Precise constant-temperature clamp for measuring characteristics of transistor

By using temperature control chips and temperature sensors in transistor testing fixtures to simulate the actual working environment temperature, the problem of difficult matching of parameter consistency of transistors under normal temperature conditions is solved, and parameter consistency detection at different temperatures is achieved to ensure the expected circuit design .

CN222232601UActive Publication Date: 2024-12-24QINGDAO BEIMAN ELECTRONIC TECH CO LTD
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
CN202420007471.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-01-03
Publication Date
2024-12-24
Estimated Expiration
2034-01-03

AI Technical Summary

Technical Problem

When the transistor is electrically tested under normal temperature conditions, the parameter consistency is difficult to match due to temperature changes, which affects the circuit design expectations.

Method used

A precision constant temperature fixture including a temperature control sheet, a lower thermal conduction copper plate, an upper thermal conduction copper plate and a temperature sensor is designed. The lower thermal conduction copper plate is heated or refrigerated through the temperature control sheet to simulate the actual working environment temperature of the transistor and ensure the constant internal temperature of the fixture. Perform electrical testing.

Benefits of technology

It achieves the consistency of transistor parameters at different temperatures, ensures that the circuit meets design expectations, and is suitable for batch detection of transistors.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN222232601U_ABST
    Figure CN222232601U_ABST
Patent Text Reader

Abstract

The utility model discloses a precise constant-temperature clamp for measuring transistor characteristics, which relates to the technical field of transistor testing appliances and comprises a base, a temperature control sheet is fixedly mounted at the top of the base, a lower heat-conducting copper plate is mounted above the temperature control sheet, and an upper heat-conducting copper plate is arranged above the lower heat-conducting copper plate. According to the design scheme, the lower heat-conducting copper plate is arranged on the temperature control sheet, the transistor is clamped between the lower heat-conducting copper plate and the upper heat-conducting copper plate, and the lower heat-conducting copper plate is heated or cooled through the temperature control sheet, so that the temperature of the actual working environment of the transistor is simulated, and heat is transferred to the upper heat-conducting copper plate through the transistor; the temperatures of the lower heat-conducting copper plate and the upper heat-conducting copper plate are sensed by the temperature sensors, when the temperature results detected by the two temperature sensors are consistent, the internal temperature of the clamp is constant, and the transistor is electrically tested at the moment, so that the parameter consistency of the transistor at different temperatures is ensured, and the circuit can reach the design expectation.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] The utility model relates to the technical field of transistor testing tools, in particular to a precise constant temperature fixture for measuring transistor characteristics. Background Art

[0002] A transistor is a solid semiconductor device, including diodes, triodes, field effect transistors, thyristors, etc., sometimes specifically referring to bipolar devices, which have multiple functions such as detection, rectification, amplification, switching, voltage regulation, signal modulation, etc. When testing finished transistors, it is necessary to conduct electrical tests on each pole of the transistor, that is, each terminal, in order to complete the quality inspection of the transistor.

[0003] In the actual production process, transistors are usually electrically tested at room temperature. However, the characteristics of transistors change with temperature. Since the temperature of the actual working environment of the transistor is different from the temperature during production testing, the parameter consistency at different temperatures cannot be well matched, and it is difficult for the circuit to meet design expectations. Utility Model Content

[0004] In order to overcome the above defects in the prior art, the utility model provides a precise constant temperature fixture for measuring transistor characteristics.

[0005] The utility model solves the technical problem by adopting the following technical solution: a precision constant temperature fixture for measuring transistor characteristics, comprising a base, a temperature control sheet is fixedly mounted on the top of the base, a lower heat-conducting copper plate is mounted above the temperature control sheet, an upper heat-conducting copper plate is arranged above the lower heat-conducting copper plate, a pressure cover is fixedly mounted on the top of the upper heat-conducting copper plate, the pressure cover is movably mounted on the base, temperature sensors are mounted inside the lower heat-conducting copper plate and the upper heat-conducting copper plate, and an insulating layer is attached to adjacent surfaces of the lower heat-conducting copper plate and the upper heat-conducting copper plate.

