Radio frequency test mechanism and radio frequency test system

Abstract

The utility model discloses a radio frequency testing mechanism and a radio frequency testing system, and belongs to the technical field of radio frequency testing. The radio frequency test mechanism comprises a clamp seat and a test module. The clamp seat is provided with a module installation area. The testing module comprises a fixing structure, a testing probe and a first locking structure, the testing probe is provided with a probe seat, the probe seat is provided with a first locking hole, the fixing structure is provided with a second locking hole, one end of the first locking structure abuts against the side, away from the fixing structure, of the probe seat, and the other end of the first locking structure penetrates through the first locking hole. The fixing structure is arranged on the needle seat and locked in the second locking hole, the fixing structure is connected with the needle seat through a first locking structure, the aperture of the first locking hole is larger than the outer diameter of the first locking structure, and the difference value between the aperture of the first locking hole and the outer diameter of the first locking structure is a first set value; the fixing structure is installed in the module installation area. According to the radio frequency test mechanism, the position of the test probe can be adjusted when the test probe is installed, and the assembly error and the error test rate are reduced.

Description

Technical Field

[0001] The present application relates to the technical field of radio frequency testing systems, and in particular to a radio frequency testing mechanism and a radio frequency testing system. Background Art

[0002] With the continuous development of communication technology, wireless terminal devices are becoming more and more popular. In order to ensure the quality of the RF signal of the wireless terminal device and to meet the wireless communication needs of the wireless terminal device, it is usually necessary to perform RF testing on the circuit board of the wireless terminal device during the production stage. During the RF test, the test probe in the RF test mechanism needs to contact the test point on the circuit board. However, due to assembly errors, the test probe is difficult to be accurately positioned and installed, and the test probe with low positioning accuracy is prone to mismeasurement. Utility Model Content

[0003] The present application provides a radio frequency testing mechanism and a radio frequency testing system, wherein the radio frequency testing mechanism can adjust the installation position of a test probe within a certain range, reduce assembly errors, and improve test accuracy.

[0004] The technical solution is as follows:

[0005] The first aspect of the present application provides a radio frequency testing mechanism, comprising:

[0006] A fixture seat having a module mounting area;

[0007] A test module comprises a fixed structure, a test probe and a first locking structure, the test probe has a needle seat, the needle seat is provided with a first locking hole, the fixed structure is provided with a second locking hole, one end of the first locking structure abuts against a side of the needle seat away from the fixed structure, the other end of the first locking structure is passed through the first locking hole and locked in the second locking hole, the fixed structure and the needle seat are connected through the first locking structure, the aperture of the first locking hole is larger than the outer diameter of the first locking structure, and the difference between the aperture of the first locking hole and the outer diameter of the first locking structure is a first set value; the fixed structure is installed in the module installation area.

[0008] The RF testing mechanism provided in the embodiment of the present application is used to perform RF testing on a test board. Since the aperture of the first locking hole is larger than the outer diameter of the first locking structure, and the fixed module is connected to the needle seat through the first locking structure, the first locking structure is locked in the second locking hole. Therefore, the relative position of the first locking structure and the second locking hole remains unchanged, and the first locking structure can move relative to the needle seat within the range of a first set value. Therefore, when the needle seat is connected to the fixed structure, the first locking structure can be first passed through the first locking hole and extended into the second locking hole. Before the first locking structure is locked with the second locking hole and the first locking structure abuts against the needle seat, the needle seat is moved to adjust the installation position of the test probe on the fixed structure. Adjusting the installation position of the test probe on the fixed structure can reduce the assembly error of the test probe to a certain extent. After completing the position adjustment of the test probe on the fixed structure, the first locking structure is abutted against the needle seat, and the first locking structure is locked in the second locking hole, thereby fixing the test probe in the adjusted position. With such arrangement, the assembly error of the test probe can be reduced, thereby improving the assembly accuracy of the test probe, reducing the false detection rate, and improving the test accuracy.

[0009] In some implementations, the test module also includes a second locking structure, the fixed structure is provided with a third locking hole, the module installation area is provided with a fourth locking hole, the test module and the fixture seat are connected through the second locking structure, the second locking structure is passed through the third locking hole and locked with the fourth locking hole, the aperture of the third locking hole is larger than the outer diameter of the second locking structure, and the difference between the aperture of the third locking hole and the outer diameter of the second locking structure is a second set value.

[0010] In some implementations, there are multiple test modules, and at least one test module is installed in the module installation area;

[0011] In different test modules, the number of test probes on the fixed structure is different, the installation positions of the test probes on the fixed structure are different, and / or the test frequency bands of the test probes on the fixed structure are different.

[0012] In some implementations, there are multiple module installation areas, and the multiple module installation areas are distributed at intervals on the fixture seat, and at least one module installation area is installed with a test module.

[0013] In some implementations, the multiple module installation areas include a first installation area and a second installation area, the number of test modules is multiple, the multiple test modules include a first module and a second module, the first module is installed in the first installation area, the second module is installed in the second installation area, and the test frequency bands of the first module and the second module are different.

[0014] In some implementations, there are multiple first modules, the multiple first modules include a first solder submodule and a first test socket submodule, the test probe in the first solder submodule is used to contact the solder pad, the first test socket submodule is used to contact the test socket, and one of the first solder submodule and the first test socket submodule is installed in the first mounting area; and / or, there are multiple second modules, the multiple second modules include a second solder submodule and a second test socket submodule, the test probe in the second solder submodule is used to contact the solder pad, the second test socket submodule is used to contact the test socket, and one of the second solder submodule and the second test socket submodule is installed in the second mounting area.

[0015] In some implementations, a limiting groove is provided in the module installation area, and at least a portion of the structure of the fixing structure is located in the limiting groove.

[0016] In some implementations, the fixture seat includes a first component and a second component, the second component is detachably connected to the first component, and the module installation area is disposed on the second component.

[0017] In some implementations, the fixture base also includes a third component, which is connected to the first component or the second component. A plurality of first limiting holes are provided on the third component at a position opposite to the module mounting area. The test probe is passed through the corresponding first limiting holes, and two ends of the test probe are respectively located on both sides of the outside of the first limiting hole.

[0018] In some implementations, the clamp seat is provided with an avoidance hole.

[0019] In some implementations, the module installation area is provided with a first positioning structure, the fixed structure is provided with a second positioning structure, and the first positioning structure and the second positioning structure are arranged opposite to each other;

[0020] The first positioning structure and the second positioning structure are both positioning holes; or, one of the first positioning structure and the second positioning structure is a positioning column, and the other is a positioning hole, and the outer diameter of the positioning column is smaller than the inner diameter of the positioning hole.

[0021] A second aspect of the present application provides a radio frequency testing system, comprising a supporting mechanism and a radio frequency testing mechanism as in any of the above technical solutions, wherein the supporting mechanism is used to support a board to be tested, and a test probe in the radio frequency testing mechanism is electrically connected to the board to be tested.

[0022] Since the radio frequency testing system includes the radio frequency testing mechanism described above, it at least has all the beneficial effects of the radio frequency testing mechanism, which will not be described in detail here.

[0023] In some implementations, the support mechanism is provided with a plurality of first limiting columns, and the plurality of first limiting columns are arranged to form a limiting area, and the limiting area is used to accommodate the single board to be tested.

[0024] In some implementations, the support mechanism is provided with a calibration hole, and the calibration hole is used for the test probe to extend into.

