Optical module parameter testing apparatus, method, computer device and computer readable storage medium
By using jumpers of different inner diameters and an optical power meter combined with automated data processing of the control module, the optical module testing process is simplified, improving efficiency and accuracy. This solves the problems of cumbersome traditional optical module testing and susceptibility to human factors, and reduces equipment and labor costs.
Patent Information
- Application Number
- CN202610714569.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-05-22
- Publication Date
- 2026-07-10
AI Technical Summary
Traditional optical module testing techniques are cumbersome and susceptible to human error, leading to inaccurate test results, increased time costs, and impact on the stability and reliability of optical communication systems.
By using jumpers with different inner diameters and optical power meters, combined with the automated data processing of the control module, and by setting the output power of the optical module to a fixed value, the difference in optical power obtained from jumpers with different inner diameters is compared with the error value to determine whether the optical module is qualified.
Simplify the testing process, improve testing efficiency, reduce human error, lower equipment costs, facilitate large-scale promotion and application, and ensure the quality of optical modules.
Smart Images
Figure CN122372077A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of optical module testing technology, and more specifically, to optical module parameter testing equipment, methods, computer equipment, and computer-readable storage media. Background Technology
[0002] In the field of optical communication, optical modules are key components for realizing photoelectric signal conversion and transmission, and their performance stability and reliability directly affect the operational quality of the entire optical communication system. With the rapid development of optical communication technology, the performance requirements for optical modules are also increasing. Accurate and efficient testing of various parameters of optical modules has become an important link in ensuring the normal operation of optical communication systems.
[0003] During the production of optical modules, variations in manufacturing processes and fluctuations in the properties of raw materials may cause deviations in their performance parameters. If these deviations are not accurately detected and corrected before leaving the factory, they may lead to a series of problems once the optical modules are put into use, such as signal transmission errors and communication interruptions, seriously affecting the stability and reliability of the optical communication system. Therefore, comprehensive and accurate parameter testing of optical modules is a crucial step in ensuring their quality.
[0004] Traditional testing techniques can be cumbersome in terms of testing procedures, requiring multiple manual operations and parameter settings. This not only increases the time cost of testing but also makes it easy for human factors to cause testing errors, affecting the reliability of test results. Summary of the Invention
[0005] The purpose of this application is to provide an optical module parameter testing device, method, computer device, and computer-readable storage medium to solve at least one of the technical problems mentioned in the background art.
[0006] To achieve the above objectives, firstly, this application provides an optical module parameter testing device, comprising: The first jumper and the second jumper have different inner diameters; An optical power meter is used to obtain the optical power of the optical module under test sequentially through the first jumper and the second jumper. The control module is electrically connected to the optical power meter, and the optical power meter sends the optical power obtained based on the first jumper and the optical power obtained based on the second jumper to the control module.
[0007] In an optional implementation, a test control board is further included, which is used to electrically connect the control module and the optical module under test, and the control module is used to control the optical module under test through the test control board.
[0008] In an optional implementation, a power module is further included, which is used to electrically connect the control module and the test control board, and the power module supplies power to the test control board.
[0009] In an optional implementation, the inner diameter of the first jumper is 30μm-55μm.
[0010] In an optional implementation, the inner diameter of the second jumper is 56μm-70μm.
[0011] Secondly, this application provides a method for testing optical module parameters, the steps of which include: Set the output power of the optical module to a fixed value; The optical module emits light beams and calculates their optical power by using jumpers with different inner diameters. The absolute value of the difference between the two power values is compared with the error value. If the absolute value of the difference between the two power values is greater than the error value, the optical module is faulty. Alternatively, at least one of the power values is compared with a preset range. If the power value is not within the preset range, the optical module is faulty.
[0012] In an optional implementation, two jumpers with different inner diameters are used to coaxially position the optical module beam.
[0013] In an optional implementation, the two jumpers with different inner diameters are designated as a first jumper and a second jumper, wherein the inner diameter of the first jumper is 30μm-55μm and the inner diameter of the second jumper is 56μm-70μm.
