Signal processing module test system

Abstract

A signal processing module test system comprises a power supply unit, a main control unit, a signal generator unit, a communication unit, an analog voltage acquisition unit, an input channel switching unit and an output channel switching unit. The single-chip microcomputer of the main control unit is correspondingly connected with the relays of the input channel switching unit and the output channel switching unit through a Darlington transistor driver. The input end of the signal generator unit is connected with three output pins of the single-chip microcomputer in a one-to-one correspondence mode, and the output end of the signal generator unit is connected with the signal input end of a to-be-tested signal processing module through the input channel switching unit. The input end of the analog voltage acquisition unit is connected with the output end of the to-be-tested signal processing module through the output channel switching unit, and the output end of the analog voltage acquisition unit is correspondingly connected with the input pins of the single-chip microcomputer. And the communication unit is correspondingly connected with an output pin of the main control unit and is used for uploading the acquired voltage signal and the time signal to an upper computer. The system is high in test speed and high in test precision.

Description

Technical Field

[0001] The utility model relates to a testing system, in particular to a signal processing module testing system. Background Art

[0002] Currently, a signal processing module is usually installed in the missile launch control system in the field of military electronic products to perform signal processing to control the missile flight trajectory.

[0003] At present, the testing of the parameters related to the signal processing module requires the use of special instruments, such as power supply, signal source, programmable switch, digital desktop multimeter, oscilloscope, etc., and the control of these instruments requires the use of special VEE software. However, in the control process, each instrument requires a certain delay time to output stably. Due to the use of too many instruments, the time taken by all the delays is too long. When we test the signal processing module, we need to take out the device to be tested stored in a low-temperature environment and perform parameter testing to verify whether the various parameters in the low-temperature environment are qualified. Therefore, the test must be completed within 30 seconds to avoid inaccurate testing due to temperature changes caused by too long time. The time required for testing using VEE software can be compressed to 1 minute at the fastest, which still cannot meet the requirements of high and low temperature testing.

[0004] Therefore, there are the following problems in relying on various instruments to complete the parameter test of the signal processing module:

[0005] 1. Since various imported instruments are expensive, the traditional testing methods that rely on various imported instruments take up too much resources, resulting in a certain waste of resources.

[0006] 2. Traditional testing methods use too many instruments, and the coordination between them requires a certain delay waiting time. Since the test must be completed within 30 seconds, it cannot meet the test requirements.

[0007] 3. Since military electronic products have strict requirements on reliability, the traditional method of building a test system with instruments is prone to confusion of connecting wires, which seriously reduces the reliability of the test. Utility Model Content

[0008] The technical problem to be solved by the utility model is to provide a signal processing module testing system with fast testing speed and high testing accuracy.

[0009] In order to solve the above problems, the utility model adopts the following technical solutions:

[0010] A signal processing module testing system comprises a power supply unit, a main control unit, a signal generator unit, a communication unit, an analog voltage acquisition unit, an input channel switching unit and an output channel switching unit, wherein a power output end of the power supply unit is electrically connected to the main control unit, the signal generator unit, the input channel switching unit and the output channel switching unit, respectively, for providing working power to the main control unit, the signal generator unit, the input channel switching unit and the output channel switching unit;

[0011] The main control unit includes a single-chip microcomputer and a Darlington tube driver, wherein the single-chip microcomputer is respectively connected to a plurality of relays of the input channel switching unit and the output channel switching unit through the Darlington tube driver, and is used to control the operation of the corresponding relays in the input channel switching unit and the output channel switching unit;

[0012] The input end of the signal generator unit is connected to the three output pins of the single-chip microcomputer in a one-to-one correspondence, and the output end is connected to the signal input end of the signal processing module to be tested through the input channel switching unit, and is used to convert the TTL signal with an amplitude value of 5V into a TTL signal with an amplitude value of 15V, so as to provide a signal source for the signal processing module to be tested;

[0013] The input end of the analog voltage acquisition unit is connected to the output end of the signal processing module to be tested through the output channel switching unit, and the output end of the analog voltage acquisition unit is correspondingly connected to the input pin of the single-chip microcomputer, which is used to convert the output high voltage signal into a voltage signal within 5V that can be recognized by the single-chip microcomputer, and input the processed voltage signal to the main control unit for voltage measurement;

[0014] The communication unit is correspondingly connected to the output pins of the main control unit and is used to upload the collected voltage signal and time signal to the host computer.

