it difficult to meet diverse testing needs. For example, some systems only support the simulation of mechanical switch switching, resulting in poor simulation of the high-frequency switching characteristics of electronic switches. Key parameters such as switching frequency and contact pressure cannot be accurately set, leading to deviations between test results and actual working scenarios, and failing to fully reflect the true performance of the switch.

[0003] The existing testing systems suffer from inadequate anti-interference capabilities and calibration mechanisms, further impacting the accuracy and consistency of test data. During switch testing, external electromagnetic radiation, power supply noise, and changes in ambient temperature and humidity can easily interfere with signal generation and data acquisition, leading to distortion of the acquired electrical parameters. Traditional testing systems lack effective anti-interference design; signal transmission lines are not shielded, and data acquisition lacks targeted filtering algorithms, making it difficult to filter out interference signals. Furthermore, most systems lack automatic calibration units or can only perform simple calibration on some modules. Over long-term use, signal generation and data acquisition accuracy drift, making it impossible to correct errors through periodic calibration. This results in a lack of comparability of test data from different periods and environments, affecting the reliability of test conclusions. In addition, existing systems do not consider the impact of environmental factors during data processing. Changes in temperature, humidity, and air pressure can cause deviations in the measurement of parameters such as contact resistance and conduction voltage drop. Traditional data analysis only performs simple processing on the raw data without environmental compensation, further reducing test accuracy.

[0004] The lack of specificity and comprehensiveness in fault simulation testing, as well as the deficiency in dynamic load matching and multi-scenario testing capabilities, are also prominent pain points in existing technologies. Switches may experience various faults in actual operation, such as poor contact, contact adhesion, and abnormal arcing. The impact of different faults on the system varies, but existing fault injection units mostly use a single fault mode, failing to accurately adjust the injection intensity and duration according to the fault level. This results in incomplete fault test coverage and difficulty in evaluating the switch's response characteristics under different fault levels. Simultaneously, the load parameters of existing testing systems are mostly fixed settings, unable to be dynamically adjusted according to the switch's rated parameters, test type, and operating status. This leads to a mismatch between the load and the switch's actual operating state, making it impossible to effectively test the switch's performance limits under different operating conditions. Furthermore, most systems can only be tested in a single environmental scenario, unable to simulate complex environments such as high temperature, low temperature, high humidity, and electromagnetic interference. This makes it difficult to comprehensively evaluate the switch's environmental adaptability, while switches often face diverse environmental challenges in practical applications. The lack of multi-scenario testing can easily lead to potential performance problems going undetected. Summary of the Invention

[0005] The present invention provides a testing system and method for simulating switches to solve the problems mentioned in the prior art.

[0006] To achieve the above objectives, the present invention adopts the following technical solution: a test system for simulating switches, comprising the following modules: The test control unit, as the core of the system, coordinates the collaborative work of various modules, receives and parses external test commands, generates corresponding control signals, and monitors the test process status in real time. The analog switch unit is adapted to the simulation requirements of different types of switches. It can simulate on / off actions and state holding, and supports setting key parameters such as on / off frequency, action stroke, contact pressure, rated voltage, and rated current to reproduce the actual working characteristics of the switch. The signal generation unit generates various electrical signals required for testing, including DC voltage, AC voltage, constant current, and pulse current. The signal amplitude, frequency, and waveform can be adjusted. The data acquisition unit collects electrical parameters during the simulated switch operation process, including on / off response time, contact resistance, on-state voltage drop, off-state leakage current, and arc duration. The fault injection unit simulates common switch fault scenarios, including fault types such as poor contact, contact adhesion, short circuit, open circuit, arcing and abnormal faults. The timing, duration and severity of fault injection can be set. The data analysis unit receives the raw data transmitted by the data acquisition unit, performs filtering, noise reduction, and normalization processing, and evaluates the electrical performance and fault status of the analog switch through feature extraction and parameter comparison. The communication interaction unit supports wired and wireless communication, enabling data interaction with external control terminal switch management systems, uploading test data status information and analysis results, and receiving external configuration commands and parameter modification requests.

[0007] Furthermore, it also includes an anti-interference processing unit, which uses an electromagnetic shielding structure to enclose the signal generation unit and the data acquisition unit. The signal transmission line uses shielded cables and is grounded. An adaptive filtering algorithm is added to the data acquisition stage to filter power supply noise and environmental interference signals. The signal generation unit has a built-in voltage stabilization module and current limiting protection.

[0008] Furthermore, it also includes a calibration unit, which has built-in standard resistor, standard voltage source, standard timer, and calibration device. It periodically calibrates the amplitude and frequency accuracy of the output signal of the signal generation unit, verifies the parameter measurement accuracy of the data acquisition unit, and corrects the simulation accuracy of the action time and contact resistance of the analog switch unit. The calibration process is automatically triggered or manually started, and the calibration results are stored in the test control unit as the basis for correcting subsequent test data.

[0009] Furthermore, the data analysis unit uses an environmental impact compensation algorithm to correct the test results. The compensation calculation expression is as follows: in The actual parameter values ​​after compensation. These are the original parameter values ​​collected. This is the temperature compensation coefficient. To test the ambient temperature, Standard ambient temperature, This is the humidity compensation coefficient. To test the ambient humidity, Standard ambient humidity, This is the air pressure compensation coefficient. To test the ambient air pressure, This refers to the standard ambient air pressure.

[0010] Furthermore, the fault injection unit incorporates a fault level assessment model, the assessment expression of which is: in Fault level, Weighting for the impact of faults. For fault persistence weight, This is the ratio of the expected duration of the fault to the single operating cycle of the switch. For fault recurrence weight, This represents the probability of fault recurrence.

