Flash memory particle testing device

Abstract

The utility model relates to the technical field of flash memory particles, in particular to a flash memory particle testing device which comprises a support, an upper gland and a lower gland, the support is arranged between the upper gland and the lower gland; an upper ejector pin module is arranged at the top of the support; a lower ejector pin module is arranged at the bottom of the support; the support is provided with a circuit board between the upper ejector pin module and the lower ejector pin module; the bottom of the upper ejector pin module is connected with the top of the circuit board; the top of the lower ejector pin module is connected with the bottom of the circuit board; the upper gland is provided with an upper pressing block matched with the top of the upper ejector pin module; the lower pressing cover is provided with a lower pressing block matched with the bottom of the lower ejector pin module. According to the utility model, after the upper gland and the lower gland are closed, a plurality of flash memory particles can be synchronously tested at the same time, and the flash memory particles are respectively tested at the top and the bottom of the support, so that the plurality of flash memory particles do not need to be tiled, the length of a bus line can be optimized, and the space is saved.

Description

Technical Field

[0001] The utility model relates to the technical field of flash memory particles, in particular to a flash memory particle testing device. Background Art

[0002] When flash memory particles are used as SSD solid state drives, in order to obtain a large-capacity SSD flash disk, 4 or 8 flash memory particles are often combined together; in order to detect whether the various performances of flash memory particles meet the standards during the R&D and production stages, such as disk capacity confirmation, H2 comparison, CDM speed, BI T aging, copy / read / delete file, data performance verification and other tests, the existing test fixture is to lay 4 or 8 test sockets flat on a plane (PCB bottom board), so that the routing length of the command bus and data bus of the flash memory particles increases several times compared with the actual application, which is different from the application scenarios of real applications and also has a considerable gap with the actual line architecture of SSD disks. As a result, the test results are inaccurate, and the speed is slowed down or the disk is dropped. Utility Model Content

[0003] The utility model aims to provide a flash memory particle testing device in view of the above-mentioned deficiencies in the prior art.

[0004] The purpose of the utility model is achieved through the following technical solutions: A flash memory particle testing device comprises a support, an upper pressure cover and a lower pressure cover; the support is arranged between the upper pressure cover and the lower pressure cover; an upper ejector module is arranged on the top of the support; a lower ejector module is arranged on the bottom of the support; a circuit board is arranged on the support between the upper ejector module and the lower ejector module;

[0005] The bottom of the upper ejector pin module is connected to the top of the circuit board; the top of the lower ejector pin module is connected to the bottom of the circuit board; the upper pressure cover is provided with an upper pressure block that cooperates with the top of the upper ejector pin module; the lower pressure cover is provided with a lower pressure block that cooperates with the bottom of the lower ejector pin module.

[0006] The utility model is further configured such that one end of the upper pressure cover is hinged to one end of the top of the support; and the other end of the upper pressure cover is detachably connected to the other end of the top of the support.

[0007] The utility model is further configured that the other end of the upper pressure cover is provided with a first clamping block; the other end of the top of the support is provided with a second clamping block clamped with the first clamping block.

[0008] The utility model is further configured such that one end of the lower pressure cover is hinged to one end of the bottom of the support; and the other end of the lower pressure cover is detachably connected to the other end of the bottom of the support.

[0009] The utility model is further configured that the other end of the lower pressure cover is provided with a third clamping block; the other end of the bottom of the support is provided with a fourth clamping block clamped with the third clamping block.

[0010] The utility model is further configured that a silica gel block is provided at the bottom of the upper pressing block and the top of the lower pressing block.

[0011] The utility model is further configured that a slot is provided on the top of the support; the upper ejector module is provided with a fixing plate; and the fixing plate is detachably connected to the slot.

[0012] The utility model is further configured that the support is provided with a receiving groove at the bottom of the groove; the circuit board is arranged in the receiving groove; and the circuit board is detachably connected to the receiving groove.

[0013] The utility model is further configured that a window is opened at the bottom of the support; and the lower ejector module is exposed at the window.