[0025] In some implementations, one of the clamp seat and the support mechanism is provided with a second limiting column, and the other is provided with a second limiting hole. The second limiting column is arranged opposite to the limiting hole, and the second limiting column can extend into the corresponding second limiting hole. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a structural schematic diagram of a radio frequency testing mechanism provided in an embodiment of the present application;

[0027] Figure 2 It is a structural schematic diagram of a fixture seat of a radio frequency testing mechanism provided in an embodiment of the present application;

[0028] Figure 3 It is a structural diagram of the first test module provided in the embodiment of the present application;

[0029] Figure 4 yes Figure 3 Sectional view at AA in the middle;

[0030] Figure 5 yes Figure 4 The enlarged view of point B in the middle;

[0031] Figure 6 It is a schematic diagram of the relative position relationship between the radio frequency test mechanism and the single board to be tested during the test process provided by the embodiment of the present application;

[0032] Figure 7 is a partial cross-sectional view of a radio frequency testing mechanism provided in an embodiment of the present application;

[0033] Figure 8 is a structural schematic diagram of another perspective of the first test module provided in an embodiment of the present application;

[0034] Fig. 9 is a schematic diagram of the structure of a test probe in a first test module provided in an embodiment of the present application;

[0035] Fig.10 is a schematic diagram of the structure of the second test module provided in the embodiment of the present application;

[0036] Fig.11 is a structural schematic diagram of another perspective of the second test module provided in an embodiment of the present application;

[0037] Fig.12 is a schematic diagram of the structure of the third test module provided in the embodiment of the present application;

[0038] Fig.13is a structural schematic diagram of another perspective of the third test module provided in an embodiment of the present application;

[0039] Fig.14 is a schematic diagram of the structure of the fourth test module provided in the embodiment of the present application;

[0040] Fig.15 is a structural schematic diagram of another perspective of the fourth test module provided in an embodiment of the present application;

[0041] Fig.16 is a schematic diagram of the structure of the fifth test module provided in the embodiment of the present application;

[0042] Fig.17 is a structural schematic diagram of another perspective of the fifth test module provided in an embodiment of the present application;

[0043] Fig.18 It is a structural schematic diagram of two test modules installed in a radio frequency test mechanism provided in an embodiment of the present application;

[0044] Fig.19 is a structural diagram of two other test modules installed in the radio frequency test mechanism provided in an embodiment of the present application;

[0045] Fig. 20 It is a structural schematic diagram of another clamp seat in the radio frequency testing mechanism provided in an embodiment of the present application;

[0046] Fig.21 is a schematic diagram of the structure of the first component provided in an embodiment of the present application;

[0047] Fig. 22 is a structural schematic diagram of a radio frequency test system provided in an embodiment of the present application in an untested state;

[0048] Fig.23 is a structural schematic diagram of a radio frequency test system provided in an embodiment of the present application in a test state;

[0049] Fig.24 is a schematic diagram of the relative position relationship between the single board to be tested and the supporting mechanism provided in an embodiment of the present application;

[0050] Fig.25 is a schematic diagram of the structure of the support mechanism provided in an embodiment of the present application;

[0051] Fig.26 It is a spring force-travel diagram of a test probe in a radio frequency test mechanism provided in an embodiment of the present application;

[0052] Fig. 27 It is a schematic diagram of test results of a CPK test performed when the downward pressure of the test probe in the radio frequency test mechanism provided in an embodiment of the present application is 6N;

[0053] Fig.28 It is a schematic diagram of the test results of a CPK test performed when the downward pressure of the test probe is 7N in the radio frequency test mechanism provided in an embodiment of the present application.

[0054] The meanings of the figures are as follows:

[0055] 100, fixture seat; 110, module installation area; 120, fourth locking hole; 130, limiting groove; 141, first component; 141a, quick release structure; 142, second component; 143, third component; 143a, first limiting hole; 150, avoidance hole; 160, first positioning structure; 170, second limiting column;

[0056] 200, test module; 210, fixing structure; 211, second locking hole; 212, third locking hole; 213, second positioning structure; 220, test probe; 221, needle seat; 221a, first locking hole; 222, needle body; 230, first locking structure; 240, second locking structure;

[0057] 300, a board to be tested; 310, a soldering pad;

[0058] 400, support mechanism; 410, first limiting column; 420, second limiting hole; 431, fixing part; 432, moving part; 440, calibration hole;

[0059] 500, driving mechanism;

[0060] 600. Cabinet. DETAILED DESCRIPTION

[0061] In order to make the objectives, technical solutions and advantages of the present application clearer, the implementation methods of the present application will be further described in detail below in conjunction with the accompanying drawings.

[0062] It should be understood that the "multiple" mentioned in this application refers to two or more. In the description of this application, unless otherwise specified, " / " means or, for example, A / B can mean A or B; "and / or" in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships, for example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. In addition, in order to facilitate the clear description of the technical solution of this application, the words "first" and "second" are used to distinguish between the same items or similar items with basically the same functions and effects. Those skilled in the art can understand that the words "first" and "second" do not limit the quantity and execution order, and the words "first" and "second" do not limit them to be different.

[0063] The radio frequency testing mechanism and radio frequency testing system provided in the embodiments of the present application are explained in detail below. In each embodiment of the present application, electrical connection refers to the connection between two electrical devices through a conductor so that electrical signals can be transmitted between the two electrical devices.

[0064] like Figures 1 to 6 As shown, an embodiment of the present application provides a radio frequency testing mechanism, including: a fixture seat 100 and a testing module 200 , the fixture seat 100 has a module installation area 110 , and the module installation area 110 is used to install the testing module 200 . The test module 200 includes a fixed structure 210, a test probe 220 and a first locking structure 230. The test probe 220 has a needle seat 221. The needle seat 221 is provided with a first locking hole 221a. The fixed structure 210 is provided with a second locking hole 211. One end of the first locking structure 230 abuts against a side of the needle seat 221 away from the fixed structure 210. The other end of the first locking structure 230 is passed through the first locking hole 221a and locked in the second locking hole 211. The fixed structure 210 and the needle seat 221 are connected through the first locking structure 230. The aperture of the first locking hole 221a is larger than the outer diameter of the first locking structure 230, and the difference between the aperture of the first locking hole 221a and the outer diameter of the first locking structure 230 is a first set value. The fixed structure 210 is installed in the module installation area 110.

[0065] Figure 1 This is a schematic diagram of a radio frequency testing mechanism provided in this embodiment, in which a testing module 200 is installed in the module installation area 110 of the fixture seat 100 . Figure 2 This is a schematic structural diagram of the fixture seat 100 in the radio frequency test mechanism provided in this embodiment, in which it can be seen that the module installation area 110 is not installed with the test module 200. Figure 3 for Figure 1 Schematic diagram of the test module 200 installed in the figure. In order to facilitate seeing the first locking hole 221a and the first locking structure 230 at the same time, the first locking structure 230 is installed only in two first locking holes 221a. It can be understood that the first locking structure 230 can be installed in all first locking holes 221a. Figure 4 yes Figure 3 In the cross-sectional view along the AA direction, the relative position relationship between a first locking structure 230 and the corresponding first locking hole 221 a and the corresponding second locking hole 211 can be seen at this position. Figure 5 yes Figure 4 The enlarged view of the part at B in the figure. Figure 5 It can be more clearly seen that the diameter of the first locking hole 221a is larger than the outer diameter of the first locking structure 230. Figure 5Where L1 is the difference between the radius of the first locking hole 221a and the outer diameter of the first locking structure 230. Since the hole diameter is the diameter, the first set value is 2*L1. Figure 6 The relative position relationship between the radio frequency testing mechanism of this embodiment and the single board 300 to be tested is shown.

[0066] The radio frequency testing mechanism provided in the embodiment of the present application is used to perform radio frequency testing on the single board 300 to be tested, and the test probe 220 is used to contact the test point on the single board 300 to be tested, thereby coupling with the circuit to be tested on the single board 300 to be tested, and importing the radio frequency detection signal into the radio frequency detector for detection. The single board 300 to be tested in the embodiment of the present application can be a single board of other products such as a PCB board or a chip substrate. The single board 300 to be tested is applied to an electronic device to be tested, and the electronic device to be tested refers to a device provided with an antenna, such as a mobile phone, a tablet computer, a wearable device, a vehicle-mounted device, a desktop computer, a router, etc. This embodiment will be further explained and described in detail by taking the electronic device to be tested as a router and the single board 300 to be tested as the mainboard of the router as an example.

