Strain gauge failure analysis method and device, and electronic equipment

Abstract

The application is suitable for the field of nuclear power technology, and provides a strain gauge fault analysis method and device and electronic equipment, including: obtaining a plurality of first measured strain values of a to-be-analyzed strain gauge in a target time length, the to-be-analyzed strain gauge being a strain gauge pre-buried in a containment; for any one of the plurality of first measured strain values, adjusting the first measured strain value according to a temperature value corresponding to the to-be-analyzed strain gauge and / or a temperature value of an environment where the to-be-analyzed strain gauge is located; determining a strain difference according to a plurality of adjusted first measured strain values; if the strain difference is greater than a preset first strain difference threshold, it is determined that the to-be-analyzed strain gauge is suspected to have a wiring error. Through the above method, the troubleshooting efficiency of finding a strain gauge suspected to have a wiring error can be improved.

Description

Technical Field

[0001] This application belongs to the field of nuclear power technology, and in particular relates to methods, apparatus, electronic equipment, computer-readable storage media and computer program products for strain gauge failure analysis. Background Technology

[0002] The containment vessel of a nuclear power plant is the last physical barrier to prevent the escape of radioactive materials, and it is constructed of prestressed concrete.

[0003] To achieve long-term monitoring of the stress, strain, and temperature distribution of the containment structure, a large number of sensors, such as strain gauges, need to be pre-installed in various parts of the containment structure to acquire strain data and assess the structural stress state. The sensors are connected to a data acquisition box with terminals via cables. Inside the acquisition box, the sensors are classified according to the type of measurement signal and paired with the terminals. Then, they are connected via cables to an automated data acquisition cabinet, where a high-performance data acquisition unit automatically acquires and stores the data. Due to the large number and variety of pre-installed sensors and limited installation space, incorrect wiring sequences are prone to occur during construction or maintenance. This means that a sensor signal may be incorrectly connected to a different terminal channel in the acquisition box, leading to confusion between data and physical location, severely affecting the validity of the monitoring data and the accuracy of the structural safety assessment.

[0004] Currently, troubleshooting errors in strain gauge terminal connections mainly relies on manual point-by-point testing and comparison with drawings. However, this method is labor-intensive and inefficient. Summary of the Invention

[0005] This application provides a method, apparatus, and electronic device for strain gauge fault analysis, which can solve the problem of low troubleshooting efficiency in existing methods when checking for wiring errors in strain gauges within containment structures.

[0006] In a first aspect, embodiments of this application provide a method for fault analysis of strain gauges, including: Acquire multiple first measured strain values ​​of the strain gauge to be analyzed within a target time period, wherein the strain gauge to be analyzed is a strain gauge pre-embedded in the containment vessel; For any one of the multiple first measured strain values, the first measured strain value is adjusted according to the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge to be analyzed is located; Based on multiple adjusted first measured strain values, the strain difference is determined; If the strain difference is greater than a preset first strain difference threshold, it is determined that the strain gauge to be analyzed is suspected of having a wiring error.

[0007] The beneficial effects of the embodiments in this application compared with the prior art are: In this embodiment, since the load on the containment structure during normal operation has periodic characteristics, selecting a target duration for monitoring the strain gauge to be analyzed is equivalent to monitoring the strain gauge under constant load conditions (where the strain difference of the strain gauge is only affected by temperature). Under constant load conditions, the theoretical strain difference of the strain gauge to be analyzed should be 0. Therefore, in this embodiment, the first measured strain value of the strain gauge to be analyzed is adjusted according to the temperature value corresponding to the strain gauge and / or the temperature value of the environment where the strain gauge is located, and the strain difference is determined based on the adjusted first measured strain value, which is equivalent to eliminating the influence of temperature on the strain difference. When it is determined that the strain difference is greater than the preset first strain difference threshold, it indicates that the wiring terminal connected to the strain gauge to be analyzed is likely mismatched with the pre-embedded position point corresponding to the wiring terminal. At this time, it is determined that the strain gauge to be analyzed is suspected of having a wiring error, which helps to improve the accuracy of finding strain gauges suspected of having wiring errors. In addition, since there is no need for manual inspection during the search process, the inspection efficiency is improved.

[0008] Secondly, embodiments of this application provide a strain gauge fault analysis apparatus, comprising: The first strain value acquisition module is used to acquire multiple first strain values ​​of the strain gauge to be analyzed within the target time period, wherein the strain gauge to be analyzed is a strain gauge pre-embedded in the containment vessel. The first strain value adjustment module is used to adjust the first strain value for any one of the plurality of first strain values ​​according to the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge to be analyzed is located. The strain difference determination module is used to determine the strain difference based on multiple adjusted first measured strain values; The suspected wiring error judgment module is used to determine that the strain gauge to be analyzed is suspected of having a wiring error if the strain difference is greater than a preset first strain difference threshold.

[0009] Thirdly, embodiments of this application provide an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the method described in the first aspect.

[0010] Fourthly, embodiments of this application provide a computer-readable storage medium storing a computer program that, when executed by a processor, implements the method described in the first aspect.

[0011] Fifthly, embodiments of this application provide a computer program product that, when run on an electronic device, causes the electronic device to perform the method described in the first aspect.

[0012] It is understood that the beneficial effects of the second to fifth aspects mentioned above can be found in the relevant descriptions in the first aspect mentioned above, and will not be repeated here. Attached Figure Description

[0013] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments or the prior art will be briefly introduced below.

[0014] Figure 1 This is a schematic diagram of the structure of a nuclear power plant containment vessel provided in an embodiment of this application; Figure 2 This is a schematic flowchart of a strain gauge fault analysis method provided in an embodiment of this application; Figure 3 This is a schematic diagram of the structure of a strain gauge fault analysis device provided in an embodiment of this application; Figure 4 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0015] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of this application. However, those skilled in the art will understand that this application may also be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods have been omitted so as not to obscure the description of this application with unnecessary detail.

[0016] It should be understood that, when used in this application specification and the appended claims, the term "comprising" indicates the presence of the described features, integrals, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or a collection thereof.

[0017] It should also be understood that the term “and / or” as used in this application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.

[0018] Furthermore, in the description of this application and the appended claims, the terms "first," "second," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0019] References to "one embodiment" or "some embodiments" in this specification mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized.

[0020] The containment vessel of a nuclear power plant is a large-volume reinforced concrete structure with the highest nuclear safety rating. It is typically a cylindrical structure with a diameter of about 40 meters and a height of about 51 meters (e.g., Figure 1 As shown in the image, the interior is equipped with numerous horizontal and vertical prestressed steel strands, a steel sealing lining, high-strength reinforcing bars, embedded parts, and coarse and fine aggregates. Among these embedded parts are a large number of sensors, such as strain gauges, thermistors, and thermocouples.

[0021] Because the number and types of sensors embedded within the containment structure are numerous and diverse, incorrect wiring sequence at the terminal blocks is highly likely to occur during construction or maintenance. Relying on manual inspection to check for wiring errors is inefficient.

