Integrated circuit test socket

Abstract

The utility model discloses an integrated circuit test seat, and belongs to the technical field of integrated circuit test. An integrated circuit test seat comprises an operation table and a test table, the top of the test table is fixedly connected with a vertical plate, the interior of the vertical plate is rotatably connected with an internal thread pipe, the internal thread pipe is internally provided with a movable rod, and one end of the movable rod is rotatably connected with a clamping plate. According to the integrated circuit test seat, after an integrated circuit board to be tested is placed on a test bench, a user presses a pressing block, so that an external thread on the outer side of a strip-shaped sliding block is separated from an internal thread pipe, at the moment, the user can directly move a clamping plate back and forth through a movable rod until the clamping plate abuts against the integrated circuit board, and then the pressing block is loosened; and the elastic force of the spring drives the strip-shaped sliding block to slide in the direction away from the spring, so that the external thread is engaged with the internal thread pipe again, and finally, the user only needs to screw the movable rod at a small angle to drive the clamping plate to finally clamp and fix the integrated circuit board, so that the speed is higher.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated circuit testing, and more specifically to an integrated circuit testing socket. Background Art

[0002] An integrated circuit is a miniature electronic device or component that uses a certain process to interconnect the transistors, resistors, capacitors, inductors and other components and wiring required in a circuit. It is made on a small piece or several small pieces of semiconductor chips or dielectric substrates, and then packaged in a tube shell to become a miniature structure with the required circuit function. All components have formed a whole in structure, making a major step forward in the direction of miniaturization, low power consumption, intelligence and high reliability of electronic components.

[0003] A Chinese patent discloses "an integrated circuit test socket" with patent number CN202223224011.7. The scheme records "an integrated circuit test socket, relating to the field of integrated circuit testing technology, comprising an operating table, a lifting slot is provided at the top of the operating table, a lifting mechanism is provided inside the lifting slot, a base is fixedly connected to the bottom end of the lifting slot, and slide slots are provided at the top of the base near both sides." The device starts two rotating motors on the base and controls the number of rotations of the rotating motors, thereby driving the two positive and negative lead screws at one end of the rotating motor to rotate in the slide slots, so that the two threaded sliders on the positive and negative lead screws can move relative to each other. Under the active connection between the first movable part and the second movable part, the hinge rod is adjusted in angle, thereby adjusting the height of the test bench, which is conducive to driving the test bench to adjust to a fixed height under the rotation control of the rotating motor, so that the probe feet can test the integrated circuit board under the fixed support of the support rod and the test top plate, but there are still certain problems.

[0004] The device clamps and fixes the integrated circuit board by driving the clamping plate to move forward and backward by screwing the threaded rod, and can clamp and fix integrated circuit boards of different sizes. After the test of the integrated circuit board with smaller specifications is completed, the user needs to adjust the distance between the clamping plates on both sides to be far enough to put down the integrated circuit board with larger specifications. Conversely, after the test of the integrated circuit board with larger specifications is completed, the user needs to adjust the distance between the clamping plates on both sides to be close enough to put down the integrated circuit board with smaller specifications. The adjustment of the clamping plates requires the user to screw the threaded rod multiple times, which is inconvenient to operate. Utility Model Content

[0005] The purpose of the utility model is to provide an integrated circuit test socket to solve the problems raised in the above background technology:

[0006] When the test of the integrated circuit board with smaller specifications is completed, the user needs to adjust the distance between the clamping plates on both sides to be far enough to put down the integrated circuit board with larger specifications. Conversely, when the test of the integrated circuit board with larger specifications is completed, the user needs to adjust the distance between the clamping plates on both sides to be close enough to put down the integrated circuit board with smaller specifications. The adjustment of the clamping plates requires the user to screw the threaded rod multiple times, which is inconvenient to operate.

[0007] In order to achieve the above purpose, the utility model provides the following technical solutions:

[0008] The cam is provided with a plurality of movable plates, each of which is provided with a plurality of movable plates, and the movable plates are provided with a plurality of movable plates at a plurality of positions.

[0009] Preferably, a pressing block is fixedly connected to a side of the exterior of the strip-shaped sliding block close to the rotating handle, and the pressing block facilitates the user to press the strip-shaped sliding block.

[0010] Preferably, there are two strip grooves, which are symmetrically distributed. The two strip grooves opened on the movable rod are distributed at two different positions opposite to each other, and the external threads on the two strip sliders are engaged with the internal threaded tube.

