Marking detection structure and test sorting machine

Abstract

The utility model discloses a marking detection structure and a test sorting machine, and relates to the technical field of chip processing, and the marking detection structure comprises an installation seat; the rotating disc is rotationally mounted on the mounting base and is provided with a feeding and discharging station, a first detection station and a marking station; the limiting jig is mounted on the rotary table and used for mounting a chip, and the rotary table enables the limiting jig to circularly rotate among the discharging station, the first detection station and the marking station in sequence; the first visual detection assembly is arranged on the outer side of the mounting seat, corresponds to the first detection station and is used for acquiring image information of the chip; and the marking assembly is arranged on the outer side of the mounting base, corresponds to the marking station and is electrically connected with the first visual detection assembly, the marking assembly comprises a multi-axis driving part and a laser generator, and the multi-axis driving part is used for adjusting the position of the laser generator. According to the technical scheme provided by the utility model, the problems that the chip processing cost is increased and the chip rejection rate is higher can be solved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip processing, in particular to a marking detection structure and a testing sorting machine. Background Art

[0002] The test sorting machine is a type of chip processing equipment with functions such as testing, marking, and sorting. Its marking function is to mark the chip. However, the marking detection structure in the existing test sorting machine will change the marking position when marking chips of different sizes during use due to the change in chip size. If the marking position of the previous chip is continued, the mark will be offset, resulting in the chip being scrapped. This will increase the chip processing cost and increase the chip scrap rate. Utility Model Content

[0003] The main purpose of the utility model is to provide a marking detection structure and a test sorting machine, aiming to solve the problems of increased chip processing costs and high chip scrap rate.

[0004] In order to achieve the above-mentioned purpose, the marking detection structure proposed by the utility model includes:

[0005] Mounting seat;

[0006] The turntable is rotatably mounted on the mounting seat and is provided with a loading and unloading station, a first inspection station, and a marking station;

[0007] A limit fixture is installed on the turntable for chip installation, and the turntable is used to make the limit fixture cyclically rotate among the loading and unloading stations, the first inspection station, and the marking station in sequence;

[0008] a first visual inspection component, disposed outside the mounting seat and corresponding to the first inspection station, for obtaining image information of the chip; and

[0009] The marking component is arranged outside the mounting seat, corresponds to the marking station, and is electrically connected to the first visual detection component. The marking component includes a multi-axis driving component and a laser generator. The multi-axis driving component is used to adjust the position of the laser generator.

[0010] In one embodiment, the marking detection structure also includes a second visual detection component, the turntable is provided with a second detection station, the second visual detection component corresponds to the second detection station, the second detection station is arranged downstream of the marking station, and the second visual detection component is used to obtain image information of the chip after marking.

[0011] In one embodiment, the number of the limiting jigs is four, and the four limiting jigs are arranged in one-to-one correspondence with the loading and unloading stations, the first inspection station, the marking station, and the second inspection station.

[0012] In one embodiment, the turntable is tilted, and the limiting fixture is configured as a triangular prism structure. When the limiting fixture is rotated to the loading and unloading station, the chip is in a horizontal state.

[0013] In one embodiment, the positioning fixture is provided with a negative pressure hole, and the negative pressure hole is used to position the chip on the positioning fixture.

[0014] In one embodiment, the first visual inspection component includes a first mounting frame and a first camera, the first camera is mounted on the first mounting frame, and a shooting end of the first camera is arranged corresponding to the first inspection station.

[0015] In one embodiment, the second visual inspection component includes a second mounting frame and a second camera, the second camera is mounted on the second mounting frame, and a shooting end of the second camera is arranged corresponding to the second inspection station.

[0016] The utility model also provides a testing and sorting machine, comprising a marking detection structure, wherein the marking detection structure is any of the above-mentioned marking detection structures.