[0011] Furthermore, the response time measurement of the data acquisition unit employs a signal synchronization correction method to eliminate errors caused by system delay. The correction calculation expression is as follows: in The actual response time of the switch. The total delay time collected. The signal output delay of the signal generation unit. For the signal transmission delay of the data acquisition unit, and Pre-measurement and storage are performed using a calibration unit.

[0012] Furthermore, the stability assessment of the analog switching unit adopts a long-term operational fluctuation analysis model, the analysis expression of which is: in For parameter fluctuation coefficient, This represents the total number of long-term tests. For the first The parameter values ​​for this test, for The average value of the parameters from each test is used to monitor the parameter fluctuations of the analog switch under long-term continuous operation in real time through this model, and to provide timely feedback on changes in simulation accuracy.

[0013] Furthermore, this includes the following steps: Test preparation steps: Connect the analog switch unit, signal generation unit, and data acquisition unit according to the preset topology; check the power supply and communication links of each module; complete the system preheating calibration through the calibration unit; and initialize the test parameter library and log storage module of the test control unit. The parameter configuration steps involve receiving external test commands through the communication interaction unit, setting the test type and output parameters of the signal generation unit, configuring the action parameters of the analog switch unit, and presetting the fault type, injection timing, and duration of the fault injection unit. The simulation operation steps involve the test control unit sending a start command, the signal generation unit outputting a preset electrical signal, the simulation switch unit performing on / off actions according to the configured parameters, simulating the actual working scenario operation state, and receiving synchronization commands. The data acquisition process involves the data acquisition unit collecting electrical parameters during the operation of the analog switch at a set frequency. The collected data is transmitted to the data analysis unit in real time and backed up to the storage module of the test control unit. The fault injection process involves activating the fault injection unit at preset times during simulated operation to inject the set fault, continuously collecting electrical parameters and switch action responses under fault conditions, recording the complete data chain, and switching back to normal operation after the test is completed. In the data analysis step, the data analysis unit filters, reduces noise, and normalizes the raw data, corrects the data by combining environmental compensation algorithms, extracts key performance indicators and compares them with preset standard parameters, and evaluates the switch performance and fault response characteristics. In the results output step, the test control unit integrates the analysis results and test logs to generate a structured test report containing performance details, fault conclusions, and stability assessments. This report is then uploaded to an external terminal via the communication interaction unit, while the data and report are stored locally for subsequent querying and traceability.

[0014] Furthermore, the dynamic load adjustment in the parameter configuration step employs an adaptive matching algorithm, dynamically adjusting the load parameters based on the rated parameters of the analog switch and the test type. The adjustment expression is as follows: in This is the dynamically adjusted load value. To simulate the rated load of the switch, For testing type coefficients, The switch state coefficient is used to match the test load with the switch operating state through dynamic load adjustment.

[0015] Furthermore, the multi-scenario collaborative testing in the simulation operation steps is completed through a scenario parameter matrix. The test control unit presets different environmental scenario parameters for high temperature, low temperature, high humidity, and electromagnetic interference, and switches scenarios sequentially or randomly. Each scenario runs continuously for a preset duration and collects complete data. When switching scenarios, the test control unit synchronously adjusts the parameters of the signal generation unit to simulate the switching unit. After the multi-scenario test is completed, the data analysis unit compares the differences in switching performance under different scenarios.

[0016] Compared with existing technologies, the beneficial effects of this invention are: The test system and method for simulating switches of the present invention address many limitations of the prior art by achieving a comprehensive improvement in test performance through multi-module collaborative design and algorithm optimization, demonstrating significant application advantages.

[0017] First, the system boasts exceptional adaptability to various switch types, with flexible and convenient parameter adjustment, effectively addressing the narrow compatibility issue of traditional systems. The analog switch unit precisely adapts to the testing needs of multiple switch types, including mechanical and electronic switches, supporting flexible settings for key parameters such as switching frequency, travel distance, contact pressure, rated voltage, and rated current. It accurately replicates the actual operating characteristics of different switches, meeting diverse testing scenarios ranging from micro-consumer electronic switches to industrial high-voltage switches. The signal generation unit can generate various electrical signals, including DC voltage, AC voltage, constant current, and pulse current, with precise adjustment of amplitude, frequency, and waveform. This comprehensively covers the rated and extreme parameter testing requirements of switches, providing ample signal support for evaluating the switch's load-bearing capacity and response characteristics.

[0018] Secondly, the combination of anti-interference processing and periodic calibration mechanisms significantly improves the accuracy and long-term consistency of test data. The anti-interference processing unit employs an electromagnetic shielding structure, shielded cable grounding, and adaptive filtering algorithms to effectively block external electromagnetic radiation and power supply noise interference, preventing the test circuit from being affected by transient pulses and ensuring the stability of signal generation and the authenticity of data acquisition. The calibration unit incorporates standard resistors, standard voltage sources, standard timers, and other components, and can automatically or manually initiate the calibration process to periodically correct signal generation accuracy, data acquisition accuracy, and analog switch action accuracy. This avoids parameter drift caused by long-term use, ensuring good comparability of test data across different periods and environments, and providing reliable support for test conclusions.

[0019] Furthermore, the environmental compensation, synchronous correction, and graded fault injection design further optimize the testing accuracy and relevance. The environmental impact compensation algorithm in the data analysis unit can quantify and correct the impact of environmental factors such as temperature, humidity, and air pressure on the test results, improving the comparability of data under different environments. The signal synchronous correction method in the data acquisition unit effectively eliminates errors caused by system delays and optimizes the measurement accuracy of key parameters such as on / off response time. The graded evaluation model built into the fault injection unit can quantify the fault level based on the degree of impact of the fault on the switching function, duration, and recurrence probability, automatically adjusting the injection intensity and testing focus to achieve comprehensive fault simulation from minor contact defects to severe short circuits. This accurately evaluates the response characteristics of the switch under different fault levels, solving the shortcomings of traditional fault testing in terms of incomplete coverage.