[0015] As a further preference, the single chip microcomputer is STC15w4k16s4; the Darlington transistor driver is ULN2803.

[0016] As a further preference, the signal generator unit includes three signal conversion circuits, the input ends of the three signal conversion circuits are respectively connected to the three output pins P3.2, P3.3, and P3.4 of the single-chip computer, each signal conversion circuit includes transistors Q1, Q2 and a waveform shaping chip, the base of the transistor Q1 is respectively led out of the input end through a resistor, the base and emitter of the transistor Q2 are respectively connected to the collector of the transistor Q1 through a resistor, the collector of the transistor Q2 is connected to the input end of the corresponding waveform shaping chip through a resistor, and the outputs are respectively output through the output pins of the waveform shaping chip.

[0017] As a further preference, the transistors Q1 and Q2 are C8050 transistors and C8550 transistors respectively, and the waveform shaping chip is CD4081.

[0018] As further preferred, the input channel switching unit includes relays J1-J9, one end of the coils of the relays J1-J9 are respectively connected to a 5V power supply, the other end of the coils of the relays J1-J9 are respectively connected to the output end of the corresponding Darlington tube driver, one end of the normally open contacts of the relays J4 and J7 are respectively connected to the first output end of the signal generator unit, and the other end is respectively connected to the signal input ends KF1 and KF2 of the signal processing module to be tested, one end of the normally open contacts of the relays J6 and J9 are respectively connected to the second output end of the signal generator unit, and the other end is respectively connected to the signal input ends KB1 and KB2 of the signal processing module to be tested, one end of the normally open contact of the relay J5 is connected to the third output end of the signal generator unit, and the other end is connected to the signal input ends KJB1 and KJB2 of the signal processing module to be tested, and one end of the normally open contact of the relay J8 is connected to the +28V power supply, and the other end is connected to the signal input end TF of the signal processing module to be tested;

[0019] As a further preference, one end of the normally open contacts of the relays J1 and J2 is grounded through a resistor respectively, and the other end of the normally open contacts of the relays J1 and J2 is connected to two voltage output ends of the signal processing module to be tested respectively, for measuring the load capacity of the signal processing module to be tested.

[0020] As a further preference, the output channel switching unit includes relays J10~J15, one end of the coils of relays J10~J15 are respectively connected to a 5V power supply, the other end of the coils of relays J10~J15 are respectively connected to the output end of the corresponding Darlington tube driver, one end of two pairs of normally open contacts of relays J10~J15 are respectively connected to a group of output ends of the signal processing module to be tested, and the other end of the two pairs of normally open contacts of relays J10~J15 are respectively connected to and lead out a first test end and a second test end.

[0021] As a further preference, the analog voltage acquisition unit includes six voltage-dividing circuits, each of which is composed of two voltage-dividing resistors connected in series and one end is grounded, wherein the other ends of two of the voltage-dividing circuits are respectively connected to the first test end and the second test end, and the other ends of the remaining four voltage-dividing circuits are respectively connected to the output end of the signal processing module to be tested.

[0022] As a further preference, the communication unit adopts a CH340T communication chip.

[0023] The beneficial effects of the utility model are:

[0024] 1. Since the main control unit is controlled by a single-chip microcomputer, the input end of the signal generator unit is connected to the three output pins of the single-chip microcomputer in a one-to-one correspondence, and the output end is connected to the signal input end of the signal processing module to be tested through the input channel switching unit. The signal generator unit is controlled by the single-chip microcomputer according to the instructions of the host computer to send out a variety of TTL signals with different pulse widths, which reduces the chance of mechanical adjustment and will not cause mechanical aging over time. The actual test signal output is reliable and stable.