[0006] Furthermore, several groups of support rods are hinged at the left and right ends of the gland respectively, and several groups of support rods are distributed in a linear array on the gland. One end of several groups of support rods away from the gland is hingedly installed on the base, and a handle is fixedly installed on the top of the gland.

[0007] Furthermore, a vertical plate is provided on the periphery of the temperature control plate, and the vertical plate is fixedly installed on the top of the base. The vertical plate is a "C"-shaped structure, and a magnet is fixedly installed on the side wall of the rear side of the vertical plate close to the pressure cover.

[0008] Furthermore, sliding grooves are respectively provided at the left and right ends of the front side of the vertical plate, a slider is slidably installed in the sliding groove, a rubber pressure block is fixedly installed on the side of the slider close to the cover plate, a spring is fixedly installed on the rear side of the slider, the other end of the spring is fixedly installed on the rear end of the sliding groove, an end cover is fixedly installed at the front end of the sliding groove, a pull rod is slidably installed on the end cover, and the pull rod is fixedly installed on the slider.

[0009] Furthermore, the bottom surface of the rubber pressing block is an arc-shaped structure.

[0010] Furthermore, a control panel is installed at the front end of the base, and the control panel is electrically connected to the temperature control sheet and the temperature sensor.

[0011] The beneficial effect of the utility model is that the design scheme of the utility model is designed by installing a lower thermally conductive copper plate on the temperature control sheet, the transistor is clamped between the lower thermally conductive copper plate and the upper thermally conductive copper plate, the lower thermally conductive copper plate is heated or cooled by the temperature control sheet, thereby simulating the temperature of the actual working environment of the transistor, the heat is transferred to the upper thermally conductive copper plate through the transistor, and the temperature of the lower thermally conductive copper plate and the upper thermally conductive copper plate is sensed by the temperature sensor. When the temperature results detected by the two temperature sensors are consistent, it means that the temperature inside the fixture is constant. At this time, the transistor is electrically tested to ensure the parameter consistency of the transistor at different temperatures, thereby ensuring that the circuit can meet the design expectations. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] The utility model is further described below in conjunction with the accompanying drawings and embodiments.

[0013] Figure 1 It is a three-dimensional structural schematic diagram of the utility model;

[0014] Figure 2 It is the front view of the utility model;

[0015] Figure 3 It is a top view of the utility model;

[0016] Figure 4 for Figure 2 Schematic diagram of the cross-section structure in the AA direction;

[0017] Figure 5 for Figure 2 Schematic diagram of the cross-sectional structure in the middle BB direction;

[0018] Figure 6 for Figure 5 Schematic diagram of the structure when the middle pressure cover is opened.

[0019] In the figure: 1. Base, 2. Temperature control sheet, 3. Lower thermal conductive copper plate, 4. Upper thermal conductive copper plate, 5. Pressure cover, 6. Temperature sensor, 7. Insulation layer, 8. Support rod, 9. Handle, 10. Vertical plate, 11. Magnet, 12. Slide groove, 13. Slider, 14. Rubber pressure block, 15. Spring, 16. End cover, 17. Pull rod, 18. Control panel, 19. Transistor. DETAILED DESCRIPTION

[0020] In order to more clearly illustrate the technical solution of the utility model, the utility model is further described below in conjunction with the accompanying drawings. Obviously, the accompanying drawings described below are only one embodiment of the utility model. For ordinary technicians in this field, without paying any creative work, other embodiments can be obtained based on this drawing and embodiment, which all belong to the protection scope of the utility model.

[0021] according to Figure 1-6 As shown, a precision constant temperature fixture for measuring transistor characteristics includes a base 1, a temperature control plate 2 is fixedly installed on the top of the base 1, and the temperature control plate 2 is preferably a ceramic heating plate. A lower thermal conductive copper plate 3 is installed above the temperature control plate 2, and an upper thermal conductive copper plate 4 is arranged above the lower thermal conductive copper plate 3. A pressure cover 5 is fixedly installed on the top of the upper thermal conductive copper plate 4, and the pressure cover 5 is movably installed on the base 1. Temperature sensors 6 are installed inside the lower thermal conductive copper plate 3 and the upper thermal conductive copper plate 4, and an insulating layer 7 is attached to the adjacent surfaces of the lower thermal conductive copper plate 3 and the upper thermal conductive copper plate 4.