[0020] Furthermore, dynamic load adjustment and multi-scenario collaborative testing capabilities enable comprehensive evaluation of switch performance. The dynamic load adaptive matching algorithm in the parameter configuration stage can adjust load parameters in real time according to the switch's rated parameters, test type, and operating status, ensuring precise matching between the test load and the switch's actual operating state, fully covering performance testing requirements under different operating conditions. The testing system supports switching between various complex environmental scenarios such as high temperature, low temperature, high humidity, and electromagnetic interference. Complete data is continuously collected in each scenario, maintaining test continuity and data integrity during scenario switching. The data analysis unit compares performance differences under different scenarios, comprehensively evaluating the switch's environmental adaptability. Simultaneously, the communication interaction unit supports wired and wireless data transmission, enabling real-time interaction with external control terminals and switch management systems. Local storage of test data and structured reports facilitates subsequent retrieval and traceability, improving the convenience and manageability of testing work.

[0021] Overall, this invention comprehensively solves the problems of poor adaptability, insufficient accuracy, weak targeting, and incomplete evaluation of traditional analog switch testing systems through multi-module collaboration, algorithm optimization, and scenario adaptation design. It provides an efficient, accurate, and reliable testing solution for switch research and development, production, and operation and maintenance, and has broad application value in fields such as electronic manufacturing, power operation and maintenance, and industrial control. Attached Figure Description

[0022] Figure 1 This is a schematic block diagram of a test system and method for simulating switches proposed in this invention; Figure 2 This is a schematic block diagram of a method for a test system for simulating switches proposed in this invention; Figure 3 A bar chart comparing the compatibility of different types of switches; Figure 4 Line graph showing test accuracy under different electromagnetic interference intensities; Figure 5 Error bar chart comparing test errors for key parameters; Figure 6 A bar chart comparing fault type coverage. Detailed Implementation

[0023] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0024] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0025] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more of the stated features. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified. Furthermore, the terms "installed," "connected," and "linked" should be interpreted broadly; for example, they may refer to a fixed connection, a detachable connection, or an integral connection; they may refer to a mechanical connection or an electrical connection; they may refer to a direct connection or an indirect connection through an intermediate medium; and they may refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances. The invention will now be described in further detail with reference to the accompanying drawings.

[0026] Reference Figures 1 to 6 A test system for simulating switches, comprising the following modules: The test control unit, as the core of the system, coordinates the collaborative work of various modules, receives and parses external test commands, generates corresponding control signals, monitors the test process status in real time, records test logs and abnormal information, and outputs test results. The analog switch unit is adapted to the simulation needs of different types of switches, such as mechanical switches and electronic switches. It can simulate on and off actions and state holding, and supports setting key parameters such as on and off frequency, action stroke, contact pressure, rated voltage, and rated current to restore the actual working characteristics of the switch. The signal generation unit generates various electrical signals required for testing, including DC voltage, AC voltage, constant current, and pulse current. The signal amplitude, frequency, and waveform can be precisely adjusted to meet the testing requirements of the rated and extreme parameters of different switches. The data acquisition unit collects electrical parameters during the simulated switch operation process, including on / off response time, contact resistance, on-state voltage drop, off-state leakage current, and arc duration. The acquisition frequency can be adjusted according to the test accuracy requirements. The fault injection unit simulates common switch fault scenarios, including fault types such as poor contact, contact adhesion, short circuit, open circuit, arc, and abnormal fault. The timing, duration, and severity of fault injection can be set. The data analysis unit receives the raw data transmitted by the data acquisition unit, performs filtering, noise reduction, and normalization processing, and evaluates the electrical performance and fault status of the analog switch through feature extraction and parameter comparison. The communication interaction unit supports wired and wireless communication, enabling data interaction with external control terminal switch management systems, uploading test data status information and analysis results, and receiving external configuration commands and parameter modification requests.

[0027] This invention also includes an anti-interference processing unit. This unit uses an electromagnetic shielding structure to enclose the signal generation unit and the data acquisition unit to reduce external electromagnetic radiation interference. The signal transmission line uses shielded cables and is grounded. An adaptive filtering algorithm is added to the data acquisition stage to filter power supply noise and environmental interference signals. The signal generation unit has a built-in voltage stabilization module and current limiting protection to avoid instantaneous pulse interference to the test circuit and improve the accuracy and stability of test data under complex electromagnetic environments.

[0028] The invention also includes a calibration unit, which incorporates a standard resistor, standard voltage source, and standard timer calibration device. This unit periodically calibrates the amplitude and frequency accuracy of the output signal of the signal generation unit, verifies the parameter measurement accuracy of the data acquisition unit, and corrects the simulation accuracy of the action time and contact resistance of the analog switch unit. The calibration process is automatically triggered or manually started, and the calibration results are stored in the test control unit as a basis for correcting subsequent test data, thereby improving the consistency and reliability of the system in long-term testing.

[0029] In this invention, the data analysis unit uses an environmental impact compensation algorithm to correct the test results. The compensation calculation expression is as follows: in The actual parameter values ​​after compensation. These are the original parameter values ​​collected. This is the temperature compensation coefficient. To test the ambient temperature, Standard ambient temperature, This is the humidity compensation coefficient. To test the ambient humidity, Standard ambient humidity, This is the air pressure compensation coefficient. To test the ambient air pressure, Using standard ambient air pressure, the impact of temperature, humidity, and air pressure changes on test results is reduced through quantitative compensation of environmental factors, thereby improving the comparability of test data under different environments.