[0067] It is worth noting that, in this embodiment, the aperture is the diameter of the hole. Since the aperture of the first locking hole 221a is larger than the outer diameter of the first locking structure 230, and the fixing module and the needle seat 221 are connected via the first locking structure 230, and the first locking structure 230 is locked in the second locking hole 211, the relative position of the first locking structure 230 and the second locking hole 211 remains unchanged, and the first locking structure 230 can move within the range of the first set value relative to the needle seat 221. Therefore, when connecting the needle seat 221 to the fixing structure 210, the first locking structure 230 can be first inserted through the first locking hole 221a into the second locking hole 211, and then the first locking structure 230 can be inserted into the second locking hole 211. Before the first locking structure 230 is locked with the second locking hole 211 and the first locking structure 230 is in contact with the needle seat 221, the needle seat 221 is moved to adjust the installation position of the test probe 220 on the fixed structure 210. Adjusting the installation position of the test probe 220 on the fixed structure 210 can reduce the assembly error of the test probe 220 to a certain extent. After the position adjustment of the test probe 220 on the fixed structure 210 is completed, the first locking structure 230 is in contact with the needle seat 221, and the first locking structure 230 is locked in the second locking hole 211, thereby fixing the test probe 220 in the adjusted position. With such a configuration, the assembly error of the test probe 220 can be reduced, thereby improving the assembly accuracy of the test probe 220, and further enabling the contact area between the test probe 220 and the single board 300 to be tested to be set as an area with higher test accuracy.

[0068] In the related art, pads are used as test points on some boards to be tested, and a test probe is electrically connected to the pad to perform radio frequency testing. However, due to the processing technology of the pad, the surface of the pad is an arc surface that protrudes outward from the outside of the board to be tested, so that the thickness of some areas of the pad is relatively larger, and the thickness of some areas is relatively smaller. For example, the thickness of the middle area of ​​the pad is the largest, and the thickness of the area closer to the edge of the pad is smaller. When the test probe has a relatively larger area of ​​contact with the pad, the test effect is better and the test accuracy is higher. If the test probe contacts the edge of the pad or contacts the area outside the pad, contact misdetection is prone to occur, and the misdetection rate is high. However, since the size of the pad is usually small, after the test probe has an assembly error, it will be difficult to contact the thicker area in the pad, thereby affecting the test accuracy. In the RF testing mechanism provided in the present embodiment, since there is a tolerance between the needle seat 221 of the test probe 220 and the fixed structure 210 (that is, the first set value mentioned above), the test probe 220 can be adjusted within the tolerance range when installed on the fixed structure 210, thereby reducing the assembly error, so that the test probe 220 can contact the thicker area in the pad, thereby improving the test accuracy, so as to obtain more accurate test data, and effectively reduce the contact misdetection caused by the inaccurate positioning of the test probe 220. That is, even if the pad is used as the test point, the use of the RF testing mechanism provided in the present embodiment can reduce the misdetection rate and improve the test accuracy. In addition, the RF testing mechanism provided in the present embodiment is also suitable for the single board 300 to be tested that uses a RF switch (Switch) test seat (hereinafter referred to as the test seat) as a test point, and can also improve the alignment accuracy of the test probe 220, reduce the misdetection rate, and improve the test accuracy.

[0069] The first locking structure 230 may be a bolt. The first locking structure 230 includes a first head and a first rod, the outer diameter of the first head is greater than the outer diameter of the first rod, and the outer diameter of the first head is greater than the outer diameter of the first locking hole 221a. The first rod is provided with an external thread, the first locking hole 221a is a smooth hole or a threaded hole, and the second locking hole 211 is a threaded hole, and the second locking hole 211 has an internal thread matching the first rod. When the test probe 220 is installed on the fixed structure 210, the first locking structure 230 is inserted into the first locking hole 221a from the side of the needle seat 221 away from the fixed structure 210 and screwed into the second locking hole 211. When the first locking structure 230 is screwed into the second locking hole 211 and the first head has not yet contacted the needle seat 221, the first locking structure 230 plays a certain degree of limiting role on the needle seat 221 through the cooperation of the first locking hole 221a, so that the needle seat 221 can only move within the first set value range relative to the first locking structure 230. At this time, the needle seat 221 can be adjusted by adjusting the first locking structure 230. 1, so that the test probe 220 moves to the set installation position, and then the first locking structure 230 is continuously rotated, so that the length of the first locking structure 230 extending into the second locking hole 211 increases, and the distance between the first head and the needle seat 221 is closer, and finally, the first head abuts against the needle seat 221, the first rod of the first locking structure 230 is threadedly connected with the fixing structure 210, and the first head of the first locking structure 230 and the fixing structure 210 clamp the needle seat 221 from both ends, so that the needle seat 221, the fixing structure 210 and the first locking structure 230 are fixedly connected. It is worth noting that the first locking hole 221a can be a countersunk hole. When the first locking hole 221a is a countersunk hole, the aperture of the first locking hole 221a mentioned above refers to the minimum aperture of the first locking hole 221a.

[0070] like Figures 1 to 7As shown, in some embodiments, the test module 200 also includes a second locking structure 240, the fixed structure 210 is provided with a third locking hole 212, the module installation area 110 is provided with a fourth locking hole 120, the test module 200 is connected to the fixture seat 100 through the second locking structure 240, the second locking structure 240 is penetrated through the third locking hole 212, and locked with the fourth locking hole 120, the aperture of the third locking hole 212 is larger than the outer diameter of the second locking structure 240, and the difference between the aperture of the third locking hole 212 and the outer diameter of the second locking structure 240 is a second set value. The fixed structure 210 in the test module 200 is installed on the fixture seat 100, and there is also a tolerance between the fixed structure 210 and the fixture seat 100 (that is, the second set value mentioned above). The fixed structure 210 is installed on the fixture seat 100 and can be adjusted within the tolerance range (that is, the second set value range), thereby adjusting the installation position of the fixed structure 210 on the fixture seat 100, reducing the assembly error of the fixed structure 210 on the fixture seat 100, and further improving the installation positioning accuracy of the test probe 220 on the fixture seat 100. The first set value and the second set value may be equal or different. For example, since the size of the fixed structure 210 is larger than the size of the test probe 220, the adjustment size of the fixed structure 210 can be larger than the adjustment size of the test probe 220, that is, the second set value is larger than the first set value. In a specific example, the first setting value is 0.35mm and the second setting value is 0.5mm. With this setting, the adjustment range of the installation position of the test probe 220 on the fixture seat 100 is 0.85mm, which can offset a larger assembly error and has a higher installation accuracy, and can effectively reduce contact misdetection caused by inaccurate positioning of the test probe 220.

[0071] It is worth noting that in Figure 1 and Figure 3 In order to see the second locking structure 240 and the third locking hole 212 at the same time, the second locking structure 240 is installed in only one of the third locking holes 212. It can be understood that the second locking structure 240 can be installed in all the third locking holes 212. In order to clearly see the matching relationship between the second locking structure 240, the third locking hole 212 and the fourth locking hole 120, Figure 7 A partial cross-sectional view of the RF test mechanism is shown in FIG. Figure 3 same. Figure 7 Where L2 is the difference between the radius of the third locking hole 212 and the radius of the fourth locking hole 120. Since the aperture is the diameter, the second set value is 2*L2.

