Silicon wafer appearance optical detection assembly for solar cell texturing process

Abstract

The utility model discloses a silicon wafer appearance optical detection assembly for a solar cell texturing process, which belongs to the technical field of solar cell production and processing and comprises an industrial camera and a lighting device, the industrial camera and the lighting device are both mounted on a mounting rack, a second connecting rod is slidably connected between the industrial camera and the mounting rack, and the second connecting rod is movably connected with the mounting rack. A transverse rod is slidably connected between the lighting equipment and the mounting frame, the industrial camera is fixedly connected with the second connecting rod, the lighting equipment is rotatably connected with the transverse rod, and a light reflecting structure is slidably connected to one side of the lighting equipment. Compared with the prior art, the silicon wafer appearance optical detection assembly for the solar cell texturing process is convenient for adjusting lighting equipment, realizes irradiation of silicon wafers with different specifications, improves the quality of appearance optical detection, and in addition, under the condition that the lighting equipment is not used for a long time, the quality of the silicon wafer appearance optical detection is improved. And the lighting equipment can be protected through the light reflecting structure.

Description

Technical Field

[0001] The utility model belongs to the technical field of solar cell production and processing, and in particular relates to a silicon chip appearance optical detection component used in a solar cell texturing process. Background Art

[0002] The production process of solar cells includes the process of texturing silicon wafers. The process of texturing silicon wafers is a process to obtain a light-trapping structure to reduce light reflection, remove organic contamination and impurities on the surface of solar cells, and improve the surface structure. After the silicon wafers are texturized, they need to be inspected to detect whether there are still organic contamination and impurities on the surface of the silicon wafers, and to detect surface damage after texturing. In the prior art, solar cell inspection is achieved through industrial cameras and lighting equipment.

[0003] The surface of the silicon wafer is illuminated by lighting equipment, and then the solar cell is photographed by an industrial camera. After analysis by the Internet of Things module, the silicon wafer is classified or downgraded. However, the existing lighting equipment cannot be adjusted, and it is not convenient to illuminate silicon wafers of different specifications, which makes the appearance inspection effect mediocre. In addition, when the lighting equipment is not used for a long time, the light-emitting part of the lighting equipment is exposed to the outside, which is easy to accumulate dust and affect the illumination.

[0004] The information disclosed in this background technology section is only intended to increase the understanding of the overall background of the present invention, and should not be regarded as acknowledging or suggesting in any form that the information constitutes the prior art already known to a person skilled in the art. Utility Model Content

[0005] The purpose of the utility model is to provide an optical inspection component for the appearance of silicon wafers used in the texturing process of solar cells, which is convenient for adjusting the lighting equipment, so as to realize the irradiation of silicon wafers of different specifications and improve the quality of the optical inspection of the appearance. In addition, when the lighting equipment is not used for a long time, the lighting equipment can be protected by the reflective structure. The reflective structure can also increase the brightness of the light irradiated on the silicon wafer, making it more convenient for industrial cameras to take pictures.

[0006] In order to achieve the above purpose, the technical solution provided by a specific embodiment of the utility model is as follows:

[0007] An optical inspection component for the appearance of silicon wafers used in the texturing process of solar cells comprises an industrial camera and a lighting device, wherein the industrial camera and the lighting device are both mounted on a mounting frame, a second connecting rod is slidably connected between the industrial camera and the mounting frame, a cross bar is slidably connected between the lighting device and the mounting frame, the industrial camera and the second connecting rod are fixedly connected, the lighting device and the cross bar are rotatably connected, and a reflective structure is slidably connected to one side of the lighting device.

[0008] In one or more embodiments of the present invention, a second slide groove is provided on the opposite surface of the mounting frame, a first slider is slidably connected in the second slide groove, and the second connecting rod is fixedly connected to the first slider via a first bolt.

[0009] In one or more embodiments of the present invention, a first slide groove is provided on one side surface of the mounting frame, a second slider is slidably connected in the first slide groove, and the cross bar is fixedly connected to the second slider by a second bolt.

[0010] In one or more embodiments of the present invention, a pair of protrusions are fixedly connected to a side wall of the cross bar away from the mounting frame, and the lighting device is rotatably connected between the pair of protrusions.