[0022] To improve troubleshooting efficiency while ensuring accuracy, this application provides a method for fault analysis of strain gauges. This method determines whether a strain gauge is suspected of having a wiring error by analyzing strain differences under a load condition that can be considered constant.

[0023] The method for fault analysis of strain gauges provided in the embodiments of this application will be described below with reference to the accompanying drawings.

[0024] Figure 2 This illustration shows a flowchart of a strain gauge fault analysis method according to an embodiment of this application. This fault analysis method can be applied to electronic devices, including mobile devices, workstations, computers, servers, etc. The fault analysis method provided in this embodiment is described in detail below: S21, acquire multiple first measured strain values ​​of the strain gauge to be analyzed within the target time period, wherein the strain gauge to be analyzed is a strain gauge pre-embedded in the containment.

[0025] The strain gauges to be analyzed are strain gauges without mechanical errors.

[0026] In this embodiment of the application, multiple strain gauges are pre-embedded within the containment. For ease of differentiation, the strain gauge pre-embedded within the containment that currently requires wiring analysis is named the strain gauge to be analyzed. Multiple strain values ​​of the strain gauge to be analyzed are continuously collected (e.g., at preset strain value intervals) within a target time period (e.g., 24 hours) to obtain multiple first measured strain values.

[0027] Optionally, if the difference between the target duration and 24 hours is within the preset duration difference range, the target duration can be set to 23 hours or 24 hours, etc., as long as it is close to 24 hours, and there is no limitation here.

[0028] Optionally, the target duration is a dynamic value that is dynamically adjusted based on the temperature of the containment vessel. Specifically, a temperature sensor (i.e., the target temperature sensor hereinafter) is temporarily installed on the surface of the containment vessel (such as the inner or outer surface), and the decision to continue acquiring the first measured strain value of the strain gauge to be analyzed is made based on the temperature value of the target temperature sensor. That is, acquiring multiple first measured strain values ​​of the strain gauge to be analyzed within the target duration includes: The temperature value of the target temperature sensor and the first measured strain value of the strain gauge to be analyzed are acquired from the first moment. The target temperature sensor is a temperature sensor installed on the surface of the containment vessel. At a second time, the temperature value of the target temperature sensor and the first measured strain value of the strain gauge to be analyzed are acquired. If the difference between the temperature value of the target temperature sensor acquired at the second time and the temperature value of the target temperature sensor acquired at the first time is within a preset temperature difference range, the acquisition of the first measured strain value of the strain gauge to be analyzed is stopped. The duration between the second time and the first time is the target duration.

[0029] Of course, if the difference between the temperature value of the target temperature sensor obtained at the second time and the temperature value of the target temperature sensor obtained at the first time is not within the preset temperature difference range, then after a preset interval, the current time is taken as the second time, and the steps of obtaining the temperature value of the target temperature sensor and the first measured strain value of the strain gauge to be analyzed at the second time and subsequent steps are returned.

[0030] Optionally, the second time point can be determined after a certain period of time has elapsed between the current time point and the first time point. For example, the second time point can be determined after 20 hours have elapsed between the current time point and the first time point.

[0031] Considering that temperature has a diurnal cycle characteristic, in this embodiment of the application, by comparing temperature values ​​at different times, equivalent time pairs with small temperature differences are selected, which is equivalent to finding a time period with diurnal cycle characteristics. That is, determining the target duration in the above manner is beneficial to improving the accuracy of the determined target duration.

[0032] In this embodiment of the application, considering that the strain gauge to be analyzed is embedded in the containment, and the signal of the embedded sensor is transmitted to the acquisition box through a cable, and then transmitted to the acquisition cabinet through the acquisition box, the strain value of the strain gauge to be analyzed (i.e. the first measured strain value mentioned above) can be obtained from the acquisition box or the acquisition cabinet.

[0033] For example, when obtaining the first measured strain value of the strain gauge to be analyzed from the acquisition box, the acquisition box can be connected in parallel with the newly installed acquisition device via a connecting cable with a pluggable terminal on one end. The electronic equipment then obtains the first measured strain value of the strain gauge to be analyzed through the newly installed acquisition device. When obtaining the value in this way, it is not necessary to disconnect the wiring of the original monitoring system, so that the normal operation of the existing containment automated monitoring system is not affected when obtaining the first measured strain value.

[0034] Optionally, outliers among the acquired first measured strain values ​​can be removed. For example, abrupt jumps in strain values ​​between adjacent sampling points (such as a rate of change exceeding 1 Hz) or occasional jumps caused by high-frequency noise interference can be identified as outliers and removed.

[0035] S22, for any one of the plurality of the first measured strain values, adjust the first measured strain value according to the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge to be analyzed is located.

[0036] In this embodiment, considering that the temperature value of the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge is located may be different at different times, when obtaining each first measured strain value of the strain gauge to be analyzed, the temperature value of the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge is located are also obtained. Subsequently, when adjusting the first measured strain value, the temperature value of the strain gauge to be analyzed corresponding to the first measured strain value and the temperature value of the environment where the strain gauge is located can be selected for adjustment to improve the accuracy of the adjusted first measured strain value.

[0037] In this embodiment, the temperature value corresponding to the strain gauge to be analyzed can be obtained in the following ways: if the strain gauge to be analyzed has a built-in temperature compensation plate, the temperature value measured by the temperature compensation plate can be obtained and used as the temperature value corresponding to the strain gauge to be analyzed; if the strain gauge to be analyzed is equipped with a cooperating thermistor, the temperature value measured by the thermistor can be used as the temperature value corresponding to the strain gauge to be analyzed. Of course, it can also be obtained in other ways, which are not limited here.

[0038] Because thermistors can be made into extremely small packages, they can be directly integrated near the substrate of the strain gauge to be analyzed. Furthermore, the thermistors have extremely high sensitivity. Therefore, attaching the thermistor to the strain gauge to be analyzed and adjusting the first measured strain value of the strain gauge based on the temperature value of the thermistor helps to improve the accuracy of the adjusted first measured strain value.

[0039] In this embodiment, the temperature of the environment in which the strain gauge is located is the temperature of the concrete in which the strain gauge is located. The temperature of the concrete in which the strain gauge is located can be measured by a temperature sensor embedded in the concrete.

[0040] Optionally, if the containment of this embodiment is further embedded with a thermocouple, and the distance between the thermocouple and the strain gauge to be analyzed is within a preset distance threshold, the temperature value of the environment where the strain gauge to be analyzed is located can be determined by: obtaining the temperature value of the thermocouple, and determining the temperature value of the environment where the strain gauge to be analyzed is located based on the temperature value of the thermocouple.

[0041] Optionally, before obtaining the temperature value of the thermocouple, it can be determined whether there is a wiring error in the thermocouple. If there is no wiring error, then the temperature value measured by the thermocouple can be obtained. Since the temperature value of the thermocouple without wiring errors is obtained, it is beneficial to improve the accuracy of the first measured strain value after adjustment based on the temperature value of the thermocouple.