[0017] The technical solution of the utility model is to set a first visual detection component upstream of the marking component, so that before the chip is marked, the image information of the chip is obtained through the first visual detection component, and then the XY axis offset value of the chip center relative to the first visual detection component and the chip deflection angle are fed back to the marking component. At this time, the marking component adjusts the position of the laser generator according to the data fed back by the first visual detection component, so that the laser beam emitted by the laser generator can hit the specified position of the chip, avoiding the occurrence of marking position offset and mark deviation, and avoiding the problem of chip being scrapped, thereby solving the technical problems existing in the prior art. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying creative work.

[0019] Figure 1 A structural schematic diagram of an embodiment of a marking detection structure provided by the utility model;

[0020] Figure 2 for Figure 1 A structural diagram of the marking detection structure from another perspective;

[0021] Figure 3 for Figure 1 A schematic diagram of the structure of an embodiment of a marking detection structure and a nozzle in a test sorting machine;

[0022] Figure 4 for Figure 1 A schematic structural diagram of an embodiment of a turntable in a marking detection structure;

[0023] Figure 5 for Figure 1 A schematic diagram of the structure of a turntable, a limit fixture, and a dielectric block in a marking detection structure.

[0024] Description of Figure Numbers:

[0025] 100, mounting base; 110, rotating motor;

[0026] 200, turntable; 210, loading and unloading station; 220, first inspection station; 230, marking station; 240, second inspection station; 250, first airway;

[0027] 300, limit fixture; 310, negative pressure hole;

[0028] 400, first visual inspection component; 410, first mounting frame; 420, first camera;

[0029] 500, marking components;

[0030] 600, second visual inspection component; 610, second mounting frame; 620, second camera;

[0031] 700, Chip;

[0032] 800, nozzle;

[0033] 900, a medium block; 910, a second airway. DETAILED DESCRIPTION

[0034] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0035] It should be noted that if the embodiments of the present invention involve directional indications (such as up, down, left, right, front, back...), the directional indications are only used to explain the relative position relationship, movement status, etc. between the components in a certain specific posture. If the specific posture changes, the directional indications will also change accordingly.

[0036] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the utility model, the descriptions of "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of technical features indicated. Therefore, the features limited to "first" and "second" may explicitly or implicitly include at least one of the features. In addition, if "and / or" or "and / or" appears in the full text, its meaning includes three parallel solutions. Taking "A and / or B" as an example, it includes solution A, solution B, or solutions that satisfy both A and B. In addition, the technical solutions between the various embodiments can be combined with each other, but it must be based on the ability of ordinary technicians in this field to implement. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by the utility model.

[0037] The test sorting machine is a type of chip processing equipment, which has functions such as testing, marking, and sorting. Its marking function is to mark the chip. However, during the use of the marking detection structure in the existing test sorting machine, when marking chips of different sizes, the marking position will change due to the change of chip size. If the marking position of the previous chip is continued, the mark will be offset, resulting in the chip being scrapped. This will increase the cost of chip processing and make the chip scrap rate higher.

[0038] The utility model provides a marking detection structure, which is used for testing a sorting machine. The testing sorting machine is provided with a suction nozzle 800.

[0039] See also Figure 1 , Figure 4 In one embodiment of the present utility model, the marking detection structure includes:

[0040] Mounting seat 100;

[0041] The turntable 200 is rotatably mounted on the mounting base 100, wherein the mounting base 100 is fixedly mounted on a rotating motor 110, and the turntable 200 is mounted on the output end of the rotating motor 110; the turntable 200 is provided with a loading and unloading station 210, a first inspection station 220, and a marking station 230, wherein the loading and unloading station 210 corresponds to the suction nozzle 800 in the test sorting machine, and is used for loading or unloading the chip 700.

[0042] The limit fixture 300 is installed on the turntable 200, wherein the limit fixture 300 is fixed to one of the stations of the turntable 200 by screw locking; the limit fixture 300 is used for installing the chip 700; the turntable 200 allows the limit fixture 300 to circulate among the loading and unloading station 210, the first inspection station 220, and the marking station 230 in sequence, so that it can be concluded that the first inspection station 220 is located downstream of the loading and unloading station 210, and the marking station 230 is located downstream of the first inspection station 230. downstream of the measuring station 220; when the rotating motor 110 drives the turntable 200 to rotate, the limiting fixture 300 can also rotate with it, that is, the limiting fixture 300 can pass through the loading and unloading station 210, the first inspection station 220, and the marking station 230 in sequence; when the limiting fixture 300 rotates to the loading and unloading station 210, the suction nozzle 800 in the test sorting machine puts the unmarked chip 700 into the limiting fixture 300, or takes the marked chip 700 out of the limiting fixture 300.