[0011] In one or more embodiments of the utility model, a first threaded hole is provided on the lighting device, a first through hole matching the first threaded hole is provided on the protrusion, a first bolt is threadedly connected between the protrusion and the lighting device, and the first bolt passes through the first through hole and is threadedly connected to the first threaded hole.

[0012] In one or more embodiments of the present invention, a circular block is fixedly connected to the side wall of the lighting device, and a first connecting rod for supporting the reflective structure is slidably connected inside the circular block.

[0013] In one or more embodiments of the present invention, the reflective structure and the first connecting rod are rotatably connected.

[0014] In one or more embodiments of the present invention, the first connecting rod includes a first rod body and a second rod body, and the first rod body and the second rod body are rotatably connected.

[0015] In one or more embodiments of the present invention, a second threaded hole is formed at one end of the first connecting rod away from the reflective structure, and a blocking block matching the second threaded hole is threadedly connected to the first connecting rod.

[0016] In one or more embodiments of the present invention, the reflective structure is one of a convex mirror, a concave mirror or a plane mirror.

[0017] Compared with the prior art, the utility model's silicon wafer appearance optical detection component for the solar cell texturing process facilitates adjustment of the lighting equipment, realizes irradiation of silicon wafers of different specifications, and improves the quality of appearance optical detection. In addition, when the lighting equipment is not used for a long time, the lighting equipment can be protected by the reflective structure. The reflective structure can also increase the brightness of the light irradiated on the silicon wafer, making it easier for industrial cameras to shoot. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 This is the installation intention of the optical detection component of the appearance of silicon wafer used in the solar cell texturing process in one embodiment of the utility model;

[0020] Figure 2 It is a side view of a silicon wafer appearance optical detection assembly for a solar cell texturing process in one embodiment of the utility model;

[0021] Figure 3 It is a partial exploded view of a silicon wafer appearance optical detection assembly for a solar cell texturing process in one embodiment of the utility model;

[0022] Figure 4 This is a schematic diagram of the use status of the silicon wafer appearance optical detection component used in the solar cell texturing process in one embodiment of the utility model;

[0023] Figure 5 This is a schematic diagram of a non-use state of a silicon wafer appearance optical detection assembly for a solar cell texturing process in an embodiment of the utility model;

[0024] Figure 6 This is a flow chart of the use of a silicon wafer appearance optical detection component for a solar cell texturing process in one embodiment of the utility model.

[0025] Description of main reference numerals:

[0026] 1. Mounting frame; 101. First slide slot; 102. Second slide slot; 2. Industrial camera; 201. Sunshade; 3. Lighting equipment; 301. Circular block; 302. First threaded hole; 4. Cross bar; 401. Bump; 4011. First through hole; 402. Second through hole; 5. First connecting rod; 501. First rod body; 5011. Second threaded hole; 502. Second rod body; 6. Block; 7. Second connecting rod; 701. Third through hole; 8. First bolt; 9. Reflective structure; 901. Magnetic block; 10. Second bolt; 11. Third bolt; 12. Rubber pad. DETAILED DESCRIPTION

[0027] In order to enable those skilled in the art to better understand the technical solutions in the present invention, the following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0028] like Figure 1 to Figure 6 As shown, the optical inspection component for the appearance of silicon wafers used in the solar cell texturing process in one embodiment of the utility model includes an industrial camera 2 and a lighting device 3, both of which are mounted on a mounting frame 1. The industrial camera 2 is mounted on the upper end of the lighting device 3, and the lighting device 3 is used to shoot the silicon wafer. After the shooting is completed, the shooting is uploaded through the Internet of Things module, and the shooting part is analyzed through the analysis module. The lighting device 3 can illuminate the surface of the silicon wafer with strong light, so that the industrial camera 2 can shoot more clearly during the shooting process.

[0029] like Figure 1-2 As shown, a second connecting rod 7 is slidably connected between the mounting frame 1 and the industrial camera 2, and the industrial camera 2 is fixedly connected to the second connecting rod 7, that is, the industrial camera 2 can slide along the second connecting rod 7, so as to adjust the distance between the industrial camera 2 and the silicon wafer, so that when the industrial camera 2 shoots silicon wafers of different specifications, the position of the industrial camera 2 can be adjusted, so that the shooting of the industrial camera 2 is clearer.

