Radiation testing system for nuclear power robots

Abstract

This application relates to an irradiation testing system for nuclear power robots. The system includes an irradiation source, at least one irradiation platform, a testing device, and a central control device. The irradiation platform carries the component under test and is positioned close to the irradiation source. The testing device is connected to both the component under test and the central control device via wiring to collect electrical parameters of the component under test during irradiation. The central control device analyzes the radiation resistance of the component under test based on these electrical parameters. A first isolation component is provided between the testing device and the irradiation source. A second isolation component is provided between the central control device and the irradiation source. By collecting the electrical parameters of the component under test in real time during irradiation through the testing device and analyzing them through the central control device, online dynamic monitoring and accurate determination of the radiation resistance of the nuclear power robot are achieved, thereby improving testing accuracy.

Description

Technical Field

[0001] This application relates to the field of irradiation testing technology, and in particular to an irradiation testing system for a nuclear power robot. Background Technology

[0002] In recent years, the rapid development of nuclear industry technology has driven the upgrading of nuclear power robots towards automation and intelligence. In the high-radiation environments of special operating areas in nuclear power plants (such as reactor buildings) and under nuclear accident conditions, nuclear power robots face stringent radiation resistance requirements. The radiation resistance limits of their core components and the entire robot directly determine their operational stability and service life in irradiated environments. Therefore, nuclear power robots must undergo total dose irradiation tests to verify their radiation resistance capabilities before leaving the factory and being put into use.

[0003] However, the current industry-standard total dose irradiation testing method is primarily derived from aerospace testing standards for semiconductor devices, and its core is an "online testing, relocation testing" model. Specifically, the semiconductor device is first placed in an irradiation chamber for target dose testing, then removed from the irradiation environment for a first electrical parameter test in a safe testing area. After passing the first electrical parameter test, another irradiation test is conducted, followed by another removal from the irradiation environment for a second electrical parameter test in a safe testing area. Only after passing the second electrical parameter test is the semiconductor device's radiation tolerance deemed to have passed the target dose test. This method requires multiple repeated tests to determine its radiation tolerance range. The entire process involves multiple independent irradiation and testing sessions, as well as multiple equipment handling and system reconnection operations, resulting in a lengthy testing cycle, complex operations, and high human and material costs. Therefore, this method is insufficient for assessing the upper limit of radiation tolerance in complex electromechanical systems such as nuclear power plant robots. Summary of the Invention

[0004] Therefore, it is necessary to provide an irradiation testing system that can improve the accuracy and convenience of irradiation resistance testing for nuclear power robots, addressing the aforementioned technical problems.

[0005] In a first aspect, this application provides an irradiation testing system for a nuclear power robot, the irradiation testing system comprising: an irradiation source, at least one irradiated platform, a testing device, and a central control device;

[0006] The irradiation stand is used to support the component to be tested and is positioned close to the irradiation source.

[0007] The testing device is used to connect to the component under test and the central control equipment via wiring to collect the electrical parameters of the component under test during the irradiation process;

[0008] Central control equipment is used to analyze the radiation resistance of the component under test based on electrical parameters;

[0009] A first isolation component is installed between the testing device and the irradiation source; a second isolation component is installed between the central control equipment and the irradiation source.

[0010] In some embodiments, the irradiation station includes: a cabinet structure and a support; the support is disposed on the front of the cabinet structure, with the front facing the irradiation source;

[0011] A bracket is used to hold the component under test.

[0012] In some embodiments, the irradiated platform further includes: a wiring component; the wiring component is disposed inside the cabinet structure;

[0013] Wiring components are used to connect the circuit between the component under test and the test device.

[0014] In some embodiments, the irradiation platform further includes a position adjustment mechanism connected to the support frame;

[0015] The position adjustment mechanism is used to adjust the spatial position of the support on the cabinet structure so that the part under test is evenly irradiated.

[0016] In some embodiments, the position adjustment mechanism includes at least one of a horizontal displacement adjustment component, a vertical height adjustment component, and a rotation adjustment component;

[0017] Horizontal displacement adjustment assembly, used to adjust the horizontal displacement of the support;

[0018] Vertical height adjustment component, used to adjust the vertical height of the bracket;

[0019] Rotary adjustment component, used to adjust the rotation direction of the bracket.

[0020] In some of these embodiments, the support includes at least one mesh structure.

[0021] In some embodiments, the cabinet structure is equipped with a detection device for visual inspection of the component under test.

[0022] In some embodiments, a shielded room is provided in the cabinet structure, and the detection device includes a camera and a video server; the camera is installed on the cabinet structure, the video server is installed in the shielded room, and the video server is connected to the camera and the central control device respectively.

[0023] The video server is used to convert the video signals detected by the camera into video data packets and transmit the video data packets to the central control equipment.

[0024] In some embodiments, the bottom or side of the cabinet structure is provided with movable parts to move the irradiated platform.

[0025] In some embodiments, the rear structure of the cabinet is a movable structure, and the rear structure is connected to the side structure of the cabinet by hinges.

[0026] The aforementioned irradiation testing system for nuclear power robots includes an irradiation source, at least one irradiation platform, a testing device, and a central control unit. The irradiation platform carries the component under test and is positioned close to the irradiation source. The testing device is connected to both the component under test and the central control unit via wiring to collect electrical parameters of the component under test during irradiation. The central control unit analyzes the radiation resistance of the component under test based on these electrical parameters. A first isolation component is installed between the testing device and the irradiation source. A second isolation component is installed between the central control unit and the irradiation source. This testing system collects the electrical parameters of the component under test in real time during irradiation via the testing device, and the central control unit analyzes these parameters, enabling online dynamic monitoring and accurate determination of the nuclear power robot's radiation resistance, thereby improving testing accuracy. Furthermore, the first and second isolation components physically isolate the testing device and central control unit from the irradiation source, reducing radiation interference and ensuring measurement stability and equipment safety. Attached Figure Description

[0027] Figure 1 This is a schematic diagram of the irradiation testing system for a nuclear power robot in some embodiments;

[0028] Figure 2 This is a schematic diagram of the structure of the irradiated platform 20 in some embodiments;

[0029] Figure 3 This is a schematic diagram of the structure of the test device 40 in some embodiments;

[0030] Figure 4 This is a schematic diagram of the structure of the central control device 50 in some embodiments;

[0031] Figure 5 These are schematic diagrams of the auxiliary device in some embodiments;

[0032] Figure 6 This is a schematic diagram of the front structure of the irradiated platform 20 in some embodiments;

[0033] Figure 7 This is a schematic diagram of the rear structure of the irradiated platform 20 in some embodiments;

[0034] Figure 8 This is a schematic diagram of the test scene layout of the irradiation test chamber in some embodiments;

[0035] Figure 9This is a schematic diagram of the online total dose irradiation test process in some embodiments.