[0022] In the above specific implementation, the transistor 19 is clamped between the lower thermally conductive copper plate 3 and the upper thermally conductive copper plate 4. The lower thermally conductive copper plate 3 is heated or cooled by the temperature control sheet 2 to simulate the temperature of the actual working environment of the transistor 19. The heat is transferred to the upper thermally conductive copper plate 4 through the transistor 19. The temperature of the lower thermally conductive copper plate 3 and the upper thermally conductive copper plate 4 is sensed by the temperature sensor 6. When the temperature results detected by the two temperature sensors 6 are consistent, it means that the temperature inside the fixture is constant. At this time, the transistor is electrically tested to ensure the consistency of the parameters of the transistor 19 at different temperatures, thereby ensuring that the circuit can meet the design expectations.

[0023] Several groups of support rods 8 are hinged at the left and right ends of the pressure cover 5, respectively. Several groups of the support rods 8 are distributed in a linear array on the pressure cover 5, and several groups of the support rods 8 are hingedly installed on the base 1 at one end away from the pressure cover 5. A handle 9 is fixedly installed on the top of the pressure cover 5. The handle 9 is pulled to pull the pressure cover 5 above the rear end of the lower heat-conducting copper plate 3 to facilitate the placement of the transistor 19.

[0024] A vertical plate 10 is provided on the periphery of the temperature control plate 2, and the vertical plate 10 is fixedly installed on the top of the base 1. The vertical plate 10 is a "C"-shaped structure. A magnet 11 is fixedly installed on the side wall of the rear side of the vertical plate 10 close to the pressure cover 5. When the pressure cover 5 is opened, the pull cover is adsorbed on the vertical plate 10 through the magnet 11.

[0025] The left and right ends of the front side of the vertical plate 10 are respectively provided with a slide groove 12, and a slider 13 is slidably installed in the slide groove 12. A rubber pressure block 14 is fixedly installed on the side of the slider 13 close to the cover plate, and a spring 15 is fixedly installed on the rear side of the slider 13. The other end of the spring 15 is fixedly installed at the rear end of the slide groove 12, and an end cover 16 is fixedly installed at the front end of the slide groove 12. A pull rod 17 is slidably installed on the end cover 16, and the pull rod 17 is fixedly installed on the slider 13. When the pressure cover 5 is closed, the slider 13 is pushed backward by the pull rod 17, so that the rubber pressure block 14 is located above the pressure cover 5, and the pressure cover 5 is limited by the rubber pressure block 14. At this time, the spring 15 is in a contracted state. When the pressure cover 5 needs to be opened, the slider 13 is pulled forward by the pull rod 17, so that the rubber pressure block 14 is separated from the top of the pressure cover 5, so that the pressure cover 5 can be opened. The slider 13 is always at the front end of the slide groove 12 under the action of the spring 15, so as to facilitate subsequent detection work.

[0026] The bottom surface of the rubber pressing block 14 is an arc-shaped structure. When the pressing cover 5 is closed, the rubber pressing block 14 presses the cover downward, thereby clamping the transistor 19.

[0027] A control panel 18 is installed at the front end of the base 1. The control panel 18 is connected to the temperature control plate 2 and the temperature sensor 6 through wires. The temperature of the temperature control plate 2 can be controlled by the control panel 18, and the temperature detected by the temperature sensor 6 is displayed through the control panel 18.