[0072] For ease of description, the portion of the test probe 220 other than the needle seat 221 is referred to as a needle body 222. In some embodiments, one needle seat 221 may be provided with one or more needle bodies 222. Exemplarily, one needle seat 221 is provided with one needle body 222, and the two ends of the needle body 222 are respectively located on both sides of the needle seat 221. One needle seat 221 may be provided with one, two or more first locking holes 221a. When there are multiple first locking holes 221a, the multiple first locking holes 221a are spaced apart in the peripheral area of ​​the needle body 222. Multiple first locking structures 230 can be installed through multiple first locking holes 221a to achieve a better fixing effect on the needle seat 221.

[0073] like Figure 8 and Fig. 9 As shown, a test module 200 may be equipped with multiple test probes 220, each of which may be provided with a needle seat 221, which is fixed to the fixed structure 210 via a first locking structure 230. The multiple test probes 220 are arranged at intervals, and each needle seat 221 may be provided with one or more first locking holes 221a, that is, each needle seat 221 may be connected to the fixed structure 210 via one or more first locking structures 230. In a specific embodiment, as Figure 8 As shown, a test module 200 is equipped with two test probes 220. The structure of the test probe 220 is as follows: Fig. 9 As shown, a test probe 220 includes a needle seat 221 and a needle body 222, and the needle seat 221 is provided with a plurality of first locking holes 221a. The number of second locking holes 211 provided in the module installation area 110 is equal to or greater than the sum of the number of first locking holes 221a on all needle seats 221 installed on the fixing structure 210. For example, Figure 8 In the embodiment, eight second locking holes 211 are arranged on the fixed structure 210, two test probes 220 are installed on the fixed structure 210, and three first locking holes 221a are arranged on the needle seat 221 of each test probe 220. That is to say, among the eight second locking holes 211, three of the second locking holes 211 are arranged one-to-one with the three first locking holes 221a of one of the test probes 220, and three of the second locking holes 211 are arranged one-to-one with the three first locking holes 221a of another test probe 220, and two spare second locking holes 211 are also arranged. This kind of test module 200 can also be applied to the installation of a test probe 220 with one, two or four first locking holes 221a on a needle seat 221.

[0074] In other examples, multiple test probes 220 can be divided into multiple groups, one group includes several test probes 220, and the needle seats 221 of several test probes 220 in the same group are fixedly connected. For example, a test module 200 includes four test probes 220, and the four test probes 220 are divided into two groups, each group includes two test probes 220, and the needle seats 221 of two test probes 220 in the same group are fixedly connected. The fixed connection of the needle seats 221 of the test probes 220 in the same group can be connected by bonding, snap-on, screw connection, etc., or can be connected into an integrated structure through an integrated molding process. When the needle seats 221 of the test probes 220 in the same group are connected into an integrated structure through an integrated molding process, the group of test probes 220 can also be said to share a needle seat 221. The test probes 220 in the same group are fixed to the fixed structure 210 through their shared needle seat 221, and the needle seat 221 is fixed to the fixed structure 210 through the first locking structure 230.

[0075] The second locking structure 240 may be a bolt. The second locking structure 240 includes a second head and a second rod, the outer diameter of the second head is larger than the outer diameter of the second rod, and the outer diameter of the second head is larger than the outer diameter of the third locking hole 212. The second rod is provided with an external thread, the third locking hole 212 is a smooth hole, and the fourth locking hole 120 is a threaded hole, and the fourth locking hole 120 has an internal thread matching the second rod. When the test module 200 is installed on the fixture seat 100, the second locking structure 240 is inserted into the third locking hole 212 from the side of the fixing structure 210 away from the fixture seat 100 and is screwed into the fourth locking hole 120. When the second locking structure 240 is screwed into the fourth locking hole 120 and the second head has not yet contacted the fixing structure 210, the second locking structure 240 plays a certain degree of limiting role on the fixing structure 210 through the cooperation of the third locking hole 212, so that the fixing structure 210 can only move within the second set value range relative to the second locking structure 240. At this time, the fixing structure 2 10, so that the test probe 220 moves to the set installation position, and then the second locking structure 240 is continuously rotated, so that the length of the second locking structure 240 extending into the fourth locking hole 120 increases, and the distance between the second head and the fixed structure 210 is closer, and finally, the second head abuts against the fixed structure 210, the second rod of the second locking structure 240 is threadedly connected with the clamp seat 100, and the second head of the second locking structure 240 and the clamp seat 100 clamp the fixed structure 210 from both ends, so that the fixed structure 210, the clamp seat 100 and the second locking structure 240 are fixedly connected. It is worth noting that the third locking hole 212 can be a countersunk hole. When the third locking hole 212 is a countersunk hole, the aperture of the third locking hole 212 mentioned above refers to the minimum aperture of the third locking hole 212.

[0076] In some specific configurations, the test probe 220 includes a signal probe and a ground probe, the test point includes a signal point and a ground point, the signal probe contacts the signal point, and the ground probe contacts the ground point. The two ends of the test probe 220 are a test end and a signal end, respectively, the test end is used to contact the test point, and the signal end is used to electrically connect to the RF tester.

[0077] When the RF test is performed on the single board 300 to be tested, the test probe 220 needs to be electrically connected to the test point on the single board 300 to be tested. In the related art, there are usually two ways to set the test point. One is to use the pad on the single board 300 to be tested as a test point, and electrically connect the test probe 220 to the pad for testing. The other is to install a test socket on the single board 300 to be tested, use the test socket as a test point, and insert the test probe 220 into the test socket, so that the test probe 220 is electrically connected to the test socket for testing. In addition, there may be differences in the antenna frequency bands set in different single boards 300 to be tested. For example, some single boards 300 to be tested may be provided with 2.4G antennas, and some single boards 300 to be tested may be provided with 5G antennas. In order to be applicable to a variety of different single boards 300 to be tested, in some embodiments, the number of test modules 200 is multiple, and at least one test module 200 is installed in the module installation area 110. Exemplarily, a module installation area 110 is provided on the fixture seat 100, and the number of test modules 200 is multiple. Only one test module 200 can be installed in one module installation area 110 at the same time, and multiple test modules 200 can be installed in the module installation area 110 respectively. When performing radio frequency testing, one test module 200 among the multiple test modules 200 is installed in the module installation area 110. Different test modules 200 are used to perform radio frequency testing on different models of single boards 300 to be tested. In different models of single boards 300 to be tested, at least one of the number of test points, the interval between adjacent test points, the position of the test points, the specific structure of the test points (such as a pad or a test seat), and the frequency band of the antenna corresponding to the test points is different. Test modules 200 may be respectively provided for different types of single boards 300 to be tested, that is, in different test modules 200, the number of test probes 220 on the fixed structure 210 is different, the installation positions of the test probes 220 on the fixed structure 210 are different, and / or the test frequency bands of the test probes 220 on the fixed structure 210 are different. For example, among multiple test modules 200, test modules 200 with test probes 220 for performing radio frequency tests on 2.4G antennas may be provided, and test modules 200 with test probes 220 for performing radio frequency tests on 5G antennas may be provided. And among multiple test modules 200 with test probes 220 for performing radio frequency tests on 2.4G antennas, the specific structures of the test probes 220 in different test modules 200 may be different, for example, one of the test modules 200 has a test probe 220 that can be electrically connected to a pad, and another test module 200 has a test probe 220 that can be inserted into a test socket. Figure 8 A first test module 200 is shown in FIG. Fig.10 and Fig.11 A second test module 200 is shown in FIG. Fig.12 and Fig.13 A third test module 200 is shown in FIG. Fig.14 and Fig.15 A fourth test module 200 is shown in FIG. Fig.16 and Fig.17 The fifth test module 200 is shown in the figure. The structures of the above five test modules 200 are only examples. It can be understood that the test module 200 can also be other structural shapes besides the above five. Among the above five test modules 200, the first test module 200, the second test module 200 and the third test module 200 can all be used to perform RF tests on 5G antennas, wherein the test probes 220 in the first test module 200 and the second test module 200 are suitable for the single board 300 to be tested whose test points are pads, and the test probes 220 in the third test module 200 are suitable for the single board 300 to be tested whose test points are test sockets. The fourth test module 200 and the fifth test module 200 can both be used to perform RF tests on 2.4G antennas, wherein the test probes 220 in the fourth test module 200 are suitable for the single board 300 to be tested whose test points are pads, and the test probes 220 in the fifth test module 200 are suitable for the single board 300 to be tested whose test points are test sockets.