[0042] When there is only one thermocouple within a preset distance threshold from the strain gauge being analyzed, the temperature value of that thermocouple is taken as the temperature value of the environment where the strain gauge is located. When there is more than one thermocouple within a preset distance threshold from the strain gauge being analyzed, the temperature values ​​of multiple thermocouples can be obtained, and the temperature value of the environment where the strain gauge is located can be determined based on these multiple thermocouple temperature values. For example, the average value of the multiple thermocouple temperature values ​​can be taken as the temperature value of the environment where the strain gauge is located; or, for example, the maximum value of the multiple thermocouple temperature values ​​can be taken as the temperature value of the environment where the strain gauge is located. No limitation is made here.

[0043] In this embodiment, when the distance between the thermocouple and the strain gauge to be analyzed is within a preset distance threshold, it indicates that the temperature value measured by the thermocouple is the temperature value of the environment where the strain gauge is located. Optionally, the preset distance threshold can be determined based on the position of the strain gauge and the thermocouple within the containment. For example, if the position of the strain gauge and the thermocouple within the containment is close to a region of severe temperature gradient within the containment (such as the inner or outer surface of the containment, cooling water pipes, penetrations, etc.), the preset distance threshold can be set to a smaller value, such as less than 200 mm; conversely, it can be set to a larger value, such as greater than 200 mm but less than 500 mm. And / or, the preset distance threshold can also be determined based on the accuracy requirements of the strain measurement. For example, when the accuracy requirements of the strain measurement are high, the preset distance threshold can be set to a smaller value; conversely, it can be set to a relatively larger value. For example, when the strain gauge and thermocouple to be analyzed are located near a region of severe temperature gradient within the containment, and there are accuracy requirements for strain measurement, the preset distance threshold can be set to a value less than 100 mm.

[0044] In this embodiment, when adjusting the first measured strain value based solely on a thermistor (or thermocouple), a compensation model (such as a strain-temperature characteristic curve) can be pre-established based on the relationship between the temperature and strain values ​​of the thermistor (or the relationship between the temperature and strain values ​​of the thermocouple). The first measured strain value at the current temperature is then adjusted according to this compensation model. When adjusting the first measured strain value simultaneously based on both the thermistor and the thermocouple, the adjustment can be performed using the following formula: .

[0045] in, The first measured strain value after adjustment. The first measured strain value, This is the strain gauge temperature self-compensation coefficient. This is the temperature change of the strain gauge itself, which is equal to the difference between the current temperature of the strain gauge and its initial temperature. This represents the change in ambient temperature, which is equal to the difference between the current ambient temperature and the initial ambient temperature. This is the coefficient of thermal expansion of concrete. The value is the strain gauge sensitivity coefficient.

[0046] S23, based on the multiple adjusted strain values ​​of the first measurement mentioned above, determine the strain difference.

[0047] In this embodiment, the difference between any two adjacent adjusted first measured strain values ​​can be calculated, and the strain difference can be determined based on multiple difference results, such as determining the largest difference result as the strain difference; alternatively, the difference between two consecutive adjusted first measured strain values ​​can be calculated, and the resulting difference is taken as the strain difference. Of course, in actual practice, other processing can be performed on the adjusted first measured strain values ​​to determine the strain difference, which is not limited here.

[0048] S24. If the strain difference is greater than the preset first strain difference threshold, it is determined that the strain gauge to be analyzed is suspected of having a wiring error.

[0049] The aforementioned preset first strain difference threshold can be set according to actual conditions. Optionally, the first strain difference threshold is determined based on the pre-embedded location of the strain gauge within the containment and the current operating conditions of the containment, thereby improving the accuracy of the determined first strain difference threshold. Optionally, the aforementioned first strain difference threshold can be set to ±5 microstrain.

[0050] Because the load on the containment structure during normal operation has periodic characteristics, selecting a target duration for monitoring the strain gauge to be analyzed is equivalent to monitoring the strain gauge under constant load conditions (where the strain difference of the strain gauge is only affected by temperature). Under constant load conditions, the theoretical strain difference of the strain gauge to be analyzed should be 0. Therefore, in this embodiment, the first measured strain value of the strain gauge to be analyzed is adjusted according to the temperature value corresponding to the strain gauge and / or the temperature value of the environment where the strain gauge is located, and the strain difference is determined based on the adjusted first measured strain value, which is equivalent to eliminating the influence of temperature on the strain difference. When it is determined that the strain difference is greater than the preset first strain difference threshold, it indicates that the wiring terminal connected to the strain gauge to be analyzed is likely mismatched with the pre-embedded position point corresponding to the wiring terminal. At this time, it is determined that the strain gauge to be analyzed is suspected of having a wiring error, which helps to improve the accuracy of finding strain gauges suspected of having wiring errors. In addition, since there is no need for manual inspection during the search process, the search efficiency is improved.

[0051] In some embodiments, to further improve the accuracy of the judgment result of wiring errors, a comprehensive judgment can be made by combining the strain values ​​measured by the strain gauge under pressure testing. The pressure test, also known as the pressure test condition, refers to the special conditions under which the overall structural strength test and leakage rate test are conducted in accordance with nuclear safety regulations during pre-service or in-service inspections of the nuclear power plant containment to verify structural integrity and sealing performance. After determining that the strain gauge under analysis is suspected of having a wiring error, the following further steps are taken: A1. After conducting an overall pressure test on the aforementioned containment vessel, obtain the load on the containment vessel and the second measured strain value of the strain gauge to be analyzed.

[0052] In the overall pressure test, the corresponding load refers to the structural integrity test pressure load. This load is a target value predetermined during the design phase based on the containment structural integrity requirements (typically 1.10 to 1.15 times the design pressure). During the dynamic pressurization process of the pressure test, as the gas pressure injected into the containment changes continuously, the real-time pressure load borne by the structure also changes accordingly. Therefore, it is necessary to monitor and obtain the actual pressure load under the current test conditions in real time to control the pressurization rate, record the structural response, and verify whether the predetermined target test pressure has been reached.

[0053] In this embodiment, after the containment vessel undergoes an overall pressure test, the load corresponding to the containment vessel and the strain value corresponding to the strain gauge to be analyzed (i.e., the second measured strain value) are recorded. Specifically, the strain value obtained from the pre-recorded terminal corresponding to the strain gauge to be analyzed is used as the aforementioned second measured strain value. It should be noted that since the pre-recorded correspondence between the strain gauge to be analyzed (or the pre-embedded location of the strain gauge to be analyzed) and the terminal may be incorrect, the aforementioned second measured strain value may not be the actual strain value corresponding to the strain gauge to be analyzed.

[0054] A2. Based on the correspondence between load and theoretical strain value, determine the theoretical strain value of the strain gauge to be analyzed under the load of the above-mentioned containment vessel. The correspondence between the load and theoretical strain value is used to record the theoretical strain value of the strain gauge to be analyzed under different loads of the above-mentioned overall pressure test after the containment vessel is subjected to an overall pressure test.