[0025] 2. Since the single-chip microcomputer is connected to the multiple relays of the input channel switching unit and the output channel switching unit respectively through the Darlington tube driver, it is used to control the operation of the corresponding relays in the input channel switching unit and the output channel switching unit; therefore, the switching test channel can be conveniently set, and the channel selection can be completed as long as an instruction is issued in the host computer, which greatly facilitates the channel switching work.

[0026] 3. Since the main control unit is controlled by a single-chip microcomputer, the test speed and test accuracy are greatly improved. The test speed can fully meet the test requirements, and the low-temperature parameter test of the module to be tested can be completed well, avoiding the confusion of connecting wires that is prone to occur in the traditional method of building a test system with instruments. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 It is a circuit block diagram of the utility model.

[0028] Figure 2 It is a circuit schematic diagram of the utility model.

[0029] Figure 3 It is the circuit schematic diagram of the signal generator unit.

[0030] Figure 4 It is the circuit schematic diagram of the signal conversion circuit.

[0031] Figure 5 This is the circuit schematic diagram of the input channel switching unit.

[0032] Figure 6 This is the circuit schematic diagram of the output channel switching unit.

[0033] Figure 7 It is the circuit schematic diagram of the signal processing module to be tested.

[0034] Figure 8 It is the circuit schematic diagram of the analog voltage acquisition unit.

[0035] Fig. 9 This is the circuit schematic of the main control unit.

[0036] Fig.10It is the circuit schematic diagram of the communication unit.

[0037] In the figure: power supply unit 1, main control unit 2, communication unit 3, signal generator unit 4, analog voltage acquisition unit 5, input channel switching unit 6, output channel switching unit 7, signal processing module 8, host computer 9. DETAILED DESCRIPTION

[0038] like Figure 1-Figure 2 As shown, the utility model relates to a signal processing module test system, including a power supply unit 1, a main control unit 2, a signal generator unit 4, a communication unit 3, an analog voltage acquisition unit 5, an input channel switching unit 6 and an output channel switching unit 7, wherein the power supply unit 1 includes LM7805 and LM7815 voltage regulator chips, which are used to convert the input +28V power supply into +5V and +15V power supplies respectively. The power output end of the power supply unit 1 is electrically connected to the power input end of the main control unit 2, the signal generator unit 4, the input channel switching unit 6 and the output channel switching unit 7 respectively, so as to provide working power to each unit.

[0039] like Fig. 9 As shown, the main control unit 2 includes a single-chip microcomputer and a Darlington tube driver, wherein the model of the single-chip microcomputer is STC15w4k16s4; the Darlington tube driver adopts ULN2803 and the number is two, and the two Darlington tube drivers are respectively connected to the output pins of the single-chip microcomputer. The single-chip microcomputer is respectively connected to the multiple relays of the input channel switching unit 6 and the output channel switching unit 7 through the Darlington tube driver, and is used to control the operation of the corresponding relays in the input channel switching unit 6 and the output channel switching unit 7.

[0040] like Figure 3-Figure 4 As shown, the input end of the signal generator unit 4 is connected to the three output pins of the single-chip microcomputer in a one-to-one correspondence, and the output end is connected to the signal input end of the signal processing module 8 to be tested through the input channel switching unit 6, which is used to convert the TTL signal with an amplitude value of 5V into a TTL signal with an amplitude value of 15V, providing a signal source for the signal processing module 8 to be tested.

[0041] The signal generator unit 4 includes three signal conversion circuits, the input ends of the three signal conversion circuits are respectively connected to the three output pins P3.2, P3.3, and P3.4 of the single chip microcomputer, each signal conversion circuit includes transistors Q1, Q2 and a waveform shaping chip, the transistors Q1 and Q2 are C8050 transistors and C8550 transistors respectively, and the waveform shaping chip is CD4081;

[0042] The base of the transistor Q1 of the first signal conversion circuit leads to the input end through the resistor R1, the base and emitter of the transistor Q2 are connected to the collector of the transistor Q1 through the resistors R3 and R4 respectively, the collector of the transistor Q1 is connected to the resistor R2, the resistors R3 and R4 are connected in parallel to the other end of the resistor R2, the collector of the transistor Q2 is connected to the input end of the corresponding waveform shaping chip through the resistor R6, the resistor R6 is close to one end of the waveform shaping chip and is grounded through the resistor R5, and the first output end KF1 / KF2 is led out through the output pin of the waveform shaping chip Pulse.

