Probe calibration method and apparatus, electronic device, and storage medium

Abstract

Embodiments of the present application provide a probe calibration method and device, electronic equipment and storage medium. The method comprises obtaining a probe length calibration instruction, and controlling the spindle of a machine tool to move based on the probe length calibration instruction, so that a side-mounted probe on the spindle performs centering operation on a standard block to obtain the center three-dimensional coordinates of the standard block. The side-mounted probe and the axis of the spindle are parallel to each other and maintain a fixed spatial positional relationship with the spindle. The standard block is a reference surface of a predetermined height. The center three-dimensional coordinates are set as the origin of a first coordinate system, and the spindle is controlled to perform a lowering operation to make a tool clamped on the spindle contact the upper surface of the standard block to obtain a target Z-axis coordinate in the first coordinate system. A preset probe length offset default value and a Z-coordinate theoretical value are obtained, and the effective length offset value of the side-mounted probe is updated based on the probe length offset default value, the Z-coordinate theoretical value and the target Z-axis coordinate. The method can provide measurement accuracy.

Description

Technical Field

[0001] This application relates to the field of machine tool calibration technology, and in particular to a probe calibration method, apparatus, electronic device and storage medium. Background Technology

[0002] With the continuous development of the CNC machining industry, parts are becoming more and more complex and dimensional accuracy is constantly improving. In-machine dimensional measurement is becoming more and more popular as part of the overall machining process. Using the probes installed on the machine tool itself for online measurement has advantages such as low cost, high efficiency and high degree of machining integration compared with special equipment inspection.

[0003] Due to the compact structure of the machine tool spindle end, it is impossible to install a tool holder-type probe. Currently, the probe can be mounted on the side of the spindle box, allowing measurements to be performed at any time without changing the tool. However, the current side-mounted probe has a spatial offset from the spindle's central axis, resulting in low measurement accuracy. Summary of the Invention

[0004] The main objective of this application is to provide a probe calibration method, apparatus, electronic device, and storage medium for improving measurement accuracy.

[0005] To achieve the above objectives, this application proposes a probe calibration method, comprising: The probe length calibration command is obtained, and the spindle of the machine tool is controlled to move based on the probe length calibration command, so that the side probe on the spindle performs a centering operation on the standard block to obtain the three-dimensional coordinates of the center of the standard block. The side probe is parallel to the axis of the spindle and maintains a fixed spatial position relationship with the spindle. The standard block is a reference plane with a preset height. Set the center three-dimensional coordinates as the origin of the first coordinate system, and control the spindle to perform a descent operation so that the tool clamped on the spindle contacts the upper surface of the standard block, thereby obtaining the target Z-axis coordinates in the first coordinate system. Obtain the preset default probe length offset and theoretical Z-coordinate value, and update the effective length offset value of the side-mounted probe based on the default probe length offset, theoretical Z-coordinate value and target Z-axis coordinate.

[0006] Optionally, in one embodiment, the machine tool spindle is moved based on a probe length calibration command, causing a side-mounted probe on the spindle to perform a centering operation on the standard block, thereby obtaining the three-dimensional coordinates of the center of the standard block, including: Based on the probe length calibration command, the main spindle is controlled to move along the X-axis and Y-axis directions respectively, so that the side probe touches the two sides of the standard block, and the center coordinates of the X-axis and Y-axis are obtained based on the midpoint of the two touch positions in each direction. Control the spindle to move along the Z-axis so that the side-mounted probe touches the upper surface of the standard block to obtain the center coordinates in the Z direction; The three-dimensional coordinates of the center are determined based on the X-axis center coordinates, Y-axis center coordinates, and Z-axis center coordinates.

[0007] Optionally, in one implementation, the X-axis center coordinates and Y-axis center coordinates are obtained based on the midpoint of the two touch points in each direction, including: The midpoint of the two touch points of the standard block in the X direction is determined by multi-round centering operation, resulting in multiple candidate midpoints in the X direction. The center coordinates in the X direction are obtained by averaging the multiple candidate midpoints in the X direction. The midpoint of the two touch points of the standard block in the Y direction is determined by multiple rounds of centering operations, resulting in multiple candidate Y-direction midpoints. The center coordinates in the Y direction are then obtained by averaging these multiple candidate Y-direction midpoints.

[0008] Optionally, in one embodiment, after updating the effective length offset value of the probe based on the default probe length offset, the theoretical Z-coordinate value, and the target Z-axis coordinate, the method further includes: Receive the relative offset calibration command between the side probe and the spindle, and control the spindle to move based on the relative offset calibration command so that the side probe can perform a centering operation on the standard block to obtain the first center two-dimensional coordinates of the standard block in the XY direction; Using the first center two-dimensional coordinate as the origin of the second coordinate system, and controlling the spindle to clamp a standard probe of a preset size to perform a centering operation on the standard block, the second center two-dimensional coordinate of the standard block in the second coordinate system is obtained. The offset of the side-mounted probe relative to the spindle center in the first XY direction is calculated based on the first center two-dimensional coordinates and the second center two-dimensional coordinates.

[0009] Optionally, in one embodiment, after updating the effective length offset value of the probe based on the default probe length offset, the theoretical Z-coordinate value, and the target Z-axis coordinate, the method further includes: Receive manual calibration command and control the spindle to move based on the manual calibration command so that the side probe can perform centering operation on the standard block and obtain the three-dimensional coordinates of the standard block in the XY direction. Use the three-dimensional coordinates of the third center as the origin of the third coordinate system, and switch the control mode of the spindle to manual mode; In response to the centering operation of the standard block performed by the manual movement of the spindle, the fourth center two-dimensional coordinates of the standard block in the XY direction in the third coordinate system are obtained; The offset of the side-mounted probe relative to the spindle center in the second XY direction is calculated based on the two-dimensional coordinates of the third and fourth centers.

[0010] Optionally, in one embodiment, in response to the centering operation of the standard block performed by manually moving the spindle, obtaining the fourth center two-dimensional coordinates of the standard block in the XY direction in the third coordinate system includes: Display the interactive interface and show the splitting prompt information based on the interactive interface. The splitting prompt information is used to guide the operation steps of splitting. The touch coordinates of the side-mounted probe to the standard block in each direction on the third coordinate system are collected, and the four-dimensional coordinates of the standard block in the XY direction are calculated based on the touch coordinates in each direction.