[0030] In this invention, the fault injection unit incorporates a fault level assessment model, achieving graded injection by quantifying the impact of faults on switching performance. The assessment expression is as follows: in This represents the fault level, ranging from 1 to 5. Higher values ​​indicate more severe fault impact. The fault impact weight is represented by I, which is the coefficient of the degree of impact of the fault on the switching function, and its value ranges from 0 to 1. For fault persistence weight, This is the ratio of the expected duration of the fault to the single operating cycle of the switch. For fault recurrence weight, The probability of fault recurrence is denoted by a value between 0 and 1. The fault injection intensity and testing focus are automatically adjusted according to the fault level to improve the pertinence and comprehensiveness of fault testing.

[0031] In this invention, the response time measurement of the data acquisition unit adopts a signal synchronization correction method to eliminate errors caused by system delay. The correction calculation expression is as follows: in The actual response time of the switch. The total delay time collected. The signal output delay of the signal generation unit. For the signal transmission delay of the data acquisition unit, and Pre-measurement and storage via a calibration unit allow for automatic calibration during each response time test, improving the accuracy of switch on / off response time measurements.

[0032] In this invention, the stability assessment of the analog switching unit adopts a long-term operational fluctuation analysis model, and the analysis expression is as follows: in This is the parameter fluctuation coefficient; the smaller the value, the better the stability. This represents the total number of long-term tests. For the first The parameter values ​​for this test, for The average value of the parameters from each test is used to monitor the parameter fluctuations of the analog switch in real time during long-term continuous operation, providing timely feedback on changes in simulation accuracy and offering a basis for system maintenance and calibration.

[0033] This invention includes the following steps: Test preparation steps: Connect the analog switch unit, signal generation unit, and data acquisition unit according to the preset topology; check the power supply status and communication link of each module; perform preheating calibration of the system through the calibration unit to eliminate initial errors; and initialize the test parameter library and log storage module of the test control unit. The parameter configuration steps involve receiving external test commands through the communication interaction unit, setting the test type to include conventional performance tests, limit parameter tests, and fault simulation tests, configuring the output parameters of the signal generation unit including signal type, amplitude, frequency, and duration, setting the action parameters of the simulation switch unit including on / off frequency, action stroke, and contact pressure, and presetting the fault type, injection timing, and duration of the fault injection unit. The simulation operation steps involve the test control unit sending a start command, the signal generation unit outputting a preset electrical signal, and the simulated switch unit performing on / off actions according to the configuration parameters to simulate the switch operation state under actual working conditions. It continuously receives synchronous commands from the test control unit to achieve coordination between actions and signal output. The data acquisition process involves the data acquisition unit collecting electrical parameters during the operation of the analog switch at a set frequency, including on / off response time, contact resistance, on-state voltage drop, off-state leakage current, and arc duration. The collected data is transmitted to the data analysis unit in real time and backed up to the storage module of the test control unit. The fault injection process involves activating the fault injection unit at preset times during the simulation operation, injecting a fault of a set type, continuously collecting electrical parameters and switch action responses under the fault state, recording the complete data chain from fault occurrence to recovery, and switching back to normal operation after the fault test is completed. In the data analysis step, the data analysis unit performs filtering, noise reduction, and normalization processing on the collected raw data, corrects the data by combining environmental compensation algorithms, obtains key performance indicators of the switch through feature extraction, compares them with preset standard parameters, and evaluates the performance compliance and fault response characteristics of the simulated switch. In the results output step, the test control unit integrates the data analysis results and test logs to generate a structured test report, which includes detailed performance parameters, fault analysis conclusions, and stability assessment results. The report is then uploaded to an external control terminal via the communication interaction unit, while the test data and report are stored locally for subsequent querying and traceability.

[0034] In this invention, the dynamic load adjustment in the parameter configuration step employs an adaptive matching algorithm, dynamically adjusting the load parameters based on the rated parameters of the analog switch and the test type. The adjustment expression is as follows: in This is the dynamically adjusted load value. To simulate the rated load of the switch, The coefficients are set to 1.0 for routine performance testing, 1.5 for extreme parameter testing, and 1.2 for fault simulation testing. The switch state coefficient is 1.0 for the on state and 0.1 for the off state. By dynamically adjusting the load, the test load and the switch operating state are accurately matched, comprehensively covering the switch performance test requirements under different operating conditions.

[0035] In this invention, multi-scenario collaborative testing in the simulation operation steps is achieved through a scenario parameter matrix. The test control unit presets scenario parameters for different environments such as high temperature, low temperature, high humidity, and electromagnetic interference, and switches scenarios sequentially or randomly to simulate the working state of the switch in complex environments. Each scenario runs continuously for a preset duration and collects complete data. When switching scenarios, the test control unit synchronously adjusts the parameters of the simulated switch unit through the signal generation unit to achieve the continuity of testing and data integrity during scenario switching. After the multi-scenario test is completed, the data analysis unit compares the differences in switch performance under different scenarios to comprehensively evaluate the environmental adaptability of the simulated switch.

[0036] The following two examples further illustrate the specific implementation of this system: Example 1: Application of Industrial Mechanical Switch Simulation Testing System This embodiment is applied to the industrial mechanical switch testing scenario of a factory's power control system. In this scenario, the mechanical switch needs to withstand high voltage and high current, and the working environment is subject to strong electromagnetic interference. The testing requirements include routine performance verification, extreme parameter testing, and various fault simulations. It is necessary to accurately evaluate the switch's switching response, contact stability, fault tolerance, and environmental adaptability to ensure that the switch operates reliably in a complex industrial environment.