[0043] The second signal conversion circuit and the third signal conversion circuit have the same structure as the first signal conversion circuit, and the second output terminals KB1 / KB2 are respectively led out through the output pins of the corresponding waveform shaping chip. Pulse and the third output terminal KJB1 / KJB2 Pulse.

[0044] like Figure 5 As shown, the input channel switching unit 6 includes relays J1-J9, one end of the coils of the relays J1-J9 is respectively connected to a 5V power supply, the other end of the coils of the relays J1-J9 is respectively connected to the output end of the corresponding Darlington tube driver, one end of the normally open contacts of the relays J4 and J7 is respectively connected to the first output end of the signal generator unit 4, and the other end is respectively connected to the signal input ends KF1 and KF2 of the signal processing module 8 to be tested, one end of the normally open contacts of the relays J6 and J9 is respectively connected to the second output end of the signal generator unit 4, and the other end is respectively connected to the signal input ends KB1 and KB2 of the signal processing module 8 to be tested, one end of the normally open contact of the relay J5 is connected to the third output end of the signal generator unit 4, and the other end is connected to the signal input ends KJB1 and KJB2 of the signal processing module 8 to be tested, and one end of the normally open contact of the relay J8 is connected to the +28V power supply, and the other end is connected to the signal input end TF of the signal processing module 8 to be tested;

[0045] One end of the normally open contacts of the relays J1 and J2 is grounded through a resistor R19 and R20 respectively, and the other end of the normally open contacts of the relays J1 and J2 is connected to the two voltage output terminals OUT-15V and OUT-5V of the signal processing module 8 to be tested, respectively, for measuring the load capacity of the signal processing module 8 to be tested.

[0046] like Figure 6As shown, the output channel switching unit 7 includes relays J10-J15, one end of the coils of the relays J10-J15 is respectively connected to a 5V power supply, the other end of the coils of the relays J10-J15 is respectively connected to the output end of the corresponding Darlington tube driver, one end of the two pairs of normally open contacts of the relay J10 is respectively connected to a group of output ends OJB1A and OJB1B of the signal processing module 8 to be tested, one end of the two pairs of normally open contacts of the relay J11 is respectively connected to a group of output ends OF2A and OF2B of the signal processing module 8 to be tested, and one end of the two pairs of normally open contacts of the relay J12 is respectively connected to To a group of output terminals OB1A and OB1B of the signal processing module 8 to be tested, one end of the two pairs of normally open contacts of the relay J13 are respectively connected to a group of output terminals OB2A and OB2B of the signal processing module 8 to be tested, one end of the two pairs of normally open contacts of the relay J14 are respectively connected to a group of output terminals OF1A and OF1B of the signal processing module 8 to be tested, one end of the two pairs of normally open contacts of the relay J15 are respectively connected to a group of output terminals OJB2A and OJB2B of the signal processing module 8 to be tested; the other ends of the two pairs of normally open contacts of the relays J10~J15 are respectively connected to and lead out the first test terminal OJB OBOF-A and the second test terminal OJB OB OF-B.

[0047] The input end of the analog voltage acquisition unit 5 is connected to the output end of the signal processing module 8 to be tested through the output channel switching unit 7, and the output end of the analog voltage acquisition unit 5 is correspondingly connected to the input pin of the single-chip microcomputer, which is used to convert the output high voltage signal into a voltage signal within 5V that can be recognized by the single-chip microcomputer, and input the processed voltage signal to the main control unit 2 for voltage measurement.