[0036] Explanation of reference numerals in the attached figures:

[0037] Irradiation source 10; Irradiated platform 20; Component under test 30; Testing device 40; Central control equipment 50; First isolation component 60; Second isolation component 70; Cabinet structure 201; Bracket 202; Grid structure 2021; Wiring component 203; Moving component 2012; Status indication module 401; Terminal block 402; Display 500; Switch 501; Server 502; Network attached storage 503; Industrial computer 504; Auxiliary device 80; Compartment 800; Detection device 90; Camera 901; Video server 902; Shielded room 2011. Detailed Implementation

[0038] In the embodiments of this application, the term "and / or" describes the relationship between associated objects, indicating that three relationships can exist. For example, A and / or B can represent three cases: A alone, A and B simultaneously, and B alone. The character " / " generally indicates that the preceding and following associated objects have an "or" relationship.

[0039] In the embodiments of this application, the term "multiple" refers to two or more, and other quantifiers are similar.

[0040] In the embodiments of this application, the term "at least one" means one or more. For example, at least one of A, B and C can represent six situations: A exists alone, B exists alone, C exists alone, A and B exist simultaneously, A and C exist simultaneously, B and C exist simultaneously, and A, B and C exist simultaneously.

[0041] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0042] In recent years, the rapid development of nuclear industry technology has driven the upgrading of nuclear power robots towards automation and intelligence. However, the high radiation dose environment in special operating areas of nuclear power plants (such as reactor buildings) and under nuclear accident conditions places stringent requirements on the radiation resistance of nuclear power robots—the radiation resistance limit of their core components and the entire machine directly determines the robot's working stability and service life in irradiated environments. Therefore, before nuclear power robots leave the factory and are put into use, they often need to undergo total dose irradiation tests to verify their radiation resistance capabilities.

[0043] However, the current industry-standard total dose irradiation testing method is primarily based on aerospace testing standards for semiconductor devices, with its core being an "online test, displacement test" model. Specifically, the semiconductor device is first placed in an irradiation chamber for target dose irradiation testing. Then, it is removed from the irradiation environment and subjected to a first electrical parameter test in a safe testing area. After passing the first electrical parameter test, an over-irradiation test is performed, followed by another removal from the irradiation environment and a second electrical parameter test in a safe testing area. Only after passing the second electrical parameter test does the semiconductor device's radiation resistance meet the target dose requirement. For example, taking a typical test to verify a device's radiation resistance of 1000 Gy as an example, the complete implementation process is described below: This model strictly follows a discrete multi-process flow of "irradiation-displacement test-annealing-test-over-irradiation-high-temperature annealing-test". First, the semiconductor device is placed in the irradiation chamber, and the irradiation source is activated. Once the cumulative absorbed dose reaches the target dose (1000 Gy), irradiation is stopped for the first time. Subsequently, operators must enter the irradiation hall, disconnect the irradiated semiconductor device from power, disassemble all connecting cables, and physically remove it from the high-dose irradiation environment. The device is then transported to a dedicated testing area in a safe zone, ensuring it is placed under strict storage conditions or within strict time limits during transport. In the testing area, operators must power on the semiconductor device and restore its operational status, then perform electrical parameter tests on its various performance parameters. The purpose of this test is to determine whether the device's functionality and performance still meet specifications after being exposed to a 1000 Gy dose. If the first test passes, a second round of "irradiation verification" is initiated. Operators must again transport the semiconductor device from the testing area back to its original location in the irradiation hall, reinstall and reconnect it. Then, the irradiation source is activated for supplementary irradiation, subjecting the semiconductor device to an additional 50% dose (500 Gy), until the cumulative total dose reaches 1500 Gy. Once the dose is reached, the second irradiation is stopped. Subsequently, the relocation operation is repeated: the equipment is moved out of the irradiation hall again, transported to the testing area, and a third connection, power-on, and status restoration are performed, followed by a second comprehensive test. Only if all equipment performance parameters remain qualified in this test can the equipment's radiation tolerance be ultimately determined to be 1000 Gy. This demonstrates the main problem with this traditional method: the irradiation process and the testing process are completely separated in space and time. The irradiation test and over-irradiation are disconnected by a lengthy physical operation of "stop irradiation - relocation - reconnection - testing." Moreover, if it is necessary to assess the upper limit of the radiation tolerance of the test piece, multiple repeated tests are required to determine its radiation tolerance range. The entire process not only includes multiple independent irradiation segments and multiple independent testing segments, but also multiple equipment relocation and system reconnection operations, making the testing cycle lengthy, the operation complex, and the human and material costs high.

[0044] In addition, the above-mentioned traditional irradiation testing methods also expose the following insurmountable limitations: (1) The process is discrete and inefficient, and it is impossible to achieve system-level online assessment: The traditional method is essentially a "sampling inspection" and "step-by-step verification" for semiconductors. The fact that a semiconductor device can pass the irradiation test of the target dose does not mean that the system composed of it can pass the irradiation test. It cannot assess the system-level interactive faults caused by radiation in the actual working state after the semiconductor components are integrated, such as bus communication errors, software state disorder, power integrity degradation and other problems, leaving the hidden danger of "qualified components forming a faulty system". (2) It is impossible to monitor in real time and the judgment efficiency is low: The semiconductor device is directly placed in the irradiation hall, and the irradiation resistance is judged by comparing the "parameter record before irradiation + parameter retest after irradiation". Since the test can only be carried out during the irradiation interval or after the test, the test process is a "black box" operation for the degradation of equipment performance. The inability to capture key dynamic processes such as gradual changes, jumps, or instantaneous recovery of performance parameters as dose accumulates leads to reliance on speculation in failure mechanism analysis. The determination of radiation tolerance limits is often conservative or imprecise. To determine a limit dose, it may be necessary to repeat the test with "different dose gradients" multiple times, which is time-consuming and costly. (3) Low test standardization: There is no unified semiconductor device support structure. Semiconductor devices are placed arbitrarily in the irradiation hall. It is difficult to adjust the equipment position and the irradiation is uneven (the dose difference between different areas of the same equipment can reach 15%). There is no regular management scheme for cable connection, which is prone to misconnection and omission, resulting in invalid test data. (4) Poor data reliability: The test equipment uses ultra-long cables (more than 30m), the signal test is inaccurate, and the semiconductor devices may be damaged due to abnormal power outages. Therefore, the traditional irradiation test system has the problems of inaccurate testing and low testing efficiency when testing the radiation tolerance of nuclear power robots.

[0045] In view of this, this application proposes an irradiation testing system for nuclear power robots, which is an online testing system suitable for total dose irradiation testing of semiconductor devices and the whole machine of nuclear power robots. It can realize standardized testing of the equipment under test, unified cable management, total irradiation dose capacity assessment, and efficient data acquisition and analysis, while ensuring the real-time performance, stability and adaptability of the test process.

[0046] It should be noted that the beneficial effects or technical problems solved by the embodiments of this application are not limited to this one, but may also be other implicit or related problems. For details, please refer to the description of the embodiments below.

[0047] The technical solution of this application and how the technical solution of this application solves the above-mentioned technical problems are described in detail below with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments. The embodiments of this application will now be described with reference to the accompanying drawings.

[0048] In some embodiments, such as Figure 1 As shown, an irradiation testing system for a nuclear power robot is provided (a top view of the irradiation testing system is shown in the figure). The irradiation testing system includes: an irradiation source 10, at least one irradiation stand 20 (one is shown as an example in the figure), a testing device 40, and a central control device 50.