[0055] In this embodiment, multiple real-time loads after the overall pressure test of the containment vessel can be pre-recorded, as well as the theoretical strain values ​​of the strain gauge to be analyzed under these multiple real-time loads. Based on the recorded multiple real-time loads and the multiple theoretical strain values, the correspondence between the loads and the theoretical strain values ​​can be obtained. Subsequently, when analyzing the embedded temperature sensors, this correspondence can be quickly retrieved, and the theoretical strain value corresponding to the load on the containment vessel can be found based on this correspondence.

[0056] A3. Adjust the second measured strain value according to the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge to be analyzed is located, to obtain the actual strain value of the strain gauge to be analyzed.

[0057] The temperature value corresponding to the strain gauge to be analyzed can be determined by the temperature value measured by the thermistor attached to the strain gauge to be analyzed, that is, by the temperature value output from the pre-recorded terminal corresponding to the thermistor.

[0058] The temperature value of the environment where the strain gauge to be analyzed is located is determined by the temperature value measured by the thermocouples around the pre-embedded location of the strain gauge to be analyzed, that is, by the temperature value output from the pre-recorded terminal corresponding to the thermocouple.

[0059] Optionally, the temperature value of the thermistor is first determined to be reliable, and then the second measured strain value is adjusted based on the temperature value of the thermistor; and / or, the temperature value of the thermocouple is first determined to be reliable, and then the second measured strain value is adjusted based on the temperature value of the thermocouple.

[0060] In this embodiment of the application, the process of adjusting the second measured strain value according to the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge to be analyzed is the same as the process of adjusting the first measured strain value according to the temperature value corresponding to the strain gauge to be analyzed and the temperature value of the environment where the strain gauge to be analyzed is located, and will not be described again here.

[0061] A4. If the absolute value of the difference between the actual strain value and the theoretical strain value of the strain gauge to be analyzed is greater than the preset second strain difference threshold, then it is determined that the strain gauge to be analyzed has a wiring error.

[0062] The aforementioned second strain difference threshold can be set according to actual conditions, for example, based on the pre-recorded embedded location of the strain gauge to be analyzed within the containment and the current operating conditions of the containment. Optionally, the aforementioned second strain difference threshold can be set to ±5 microstrains.

[0063] In this embodiment, considering that under pressure conditions, the strain gauge to be analyzed is affected not only by temperature but also by the expansion deformation of the containment vessel under pressure, with the expansion deformation having a greater impact, the second measured strain value is adjusted based on the temperature value corresponding to the strain gauge and / or the temperature value of the environment in which the strain gauge is located. The adjusted second measured strain value (i.e., the actual strain value) is then compared with the theoretical strain value. The resulting difference reflects the paired deviation between the measured mechanical strain after temperature compensation and the theoretically calculated mechanical strain. If this deviation is greater than a preset second strain difference threshold, it indicates a wiring error in the strain gauge to be analyzed; if it is not greater than the second strain difference threshold, it indicates that the wiring of the strain gauge to be analyzed is highly likely to be correct. That is, after determining that the strain gauge to be analyzed may have a wiring error, further analysis using the absolute value of the difference between the actual strain value and the theoretical strain value of the strain gauge under pressure conditions helps improve the accuracy of the obtained wiring error judgment result.

[0064] In addition to determining whether the strain gauge under analysis has a wiring error using the methods described above, the following methods can also be used for determination. That is, in some embodiments, after determining that the strain gauge under analysis is suspected of having a wiring error, the method further includes: After conducting an overall pressure test on the containment, multiple loads on the containment under the overall pressure test and multiple third-measured strain values ​​of the strain gauge to be analyzed are obtained. The distribution trend of the load is determined based on the plurality of said loads, and the distribution trend of the third measured strain value is determined based on the plurality of said third measured strain values; If the distribution trend of the load and the distribution trend of the third measured strain value are inconsistent, it is determined that the strain gauge to be analyzed has a wiring error.

[0065] In this embodiment, the aforementioned distribution trend can be represented by one or more of the following: first derivative (or slope), area under the curve, fluctuation frequency, trend strength, periodicity, autocorrelation, etc. Specifically, when the distribution trend is represented by the first derivative, comparing the distribution trend of the load and the distribution trend of the third measured strain value is equivalent to comparing the first derivatives of multiple loads and the first derivatives of multiple third measured strain values. If the difference between the two is large (e.g., greater than a preset trend threshold), it is determined that the distribution trend of the load and the distribution trend of the third measured strain value are inconsistent; otherwise, it is determined that the distribution trend of the load and the distribution trend of the third measured strain value are consistent. Since the change in the strain value of the strain gauge to be analyzed should be consistent with the change in the load when there are no wiring errors, judging whether the distribution trend of the load and the distribution trend of the third measured strain value are consistent can improve the accuracy of determining whether there is a wiring error in the strain gauge to be analyzed.

[0066] In this embodiment of the application, after determining that the strain gauge to be analyzed has a wiring error, the correspondence between the recorded wiring terminals and the pre-embedded position points of the strain gauge can be readjusted. That is, after determining that the strain gauge to be analyzed has a wiring error, the method further includes: B1. Obtain multiple time-series strain measurement values ​​of the current terminal corresponding to the strain gauge to be analyzed, and obtain the first strain value sequence.

[0067] In this embodiment, based on the pre-recorded correspondence between the wiring terminals and the pre-embedded locations of the strain gauges, the wiring terminal corresponding to the strain gauge (or the pre-embedded location to be analyzed) is located. Specifically, strain values ​​at different times (i.e., the aforementioned time-series strain measurement values) can be obtained from the wiring terminals corresponding to the strain gauge to be analyzed in chronological order. Since the temperature value at the same pre-embedded location may differ over time, even under the same operating conditions, the target scenario corresponding to the same pre-embedded location may also be different at different times. Therefore, obtaining the aforementioned multiple time-series strain measurement values ​​is equivalent to obtaining multiple time-series strain measurement values ​​under different target scenarios. The target scenario includes information such as operating conditions and / or temperature; when any piece of information differs, the corresponding target scenario also differs.

[0068] B2. Obtain the time-series strain theoretical values ​​corresponding to each target pre-embedded location point to obtain multiple second strain value sequences, wherein the above-mentioned target pre-embedded location points are the pre-embedded location points in the above-mentioned containment where strain gauges are pre-embedded, and one of the above-mentioned target pre-embedded location points corresponds to one of the above-mentioned second strain value sequences.

[0069] In this embodiment, a target neural network model can be pre-trained. This model can output theoretical strain values ​​corresponding to the pre-embedded location points based on the input scene information and these points. When it is necessary to obtain time-series theoretical strain values ​​later, the target scene corresponding to the first strain value sequence (such as the working condition and temperature value corresponding to each time-series strain measurement value in the first strain value sequence) and the target pre-embedded location points can be used as input to the target neural network model. This will yield the strain values ​​(i.e., the aforementioned time-series theoretical strain values) output by the target neural network model corresponding to each target pre-embedded location point. Multiple theoretical strain values ​​corresponding to each target pre-embedded location point constitute a second strain value sequence. Of course, in practice, the second strain value sequences corresponding to the target scene can also be determined based on the historical outputs of each target pre-embedded location point under different scenes; this is not limited here.