[0048] like Figure 7-8 As shown, the analog voltage acquisition unit 5 includes six voltage-dividing circuits, each of which is composed of two voltage-dividing resistors connected in series and one end is grounded, wherein the other ends of the two voltage-dividing circuits are respectively connected to the first test end OJB OB OF-A and the second test end OJB OB OF-B, and the other ends of the remaining four voltage-dividing circuits are respectively connected to the output ends BT, OUT-15V, CBP and OUT-5V of the signal processing module 8 to be tested, and signal output ends P1.1~P1.6 are respectively led out between the two voltage-dividing resistors of the six voltage-dividing circuits and are respectively connected to the input pins P1.1~P1.6 of the microcontroller in a one-to-one correspondence.

[0049] like Fig.10 As shown, the communication unit 3 adopts a CH340T communication chip, and the communication unit 3 is correspondingly connected to the output pins P3.0 and P3.1 of the single chip microcomputer of the main control unit 2, and is used to upload the collected voltage signal and time signal to the host computer 9.

[0050] When testing, the process is as follows:

[0051] 1. The host computer 9 controls the main control unit 2 to send a 5V TTL signal to the signal generator unit 4. The signal generator unit 4 converts the 5V TTL signal into a 15V TTL signal and performs a certain shaping on the input waveform to provide a good output waveform signal.

[0052] 2. Then the main control unit 2 sends a low-level signal to the specified relays J4~J9 in the input channel switching unit 6 through the Darlington tube driver, so that the relays J4~J9 are activated and the TTL signal and 28V power supply signal output by the signal generator unit 4 are transmitted to the signal input terminal corresponding to the signal processing module to be tested.

[0053] 3. The main control unit 2 sends a low-level signal to the specified relays J1~J2 in the input channel switching unit 6 through the Darlington tube driver, and the two voltage output terminals OUT-15V and OUT-5V of the signal processing module to be tested are grounded through resistors R19 and R20 respectively. The voltage signals of the signal output terminals P1.2 and P1.4 of the two voltage divider circuits in the analog voltage acquisition unit 5 are collected by the single-chip microcomputer, so as to test the load capacity of the two voltage output terminals of the signal processing module to be tested.

[0054] 4. The main control unit 2 sends a low-level signal to the specified relays J10~J15 in the output channel switching unit 7 through the Darlington tube driver, controls the corresponding relays J10~J15 to operate, so that the multiple groups of output terminals of the signal processing module to be tested are output to the analog voltage acquisition unit 5 through the output channel switching unit 7 respectively. The voltage signals of the signal output terminals P1.5 and P1.6 of the two voltage divider circuits in the analog voltage acquisition unit are collected by the single-chip microcomputer, so as to test the voltage parameters and time parameters of the multiple groups of output terminals of the signal processing module to be tested.

[0055] Although the implementation scheme of the utility model has been disclosed as above, it is not limited to the applications listed in the specification and implementation modes. It can be fully applied to various fields suitable for the utility model. For those familiar with the art, additional modifications can be easily implemented. Therefore, without departing from the general concept defined by the claims and the scope of equivalents, the utility model is not limited to the specific details and the illustrations shown and described herein.

Claims

1. A signal processing module testing system, characterized in that: It includes a power supply unit, a main control unit, a signal generator unit, a communication unit, an analog voltage acquisition unit, an input channel switching unit and an output channel switching unit, wherein the power output end of the power supply unit is electrically connected to the main control unit, the signal generator unit, the input channel switching unit and the output channel switching unit, respectively, for providing working power to them; The main control unit includes a single-chip microcomputer and a Darlington tube driver, wherein the single-chip microcomputer is respectively connected to a plurality of relays of the input channel switching unit and the output channel switching unit through the Darlington tube driver, and is used to control the operation of the corresponding relays in the input channel switching unit and the output channel switching unit; The input end of the signal generator unit is connected to the three output pins of the single-chip microcomputer in a one-to-one correspondence, and the output end is connected to the signal input end of the signal processing module to be tested through the input channel switching unit, and is used to convert the TTL signal with an amplitude value of 5V into a TTL signal with an amplitude value of 15V, so as to provide a signal source for the signal processing module to be tested; The input end of the analog voltage acquisition unit is connected to the output end of the signal processing module to be tested through the output channel switching unit, and the output end of the analog voltage acquisition unit is correspondingly connected to the input pin of the single-chip microcomputer, which is used to convert the output high voltage signal into a voltage signal within 5V that can be recognized by the single-chip microcomputer, and input the processed voltage signal to the main control unit for voltage measurement; The communication unit is correspondingly connected to the output pins of the main control unit and is used to upload the collected voltage signal and time signal to the host computer.

