Multi-stage output voltage power supply, detection system and detection method

Abstract

A multi-output voltage power supply, a detection system and a detection method. The multi-output voltage power supply can provide a test voltage to a device under test. The multi-output voltage power supply includes a transformer, a plurality of power supply rails, and a microcontroller. The transformer provides a plurality of operating voltages. The power supply rails are connected to the transformer. Each of the power supply rails has a feedback circuit. Each of the power supply rails outputs a corresponding test voltage. The microcontroller is connected to the power supply rails. The microcontroller receives a selection requirement and an adjustment requirement. The microcontroller selects one of the power supply rails according to the selection requirement. The selected power supply rail is a designated rail. The microcontroller adjusts the operating voltage to the test voltage according to the adjustment requirement and outputs the test voltage to the device under test.

Description

Technical Field

[0001] This invention relates to a power supply device, system, and testing method, and particularly to a power supply, testing system, and testing method for a multi-segment output voltage. Background Technology

[0002] With the rapid development of computers, more and more peripheral devices can be integrated into (or connected to) computers, such as motherboards, graphics cards, expansion cards, disks, and keyboards. Each of these peripheral devices requires its own power supply. Therefore, the computer's power supply plays a crucial role in providing power.

[0003] Intel introduced the Advanced Technology Extended (ATX) power supply specification to enable power supplies to maintain voltage within a specific range under varying load and environmental conditions. However, after prolonged use, the voltage supplied by the power supply may fluctuate due to the aging of internal electronic components. Alternatively, excessively long connection distances to peripheral devices can cause the supply voltage to be incompatible with the needs of the connected devices, leading to instability in their operation. For example, excessively long connection distances to a water cooling radiator may affect the operation of the water pump or fan. Summary of the Invention

[0004] In view of this, in one embodiment, a multi-segment output voltage power supply provides a test voltage to the device under test (DUT). The multi-segment output voltage power supply includes a transformer, multiple power rails, and a microcontroller. The transformer provides multiple operating voltages; the power rails are connected to the transformer, each power rail has a feedback circuit, and each power rail outputs a corresponding test voltage; the microcontroller is connected to the power rails, and the microcontroller receives selection and adjustment requirements. The microcontroller selects one power rail from the power rails according to the selection requirements, and the selected power rail is designated as the rail; wherein, the microcontroller adjusts the operating voltage to the test voltage according to the adjustment requirements and outputs it to the DUT.

[0005] In one embodiment, a method for detecting peripheral devices includes detecting the operating results of a device under test (DUT) under different voltages. The method includes connecting a power supply to the DUT, the power supply rail providing an operating voltage to the DUT; the power supply receiving an adjustment request and adjusting the operating voltage to a test voltage; and the power supply outputting a test voltage to the DUT.

[0006] In one embodiment, a device testing system with multi-segment output voltage includes at least one peripheral device, a motherboard, and a power supply. Each peripheral device has an applicable voltage range; the motherboard is connected to the peripheral device and transmits the operating voltage of the peripheral device; the power supply is connected to the motherboard and has multiple power rails and a microcontroller. Each power rail has a feedback circuit, and each power rail is matched to the corresponding peripheral device and provides the operating voltage; wherein, the microcontroller selects one of the power rails according to selection requirements, the selected power rail is the designated rail, and the peripheral device connected to the designated rail is the device under test; the microcontroller adjusts the feedback circuit of the designated rail according to adjustment requirements to adjust the operating voltage to the test voltage.

[0007] Multi-output voltage power supplies, detection systems, and detection methods offer different adjustment parameters to control the range of output voltage, thereby enabling the testing of connected peripheral devices. For the tester, the multi-output voltage power supply allows for dynamic adjustment of the output voltage and determination of the operating status of peripheral devices under each output voltage. Attached Figure Description

[0008] Figure 1 This is a schematic diagram of a device detection system architecture for a multi-segment output voltage according to one embodiment.