[0011] Optionally, in one embodiment, the method further includes: Obtain the ambient temperature of the machine tool; The effective length offset value is adjusted based on the ambient temperature.

[0012] Another aspect of this application provides a probe calibration apparatus, comprising: The centering unit is used to obtain the probe length calibration command and control the machine tool spindle to move based on the probe length calibration command, so that the side probe on the spindle performs a centering operation on the standard block to obtain the three-dimensional coordinates of the center of the standard block. The side probe is parallel to the axis of the spindle and maintains a fixed spatial position relationship with the spindle. The standard block is a reference plane with a preset height. The measuring unit is used to set the central three-dimensional coordinates as the origin of the first coordinate system and control the spindle to perform a descent operation so that the tool clamped on the spindle contacts the upper surface of the standard block, thereby obtaining the target Z-axis coordinates in the first coordinate system. The update unit is used to obtain the preset default value of probe length offset and theoretical value of Z coordinate, and update the effective length offset value of the side probe based on the default value of probe length offset, theoretical value of Z coordinate and target Z-axis coordinate.

[0013] Another aspect of this application provides an electronic device, comprising: Memory, transceiver, processor, and bus system; The memory is used to store programs; The processor is used to execute programs in memory, including methods for performing the aspects mentioned above; Bus systems are used to connect memory and processor to enable communication between them.

[0014] Another aspect of this application provides a computer-readable storage medium storing instructions that, when executed on a computer, cause the computer to perform the methods described above.

[0015] As can be seen from the above technical solutions, the embodiments of this application have the following advantages: By responding to the probe length calibration command, the side-mounted probe is driven to perform a centering operation on the standard block to obtain the center three-dimensional coordinates. In the first coordinate system with the center three-dimensional coordinates as the origin, the spindle tool contacts and collects the Z-axis coordinates on the upper surface of the standard block. Finally, the effective length offset value of the probe is updated by combining the preset probe length offset default value, the theoretical value of the Z coordinate, and the collected Z-axis coordinates. This can eliminate the coupling interference of the XY reference offset caused by the eccentric installation of the side-mounted probe and the spindle on the Z-axis height measurement based on a unified coordinate system. Furthermore, by combining the preset offset value, theoretical coordinates, and the actual collected Z-axis coordinates for calculation, the influence of errors is reduced and the measurement accuracy is improved. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the application architecture of the probe calibration method provided in the embodiments of this application; Figure 2 This is a schematic flowchart of the probe calibration method provided in the embodiments of this application; Figure 3 This is a schematic diagram of the probe calibration device provided in the embodiments of this application; Figure 4 This is a schematic diagram of the structure of the electronic device provided in the embodiments of this application. Detailed Implementation

[0017] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0018] It should be noted that although functional modules are divided in the device schematic diagram and a logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than the module division in the device or the order in the flowchart. The terms "first," "second," etc., in the specification, claims, and the aforementioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0019] The term “exemplary” as used herein means “serving as an example, embodiment, or illustration.” Any embodiment illustrated herein as “exemplary” is not necessarily to be construed as superior to or better than other embodiments.

[0020] In the embodiments of this application, the terms "module" or "unit" refer to a computer program or part of a computer program that has a predetermined function and works with other related parts to achieve a predetermined goal, and can be implemented wholly or partially using software, hardware (such as processing circuitry or memory), or a combination thereof. Similarly, a processor (or multiple processors or memory) can be used to implement one or more modules or units. Furthermore, each module or unit can be part of an overall module or unit that includes the functionality of that module or unit.

[0021] Furthermore, to better illustrate this application, numerous specific details are provided in the following detailed embodiments. Those skilled in the art should understand that this application can be implemented without certain specific details. In some instances, methods, means, components, and circuits well-known to those skilled in the art have not been described in detail in order to highlight the main points of this application.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing embodiments of this application only and is not intended to limit this application.

[0023] In modern high-precision CNC machining, many machine tools employ contact probes (or probe heads) to achieve online measurement, workpiece centering, tool length compensation, and tool setting. In traditional designs, the probe is typically designed as a tool-type probe that can be clamped within the spindle taper hole; that is, the probe and the machining tool share the same spindle mounting interface and are clamped via a tool holder. While this method ensures that the probe axis coincides with the spindle axis, some small and medium-sized machine tools, due to the compact structure of the spindle end, cannot accommodate tool holder-type probes.

[0024] To address this, some machine tool manufacturers use fixed-mount or side-mounted probes, where the probe is mounted on the side of the spindle box or on the spindle sleeve, independently of the spindle. This "side-mounted probe" does not occupy the tool changer position and can perform measurements at any time without changing the tool. However, because there is a spatial offset between the side-mounted probe and the spindle's central axis, the working coordinates recorded internally by the CNC system during machining are all based on the spindle center. If the trigger coordinates of the side-mounted probe are directly used as the workpiece position, a systematic offset error will be introduced. Therefore, precise calibration of the three-dimensional offset between the probe and the spindle is urgently needed.

[0025] Based on this, embodiments of this application provide a probe calibration method that can solve the above-mentioned technical problems.

[0026] System architecture and scenario description used in the embodiments of this application: Figure 1This is a system architecture diagram of the probe calibration method according to an embodiment of this application. It includes a terminal 140, an Internet 130, a gateway 120, a server 110, etc.

[0027] Terminal 140 includes various forms of devices with display screens, such as desktop computers, laptops, PDAs (personal digital assistants), mobile phones, in-vehicle terminals, home theater terminals, dedicated terminals, intelligent voice interaction devices, smart home appliances, or aircraft. Furthermore, it can be a single device or a collection of multiple devices. Terminal 140 can communicate with the Internet 130 via wired or wireless means to exchange data.

[0028] Server 110 refers to a computer system that can provide certain services to terminal 140. Compared to ordinary terminal 140, server 110 has higher requirements in terms of stability, security, and performance. Server 110 can be a single high-performance computer in a network platform, a cluster of multiple high-performance computers, a portion of a single high-performance computer (e.g., a virtual machine), or a combination of portions of multiple high-performance computers (e.g., virtual machines).