[0030] The industrial camera 2 is also provided with a shading plate 201, which can block unnecessary light to prevent glare and light spots from affecting the imaging effect.

[0031] Specifically, Figure 1 As shown, the second slide grooves 102 are provided on the opposite surfaces of the two mounting frames 1, the first slider is slidably connected in the second slide grooves 102, and the first bolt 8 is threadedly connected to the first slider through the third through hole 701. That is, the second connecting rod 7 and the first slider are fixed by the first bolt 8, and the second connecting rod 7 can be locked on the mounting frame 1, and the position of the second connecting rod 7 is fixed.

[0032] like Figure 1 As shown, a crossbar 4 is installed between the lighting device 3 and the mounting frame 1, the crossbar 4 is slidably connected to the mounting frame 1, the lighting device 3 is fixedly connected to the crossbar 4, and the sliding lighting device 3 can slide with the crossbar 4 to adjust the position of the lighting device 3. This allows the lighting device 3 to better illuminate the surface of the silicon wafer and cooperate with the industrial camera 2 to shoot and detect the silicon wafer.

[0033] like Figure 1 to Figure 3 As shown, a first slide groove 101 is provided on one side wall of the mounting frame 1, a second slider is slidably connected in the first slide groove 101, a second through hole 402 is provided on the cross bar 4, a second bolt 10 passes through the second through hole 402 and is threadedly connected to the second slider, and when the second bolt 10 is tightened, the cross bar 4 and the first slider can be fastened to the mounting frame 1, thereby locking the position of the cross bar 4.

[0034] like Figure 3 As shown, a pair of protrusions 401 are fixedly connected to the cross bar 4, and a lighting device 3 is rotatably connected between the pair of protrusions 401. By rotating the lighting device 3, the position of the lighting device 3 can be adjusted so that the position of the lighting device 3 can be the same as the position of the industrial camera 2.

[0035] Specifically, a first threaded hole 302 is provided on the lighting device 3, a first through hole 4011 matching the first threaded hole 302 is provided on the protrusion 401, the third bolt 11 passes through the first through hole 4011 and is threadedly connected to the first threaded hole 302, the lighting device 3 is rotatably connected to the protrusion 401 by the third bolt 11, and is then locked by the third bolt 11.

[0036] Preferably, since the industrial camera 2 can slide up and down on the mounting frame 1, and the industrial camera 2 can also slide left and right on the mounting frame 1, when the industrial camera 2 can slide left and right, you can choose to install either the industrial camera 2 or the lighting device 3 first. For example, the lighting device 3 is installed first, and after the lighting device 3 is installed and calibrated, the light can be perfectly irradiated on the silicon wafer. When the industrial camera 2 is installed, the industrial camera 2 is slid up and down and left and right so that the position photographed by the industrial camera 2 can match the position irradiated by the lighting device 3. Conversely, after the industrial camera 2 is installed, the lighting device 3 is slid up and down and rotated so that the position irradiated by the lighting device 3 can match the position photographed by the industrial camera 2.

[0037] like Figure 1 to Figure 5 As shown, the light-emitting part of the lighting device 3 is also provided with a reflective structure 9, and the outer edge of the reflective structure 9 is fixedly connected with a magnetic block 901 matching the lighting device 3. The magnetic block 901 can be adsorbed on the lighting device 3 to protect the light-emitting part of the lighting device 3.

[0038] Specifically, the two sides of the lighting device 3 are fixedly connected with the circular blocks 301, the first connecting rod 5 is slidably connected inside the circular blocks 301, and one end of the first connecting rod 5 is rotatably connected to the reflective structure 9. That is, the reflective structure 9 can cover the lighting device 3 by rotating, and when the lighting device 3 is used, the reflective structure 9 can be rotated to move away from the light-emitting part of the lighting device 3, so that the lighting device 3 can work normally.