[0049] The irradiation stand 20 is used to support the component under test 30. The number of components under test 30 can be one or more (three are shown as an example in the figure), and the irradiation stand 20 is positioned close to the irradiation source 10. The testing device 40 is connected to both the component under test 30 and the central control device 50 via wiring to collect the electrical parameters of the component under test 30 during the irradiation process. The central control device 50 is used to analyze the radiation resistance of the component under test 30 based on the electrical parameters. A first isolation component 60 is provided between the testing device 40 and the irradiation source 10; a second isolation component 70 is provided between the central control device 50 and the irradiation source 10.

[0050] It should be noted that the core equipment in the aforementioned irradiation testing system needs to be located inside or around a dedicated facility with radiation shielding capabilities to ensure personnel safety, stable equipment operation, and the accuracy of test data. In this embodiment, the dedicated facility is specifically an irradiation hall, which is a closed or semi-closed building space with a complete shielding structure specifically used for radiation experiments. Irradiation halls are typically constructed with radiation shielding materials such as high-density concrete walls or lead plates, effectively controlling the radiation generated by the radiation source within the hall and ensuring the safety of the external environment. Therefore, those skilled in the art will understand that the application scenario of this system is not an open-air environment, but rather a professional testing site with strict radiation protection conditions.

[0051] The aforementioned irradiation source 10 is used to generate high-energy rays (such as gamma rays generated by cobalt-60) in the total dose irradiation test to simulate the radiation field in a nuclear power plant environment, continuously or intermittently irradiating the component under test 30. The irradiation source 10 can be a fixed radiation source device, and its intensity and dose rate can be selected and calibrated according to test standards. For example, to achieve a high dose rate test, a cobalt-60 irradiation source with higher activity can be used; to achieve irradiation of a specific energy spectrum, an X-ray machine or other types of radiation devices can also be used. The irradiation process can be controlled by a remote control system to control the opening and closing of the irradiation source 10, the opening and closing of the shielding door, and the irradiation time, thereby precisely controlling the total absorbed dose received by the component under test 30. This irradiation source 10 is a controllable and measurable standardized irradiation source 10, providing reliable and repeatable test conditions for the quantitative evaluation and comparison of the radiation resistance performance of electronic components, overcoming the defects of uneven radiation field and inaccurate dose in traditional methods.

[0052] The aforementioned irradiation stand 20 is a modular, movable support structure specifically designed to support and position the component 30 to be tested within the irradiation hall. The irradiation stand 20 can be a single support frame or a support frame that includes a cabinet, such as... Figure 2 As shown, taking a support frame including a cabinet as an example, its front can hold at least one component under test (DUT) 30. The figure illustrates four DUTs 30, each with a different shape. The number of irradiation test stands 20 can be determined based on the number and size of the DUTs 30. The DUTs 30 include, but are not limited to, integrated circuits, printed circuit boards, sensor modules, or complete equipment of nuclear power robots, such as control chips, signal processing boards, or equipment controllers of nuclear power robots. The irradiation test stands 20 can be used independently (suitable for testing a single DUT), or two sets of stands with a mirror-symmetrical design can be used together (suitable for simultaneous testing of multiple DUTs), flexibly handling different test scales.

[0053] The support surface of the irradiation stand 20 can be a grid plate or a perforated plate (e.g., a metal grid plate or a perforated plate), and test components 30 of different shapes and sizes can be fixed by bolts, clamps, or magnetic bases. The main body of the irradiation stand 20 can be constructed of aluminum profiles or a steel frame, balancing lightweight and rigidity. For easy movement and positioning, casters or track wheels with locking function can be installed at the bottom of the irradiation stand 20. By providing a height-adjustable and flexibly positioned irradiation stand 20, the optimal orientation and position of the test component 30 in the radiation field are ensured, effectively eliminating the problem of uneven irradiation caused by improper placement, and improving the consistency and comparability of test results. If the irradiation stand 20 and other equipment are not used, and instead the irradiation equipment is placed directly in the irradiation hall, with other supporting equipment placed in the safe area outside the irradiation hall, although irradiation tests can still be conducted, the wiring will be messy and the quality of communication and weak current signal transmission will be difficult to guarantee.

[0054] The aforementioned testing device 40 is the core equipment used to collect electrical parameters of the component under test 30. It can be implemented in a cabinet, such as a test cabinet. The first isolation component 60 refers to a physical structure (wall) located within the irradiation hall for attenuating radiation. For example, the testing device 40 may be located in the labyrinth area between the first and second walls of the irradiation hall. The testing device 40 may be connected to the irradiated platform 20 via a cable typically 3-6 meters long to avoid excessive signal attenuation. The testing device 40 can be placed in the medium-dose area (e.g., the labyrinth area with a dose rate of approximately 1.8 Gy / h) after the first isolation component 60.

[0055] The test device 40 is mainly composed of five modules: (1) a switching power supply and transformer module, which provides a stable working power supply for itself and the component under test 30. The output voltage covers 220V and 0~48V to meet the power requirements of the internal modules of the test device 40 and the component under test 30; (2) a hot-swappable data acquisition box, which has built-in dynamic signal acquisition card, data source card, communication measurement card, temperature acquisition card and other acquisition cards, for real-time acquisition of electrical parameters such as voltage, current and signal waveform. The acquisition cards can be added or removed according to the test requirements; (3) a synchronous clock box, which is used to synchronize the clocks of multiple data acquisition boxes; (4) a temperature control module, which is used to maintain the working temperature inside the test device 40 within the range of 0~40℃ to avoid the high temperature environment from affecting the measurement accuracy of the acquisition card; (5) a status indicator module 401, which is equipped with LED indicator lights to display the working status of the acquisition card and power supply in real time, so as to facilitate the operator to quickly troubleshoot the fault. Optionally, the status indication signal corresponding to the status indication module 401 can be transmitted to the central control device 50. The central control device 50 can then test the component under test 30 based on its electrical parameters and the status indication signal. Specifically, if the test result indicates an anomaly, it can first determine if the status indication signal is abnormal. If the status indication signal is abnormal, it can further determine if the abnormal test result is caused by the abnormal status indication signal. For example, the testing device 40 can be repaired, the component under test 30 can be re-irradiated, and the test results can be re-analyzed. If it is determined that the abnormal test result is not caused by the abnormal status indication signal, then anomaly analysis can be performed based on the electrical parameters. The status indication module 401 can quickly troubleshoot situations where abnormal measurement results are caused by a faulty acquisition card in the testing device. By placing the testing device 40 at an optimized position after the first isolation component 60, the influence of radiation is reduced, while achieving close-range, high-reliability real-time acquisition of electrical parameters, ensuring the accuracy of the test data. It should be noted that if the testing device 40 is not placed between the first and second walls of the irradiation hall, but outside the irradiation hall, the testing function can still be achieved, but there will be a large number of cables between the testing device 40 and the irradiation platform 20. This arrangement will result in excessively long and heavy cables.