[0009] Figure 2 This is a schematic diagram of the architecture of a power supply with multiple output voltages according to one embodiment.

[0010] Figure 3 This is a schematic diagram of the detection process for peripheral equipment in one embodiment.

[0011] Figure 4 This is a schematic diagram of the circuit structure of a power supply according to one embodiment.

[0012] Figure 5 This is a schematic diagram of the circuit structure of a power supply according to one embodiment.

[0013] Figure 6 This is a schematic diagram of the architecture of a power supply with multiple output voltages according to one embodiment.

[0014] The reference numerals in the attached figures are explained as follows:

[0015] 10: Detection System

[0016] 110: Peripheral equipment

[0017] 111: Device under test

[0018] 200: Motherboard

[0019] 210: Signal Interface

[0020] 220: Power Interface

[0021] 300: Power Supply

[0022] 310: Transformer

[0023] 311: PWM controller

[0024] 312: First MOSFET

[0025] 313: Second MOSFET

[0026] 320: Power supply rail

[0027] 321: Specify track

[0028] 330: Microcontroller

[0029] 331: Communication Interface

[0030] 341: Operating voltage

[0031] 342: Test voltage

[0032] 350: Feedback circuit

[0033] 351: Control MOSFET

[0034] 400: Computer

[0035] 410: Adjustment Requirements

[0036] 420: Operational Results

[0037] HS-GATE: High-side gate position signal

[0038] LS-GATE: Low-side gate position signal

[0039] VFB, VFB_1, VFB_2, VFB_3: Feedback pins

[0040] GND: Grounding point

[0041] VCC_E, DCDC_FB_E: Pins

[0042] S310, S320, S330, S340, S350: Steps Detailed Implementation

[0043] Please refer to Figure 1 and Figure 2The diagram shows a schematic of a device detection system architecture with multiple output voltages according to one embodiment and a schematic of a power supply architecture with multiple output voltages according to another embodiment. The device detection system with multiple output voltages (hereinafter referred to as detection system 10) includes at least one peripheral device 110, a motherboard 200, and a power supply 300. The motherboard 200 is connected to both the peripheral device 110 and the power supply 300. The peripheral device 110 can be, but is not limited to, a keyboard, mouse, screen, memory, or interface card. Each peripheral device 110 has an applicable voltage range. Taking the heat sink in the computer 400 as an example, the applicable voltage range of the heat sink can be 12V to 24V.

[0044] The motherboard 200 has a signal interface 210 and a power interface 220. The signal interface 210 is connected to the peripheral device 110. The type of signal interface 210 matches the connected peripheral device 110. For example, if the peripheral device 110 is a Universal Serial Bus (USB) keyboard, then the signal interface 210 is a USB interface. Alternatively, the signal interface 210 can also be a Peripheral Component Interconnect Express (PCI-Express).

[0045] The power interface 220 can be, but is not limited to, an Advanced Technology Extended 3.0 (ATX), ATX12VO 2.0, or EPS12V interface. The power interface 220 is connected to the power supply 300 and is used to transmit various voltages provided by the power supply 300. The power supply 300 can provide an operating voltage 341 or a test voltage 342. The motherboard 200 transmits the operating voltage 341 (or test voltage 342) to the peripheral device 110 via the power interface 220. Taking the ATX 3.0 specification as an example, the power rail 320 can provide the following operating voltages 341, which include at least +3.3V, +5V, +12V, and -12V. Generally, the operating voltage 341 provided by the power rail 320 is matched to the applicable voltage range of the corresponding peripheral device 110, thereby providing power for the normal operation of the peripheral device 110.

[0046] The power supply 300 includes a transformer 310, multiple power rails 320, and a microcontroller 330. One side of the transformer 310 receives external power, such as AC mains power. The transformer 310 converts the external power into corresponding DC power. The transformer 310 can be implemented using a flyback converter, buck converter, boost converter, buck-boost converter, SEPIC converter, Cuk converter, Zeta converter, resonant converter, push-pull converter, half-bridge converter, full-bridge converter, linear regulator, or charge pump.