[0029] Gateway 120, also known as an internetwork connector or protocol converter, is a computer system or device that acts as a translator, enabling network interconnection at the transport layer. It bridges the gap between two systems using different communication protocols, data formats, languages, or even completely different architectures. Gateways can also provide filtering and security functions. Messages sent from terminal 140 to server 110 are forwarded to the corresponding server 110 via gateway 120. Messages sent from server 110 to terminal 140 are also forwarded to the corresponding terminal 140 via gateway 120.

[0030] The probe calibration method provided in this application embodiment can be implemented separately in terminal 140, separately in server 110, or partially in terminal 140 and partially in server 110.

[0031] When the probe calibration method provided in this application embodiment is implemented alone in the terminal 140, the terminal 140 obtains a probe length calibration command and controls the spindle of the machine tool to move based on the probe length calibration command, so that the side probe on the spindle performs a centering operation on the standard block to obtain the center three-dimensional coordinates of the standard block. The side probe is parallel to the axis of the spindle and maintains a fixed spatial position relationship with the spindle. The standard block is a reference surface with a preset height. The terminal 140 sets the center three-dimensional coordinates as the origin of the first coordinate system and controls the spindle to perform a descent operation so that the tool clamped on the spindle contacts the upper surface of the standard block to obtain the target Z-axis coordinate in the first coordinate system. The terminal 140 obtains the preset probe length offset default value and the theoretical Z-coordinate value, and updates the effective length offset value of the side probe based on the probe length offset default value, the theoretical Z-coordinate value and the target Z-axis coordinate.

[0032] The probe calibration method provided in the embodiments of this application will be described below with reference to the accompanying drawings. The subject of the probe calibration method described below is a terminal device, which can be implemented by the terminal device by running the various computer programs mentioned above. Of course, based on the understanding of the following text, it is not difficult to see that the probe calibration method provided in the embodiments of this application can also be implemented by the terminal device and the server in collaboration.

[0033] Please see Figure 2 ,like Figure 2 The diagram shown is a flowchart of a probe calibration method provided in this embodiment. The method includes: Step 201: Obtain the probe length calibration command, and control the machine tool spindle to move based on the probe length calibration command, so that the side probe on the spindle performs a centering operation on the standard block to obtain the three-dimensional coordinates of the center of the standard block. The side probe is parallel to the axis of the spindle and maintains a fixed spatial position relationship with the spindle. The standard block is a reference plane with a preset height.

[0034] The probe length calibration command can be a control command that triggers the probe length compensation calibration. Here, it can be a start signal received by the CNC system to start the Z-axis length offset calibration process of the side-mounted probe.

[0035] The spindle can be a shaft component of a CNC machine tool used to clamp the cutting tool and drive the cutting tool to rotate for cutting. It can perform displacement in the X, Y, and Z axes.

[0036] Side-mounted probes can be contact measurement sensors that are mounted on the side of the spindle and are not coaxially mounted.

[0037] A standard block can be a reference gauge with high-precision dimensions and flatness, and is a reference surface component with a preset fixed height. Specifically, the standard block can be a metal cuboid with a top surface flatness ≤0.002mm and a side surface parallelism ≤0.003mm, and the standard block is fixed to the machine tool worktable and is not disassembled during calibration.

[0038] Centering operation can refer to the measurement operation of finding the geometric center of a reference part. After receiving the instruction to start probe length calibration, the CNC system controls the machine tool spindle to drive the side probe to move, so that the probe touches the two sides of the standard block in the X and Y directions and the upper surface in the Z direction in sequence. The geometric center point of the standard block is obtained by calculating the edge coordinates. This geometric center point can be the three-dimensional position data under the machine tool axis system, which can be called the center three-dimensional coordinates.

[0039] Understandably, when performing centering operations, the CNC system can set the probe's movement path into a rapid positioning section and a measurement contact section. The rapid positioning section is used to drive the probe to quickly approach the edge area of ​​the standard block at a high speed, shortening the idle travel time and improving the overall calibration efficiency. When the probe approaches the edge of the standard block at a preset distance, it automatically switches to the low-speed (e.g., 30 mm / min) measurement contact section, approaching the reference surface with a smooth and stable feed speed. This avoids impact, bouncing, or overshoot when touching the surface, ensuring that the probe trigger signal is accurate and reliable, and reducing measurement errors caused by mechanical vibration. This balances calibration efficiency and centering measurement accuracy.

[0040] Step 202: Set the center three-dimensional coordinates as the origin of the first coordinate system, and control the spindle to perform a descent operation so that the tool clamped on the spindle contacts the upper surface of the standard block, thereby obtaining the target Z-axis coordinates in the first coordinate system.

[0041] The cutting tool can be a machine tool component used for cutting operations, which is clamped in the taper hole of the spindle.

[0042] Using the three-dimensional coordinates of the standard block center measured by the probe in the previous step as the origin of the first coordinate system, the measurement reference of the side-mounted probe and the spindle is unified. Then, the spindle is controlled to descend so that the tool on the spindle contacts the upper surface of the standard block, and the Z-axis height data corresponding to the spindle in the first coordinate system is collected. This Z-axis height data can be called the target Z-axis coordinate.

[0043] Step 203: Obtain the preset default value of probe length offset and theoretical value of Z coordinate, and update the effective length offset value of the side probe based on the default value of probe length offset, theoretical value of Z coordinate and target Z-axis coordinate.

[0044] The default value for probe length offset can be the factory-preset theoretical deviation value for probe length, which is the initial length compensation parameter preset based on the theoretical installation dimensions of the probe and initially stored in the machine tool system.

[0045] The theoretical value of the Z-coordinate can be the theoretical Z-axis height of the upper surface of the standard block under ideal conditions.

[0046] The system retrieves the preset probe initial length deviation parameters and the theoretical Z-axis height of the standard block. Combined with the actual Z-axis coordinates under the main axis view acquired in the previous step, the probe's true length compensation parameters that conform to the actual installation state are corrected and updated. These true length compensation parameters can be called the effective length offset value.