[0011] Preferably, the outer wall of the strip slider fits with the inner wall of the strip groove, which can ensure that the strip slider and the strip groove fit closely and slide up and down smoothly; the lower surface of the clamping plate fits with the upper surface of the test bench, and the clamping plate is slidably connected to the test bench. The clamping plate is a rectangular structure, and the lower surface of the clamping plate fits with the upper surface of the test bench. When the user rotates the movable rod, the clamping plate can be driven close to or away from the integrated circuit board.

[0012] Preferably, an electric push rod is fixedly connected to the inside of the operating table, the test table is fixedly connected to the output end of the electric push rod, a sleeve is fixedly connected to the inside of the operating table and below the test table, a sliding rod is slidably connected to the inside of the sleeve, the sliding rod is fixedly connected to the test table, the up and down movement of the test table is controlled by the electric push rod, the sleeve cooperates with the sliding rod to ensure the stability of the test table when it moves up and down, and four groups of sleeves and sliding rods are distributed at the four corners below the test table.

[0013] Preferably, the top of the operating table is fixedly connected to a support rod, the outside of the support rod is rotatably connected to a test top plate, the top of the test top plate is provided with a probe pin, the inside of the support rod is slidably connected to a limit rod, and a limit groove is provided on the inside of the test top plate close to the support rod, the limit groove is used in conjunction with the limit rod, the limit rod passes through the support rod and is combined with the limit groove on one side of the test top plate, the limit rod and the support rod are positioned at ninety degrees, and when the limit rod is combined with the limit groove, the test top plate and the support rod are also positioned at ninety degrees, the limit rod and the limit groove are tightly matched to ensure the stability between the test top plate and the support rod.

[0014] Preferably, the limiting rod is a U-shaped structure, and the limiting rod of the U-shaped structure enables it to limit the position between the test top plate and the support rod from two different positions.

[0015] Compared with the prior art, the beneficial effects of the utility model are:

[0016] 1) When the integrated circuit test socket is in use, after the integrated circuit board to be tested is placed on the test bench, the user presses the pressure block so that the external thread on the outside of the strip slider is disengaged from the internal thread tube. At this time, the user can directly move the clamping plate back and forth through the movable rod until the clamping plate is against the integrated circuit board, and then release the pressure block. The spring force drives the strip slider to slide away from the spring, so that the external thread and the internal thread tube are engaged again. If they cannot be engaged at once, the user can adjust the external thread to a position matching the internal thread tube by twisting the movable rod in the forward and reverse directions at a small angle. Finally, the user only needs to twist the movable rod at a small angle to drive the clamping plate to finally clamp and fix the integrated circuit board. Compared with the traditional method of driving the clamping plate to move with the threaded rod, the operation is faster.

[0017] 2) When the integrated circuit test socket is in use, if the probe pins need to be checked, the user pulls the limit rod on the support rod to separate the limit rod from the limit groove on one side of the test top plate, thereby releasing the limit rod from limiting the test top plate. The user can then rotate the test top plate upward until the probe pins are exposed. At this time, the user can check the probe pins without having to squat. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1It is a schematic diagram of the overall structure of the utility model;

[0019] Figure 2 It is a structural schematic diagram of the limit rod of the utility model;

[0020] Figure 3 It is a cross-sectional schematic diagram of the movable rod of the utility model;

[0021] Figure 4 It is a structural schematic diagram of the external thread of the utility model.

[0022] Explanation of the numbers in the figure: 1. Operating table; 2. Test table; 3. Vertical plate; 4. Internally threaded pipe; 5. Movable rod; 6. Strip groove; 7. Strip slider; 8. Spring; 9. External thread; 10. Clamping plate; 11. Handle; 12. Pressure block; 13. Electric push rod; 14. Sleeve; 15. Sliding rod; 16. Support rod; 17. Test top plate; 18. Probe foot; 19. Limit rod; 20. Limit groove. DETAILED DESCRIPTION

[0023] Example 1

[0024] In some existing integrated circuit test sockets, after the test of the integrated circuit board with smaller specifications is completed, the user needs to adjust the distance between the clamping plates 10 on both sides to be far enough to place the integrated circuit board with larger specifications. Conversely, after the test of the integrated circuit board with larger specifications is completed, the user needs to adjust the distance between the clamping plates 10 on both sides to be close enough to place the integrated circuit board with smaller specifications. The adjustment of the clamping plates 10 requires the user to screw the threaded rod multiple times, which is inconvenient to operate. The following solution is used to solve this problem.