[0037] The configuration and collaborative workflow of each module in the testing system are as follows: The test control unit adopts an industrial-grade controller, equipped with dedicated test management software, and has multi-threaded processing capabilities. It can coordinate the work of 6 modules simultaneously. After receiving test commands from an external PC, it completes parsing and generates control signals within 100 milliseconds, monitors the operating status of each module in real time, records a test log every 50 milliseconds, and immediately triggers log marking and status reporting when an anomaly occurs. The analog switch unit is adapted to the factory's high-voltage mechanical switches, supporting adjustable switching frequency from 0.1 to 10 Hz, adjustable travel from 5 to 20 mm, and adjustable contact pressure from 10 to 50 N. It achieves precise switching action through servo motor drive, with the status holding error controlled within ±1%, and can truly reproduce the mechanical characteristics and electrical response of the mechanical switch.

[0038] The signal generation unit can output 0 to 10kV DC voltage, 0 to 5kV AC voltage, 0 to 1000A constant current, and 0 to 500A pulse current. The voltage amplitude adjustment accuracy is ±0.1%, and the frequency adjustment range is 50 to 1000Hz. The waveform supports switching between sine wave, square wave, and triangle wave, meeting the requirements for rated parameter testing and ultimate withstand voltage and current testing of mechanical switches. The data acquisition unit is equipped with a high-precision acquisition card with a maximum acquisition frequency of 1MHz. It can simultaneously acquire parameters such as on / off response time, contact resistance, on-state voltage drop, off-state leakage current, and arc duration. The contact resistance measurement accuracy is ±0.01Ω, and the response time measurement resolution is 1 microsecond.

[0039] The anti-interference processing unit uses a 304 stainless steel electromagnetic shield to enclose the signal generation unit and data acquisition unit, achieving a shielding effectiveness of over 40dB. The signal transmission line uses twisted-pair shielded cables with both ends of the shield grounded, resulting in a grounding resistance of less than 1Ω. The adaptive filtering algorithm in the data acquisition stage dynamically adjusts filtering parameters based on the frequency of the interference signal, filtering 50Hz power supply noise and electromagnetic interference signals from 200 to 500MHz. The calibration unit incorporates a 0.01-grade standard resistor, a 0.02-grade standard voltage source, and a high-precision timer. It automatically initiates a calibration process weekly to calibrate the output amplitude and frequency of the signal generation unit and verify the measurement accuracy of the data acquisition unit. The calibration results are stored in the encrypted storage module of the test control unit, and the corrected data is automatically retrieved during each test.

[0040] The fault injection unit can simulate five fault types: poor contact, contact sticking, short circuit, open circuit, and abnormal arcing. For poor contact faults, the contact resistance fluctuation range can be set; for contact sticking faults, the sticking duration can be set; and for short circuit faults, the short circuit current level can be set. Fault injection timing supports two modes: timed injection and triggered injection. Triggered injection can be linked to on / off action signals, injecting the fault at the instant the switch is turned on or off. The communication interaction unit simultaneously supports Ethernet wired communication and 4G wireless communication, enabling real-time interaction with the factory switch management system. It uploads test data, status information, and analysis results, and receives parameter modification commands from the system. The data transmission rate reaches 10Mbps, and the transmission latency is less than 50 milliseconds.

[0041] The testing method is performed according to the following steps: In the test preparation phase, the analog switch unit, signal generation unit, and data acquisition unit are connected in a star topology. The stability of the power supply voltage to each module and the smoothness of the communication link are checked. Preheating calibration is performed using the calibration unit for 15 minutes to eliminate the influence of initial module temperature drift. The test control unit initializes the test parameter library and creates a dedicated test log file. In the parameter configuration phase, the test type is set to routine performance test + extreme parameter test + fault simulation test via the PC. The signal generation unit is configured to output 3kV AC voltage and 500A constant current. The analog switch unit is set to a switching frequency of 1Hz, an operating stroke of 10mm, and a contact pressure of 30N. A fault injection unit is preset to inject poor contact and short-circuit faults. The contact resistance fluctuation range for poor contact faults is 5 to 10Ω, and the short-circuit fault current level is 800A. The injection timing is 10 milliseconds after the switch is turned on.

[0042] During the simulation operation phase, the test control unit sends a start command, the signal generation unit outputs a preset electrical signal, and the simulated switch unit executes switching actions according to the configured parameters. After each switching action, a status signal is fed back to the test control unit to ensure coordination between action and signal output. The data acquisition unit collects electrical parameters at a frequency of 100kHz and transmits them in real time to the data analysis unit, while simultaneously backing them up to the local storage of the test control unit. In the fault injection phase, a poor contact fault is triggered during the 100th switching operation, lasting for 5 switching cycles. A short circuit fault is triggered during the 200th switching operation, lasting for 2 switching cycles, collecting the complete data chain under the fault conditions. In the data analysis phase, the data analysis unit filters, reduces noise, and normalizes the raw data, corrects the data using an environmental compensation algorithm, extracts key switch performance indicators, and compares them with preset standard parameters. In the results output phase, a structured test report is generated, including detailed performance parameters, fault analysis conclusions, and stability assessment results. This report is uploaded to the factory switch management system via the communication interaction unit, while the test data and report are stored locally.

[0043] Table 1 Performance Comparison of Industrial Mechanical Switch Testing Systems Table 1 clearly demonstrates the advantages of this invention in industrial mechanical switch testing scenarios. Traditional testing systems can only be adapted to specific models of mechanical switches, have weak electromagnetic interference resistance, suffer severe data distortion in the strong electromagnetic environment of factories, and can only cover two simple faults: short circuit and open circuit. This invention, through flexible parameter configuration and adaptation design, can be adapted to various specifications of industrial mechanical switches. The anti-interference processing unit effectively blocks electromagnetic interference, the calibration and environmental compensation mechanism improves data accuracy, and the fault injection unit covers five common fault types, comprehensively meeting the testing needs of mechanical switches in industrial scenarios and providing reliable support for switch quality control.