[0078] It is worth noting that when one module installation area 110 can be used to install a variety of different test modules 200, the location and quantity of the third locking holes 212 in different test modules 200 may be the same or different. When the location and quantity of the first locking holes 221a in different test modules 200 are the same, the number of the fourth locking holes 120 set in the first module installation area 110 is the same as the number of the third locking holes 212 in the test module 200 and the positions are opposite.

[0079] In the case where the first locking holes 221a are arranged at different positions in different test modules 200, the number of the fourth locking holes 120 arranged in one module installation area 110 is greater than the number of the third locking holes 212 in any one test module 200. In other words, the plurality of fourth locking holes 120 in one module installation area 110 include a plurality of fourth locking holes 120 corresponding to the plurality of third locking holes 212 in any one test module 200. Exemplarily, a module installation area 110 is provided with twelve fourth locking holes 120. Among the multiple test modules 200 that can be installed in the module installation area 110, the number of third locking holes 212 in each test module 200 is the same, which is six. However, among the multiple test modules 200, the setting positions of the six third locking holes 212 have two setting modes. Among the twelve fourth locking holes 120 provided in the module installation area 110, six are the same as the first setting mode of the third locking holes 212 in the test module 200, and the other six are the same as the second setting mode of the third locking holes 212 in the test module 200. That is to say, when the test module 200 with the first setting mode is installed in the module installation area 110, it is connected at the six fourth locking holes 120 through the six second locking structures 240, and when the test module 200 with the second setting mode is installed in the module installation area 110, it is connected at the other six fourth locking holes 120 through the six second locking structures 240. Of course, in other configurations, the same fourth locking hole 120 may correspond to the third locking holes 212 in different test modules 200 , that is, there are several fourth locking holes 120 that can be used in common for a variety of different test modules 200 . Exemplarily, eight fourth locking holes 120 are provided in the module installation area 110. Among the multiple test modules 200 that can be installed in the module installation area 110, the number of third locking holes 212 in each test module 200 is the same, that is, six. However, among the multiple test modules 200, the setting positions of the six third locking holes 212 have two setting methods. Among the twelve fourth locking holes 120 provided in the module installation area 110, six are the same as the first setting method of the third locking holes 212 in the test module 200, and two of the above six fourth locking holes 120 are the same as the second setting method of the other four fourth locking holes 120, that is, two of the eight fourth locking holes 120 are adapted to two test modules 200 with different third locking holes 212 setting methods, and are shared by the two test modules 200.

[0080] In order to adapt to more types of single boards 300 to be tested, in some embodiments, Figure 2 As shown, there are multiple module installation areas 110, and the multiple module installation areas 110 are distributed at intervals on the fixture seat 100, such as Figure 1 , Fig.18 and Fig.19 As shown, at least one module installation area 110 is installed with a test module 200. There are multiple module installation areas 110, and the test module 200 may be installed in only one module installation area 110, or in several or all of the module installation areas 110. When the test module 200 is installed in only one module installation area 110, the test point corresponding to an antenna on the single board 300 to be tested can be tested by the test module 200 installed in the module installation area 110. Some single boards 300 to be tested may be provided with multiple antennas at the same time, and the test modules 200 may be installed in multiple module installation areas 110 respectively, so that the multiple antennas on the single board 300 to be tested can be tested simultaneously by multiple test modules 200.

[0081] In some embodiments, the module installation area 110 includes a first installation area and a second installation area, and the test module 200 includes a first module and a second module. The first module is installed in the first installation area, and the second module is installed in the second installation area. The test frequency bands of the first module and the second module are different. It is worth noting that the first installation area and the second installation area are the names of the module installation areas 110 at two different positions on the fixed structure 210. The first installation area and the second installation area are both module installation areas 110, but the setting positions on the fixed structure 210 are different. That is to say, the first installation area and the second installation area are both used to install the test module 200, and the first installation area and the second installation area are respectively provided with a fourth locking hole 120. The first module and the second module are both test modules 200, and the test frequency bands of the first module and the second module are different. That is to say, the first module and the second module both have the characteristics of the test module 200, and the first module and the second module both include a fixed structure 210, a test probe 220 and a first locking structure 230. The test probes 220 in the first module and the second module may be different types of test probes 220, so that the test frequency bands of the first module and the second module are different. Exemplarily, the first module is used to perform RF testing on the 2.4G antenna, and the second module is used to perform RF testing on the 5G antenna. Since the first module is installed in the first installation area and the second module is installed in the second installation area, the RF testing mechanism can be used to perform RF testing on the 2.4G antenna and the 5G antenna in the single board 300 to be tested that has both a 2.4G antenna and a 5G antenna, without replacing the RF testing mechanism or the test module 200, and the test efficiency is high. Exemplarily, in Figure 2 In the example, the module installation area 110 on the left is the second installation area, and the module installation area 110 on the right is the first installation area. Figure 8 , Figures 10 to 13 The test modules 200 shown in FIG. 2 are all second modules. Figures 14 to 17 The test modules 200 shown in FIG. 2 are all first modules. Fig.18 and Fig.19 Schematic diagrams showing that the first installation area and the second installation area are both installed with the test module 200 are shown.

[0082] In order to adapt to different test point settings on different single boards 300 to be tested, in some embodiments, the number of first modules in the radio frequency test mechanism is multiple, and the multiple first modules include at least a first solder submodule and a first test socket submodule. The test probe 220 in the first solder submodule is used to contact the solder pad, and the first test socket submodule is used to contact the test socket. One of the first solder submodule and the first test socket submodule is installed in the first installation area. It is worth noting that the first solder submodule and the first test socket submodule are both first modules, which can be installed in the first installation area respectively. The test probe 220 in the first solder submodule and the first test socket submodule has different structures. The test probe 220 in the first solder submodule is adapted to the solder pad and is used to be electrically connected to the solder pad to test the single board 300 to be tested with the solder pad as the test point. The test probe 220 in the first test socket submodule is adapted to the test socket and is used to be electrically connected to the test socket to test the single board 300 to be tested with the test socket as the test point. When the first mounting area is installed with a first solder submodule, the first solder submodule can be used to perform radio frequency testing on the single board 300 to be tested which is provided with solder pads as test points.

[0083] In some embodiments, the number of second modules is multiple, and the multiple second modules include at least a second solder submodule and a second test socket submodule, the test probe 220 in the second solder submodule is used to contact the solder pad, the second test socket submodule is used to contact the test socket, and one of the second solder submodule and the second test socket submodule is installed in the second installation area.

[0084] In some embodiments, the number of the first module and the second module of the RF testing mechanism are both multiple, and the multiple first modules include at least the first solder submodule and the first test socket submodule, and the multiple second modules include at least the first solder submodule and the first test socket submodule. This type of RF testing mechanism can be applied to a test mainboard having two antennas of different frequency bands at the same time. Regardless of whether the test point on the test mainboard is a solder pad or a test socket, the test can be performed by installing the adapted first module and the second module in the first installation area and the second installation area respectively, and the RF testing mechanism has a wider scope of application. Since the assembly error of the test probe 220 in the RF testing mechanism is smaller and the false detection rate is lower, it is particularly suitable for the single board 300 to be tested that uses the solder pad as the test point. Since the single board 300 to be tested can use the solder pad as the test point, there is no need to install the test socket, saving the production cost of the single board 300 to be tested.

