Special-shaped sample clamp based on electronic probe test

Abstract

The utility model provides a special-shaped sample clamp based on electronic probe testing, which comprises a sample tank, a spring and a sample tray are arranged in the sample tank, the spring is vertically fixed at the bottom of the sample tank, the sample tray is fixed on the spring, and the sample tray is provided with a tray round hole; the limiting cover is detachably connected to the sample tank, and a limiting round hole is formed in the limiting cover; the special-shaped sample is placed on the tray round hole, the test surface of the special-shaped sample is exposed out of the limiting round hole, and the spring is in a compressed state, so that the special-shaped sample is tightly pressed between the sample tray and the limiting cover. The special-shaped sample is placed between the sample tray and the limiting cover, and the test surface of the special-shaped sample is exposed from the limiting round hole of the limiting cover through the bounce of the spring in a compressed state, so that the special-shaped sample does not shake during testing, and the accuracy of a test result is not influenced.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic probe analysis, in particular to a special-shaped sample fixture based on electronic probe testing. Background Art

[0002] The electron probe can perform qualitative or quantitative analysis on the chemical composition of a tiny area (micrometer level) in a sample, and can perform point and line scanning (to obtain layer component distribution information) and surface scanning analysis (to obtain surface component distribution images). Compared with complex chemical qualitative or quantitative analysis methods, the electron probe technology has the advantages of quick and easy operation, straightforward experimental results, no damage to the sample during the analysis process, and high measurement accuracy. Therefore, it is increasingly widely used in metallurgy, geology, jewelry, electronic materials, biology, medicine, archaeology and other fields, and is an important tool for mineral testing and analysis and sample composition analysis.

[0003] The sample stage is an essential sample carrier in the process of electron probe testing. Its structural design affects the shape and size of the sample to be tested. Generally, the samples to be tested include targets, thin slices, and optical slices. Conventional sample stages are only used to load samples of a single size, such as a porous sample stage with a diameter of 2.6 mm for loading a single mineral target, or a sample stage for loading a probe sheet. However, jewelry samples are mostly faceted due to their economic value, and the samples cannot be processed by target making or grinding. As a result, if the jewelry samples are placed on a conventional sample stage during testing, it is difficult to ensure that the samples are placed flat, and the samples are prone to shaking during the test, so accurate quantitative analysis data cannot be obtained. Summary of the invention

[0004] In view of the deficiencies in the prior art, the utility model provides a special-shaped sample fixture based on electronic probe testing, in which the special-shaped sample is placed between a sample tray and a limiting cover, and the test surface of the special-shaped sample is exposed from the limiting circular hole of the limiting cover through the rebound force of the spring in a compressed state. During the test, the special-shaped sample will not shake, and the accuracy of the test result will not be affected.

[0005] The technical solution adopted to achieve the above-mentioned purpose of the utility model is:

[0006] A special-shaped sample fixture based on electronic probe testing, the special-shaped sample fixture based on electronic probe testing comprising:

[0007] A sample tank, wherein a spring and a sample tray are arranged inside the sample tank, the spring is vertically fixed to the bottom of the sample tank, the sample tray is fixed on the spring, and a tray round hole is arranged on the sample tray;

[0008] A limit cover, which is detachably connected to the sample tank, and a limit circular hole is provided on the limit cover;

[0009] The special-shaped sample is placed on the circular hole of the tray, the test surface of the special-shaped sample is exposed from the limiting circular hole, and the spring is in a compressed state, so that the special-shaped sample is pressed tightly between the sample tray and the limiting cover.

[0010] The limit cover is a split structure, including a lower cover and a cover plate fixed on the upper surface of the lower cover, the lower cover is provided with a first limit circular hole, the cover plate is provided with a second limit circular hole, and the centers of the first limit circular hole and the second limit circular hole are on a vertical line.

[0011] The diameter of the first limiting circular hole is greater than the diameter of the second limiting circular hole, and the size of the first limiting circular hole is greater than the size of the maximum cross-section of the special-shaped sample.

[0012] The cover plate is an aluminum alloy sheet, and the thickness of the aluminum alloy sheet is 1 mm.

[0013] The first limiting circular hole and the second limiting circular hole are respectively arranged at the center of the lower cover and the cover plate.

[0014] The spring is fixed at the center of the bottom of the sample tank, and the vertical center lines of the spring, the sample tray, the circular hole of the tray and the limiting circular hole are all in a straight line.

[0015] The size of the circular hole of the tray is smaller than the size of the maximum cross section of the special-shaped sample.

[0016] When the irregularly shaped sample is placed on the circular hole of the tray and the spring is not compressed, the height distance between the circular hole of the tray and the limiting circular hole is smaller than the height distance of the irregularly shaped sample between the circular hole of the tray and the limiting circular hole.