[0056] For example, a schematic diagram of the test apparatus 40 can be found here. Figure 3 As shown, Figure 3 The left-hand diagram shows the overall structure of the testing device (i.e., the cabinet structure). Figure 3 The right side of the figure shows the status indicator module 401 (circular structure in the figure) and the wiring terminal 402 (square structure in the figure) set on the front of the test device 40. The status indicator module 401 can display the working status of the internal acquisition card and power supply, and the wiring terminal 402 can be connected to the component under test 30.

[0057] The aforementioned central control device 50 is the control and data processing center located in the safe zone, and is the main operating position for operators. The second isolation component 70 refers to the protective wall that completely isolates the interior of the irradiation hall from the external safe zone. Specifically, the central control device 50 is the main control console, located in the safe zone outside the irradiation hall.

[0058] The central control device 50 is mainly composed of four modules: (1) Switch 501, which is used to communicate with the test device 40, auxiliary device 80 and other devices, realize the communication connection between the industrial computer 501 and the test device 40, auxiliary device 80 and server 50, and ensure the stability and real-time performance of data transmission; (2) Server 502, which is used to receive the video signal transmitted by the camera on the irradiated stand 20 when the camera is deployed on the irradiated stand 20, and display the appearance status of the device under test on the display 500 in real time, and supports video recording and playback; (3) Network Attached Storage (NAS503) 503, which is used to store and back up test data, supports off-site backup, and avoids data loss due to local storage damage; (4) Industrial computer 504, which is used to record initial parameters, display real-time electrical parameter curves and device status on the display 500, and its display screen 500 is used to display electrical parameter curves, video images and device working status in a split screen, so that operators can carry out real-time full-process monitoring and operation in this safe area. By placing the central control device 50 in a safe zone outside the second isolation component 70, the safety of personnel and core control equipment is ensured, and remote, real-time monitoring and centralized data management of the test process are realized.

[0059] For example, a schematic diagram of the central control device 50 can be found here. Figure 4 As shown, Figure 4 The left-hand compartment can house server 502, switch 501, and NAS 503 (in the diagram, server 502, switch 501, and NAS 503 are placed sequentially from top to bottom, spaced apart to avoid signal interference), while the right-hand compartment can house industrial computer 504. Other devices can also be housed within the central control equipment 50 to ensure its operation in a suitable environment.

[0060] Optionally, the aforementioned nuclear power robot irradiation testing system also includes an auxiliary device 80, which can be implemented in a cabinet, such as an auxiliary cabinet. The auxiliary device 80 is located together with the central control equipment 50 in a safe area outside the irradiation hall. The safe area is completely away from the radiation field, ensuring the safety of operators and the long-term stable operation of the equipment inside the cabinet, free from radiation interference. The auxiliary device 80 is a supportive and backup equipment unit; it does not participate in the core, continuous data acquisition and control loop, but rather serves as an extension and backup of the main testing system. The irradiated test bench 20, testing device 40, central control equipment 50, and auxiliary device 80 are connected by standardized cables. The outer layer of the standardized cables uses radiation-resistant insulation material and is marked with color and number. In practical applications, the cables are manufactured according to equipment interface specifications and connected to the corresponding rows of terminals 402 arranged in the partitioned areas (such as power signal area and data signal area) within the electrical cabinet of the irradiated test bench 20. Through color and number markings, and in conjunction with electrical quick-connect connectors (such as aviation plugs), quick and accurate connections between devices are achieved. By adopting standardized and labeled cables and connection schemes, a reliable and efficient system interconnection was established, reducing wiring errors and improving operational efficiency.

[0061] The auxiliary device 80 is connected to other parts of the system (such as the central control device 50 and the test device 40) via standardized cables. Since it is located in a safe area, wiring and management are relatively convenient. The auxiliary device 80 mainly houses two types of equipment: (1) Commonly used auxiliary test instruments: such as oscilloscopes, signal generators, programmable power supplies, adjustable power supplies, etc. These devices do not need to be used throughout every test, but can be activated at any time when in-depth diagnosis, specific excitation, or fine measurement is required. For example, the auxiliary device 80 can expand the test functions and enhance the system flexibility: when the standard test process requires additional excitation signals (signal generators), more complex waveform analysis (oscilloscopes), or specific power conditions (programmable / adjustable power supplies), the corresponding equipment in the auxiliary device 80 can be used directly without modifying the core system. If an abnormality occurs during the test, these auxiliary instruments can be quickly connected to the system for in-depth diagnosis and problem localization. The auxiliary device 80 can realize modular deployment of equipment and optimize space and cost: placing equipment that does not participate in the continuous core process in the auxiliary device 80 makes the design of the central control device 50 and the test device 40 simpler and more focused. These auxiliary instruments can be shared between different tests without the need for separate configuration for each test station, saving costs and space. (2) Key emergency support equipment: mainly refers to uninterruptible power supply (UPS), the UPS system runs continuously for ≥5 minutes. For example, auxiliary device 80 can provide emergency power to ensure data security and equipment safety: during the irradiation test, if an unexpected power outage occurs, the built-in UPS can immediately provide continuous power to the entire test system (at least the key data acquisition, storage and communication parts) for no less than 5 minutes. During the 5-minute buffer time, the system is allowed to shut down the data acquisition process normally and save the key test data in the cache completely to the NAS storage of the main control console, avoiding data loss or damage caused by sudden power outage. It provides a safe shutdown time for the device under test and the precision acquisition card to prevent damage to the equipment hardware caused by current surge or abnormal status. By setting up auxiliary device 80 containing uninterruptible power supply, emergency power protection is provided for the test system, enhancing the continuity of the test and data security. For example, a schematic diagram of auxiliary device 80 can be found in Figure 5 As shown, Figure 5 The auxiliary device 80 can be a cabinet structure, including multiple compartments 800, used to accommodate other non-essential equipment and backup equipment, namely commonly used auxiliary testing instruments and key emergency support equipment.

[0062] The testing method for the irradiation testing system of the nuclear power robot in this embodiment includes three processes, as follows:

[0063] Process 1: Pre-test Preparation. Pre-test preparation includes equipment setup, installation and connection, wiring verification, and system initialization. Specifically, the pre-test preparation includes the following steps: First, arrange the equipment according to the zoning plan: place the irradiation stand 20 in the high-dose area of ​​the irradiation hall; place the test device 40 at the labyrinth entrance (medium-dose area) behind the first isolation component 60; place the central control device 50 and auxiliary device 80 in the safe area outside the second isolation component 70. Connect the equipment using standardized cables. Fix the device under test 30 onto the irradiation stand 20. Verify the wiring against the terminal block markings and cable colors / numbers. Power on the system and apply an appropriate bias voltage to the device under test through the power supply. After the equipment is running stably, record the initial electrical parameters (such as voltage, current, signal frequency, and waveform) through the central control device 50 as the baseline data for the test. This standardized pre-test preparation process lays the foundation for the reliable conduct of online irradiation tests.