[0014] Thirdly, this application provides computer equipment, including: At least one processor; and A memory that is communicatively connected to the at least one processor; The memory stores a computer program that can be executed by the at least one processor, which is then executed by the at least one processor to enable the at least one processor to perform the optical module parameter testing method described in any of the foregoing embodiments.
[0015] Fourthly, the present invention provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the optical module parameter testing method described in any of the foregoing embodiments.
[0016] The optical module parameter testing equipment provided in this application has a simpler operation process than traditional methods. Operators connect jumpers to obtain optical power data according to fixed steps, reducing tedious steps and saving time. The control module can automatically process data and determine whether the optical module is qualified, improving testing efficiency and benefiting the production process. Before leaving the factory, the equipment is used for preliminary testing, and then expensive equipment is used to test defective products, which can reduce the purchase of expensive equipment and reduce costs. Moreover, the equipment has a low cost and does not require high operator skills, making it easy to promote on a large scale to further reduce costs.
[0017] Other features and advantages of this application will be described in detail in the following detailed description section. Attached Figure Description
[0018] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.
[0019] Figure 1 and Figure 2 A schematic diagram of one embodiment of the optical module parameter testing device provided in this application; Figures 3 to 5 A schematic diagram showing the usage status of the optical module parameter testing equipment provided in this application; Figure 6 A schematic flowchart of a portion of one embodiment of the optical module parameter testing method provided in this application; Figure 7 A schematic diagram of one embodiment of the computer device provided in this application.
[0020] icon: 100 - Optical power meter; 200 - Control module; 300 - Test control board; 400 - Power module; 500 - Optical module; 600 - First jumper; 700 - Second jumper; 810 - Processor; 820 - Memory; 830 - Computer program. Detailed Implementation
[0021] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The components of the embodiments of this application described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.
[0022] In the description of this application, it should be noted that the terms "inner" and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product is in use. They are used only for the convenience of describing this application and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application. Furthermore, the terms "first," "second," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.
[0023] In the description of this application, it should also be noted that, unless otherwise expressly specified and limited, the terms "setup" and "connection" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.
[0024] like Figure 1 As shown, in a first aspect, embodiments of this application provide an optical module parameter testing device, including a control module 200, an optical power meter 100, a first jumper 600, and a second jumper 700.
[0025] The inner diameters of the first jumper 600 and the second jumper 700 are different.
[0026] The optical power meter 100 is used to obtain the optical power of the optical module 500 under test through the first jumper 600 and the second jumper 700 in sequence. For example, the optical power meter 100 is a dual-channel optical power meter.
[0027] The control module 200 is electrically connected to the optical power meter 100. The optical power meter 100 sends the optical power obtained based on the first jumper 600 and the optical power obtained based on the second jumper 700 to the control module 200.
[0028] For example, the control module 200 includes, but is not limited to: programmable logic controller (PLC), numerical control device (NC), process controller, distributed control system (DCS), supervisory control and data acquisition system (SCADA), programmable automation controller (PAC), etc.
[0029] During use, the operator first turns on the optical module 500 under test, causing it to emit light, and then sets the optical power of the optical module 500 to a fixed value. For example... Figure 1 As shown, the operator inserts one end of the first jumper cable 600 into the optical power meter 100 and the other end into the optical module 500. The first jumper cable 600 guides the light beam from the optical module 500 into the optical power meter 100. The optical power meter 100 acquires the optical power P1 and sends it to the control module 200. The operator then disconnects the first jumper cable 600 from both the optical power meter 100 and the optical module 500. Figure 2 As shown, one end of the second jumper 700 is inserted into the optical power meter 100, and the other end is installed on the optical module 500. The second jumper 700 guides the light beam from the optical module 500 into the optical power meter 100. The optical power meter 100 obtains the optical power P2 and sends it to the control module 200. The control module 200 calculates |P1-P2| and compares it with the error value C. The error value C can be set according to the actual needs of the product. The error value C is positively correlated with the rated power of the optical module 500. The higher the rated power of the optical module 500, the larger the error value C. For example, if the rated power of the optical module 500 is 8dB, the error value C is set to 0.5dB. Different products have different requirements. If the power of the optical module 500 is higher, such as 15dB, the error value C can be set to 0.7dB. For example, if the rated power of the optical module 500 is 20dB, the error value C can be set to 1dB. However, if higher accuracy is required, the error value C can be set to 0.9dB.