[0047] Power rails 320 are connected to the transformer and the microcontroller 330, respectively. Each power rail 320 has its own feedback circuit 350. The feedback circuit 350 provides a specified output voltage. Generally, the power rail 320 provides its own operating voltage 341 to the power interface 220 and peripheral device 110. After adjusting the feedback circuit 350, the aforementioned power rail 320 will output a test voltage 342 to the peripheral device 110. The voltage output range of the feedback circuit 350 is from an upper voltage value to a lower voltage value. The microcontroller 330 selects any voltage between the upper voltage value and the lower voltage value, and the selected voltage value is the test voltage 342. The upper voltage value is greater than the maximum value of the applicable voltage range, while the lower voltage value is less than the minimum value of the applicable voltage range. In other words, the microcontroller 330 selects a voltage value that exceeds the applicable voltage range as the test voltage 342.

[0048] To further explain the inspection process for peripheral equipment 110, please refer to [link / reference needed]. Figure 3 This is a schematic diagram of the detection process of peripheral device 110 in one embodiment.

[0049] Step S310: The power supply connects to multiple peripheral devices;

[0050] Step S320: Select one of the peripheral devices, the selected peripheral device is the device under test;

[0051] Step S330: The power supply rails provide operating voltage to the device under test;

[0052] Step S340: The power supply receives the adjustment request and adjusts the operating voltage to the test voltage; and

[0053] Step S350: The power supply outputs a test voltage to the device under test.

[0054] First, the power supply 300 is connected to the motherboard 200, and the motherboard 200 is connected to each peripheral device 110 (corresponding to step S310). The power supply 300 receives a selection request, allowing it to select one of these peripheral devices 110 (corresponding to step S320). The selected peripheral device 110 will be referred to as the device under test 111. Generally, the power supply 300 provides different operating voltages 341 to the corresponding peripheral devices 110 (corresponding to step S330).

[0055] In some embodiments, motherboard 200 may send a selection request to power supply 300. For example, motherboard 200 may send the selection request to power supply 300 after power-on via Unified Extensible Firmware Interface (UEFI), Basic Input / Output System (BIOS), or Operation System.

[0056] Next, after receiving the adjustment request 410, the power supply 300 adjusts the power supply rail 320 of the device under test 111 so that the adjusted power supply rail 320 provides the test voltage 342 (corresponding to step S340). The power supply 300 outputs the test voltage 342 to the device under test 111 (corresponding to step S350).

[0057] In addition, the computer 400 can also send a selection request to the power supply 300. The microcontroller 330 selects the corresponding designated rail 321 from the power rails 320 according to the selection request. The microcontroller 330 then controls the corresponding feedback circuit 350 of the designated rail 321, causing the feedback circuit 350 to adjust from the operating voltage 341 to the test voltage 342. When the device under test 111 operates at the test voltage 342, the computer 400 records the operating results 420 of the device under test 111. Generally, the voltage output range of the feedback circuit 350 is from the upper limit voltage value to the lower limit voltage value. The microcontroller 330 selects any voltage value between the upper limit voltage value and the lower limit voltage value as the test voltage 342.

[0058] Taking the water pump of the radiator as an example, after selecting the power supply rail 320, the computer 400 can sequentially select different voltages as test voltages 342 and sequentially provide test voltages 342 to the device under test 111. The computer 400 records the operating time, status, and other information of the device under test 111, and all information is collectively referred to as the operating result 420. Since the test voltage 342 of the designated rail 321 belongs to a different transmission channel than the operating voltage 341 of other power supply rails 320, other peripheral devices 110 will not be affected by the voltage of the designated rail 321.

[0059] In some embodiments, the feedback circuit 350 is composed of multiple metal-oxide-semiconductor field-effect transistors (MOSFETs), resistors, capacitors, and other components. Alternatively, the feedback circuit 350 can also be implemented using at least one bipolar junction transistor (BJT). The following descriptions of both embodiments are provided for reference. Figure 4 and Figure 5 .