[0043] The first visual inspection component 400 is disposed outside the mounting seat 100 and corresponds to the first inspection station 220, and is used to obtain image information of the chip 700, wherein the image information includes the XY axis offset value and chip deflection angle of the center of the chip 700 relative to the center of the first visual inspection component 400.

[0044] The marking component 500 is arranged on the outside of the mounting seat 100, corresponds to the marking station 230, and is electrically connected to the first visual inspection component 400, wherein the first visual inspection component 400 can feed back the XY axis offset value and chip deflection angle of the center of the chip 700 relative to the center of the first inspection station 220 to the marking component 500 through electrical connection. The marking component 500 includes a multi-axis driving component and a laser generator. The multi-axis driving component is used to adjust the position of the laser generator. The multi-axis driving component adjusts and compensates the laser generator according to the numerical value fed back from the first detection station 220 to ensure that the laser beam emitted by the laser generator can hit the specified position of the chip 700, thereby avoiding the situation where the chip 700 is scrapped due to marking deviation. At the same time, in this embodiment, when replacing chips 700 of different sizes, they will pass through the first visual inspection component 400 before marking, and the image information of the chip 700 will be obtained through the first visual inspection component 400. Then, the XY axis offset value of the center of the chip 700 relative to the center of the first visual inspection component 400 and the chip deflection angle are fed back to the marking component 500. At this time, the multi-axis driving component adjusts the position of the laser generator according to the feedback data.

[0045] The technical solution of the utility model is to set a first visual inspection component 400 upstream of the marking component 500, so that before the chip 700 is marked, the image information of the chip 700 is obtained through the first visual inspection component 400, and then the XY axis offset value of the center of the chip 700 relative to the first visual inspection component 400 and the chip deflection angle are fed back to the marking component 500. At this time, the multi-axis driving component in the marking component 500 adjusts the position of the laser generator according to the data fed back by the first visual inspection component 400 to adjust the marking position, so that the laser beam emitted by the laser generator can hit the specified position of the chip 700, avoiding the occurrence of marking position offset and mark deviation, and avoiding the problem of chip 700 being scrapped, thereby solving the technical problems existing in the prior art.

[0046] In one embodiment, see Figure 1 , the marking detection structure also includes a second visual detection component 600, the turntable 200 is provided with a second detection station 240, the second visual detection component 600 corresponds to the second detection station 240, the second detection station 240 is arranged downstream of the marking station 230, and the second visual detection component 600 is used to obtain the image information of the chip 700 after marking; in this embodiment, after the second visual detection component 600 obtains the image information of the chip 700 after marking, it is fed back to the test sorting machine, and the image information of the chip 700 after marking is judged and inspected by the test sorting machine to see whether the marking position is qualified and whether there is an offset, and the marking effect is detected. By detecting the chip 700 after marking, if it is detected that the scrap rate of the chip 700 in the same batch is high, it proves that a certain component (the first visual detection component 400 or the marking component 500 or the second visual detection component 600) in the marking detection structure is damaged, and the marking detection structure needs to be repaired. In this embodiment, the installation adjustment of the second visual detection component 600 is manually adjusted, which can reduce the maintenance cost of the second visual detection component 600 and further reduce the structure of the second visual detection component 600, making it more compact and occupying a smaller area. In other embodiments, the same is true for the first visual detection component 400.