[0070] B3. Based on the first strain value sequence and each of the second strain value sequences, a matching sequence group is determined, wherein the matching sequence group includes one of the first strain value sequences and at least one of the second strain value sequences.

[0071] In this embodiment, according to the acquisition time of the time-series strain measurement values, the differences between each time-series strain measurement value in the first strain value sequence and each time-series strain theoretical value in the second strain value sequence are calculated to obtain the corresponding difference values. If the average of these differences is within a preset difference range, the first strain value sequence and the second strain value sequence are determined to be a matching sequence group. In this case, the sequence group includes one first strain value sequence, but may include one or more second strain value sequences. Optionally, the first strain value sequence and the second strain value sequence with the smallest average difference can also be determined to be a matching sequence group. In this case, the sequence group includes one first strain value sequence and one second strain value sequence.

[0072] Optionally, the matching sequence group can be determined by first determining the distribution trend of the first strain value sequence and the distribution trends of each second strain value sequence, and then comparing the distribution trend of the first strain value sequence with the distribution trends of each second strain value sequence. The distribution trend can be represented by one or more of the following: first derivative (or slope), area under the curve, fluctuation frequency, trend strength, periodicity, autocorrelation, etc. Specifically, when the distribution trend is represented by the first derivative, comparing the distribution trends of the first strain value sequence and the second strain value sequence is equivalent to comparing the first derivative of the first strain value sequence and the first derivative of the second strain value sequence. If the difference between the two is greater than a preset distribution trend difference threshold, then the distribution trend of the first strain value sequence is determined to be different from the distribution trend of the second strain value sequence.

[0073] B4. Based on the target pre-embedded location point corresponding to the second strain value sequence in the above-matched sequence group, determine the actual pre-embedded location point corresponding to the current wiring terminal of the strain gauge to be analyzed.

[0074] In this embodiment of the application, when there is only one second strain value sequence in the matched sequence group, the target pre-embedded position point corresponding to the second strain value sequence is taken as the actual pre-embedded position point corresponding to the current terminal of the strain gauge to be analyzed; when there is more than one second strain value sequence in the matched sequence group, the matching relationship between other parameter values ​​of the strain gauge to be analyzed and other parameter values ​​corresponding to the target pre-embedded position point can be further analyzed, so as to determine the correspondence between the current terminal of the strain gauge to be analyzed and the target pre-embedded position point based on the matching situation of other parameter values.

[0075] In some embodiments, in the matched sequence group, the number of the second strain value sequences is greater than 1. B4, based on the target pre-embedded location point corresponding to the second strain value sequence in the matched sequence group, determines the actual pre-embedded location point corresponding to the current wiring terminal of the strain gauge to be analyzed, including: B41. Obtain the sequence of measured target parameters corresponding to the strain gauge to be analyzed to obtain the first sequence of measured target parameters, wherein the target parameters are non-strain parameters.

[0076] The aforementioned non-strain parameters may include one or more of the following: temperature, pressure, humidity, etc. Of course, in practice, parameters from other types of sensors may also be included, which will not be listed here.

[0077] In this embodiment, sensors that are not strain gauges but are located around the strain gauge to be analyzed (e.g., within a preset distance threshold) can be identified. Then, multiple target parameter measurements from at least one non-strain gauge type sensor are obtained as the first target parameter measurement value sequence corresponding to the strain gauge to be analyzed. For example, if the non-strain gauge type sensor around the strain gauge to be analyzed is a pressure sensor, multiple pressure measurements from that pressure sensor are obtained to obtain the first pressure measurement value sequence corresponding to the strain gauge to be analyzed.

[0078] B42. Obtain the target parameter measurement value sequence corresponding to each of the above-mentioned target pre-embedded location points in the above-mentioned matched sequence group, and obtain the corresponding second target parameter measurement value sequence.

[0079] In this embodiment of the application, for each target pre-embedded location point, a sensor with the same sensor type as the sensor type corresponding to the first target parameter measurement value sequence is found around the target pre-embedded location point (e.g., the distance from the target pre-embedded location point is within a preset distance threshold). The target parameter measurement value sequence corresponding to the found sensor is used as the second target parameter measurement value sequence corresponding to the target pre-embedded location point.

[0080] B43. Based on the above-mentioned first target parameter measurement value sequence and each of the above-mentioned second target parameter measurement value sequences, determine the actual pre-embedded position point corresponding to the current wiring terminal of the strain gauge to be analyzed from the target pre-embedded position point corresponding to each of the above-mentioned second strain value sequences.

[0081] In this embodiment of the application, when comparing whether the first target parameter measurement value sequence matches a second target parameter measurement value sequence, the matching can be done by subtraction or by distribution trend. The specific matching process is similar to the matching process of the first strain value sequence and the second strain value sequence described above, and will not be repeated here.

[0082] Because when determining the actual pre-embedded position of the current terminal of the strain gauge to be analyzed, not only is the strain value output by the terminal analyzed, but also the strain value corresponding to other target pre-embedded positions, as well as the target parameter measurement value corresponding to the strain gauge to be analyzed, it is equivalent to analyzing the matching relationship between the terminal and the target pre-embedded position from multiple dimensions of data. Therefore, it is beneficial to improve the accuracy of the actual pre-embedded position of the current terminal of the strain gauge to be analyzed.

[0083] Optionally, after determining the actual pre-embedded location point corresponding to the current wiring terminal of the strain gauge to be analyzed, the method further includes: Adjustment suggestions are generated to establish the correspondence between the wiring terminals and the pre-embedded location points. These suggestions include the identification information of the wiring terminals to be adjusted and the pre-embedded location points (or strain gauges).

[0084] Because this adjustment suggestion is generated, it helps users to more intuitively understand the information about the wiring terminals and pre-embedded locations that need to be adjusted.

[0085] In some embodiments, if the number of strain gauges to be analyzed with wiring errors is greater than one, the actual pre-embedded location points corresponding to each terminal can be quickly found through cross-matching. That is, after determining that the strain gauge to be analyzed has wiring errors, the method further includes: After conducting at least two overall pressure tests on the containment, the load on the containment and the fourth measured strain value of each strain gauge to be analyzed are obtained under each overall pressure test. Based on the correspondence between load and theoretical strain value, the theoretical strain value corresponding to each strain gauge to be analyzed under the load of each containment is determined. The correspondence between load and theoretical strain value is used to record the theoretical strain value of the strain gauge to be analyzed under different loads of the overall pressure test after the containment is subjected to an overall pressure test. For each strain gauge to be analyzed, the fourth measured strain value is adjusted according to the temperature value corresponding to the strain gauge and / or the temperature value of the environment where the strain gauge is located. The adjusted fourth measured strain value corresponding to each strain gauge to be analyzed is cross-matched with each theoretical strain value, and the actual pre-embedded position point corresponding to the current wiring terminal of each strain gauge to be analyzed is determined according to the cross-matching result.