[0085] In some embodiments, Figure 2 and Figure 3As shown, the module installation area 110 is provided with a first positioning structure 160, and the fixed structure 210 is provided with a second positioning structure 213, and the first positioning structure 160 and the second positioning structure 213 are arranged opposite to each other. In one arrangement, the first positioning structure 160 and the second positioning structure 213 are both positioning holes. With such an arrangement, when the test module 200 is installed in the module installation area 110, a positioning pin or a positioning needle can pass through the first positioning structure 160 and the second positioning structure 213, so that the test module 200 and the module installation area 110 are initially positioned. It is worth noting that the outer diameter of the selected positioning pin or positioning needle needs to be smaller than the inner diameter of the second positioning structure 213, so that the test module 200 can move relative to the module installation area 110 within a certain range after the initial positioning in the module installation area 110.

[0086] In another configuration, one of the first positioning structure 160 and the second positioning structure 213 is a positioning column, and the other is a positioning hole, and the outer diameter of the positioning column is smaller than the inner diameter of the positioning hole. In this configuration, when the test module 200 is installed in the module installation area 110, the positioning column extends into the positioning hole, so that the test module 200 and the module installation area 110 are initially positioned. It is worth noting that since the outer diameter of the positioning column is smaller than the inner diameter of the positioning hole, the test module 200 can still move relative to the module installation area 110 within a certain range after the initial positioning in the module installation area 110. The difference between the diameter of the positioning column and the diameter of the positioning hole can be greater than or equal to the second set value.

[0087] In some embodiments, Figure 2 As shown, the module installation area 110 is provided with a limiting groove 130, and at least part of the structure of the fixed structure 210 is located in the limiting groove 130. In this arrangement, on the one hand, the inner wall of the limiting groove 130 plays a certain degree of limiting role for the fixed structure 210, and in the process of installing the fixed structure 210 to the module installation area 110, the limiting groove 130 plays a role in initial positioning for the fixed structure 210. On the other hand, since at least part of the fixed structure 210 in the test module 200 is located in the limiting groove 130, the total thickness of the RF test mechanism is relatively smaller, the structure of the RF test mechanism is more compact, and the occupied space is relatively smaller.

[0088] It is worth noting that when the module installation area 110 includes a first installation area and a second installation area, the first installation area and the second installation area can both be provided with a first positioning structure 160 and a limiting groove 130, or one of them can be provided with a first positioning structure 160 and the other can be provided with a limiting groove 130, or both can be provided with a first positioning structure 160, or both can be provided with a limiting groove 130.

[0089] In some embodiments, Figure 6 , Fig. 20 and Fig.21 As shown, the fixture seat 100 includes a first component 141 and a second component 142, the second component 142 is detachably connected to the first component 141, and the module installation area 110 is set on the second component 142. The first component 141 can be used to connect with external equipment to fix the fixture seat 100. For example, if the fixture seat 100 is installed in a cabinet 600, the first component 141 can be used to connect with the cabinet 600, and the second component 142 is detachably connected to the first component 141. With this arrangement, the test module 200 can be installed and adjusted on the second component 142 outside the cabinet 600, and the operation space is larger, which is convenient for improving the installation and adjustment accuracy and efficiency. When installing the test module 200 on the second component 142, the first component 141 can be installed in the cabinet 600, and then the second component 142 with the test module 200 installed can be installed on the first component 141. When the model of the single board 300 to be tested changes, it is necessary to replace the test module 200 that is compatible with the new model of the single board 300 to be tested. At this time, the second component 142 can be removed from the first component 141 and replaced with the second component 142 that is installed with the test module 200 that is compatible with the new model of the single board 300 to be tested, thereby quickly completing the model change operation and improving the detection efficiency.

[0090] In some embodiments, Fig. 20 and Fig.21 As shown, the first component 141 is provided with a quick-release structure 141a. The quick-release structure 141a is used to quickly connect the first component 141 to an external device, which may be a cabinet 600. The quick-release structure 141a can be used to quickly connect the first component 141 to the cabinet 600. Exemplarily, the quick-release structure 141a can be a quick-release slot body, which is adapted to a swinging member in the cabinet 600. The swinging member can swing and move into the quick-release slot body, thereby connecting the first component 141 to the cabinet 600. The swinging member can swing and move out of the quick-release slot body, thereby allowing the first component 141 to be removed from the cabinet 600.

[0091] In a specific example, Fig.21 As shown, the first component 141 is a frame-type structure, and a fixing platform is provided on its inner wall. The edge of the second component 142 overlaps the fixing platform, and the second component 142 is fixedly connected to the fixing platform. The first component 141 and the second component 142 can be connected by bolts.

[0092] In some embodiments, Figure 6As shown, the fixture seat 100 also includes a third component 143, the third component 143 is connected to the first component 141 or the second component 142, and a plurality of first limiting holes 143a are provided on the third component 143 at a position opposite to the module installation area 110, and the test probe 220 is passed through the corresponding first limiting holes 143a, and the two ends of the test probe 220 are respectively located on both sides of the outside of the first limiting holes 143a. In this example, since the inner wall of the first limiting hole 143a of the third component 143 plays a certain limiting role for the test probe 220, the shaking that may be generated when the test probe 220 contacts the area to be tested can be reduced, thereby reducing the false detection rate. In addition, the first limiting hole 143a also plays a certain protective role for the test probe 220.

[0093] like Figure 6 As shown, the first component 141, the second component 142 and the third component 143 may be a laminated structure, the second component 142 is located between the first component 141 and the third component 143, the first component 141 is located on the side of the second component 142 away from the single board 300 to be tested, and the third component 143 is located on the side of the second component 142 close to the single board 300 to be tested.

[0094] In some embodiments, Figure 2 As shown, the fixture seat 100 is provided with an avoidance hole 150. The avoidance hole 150 can be a blind hole or a through hole, and the avoidance hole 150 is used to avoid the components installed on the single board 300 to be tested. With such a configuration, when the test probe 220 contacts the test point on the single board 300 to be tested, some components on the single board 300 to be tested extend into the avoidance hole 150, that is, the test probe 220 extends out of the fixture seat 100 and faces the surface of the single board 300 to be tested. Effective contact with the test point can be achieved by a relatively small distance. In addition, the avoidance hole 150 on the fixture seat 100 can also play a role in reducing weight. In some specific configurations, the avoidance hole 150 can be provided on the second component 142 and / or the third component 143.

[0095] like Figure 22 to Figure 25 As shown, the embodiment of the present application further provides a radio frequency test system, including a support mechanism 400 and the radio frequency test mechanism provided by any of the above embodiments, the support mechanism 400 is used to support the single board 300 to be tested, the single board 300 to be tested has a test point, and the test probe 220 in the radio frequency test mechanism is electrically connected to the test point of the single board 300 to be tested. Since the radio frequency test mechanism is provided in the radio frequency test system, it has at least all the advantages of the above radio frequency test mechanism, which will not be repeated here.

[0096] In some examples, the RF test system further includes an RF tester and an RF cable, and the RF tester is electrically connected to a test probe 220 in the RF test mechanism through an RF cable. Exemplarily, one end of the test probe 220 contacts a test point on the single board 300 to be tested, and the other end is connected to the RF cable, and the test probe 220 is connected to the RF tester through the RF cable, and the RF test system is used to perform RF testing on the single board 300 to be tested.

[0097] In some examples, such as Fig. 22 and Fig.23 As shown, the radio frequency test system further includes a cabinet 600, and the support mechanism 400 and the radio frequency test mechanism are both installed in the cabinet 600, and the support mechanism 400 and the radio frequency test mechanism are arranged relatively spaced apart.

