Socket for chip aging test

Abstract

The utility model relates to a socket for a chip aging test, which comprises a base, the center of the base is provided with a plurality of fixed pinholes used for plugging the tail ends of metal probes, a chip connecting seat is connected above the base, an elastic connecting piece is connected between the chip connecting seat and the base, the outer side of the base is provided with a guide groove, and the guide groove is provided with a through hole. A guide groove is formed in the base, an upper stop block is connected to the upper portion of the guide groove, a guide strip sliding in the guide groove is connected to the outer side of the chip connecting base, a lower stop block matched with the upper stop block is connected to the bottom end of the guide strip, and a movable distance is formed between the chip connecting base and the base through an elastic connecting piece. The center of the chip connecting seat is provided with ball clamping holes which are in one-to-one correspondence with the fixing pinholes, the center of the chip connecting seat is connected with a chip adapter plate, the chip adapter plate is provided with chip holes which are in one-to-one correspondence with the fixing pinholes and are used for being connected with the top ends of the metal probes in an inserted mode, and the side edge of the base is connected with a pressing assembly used for pressing a chip. According to the utility model, the working efficiency of testing can be improved.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor testing, in particular to a socket for chip aging testing. Background Art

[0002] With the development of science and technology, electronic chips have been widely used in various electronic products. After completing mass production of chips, it is necessary to test the qualification of the chips to select unqualified chips and retain qualified chips. However, in the current field of semiconductor chip testing, the test socket mainly includes a lower test socket body, a test probe, and a lower test socket probe holding plate to complete the test of single-sided pin array chips. Its function is to test chips with single-sided pin arrays. For new packaging technology chips with double-sided pin arrays, especially the main chip of stacked semiconductor chips, this test socket does not have the function of testing the upper and lower sides of the chip at the same time.

[0003] After searching, the patent: A socket for packaged chip aging test (CN202021818400.0), including a socket body, a rectangular connecting groove is provided on the top surface of the socket body, a fixed hook is installed inside the rectangular connecting groove, a positioning groove is installed at the center of the top of the socket body, a test pinhole is provided inside the positioning groove, the socket body includes a probe tube and an integrated test board, a packaged chip to be tested is placed on the top of the socket body, and the two ends of the integrated test board include sensors and bolts. Although the above structure can be installed quickly, it cannot ensure full contact between the product and the metal probe, resulting in low test quality.

[0004] In view of the above-mentioned defects, the designers have actively carried out research and innovation in order to create a new structure of a chip aging test socket to make it more valuable for industrial use. Utility Model Content

[0005] In order to solve the above technical problems, the purpose of the utility model is to provide a socket for chip aging test.

[0006] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0007] A socket for chip aging test comprises a base, a plurality of fixed pinholes for plugging the tail ends of metal probes are provided at the center of the base, a chip connection seat is connected above the base, an elastic connecting piece is connected between the chip connection seat and the base, a guide groove is provided on the outer side of the base, an upper blocking block is connected above the guide groove, a guide strip sliding in the guide groove is connected to the outer side of the chip connection seat, a lower blocking block matching the upper blocking block is connected to the bottom end of the guide strip, a movable spacing is provided between the chip connection seat and the base through the elastic connecting piece, a ball clamping hole corresponding to the fixed pinhole is provided at the center of the chip connection seat, a chip adapter board is connected at the center of the chip connection seat, a chip hole corresponding to the fixed pinhole and used for plugging the top end of the metal probe is provided on the chip adapter board, and a clamping assembly for clamping the chip is connected to the side of the base.

[0008] Preferably, in the socket for chip aging test, a limiting connection seat for limiting the metal probe is connected below the base, and the limiting connection seat is provided with limiting pinholes corresponding to the fixed pinholes on the base.

[0009] Preferably, in the chip aging test socket, a groove matching the position limiting connection seat is formed at the bottom of the base, and the position limiting connection seat is buckled on the base.

[0010] Preferably, in the socket for chip aging test, the clamping assembly includes a clamping locking plate, a clamping spring and an auxiliary rocker block, the clamping spring is connected to the side of the base, the top of the clamping spring is connected to one end of the clamping locking plate, and the side of one end of the clamping locking plate is connected to the base through a rotating shaft, the other end of the clamping spring is pressed onto the chip adapter board under the reaction force of the clamping spring, and the auxiliary rocker block is connected to the chip connecting seat, and when the auxiliary rocker block is pressed down on the chip connecting seat, the lower end of the auxiliary rocker block rockers the clamping locking plate to make the other end of the clamping locking plate detach from the chip adapter board.

[0011] Preferably, in the chip aging test socket, the elastic connectors are springs, which are arranged at four corners of the base.