[0060] exist Figure 4 The above is a simplified circuit structure of transformer 310. Figure 4 The lower left side shows a simplified circuit structure of the feedback circuit 350, and the lower right side shows the microcontroller 330 and its communication interface 331. The transformer 310 can be constructed from a pulse-width modulation (PWM) controller 311 and two MOSFETs, but it is not actually limited to this circuit structure and number of components. The PWM controller 311 is connected to two MOSFETs (the first MOSFET 312 and the second MOSFET 313).

[0061] The feedback circuit 350 has multiple control MOSFETs 351. One end of each control MOSFET 351 is connected to the microcontroller 330, while the other pin is grounded (GND). The microcontroller 330 connects to the corresponding feedback pins (Voltage Feedback Controller, VFB pin, which may correspond to VFB_1, VFB_2, VFB_3) of the control MOSFETs 351 via different general-purpose input / output (GPIO) pins (unlabeled). In addition to the aforementioned GPIO pins, the microcontroller 330 can also control the MOSFETs 351 via pins of its internal integrated circuit (I2C). The number of control MOSFETs 351 is determined by the actual circuit and is not limited to a specific number. Figure 4 The quantity in the circuit. The feedback circuit 350 controls the output test voltage 342 by turning each control MOSFET 351 on and off.

[0062] Microcontroller 330 receives adjustment request 410 and obtains pulse width modulation information from it. Microcontroller 330 adjusts the feedback voltage signals (VFB_1, VFB_2, VFB_3) through the feedback pins in feedback circuit 350, thereby controlling the output of PWM controller 311. PWM controller 311, based on the adjusted feedback voltage signals, changes the pulse width, which includes the switching frequency and duty cycle. PWM controller 311 turns the first MOSFET 312 and the second MOSFET 313 on or off respectively. Therefore, transformer 310 adjusts the operating voltage 341 to the target test voltage 342 according to these modulation signals.

[0063] The PWM controller 311 controls the on / off state of the first MOSFET 312 and the second MOSFET 313 by adjusting the high-side gate signal (HS_GATE) and the low-side gate signal (LS_GATE). The first MOSFET 312 controls the power switch of the high-side gate, and the second MOSFET 313 controls the power switch of the low-side gate. Assuming the other end of the first MOSFET 312 is connected to a power source that can provide a 12V operating voltage 341, see reference [reference needed]. Figure 4 Above.

[0064] When the PWM controller 311 outputs a high-level high-side gate signal to the first MOSFET 312, the gate voltage will rise and turn on the first MOSFET 312. After the first MOSFET 312 is turned on, the operating voltage 341 is transmitted to the operating voltage through the first MOSFET 312. Figure 4 The inductor on the right (unlabeled) allows current to flow through the first MOSFET 312 to charge the inductor. Simultaneously, the second MOSFET 313 is off. Conversely, when the first MOSFET 312 is off, the second MOSFET 313 is on. The inductor supplies power to the device under test (DUT) 111 through the second MOSFET 313. The adjusted test voltage 342 is output from the designated rail 321 to the DUT 111. For example, the designated rail 321 outputs a "5V" test voltage 342, which is then passed through... Figure 4 The right-side pin output is sent to the device under test 111.

[0065] exist Figure 5 The bipolar transistor is used as an example for illustration. Figure 5 The microcontroller 330 uses a digital-to-analog converter (DAC) to control the bipolar transistor in the feedback voltage, adjusting the operating voltage 341 to the test voltage 342. For Figure 5 The instructions for transformer 310 can be found here. Figure 4 Description of the PWM controller 311, the first MOSFET 312 and the second MOSFET 313. Figure 5 The lower left corner is the corresponding feedback circuit 350, which is composed of bipolar transistors, multiple resistors and capacitors.