[0064] Process Two: Irradiation Monitoring. Irradiation monitoring includes starting irradiation, real-time data acquisition and monitoring, and judgment and processing based on monitoring results. Specifically, irradiation monitoring includes the following steps: Irradiation source 10 is started, and the system enters online measurement mode. The acquisition card in the testing device 40 acquires the electrical parameters of the component under test 30 in real time and transmits them to the central control device 50. The operator views the electrical parameter curves on the display 500 of the central control device 50. If the electrical parameters are stable throughout, irradiation continues until the specified total dose is reached, then the irradiation source 10 is turned off, and the test is considered passed. If the electrical parameters are abnormal, irradiation is immediately stopped, and the component under test 30 is placed in a room temperature environment for annealing (e.g., 24 hours). After annealing, the bias is reapplied to the device, and the electrical parameters are retested: if the retested parameters return to normal, the test is considered passed; if the retested parameters are still abnormal, the test is considered failed, and the irradiation dose at the time of device failure is recorded. By monitoring electrical parameters and appearance in real time online, performance changes can be dynamically captured, and a standardized anomaly handling and judgment process is provided, enabling accurate assessment of radiation resistance. Taking the verification of radiation resistance of 1000 Gy as an example, traditional irradiation testing methods require first conducting 1000 Gy irradiation followed by testing, and then conducting 500 Gy over-irradiation and testing again after passing the test. However, using the online method in this embodiment, it is only necessary to set the final target dose to 1500 Gy (i.e., 1000 Gy + 50% over-irradiation dose) and start one continuous irradiation. Throughout the entire irradiation process from 0 Gy to 1500 Gy, the system continuously monitors all key parameters. If the electrical parameters and appearance remain stable and without anomalies when the cumulative dose reaches 1500 Gy, it can be directly determined that the radiation resistance of the component under test 30 is not less than 1000 Gy. This process is completed in one go, without the need to interrupt irradiation at 1000 Gy for relocation testing, thus compressing multiple rounds of verification into a single round. If, at any point during the irradiation process (e.g., at 800 Gy), an abnormality exceeding the threshold in electrical parameters or an abnormal appearance in the video feed is detected, irradiation is immediately stopped. Subsequently, the component under test 30 is placed at room temperature for annealing (e.g., 24 hours). After annealing, the device is powered on again and its electrical parameters are retested. Based on the retest results: if the parameters return to normal, the test passes (indicating the abnormality may be a transient effect); if the parameters remain abnormal, the test fails, and the accumulated irradiation dose at the time of failure (i.e., 800 Gy) is accurately recorded. This data provides a precise dose point for analyzing the device failure mechanism. Through an "online, continuous, and real-time" monitoring mechanism, not only is precise capture and immediate intervention of the dynamic process of performance degradation achieved, but more importantly, it seamlessly integrates the separate performance verification and over-irradiation verification stages, or even multiple rounds of testing, in traditional irradiation testing methods into a continuous, data-driven, automated judgment process.This completely eliminates the errors and risks introduced by multiple shifts, reconnections, and restarts, shortening what could have been a complex process lasting several days into a single, highly efficient online test. While ensuring the accuracy of the judgment, it achieves an order-of-magnitude increase in test efficiency and a significant reduction in costs.

[0065] Step 3: Post-Test Processing. Post-test processing includes data backup, system power-down reset, and test report generation. Specifically, post-test processing includes the following steps: After the test, the entire test data (initial parameters, real-time electrical parameter curves, anomaly records, and retest results) is saved to Network Attached Storage (NAS) via the central control device 50, and off-site backup is initiated. Subsequently, the system power is turned off, and the connecting cables between devices are disconnected in the order from the safe zone to the medium-dose zone and then to the high-dose zone, and each device is reset. Finally, a test report is generated, including test parameters, information on the device under test, test process records, and judgment results, ensuring data traceability. Through a standardized post-test processing procedure, the secure archiving of test data and the complete recording of the test process are ensured, meeting the requirements for standardization and traceability of the test.

[0066] The irradiation testing system for nuclear power robots provided in this application uses a testing device 40 to collect electrical parameters of the component under test 30 in real time during irradiation, which are then analyzed by a central control device 50. This enables online dynamic monitoring and accurate determination of the nuclear power robot's radiation resistance, thereby improving test accuracy. Furthermore, the first isolation component 60 and the second isolation component 70 physically isolate the testing device 40 and the central control device 50 from the irradiation source 10, reducing radiation interference and ensuring measurement stability and equipment safety. The irradiation testing system and method for nuclear power robots in this application can directly conduct online irradiation tests on core components (such as complete controller boards) and even the entire nuclear power robot. Compared to traditional irradiation testing methods, the test object is elevated from "semiconductor devices" to the "functional unit" and "system" levels. This allows the test to directly expose system interaction faults and post-integration vulnerabilities that cannot be detected when testing semiconductor devices individually. The assessment conclusions are closer to actual usage scenarios, achieving true system-level or whole-machine-level radiation resistance assessment. Furthermore, during online testing of the entire device, the board or device under test is in a state of actual power-on, program running, and function execution. The electrical parameters (voltage, current, communication data, control signals) collected by the testing device 40 reflect its true dynamic response under irradiation interference. By conducting the assessment under real working conditions, the authenticity and effectiveness of the test are greatly improved, and it is possible to directly verify whether the equipment can work normally under irradiation. Moreover, the traditional testing method follows a test path of: first, irradiating components, then screening qualified parts, then assembling, and then conducting whole-device functional testing (without irradiation), and finally inferring the radiation resistance of the whole device. The test path of the testing method in this application is: directly conducting online irradiation testing on the assembled components or whole device, and then obtaining a direct conclusion on radiation resistance. This not only significantly shortens the R&D verification cycle, but also provides more direct and reliable conclusions, avoiding the potential risk of inaccurate testing based on speculation.

[0067] In some embodiments, such as Figure 6 The front view of the irradiated platform 20 shown and Figure 7 The diagram shows the back of the irradiation stand 20, which includes a cabinet structure 201 and a support 202. The support 202 is located on the front of the cabinet structure 201, facing the irradiation source 10; the support 202 is used to fix the component 30 to be tested.

[0068] The cabinet structure 201 forms the main frame of the irradiation test stand 20, providing support for the installation of internal equipment and the attachment of external functional components. The cabinet structure 201 can be a three-dimensional structure or other types of support structures. The bracket 202, as the main load-bearing interface of the component under test 30, is directly connected to the component under test 30 and stably holds it in a predetermined position facing the irradiation source 10, ensuring that the component under test 30 can receive effective irradiation. By structuring the irradiation test stand 20 into a clearly defined cabinet structure 201 and a functional bracket 202, a standardized, stable, and oriented installation foundation is provided for the component under test 30, creating conditions for subsequent uniform irradiation and reliable testing.

[0069] Furthermore, the irradiated test bench 20 also includes a wiring component 203. The wiring component 203 is located inside the cabinet structure 201; it is used to connect the wiring between the device under test (DUT) 30 and the testing device 40. The wiring component 203 acts as an electrical connection hub, gathering and organizing various signal and power lines from the DUT 30, and then connecting them to the cables of the external testing device 40 through a unified outlet (such as a quick-connect connector). This avoids the confusion caused by multiple cables directly leading from the DUT 30. By integrating the wiring component 203 inside the cabinet, centralized management and organized wiring of the internal cables of the test bench are achieved, reducing the complexity of external connections and the risk of incorrect wiring, thus improving the reliability and aesthetics of the system.