[0047] In one example, the probe length calibration procedure can be as follows: First, initial parameter configuration is performed. The default value of probe length offset L_def is pre-stored inside the machine tool CNC system. This default value can be pre-set according to the theoretical installation dimensions and assembly tolerance range of the side-mounted probe, and serves as the initial compensation benchmark for probe length calibration.

[0048] Then, the probe length calibration process is started, and the spindle is controlled to drive the side probe to perform a centering operation on the standard block. The probe touches the two sides of the standard block in the X and Y directions and the upper surface in the Z direction in sequence. The three-dimensional center coordinates P_probe_center of the standard block are calculated by the two sides of the touch coordinates, and the origin of the workpiece coordinate system of the CNC system is set at this center position to unify the measurement reference of the probe and the spindle.

[0049] After establishing the reference coordinate system, a high-precision tool is clamped in the spindle taper hole. A flat end mill or a special tool setting tool can be selected to ensure that the tool end face can accurately fit and contact the upper surface of the standard block.

[0050] Control the spindle to move the tool directly above the upper surface of the standard block, then control the spindle to slowly descend until the tool end face is in complete contact with the upper surface of the standard block. The contact state can be determined by using a 0.01mm feeler gauge to detect the gap or by changes in the machine tool spindle load.

[0051] Once the tool has made stable contact with the upper surface of the standard block, the actual Z-axis coordinate Z_spindle corresponding to the current spindle is collected and recorded.

[0052] The theoretical reference coordinate Z_ref of the upper surface of the standard block obtained during the probe centering process is retrieved. Combined with the system's preset probe length offset default value L_def, the preset default length offset value is corrected according to the height difference between the actual Z-axis coordinate Z_spindle and the theoretical Z-coordinate Z_ref of the spindle. The effective probe length offset value L_actual that is adapted to the actual installation state is obtained, that is, L_actual=L_def–(Z_spindle–Z_ref).

[0053] Finally, the corrected effective length offset value L_actual is written into the CNC system as the formal compensation parameter for subsequent workpiece measurement and coordinate compensation, thus completing the length calibration of the side-mounted probe.

[0054] The probe calibration method provided in this application includes obtaining a probe length calibration command, and controlling the spindle of the machine tool to move based on the probe length calibration command, so that the side-mounted probe on the spindle performs a centering operation on the standard block to obtain the center three-dimensional coordinates of the standard block. The side-mounted probe is parallel to the axis of the spindle and maintains a fixed spatial position relationship with the spindle. The standard block is a reference surface with a preset height. The center three-dimensional coordinates are set as the origin of the first coordinate system, and the spindle is controlled to perform a descent operation to bring the tool clamped on the spindle into contact with the upper surface of the standard block to obtain the target Z-axis coordinate in the first coordinate system. A preset probe length offset default value and a theoretical Z-coordinate value are obtained, and the effective length offset value of the side-mounted probe is updated based on the probe length offset default value, the theoretical Z-coordinate value, and the target Z-axis coordinate.

[0055] This method responds to probe length calibration commands, drives a side-mounted probe to perform a centering operation on a standard block to obtain the center's three-dimensional coordinates. In a first coordinate system with the center's three-dimensional coordinates as the origin, the spindle tool contacts and collects the Z-axis coordinates of the upper surface of the standard block. Finally, the effective length offset value of the probe is updated by combining the preset probe length offset default value, the theoretical Z-coordinate value, and the collected Z-axis coordinates. This method can eliminate the coupling interference of the XY reference offset caused by the eccentric installation of the side-mounted probe and the spindle on the Z-axis height measurement based on a unified coordinate system. Furthermore, by combining the preset offset value, theoretical coordinates, and the actual collected Z-axis coordinates for calculation, the influence of errors is reduced, and the measurement accuracy is improved.

[0056] In one embodiment, the machine tool spindle is moved based on a probe length calibration command, causing a side-mounted probe on the spindle to perform a centering operation on a standard block, thereby obtaining the three-dimensional coordinates of the standard block's center, including: Based on the probe length calibration command, the main spindle is controlled to move along the X-axis and Y-axis directions respectively, so that the side probe touches the two sides of the standard block, and the center coordinates of the X-axis and Y-axis are obtained based on the midpoint of the two touch positions in each direction. Control the spindle to move along the Z-axis so that the side-mounted probe touches the upper surface of the standard block to obtain the center coordinates in the Z direction; The three-dimensional coordinates of the center are determined based on the X-axis center coordinates, Y-axis center coordinates, and Z-axis center coordinates.

[0057] In this embodiment, the CNC system responds to the probe length calibration command and controls the spindle to move independently along the X-axis and Y-axis, respectively, so that the side-mounted probe touches the vertical edges of the standard block in the X-direction (left and right sides) and Y-direction (front and back sides) in sequence. The system locks the position coordinates corresponding to the two touches in each direction, takes the midpoint of the two sets of coordinates in each direction, and calculates the center coordinates of the standard block in the X-direction and Y-direction respectively, thus completing the positioning of the center of the standard block in the plane.

[0058] Furthermore, the CNC system controls the spindle to move downwards along the vertical Z-axis, causing the side-mounted probe to perpendicularly contact the upper surface of the standard block. The system latches the corresponding Z-axis position at the moment the probe is triggered, thus directly obtaining the vertical Z-axis center coordinates of the standard block. The obtained X-axis, Y-axis, and Z-axis center coordinates can then be integrated to form the complete three-dimensional center coordinates of the standard block.

[0059] It eliminates random errors caused by unilateral measurement by averaging the measurements from both sides, ensuring the accuracy of plane center positioning, and accurately obtains the Z-axis reference height by direct vertical contact, thus improving measurement accuracy.

[0060] In one implementation, the center coordinates in the X direction and the center coordinates in the Y direction are obtained based on the midpoint of the two touch points in each direction, including: The midpoint of the two touch points of the standard block in the X direction is determined by multi-round centering operation, resulting in multiple candidate midpoints in the X direction. The center coordinates in the X direction are obtained by averaging the multiple candidate midpoints in the X direction. The midpoint of the two touch points of the standard block in the Y direction is determined by multiple rounds of centering operations, resulting in multiple candidate Y-direction midpoints. The center coordinates in the Y direction are then obtained by averaging these multiple candidate Y-direction midpoints.