[0014] The beneficial effects of the utility model are as follows: after the upper pressure cover and the lower pressure cover are closed, the utility model can simultaneously perform synchronous tests on multiple flash memory particles, and because the flash memory particles are tested at the top and bottom of the support respectively, there is no need to lay the multiple flash memory particles flat, thereby optimizing the bus line length and saving space. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The utility model is further described using the accompanying drawings, but the embodiments in the accompanying drawings do not constitute any limitation to the utility model. A person skilled in the art can obtain other drawings based on the following drawings without creative work.

[0016] Figure 1 It is a structural schematic diagram of the utility model;

[0017] Figure 2 It is a structural schematic diagram of the utility model from another perspective;

[0018] Among them: 1. support; 11. slot; 12. accommodating groove; 13. window; 2. upper pressure cover; 21. upper pressure block; 22. silicone block; 3. lower pressure cover; 31. lower pressure block; 41. upper ejector pin module; 42. lower ejector pin module; 43. circuit board; 51. first card block; 52. second card block; 53. third card block; 54. fourth card block; 6. fixing plate. DETAILED DESCRIPTION

[0019] The utility model is further described in conjunction with the following embodiments.

[0020] Depend on Figure 1 to Figure 2It can be seen that the flash memory particle testing device described in this embodiment includes a support 1, an upper pressure cover 2 and a lower pressure cover 3; the support 1 is arranged between the upper pressure cover 2 and the lower pressure cover 3; the top of the support 1 is provided with an upper ejector module 41; the bottom of the support 1 is provided with a lower ejector module 42; the support 1 is provided with a circuit board 43 between the upper ejector module 41 and the lower ejector module 42;

[0021] The bottom of the upper ejector module 41 is connected to the top of the circuit board 43; the top of the lower ejector module 42 is connected to the bottom of the circuit board 43; the upper pressure cover 2 is provided with an upper pressure block 21 that cooperates with the top of the upper ejector module 41; the lower pressure cover 3 is provided with a lower pressure block 31 that cooperates with the bottom of the lower ejector module 42.

[0022] Specifically, when the flash memory particle testing device described in this embodiment is used, the flash memory particles are first placed in the upper ejector pin module 41, and then the upper pressure cover 2 is closed, and the flash memory particles and the upper ejector pin module 41 are pressed tightly by the upper pressure block 21; then other flash memory particles are placed in the lower ejector pin module 42, and then the lower pressure cover 3 is closed, and the flash memory particles and the lower ejector pin module 42 are pressed tightly by the lower pressure block 31.

[0023] After closing the upper cover 2 and the lower cover 3, multiple flash memory particles can be tested synchronously at the same time. Since the flash memory particles are tested at the top and bottom of the support 1 respectively, there is no need to lay the multiple flash memory particles flat, so that the bus line length can be optimized and space can be saved.

[0024] In the flash memory particle testing device described in this embodiment, one end of the upper pressure cover 2 is hinged to one end of the top of the support 1; the other end of the upper pressure cover 2 is detachably connected to the other end of the top of the support 1. Specifically, through the above arrangement, the upper pressure cover 2 can be opened and closed in a hinged manner, which is convenient for user operation.

[0025] In the flash memory particle testing device described in this embodiment, the other end of the upper pressure cover 2 is provided with a first clamping block 51; the other end of the top of the support 1 is provided with a second clamping block 52 that is clamped with the first clamping block 51. Specifically, through the above arrangement, the support 1 and the upper pressure cover 2 are conveniently fixed and separated.

[0026] In the flash memory particle testing device described in this embodiment, one end of the lower pressure cover 3 is hinged to one end of the bottom of the support 1; the other end of the lower pressure cover 3 is detachably connected to the other end of the bottom of the support 1. Specifically, through the above arrangement, the lower pressure cover 3 can be opened and closed in a hinged manner, which is convenient for user operation.

[0027] In the flash memory particle testing device described in this embodiment, the other end of the lower cover 3 is provided with a third clamping block 53; the other end of the bottom of the support 1 is provided with a fourth clamping block 54 that is clamped with the third clamping block 53. Specifically, through the above arrangement, the support 1 and the lower cover 3 are easily fixed and separated.