[0070] Optionally, the irradiation stand 20 further includes a position adjustment mechanism. The position adjustment mechanism is connected to the support 202; it is used to adjust the spatial position of the support 202 on the cabinet structure 201 to ensure uniform irradiation of the component under test 30. As the core adjustment component of the irradiation stand 20, the position adjustment mechanism changes the spatial position of the support 202, allowing the component under test 30 fixed thereon to move or rotate within the radiation field formed by the irradiation source 10, thereby obtaining the optimal irradiation angle and position, ensuring uniform irradiation dose in all areas of the component under test 30, and eliminating uneven irradiation caused by improper placement. For example, to achieve uniform irradiation, the irradiation stand 20 can integrate a one-dimensional, two-dimensional, or rotational adjustment mechanism.

[0071] Furthermore, the position adjustment mechanism includes at least one of a horizontal displacement adjustment component, a vertical height adjustment component, and a rotation adjustment component. The horizontal displacement adjustment component is used to adjust the horizontal displacement of the support 202; for example, the horizontal displacement adjustment component can be a handwheel-driven precision slide, allowing for precise horizontal movement of the support 202 through manual operation. The vertical height adjustment component is used to adjust the vertical height of the support 202; for example, the vertical height adjustment component can be an electric push rod or a screw jack, allowing for vertical adjustment of the support 202 through electric drive. The rotation adjustment component is used to adjust the rotation direction of the support 202; the rotation adjustment component can be a low-speed motor-driven turntable, allowing for slow rotation of the support 202 in the horizontal plane through motor drive. It should be noted that the adjustment components in the above position adjustment mechanism can be used individually or in combination to adapt to test components 30 of different sizes and shapes, as well as different test requirements. In this embodiment, by integrating multiple spatial position adjustment components, the test component 30 is precisely adjusted in multiple dimensions in the radiation field, which effectively improves the uniformity of irradiation and thus ensures the consistency and comparability of the test results.

[0072] Optionally, the support 202 includes at least one metal mesh structure 2021. For example, each stand has two metal mesh supports on its front side. The mesh structure 2021 serves as the load-bearing surface of the support 202, used to directly fix the base plate of the component under test 30 to the ground using bolts, clamps, etc. Its mesh structure helps reduce radiation obstruction and scattering, and facilitates ventilation and heat dissipation. By using the metal mesh structure 2021 as the interface of the support 202, interference with the radiation field is minimized while ensuring support strength, and a good mounting point and heat dissipation conditions are provided for the component under test 30.

[0073] Optionally, the cabinet structure 201 is equipped with a detection device 90 for visual inspection of the component 30 under test. Specifically, the cabinet structure 201 includes a shielded room 2011, and the detection device 90 includes a camera 901 and a video server 902. The camera is mounted on the cabinet structure 201, and the video server 902 is located inside the shielded room 2011. The video server 902 is connected to both the camera 901 and the central control device 50. The video server 902 is used to convert the video signal detected by the camera into a video data packet and transmit the video data packet to the central control device 50.

[0074] The aforementioned shielding room 2011 is specifically located within the electrical cabinet at the rear of the cabinet structure 201. It can be constructed using radiation shielding materials such as lead-bismuth alloy, forming a localized low-radiation environment. Besides the video server 902, it can also house communication modules, power modules, and other non-experimental electronic equipment, protecting them from interference or damage caused by high-dose radiation. This embodiment, by integrating the shielding room 2011 within the irradiated test bench 20, provides a safe operating environment for critical auxiliary equipment, extends equipment lifespan, and ensures the continuity of the testing process and the reliability of the data.

[0075] The aforementioned camera 901 is positioned with its shooting direction aimed at the component under test 30, possessing low-light imaging and radiation resistance capabilities. It transmits the raw video signal to the video server 902 via a cable. For example, the camera 901 can be a high-definition industrial camera or a pan-tilt camera, mounted on the front frame of the cabinet structure 201, with its lens facing the component under test 30, which is fixed to the bracket 202. It can capture the appearance of the component under test 30 in real time during the irradiation process. By integrating the camera 901, which is aimed at the component under test 30, onto the test bench, non-contact visual monitoring of the testing process is achieved. This provides a direct means to observe whether the component under test 30 exhibits abnormal appearances such as smoke or deformation, enhancing the safety of the test. In this embodiment, the camera 901 is described using the example of being mounted on the cabinet structure 201. In practical applications, the camera 901 can be mounted in a corner or supported by a bracket, as long as its shooting direction is aligned with the component under test 30. The specific mounting method is not limited in this embodiment.

[0076] The aforementioned video server 902, acting as a video processing unit, receives the raw video signals captured by the camera 901. It performs compression, encoding, and packetization on the received analog or digital video signals, converting them into video data packets suitable for network transmission. These data packets are then sent via a communication link (such as Ethernet) to the central control device 50 located in the safe zone for display and storage. By setting up a shielded room 2011 inside the cabinet, a safe storage space is provided for radiation-sensitive non-critical experimental equipment such as the video server 902 and communication modules, effectively preventing performance damage or malfunctions due to direct exposure to the radiation field. By placing the video server 902 near the shielded room 2011 of the irradiated platform 20 and completing local processing and forwarding of the video signals, the integration and front-end nature of the video monitoring function is achieved, reducing interference and attenuation during long-distance analog video transmission and ensuring the quality and real-time performance of the video monitoring images. This embodiment, through the combination of the camera 901 and the video server 902, achieves real-time, high-definition, and long-distance monitoring of the appearance of the component under test 30 during irradiation, providing a reliable guarantee for timely detection of anomalies and the implementation of emergency measures.

[0077] Optionally, a movable component 2012 is provided at the bottom or side of the cabinet structure 201 to move the irradiation platform 20. Specifically, the movable component 2012 can be a caster wheel with a brake, installed at the bottom of the cabinet structure 201. By unlocking the brake, the platform can be manually pushed to a designated position on the irradiation hall floor. Once in position, the brake is locked to secure the irradiation platform 20. By equipping the irradiation platform 20 with the movable component 2012, it gains convenient movement and positioning capabilities, enabling rapid adaptation to different irradiation hall layouts or experimental requirements, greatly improving the flexibility of equipment deployment.

[0078] Optionally, the rear structure of the cabinet structure 201 is movable, and the rear structure is connected to the side structure of the cabinet structure 201 via hinges. Specifically, the rear structure can be one or more door panels connected to the cabinet side frame via hinges. By opening this movable rear structure, the internal space of the cabinet can be exposed, facilitating the installation, maintenance, inspection, or replacement of the wiring components 203 and the equipment within the shielding chamber 2011. Designing the rear of the cabinet as a movable hinged door structure greatly facilitates the maintenance and operation of the equipment inside the irradiated platform 20, improving the maintainability and ease of use of the system.

[0079] Optionally, the cabinet structure 201 may also include auxiliary fasteners: adjustable buckles are provided on the side of the stand to fix the cables and prevent the cables from falling off due to the movement of the stand or vibration of the irradiation environment.