[0047] In one embodiment, see Figure 4, the number of the limit jigs 300 is four, and the four limit jigs 300 are arranged in one-to-one correspondence with the loading and unloading station 210, the first inspection station 220, the marking station 230, and the second inspection station 240. In this embodiment, four limit jigs 300 are arranged, and the four limit jigs 300 correspond to the loading and unloading station 210, the first inspection station 220, the marking station 230 and the second inspection station 240 respectively, so that the turntable 200 can rotate 90 degrees to enable the limit jig 300 to rotate from the previous station to the next station, which can further improve the processing efficiency of the marking quality inspection structure.

[0048] In this example, see Figure 1 , Figure 4 , the turntable 200 rotates 90 degrees to move the limiting fixture 300 located at the second inspection station 240 to the loading and unloading station 210. At this time, the suction nozzle 800 in the test sorting machine will take away the chip 700 passing through the second inspection station 240. At this time, the limiting fixture 300 is empty, and then the next suction nozzle 800 enters the loading and unloading station 210 to put the unmarked chip 700 into the empty limiting fixture 300, and then the turntable 200 drives the unmarked chip 700 to enter the first inspection station 220, the marking station 230, the second inspection station 240, and the loading and unloading station 210 in sequence.

[0049] In one embodiment, see Figure 1 , Figure 2 , the turntable 200 is tilted. In this embodiment, the turntable 200 is tilted at 45 degrees. Further, the angle between the turntable 200 and the ground plane is 45 degrees. The position limiting fixture 300 is configured as a triangular prism structure, wherein the position limiting fixture 300 is configured as an isosceles right-angled triangular prism, that is, when the position limiting fixture 300 rotates to the loading and unloading station 210, the chip 700 is in a horizontal state. In other embodiments, the tilt angle of the turntable 200 can also be other angles, such as 30 degrees, 60 degrees, etc. When the turntable 200 is tilted at 30 degrees or 60 degrees, the corresponding triangular prism structure also needs to adjust the corresponding angle to meet the requirement that when the position limiting fixture 300 rotates to the loading and unloading station 210, the chip 700 is in a horizontal state. When the chip 700 is in a horizontal state, the suction nozzle 800 in the test sorting machine can vertically take the material up and down, so that the suction nozzle 800 in the test sorting machine can be installed conveniently. In other embodiments, the chip 700 may also be in an inclined state to facilitate loading and unloading of the nozzle 800 .

[0050] In one embodiment, see Figure 4 , Figure 5, the limiting fixture 300 is provided with a negative pressure hole 310, and the negative pressure hole 310 is used to position the chip 700 on the limiting fixture 300; in this embodiment, the turntable 200 is provided with a first airway 250, and the first airway 250 is connected to the negative pressure hole 310, and a medium block 900 is provided outside the turntable 200, and the medium block 900 is rotatably matched with the turntable 200, and the medium block 900 is provided with a second airway 910, and the first airway 250 is connected to the negative pressure hole 310. 0 is connected to the second air channel 910; wherein the medium block 900 is also connected to a negative pressure pump, and specifically the negative pressure pump is connected to the second air channel 910 in the medium block 900, so that the second air channel 910 forms a negative pressure. After the second air channel 910 forms a negative pressure, the first air channel 250 connected thereto also forms a negative pressure; the specific second air channel 910 is configured as a ring groove structure, so that the first air channel 250 can be connected to the second air channel 910 when the turntable 200 rotates. In this embodiment, under the action of the negative pressure hole 310, the chip 700 can be prevented from flying out of the limiting fixture 300 during the rotation between the workstations, and the chip 700 can also be prevented from moving during the marking process.

[0051] In one embodiment, see Figure 1 , Figure 2 The first visual inspection component 400 includes a first mounting frame 410 and a first camera 420. The first camera 420 is mounted on the first mounting frame 410. The shooting end of the first camera 420 is set corresponding to the first inspection station 220. When the limiting fixture 300 rotates to the first inspection station 220, the first camera 420 captures the XY axis offset value and chip deflection angle of the center of the chip 700 relative to the camera cross center, and then feeds back the XY axis offset value and chip deflection angle to the marking component 500. Then the marking component 500 drives the laser generator through a multi-axis driving member to adjust the position of the laser generator, so that the XY axis offset value and chip deflection angle of the center of the chip 700 can be compensated.