[0012] Preferably, in the socket for chip aging test, the ball clamping hole comprises a ball clamping hole body and a ball clamping guide pin, the ball clamping guide pin is connected to the chip connection seat, and the ball clamping guide pin is located at the center of the ball clamping hole body, and a through hole for passing a metal probe is provided between the ball clamping guide pin and the ball clamping hole body, the metal probe is in a "Y"-shaped structure, the ball clamping guide pin is located in the middle of the "Y"-shaped metal probe, and when the chip connection seat is pressed down, the ball clamping guide pin separates the upper half of the metal probe of the "Y"-shaped structure.

[0013] Preferably, in the chip aging test socket, the base is connected with a guide column, and the chip connection seat is provided with a guide hole matched with the guide column.

[0014] By means of the above solution, the utility model has at least the following advantages:

[0015] The utility model can realize the rapid installation of the product and effectively improve the working efficiency of the test. The utility model can ensure the stable contact between the metal probe and the product through the ball clamping hole and improve the quality of the test.

[0016] The above description is only an overview of the technical solution of the utility model. In order to more clearly understand the technical means of the utility model and implement it according to the contents of the specification, the following is a detailed description of the preferred embodiments of the utility model in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the utility model and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying creative work.

[0018] Figure 1 It is a structural schematic diagram of the utility model;

[0019] Figure 2 It is a cross-sectional view of the utility model;

[0020] Figure 3 It is a cross-sectional view of the base, the chip connection seat and the chip adapter plate of the utility model. DETAILED DESCRIPTION

[0021] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various different configurations.

[0022] Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application for which protection is sought, but merely represents selected embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0023] Example

[0024] like Figure 1 , Figure 2 and Figure 3 As shown, a socket for chip aging test comprises a base 1, a plurality of fixed pinholes 3 for plugging the tail end of a metal probe 2 are provided at the center of the base 1, a chip connection seat 4 is connected above the base 1, an elastic connector 7 is connected between the chip connection seat 4 and the base 1, a guide groove 6 is provided on the outer side of the base 1, an upper blocking block is connected above the guide groove 6, a guide bar 12 sliding in the guide groove 6 is connected to the outer side of the chip connection seat 4, a lower blocking block matching the upper blocking block is connected to the bottom end of the guide bar 12, a movable spacing is provided between the chip connection seat 4 and the base 1 through the elastic connector 7, a ball clamping hole 13 corresponding to the fixed pinholes is provided at the center of the chip connection seat 4, a chip adapter plate 8 is connected at the center of the chip connection seat 4, a chip hole 9 corresponding to the fixed pinholes and used for plugging the top of the metal probe 2 is provided on the chip adapter plate 8, and a clamping assembly 10 for clamping the chip is connected to the side of the base 1.

[0025] A limiting connection seat 5 for limiting the metal probe 2 is connected to the bottom of the base 1 in the utility model, and the limiting connection seat 5 is provided with limiting pinholes corresponding to the fixed pinholes on the base 1, wherein the bottom of the base 1 is provided with a groove matching the limiting connection seat, and the limiting connection seat 5 is buckled on the base 1.

[0026] The clamping assembly 10 in the present invention includes a clamping lock plate 101, a clamping spring 102 and an auxiliary rocker 103. The clamping spring 102 is connected to the side of the base 1, and the top of the clamping spring 102 is connected to one end of the clamping lock plate 101. At the same time, the side of one end of the clamping lock plate 101 is connected to the base 1 through a rotating shaft. The other end of the clamping spring 102 is pressed onto the chip adapter plate 8 under the reaction force of the clamping spring 102, and the auxiliary rocker 103 is connected to the chip connection seat 4. When the auxiliary rocker 103 is pressed down on the chip connection seat 4, the lower end of the auxiliary rocker 103 rockers the clamping lock plate 101 to make the other end of the clamping lock plate 101 detach from the chip adapter plate 8.

[0027] The elastic connecting members 7 in the present invention are springs, which are arranged at four corners of the base.

[0028] The ball clamping hole described in the utility model includes a ball clamping hole body 131 and a ball clamping guide column 132, and the ball clamping guide column is connected to the chip connection seat 4. At the same time, the ball clamping guide column is located at the center of the ball clamping hole body, and a through hole for passing a metal probe is provided between the ball clamping guide column and the ball clamping hole body. The metal probe is in a "Y"-shaped structure, and the ball clamping guide column is located in the middle of the "Y"-shaped metal probe. When the chip connection seat 4 is pressed down, the ball clamping guide column separates the upper half of the metal probe of the "Y"-shaped structure. A guide column 11 is connected to the base 1, and a guide hole matching the guide column is provided on the chip connection seat 4.