[0080] The testing method for the irradiation testing system of the nuclear power robot described in this application includes three processes, as follows:

[0081] Process 1: Pre-test Preparation. Pre-test preparation refers to a series of standardized operations involving the deployment, connection, initialization, and parameter recording of all components of the test system before conducting the total dose irradiation test. The pre-test preparation specifically includes the following steps: First, based on the dose distribution within the irradiation hall, a zoned layout is implemented. At least one irradiation stand 20 is placed in the high-dose zone of the irradiation hall, with its front facing the irradiation source 10. The test device 40 is placed in the medium-dose zone behind the first isolation component 60 (e.g., the labyrinth opening between the first and second walls of the irradiation hall). The central control equipment 50 and auxiliary cabinet are placed in the safe zone outside the second isolation component 70 (i.e., the outer wall of the irradiation hall). Then, standardized cables are used to complete the wiring connections between the irradiation stand 20, the test device 40, the central control equipment 50, and the auxiliary cabinet. Next, the component under test 30 is fixed to the bracket 202 of the irradiation stand 20. The height of the bracket 202 is adjusted according to the size of the component under test 30, and all electrical interfaces are connected to the wiring components 203 inside the irradiation stand 20. Non-test equipment (such as video server 902) was placed inside the shielded chamber 2011 of the irradiation stand 20. Then, the wiring was checked to ensure that each cable was correctly connected according to its color and number, with no incorrect or missing connections. Finally, the system was powered on, and an appropriate operating bias voltage (e.g., 5V bias for the control chip, 24V bias for the board) was applied to the component under test 30 via the power supply in the test device 40 or auxiliary cabinet. After the component under test 30 stabilized, its initial electrical parameters (such as voltage, current, signal frequency, and waveform) were recorded by the central control device 50 as the benchmark control group data. Through standardized zoning, connection, and initialization procedures, the consistency of the test environment and initial state was ensured for each test, laying a solid foundation for obtaining accurate and comparable irradiation effect data and effectively avoiding test errors introduced by improper preparation.

[0082] Process Two: Irradiation Monitoring. Irradiation monitoring refers to the process by which the testing system continuously collects the performance parameters and appearance of the component under test (SUT) 30 after the irradiation source 10 is activated, and controls and judges the test process based on real-time data. Irradiation monitoring specifically includes the following steps: The irradiation source 10 is activated, and the system enters a continuous online measurement state. The data acquisition card within the testing device 40 begins to collect the electrical parameters of the SUT 30 in real time and transmits them to the central control device 50 via a line. Simultaneously, the camera 901 on the irradiated stand 20 collects the appearance video signal of the SUT 30 in real time, which is processed by the video server 902 located in the shielded room 2011 and then transmitted to the central control device 50. Operators can view the electrical parameter change curves, appearance video images, and the working status of each device on the split-screen display 500 of the central control device 50 in real time. There are two judgment paths during the monitoring process: First, if the electrical parameters of the component under test 30 remain stable throughout the irradiation process, and its appearance is normal as observed through video (e.g., no smoke, no deformation), irradiation continues until the preset total dose target is reached. Then, the irradiation source 10 is turned off, and the component under test 30 is judged to have passed the irradiation resistance test. Second, if abnormal fluctuations exceeding the threshold are detected in the electrical parameters, or if abnormal appearance is observed in the video of the component under test 30, the irradiation source 10 is immediately stopped. The abnormal component under test 30 is moved to room temperature for annealing (e.g., 24 hours). After annealing, the operating bias voltage is reapplied to the component under test 30, and its electrical parameters are retested through the testing device 40: if the retested parameters return to normal, the test is judged to have passed; if the retested parameters are still abnormal, the test is judged to have failed, and the cumulative irradiation dose received by the component under test 30 at the time of failure is recorded. Through a closed-loop mechanism of real-time online monitoring and intelligent judgment using "electrical parameters + vision" dual channels, the dynamic capture and immediate intervention of the radiation resistance degradation process are realized. This not only greatly improves the safety and judgment efficiency of the test, but also accurately locates the failure dose point, significantly enhancing the reliability and scientific nature of the test results.

[0083] Process Three: Post-Test Processing. Post-test processing refers to the organization, archiving, and resetting of test data, equipment, and the site after the irradiation test to complete the test loop and ensure data traceability. Post-test processing specifically includes the following steps: First, all data generated throughout the test, including initial parameters, real-time acquired electrical parameter curves, video recordings, abnormal event records, and retest results, are uniformly saved to a network-attached storage device via the central control device 50, and an off-site backup process is initiated to prevent data loss. Next, following the order from the safe zone to the medium-dose zone and then to the high-dose zone, the power to each device is turned off sequentially, and the connecting cables between devices are carefully disconnected. The irradiated platform 20, testing device 40, and other equipment are reset to their initial state or designated storage location. Finally, a complete test report is compiled and generated. The report must cover test parameters (total dose, dose rate), information on the tested component 30, detailed test process records (including any abnormalities and handling measures), and the final judgment results and analysis, ensuring complete traceability of the entire test process and compliance with test specifications. A rigorous closed-loop system for test quality management is established through systematic data archiving, equipment reset, and report generation. This not only ensures the long-term safety and availability of valuable test data but also provides a complete and reliable basis for subsequent data analysis, component improvement, and standardization, thereby enhancing the standardization and value of the entire testing activity.

[0084] For example, such as Figure 8 As shown, taking the test scenario of an irradiation test hall in northern my country as an example (the scenario is set with a total dose of 1000 Gy and a dose rate of 200 Gy / h, which translates to a dose rate of 5.6 rad / s), the equipment is arranged in zones according to the "irradiation dose gradient", as follows:

[0085] Equipment 1 (Irradiation Stands A and B): Located in the high-dose area of ​​the irradiation hall, this area has a dose rate of 5.6 rad / s and is mainly used to mount the equipment under test to receive irradiation.

[0086] Equipment 2 (Test Cabinet): Located at the "maze-like opening between the first and second floor walls" in the irradiation hall, this location is in the medium-dose zone, with a dose rate of approximately 1.8 Gy / h. The distance between Equipment 2 and Equipment 1 is controlled within the range of 3-6 meters. This distance setting avoids signal attenuation problems caused by excessively long cables (if cables are laid from the safety area to the irradiation hall, the length needs to be more than 35 meters). Actual measurements show that the signal attenuation rate of 3-6 meter cables is ≤2%, while the signal attenuation rate of 35 meter cables is ≥15%.

[0087] Equipment 3 (main control console) and Equipment 4 (auxiliary cabinet): Located in a safe area outside the irradiation hall, they are far from radiation interference, ensuring the safety of operators and the long-term stable operation of core control and auxiliary equipment.

[0088] In addition, the equipment is connected by standardized cables with labels. The outer layer of the cables is made of radiation-proof insulation material. At the same time, the partitioned terminal blocks and quick-change connectors of the irradiated platform electrical cabinet enable efficient docking and disconnection between equipment, reduce wiring time, and avoid problems such as incorrect or missing connections.