[0052] In one embodiment, see Figure 1 , Figure 2 The second visual inspection component 600 includes a second mounting frame 610 and a second camera 620. The second camera is mounted on the second mounting frame 610. The shooting end of the second camera is arranged corresponding to the second inspection station 240. The second camera 620 is used to obtain the image information of the chip 700 after marking, and then feed it back to the test sorting machine. The test sorting machine detects the image information to see the effect after marking.

[0053] The utility model also provides a test sorting machine, see Figure 3The test sorting machine includes a marking detection structure. The specific structure of the marking detection structure refers to the above embodiment. Since the test sorting machine adopts all the technical solutions of all the above embodiments, it at least has all the beneficial effects brought by the technical solutions of the above embodiments, which will not be repeated here. The test sorting machine is provided with a suction nozzle 800 and a downward voice coil motor (not shown), wherein the downward voice coil motor is used to drive the suction nozzle 800 to move downward, and the suction nozzle 800 is configured as a vacuum suction nozzle.

[0054] The above description is only an exemplary embodiment of the present invention, and does not limit the patent scope of the present invention. All equivalent structural changes made by using the contents of the present invention specification and drawings under the technical concept of the present invention, or directly / indirectly applied in other related technical fields are included in the patent protection scope of the present invention.

Claims

1. A marking detection structure, characterized in that: include: Mounting seat; The turntable is rotatably mounted on the mounting seat and is provided with a loading and unloading station, a first inspection station, and a marking station; A limit fixture is installed on the turntable for chip installation, and the turntable is used to make the limit fixture cyclically rotate among the loading and unloading stations, the first inspection station, and the marking station in sequence; A first visual inspection component is disposed outside the mounting seat and corresponds to the first inspection station, and is used to obtain image information of the chip; as well as The marking component is arranged outside the mounting seat, corresponds to the marking station, and is electrically connected to the first visual detection component. The marking component includes a multi-axis driving component and a laser generator. The multi-axis driving component is used to adjust the position of the laser generator.

2. The marking detection structure according to claim 1, characterized in that: The marking detection structure also includes a second visual detection component. The turntable is provided with a second detection station. The second visual detection component corresponds to the second detection station. The second detection station is arranged downstream of the marking station. The second visual detection component is used to obtain image information of the chip after marking.

3. The marking detection structure according to claim 2, characterized in that: The number of the position limiting jigs is four, and the four position limiting jigs are arranged in one-to-one correspondence with the loading and unloading stations, the first inspection station, the marking station, and the second inspection station.

4. The marking detection structure according to claim 2, characterized in that: The turntable is tilted, and the limiting fixture is configured as a triangular prism structure. When the limiting fixture is rotated to the loading and unloading station, the chip is in a horizontal state.

5. The marking detection structure according to claim 2, characterized in that: The positioning fixture is provided with a negative pressure hole, and the negative pressure hole is used to position the chip on the positioning fixture.

6. The marking detection structure according to claim 5, characterized in that: The turntable is provided with a first air channel, which is connected to the negative pressure hole. A medium block is provided outside the turntable, which cooperates with the turntable in rotation. The medium block is provided with a second air channel, and the first air channel is connected to the second air channel; wherein the medium block is also connected to the negative pressure pump.

7. The marking detection structure according to claim 6, characterized in that: The second air channel is configured as an annular groove structure.

8. The marking detection structure according to any one of claims 1 to 7, characterized in that: The first visual inspection component includes a first mounting frame and a first camera. The first camera is mounted on the first mounting frame, and a shooting end of the first camera is arranged corresponding to the first inspection station.

9. The marking detection structure according to any one of claims 2 to 7, characterized in that: The second visual inspection component includes a second mounting frame and a second camera, the second camera is mounted on the second mounting frame, and the shooting end of the second camera is arranged corresponding to the second inspection station.

10. A test sorting machine, characterized in that: It comprises a marking detection structure, wherein the marking detection structure is the marking detection structure according to any one of claims 1 to 9.

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