[0066] The right and top pins of the feedback circuit 350 share the same voltage node with the PWM controller 311, namely the VCC_E pin. The VCC_E pin on the top of the feedback circuit 350 receives the output voltage from the transformer 310. The voltage input to the VCC_E pin is processed by a voltage divider network composed of resistors and capacitors, and the resulting voltage signal is output through the left pin of the feedback circuit 350, corresponding to... Figure 5 The DC-DC_FB_E pin is used for input signals. The signal input to this DC-DC_FB_E pin is sent to the PWM controller 311 to control the duty cycle of the PWM controller 311, thereby adjusting the final output voltage. For the VCC_E pin on the right side of the feedback circuit 350, its voltage is determined by the current controlled by the bipolar transistor.

[0067] The PWM controller 311 receives the adjusted feedback voltage signal from the feedback circuit and dynamically adjusts its output based on this signal. The PWM controller 311 controls the switching operation of the power components by adjusting the pulse width, including the switching frequency and duty cycle. A bipolar junction transistor (BJT) acts as an amplification element for the feedback signal, finely adjusting the signal from the feedback pin VFB to ensure stable operation of the PWM controller 311. When the adjusted signal is output by the PWM controller 311, the first MOSFET 312 and the second MOSFET 313 achieve precise voltage control based on the changes in the adjusted signal. The on / off state of the first MOSFET 312 and the second MOSFET 313 affects the final voltage output (corresponding to VCC_E), ensuring that the specified test voltage 342 can be output.

[0068] In some embodiments, the microcontroller 330 also has a communication interface 331, please refer to Figure 6 The communication interface 331 is connected between the microcontroller 330 and the computer 400. The computer 400 can be the aforementioned motherboard 200, or an external electronic device, such as a personal computer, laptop, tablet, mobile phone, or embedded computer 400, which possesses digital communication capabilities and computing power. The communication interface 331 can be a universal serial bus, a computer serial interface peripheral connection (EIA-RS-232, RS232), Ethernet, Bluetooth, or Near Field Communication (NFC), etc. Furthermore, the communication interface 331 is connected to either the motherboard 200 or the computer 400. The communication interface 331 transmits adjustment requests 410 to the microcontroller 330, causing the microcontroller 330 to drive the first MOSFET 312 and the second MOSFET 313 to turn on and off, thereby realizing the adjustment processing of the test voltage 342.

[0069] The multi-segment output voltage power supply 300, the detection system 10, and the detection method provide different adjustment parameters to control the range of output voltage, thereby detecting the connected peripheral equipment 110. For the tester, the multi-segment output voltage power supply 300 allows for dynamic adjustment of the output voltage, enabling the determination of the operating status of the peripheral equipment 110 under different output voltages. The detection system 10 can be used for factory inspection of peripheral equipment 110 on the production line, and can also be provided to general users. Users can use corresponding applications to drive the power supply 300 to output different voltage ranges, thereby detecting the operation of the peripheral equipment 110.

Claims

1. A power supply with multi-segment output voltage, characterized in that, A power supply that provides a test voltage to a device under test, the multi-segment output voltage power supply comprising: A transformer that provides multiple operating voltages; Multiple power rails are connected to the transformer, each power rail has a feedback circuit, and each power rail outputs a corresponding test voltage; and A microcontroller is connected to the plurality of power rails. The microcontroller receives a selection request and an adjustment request. The microcontroller selects one of the plurality of power rails according to the selection request. The selected power rail is a designated rail. The microcontroller adjusts the operating voltage to the test voltage according to the adjustment requirements and outputs it to the device under test.

2. The power supply with multi-segment output voltage as described in claim 1, characterized in that, The operating voltages include +3.3V, +5V, +12V, and -12V.

3. The power supply with multi-segment output voltage as described in claim 1, characterized in that, The voltage output range of the feedback circuit is from an upper voltage value to a lower voltage value. The microcontroller selects any voltage value between the upper voltage value and the lower voltage value as the test voltage.

