Chip aging test device

Abstract

The utility model discloses a chip aging test device which comprises a test box body, an adjusting bin is arranged on the inner side wall of the test box body, a temperature and humidity adjusting device is arranged in the adjusting bin, an exhaust port and an air duct are arranged on the inner side wall of the test box body, and the air duct is respectively communicated with the exhaust port and the adjusting bin. An opening is formed in the front side face of the test box body, a bearing structure is arranged in the test box body in a sliding mode and comprises a sealing plate and a limiting table, a mounting groove is formed in the limiting table, a test plate is arranged in the mounting groove in a sliding mode, limiting sliding grooves are formed in the opposite side walls in the test box body, and the limiting table is arranged in the limiting sliding grooves in a sliding mode. And a plurality of groups of test grooves are uniformly distributed in the test plate. The utility model relates to the technical field of chip aging test, and specifically provides a chip aging test device.

Description

Technical Field

[0001] The utility model relates to the technical field of chip aging test, in particular to a chip aging test device. Background Art

[0002] With the rapid development of semiconductor technology and the increasing complexity of chips, chip testing runs through the entire design, development and production process. High temperature aging test is an important test, which aims to predict the service life of the product and evaluate the durability of the predicted chip.

[0003] The chip aging test device can simulate a high-temperature environment to perform aging tests on chips. The existing test device has uneven internal heating when placing multiple layers of products, which affects the test accuracy. In addition, the chip installation and placement process is carried out in a small space in the test box, which is inconvenient to operate. Utility Model Content

[0004] The technical problem to be solved by the utility model is that when placing multi-layer test chips, there is a temperature difference inside the aging test equipment, which affects the test accuracy. In addition, it is inconvenient to install the multi-layer chips in the test box.

[0005] The utility model provides the following technical solution: A chip aging test device proposed by the utility model includes a test box, the inner side wall of the test box is provided with an adjustment chamber, the adjustment chamber is provided with a temperature and humidity adjustment device, the inner side wall of the test box is provided with an exhaust port and an air duct, the air duct is respectively connected with the exhaust port and the adjustment chamber, the front side of the test box is open, and a bearing structure is slidably provided inside the test box.

[0006] Furthermore, the bearing structure includes a sealing plate and a limit platform, the limit platform is provided with an installation groove, a test plate is slidably arranged in the installation groove, the opposite side walls of the test box are provided with limit sliding grooves, the limit platform is slidably arranged in the limit sliding grooves, and a plurality of groups of test slots are evenly distributed in the test board.

[0007] Furthermore, a guide sleeve is provided at the bottom of the test box, a guide slide is provided at the bottom of the sealing plate, and one end of the guide slide is slidably disposed in the guide sleeve.

[0008] Furthermore, a positioning hole is provided at one end of the limit platform, and a spring pin corresponding to the positioning hole is provided at the bottom of the test plate.

[0009] Furthermore, the exhaust port, the limit platform and the test plate are each provided with a plurality of corresponding groups along the height direction.

[0010] Furthermore, a circulating air outlet is provided on the limiting platform, and an exhaust window is provided on the top of the test box.

[0011] Preferably, four groups of temperature and humidity sensors are provided at the four corners of the inner wall of the test box, a control display screen is provided on the side wall of the test box, and the temperature and humidity adjustment device and the temperature and humidity sensors are electrically connected to the control display screen.

[0012] The chip aging test device proposed by the utility model adopts the above structure to achieve the following beneficial effects:

[0013] (1) The exhaust port and circulating air port can ensure good circulation of internal temperature and humidity;

[0014] (2) The bearing structure and the test box are designed to be pull-out, which is convenient for opening and closing. The pull-out design of the test board and the limit table facilitates the installation of the test board, and the operation is simple and efficient;

[0015] (3) Temperature and humidity control equipment and temperature and humidity sensors cooperate to control and monitor the temperature and humidity of the internal space. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0017] Figure 1 The overall structure of a chip aging test device proposed by the utility model is shown in FIG. Figure 1 ;

[0018] Figure 2 The overall structure of a chip aging test device proposed by the utility model is shown in FIG. Figure 2 ;

[0019] Figure 3 The overall structure of a chip aging test device proposed by the utility model is shown in FIG. Figure 3 ;

[0020] Figure 4 The overall structure of a chip aging test device proposed by the utility model is shown in FIG. Figure 4 ;

[0021] Figure 5 This is a schematic diagram of the internal structure of a test box of a chip aging test device proposed by the utility model;

[0022] Figure 6 for Figure 2 A partial enlarged schematic diagram of part A.

[0023] Among them, 1. test box, 2. adjustment chamber, 3. temperature and humidity adjustment equipment, 4. exhaust port, 5. air duct, 6. bearing structure, 7. sealing plate, 8. limit table, 9. installation groove, 10. test plate, 11. limit slide groove, 12. test groove, 13. guide sleeve rod, 14. guide slide rod, 15. positioning hole, 16. circulation air outlet, 17. exhaust window, 18. temperature and humidity sensor, 19. control display screen, 20. spring pin. DETAILED DESCRIPTION

[0024] The technical solutions in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all of the embodiments; based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the utility model.