[0086] In this embodiment of the application, after it has been determined that the strain gauge to be analyzed has a wiring error and the number of strain gauges to be analyzed with wiring errors is greater than 1, at least two overall pressure tests are performed on the containment vessel. During each overall pressure test, the strain value (i.e. the fourth measured strain value mentioned above) of each strain gauge to be analyzed with wiring errors is obtained, and the theoretical strain value corresponding to these strain gauges to be analyzed is obtained. The process of obtaining the theoretical strain value is the same as the process of obtaining the second measured strain value and its corresponding theoretical strain value mentioned above, and will not be repeated here.

[0087] The adjusted fourth measured strain value corresponding to each strain gauge to be analyzed is cross-matched with each theoretical strain value. For example, for a certain strain gauge to be analyzed, the fourth measured strain value output by the current terminal of the strain gauge to be analyzed at the same time is compared with the theoretical strain value of the pre-embedded position point corresponding to each strain gauge to be analyzed. Alternatively, the distribution trend of multiple fourth measured strain values ​​of a certain strain gauge to be analyzed is compared with the distribution trend of theoretical strain values ​​of each pre-embedded position point to find the terminal and pre-embedded position point with small differences, and establish the correspondence between the terminal and pre-embedded position point with small differences to obtain the actual pre-embedded position point corresponding to the current terminal of the strain gauge to be analyzed.

[0088] Since the analysis only targets the strain values ​​of multiple strain gauges with wiring errors, the amount of data to be analyzed is reduced, which helps to improve the efficiency of determining the actual pre-embedded position point corresponding to the current wiring terminal of the strain gauge under analysis.

[0089] It should be understood that the sequence number of each step in the above embodiments does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0090] Corresponding to the strain gauge fault analysis method described in the above embodiments, Figure 3 The diagram shows a structural block diagram of a strain gauge fault analysis device provided in an embodiment of this application. For ease of explanation, only the parts related to the embodiment of this application are shown.

[0091] Reference Figure 3 The strain gauge fault analysis device 3 is applied to electronic equipment and includes: The first strain value acquisition module 31 is used to acquire multiple first strain values ​​of the strain gauge to be analyzed within the target time period. The strain gauge to be analyzed is a strain gauge pre-embedded in the containment. The first measured strain value adjustment module 32 is used to adjust the first measured strain value for any one of the plurality of the first measured strain values ​​according to the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge to be analyzed is located. The strain difference determination module 33 is used to determine the strain difference based on multiple adjusted first measured strain values ​​mentioned above; The suspected wiring error judgment module 34 is used to determine that the strain gauge to be analyzed is suspected of having a wiring error if the strain difference is greater than a preset first strain difference threshold.

[0092] In this embodiment, since the load on the containment structure during normal operation has periodic characteristics, selecting a target duration for monitoring the strain gauge to be analyzed is equivalent to monitoring the strain gauge under constant load conditions (where the strain difference of the strain gauge is only affected by temperature). Under constant load conditions, the theoretical strain difference of the strain gauge to be analyzed should be 0. Therefore, in this embodiment, the first measured strain value of the strain gauge to be analyzed is adjusted according to the temperature value corresponding to the strain gauge and / or the temperature value of the environment where the strain gauge is located, and the strain difference is determined based on the adjusted first measured strain value, which is equivalent to eliminating the influence of temperature on the strain difference. When it is determined that the strain difference is greater than the preset first strain difference threshold, it indicates that the wiring terminal connected to the strain gauge to be analyzed is likely mismatched with the pre-embedded position point corresponding to the wiring terminal. At this time, it is determined that the strain gauge to be analyzed is suspected of having a wiring error, which helps to improve the accuracy of finding strain gauges suspected of having wiring errors. In addition, since there is no need for manual inspection during the search process, the inspection efficiency is improved.

[0093] Optionally, the strain gauge to be analyzed is equipped with a cooperating thermistor, and the first strain measurement value adjustment module 32 includes: The temperature value acquisition unit of the thermistor is used to acquire the temperature value of the thermistor, and the temperature value of the thermistor is used as the temperature value corresponding to the strain gauge to be analyzed. The first measurement strain value adjustment unit is used to adjust the first measurement strain value according to the temperature value of the thermistor and / or the temperature value of the environment where the strain gauge to be analyzed is located.

[0094] Optionally, the containment vessel is further equipped with a thermocouple, and the distance between the thermocouple and the strain gauge to be analyzed is within a preset distance threshold. The first strain measurement adjustment module 32 includes: Thermocouple temperature value acquisition unit is used to acquire the temperature value of the thermocouple, and the temperature value of the thermocouple is used as the temperature value of the environment where the strain gauge to be analyzed is located. The first measurement strain value second adjustment unit is used to adjust the first measurement strain value according to the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the thermocouple.

[0095] Optionally, the number of thermocouples is greater than one, and the temperature value acquisition unit for each thermocouple is specifically one: Obtain the temperature values ​​of multiple thermocouples mentioned above; The temperature of the environment in which the strain gauge to be analyzed is located is determined based on the temperature values ​​of the multiple thermocouples mentioned above.

[0096] Optionally, the strain gauge fault analysis device 3 provided in this application embodiment further includes: The load acquisition module is used to acquire the load on the containment vessel and the second measured strain value of the strain gauge after the above-mentioned determination that the strain gauge to be analyzed is suspected of having a wiring error, and after the containment vessel is subjected to an overall pressure test. The first theoretical strain value determination module is used to determine the theoretical strain value of the strain gauge to be analyzed under the load of the above-mentioned containment vessel according to the correspondence between the load and the theoretical strain value. The correspondence between the load and the theoretical strain value is used to record the theoretical strain value of the strain gauge to be analyzed under different loads of the above-mentioned overall pressure test after the containment vessel is subjected to an overall pressure test. The second strain value adjustment module is used to adjust the second strain value according to the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge to be analyzed is located, so as to obtain the actual strain value of the strain gauge to be analyzed. The wiring error determination module is used to determine that the strain gauge under analysis has a wiring error if the absolute value of the difference between the actual strain value and the theoretical strain value of the strain gauge under analysis is greater than a preset second strain difference threshold.

[0097] Optionally, the strain gauge fault analysis device 3 provided in this application embodiment further includes: The third strain measurement module is used to obtain multiple loads on the containment under the overall pressure test and multiple third strain measurement values ​​of the strain gauge under the overall pressure test after determining that the strain gauge to be analyzed is suspected to have a wiring error and after conducting an overall pressure test on the containment. A load distribution trend determination module is used to determine the load distribution trend based on a plurality of said loads, and to determine the distribution trend of said third measured strain values ​​based on a plurality of said third measured strain values; The distribution trend comparison module is used to determine that the strain gauge to be analyzed has a wiring error if the distribution trend of the load and the distribution trend of the third measured strain value are inconsistent.