[0061] In this implementation, the multi-round centering operation can involve the probe repeatedly performing multiple rounds of centering actions in the same direction, including touching the left edge and the right edge of the standard block. The geometric midpoint calculated separately after two touches in the X direction in each round can be called the candidate X-direction midpoint, and the geometric midpoint calculated separately after two touches in the Y direction in each round can be called the candidate Y-direction midpoint.

[0062] The system can calculate the average value of all candidate X-axis midpoints and use the average value as the final X-axis center coordinate. It can also calculate the average value of all candidate Y-axis midpoints and use the average value as the final Y-axis center coordinate.

[0063] By introducing the logic of repeated centering and average value processing of multiple groups of midpoints, the single measurement error caused by random vibration of machine tool axis system, instantaneous triggering deviation of probe and slight environmental disturbance can be effectively offset, and the center coordinate shift caused by the instability of a single touch can be avoided.

[0064] In one embodiment, after updating the effective length offset value of the probe based on the default probe length offset value, the theoretical Z-coordinate value, and the target Z-axis coordinate, the method further includes: Receive the relative offset calibration command between the side probe and the spindle, and control the spindle to move based on the relative offset calibration command so that the side probe can perform a centering operation on the standard block to obtain the first center two-dimensional coordinates of the standard block in the XY direction; Using the first center two-dimensional coordinate as the origin of the second coordinate system, and controlling the spindle to clamp a standard probe of a preset size to perform a centering operation on the standard block, the second center two-dimensional coordinate of the standard block in the second coordinate system is obtained. The offset of the side-mounted probe relative to the spindle center in the first XY direction is calculated based on the first center two-dimensional coordinates and the second center two-dimensional coordinates.

[0065] In this embodiment, the relative offset calibration command can be a control command to start the calibration of the positional deviation between the probe and the spindle, serving as a start signal to trigger the XY direction eccentricity calibration in automatic mode.

[0066] The first center two-dimensional coordinates can be the geometric center coordinates of the standard block in the horizontal plane. Here, they are the plane center coordinates obtained after the side-mounted probe touches and centers the X and Y edges of the standard block.

[0067] A standard probe can be a precisely calibrated measuring component used to represent the center position of the spindle, such as a centering bar or edge finder clamped in the spindle taper hole, to directly reflect the actual position of the spindle center. The first center two-dimensional coordinates measured by the side-mounted probe are set as the origin of the second coordinate system, unifying the measurement reference in the XY plane. Then, the spindle is controlled to clamp a standard probe of a preset size, and the standard block is centered again in the X and Y directions to obtain the center coordinates of the standard block plane corresponding to the spindle viewpoint in the second coordinate system, thus obtaining the second center two-dimensional coordinates. In the unified second coordinate system, the center coordinates of the standard block plane measured by the side-mounted probe and the spindle standard probe are compared, and the X and Y offsets of the side-mounted probe relative to the spindle center are obtained through position difference calculations.

[0068] XY offset calibration is performed under the premise of accurate Z-axis length offset update, avoiding the interference of length deviation on planar offset measurement. Then, by constructing an independent second coordinate system, the centering measurement of the side probe and the spindle is in the same reference system, eliminating the eccentricity calculation error caused by reference misalignment and improving the accuracy of offset calculation.

[0069] In one example, for a CNC machine tool equipped with automatic tool change and automatic probe signal processing capabilities, the XY direction offset calibration is performed in automatic mode. The specific process is as follows: First, the spindle is controlled to drive the side-mounted probe to perform centering measurement on the standard block. It touches both sides of the standard block along the X-axis direction to calculate the coordinates of the midpoint X_probe in the X direction. Then, it touches both sides of the standard block along the Y-axis direction to calculate the coordinates of the midpoint Y_probe in the Y direction. Subsequently, the origin of the workpiece coordinate system is set as the midpoint position (X_probe, Y_probe) of this plane to establish a unified measurement benchmark.

[0070] Subsequently, the machine tool uses an automatic tool changer to clamp a standard probe or centering bar with precisely calibrated dimensions inside the spindle taper hole. The spindle is then controlled to drive the standard probe, and the same centering operation method as the side-mounted probe is used to repeatedly perform centering measurements in the X and Y directions on the same standard block to obtain the coordinates (X_spindle, Y_spindle) of the plane midpoint of the standard block from the perspective of the standard probe.

[0071] Finally, in the same coordinate system, by comparing the difference in the center coordinates of the standard block measured by the standard probe and the side probe respectively, the X and Y offset parameters of the side probe relative to the spindle center are obtained, and the calibration of the plane eccentricity in automatic mode is completed, that is, ΔX=X_spindle–X_probe, ΔY=Y_spindle–Y_probe.

[0072] In one embodiment, after updating the effective length offset value of the probe based on the default probe length offset value, the theoretical Z-coordinate value, and the target Z-axis coordinate, the method further includes: Receive manual calibration command and control the spindle to move based on the manual calibration command so that the side probe can perform centering operation on the standard block and obtain the three-dimensional coordinates of the standard block in the XY direction. Use the three-dimensional coordinates of the third center as the origin of the third coordinate system, and switch the control mode of the spindle to manual mode; In response to the centering operation of the standard block performed by the manual movement of the spindle, the fourth center two-dimensional coordinates of the standard block in the XY direction in the third coordinate system are obtained; The offset of the side-mounted probe relative to the spindle center in the second XY direction is calculated based on the two-dimensional coordinates of the third and fourth centers.

[0073] In this embodiment, the manual calibration command can be a control command to initiate manual probe eccentricity calibration, i.e., a trigger signal to switch to the manual calibration process. This is suitable for scenarios where the machine tool does not have automatic tool changing or automatic probe signal processing functions. After receiving the manual calibration start command, the CNC system automatically controls the spindle to drive the side-mounted probe to perform X and Y direction centering operations on the standard block. The plane center coordinates are calculated by touching the two sides of the standard block, and these center coordinates can be referred to as the third center two-dimensional coordinates.