[0028] When the utility model is used, the transistor 19 is first placed on the lower heat-conducting copper plate 3 in sequence, and then the pressure cover 5 is closed to clamp the transistor 19 between the lower heat-conducting copper plate 3 and the upper heat-conducting copper plate 4, and the pull rods on both sides of the vertical plate 10 are pushed backward, and the rubber pressure block 14 is pushed to the top of the pressure cover 5 by the pull rod 17, and the pressure cover 5 is limited by the rubber pressure block 14, and then the temperature control sheet 2 is started to heat or cool the transistor 19, so as to simulate the temperature of the actual working environment of the transistor 19. When the temperature results detected by the temperature sensor 6 inside the lower heat-conducting copper plate 3 and the upper heat-conducting copper plate 4 are consistent, This indicates that the temperature inside the fixture is constant, and the electrical test of the transistor 19 can be started. After the electrical test is completed, the pull rod 17 is pulled backward to disengage the rubber pressure block 14 from the top of the pressure cover 5, so that the pressure cover 5 can be opened to take out the transistor 19. After the pressure cover 5 is opened, it is adsorbed on the vertical plate 10 by the magnet 11, and the rubber pressure block 14 is located at the front end of the vertical plate 10 under the action of the spring 15, so as to facilitate the subsequent detection of the transistor 19. Therefore, batch detection of the transistor 19 can be realized, thereby ensuring the parameter consistency of the transistor 19 at different temperatures, and then ensuring that the circuit can meet the design expectations.

[0029] The above embodiments are only exemplary embodiments of the present invention and are not intended to limit the present invention. The protection scope of the present invention is defined by the claims. Those skilled in the art may make various modifications or equivalent substitutions to the present invention within the essence and protection scope of the present invention, and such modifications or equivalent substitutions shall also be deemed to fall within the protection scope of the present invention.

Claims

1. A precision constant temperature fixture for measuring transistor characteristics, comprising a base (1), characterized in that: A temperature control plate (2) is fixedly mounted on the top of the base (1); a lower heat-conducting copper plate (3) is mounted above the temperature control plate (2); an upper heat-conducting copper plate (4) is arranged above the lower heat-conducting copper plate (3); a pressure cover (5) is fixedly mounted on the top of the upper heat-conducting copper plate (4); the pressure cover (5) is movably mounted on the base (1); temperature sensors (6) are mounted inside the lower heat-conducting copper plate (3) and the upper heat-conducting copper plate (4); and an insulating layer (7) is attached to adjacent surfaces of the lower heat-conducting copper plate (3) and the upper heat-conducting copper plate (4).

2. A precision constant temperature fixture for measuring transistor characteristics according to claim 1, characterized in that: A plurality of groups of support rods (8) are hingedly connected at the left and right ends of the pressure cover (5), and a plurality of groups of support rods (8) are distributed on the pressure cover (5) in a linear array. The ends of the plurality of groups of support rods (8) away from the pressure cover (5) are hingedly mounted on the base (1), and a handle (9) is fixedly mounted on the top of the pressure cover (5).

3. A precision constant temperature fixture for measuring transistor characteristics according to claim 1, characterized in that: A vertical plate (10) is provided on the periphery of the temperature control plate (2), and the vertical plate (10) is fixedly mounted on the top of the base (1). The vertical plate (10) is a "C"-shaped structure, and a magnet (11) is fixedly mounted on the side wall of the rear side of the vertical plate (10) close to the pressure cover (5).

4. A precision constant temperature fixture for measuring transistor characteristics according to claim 3, characterized in that: The left and right ends of the front side of the vertical plate (10) are respectively provided with a slide groove (12), a slider (13) is slidably installed in the slide groove (12), a rubber pressure block (14) is fixedly installed on the side of the slider (13) close to the cover plate, a spring (15) is fixedly installed on the rear side of the slider (13), the other end of the spring (15) is fixedly installed on the rear end of the slide groove (12), an end cover (16) is fixedly installed at the front end of the slide groove (12), a pull rod (17) is slidably installed on the end cover (16), and the pull rod (17) is fixedly installed on the slider (13).

5. A precision constant temperature fixture for measuring transistor characteristics according to claim 4, characterized in that: The bottom surface of the rubber pressing block (14) is an arc-shaped structure.

6. A precision constant temperature fixture for measuring transistor characteristics according to any one of claims 1 to 5, characterized in that: A control panel (18) is installed at the front end of the base (1), and the control panel (18) is electrically connected to the temperature control sheet (2) and the temperature sensor (6).