[0098] Optionally, the strain gauge fault analysis device 3 provided in this application embodiment further includes: The first strain value sequence acquisition module is used to acquire multiple time-series strain measurement values ​​of the current corresponding wiring terminal of the strain gauge to be analyzed after determining that there is a wiring error in the strain gauge to be analyzed, and obtain the first strain value sequence. The second strain value sequence acquisition module is used to acquire the time-series strain theoretical value corresponding to each target pre-embedded location point, and obtain multiple second strain value sequences. The target pre-embedded location points are the pre-embedded location points in the containment where strain gauges are pre-embedded. One target pre-embedded location point corresponds to one second strain value sequence. The matching sequence group determination module is used to determine a matching sequence group based on the first strain value sequence and each of the second strain value sequences, wherein the matching sequence group includes one of the first strain value sequences and at least one of the second strain value sequences. The actual pre-embedded location point determination module is used to determine the actual pre-embedded location point corresponding to the current wiring terminal of the strain gauge to be analyzed based on the target pre-embedded location point corresponding to the second strain value sequence in the matched sequence group.

[0099] Optionally, in the aforementioned matched sequence group, the number of the second strain value sequences is greater than 1, and the aforementioned actual pre-embedded location point determination module is specifically used for: Obtain the sequence of measured values ​​of the target parameters corresponding to the strain gauge to be analyzed to obtain the first sequence of measured values ​​of the target parameters, wherein the target parameters are non-strain parameters; Obtain the target parameter measurement value sequence corresponding to each of the above-mentioned target pre-embedded location points in the above-mentioned matched sequence group to obtain multiple second target parameter measurement value sequences; Based on the above-mentioned first target parameter measurement value sequence and each of the above-mentioned second target parameter measurement value sequences, the actual pre-embedded position point corresponding to the current wiring terminal of the strain gauge to be analyzed is determined from the target pre-embedded position point corresponding to each of the above-mentioned second strain value sequences.

[0100] Optionally, the strain gauge fault analysis device 3 provided in this application embodiment further includes: The adjustment suggestion generation module is used to generate adjustment suggestions for the correspondence between wiring terminals and pre-embedded location points. The adjustment suggestions include the identification information of the wiring terminals to be adjusted and the pre-embedded location points (or strain gauges).

[0101] Optionally, the strain gauge fault analysis device 3 provided in this application embodiment further includes: The multiple pressure test module is used to, if the number of strain gauges to be analyzed with wiring errors is greater than 1, after determining that the strain gauges to be analyzed have wiring errors, perform at least two overall pressure tests on the containment, and obtain the load of the containment and the fourth measured strain value of each strain gauge under each overall pressure test. The second theoretical strain value determination module is used to determine the theoretical strain value of each strain gauge to be analyzed under the load of each containment based on the correspondence between load and theoretical strain value. The correspondence between load and theoretical strain value is used to record the theoretical strain value of the strain gauge to be analyzed under different loads of the overall pressure test after the containment is subjected to an overall pressure test. The fourth strain measurement adjustment module is used to adjust the fourth strain measurement value for each strain gauge to be analyzed based on the temperature value corresponding to the strain gauge and / or the temperature value of the environment where the strain gauge is located. The cross-matching module is used to cross-match the adjusted fourth measured strain value corresponding to each strain gauge to be analyzed with each theoretical strain value, and determine the actual pre-embedded position point corresponding to the current wiring terminal of each strain gauge to be analyzed based on the cross-matching result.

[0102] Optionally, the first strain value acquisition module is specifically used for: The temperature value of the target temperature sensor and the first measured strain value of the strain gauge to be analyzed are acquired from the first moment. The target temperature sensor is a temperature sensor installed on the surface of the containment vessel. If the difference between the temperature value of the target temperature sensor acquired at the second moment and the temperature value of the target temperature sensor acquired at the first moment is within a preset temperature difference range, then the acquisition of the first measured strain value of the strain gauge to be analyzed is stopped, wherein the duration between the second moment and the first moment is the target duration.

[0103] It should be noted that the information interaction and execution process between the above-mentioned devices / units are based on the same concept as the method embodiments of this application. For details on their specific functions and technical effects, please refer to the method embodiments section, and they will not be repeated here.

[0104] Figure 4 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Figure 4 As shown, the electronic device 4 of this embodiment includes: at least one processor 40 ( Figure 4The diagram shows only one processor, a memory 41, and a computer program 42 stored in the memory 41 and executable on the at least one processor 40, which, when executing the computer program 42, implements the steps in any of the above method embodiments.

[0105] The electronic device 4 can be a desktop computer, laptop, handheld computer, or cloud server, etc. This electronic device may include, but is not limited to, a processor 40 and a memory 41. Those skilled in the art will understand that... Figure 4 This is merely an example of electronic device 4 and does not constitute a limitation on electronic device 4. It may include more or fewer components than shown, or combine certain components, or different components, such as input / output devices, network access devices, etc.

[0106] The processor 40 may be a Central Processing Unit (CPU), or it may be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0107] In some embodiments, the memory 41 may be an internal storage unit of the electronic device 4, such as a hard disk or memory of the electronic device 4. In other embodiments, the memory 41 may be an external storage device of the electronic device 4, such as a plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, etc., equipped on the electronic device 4. Furthermore, the memory 41 may include both internal and external storage units of the electronic device 4. The memory 41 is used to store the operating system, applications, bootloader, data, and other programs, such as the program code of the computer program. The memory 41 can also be used to temporarily store data that has been output or will be output.

[0108] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional units and modules is merely an example. In practical applications, the above functions can be assigned to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. Furthermore, the specific names of the functional units and modules are only for easy differentiation and are not intended to limit the scope of protection of this application. The specific working process of the units and modules in the above system can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0109] This application also provides a network device, which includes: at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, wherein the processor executes the computer program to implement the steps in any of the above method embodiments.

[0110] This application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, can implement the steps in the above-described method embodiments.

[0111] This application provides a computer program product that, when run on an electronic device, enables the electronic device to implement the steps described in the various method embodiments above.

[0112] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the methods of the above embodiments of this application can be implemented by a computer program instructing related hardware. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or certain intermediate forms. The computer-readable medium can include at least: any entity or device capable of carrying computer program code to a photographic device / electronic device, a recording medium, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium. Examples include USB flash drives, portable hard drives, magnetic disks, or optical disks. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electrical carrier signals or telecommunication signals.

[0113] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.

[0114] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0115] In the embodiments provided in this application, it should be understood that the disclosed apparatus / network devices and methods can be implemented in other ways. For example, the apparatus / network device embodiments described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0116] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

Claims

1. A method for fault analysis of strain gauges, characterized in that, include: Acquire multiple first measured strain values ​​of the strain gauge to be analyzed within a target time period, wherein the strain gauge to be analyzed is a strain gauge pre-embedded in the containment vessel; For any one of the multiple first measured strain values, the first measured strain value is adjusted according to the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge to be analyzed is located; Based on multiple adjusted first measured strain values, the strain difference is determined; If the strain difference is greater than a preset first strain difference threshold, it is determined that the strain gauge to be analyzed is suspected of having a wiring error.

2. The strain gauge fault analysis method as described in claim 1, characterized in that, The strain gauge to be analyzed is equipped with a co-current thermistor. Adjusting the first measured strain value based on the temperature value corresponding to the strain gauge and / or the temperature value of the environment in which the strain gauge is located includes: The temperature value of the thermistor is obtained, and the temperature value of the thermistor is used as the temperature value corresponding to the strain gauge to be analyzed. The first measured strain value is adjusted based on the temperature value of the thermistor and / or the temperature value of the environment where the strain gauge to be analyzed is located.