2. A signal processing module testing system according to claim 1, characterized in that: The single chip microcomputer is STC15w4k16s4; the Darlington transistor driver is ULN2803.

3. A signal processing module testing system according to claim 1, characterized in that: The signal generator unit includes three signal conversion circuits, the input ends of the three signal conversion circuits are respectively connected to the three output pins P3.2, P3.3, and P3.4 of the single-chip computer. Each signal conversion circuit includes transistors Q1, Q2, and a waveform shaping chip. The base of the transistor Q1 is respectively led out of the input end through a resistor, the base and emitter of the transistor Q2 are respectively connected to the collector of the transistor Q1 through a resistor, and the collector of the transistor Q2 is connected to the input end of the corresponding waveform shaping chip through a resistor, and the output is respectively output through the output pins of the waveform shaping chip.

4. A signal processing module testing system according to claim 3, characterized in that: The transistors Q1 and Q2 are C8050 transistors and C8550 transistors respectively, and the waveform shaping chip is CD4081.

5. A signal processing module testing system according to claim 1, characterized in that: The input channel switching unit includes relays J1-J9, one end of the coils of the relays J1-J9 is respectively connected to a 5V power supply, the other end of the coils of the relays J1-J9 is respectively connected to the output end of the corresponding Darlington tube driver, one end of the normally open contacts of the relays J4 and J7 is respectively connected to the first output end of the signal generator unit, and the other end is respectively connected to the signal input ends KF1 and KF2 of the signal processing module to be tested, one end of the normally open contacts of the relays J6 and J9 is respectively connected to the second output end of the signal generator unit, and the other end is respectively connected to the signal input ends KB1 and KB2 of the signal processing module to be tested, one end of the normally open contact of the relay J5 is connected to the third output end of the signal generator unit, and the other end is connected to the signal input ends KJB1 and KJB2 of the signal processing module to be tested, and one end of the normally open contact of the relay J8 is connected to the +28V power supply, and the other end is connected to the signal input end TF of the signal processing module to be tested.

6. A signal processing module testing system according to claim 5, characterized in that: One end of the normally open contacts of the relays J1 and J2 is grounded through a resistor respectively, and the other end of the normally open contacts of the relays J1 and J2 is connected to two voltage output terminals of the signal processing module to be tested respectively, so as to measure the load capacity of the signal processing module to be tested.

7. A signal processing module testing system according to claim 1, characterized in that: The output channel switching unit includes relays J10~J15, one end of the coils of relays J10~J15 is respectively connected to a 5V power supply, the other end of the coils of relays J10~J15 is respectively connected to the output end of the corresponding Darlington tube driver, one end of two pairs of normally open contacts of relays J10~J15 is respectively connected to a group of output ends of the signal processing module to be tested, and the other end of the two pairs of normally open contacts of relays J10~J15 is respectively connected to and leads to a first test end and a second test end.

8. A signal processing module testing system according to claim 7, characterized in that: The analog voltage acquisition unit includes six voltage-dividing circuits, each of which is composed of two voltage-dividing resistors connected in series and one end of which is grounded. The other ends of two of the voltage-dividing circuits are respectively connected to the first test end and the second test end, and the other ends of the remaining four voltage-dividing circuits are respectively connected to the output end of the signal processing module to be tested.

9. A signal processing module testing system according to claim 1, characterized in that: The communication unit adopts CH340T communication chip.

Images