[0089] The online total dose irradiation test procedure is divided into three stages: pre-test preparation, irradiation process monitoring, and post-test processing, as detailed below. Figure 9 As shown:

[0090] Pre-test preparation: Arrange the test system equipment according to a reasonable zoning layout plan, and connect equipment 1, equipment 2, equipment 3, and equipment 4 using standardized cables; fix the device under test (DUT) on the metal mesh bracket of equipment 1, and adjust the bracket height according to the size of the DUT to ensure uniform illumination; place non-test equipment in the miniature shielding chamber of equipment 1 to avoid radiation interference; verify the wiring: check the terminal block zoning labels and cable colors / numbers to confirm that each cable is connected to the corresponding terminal without misconnection or omission; power on the system and apply an adaptive bias to the DUT through the power supply (e.g., apply a 5V bias to the control chip and a 24V bias to the board). After the equipment is running stably, record the initial electrical parameters (e.g., voltage, current, signal frequency, waveform) through the industrial control computer as test control data.

[0091] Irradiation process monitoring: Upon starting the irradiation source, the system enters continuous online measurement mode: the acquisition card of device 2 collects the electrical parameters of the device under test in real time and transmits them to the industrial control computer via the signal conversion module; the operator monitors in real time: viewing the electrical parameter curves, the appearance of the device under test, and the working status of each device on a split screen; if the electrical parameters are stable throughout the process and the device appearance is normal, continue irradiation until the specified total dose is reached, then turn off the irradiation source, and the test is deemed passed; if the electrical parameters are abnormal or the device appearance is abnormal (such as smoke or deformation), immediately stop irradiation and anneal the device under test at room temperature for 24 hours; after annealing, reapply the bias to the device and remeasure the electrical parameters: if the remeasured electrical parameters return to normal, the test is deemed passed; if the remeasured electrical parameters are still abnormal, the test is deemed failed, and the irradiation dose at the time of device failure is recorded.

[0092] Post-test processing: Save all test data (initial parameters, real-time electrical parameter curves, anomaly records, and retest results) to NAS storage using device 3, and initiate off-site backup to ensure no data loss; turn off the system power, disconnect cables in the order of "safe zone - medium dose zone - high dose zone", and reset each device; compile the test report, including test parameters, information on the device under test, test process records, and judgment results, to ensure data traceability and meet test specification requirements.

[0093] The irradiation testing system for nuclear power robots described in this application has the following beneficial effects: (1) Real-time online measurement is achieved, improving the accuracy of irradiation limit determination: The power supply and working signals of the device under test are transferred and transmitted to the main control console in the safe area in real time through the test cabinet. With the help of the measuring instruments in the auxiliary cabinet, the working status of the device under test can be monitored in real time during the test. It does not need to rely on the method of "comparison before and after irradiation + repeated test", accurately capturing the performance changes of the device under different irradiation doses, greatly shortening the test cycle, reducing the test cost, and improving the reliability of irradiation limit determination; (2) Ensure test stability and equipment safety: The equipment is arranged in zones according to irradiation dose, and the core acquisition and control equipment (test cabinet, main control console) is far away from high radiation areas to reduce radiation interference; the UPS power supply design of the auxiliary cabinet can meet the requirements of the test. In the event of a sudden power outage, the test is not interrupted and data is not lost, and the test success rate is increased to over 98%; the miniature shielding room inside the irradiated platform further protects non-test equipment and extends the service life of the equipment; cameras are arranged on the platform to observe the irradiated equipment and prevent accidents; (3) Enhance test adaptability and flexibility: the independent / combined use mode of the two irradiated platforms and the liftable support structure are adapted to different sizes and types of test equipment (such as electronic components, parts, and complete machines); the modular design of the test cabinet can expand the acquisition function according to the test requirements without the need for overall system modification, and adapt to diverse test scenarios; (4) Improve the reliability of test signals: the equipment 2 is arranged at the entrance of the maze, and the distance from the test equipment is generally 3~6m, which avoids the problem of signal attenuation caused by the excessively long line (generally more than 35m) for measuring electrical parameters from the safe area.

[0094] In summary, the embodiments of this application can solve the technical problems in the conventional technology: by realizing real-time online measurement of the electrical parameters of the device under test during irradiation, performance changes can be accurately captured, repeated tests can be avoided, and the efficiency and accuracy of irradiation limit determination can be improved; by designing a standardized equipment support structure and cable management scheme, the problems of uneven irradiation and messy wiring of the device under test can be solved, and the degree of test standardization can be improved; when the equipment is affected by irradiation, test data is easily lost in the event of a sudden power outage; by optimizing the equipment layout and protection design, radiation interference to non-test equipment can be avoided, and sudden power outages can be dealt with to ensure that test data is not lost and equipment is not damaged; by improving system adaptability, it can meet the test scenarios of different sizes and types of devices under test (components, parts, and complete machines) and different test requirements (such as different dose rates, total doses, and different irradiation hall structures).

[0095] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0096] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. An irradiation testing system for a nuclear power plant robot, characterized in that, The irradiation testing system includes: an irradiation source, at least one irradiated stand, a testing device, and a central control device; The irradiation stand is used to support the component to be tested, and the irradiation stand is positioned close to the irradiation source; The testing device is used to connect to the component under test and the central control equipment via wiring to collect electrical parameters of the component under test during the irradiation process. The central control device is used to analyze the radiation resistance of the component under test based on the electrical parameters. A first isolation component is provided between the testing device and the irradiation source; a second isolation component is provided between the central control equipment and the irradiation source.

2. The system according to claim 1, characterized in that, The irradiation platform includes: a cabinet structure and a support; the support is disposed on the front of the cabinet structure, and the front faces the irradiation source; The bracket is used to fix the component to be tested.

3. The system according to claim 2, characterized in that, The irradiated platform further includes: a wiring component; the wiring component is disposed inside the cabinet structure; The wiring component is used to connect the circuit between the component under test and the testing device.

4. The system according to claim 2, characterized in that, The irradiation platform further includes a position adjustment mechanism, which is connected to the support frame; The position adjustment mechanism is used to adjust the spatial position of the bracket on the cabinet structure so that the component under test is evenly irradiated.

5. The system according to claim 4, characterized in that, The position adjustment mechanism includes at least one of a horizontal displacement adjustment component, a vertical height adjustment component, and a rotation adjustment component; The horizontal displacement adjustment component is used to adjust the horizontal displacement of the bracket; The vertical height adjustment component is used to adjust the vertical height of the bracket; The rotation adjustment component is used to adjust the rotation direction of the bracket.

6. The system according to any one of claims 2-5, characterized in that, The support includes at least one mesh structure.

7. The system according to claim 2, characterized in that, The cabinet structure is equipped with a detection device for visual inspection of the component to be tested.

8. The system according to claim 7, characterized in that, The cabinet structure includes a shielded room, and the detection device includes a camera and a video server; the camera is mounted on the cabinet structure, the video server is mounted in the shielded room, and the video server is connected to both the camera and the central control device. The video server is used to convert the video signal detected by the camera into a video data packet, and then transmit the video data packet to the central control device.

9. The system according to claim 2, characterized in that, The bottom or side of the cabinet structure is provided with a movable component to move the irradiation platform.

10. The system according to claim 2, characterized in that, The rear structure of the cabinet is movable, and the rear structure is connected to the side structure of the cabinet by hinges.

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