[0017] An external thread is arranged on the top outer wall of the sample tank, and an internal thread is arranged on the inner wall of the limiting cover. The external thread and the internal thread match each other, so that the limiting cover and the sample tank are detachably connected.

[0018] The bottom of the sample tank is provided with a dovetail groove matching the equipment base of the electronic probe, so that the sample tank can be placed stably.

[0019] Compared with the prior art, the special-shaped sample fixture based on electronic probe testing provided by the utility model has the following advantages: (1) In the utility model, the special-shaped sample is placed between the sample tray and the limiting cover, and the test surface of the special-shaped sample is exposed from the limiting circular hole of the limiting cover through the rebound force under the compressed state of the spring, and the test surface will not shake, which will not affect the accuracy of the test result.

[0020] (2) The limit cover in the utility model is a split structure, and the cover plate is an aluminum alloy sheet with a thickness of 1 mm, which can prevent the cover plate from blocking the signal collection at the edge of the sample.

[0021] (3) In the utility model, the sample tray and the sample tank are detachably connected via internal and external threads, which facilitates quick sample replacement and improves test efficiency.

[0022] (4) The bottom of the sample jar in the utility model is provided with a dovetail groove, which can ensure the stable placement of the sample jar. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 A structural diagram of a special-shaped sample fixture based on an electronic probe test provided by the utility model;

[0024] Figure 2 A cross-sectional view of a special-shaped sample fixture based on an electron probe test provided by the utility model;

[0025] Figure 3 A top view of a special-shaped sample fixture based on an electronic probe test provided by the utility model;

[0026] Figure 4 This is a structural diagram of the limit cover in the utility model;

[0027] Figure 5 It is a cross-sectional view of the limit cover in the utility model;

[0028] In the figure: 1-sample jar, 2-spring, 3-sample tray, 4-tray circular hole, 5-limiting cover, 51-lower cover, 52-cover plate, 61-first limiting circular hole, 62-second limiting circular hole, 7-external thread, 8-internal thread, 9-dovetail groove. DETAILED DESCRIPTION

[0029] The utility model is described in detail below with reference to the accompanying drawings.

[0030] The structure of the special-shaped sample fixture based on the electronic probe test provided by the utility model is as follows: Figure 1-Figure 3 As shown, the special-shaped sample fixture based on the electron probe test includes at least a sample tank 1, a spring 2 and a sample tray 3 are arranged in the sample tank, in this embodiment, the spring is vertically fixed at the center of the bottom of the sample tank, the sample tray is fixed on the spring, a tray circular hole 4 is arranged on the sample tray, and the vertical center lines of the spring, the sample tray and the tray circular hole are all in a straight line. The tested special-shaped sample is placed on the tray circular hole. In order to ensure that the sample does not fall out of the tray circular hole, the size of the tray circular hole is smaller than the size of the maximum cross-section of the special-shaped sample, that is, the diameter of the tray circular hole is smaller than the longest vertex line at the maximum cross-section of the special-shaped sample. It should be noted that the cross-section here refers to the horizontal cross-section of the special-shaped sample when it is placed on the tray circular hole. Furthermore, the diameter of the spring is larger than the diameter of the tray circular hole, which facilitates the fixation of the spring and the sample tray.

[0031] In this embodiment, the sample tank is detachably connected with a limited cover 5. Specifically, an external thread 7 is provided on the top outer wall of the sample tank, and an internal thread 8 is provided on the inner wall of the limited cover. The external thread and the internal thread match, so that the limited cover and the sample tank are detachably connected. A limited circular hole is provided on the limited cover. Specifically, the vertical center line of the limited circular hole is in a straight line with the vertical center line of the tray circular hole. Further, when the special-shaped sample is placed on the tray circular hole and the spring is not compressed (equivalent to when the limited cover is not covered), the height distance between the tray circular hole and the limited circular hole is less than the height distance of the special-shaped sample between the tray circular hole and the limited circular hole, so that when the limited cover is covered, the special-shaped sample compresses the spring downward. It should be noted that the height distance of the special-shaped sample between the tray circular hole and the limited circular hole refers to the height distance of the special-shaped sample between the tray circular hole and the limited circular hole when the special-shaped sample is pressed by the spring rebound force.

[0032] When the limit cover is connected to the sample jar, the limit cover covers the irregular sample, so that the test surface of the irregular sample is exposed from the limit circular hole, and the spring is in a compressed state at this time, providing rebound force for the irregular sample, so that the irregular sample is clamped between the sample tray and the limit cover.