[0030] like Figure 3 As shown, if |P1-P2|≤C, it indicates that the optical module 500 is qualified, and the beam of the optical module 500 is basically completely guided to the optical power meter 100 by the first jumper 600 and the second jumper 700.
[0031] like Figure 4 As shown, if the beam of the optical module 500 experiences radial shift in focus, part of the beam will be outside the first jumper 600. The beam introduced into the optical power meter 100 by the first jumper 600 is smaller than the beam introduced into the optical power meter 100 by the second jumper 700, resulting in a situation where |P1-P2|>C. The control module 200 determines that the optical module 500 is faulty and requires the operator to perform further testing on the optical module 500.
[0032] like Figure 5As shown, if the beam of the optical module 500 experiences axial shift of the focal point, a portion of the beam will still be outside the first jumper 600. The beam introduced into the optical power meter 100 by the first jumper 600 is smaller than the beam introduced into the optical power meter 100 by the second jumper 700, resulting in a situation where |P1-P2|>C. The control module 200 determines that the optical module 500 is faulty and requires the operator to perform further testing on the optical module 500.
[0033] Before the optical module 500 leaves the factory, the operator first uses the optical module parameter testing equipment provided in this application to conduct a preliminary test on the optical module 500. The defective optical modules 500 found in the test are then subjected to more specific fault tests using expensive testing equipment, thereby reducing the number of expensive testing equipment to be purchased and reducing equipment costs.
[0034] The optical module parameter testing equipment provided in this application, although requiring two jumper plugging and unplugging operations during operation, has a simpler overall process compared to traditional methods. Operators only need to connect the jumpers sequentially according to fixed steps to obtain optical power data, eliminating the need for complex multiple operations and parameter settings, reducing tedious steps and saving testing time.
[0035] The control module 200 can receive data sent by the optical power meter 100 in real time, quickly calculate the difference and compare it with the error value, and promptly give the judgment result of whether the optical module 500 is qualified. This automated data processing and judgment method improves testing efficiency, enables operators to quickly know the results, and promptly classify and process the optical module 500, which is conducive to the smooth operation of the production process.
[0036] Before the optical module 500 leaves the factory, it is first tested using the low-cost and easy-to-operate optical module parameter testing equipment provided in this application. The defective optical modules 500 are then subjected to more detailed testing using expensive testing equipment. This reduces the number of expensive testing devices to be purchased, thereby lowering equipment costs.
[0037] Because the equipment is inexpensive, requires relatively low operator skills, and can effectively complete the preliminary testing of optical modules 500, it is easy to promote and apply it on a large scale in optical module 500 manufacturing enterprises, further reducing the overall testing cost.
[0038] like Figure 1 or Figure 2 As shown, in one embodiment, the optical module parameter testing device further includes a test control board 300, which is used to electrically connect the control module 200 and the optical module 500 under test. The control module 200 is used to control the optical module 500 under test through the test control board 300.
[0039] For example, the test control board 300 is a PCBA board used to fix the optical module under test 500, provide power and control signals, and is a circuit board device regulated by the control module 200 to realize automatic power-on and light emission. The test control board 300 is a bridge connecting the control commands of the control module 200 and the physical optical module 500, and plays a key execution node role in this application, ensuring the consistency and repeatability of the test process.
[0040] The test control board 300 is used to electrically connect the control module 200 and the optical module under test 500. The control module 200 controls the optical module under test 500 through the test control board 300. This setup establishes a communication bridge between the control module 200 and the optical module under test 500, enabling the control module 200 to accurately transmit control commands to the optical module under test 500, thereby controlling the testing of various parameters of the optical module 500 and ensuring that the testing function can be carried out normally.
[0041] The test control board 300, controlled by the control module 200, can automatically power on and emit light. This means that during testing, there is no need for manual power-on operation of the optical module 500, reducing human intervention, improving the automation level of testing, and enabling more efficient parameter testing of the optical module 500.