[0029] The chip hole of the utility model is larger than the ball clamping hole, so that the metal probe with a Y-shaped structure can move in the chip hole.

[0030] The working principle of the utility model is as follows:

[0031] During specific operation, the product (chip) is placed on the chip adapter board. At this time, the contact point (welding point) at the bottom of the chip is clamped with the top of the metal probe. At the same time, the clamping assembly also presses the top of the product, and finally connects to the test device through the bottom of the metal probe.

[0032] After the product is tested, the chip connector is pressed down. During the pressing process, the clamping lock piece in the clamping assembly is lifted up by the auxiliary rocker block pair, and the top of the metal probe is separated from the contact point of the product by the ball clamping guide column, and finally the product (chip) is taken out.

[0033] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0034] In the description of this application, it should be noted that the terms "vertical", "horizontal", "inside", "outside", etc. indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, or the positions or positional relationships in which the product of the application is usually placed when in use. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application. In addition, the terms "first", "second", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0035] In addition, the terms "horizontal", "vertical" and the like do not mean that the components are required to be absolutely horizontal or vertical, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0036] In the description of this application, it should also be noted that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0037] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. It should be pointed out that a person skilled in the art can make several improvements and modifications without departing from the technical principle of the present invention, and these improvements and modifications should also be regarded as within the protection scope of the present invention.

Claims

1. A socket for chip aging test, characterized in that: The invention comprises a base (1), wherein a plurality of fixed pinholes (3) for inserting the tail end of a metal probe (2) are provided at the center of the base (1), a chip connection seat (4) is connected above the base (1), an elastic connection member (7) is connected between the chip connection seat (4) and the base (1), a guide groove (6) is provided on the outer side of the base (1), an upper blocking block is connected above the guide groove (6), a guide bar (12) sliding in the guide groove (6) is connected on the outer side of the chip connection seat (4), and a guide bar (12) at the bottom end of the guide bar (12) is provided on the outer side of the chip connection seat (4). A lower blocking block is connected to match the upper blocking block, and a movable spacing is provided between the chip connection seat (4) and the base (1) through an elastic connecting piece (7). A ball clamping hole (13) corresponding to the fixed pin hole is provided at the center of the chip connection seat (4). A chip adapter plate (8) is connected to the center of the chip connection seat (4). A chip hole (9) corresponding to the fixed pin hole and used for plugging the top of the metal probe (2) is provided on the chip adapter plate (8). A clamping assembly (10) for clamping the chip is connected to the side of the base (1).

2. A chip aging test socket according to claim 1, characterized in that: A limiting connection seat (5) for limiting the metal probe (2) is connected below the base (1), and the limiting connection seat (5) is provided with limiting pinholes corresponding one to one with the fixed pinholes on the base (1).

3. A chip aging test socket according to claim 1 or 2, characterized in that: The bottom of the base (1) is provided with a groove matching the position-limiting connection seat, and the position-limiting connection seat (5) is buckled on the base (1).

4. The chip aging test socket according to claim 1, characterized in that: The clamping assembly (10) comprises a clamping lock plate (101), a clamping spring (102) and an auxiliary rocker (103); the clamping spring (102) is connected to the side of the base (1); the top end of the clamping spring (102) is connected to one end of the clamping lock plate (101); and the side of one end of the clamping lock plate (101) is connected to the base (1) via a rotating shaft; the other end of the clamping spring (102) is pressed onto the chip adapter plate (8) under the reaction force of the clamping spring (102); the auxiliary rocker (103) is connected to the chip connection seat (4); when the auxiliary rocker (103) is pressed down on the chip connection seat (4), the lower end of the auxiliary rocker (103) rockers the clamping lock plate (101) so that the other end of the clamping lock plate (101) is separated from the chip adapter plate (8).

5. The chip aging test socket according to claim 1, characterized in that: The elastic connecting members (7) are springs, which are arranged at four corners of the base.

6. The chip aging test socket according to claim 1, characterized in that: The ball clamping hole comprises a ball clamping hole body and a ball clamping guide column, the ball clamping guide column is connected to the chip connection seat (4), and the ball clamping guide column is located at the center of the ball clamping hole body. A through hole for passing a metal probe is provided between the ball clamping guide column and the ball clamping hole body. The metal probe is in a "Y"-shaped structure, and the ball clamping guide column is located in the middle of the "Y"-shaped metal probe. When the chip connection seat (4) is pressed down, the ball clamping guide column separates the upper half of the "Y"-shaped metal probe.

7. The chip aging test socket according to claim 1, characterized in that: The base (1) is connected to a guide column (11), and the chip connection seat (4) is provided with a guide hole that matches the guide column.

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