[0074] Subsequently, the three-dimensional coordinates of the third center obtained by the automatic centering of the side-mounted probe can be set as the origin of the third coordinate system to establish a unified measurement benchmark. At the same time, the spindle control authority is switched to manual mode, the automatic movement of the system is prohibited, and the operator controls the spindle movement through the handwheel, thus preparing the control mode for manual centering operation.

[0075] In manual mode, the operator controls the spindle to drive the centering bar or cutter to touch the two sides of the standard block through the handwheel. The CNC system collects the coordinate data in real time during the manual centering process, calculates the plane center coordinates of the standard block in the third coordinate system, and obtains the four center two-dimensional coordinates.

[0076] Within a unified third coordinate system, the reference center automatically measured by the side-mounted probe is compared with the reference center measured by the manually controlled spindle. The XY offset of the side-mounted probe relative to the spindle center is obtained through coordinate difference calculation, thus completing the eccentricity calibration in manual mode.

[0077] By automatically centering and locking the reference origin with a side-mounted probe, the reference offset error caused by manual operation is avoided. At the same time, it is compatible with machine tools that do not have automatic tool changing or automatic probe signal processing functions, thus improving the flexibility of calibration.

[0078] In one example, for machine tools that lack an automatic tool changer, cannot achieve automatic probe signal linkage, or are unsuitable for automatic touch measurement, this solution includes a manual XY offset calibration mode. The specific execution process is as follows: First, the machine tool's built-in side probe performs a centering operation on the standard block, and measures and records the center coordinates (X_probe_man, Y_probe_man) of the standard block plane measured by the side probe.

[0079] Subsequently, the operator manually installs the centering bar, edge finder, or high-precision tool setter into the spindle taper hole. The operator manually controls the spindle movement via the handwheel, causing the centering bar or tool to sequentially touch both sides of the standard block along the X direction. The system records the corresponding touch coordinates and automatically calculates the X-direction midpoint X_spindle_man. The same method is used to complete the centering in the Y direction, obtaining the Y-direction midpoint Y_spindle_man. The coordinates of the standard block's plane center (X_spindle_man, Y_spindle_man) measured from the spindle side are then obtained.

[0080] Finally, by comparing the center coordinates measured by the spindle under the same reference with the reference center coordinates measured by the side probe, the position difference between the two can be calculated to obtain the X and Y direction offsets of the side probe relative to the spindle center in manual calibration mode, thus completing the plane eccentricity parameter calibration, i.e., ΔX_man=X_spindle_man–X_probe_man, ΔY_man=Y_spindle_man–Y_probe_man.

[0081] In one embodiment, in response to the centering operation of the standard block performed by manually moving the spindle, the fourth center two-dimensional coordinates of the standard block in the XY direction in the third coordinate system are obtained, including: Display the interactive interface and show the splitting prompt information based on the interactive interface. The splitting prompt information is used to guide the operation steps of splitting. The touch coordinates of the side-mounted probe to the standard block in each direction on the third coordinate system are collected, and the four-dimensional coordinates of the standard block in the XY direction are calculated based on the touch coordinates in each direction.

[0082] In this embodiment, the interactive interface can be a visual display interface of the CNC system for human-machine information interaction, that is, the operation display screen of the CNC machine tool, which is used to output operation guidance, real-time coordinate data, and status prompts to realize information interaction between the system and the operator.

[0083] Centering prompts can be text or graphic prompts used to guide operators in completing centering measurements, such as sequentially indicating steps like touching the edge in the X direction, touching the edge in the Y direction, and confirming coordinates, thus standardizing manual operation procedures.

[0084] The touch coordinates can be obtained by the CNC system collecting the position data of each direction in the third coordinate system in real time after the operator completes the touch of each edge according to the interface guidance. The system automatically calculates the midpoint of each direction based on the touch coordinates of the two sides of each direction, so as to obtain the four center two-dimensional coordinates of the standard block in the XY direction.

[0085] A visual interactive guidance mechanism is introduced, which uses standardized interface prompts to constrain the operator's operation sequence and actions, avoiding centering deviations caused by insufficient human experience or non-standard operation. At the same time, the system automatically collects touch coordinates and automatically calculates center coordinates, replacing manual reading and calculation, which significantly reduces human reading and calculation errors.

[0086] In one embodiment, the method further includes: Obtain the ambient temperature of the machine tool; The effective length offset value is adjusted based on the ambient temperature.

[0087] In this embodiment, the side-mounted probe exhibits the physical characteristic of thermal expansion and contraction. When the ambient temperature of the machine tool changes, the probe's length may undergo slight deformation, leading to a systematic error in the calibrated effective length offset. Therefore, the CNC system can use a pre-installed temperature acquisition component to acquire the machine tool's ambient operating temperature in real time during the calibration process. It can then retrieve pre-set thermal deformation compensation parameters and, combined with the currently acquired ambient temperature, correct the updated effective length offset of the side-mounted probe accordingly. This eliminates the length measurement deviation caused by temperature factors, resulting in the final probe length compensation parameters adapted to the current operating temperature.

[0088] By collecting the machine tool's ambient temperature in real time and performing targeted temperature compensation correction on the effective length offset value, the system error introduced by temperature changes can be offset, thereby improving calibration accuracy.

[0089] The probe calibration method has been provided above; the apparatus for performing this method is described below.

[0090] Please see Figure 3 ,like Figure 3 The diagram shown is a schematic representation of a probe calibration device according to an embodiment of this application. The device 300 includes: Centering unit 301 is used to obtain probe length calibration instructions and control the spindle of the machine tool to move based on the probe length calibration instructions, so that the side probe on the spindle performs centering operation on the standard block to obtain the three-dimensional coordinates of the center of the standard block. The side probe is parallel to the axis of the spindle and maintains a fixed spatial position relationship with the spindle. The standard block is a reference plane with a preset height. The measuring unit 302 is used to set the center three-dimensional coordinates as the origin of the first coordinate system and control the spindle to perform a descent operation so that the tool clamped on the spindle contacts the upper surface of the standard block, thereby obtaining the target Z-axis coordinates in the first coordinate system. The update unit 303 is used to obtain the preset default value of probe length offset and theoretical value of Z coordinate, and update the effective length offset value of the side probe based on the default value of probe length offset, theoretical value of Z coordinate and target Z-axis coordinate.