[0042] like Figure 1 or Figure 2 As shown, in one embodiment, the optical module parameter testing equipment further includes a power supply module 400, which is used to electrically connect the control module 200 and the test control board 300, and the power supply module 400 supplies power to the test control board 300.
[0043] The power module 400 provides a stable and continuous power supply to the test control board 300. During the parameter testing of the optical module 500, the test control board 300 needs to operate stably to achieve functions such as electrically connecting the control module 200 and the optical module under test 500, and transmitting control commands and signals. Stable power is the foundation for the normal operation of the test control board 300, preventing abnormal operation of the test control board 300 due to power fluctuations or interruptions, which would affect the stable operation of the entire test equipment and ensure that the test process can proceed smoothly and continuously.
[0044] In one embodiment, the inner diameter of the first jumper 600 is 30 μm-55 μm. For example, the inner diameter of the first jumper 600 is 30 μm. In another embodiment, the inner diameter of the first jumper 600 is 40 μm. In another embodiment, the inner diameter of the first jumper 600 is 45 μm. In another embodiment, the inner diameter of the first jumper 600 is 50 μm. In yet another embodiment, the inner diameter of the first jumper 600 is 55 μm.
[0045] In one embodiment, the inner diameter of the second jumper 700 is 56 μm-70 μm. For example, the inner diameter of the second jumper 700 is 56 μm. In another embodiment, the inner diameter of the second jumper 700 is 60 μm. In another embodiment, the inner diameter of the second jumper 700 is 65 μm. In yet another embodiment, the inner diameter of the second jumper 700 is 70 μm.
[0046] If the inner diameter of the first jumper 600 is too large (greater than 55 μm), or the inner diameter of the second jumper 700 is too small (less than 56 μm), their inner diameters will be relatively close. The first jumper 600 will easily receive more scattered light, while the second jumper 700 will not easily receive the light spot after the focus shift. This will cause the optical power input from the first jumper 600 to be close to the optical power input from the second jumper 700. The absolute value of the difference between the two powers received by the first jumper 600 and the second jumper 700 will be smaller, resulting in decreased detection accuracy and increased false positive rate. If the inner diameter of the first jumper 600 is too small (less than 30 μm), the detection accuracy will decrease. Alternatively, if the inner diameter of the second jumper 700 is too large (greater than 70μm), the second jumper 700 will easily receive more scattered light (compared to the case where the inner diameter is less than 70μm). This will result in a larger absolute value of the power difference between the first jumper 600 and the second jumper 700, leading to excessively high detection sensitivity, reduced yield of the optical module 500, and increased production costs. Therefore, the inner diameter of the first jumper 600 is limited to the range of 30μm-55μm, and the inner diameter of the second jumper 700 is limited to the range of 56μm-70μm. This reduces the probability of false detection while ensuring detection sensitivity.
[0047] like Figure 6 As shown, in a second aspect, embodiments of this application also provide a method for testing optical module parameters, the steps of which include: S10: Set the output power of the optical module 500 to a fixed value.
[0048] For example, the control module 200, test control board 300, and power module 400 of the optical module parameter testing equipment provided in the above embodiments enable the setting of the optical module 500's output power to a fixed value. This operation effectively controls a key variable in the testing process, ensuring that subsequent test results are not deviated due to fluctuations in the optical module 500's output power. For instance, if the optical module 500's output power is unstable, emitting different power at different times, the output power obtained using the same inner diameter jumper will also differ. This makes it impossible to accurately determine whether the difference in test results is due to a problem with the optical module 500 itself or power fluctuations. Setting a fixed output power avoids this situation, providing a solid foundation for accurately testing the performance of the optical module 500.
[0049] S20: Use jumpers with different inner diameters to obtain the light beam emitted by the optical module 500 and calculate its optical power.
[0050] For example, the first jumper 600 and the second jumper 700 of the optical module parameter testing device provided in the above embodiment are used to acquire the light beam emitted by the optical module 500 in sequence, and the power meter is used to acquire two powers P1 and P2 respectively, and the control module 200 calculates |P1-P2|.