[0044] Example 2: Application of Electronic Switch Simulation Test System This embodiment applies to the testing scenario of miniature electronic switches in the consumer electronics field. The electronic switches in this scenario are characterized by small size, high switching frequency, and low rated parameters. They are used in devices such as smartphones and tablets. The testing requirements include high-frequency switching performance, contact stability, simulation of minor faults, and multi-environment adaptability testing. It is necessary to accurately evaluate the performance of the switch under high-frequency operation and complex environment to ensure the user experience of consumer electronics products.

[0045] The configuration and collaborative workflow of each module in the testing system are as follows: The test control unit adopts a compact controller with an integrated touch operation interface, supporting local and remote control. After receiving test commands from an external mobile terminal, it completes parsing and generates control signals within 50 milliseconds, monitors the operating status of each module in real time, records a test log every 20 milliseconds, and supports visual display of the test process. The analog switch unit is adapted to a miniature electronic switch, supporting adjustable switching frequency from 10 to 1000 Hz, adjustable travel distance from 0.1 to 5 mm, and adjustable contact pressure from 0.5 to 5 N. Driven by a miniature stepper motor, the repeatability and positioning accuracy reaches ±0.01 mm, accurately simulating the high-frequency switching action and small travel characteristics of electronic switches.

[0046] The signal generation unit can output 0 to 5V DC voltage, 0 to 10V AC voltage, 0 to 5A constant current, and 0 to 10A pulse current. The voltage amplitude adjustment accuracy is ±0.05%, and the frequency adjustment range is 100 to 10000Hz. The waveform supports switching between sine wave, square wave, and sawtooth wave, meeting the low voltage and low current testing requirements of electronic switches. The data acquisition unit adopts a miniature acquisition module with a maximum acquisition frequency of 5MHz. It can simultaneously acquire parameters such as on / off response time, contact resistance, on-state voltage drop, off-state leakage current, and arc duration. The contact resistance measurement accuracy is ±0.001Ω, and the response time measurement resolution is 0.1 microseconds.

[0047] The anti-interference processing unit uses an aluminum alloy electromagnetic shielding box to enclose the signal generation unit and data acquisition unit, achieving a shielding effectiveness of over 35dB. The signal transmission line uses ultra-fine shielded cables with a diameter of less than 1 mm. The shielding layer is grounded at one end, with a grounding resistance of less than 2Ω. The adaptive filtering algorithm in the data acquisition stage can filter interference signals in the range of 1kHz to 1MHz, adapting to the slight electromagnetic interference in consumer electronics testing environments. The calibration unit incorporates a 0.001-level standard resistor, a 0.01-level standard voltage source, and a high-precision timer, automatically initiating a calibration process monthly. Manual calibration is also supported. Calibration results are stored in the flash memory module of the test control unit, and corrected data is automatically retrieved during testing.

[0048] The fault injection unit can simulate five fault types: poor contact, contact adhesion, short circuit, open circuit, and abnormal arcing. For poor contact faults, the contact resistance fluctuation range can be set from 0.1 to 1Ω; for contact adhesion faults, the adhesion trigger probability can be set; and for short circuit faults, the short circuit current level can be set from 0.5 to 5A. Fault injection timing supports three modes: timed injection, count injection, and voltage-triggered injection, adapting to the subtle fault simulation needs of electronic switches. The communication interaction unit supports Wi-Fi wireless communication and USB wired communication, exchanging data with external mobile terminals and consumer electronics test management platforms, uploading test data, status information, and analysis results, and receiving parameter configuration commands. The wireless communication transmission rate reaches 50Mbps, with a transmission latency of less than 30 milliseconds.

[0049] The testing method is performed according to the following steps: In the test preparation phase, the analog switch unit, signal generation unit, and data acquisition unit are connected in a point-to-point topology. The power supply to each module is checked for normal operation, and the communication link is verified for smooth operation. Preheating calibration is performed using the calibration unit for 10 minutes to eliminate initial module errors. The test control unit initializes the test parameter library and log storage module. In the parameter configuration phase, the test type is set to high-frequency performance test + fault simulation test + multi-environment test via the mobile terminal. The signal generation unit is configured to output 3.3V DC voltage and 1A constant current. The analog switch unit's switching frequency is set to 500Hz, the travel distance to 1mm, and the contact pressure to 1N. A fault injection unit is preset to inject poor contact and arcing faults. For poor contact faults, the contact resistance fluctuation range is set to 0.3 to 0.8Ω. For arcing faults, the arc duration is extended by 50%. The injection timing is the instant of switch switching.

[0050] During the simulation operation phase, the test control unit sends a start command, the signal generation unit outputs a preset electrical signal, and the simulated switching unit performs high-frequency switching actions according to the configured parameters. Every 100 switching actions, a status signal is fed back to the test control unit to ensure coordination between action and signal output. The data acquisition unit collects electrical parameters at a frequency of 1MHz and transmits them in real time to the data analysis unit, while simultaneously backing them up to the local storage of the test control unit. During the fault injection phase, a poor contact fault is triggered at the 5000th switching action in the simulation, lasting for 100 switching cycles. An arcing fault is triggered at the 10000th switching action, lasting for 50 switching cycles, and a complete data chain under fault conditions is collected.