[0025] See also Figures 1 to 4 The top of the test bench 2 is fixedly connected with a vertical plate 3, and the internal rotation of the vertical plate 3 is connected with an internal threaded tube 4. A movable rod 5 is arranged inside the internal threaded tube 4, and one end of the movable rod 5 is rotatably connected with a clamping plate 10, and the other end of the movable rod 5 is fixedly connected with a rotating handle 11, which is convenient for the user to screw the movable rod 5; a strip groove 6 is opened inside the movable rod 5, and a strip slider 7 is slidably connected inside the strip groove 6. A spring 8 is arranged between the strip slider 7 and the strip groove 6, one end of the spring 8 is fixedly connected to the movable rod 5, and the other end of the spring 8 is fixedly connected to the strip slider 7, and an external thread 9 is arranged on the side of the outer side of the strip slider 7 away from the spring 8, and the external thread 9 is meshed with the internal threaded tube 4. Due to the elastic force of the spring 8, the external thread 9 on the strip slider 7 will always remain in a state of meshing with the internal threaded tube 4, and when the user screws the movable rod 5, the clamping plate 10 can be driven to move.

[0026] A pressing block 12 is fixedly connected to one side of the outer portion of the strip-shaped slider 7 close to the rotating handle 11 , and the pressing block 12 facilitates the user to press the strip-shaped slider 7 .

[0027] There are two strip grooves 6 , which are symmetrically distributed. The two strip grooves 6 opened on the movable rod 5 are distributed at two different positions opposite to each other. Correspondingly, the external threads 9 on the two strip sliders 7 are engaged with the internal threaded tube 4 .

[0028] The outer wall of the strip slider 7 fits with the inner wall of the strip groove 6, which can ensure that the strip slider 7 and the strip groove 6 are closely matched and slide up and down smoothly; the lower surface of the clamping plate 10 fits with the upper surface of the test bench 2, and the clamping plate 10 is slidably connected to the test bench 2. The clamping plate 10 is a rectangular structure, and the lower surface of the clamping plate 10 fits with the upper surface of the test bench 2. When the user rotates the movable rod 5, the clamping plate 10 can be driven to approach or move away from the integrated circuit board, thereby clamping and releasing the integrated circuit board.

[0029] An electric push rod 13 is fixedly connected inside the operating table 1, and the test table 2 is fixedly connected to the output end of the electric push rod 13. A sleeve 14 is fixedly connected inside the operating table 1 and below the test table 2. A sliding rod 15 is slidably connected inside the sleeve 14. The sliding rod 15 is fixedly connected to the test table 2. The up and down movement of the test table 2 is controlled by the electric push rod 13. The sleeve 14 cooperates with the sliding rod 15 to ensure the stability of the test table 2 when it moves up and down. Four groups of sleeves 14 and sliding rods 15 are provided, which are distributed at the four corners below the test table 2.

[0030] The use steps of the utility model are as follows: when the integrated circuit test socket is in use, after the integrated circuit board to be tested is placed on the test bench 2, the user presses the pressing block 12, and the pressing block 12 drives the strip slide block 7 in the strip groove 6 to slide in the direction close to the spring 8, and compresses the spring 8, and at the same time drives the external thread 9 on the outer side of the strip slide block 7 to separate from the internal thread tube 4. At this time, the user can directly move the clamping plate 10 back and forth through the movable rod 5 until the clamping plate 10 abuts against the integrated circuit board, and then releases the pressing block 12, and the elastic force of the compressed spring 8 drives the strip slide block 7 to move away from the spring The outer thread 9 and the inner thread tube 4 can be meshed again by the user by twisting the movable rod 5 in a small angle in the forward and reverse directions. Finally, the user only needs to twist the movable rod 5 in a small angle to drive the clamping plate 10 to finally clamp and fix the integrated circuit board. The same operation is used to release the clamping of the integrated circuit board. After pressing the pressing block 12, the movable rod 5 can be pulled away from the integrated circuit board. Compared with the traditional method of driving the clamping plate 10 to move with the traditional threaded rod, the operation is faster.

[0031] Example 2

[0032] In some existing integrated circuit test sockets, the probe pins 18 used to test the integrated circuit board are directly fixed on the test top plate 17, and the test top plate 17 is directly fixed to the operating table 1 through the support rod 16. If the user needs to check the probe pins 18, it will be blocked by the test top plate 17, resulting in the user having to check the probe pins 18 in a squatting posture, which is inconvenient. The following solution is used to solve this problem.