[0091] Optionally, in one embodiment, the centering unit 301 is specifically used for: Based on the probe length calibration command, the main spindle is controlled to move along the X-axis and Y-axis directions respectively, so that the side probe touches the two sides of the standard block, and the center coordinates of the X-axis and Y-axis are obtained based on the midpoint of the two touch positions in each direction. Control the spindle to move along the Z-axis so that the side-mounted probe touches the upper surface of the standard block to obtain the center coordinates in the Z direction; The three-dimensional coordinates of the center are determined based on the X-axis center coordinates, Y-axis center coordinates, and Z-axis center coordinates.

[0092] Optionally, in one embodiment, the centering unit 301 is specifically used for: The midpoint of the two touch points of the standard block in the X direction is determined by multi-round centering operation, resulting in multiple candidate midpoints in the X direction. The center coordinates in the X direction are obtained by averaging the multiple candidate midpoints in the X direction. The midpoint of the two touch points of the standard block in the Y direction is determined by multiple rounds of centering operations, resulting in multiple candidate Y-direction midpoints. The center coordinates in the Y direction are then obtained by averaging these multiple candidate Y-direction midpoints.

[0093] Optionally, in one embodiment, the updating unit 303 is further configured to: Receive the relative offset calibration command between the side probe and the spindle, and control the spindle to move based on the relative offset calibration command so that the side probe can perform a centering operation on the standard block to obtain the first center two-dimensional coordinates of the standard block in the XY direction; Using the first center two-dimensional coordinate as the origin of the second coordinate system, and controlling the spindle to clamp a standard probe of a preset size to perform a centering operation on the standard block, the second center two-dimensional coordinate of the standard block in the second coordinate system is obtained. The offset of the side-mounted probe relative to the spindle center in the first XY direction is calculated based on the first center two-dimensional coordinates and the second center two-dimensional coordinates.

[0094] Optionally, in one embodiment, the updating unit 303 is further configured to: Receive manual calibration command and control the spindle to move based on the manual calibration command so that the side probe can perform centering operation on the standard block and obtain the three-dimensional coordinates of the standard block in the XY direction. Use the three-dimensional coordinates of the third center as the origin of the third coordinate system, and switch the control mode of the spindle to manual mode; In response to the centering operation of the standard block performed by the manual movement of the spindle, the fourth center two-dimensional coordinates of the standard block in the XY direction in the third coordinate system are obtained; The offset of the side-mounted probe relative to the spindle center in the second XY direction is calculated based on the two-dimensional coordinates of the third and fourth centers.

[0095] Optionally, in one embodiment, the updating unit 303 is further configured to: Display the interactive interface and show the splitting prompt information based on the interactive interface. The splitting prompt information is used to guide the operation steps of splitting. The touch coordinates of the side-mounted probe to the standard block in each direction on the third coordinate system are collected, and the four-dimensional coordinates of the standard block in the XY direction are calculated based on the touch coordinates in each direction.

[0096] Optionally, in one embodiment, the updating unit 303 is further configured to: Obtain the ambient temperature of the machine tool; The effective length offset value is adjusted based on the ambient temperature.

[0097] This application also provides an electronic device, which includes a memory and a processor. The memory stores a computer program, and the processor executes the computer program to implement the above-described probe calibration method. This electronic device can be any smart terminal, including tablet computers, in-vehicle computers, etc.

[0098] Please see Figure 4 , Figure 4 The hardware structure of an electronic device according to another embodiment is illustrated. The electronic device includes: The processor 401 can be implemented using a general-purpose CPU (Central Processing Unit), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this application. The memory 402 can be implemented as a read-only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM). The memory 402 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented through software or firmware, the relevant program code is stored in the memory 402 and is called and executed by the processor 401 using the probe calibration method of the embodiments of this application. Input / output interface 403 is used to implement information input and output; The communication interface 404 is used to enable communication and interaction between this device and other devices. Communication can be achieved through wired means (such as USB, Ethernet cable, etc.) or wireless means (such as mobile network, WIFI, Bluetooth, etc.). Bus 405 transmits information between various components of the device (e.g., processor 401, memory 402, input / output interface 403, and communication interface 404); The processor 401, memory 402, input / output interface 403 and communication interface 404 are connected to each other within the device via bus 405.

[0099] This application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the probe calibration method described above.

[0100] Memory, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs and non-transitory computer-executable programs. Furthermore, memory may include high-speed random access memory, and may also include non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device. In some embodiments, memory may optionally include memory remotely located relative to the processor, and these remote memories can be connected to the processor via a network. Examples of such networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.

[0101] The embodiments described in this application are for the purpose of more clearly illustrating the technical solutions of the embodiments of this application, and do not constitute a limitation on the technical solutions provided by the embodiments of this application. As those skilled in the art will know, with the evolution of technology and the emergence of new application scenarios, the technical solutions provided by the embodiments of this application are also applicable to similar technical problems.

[0102] Those skilled in the art will understand that the technical solutions shown in the figures do not constitute a limitation on the embodiments of this application, and may include more or fewer steps than shown, or combine certain steps, or different steps.

[0103] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0104] Those skilled in the art will understand that all or some of the steps in the methods disclosed above, as well as the functional modules / units in the systems and devices, can be implemented as software, firmware, hardware, or suitable combinations thereof.

[0105] The terms “first,” “second,” “third,” “fourth,” etc. (if present) in the specification and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms “comprising” and “having,” and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0106] It should be understood that in this application, "at least one (item)" means one or more, and "more than" means two or more. "And / or" is used to describe the relationship between related objects, indicating that three relationships can exist. For example, "A and / or B" can represent three cases: only A exists, only B exists, and both A and B exist simultaneously, where A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one (item) of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one (item) of a, b, or c can represent: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, and c can be single or multiple.

[0107] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of the units described above is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0108] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0109] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0110] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes multiple instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this application. The aforementioned storage medium includes various media capable of storing programs, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0111] The preferred embodiments of the present application have been described above with reference to the accompanying drawings, but this does not limit the scope of the claims of the present application. Any modifications, equivalent substitutions, and improvements made by those skilled in the art without departing from the scope and substance of the embodiments of the present application shall be within the scope of the claims of the present application.