[0051] S30: Compare the absolute value of the two power differences, |P1-P2|, with the error value C.
[0052] For example, the control module 200 of the optical module parameter testing device provided in the above embodiment compares the absolute value of two power differences, |P1-P2|, with the magnitude of the error value C.
[0053] S40: If |P1-P2|>C, then the optical module is faulty (500).
[0054] S50: If |P1-P2|≤C, then the optical module 500 is qualified.
[0055] In step S10, the light output power of the optical module 500 is set to a fixed value.
[0056] In one embodiment, two jumpers with different inner diameters are used to coaxially position the beam of the optical module 500, thereby ensuring the accuracy of acquiring the beam power of the optical module 500.
[0057] The light beam emitted by the optical module 500 has a certain directionality and divergence angle. When two jumpers with different inner diameters are installed coaxially, the light beam is guaranteed to propagate along the same central axis, minimizing beam offset during transmission. If the jumpers are installed off-axis, the light beam may partially illuminate the inner wall of the jumper, causing light scattering and absorption, resulting in the measured optical power being lower than the actual power emitted by the optical module 500. Coaxial installation effectively avoids this situation, laying the foundation for accurate optical power measurement.
[0058] In one embodiment, the two jumpers with different inner diameters are a first jumper 600 and a second jumper 700, wherein the inner diameter of the first jumper 600 is 30 μm-55 μm. For example, the inner diameter of the first jumper 600 is 30 μm. In another embodiment, the inner diameter of the first jumper 600 is 40 μm. In another embodiment, the inner diameter of the first jumper 600 is 45 μm. In another embodiment, the inner diameter of the first jumper 600 is 50 μm. In yet another embodiment, the inner diameter of the first jumper 600 is 55 μm.
[0059] The inner diameter of the second jumper 700 is 56 μm-70 μm. For example, the inner diameter of the second jumper 700 is 56 μm. In another embodiment, the inner diameter of the second jumper 700 is 60 μm. In another embodiment, the inner diameter of the second jumper 700 is 65 μm. In yet another embodiment, the inner diameter of the second jumper 700 is 70 μm.
[0060] The optical module parameter testing method of this application also provides another implementation method for determining whether the optical module 500 is qualified. In another embodiment, the light beam emitted by the optical module 500 is obtained and the optical power is calculated through two jumpers. The two jumpers will obtain two power values. At least one of the power values is compared with a preset range. If the power value is not within the preset range, the optical module 500 is defective. The preset range can be set according to actual needs. If the optical module 500 is qualified, its power should be within the preset range or equal to the boundary value of the preset range. If the optical module 500 is defective, the power obtained by the jumpers may be greater than or less than the preset range; therefore, whether it is less than or greater than the preset range, it can be determined as defective. In this embodiment, a single jumper can also be used to obtain the power of the optical module 500, or at least two jumpers of different diameters can be used to obtain the power of the optical module 500 respectively. The above two implementation methods for determining whether the optical module 500 is qualified can be chosen arbitrarily.
[0061] Thirdly, embodiments of this application also provide a computer device, such as... Figure 7 As shown, the computer device includes a memory 820, a processor 810, and a computer program 830 stored in the memory 820 and executable on the processor 810. When the processor 810 executes the computer program 830, it implements the above-mentioned optical module parameter testing method.
[0062] The memory 820 includes at least one type of readable storage medium, including flash memory, hard disk, multimedia card, card-type memory (e.g., SD or DX memory), magnetic memory, magnetic disk, optical disk, etc. In some embodiments, the memory 820 can be an internal storage unit of a computer device, such as the hard disk of that computer device. In other embodiments, the memory 820 can be an external storage device, such as a plug-in hard disk, a SmartMediaCard (SMC), a Secure Digital (SD) card, a flash card, etc. Furthermore, the memory 820 can include both internal and external storage units of a computer device. The memory 820 can be used not only to store application software and various types of data installed on the computer device, but also to temporarily store data that has been output or will be output.