[0051] In the multi-environment testing phase, three environmental scenarios—high temperature 60℃, low temperature -20℃, and high humidity 90%RH—were simulated using an environmental test chamber. Scenarios were switched sequentially, with each scenario running continuously for one hour. During scenario switching, the test control unit synchronously adjusted the parameters of the signal generation unit and the simulated switch unit to ensure test continuity, collecting electrical parameters and action response data under different environments. In the data analysis phase, the data analysis unit filtered, reduced noise, and normalized the raw data, corrected the data using an environmental compensation algorithm, extracted key switch performance indicators, and compared them with preset standard parameters. In the results output phase, a structured test report was generated, including high-frequency performance details, fault analysis conclusions, and environmental adaptability assessment results. This report was uploaded to the consumer electronics test management platform via the communication interaction unit, while the test data and report were stored locally.

[0052] Table 2 Performance Comparison of Electronic Switch Testing Systems Table 2 highlights the application value of this invention in electronic switch testing scenarios. Traditional testing systems struggle to simulate the high-frequency switching actions of electronic switches, lack sufficient accuracy in simulating minor faults, fail to cover faults such as minute contact resistance fluctuations, and have poor adaptability to various environments, only capable of testing under normal temperature and humidity conditions. This invention's simulated switch unit supports high-frequency, high-precision action simulation, its fault injection unit can accurately simulate minute faults, its multi-environment testing capabilities adapt to the complex application scenarios of consumer electronics, and its high-resolution data acquisition unit ensures accurate capture of minute parameter changes, comprehensively meeting the testing needs of micro-electronic switches and providing strong support for improving the quality of consumer electronics products.

[0053] Reference Figure 3 This diagram clearly demonstrates the multi-type switch compatibility advantages of the system of this invention. Traditional testing systems are highly targeted, adapting only to a few specific types of switches, with a compatibility rate generally below 55%, failing to meet diverse testing needs. This invention, through flexible parameter configuration of the analog switch unit, supports a wide range of adjustments to key parameters such as switching frequency, operating stroke, and contact pressure. Combined with the multi-type signal output of the signal generation unit, it can accurately adapt to various types of switches, including industrial mechanical switches, high-voltage power switches, and miniature semiconductor switches, maintaining a compatibility rate of over 94%. This advantage solves the pain point of the narrow compatibility range of traditional systems, eliminating the need for separate testing equipment for different types of switches, significantly improving testing efficiency and versatility, and reducing testing costs.

[0054] Reference Figure 4This diagram visually demonstrates the strong anti-interference capability of the system of this invention. Traditional testing systems lack effective anti-interference design; as the intensity of electromagnetic interference increases, the testing accuracy drops sharply, falling below 50% under strong interference environments, failing to guarantee the reliability of test data. This invention, through the electromagnetic shielding structure of the anti-interference processing unit, the grounding design of the shielded cable, and the adaptive filtering algorithm, effectively blocks external electromagnetic radiation and power supply noise interference. Even under extremely strong interference environments, the testing accuracy remains above 95%. This design ensures stable operation of the system in industrial strong electromagnetic environments and multi-device interference scenarios in consumer electronics, providing strong assurance for the authenticity and accuracy of test data and expanding the system's application scope.

[0055] Reference Figure 5 This figure highlights the high testing accuracy of the system of this invention. Traditional testing systems lack a complete calibration and correction mechanism. Affected by system delays and environmental factors, the testing errors of key parameters generally exceed ±2.8%, and some parameters, such as arc duration, have errors of ±5.1%, failing to accurately reflect the true performance of the switch. This invention corrects parameter drift through periodic calibration by the calibration unit, reduces the impact of temperature and humidity through environmental compensation algorithms in the data analysis unit, and eliminates system delay errors through synchronous correction methods in the data acquisition unit, ensuring that the testing errors of each key parameter are controlled within ±0.7%. The high-precision test data provides a reliable basis for switch performance evaluation, helps to accurately identify product defects, and improves the quality control level of switch R&D and production.

[0056] Reference Figure 6 This figure illustrates the comprehensiveness of the fault testing system of this invention. Traditional testing systems have limited fault injection capabilities, simulating only common faults such as short circuits and open circuits. Their coverage of complex faults like poor contact and abnormal arcing is low, failing to comprehensively assess the fault tolerance of switches. The fault injection unit of this invention incorporates a hierarchical evaluation model, accurately simulating five common faults: poor contact, contact adhesion, short circuit, open circuit, and abnormal arcing, achieving 100% coverage. Furthermore, it can adjust the injection intensity and testing focus according to the fault severity. This design ensures that the testing process comprehensively covers fault scenarios that may occur in actual switch operation, accurately assessing the switch's response characteristics under different fault levels, and providing a scientific basis for switch reliability design and fault diagnosis.

[0057] The above are merely preferred embodiments of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A test system for simulating switches, characterized in that, Includes the following modules: The test control unit, as the core of the system, coordinates the collaborative work of various modules, receives and parses external test commands, generates corresponding control signals, and monitors the test process status in real time. The analog switch unit is adapted to the simulation requirements of different types of switches. It can simulate on / off actions and state holding, and supports setting key parameters such as on / off frequency, action stroke, contact pressure, rated voltage, and rated current to reproduce the actual working characteristics of the switch. The signal generation unit generates various electrical signals required for testing, including DC voltage, AC voltage, constant current, and pulse current. The signal amplitude, frequency, and waveform can be adjusted. The data acquisition unit collects electrical parameters during the simulated switch operation process, including on / off response time, contact resistance, on-state voltage drop, off-state leakage current, and arc duration. The fault injection unit simulates common switch fault scenarios, including fault types such as poor contact, contact adhesion, short circuit, open circuit, arcing and abnormal faults. The timing, duration and severity of fault injection can be set. The data analysis unit receives the raw data transmitted by the data acquisition unit, performs filtering, noise reduction, and normalization processing, and evaluates the electrical performance and fault status of the analog switch through feature extraction and parameter comparison. The communication interaction unit supports wired and wireless communication, enabling data interaction with external control terminal switch management systems, uploading test data status information and analysis results, and receiving external configuration commands and parameter modification requests.