[0098] In some examples, such as Fig. 22 and Fig.23 As shown, the RF test system further includes a driving mechanism 500 , which is used to change the distance between the supporting mechanism 400 and the RF test mechanism, so that the test probe 220 is close to or away from the single board 300 to be tested placed on the supporting mechanism 400 .

[0099] The driving mechanism 500 can be connected to the supporting mechanism 400 by transmission, so as to drive at least part of the structure in the supporting mechanism 400 to move toward or away from the RF testing mechanism, so as to move the single board 300 to be tested in the supporting mechanism 400 toward or away from the testing probe 220. The driving mechanism 500 can also be connected to the RF testing mechanism by transmission, so as to drive the RF testing mechanism to move toward or away from the supporting mechanism 400, so as to move the RF testing mechanism toward or away from the single board 300 to be tested. Alternatively, the driving mechanism 500 can also be connected to the supporting mechanism 400 and the RF testing mechanism by transmission, so that the driving mechanism 500 drives the supporting mechanism 400 and the RF testing mechanism to move in opposite directions to move toward or away from each other.

[0100] In some specific examples, the driving mechanism 500 is in transmission connection with the supporting mechanism 400, the supporting mechanism 400 includes a fixed portion 431 and a movable portion 432, the fixed portion 431 is provided with a first through hole, the movable portion 432 covers the first through hole, the driving mechanism 500 is located on the side of the fixed portion 431 away from the fixture seat 100, and the driving mechanism 500 is connected to the movable portion 432 through the first through hole. The fixed portion 431 is used to connect with external equipment, such as the cabinet 600, and the fixed portion 431 is used to limit the movable portion 432 in the horizontal direction.

[0101] Exemplarily, the driving mechanism 500 includes a cylinder, which includes a cylinder body and a cylinder rod. The cylinder body is fixed in the cabinet 600, one end of the cylinder rod extends into the cylinder body, and the cylinder rod can move relative to the cylinder body. The end of the cylinder rod located on the outside of the cylinder body is connected to the movable part 432. The cylinder rod moves relative to the cylinder body, thereby driving the movable part 432 to move relative to the fixed part 431, thereby driving the single board 300 to be tested located on the movable part 432 to move toward or away from the test probe 220.

[0102] In one configuration, the distance between the support mechanism 400 and the RF test mechanism is changed by the driving mechanism 500, so that the test probe 220 contacts the test point on the single board 300 to be tested. In some test probes 220, the needle body 222 can elastically float relative to the needle seat 221 in a direction close to or away from the single board 300 to be tested. For example, Fig.15 In the test probe 220 of the test module 200 shown in FIG. 1 , a spring is provided between the needle body 222 and the needle seat 221, and the spring enables the needle body 222 to move relative to the needle seat 221. Fig.15 After the test probe 220 contacts the test point on the single board 300 to be tested, if the driving mechanism 500 continues to reduce the distance between the support mechanism 400 and the RF test mechanism, the test probe 220 moves upward relative to the needle holder 221, and the force of the test probe 220 on the single board 300 to be tested increases. When the test point is a pad, increasing the force of the test probe 220 on the test point can make the test probe 220 pierce the coating on the surface of the pad, so that the test probe 220 can be more stably electrically connected to the pad.

[0103] In a specific embodiment, the driving mechanism 500 is controlled so that the force applied by the test probe 220 to the test point (or the downward force of the test probe 220) is within the range of 7N to 8N. For example, the downward force of the test probe 220 may be 7N, 7.5N, 8N, etc. In an optional embodiment, the test probe 220 may use a triangular needle type needle body 222. The driving mechanism 500 is controlled so that the force applied by the test probe 220 to the test point is 7N. Taking the triangular needle type test probe 220 as an example, Fig.26 , Fig. 27 and Fig.28, perform a pin contact S11 test on the test probe 220. When the contact is good, the 2.4G band is <-20dB, the 5G band is <-15dB, and the load is around 50 ohms. The downward pressure of the test needle will affect the contact state of the test needle. By verifying that the downward pressure of 7N can make the CPK (Capability Process Index) reach 1.33, the misdetection is around 1%, and there is no reliability problem. One end of the test probe 220 is connected to the RF cable. The electrical characteristics of the RF cable are: characteristic impedance 50 ohms, frequency range 0~6G; insertion loss 2.1DB (0~3GHz) 2.8DB (3~6GHz) S11≤-20dB. When the downward pressure of the test needle is 7N, the difference between the two test schemes of the test socket and the pad can be within ±0.5dB. In the related art, the error rate during the RF test with the pad as the test point is about 5%. The RF test system provided in this embodiment tested the single board to be tested with the pad as the test point. After testing 300 single boards to be tested, the error rate was less than 1%. It is estimated that the error rate in the mass production stage will be about 1%. Fig.26 As shown, when the downward pressure (elastic force) of the test probe 220 is 7N, its stroke is 5mm, which is sufficient to allow the test probe 220 to pierce the oxide layer, impurities, flux or other coatings on the surface of the pad. Fig. 27 This is a CPK test diagram when the downward pressure of the test probe 220 is 6N. Fig.28 This is a CPK test diagram when the downward pressure of the test probe 220 is 7N. Fig. 27 and Fig.28 In the figure, the horizontal axis is the threshold, which is used to determine whether the product has reached the predetermined quality standard. LSL (Lower Specification Limit) is the lower limit specification of the threshold, USL (Upper Specification Limit) is the upper limit specification of the threshold, and MSL (Middle Specification Limit) is the center value of the threshold, or the ideal center value. The vertical axis on the left is the frequency. For example, in Fig. 27 In all tests, the number of times the threshold is 0 is more than 40 times and less than 50 times. Fig. 27 and Fig.28 It can be concluded that the peak convergence of the normal distribution curve when the test probe 220 is 7N is higher, that is, most of the measurement data are more concentrated in a small range of threshold values, that is, the test stability is higher and the false detection rate is lower. From the above data, the stability of the test with a pressure of 7N is higher than the stability of the test with a pressure of 6N.

[0104] In some embodiments, Fig.24 and Fig.25Two different structures of the support mechanism 400 are shown. Fig.24 In the support mechanism 400 shown, the side of the support mechanism 400 facing the RF test mechanism is a plane, and the single board 300 to be tested is placed on the plane, and the plane plays a supporting role for the single board 300 to be tested. Fig.25 As shown, the support mechanism 400 is provided with a plurality of first limiting posts 410, and the plurality of first limiting posts 410 are arranged to form a limiting area, and the single board 300 to be tested is located in the limiting area ( Fig.25 The single board 300 to be tested is not shown in the figure). A plurality of first limiting posts 410 are spaced apart on the support mechanism 400. Since there are gaps between adjacent first limiting posts 410, it is convenient to take and place the single board 300 to be tested in the limiting area. Exemplarily, the first limiting posts 410 are cylindrical structures. When the outer contour of the single board 300 to be tested is substantially a square plate body, one or more first limiting posts 410 are respectively arranged on both sides of the length direction of the single board 300 to be tested, and one or more first limiting posts 410 are respectively arranged on both sides of the width direction of the single board 300 to be tested. In this way, the plurality of first limiting posts 410 limit the single board 300 to be tested from at least four directions, so that the single board 300 to be tested is limited relative to the support mechanism 400. The layout trajectory of the plurality of first limiting posts 410 may also match the outer contour shape of the single board 300 to be tested. For example, if a notch is provided on the outer periphery of the single board 300 to be tested, a first limiting post 410 may be provided at the corresponding notch.

[0105] In some examples, the single board 300 to be tested may be provided with a solder pad as a test point, or a test socket may be installed on the single board 300 to be tested, and the test socket may be used as a test point. In other words, the single board 300 to be tested may be tested using a solder pad or by installing a test socket. Fig.24 In the example, the board to be tested 300 uses the pad 310 as a test point.