3. The strain gauge fault analysis method as described in claim 1, characterized in that, The containment vessel is also pre-embedded with thermocouples, and the distance between the thermocouples and the strain gauge to be analyzed is within a preset distance threshold. Adjusting the first measured strain value based on the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge is located includes: The temperature value of the thermocouple is obtained, and the temperature value of the thermocouple is used as the temperature value of the environment where the strain gauge to be analyzed is located; The first measured strain value is adjusted according to the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the thermocouple.

4. The strain gauge fault analysis method as described in claim 3, characterized in that, The number of thermocouples is greater than 1, and obtaining the temperature value of the thermocouple includes: Obtain the temperature values ​​of multiple thermocouples; The temperature of the environment in which the strain gauge to be analyzed is located is determined based on the temperature values ​​of the multiple thermocouples.

5. The strain gauge fault analysis method according to any one of claims 1 to 4, characterized in that, After determining that the strain gauge to be analyzed is suspected of having a wiring error, the method further includes: After conducting an overall pressure test on the containment vessel, the load on the containment vessel and the second measured strain value of the strain gauge to be analyzed are obtained; Based on the correspondence between load and theoretical strain value, the theoretical strain value corresponding to the load of the strain gauge to be analyzed in the containment is determined. The correspondence between load and theoretical strain value is used to record the theoretical strain value of the strain gauge to be analyzed under different loads in the overall pressure test after the containment is subjected to an overall pressure test. The second measured strain value is adjusted according to the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge to be analyzed is located, so as to obtain the actual strain value of the strain gauge to be analyzed. If the absolute value of the difference between the actual strain value and the theoretical strain value of the strain gauge to be analyzed is greater than the preset second strain difference threshold, then it is determined that the strain gauge to be analyzed has a wiring error.

6. The strain gauge fault analysis method according to any one of claims 1 to 4, characterized in that, After determining that the strain gauge to be analyzed is suspected of having a wiring error, the method further includes: After conducting an overall pressure test on the containment, multiple loads on the containment under the overall pressure test and multiple third-measured strain values ​​of the strain gauge to be analyzed are obtained. The distribution trend of the load is determined based on the plurality of said loads, and the distribution trend of the third measured strain value is determined based on the plurality of said third measured strain values; If the distribution trend of the load and the distribution trend of the third measured strain value are inconsistent, it is determined that the strain gauge to be analyzed has a wiring error.

7. The strain gauge fault analysis method according to any one of claims 1 to 4, characterized in that, After determining that the strain gauge to be analyzed has a wiring error, the method further includes: Obtain multiple time-series strain measurement values ​​of the current terminal corresponding to the strain gauge to be analyzed, and obtain the first strain value sequence; The time-series strain theoretical values ​​corresponding to each target pre-embedded location point are obtained to obtain multiple second strain value sequences. The target pre-embedded location point is the pre-embedded location point in the containment where strain gauges are pre-embedded. One target pre-embedded location point corresponds to one second strain value sequence. Based on the first strain value sequence and each of the second strain value sequences, a matching sequence group is determined, wherein the matching sequence group includes one first strain value sequence and at least one second strain value sequence; Based on the target pre-embedded location point corresponding to the second strain value sequence in the matched sequence group, the actual pre-embedded location point corresponding to the wiring terminal of the strain gauge to be analyzed is determined.

8. The strain gauge fault analysis method as described in claim 7, characterized in that, In the matched sequence group, the number of second strain value sequences is greater than 1. Determining the actual pre-embedded position point corresponding to the current wiring terminal of the strain gauge to be analyzed based on the target pre-embedded position point corresponding to the second strain value sequence in the matched sequence group includes: Obtain the target parameter measurement value sequence corresponding to the strain gauge to be analyzed to obtain the first target parameter measurement value sequence, wherein the target parameter is a non-strain value parameter; Obtain the target parameter measurement value sequence corresponding to each target pre-embedded location point in the matched sequence group to obtain multiple second target parameter measurement value sequences; Based on the first target parameter measurement value sequence and each of the second target parameter measurement value sequences, the actual pre-embedded position point corresponding to the current wiring terminal of the strain gauge to be analyzed is determined from the target pre-embedded position point corresponding to each of the second strain value sequences.

9. The strain gauge fault analysis method according to any one of claims 1 to 4, characterized in that, If the number of strain gauges to be analyzed with wiring errors is greater than 1, after determining that the strain gauges to be analyzed have wiring errors, the method further includes: After conducting at least two overall pressure tests on the containment, the load on the containment and the fourth measured strain value of each strain gauge to be analyzed are obtained under each overall pressure test. Based on the correspondence between load and theoretical strain value, the theoretical strain value corresponding to each strain gauge to be analyzed under the load of each containment is determined. The correspondence between load and theoretical strain value is used to record the theoretical strain value of the strain gauge to be analyzed under different loads of the overall pressure test after the containment is subjected to an overall pressure test. For each strain gauge to be analyzed, the fourth measured strain value is adjusted according to the temperature value corresponding to the strain gauge and / or the temperature value of the environment where the strain gauge is located. The adjusted fourth measured strain value corresponding to each strain gauge to be analyzed is cross-matched with each theoretical strain value, and the actual pre-embedded position point corresponding to the current wiring terminal of each strain gauge to be analyzed is determined according to the cross-matching result.

10. The method for fault analysis of strain gauges as described in any one of claims 1 to 4, characterized in that, The acquisition of multiple first measured strain values ​​of the strain gauge to be analyzed within the target time period includes: The temperature value of the target temperature sensor and the first measured strain value of the strain gauge to be analyzed are acquired from the first moment. The target temperature sensor is a temperature sensor installed on the surface of the containment vessel. If the difference between the temperature value of the target temperature sensor acquired at the second moment and the temperature value of the target temperature sensor acquired at the first moment is within a preset temperature difference range, then the acquisition of the first measured strain value of the strain gauge to be analyzed is stopped, wherein the duration between the second moment and the first moment is the target duration.

11. A fault analysis device for strain gauges, characterized in that, include: The first strain value acquisition module is used to acquire multiple first strain values ​​of the strain gauge to be analyzed within the target time period, wherein the strain gauge to be analyzed is a strain gauge pre-embedded in the containment vessel. The first strain value adjustment module is used to adjust the first strain value for any one of the plurality of first strain values ​​according to the temperature value corresponding to the strain gauge to be analyzed and / or the temperature value of the environment where the strain gauge to be analyzed is located. The strain difference determination module is used to determine the strain difference based on multiple adjusted first measured strain values; The suspected wiring error judgment module is used to determine that the strain gauge to be analyzed is suspected of having a wiring error if the strain difference is greater than a preset first strain difference threshold.

12. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the method as described in any one of claims 1 to 10.

13. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it implements the method as described in any one of claims 1 to 10.

14. A computer program product, characterized in that, Includes a computer program, which, when executed, causes the electronic device to perform the method according to any one of claims 1 to 10.

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