[0033] See also Figure 2 The difference in the basis of the combined implementation is that a support rod 16 is fixedly connected to the top of the operating table 1, and the outside of the support rod 16 is rotatably connected to a test top plate 17. A probe foot 18 is arranged on the top of the test top plate 17, and the support rod 16 is internally slidably connected to a limit rod 19. A limit groove 20 is provided on the inside of the test top plate 17 close to the support rod 16. The limit groove 20 is used in conjunction with the limit rod 19. The limit rod 19 passes through the support rod 16 and is combined with the limit groove 20 on one side of the test top plate 17, and the limit rod 19 passing through the support rod 16 is ninety degrees to the support rod 16. When the limit rod 19 is combined with the limit groove 20, the test top plate 17 and the support rod 16 are also ninety degrees apart. The limit rod 19 and the limit groove 20 are tightly matched to ensure the stability between the test top plate 17 and the support rod 16.

[0034] The limiting rod 19 is a U-shaped structure, and the U-shaped limiting rod 19 can limit the position between the test top plate 17 and the support rod 16 from two different positions. Correspondingly, there are also two limiting grooves 20 opened on the test top plate 17.

[0035] Usage steps of the utility model: When the integrated circuit test socket is in use, if it is necessary to check the probe pins 18, the user pulls the limit rod 19 on the support rod 16 to separate the limit rod 19 from the limit groove 20 on one side of the test top plate 17. Since the test top plate 17 can rotate on the support rod 16, when the limit rod 19 is separated from the limit groove 20, the user also releases the limit of the test top plate 17 by the limit rod 19, and then the user can rotate the test top plate 17 upward until the probe pins 18 are exposed. At this time, the user can check the probe pins 18 without squatting.

[0036] The above shows and describes the basic principle, main features and advantages of the utility model. Those skilled in the art should understand that the utility model is not limited by the above embodiments. The above embodiments and descriptions are only preferred examples of the utility model and are not used to limit the utility model. Without departing from the spirit and scope of the utility model, the utility model may have various changes and improvements, which fall within the scope of the utility model to be protected. The scope of protection of the utility model is defined by the attached claims and their equivalents.

Claims

1. An integrated circuit test socket, comprising an operating table (1) and a test table (2), wherein a vertical plate (3) is fixedly connected to the top of the test table (2), characterized in that: The interior of the vertical plate (3) is rotatably connected to an internal threaded tube (4), and a movable rod (5) is arranged inside the internal threaded tube (4). One end of the movable rod (5) is rotatably connected to a clamping plate (10), and the other end of the movable rod (5) is fixedly connected to a rotating handle (11). A strip groove (6) is provided inside the movable rod (5), and a strip slider (7) is slidably connected inside the strip groove (6). A spring (8) is arranged between the strip slider (7) and the strip groove (6), one end of the spring (8) is fixedly connected to the movable rod (5), and the other end of the spring (8) is fixedly connected to the strip slider (7). An external thread (9) is arranged on the side of the outside of the strip slider (7) away from the spring (8), and the external thread (9) is meshedly connected to the internal threaded tube (4).

2. An integrated circuit test socket according to claim 1, characterized in that: A pressing block (12) is fixedly connected to the outer side of the strip-shaped sliding block (7) close to the rotating handle (11).

3. The integrated circuit test socket according to claim 1, characterized in that: There are two strip-shaped grooves (6) in total, and the two strip-shaped grooves (6) are symmetrically distributed.

4. The integrated circuit test socket according to claim 1, characterized in that: The outer wall of the strip-shaped sliding block (7) fits with the inner wall of the strip-shaped groove (6), the lower surface of the clamping plate (10) fits with the upper surface of the test bench (2), and the clamping plate (10) is slidably connected to the test bench (2).

5. The integrated circuit test socket according to claim 1, characterized in that: An electric push rod (13) is fixedly connected inside the operating table (1), the test table (2) is fixedly connected to the output end of the electric push rod (13), a sleeve (14) is fixedly connected inside the operating table (1) and below the test table (2), a sliding rod (15) is slidably connected inside the sleeve (14), and the sliding rod (15) is fixedly connected to the test table (2).

6. The integrated circuit test socket according to claim 1, characterized in that: The top of the operating table (1) is fixedly connected to a support rod (16), the outside of the support rod (16) is rotatably connected to a test top plate (17), the top of the test top plate (17) is provided with a probe pin (18), the inside of the support rod (16) is slidably connected to a limit rod (19), a limit groove (20) is provided on one side of the inside of the test top plate (17) close to the support rod (16), and the limit groove (20) is used in conjunction with the limit rod (19).

7. An integrated circuit test socket according to claim 6, characterized in that: The limiting rod (19) is a U-shaped structure.

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