Claims

1. A probe calibration method, characterized in that, include: The probe length calibration command is obtained, and the spindle of the machine tool is controlled to move based on the probe length calibration command, so that the side probe on the spindle performs a centering operation on the standard block to obtain the three-dimensional coordinates of the center of the standard block. The side probe is parallel to the axis of the spindle and maintains a fixed spatial position relationship with the spindle. The standard block is a reference plane with a preset height. The central three-dimensional coordinates are set as the origin of the first coordinate system, and the spindle is controlled to perform a descent operation so that the tool clamped on the spindle contacts the upper surface of the standard block, thereby obtaining the target Z-axis coordinates in the first coordinate system. Obtain the preset default value of probe length offset and the theoretical value of Z coordinate, and update the effective length offset value of the side-mounted probe based on the default value of probe length offset, the theoretical value of Z coordinate and the target Z-axis coordinate.

2. The method according to claim 1, characterized in that, The process of controlling the machine tool spindle to move based on the probe length calibration command, so that the side-mounted probe on the spindle performs a centering operation on the standard block to obtain the three-dimensional coordinates of the center of the standard block, includes: Based on the probe length calibration command, the main shaft is controlled to move along the X-axis and Y-axis directions respectively, so that the side-mounted probe touches the two sides of the standard block, and the center coordinates of the X-axis and Y-axis are obtained based on the midpoint of the two touch positions in each direction; Control the spindle to move along the Z-axis direction so that the side-mounted probe touches the upper surface of the standard block to obtain the Z-axis center coordinates; The three-dimensional coordinates of the center are determined based on the X-axis center coordinates, the Y-axis center coordinates, and the Z-axis center coordinates.

3. The method according to claim 2, characterized in that, The process of obtaining the X-axis center coordinates and Y-axis center coordinates based on the midpoint of the two touch positions in each direction includes: Based on the multi-round centering operation, the midpoint of the two touch positions of the standard block in the X direction is determined, and multiple candidate X-direction midpoints are obtained. The X-direction center coordinates are obtained by averaging the multiple candidate X-direction midpoints. The midpoint of the two touch points of the standard block in the Y direction is determined by multi-round centering operation, resulting in multiple candidate Y-direction midpoints. The center coordinates in the Y direction are obtained by averaging the multiple candidate Y-direction midpoints.

4. The method according to claim 1, characterized in that, After updating the effective length offset value of the probe based on the default probe length offset value, the theoretical Z-coordinate value, and the target Z-axis coordinate, the method further includes: The system receives a relative offset calibration command between the side-mounted probe and the spindle, and controls the spindle to move based on the relative offset calibration command, so that the side-mounted probe performs a centering operation on the standard block to obtain the first center two-dimensional coordinates of the standard block in the XY direction. Using the first center two-dimensional coordinate as the origin of the second coordinate system, and controlling the spindle to clamp a standard probe of a preset size to perform a centering operation on the standard block, the second center two-dimensional coordinate of the standard block in the second coordinate system is obtained; The first XY direction offset of the side-mounted probe relative to the spindle center is calculated based on the first center two-dimensional coordinates and the second center two-dimensional coordinates.

5. The method according to claim 1, characterized in that, After updating the effective length offset value of the probe based on the default probe length offset value, the theoretical Z-coordinate value, and the target Z-axis coordinate, the method further includes: Receive a manual calibration command and control the spindle to move based on the manual calibration command so that the side-mounted probe can perform a centering operation on the standard block to obtain the three-dimensional coordinates of the standard block in the XY direction. Use the three-dimensional coordinates of the third center as the origin of the third coordinate system, and switch the control mode of the main axis to manual mode; In response to the centering operation of the standard block performed by manually moving the main shaft, the fourth center two-dimensional coordinates of the standard block in the XY direction in the third coordinate system are obtained; The second XY direction offset of the side-mounted probe relative to the spindle center is calculated based on the third center two-dimensional coordinates and the fourth center two-dimensional coordinates.

6. The method according to claim 5, characterized in that, The centering operation of the standard block performed in response to manual movement of the main shaft, obtaining the fourth center two-dimensional coordinates of the standard block in the XY direction in the third coordinate system, includes: Display the interactive interface and show the splitting prompt information based on the interactive interface. The splitting prompt information is used to guide the operation steps of the splitting operation. The touch coordinates of the side-mounted probe on the standard block in each direction on the third coordinate system are collected, and the fourth center two-dimensional coordinates of the standard block in the XY direction are calculated based on the touch coordinates in each direction.

7. The method according to claim 1, characterized in that, The method further includes: Obtain the ambient temperature of the machine tool; The effective length offset value is adjusted based on the ambient temperature.

8. A probe calibration device, characterized in that, include: The centering unit is used to acquire probe length calibration instructions and control the spindle of the machine tool to move based on the probe length calibration instructions, so that the side probe on the spindle performs a centering operation on the standard block to obtain the three-dimensional coordinates of the center of the standard block. The side probe is parallel to the axis of the spindle and maintains a fixed spatial position relationship with the spindle. The standard block is a reference plane with a preset height. The measuring unit is used to set the central three-dimensional coordinates as the origin of the first coordinate system and control the spindle to perform a descent operation so that the tool clamped on the spindle contacts the upper surface of the standard block, thereby obtaining the target Z-axis coordinates in the first coordinate system. The update unit is used to obtain the preset probe length offset default value and the theoretical Z coordinate value, and update the effective length offset value of the side-mounted probe based on the probe length offset default value, the theoretical Z coordinate value and the target Z-axis coordinate.

9. An electronic device, characterized in that, include: Memory, transceiver, processor, and bus system; The memory is used to store programs; The processor is configured to execute a program in the memory, including performing the method as described in any one of claims 1 to 7; The bus system is used to connect the memory and the processor to enable communication between the memory and the processor.

10. A computer-readable storage medium, characterized in that, Includes instructions that, when run on a computer, cause the computer to perform the method as described in any one of claims 1 to 7.

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