[0033] In this embodiment, the limit cover is a split structure. Figure 4 and Figure 5 As shown, it includes a lower cover 51 and a cover plate 52 fixed on the upper surface of the lower cover, and the internal thread is arranged on the inner wall of the lower cover. A first limiting circular hole 61 is arranged on the lower cover, and a second limiting circular hole 62 is arranged on the cover plate, and the centers of the first limiting circular hole and the second limiting circular hole are on a vertical line. Specifically, the first limiting circular hole and the second limiting circular hole are arranged at the center of the lower cover and the cover plate, respectively. Preferably, the diameter of the first limiting circular hole is greater than the diameter of the second limiting circular hole, and the size of the first limiting circular hole is greater than the size of the maximum cross-section of the irregular sample, that is, the diameter of the first limiting circular hole is greater than the longest vertex line at the maximum cross-section of the irregular sample. It should be noted that the cross-section here refers to the horizontal cross-section of the irregular sample when it is placed on the circular hole of the tray. Specifically, the cover plate is an aluminum alloy sheet with a thickness of 1 mm to prevent the cover plate from blocking the signal acquisition at the edge position of the irregular sample.

[0034] In this embodiment, a dovetail groove 9 matching the device base of the electron probe is provided at the bottom of the sample tank, so that the sample tank can be stably placed on the device base.

[0035] The method of using the special-shaped sample clamp based on electronic probe testing provided by the utility model is: open the limit cover, place the special-shaped sample on the circular hole of the tray, cover the limit cover, the test surface of the special-shaped sample extends from the first limit hole and the second limit hole, and compresses the spring, and under the action of the rebound force of the spring, the special-shaped sample is clamped between the sample tray and the limit cover. During the test, the special-shaped sample will not shake and will not affect the test data.

Claims

1. A special-shaped sample fixture based on electron probe testing, characterized in that: The special-shaped sample fixture based on electron probe testing includes: A sample tank, wherein a spring and a sample tray are arranged inside the sample tank, the spring is vertically fixed to the bottom of the sample tank, the sample tray is fixed on the spring, and a tray round hole is arranged on the sample tray; A limit cover, which is detachably connected to the sample tank, and a limit circular hole is provided on the limit cover; The special-shaped sample is placed on the circular hole of the tray, the test surface of the special-shaped sample is exposed from the limiting circular hole, and the spring is in a compressed state, so that the special-shaped sample is pressed tightly between the sample tray and the limiting cover.

2. The special-shaped sample fixture based on electron probe testing according to claim 1, characterized in that: The limit cover is a split structure, including a lower cover and a cover plate fixed on the upper surface of the lower cover, the lower cover is provided with a first limit circular hole, the cover plate is provided with a second limit circular hole, and the centers of the first limit circular hole and the second limit circular hole are on a vertical line.

3. The special-shaped sample fixture based on electron probe testing according to claim 2, characterized in that: The diameter of the first limiting circular hole is greater than the diameter of the second limiting circular hole, and the size of the first limiting circular hole is greater than the size of the maximum cross-section of the special-shaped sample.

4. The special-shaped sample fixture based on electron probe testing according to claim 2, characterized in that: The cover plate is an aluminum alloy sheet, and the thickness of the aluminum alloy sheet is 1 mm.

5. The special-shaped sample fixture based on electron probe testing according to claim 4, characterized in that: The first limiting circular hole and the second limiting circular hole are respectively arranged at the center of the lower cover and the cover plate.

6. The special-shaped sample fixture based on electron probe testing according to claim 1, characterized in that: The spring is fixed at the center of the bottom of the sample tank, and the vertical center lines of the spring, the sample tray, the circular hole of the tray and the limiting circular hole are all in a straight line.

7. The special-shaped sample fixture based on electron probe testing according to claim 1, characterized in that: The size of the circular hole of the tray is smaller than the size of the maximum cross section of the special-shaped sample.

8. The special-shaped sample fixture based on electron probe testing according to claim 1, characterized in that: When the irregularly shaped sample is placed on the circular hole of the tray and the spring is not compressed, the height distance between the circular hole of the tray and the limiting circular hole is smaller than the height distance of the irregularly shaped sample between the circular hole of the tray and the limiting circular hole.

9. The special-shaped sample fixture based on electron probe testing according to claim 1, characterized in that: An external thread is arranged on the top outer wall of the sample tank, and an internal thread is arranged on the inner wall of the limit cover. The external thread and the internal thread match each other, so that the limit cover and the sample tank are detachably connected.

10. The special-shaped sample fixture based on electron probe testing according to claim 1, characterized in that: The bottom of the sample tank is provided with a dovetail groove matching the equipment base of the electronic probe, so that the sample tank can be placed stably.

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