[0028] In the flash memory particle testing device described in this embodiment, the bottom of the upper pressing block 21 and the top of the lower pressing block 31 are both provided with a silica gel block 22. Specifically, the above arrangement can play a role of buffering and protecting the flash memory particles.

[0029] In the flash memory particle testing device described in this embodiment, the top of the support 1 is provided with a slot 11; the upper ejector module 41 is provided with a fixing plate 6; the fixing plate 6 is detachably connected to the slot 11. Specifically, through the above arrangement, it is convenient for the user to replace the upper ejector module 41 of different specifications, so as to adapt to different flash memory particles.

[0030] In the flash memory particle testing device described in this embodiment, the support 1 is provided with a receiving groove 12 at the bottom of the slot 11; the circuit board 43 is arranged in the receiving groove 12; the circuit board 43 is detachably connected to the receiving groove 12. Specifically, the above arrangement facilitates the disassembly and assembly of the circuit board 43.

[0031] In the flash memory particle testing device described in this embodiment, a window 13 is provided at the bottom of the support 1; the lower ejector module 42 is exposed at the window 13. Specifically, the lower ejector module 42 can be stably fixed in the support 1 through the above arrangement.

[0032] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the utility model, rather than to limit the protection scope of the utility model. Although the utility model has been described in detail with reference to the preferred embodiments, ordinary technicians in this field should understand that the technical solution of the utility model can be modified or replaced by equivalents without departing from the essence and scope of the technical solution of the utility model.

Claims

1. A flash memory particle testing device, characterized in that: The invention comprises a support (1), an upper pressure cover (2) and a lower pressure cover (3); the support (1) is arranged between the upper pressure cover (2) and the lower pressure cover (3); an upper ejector pin module (41) is arranged at the top of the support (1); a lower ejector pin module (42) is arranged at the bottom of the support (1); and a circuit board (43) is arranged between the upper ejector pin module (41) and the lower ejector pin module (42) of the support (1); The bottom of the upper ejector module (41) is connected to the top of the circuit board (43); the top of the lower ejector module (42) is connected to the bottom of the circuit board (43); the upper pressure cover (2) is provided with an upper pressure block (21) that cooperates with the top of the upper ejector module (41); and the lower pressure cover (3) is provided with a lower pressure block (31) that cooperates with the bottom of the lower ejector module (42).

2. A flash memory particle testing device according to claim 1, characterized in that: One end of the upper pressure cover (2) is hinged to one end of the top of the support (1); the other end of the upper pressure cover (2) is detachably connected to the other end of the top of the support (1).

3. A flash memory particle testing device according to claim 2, characterized in that: The other end of the upper pressure cover (2) is provided with a first clamping block (51); the other end of the top of the support (1) is provided with a second clamping block (52) clamped with the first clamping block (51).

4. The flash memory particle testing device according to claim 1, characterized in that: One end of the lower pressure cover (3) is hinged to one end of the bottom of the support (1); the other end of the lower pressure cover (3) is detachably connected to the other end of the bottom of the support (1).

5. A flash memory particle testing device according to claim 4, characterized in that: The other end of the lower pressure cover (3) is provided with a third clamping block (53); the other end of the bottom of the support (1) is provided with a fourth clamping block (54) clamped with the third clamping block (53).

6. The flash memory particle testing device according to claim 1, characterized in that: The bottom of the upper pressing block (21) and the top of the lower pressing block (31) are both provided with a silica gel block (22).

7. The flash memory particle testing device according to claim 1, characterized in that: The top of the support (1) is provided with a slot (11); the upper ejector module (41) is provided with a fixing plate (6); the fixing plate (6) is detachably connected to the slot (11).

8. The flash memory particle testing device according to claim 7, characterized in that: The support (1) is provided with a receiving groove (12) at the bottom of the slot (11); the circuit board (43) is arranged in the receiving groove (12); and the circuit board (43) and the receiving groove (12) are detachably connected.

9. The flash memory particle testing device according to claim 1, characterized in that: A window (13) is provided at the bottom of the support (1); the lower ejector module (42) is exposed at the window (13).

Images