[0025] It should be noted that the words "front", "rear", "left", "right", "up" and "down" used in the following description refer to directions in the drawings, and the words "inside" and "outside" refer to directions toward or away from the geometric center of a specific component, respectively.

[0026] like Figures 1 to 6 As shown, the technical solution adopted by the utility model is as follows: a chip aging test device includes a test box 1, the inner side wall of the test box 1 is provided with an adjustment chamber 2, the adjustment chamber 2 is provided with a temperature and humidity adjustment device 3, the inner side wall of the test box 1 is provided with an exhaust port 4 and an air duct 5, the air duct 5 is respectively connected with the exhaust port 4 and the adjustment chamber 2, the front side of the test box 1 is open, a bearing structure 6 is slidably provided in the test box 1, a guide sleeve rod 13 is provided at the bottom of the test box 1, a guide slide rod 14 is provided at the bottom of the sealing plate 7, and one end of the guide slide rod 14 is slidably provided in the guide sleeve rod 13.

[0027] like Figure 3 , Figure 4 and Figure 6 As shown, the bearing structure 6 includes a sealing plate 7 and a limit platform 8, the limit platform 8 is provided with a mounting groove 9, a test plate 10 is slidably arranged in the mounting groove 9, the opposite side walls in the test box 1 are provided with a limiting slide groove 11, the limit platform 8 is slidably arranged in the limiting slide groove 11, a plurality of groups of test grooves 12 are evenly distributed in the test board 10, a positioning hole 15 is provided at one end of the limit platform 8, a spring pin 20 corresponding to the positioning hole 15 is provided at the bottom of the test board 10, a circulating air outlet 16 is provided on the limit platform 8, an exhaust window 17 is provided on the top of the test box 1, and the exhaust port 4, the limit platform 8 and the test board 10 are all provided with a plurality of groups correspondingly along the height direction.

[0028] Among them, four groups of temperature and humidity sensors 18 are arranged at the four corners of the inner wall of the test box 1 , a control display screen 19 is arranged on the side wall of the test box 1 , and the temperature and humidity adjustment device 3 and the temperature and humidity sensors 18 are electrically connected to the control display screen 19 .

[0029] During specific use, the chip to be tested is installed in the test slot 12 on the test board 10, connected and fixed with the limit platform 8 through the installation slot 9, and limited by the spring pin 20. The installation is convenient, and the sealing plate 7 is pushed to make the limit platform 8 enter the inside of the test box 1, and the temperature and humidity adjustment device 3 is started. The temperature and humidity of the internal space are regulated by the exhaust port 4 and the air duct 5. The circulating air port 16 can make the internal temperature circulate evenly, and the four groups of temperature and humidity sensors 18 are set to monitor the temperature and humidity at the four corners inside the test box 1.

[0030] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, material or apparatus including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, material or apparatus.

[0031] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A chip aging test device, comprising a test box, an inner side wall of the test box is provided with an adjustment chamber, a temperature and humidity adjustment device is provided in the adjustment chamber, an inner side wall of the test box is provided with an exhaust port and an air duct, the air duct is respectively connected to the exhaust port and the adjustment chamber, and is characterized in that: The front side of the test box is open, and a bearing structure is slidably arranged inside the test box.

2. A chip aging test device according to claim 1, characterized in that: The bearing structure includes a sealing plate and a limit platform, the limit platform is provided with an installation groove, a test plate is slidably arranged in the installation groove, the opposite side walls of the test box are provided with limit sliding grooves, the limit platform is slidably arranged in the limit sliding grooves, and a plurality of groups of test slots are evenly distributed in the test board.

3. A chip aging test device according to claim 2, characterized in that: A guide sleeve rod is provided at the bottom of the test box body, a guide slide rod is provided at the bottom of the sealing plate, and one end of the guide slide rod is slidably arranged in the guide sleeve rod.

4. A chip aging test device according to claim 3, characterized in that: A positioning hole is provided at one end of the limit platform, and a spring pin corresponding to the positioning hole is provided at the bottom of the test plate.

5. A chip aging test device according to claim 4, characterized in that: The exhaust port, the limit platform and the test plate are each provided with a plurality of corresponding groups along the height direction.

6. A chip aging test device according to claim 5, characterized in that: The limiting platform is provided with a circulating air outlet, and the top of the test box is provided with an exhaust window.

7. A chip aging test device according to claim 6, characterized in that: Four groups of temperature and humidity sensors are arranged at the four corners of the inner wall of the test box, a control display screen is arranged on the side wall of the test box, and the temperature and humidity regulating device and the temperature and humidity sensors are electrically connected to the control display screen.

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