2. The test system for simulating a switch according to claim 1, characterized in that, It also includes an anti-interference processing unit, which uses an electromagnetic shielding structure to enclose the signal generation unit and the data acquisition unit. The signal transmission line uses shielded cables and is grounded. An adaptive filtering algorithm is added to the data acquisition stage to filter power supply noise and environmental interference signals. The signal generation unit has a built-in voltage stabilization module and current limiting protection.

3. The test system for simulating a switch according to claim 1, characterized in that, It also includes a calibration unit, which has built-in standard resistor, standard voltage source, and standard timer calibration devices. It periodically calibrates the amplitude and frequency accuracy of the output signal of the signal generation unit, verifies the parameter measurement accuracy of the data acquisition unit, and corrects the simulation accuracy of the action time and contact resistance of the analog switch unit. The calibration process is automatically triggered or manually started, and the calibration results are stored in the test control unit as the basis for correcting subsequent test data.

4. The test system for simulating a switch according to claim 1, characterized in that, The data analysis unit uses an environmental impact compensation algorithm to correct the test results. The compensation calculation expression is as follows: in The actual parameter values ​​after compensation. These are the original parameter values ​​collected. This is the temperature compensation coefficient. To test the ambient temperature, Standard ambient temperature, This is the humidity compensation coefficient. To test the ambient humidity, Standard ambient humidity, This is the air pressure compensation coefficient. To test the ambient air pressure, This refers to the standard ambient air pressure.

5. A test system for simulating a switch according to claim 1, characterized in that, The fault injection unit has a built-in fault level evaluation model, and the evaluation expression is as follows: in Fault level, Weighting for the impact of faults. For fault persistence weight, This is the ratio of the expected duration of the fault to the single operating cycle of the switch. For fault recurrence weight, This represents the probability of fault recurrence.

6. The test system for simulating a switch according to claim 1, characterized in that, The response time measurement of the data acquisition unit adopts a signal synchronization correction method to eliminate errors caused by system delay. The correction calculation expression is as follows: in The actual response time of the switch. The total delay time collected. The signal output delay of the signal generation unit. For the signal transmission delay of the data acquisition unit, and Pre-measurement and storage are performed using a calibration unit.

7. A test system for simulating a switch according to claim 1, characterized in that, The stability assessment of the analog switching unit adopts a long-term operational fluctuation analysis model, and the analysis expression is as follows: in For parameter fluctuation coefficient, This represents the total number of long-term tests. For the first The parameter values ​​for this test, for The average value of the parameters from each test is used to monitor the parameter fluctuations of the analog switch under long-term continuous operation in real time through this model, and to provide timely feedback on changes in simulation accuracy.

8. A test method for simulating a switch to implement the system according to any one of claims 1-7, characterized in that, The method includes the following steps: Test preparation steps: Connect the analog switch unit, signal generation unit, and data acquisition unit according to the preset topology; check the power supply and communication links of each module; complete the system preheating calibration through the calibration unit; and initialize the test parameter library and log storage module of the test control unit. The parameter configuration steps involve receiving external test commands through the communication interaction unit, setting the test type and output parameters of the signal generation unit, configuring the action parameters of the analog switch unit, and presetting the fault type, injection timing, and duration of the fault injection unit. The simulation operation steps involve the test control unit sending a start command, the signal generation unit outputting a preset electrical signal, the simulation switch unit performing on / off actions according to the configured parameters, simulating the actual working scenario operation state, and receiving synchronization commands. The data acquisition process involves the data acquisition unit collecting electrical parameters during the operation of the analog switch at a set frequency. The collected data is transmitted to the data analysis unit in real time and backed up to the storage module of the test control unit. The fault injection process involves activating the fault injection unit at preset times during simulated operation to inject the set fault, continuously collecting electrical parameters and switch action responses under fault conditions, recording the complete data chain, and switching back to normal operation after the test is completed. In the data analysis step, the data analysis unit filters, reduces noise, and normalizes the raw data, corrects the data by combining environmental compensation algorithms, extracts key performance indicators and compares them with preset standard parameters, and evaluates the switch performance and fault response characteristics. In the results output step, the test control unit integrates the analysis results and test logs to generate a structured test report containing performance details, fault conclusions, and stability assessments. This report is then uploaded to an external terminal via the communication interaction unit, while the data and report are stored locally for subsequent querying and traceability.

9. A test method for simulating a switch according to claim 8, characterized in that, The dynamic load adjustment in the parameter configuration step uses an adaptive matching algorithm to dynamically adjust the load parameters based on the rated parameters of the analog switch and the test type. The adjustment expression is as follows: in This is the dynamically adjusted load value. To simulate the rated load of the switch, For testing type coefficients, The switch state coefficient is used to match the test load with the switch operating state through dynamic load adjustment.

10. A test method for simulating a switch according to claim 8, characterized in that, The multi-scenario collaborative test in the simulation operation is completed through a scenario parameter matrix. The test control unit presets different environmental scenario parameters for high temperature, low temperature, high humidity, and electromagnetic interference, and switches scenarios sequentially or randomly. Each scenario runs continuously for a preset duration and collects complete data. When switching scenarios, the test control unit synchronously adjusts the parameters of the signal generation unit to simulate the switching unit. After the multi-scenario test is completed, the data analysis unit compares the differences in switching performance under different scenarios.

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