4. The power supply with multi-segment output voltage as described in claim 1, characterized in that, The feedback circuit is composed of a metal-oxide-semiconductor field-effect transistor or a bipolar transistor.

5. The power supply with multi-segment output voltage as described in claim 4, characterized in that, The adjustment requirement includes a pulse width modulation, which adjusts the operating voltage of the metal-oxide-semiconductor field-effect transistor to the test voltage according to a switching frequency or a duty cycle of the pulse width modulation.

6. The power supply with multi-segment output voltage as described in claim 4, characterized in that, The adjustment requirement includes a voltage control, which adjusts the bipolar transistor according to the microcontroller's digital-to-analog converter (DAC) to adjust the operating voltage to the test voltage.

7. The power supply with multi-segment output voltage as described in claim 1, characterized in that, The microcontroller has a communication interface that is signal-connected to a computer. The computer sends the selection request to the microcontroller, causing the microcontroller to select the specified rail and the test voltage.

8. The power supply with multiple output voltages as described in claim 7, characterized in that, The computer records the operating results of the device under test under the test voltage.

9. A method for detecting peripheral equipment, characterized in that, The method for testing a device under test (DUT) at different voltages includes: A power supply is connected to the device under test, and a power rail of the power supply provides an operating voltage to the device under test. The power supply receives an adjustment request to adjust the operating voltage to a test voltage; and The power supply outputs the test voltage to the device under test.

10. The method for detecting peripheral equipment as described in claim 9, characterized in that, The step preceding "the power supply is connected to the device under test, and the power rail of the power supply provides the operating voltage to the device under test" includes: This power supply connects to multiple peripheral devices; and The power supply selects one of the plurality of peripheral devices according to a selection requirement, and the selected peripheral device is the device under test.

11. The method for detecting peripheral equipment as described in claim 9, characterized in that, The step of "the power supply receiving the adjustment request and adjusting the operating voltage to the test voltage" includes: The adjustment requirement includes a pulse width modulation, in which a transistor on the power supply rail adjusts the operating voltage to the test voltage according to a switching frequency or duty cycle of the pulse width modulation.

12. The method for detecting peripheral equipment as described in claim 9, characterized in that, The step of "the power supply receiving the adjustment request and adjusting the operating voltage to the test voltage" includes: The adjustment requirement includes a voltage control, which adjusts a bipolar transistor in the power supply according to the voltage control, so that the operating voltage is adjusted to the test voltage.

13. The method for detecting peripheral equipment as described in claim 9, characterized in that, The step of "the power supply outputs the test voltage to the device under test" includes: A computer signal is connected to the power supply; and The computer records the operating results of the device under test at the test voltage.

14. A device detection system with multi-segment output voltage, characterized in that, include: At least one peripheral device, each of which has a suitable voltage range; A motherboard is connected to the peripheral devices, and the motherboard transmits an operating voltage to the plurality of peripheral devices; as well as A power supply is connected to the motherboard. The power supply has multiple power rails and a microcontroller. Each power rail has a feedback circuit. Each power rail is matched with the corresponding peripheral device and provides the operating voltage. The microcontroller selects one of the plurality of power supply rails according to a selection requirement. The selected power supply rail is a designated rail, and the peripheral device connected to the designated rail is a device under test. The microcontroller adjusts the feedback circuit of the designated rail according to an adjustment requirement to adjust the operating voltage to a test voltage.

15. The device detection system for multi-segment output voltage as described in claim 14, characterized in that, The operating voltage is matched to the applicable voltage range of the peripheral equipment.

16. The device detection system for multi-segment output voltage as described in claim 14, characterized in that, The test voltage range is defined by an upper voltage value and a lower voltage value. The upper voltage value is greater than the maximum value of the applicable voltage range, and the lower voltage value is less than the minimum value of the applicable voltage range.

17. The device detection system for multi-segment output voltage as described in claim 14, characterized in that, The power supply has a communication interface that is connected to the motherboard or a computer, and the communication interface receives the selection request or the adjustment request.

Images