[0106] like Fig.24 As shown, in some embodiments, when the single board 300 to be tested is provided with a pad 310 as a test point, the diameter of the pad is greater than or equal to 2 mm. In this way, the diameter of the pad 310 is relatively large, so that the area of ​​the pad 310 that can be used to contact the test probe 220 for radio frequency testing is relatively large, which can reduce the probability of misdetection by the test probe 220. Exemplarily, a pad 310 is provided as a test point on the single board 300 to be tested, and the diameter of the pad 310 is 2 mm.

[0107] In some embodiments, the single board 300 to be tested is provided with a plurality of test points, and the distance between adjacent test points is greater than or equal to 3 mm. In this arrangement, since the distance between adjacent test points is relatively large, the distance between the test probes 220 adapted to the single board 300 to be tested can be relatively large, which facilitates the installation of the test probes 220. Exemplarily, a pad 310 is provided on the single board 300 to be tested as a test point, and the distance between adjacent pads 310 is 3 mm.

[0108] In some embodiments, Fig.25 As shown, the support mechanism 400 is provided with a calibration hole 440, and the calibration hole 440 is used for the test probe 220 to extend into. The calibration hole 440 is used when both the support mechanism 400 and the RF test mechanism are assembled, and before the actual RF test is performed, the distance between the RF test mechanism and the support mechanism 400 can be reduced, and it is observed whether the test probe 220 can extend into the calibration hole 440. If the test probe 220 cannot extend into the calibration hole 440, it is necessary to adjust the installation position of the test probe 220 again. If the test probe 220 can extend into the calibration hole 440, it means that the installation accuracy of the test probe 220 is relatively high, and subsequent RF tests can be performed. Exemplarily, during the calibration process, the support mechanism 400 can be driven by the driving mechanism 500 to move in a direction close to the RF test mechanism, so that the distance between the support mechanism 400 and the test probe 220 is reduced, and it is observed whether the test probe 220 can extend into the calibration hole 440.

[0109] In some embodiments, Figure 2 , Figure 6 and Fig.25 As shown, one of the clamp seat 100 and the support mechanism 400 is provided with a second limiting column 170, and the other is provided with a second limiting hole 420. The second limiting column 170 is arranged opposite to the second limiting hole 420, and the second limiting column 170 can extend into the corresponding second limiting hole 420. It is worth noting that when the distance between the clamp seat 100 and the support mechanism 400 is less than the length of the second limiting column 170, the second limiting column 170 is located in the limiting hole, and after the distance between the clamp seat 100 and the support mechanism 400 is further reduced, the second limiting column 170 plays a guiding role for the moving one of the clamp seat 100 and the support mechanism 400. Exemplarily, the driving mechanism 500 drives the supporting mechanism 400 to move toward the direction approaching the clamp seat 100. When the second limiting column 170 extends into the corresponding second limiting hole 420, the second limiting column 170 guides and limits the supporting mechanism 400, which can reduce the deviation or jitter of the moving direction of the supporting mechanism 400 caused by moving a relatively long distance to a certain extent, thereby reducing the false detection rate.

[0110] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A radio frequency testing mechanism, characterized in that: include: A fixture seat having a module mounting area; A test module comprises a fixing structure, a test probe and a first locking structure, wherein the test probe has a needle seat, the needle seat is provided with a first locking hole, and the fixing structure is provided with a second locking hole, one end of the first locking structure abuts against a side of the needle seat away from the fixing structure, the other end of the first locking structure is passed through the first locking hole and locked in the second locking hole, the fixing structure and the needle seat are connected through the first locking structure, the aperture of the first locking hole is larger than the outer diameter of the first locking structure, and the difference between the aperture of the first locking hole and the outer diameter of the first locking structure is a first set value; the fixing structure is installed in the module installation area.

2. The radio frequency testing mechanism according to claim 1, characterized in that: The test module also includes a second locking structure, the fixed structure is provided with a third locking hole, the module installation area is provided with a fourth locking hole, the test module is connected to the fixture seat through the second locking structure, the second locking structure is passed through the third locking hole and locked with the fourth locking hole, the aperture of the third locking hole is larger than the outer diameter of the second locking structure, and the difference between the aperture of the third locking hole and the outer diameter of the second locking structure is a second set value.

3. The radio frequency testing mechanism according to claim 1, characterized in that: There are multiple test modules, and at least one test module is installed in the module installation area; In different test modules, the number of the test probes on the fixed structure is different, the installation positions of the test probes on the fixed structure are different, and / or the test frequency bands of the test probes on the fixed structure are different.

4. The radio frequency testing mechanism according to claim 1, characterized in that: There are multiple module installation areas, and the multiple module installation areas are distributed at intervals on the fixture seat. The test module is installed in at least one module installation area.

5. The radio frequency testing mechanism according to claim 4, characterized in that: The multiple module installation areas include a first installation area and a second installation area. The number of the test modules is multiple. The multiple test modules include a first module and a second module. The first module is installed in the first installation area, and the second module is installed in the second installation area. The test frequency bands of the first module and the second module are different.

6. The radio frequency testing mechanism according to claim 5, characterized in that: There are multiple first modules, and the multiple first modules include a first solder submodule and a first test socket submodule, the test probe in the first solder submodule is used to contact the solder pad, the first test socket submodule is used to contact the test socket, and one of the first solder submodule and the first test socket submodule is installed in the first mounting area; and / or there are multiple second modules, and the multiple second modules include a second solder submodule and a second test socket submodule, the test probe in the second solder submodule is used to contact the solder pad, the second test socket submodule is used to contact the test socket, and one of the second solder submodule and the second test socket submodule is installed in the second mounting area.

7. The radio frequency testing mechanism according to any one of claims 1 to 6, characterized in that: The module installation area is provided with a limiting groove, and at least a part of the structure of the fixing structure is located in the limiting groove.

8. The radio frequency testing mechanism according to any one of claims 1 to 6, characterized in that: The fixture seat includes a first component and a second component, the second component is detachably connected to the first component, and the module installation area is arranged on the second component.

9. The radio frequency testing mechanism according to claim 8, characterized in that: The fixture seat also includes a third component, which is connected to the first component or the second component. A plurality of first limiting holes are arranged on the third component at a position opposite to the module installation area. The test probe is passed through the corresponding first limiting holes, and both ends of the test probe are respectively located on both sides of the outside of the first limiting hole.

10. The radio frequency testing mechanism according to any one of claims 1 to 6, characterized in that: The clamp seat is provided with an avoidance hole.

11. The radio frequency testing mechanism according to any one of claims 1 to 6, characterized in that: The module installation area is provided with a first positioning structure, the fixed structure is provided with a second positioning structure, and the first positioning structure and the second positioning structure are arranged opposite to each other; The first positioning structure and the second positioning structure are both positioning holes; or, one of the first positioning structure and the second positioning structure is a positioning column, and the other is a positioning hole, and the outer diameter of the positioning column is smaller than the inner diameter of the positioning hole.

12. A radio frequency testing system, characterized in that: It comprises a supporting mechanism and a radio frequency testing mechanism as claimed in any one of claims 1 to 11, wherein the supporting mechanism is used to support a single board to be tested, and a testing probe in the radio frequency testing mechanism is electrically connected to the single board to be tested.

13. The radio frequency testing system according to claim 12, characterized in that: The support mechanism is provided with a plurality of first limiting columns, and the plurality of first limiting columns are arranged to form a limiting area, and the limiting area is used to accommodate the single board to be tested.

14. The radio frequency testing system according to claim 12, wherein: The support mechanism is provided with a calibration hole, and the calibration hole is used for the test probe to extend into.

15. The radio frequency testing system according to claim 12, characterized in that: One of the clamp seat and the supporting mechanism is provided with a second limiting column, and the other is provided with a second limiting hole. The second limiting column is arranged opposite to the limiting hole, and the second limiting column can extend into the corresponding second limiting hole.

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