[0063] In some embodiments, the processor 810 may be an electronic control unit (ECU, also known as a vehicle computer), a central processing unit (CPU), a controller, a microcontroller, a microprocessor 810, or other data processing chips, used to run program code stored in the memory 820 or process data, such as executing access restriction programs.
[0064] It should be pointed out that, Figure 7 The structure shown does not constitute a limitation on the computer device. In other embodiments, the computer device may include fewer or more components than shown, or combine certain components, or have different component arrangements.
[0065] Fourthly, embodiments of this application also provide a computer-readable storage medium having a computer program 830 stored thereon, which, when executed by a processor 810, implements the optical module parameter testing method as described above.
[0066] Those skilled in the art will understand that the logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a system including processor 810, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, "computer-readable medium" can mean any means that can contain, store, communicate, propagate, or transmit programs for use by, or in conjunction with, an instruction execution system, apparatus, or device.
[0067] More specific examples of computer-readable media (a non-exhaustive list) include: electrical connections (electronic devices) having one or more wires, portable computer disk drives (magnetic devices), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). Additionally, the computer-readable medium can even be paper or other suitable media on which the program can be printed, since the program can be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, interpreting, or otherwise processing as necessary, and then stored in computer memory 820.
[0068] It should be understood that various parts of this application can be implemented using hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented using software or firmware stored in memory 820 and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, it can be implemented using any one or a combination of the following techniques known in the art: discrete logic circuits having logic gates for implementing logical functions on data signals, application-specific integrated circuits (ASICs) having suitable combinational logic gates, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.
[0069] It should be noted that, where there is no conflict, the features in the embodiments of this application can be combined with each other.
[0070] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.
Claims
1. An optical module parameter testing device, characterized in that, include: The first jumper (600) and the second jumper (700) have different inner diameters; An optical power meter (100) is used to obtain the optical power of the optical module (500) under test sequentially through the first jumper (600) and the second jumper (700); The control module (200) is electrically connected to the optical power meter (100), and the optical power meter (100) sends the optical power obtained based on the first jumper (600) and the optical power obtained based on the second jumper (700) to the control module (200).
2. The optical module parameter testing equipment according to claim 1, characterized in that, It also includes a test control board (300), which is used to electrically connect the control module (200) and the optical module under test (500), and the control module (200) is used to control the optical module under test (500) through the test control board (300).
3. The optical module parameter testing equipment according to claim 2, characterized in that, It also includes a power module (400) for electrically connecting the control module (200) and the test control board (300), and the power module (400) supplies power to the test control board (300).
4. The optical module parameter testing device according to claim 1, characterized in that, The inner diameter of the first jumper (600) is 30μm-55μm.
5. The optical module parameter testing device according to claim 4, characterized in that, The inner diameter of the second jumper (700) is 56μm-70μm.
6. A method for testing optical module parameters, characterized in that, The steps include: Set the output power of the optical module (500) to a fixed value; The light beam emitted by the optical module (500) is obtained by using jumpers with different inner diameters and its optical power is calculated. The absolute value of the two power differences is compared with the error value. If the absolute value of the two power differences is greater than the error value, the optical module (500) is defective. Alternatively, at least one of the power values is compared with a preset range. If the power value is not within the preset range, the optical module (500) is defective.
7. The optical module parameter testing method according to claim 6, characterized in that, Two jumpers with different inner diameters are used to obtain the coaxial mounting position of the beam of the optical module (500).
8. The optical module parameter testing method according to claim 6, characterized in that, Two jumpers with different inner diameters are the first jumper (600) and the second jumper (700). The inner diameter of the first jumper (600) is 30μm-55μm, and the inner diameter of the second jumper (700) is 56μm-70μm.
9. A computer device, characterized in that, include: At least one processor (810); as well as A memory (820) communicatively connected to the at least one processor (810); The memory (820) stores a computer program (830) executable by the at least one processor (810), the computer program (830) being executed by the at least one processor (810) to enable the at least one processor (810) to perform the optical module parameter testing method according to any one of claims 6-8.
10. A computer-readable storage medium having a computer program (830) stored thereon, characterized in that, When the program is executed by the processor (810), it implements the optical module parameter testing method according to any one of claims 6-8.