[0039] A rubber pad 12 is bonded between the first connecting rod 5 and the inner wall of the circular block 301 , and the rubber pad 12 can make the first connecting rod 5 and the circular block 301 have an interference fit.

[0040] like Figure 1 to Figure 5 As shown, the reflective structure 9 can be a convex mirror, a concave mirror or a plane mirror. The reflective structure 9 can be moved in parallel by the first connecting rod 5 so that the reflective structure 9 is away from the lighting device 3, and then rotated so that the reflective structure 9 can reflect the light emitted by the lighting device 3. The reflective structure 9 reflects the light onto the silicon wafer. Through the reflection of the reflective structure 9, the brightness of the light irradiated on the silicon wafer can be enhanced, thereby making it easier for the industrial camera 2 to perform shooting and detection.

[0041] That is, the reflective structure 9 can enhance the brightness of the light irradiated on the silicon wafer by the lighting device 3 without changing the power of the lighting device 3 , and can ensure that the brightness of the light irradiated on the silicon wafer remains unchanged when the power of the lighting device 3 is reduced.

[0042] like Figure 3 to Figure 5 As shown, the first connecting rod 5 includes a first rod body 501 and a second rod body 502, and the first rod body 501 and the second rod body 502 are rotatably connected, and the position of the reflective structure 9 can be adjusted more conveniently through the first rod body 501 and the second rod body 502. In addition, a second threaded hole 5011 is provided at one end of the first rod body 501 away from the second rod body 502, and a block 6 matching the second threaded hole 5011 is threadedly connected to the first connecting rod 5, and the block 6 prevents the first connecting rod 5 and the circular block 301 from being separated. When the first connecting rod 5 or the reflective structure 9 needs to be replaced, the block 6 can be disassembled, and then the first connecting rod 5 and the reflective structure 9 can be disassembled for replacement.

[0043] During installation, first fix the industrial camera 2 on the upper end of the mounting frame 1, and place a silicon wafer directly below the industrial camera 2 to judge the shooting effect of the industrial camera 2. After the industrial camera 2 is fixed, install the lighting device 3. The lighting device 3 is installed at one end close to the silicon wafer. By sliding up and down and rotating the position of the lighting device 3, the lighting device 3 can be irradiated on the silicon wafer, and then judged by the photos taken by the industrial camera 2. After adjusting the lighting device 3, fix the lighting device 3. Then, by moving the reflective structure 9 away from the lighting device 3, the reflective structure 9 can reflect the light of the lighting device 3, so that the light reflected by the reflective structure 9 can also irradiate on the silicon wafer. The light reflected by the reflective structure 9 can not only enhance the brightness of the light irradiating the silicon wafer, but also play a role in shielding the light, so that the light is not easy to diverge outside.

[0044] The utility model facilitates the adjustment of the position of the silicon wafer appearance optical detection assembly used in the solar cell texturing process, so that the appearance optical detection assembly can complete the shooting and detection of silicon wafers of different specifications. By setting the reflective structure 9, the light emitted by the lighting device 3 can be enhanced, making the light on the silicon wafer brighter. The reflective structure 9 can be adsorbed on one side of the lighting device 3, and when the lighting device 3 is not in use, the lighting device 3 can be protected to prevent dust from adhering to the light-emitting part.

[0045] It is obvious to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be regarded as exemplary and non-restrictive from any point of view, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention. Any reference numeral in a claim should not be regarded as limiting the claim to which it relates.

[0046] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. An optical inspection component for the appearance of silicon wafers used in the texturing process of solar cells, comprising an industrial camera (2) and a lighting device (3), wherein the industrial camera (2) and the lighting device (3) are both mounted on a mounting frame (1), and characterized in that: A second connecting rod (7) is slidably connected between the industrial camera (2) and the mounting frame (1), and a cross bar (4) is slidably connected between the lighting device (3) and the mounting frame (1). The industrial camera (2) and the second connecting rod (7) are fixedly connected, the lighting device (3) and the cross bar (4) are rotatably connected, and a reflective structure (9) is slidably connected to one side of the lighting device (3).

2. The optical inspection component for silicon wafer appearance used in the solar cell texturing process according to claim 1, characterized in that: A second sliding groove (102) is provided on the opposite surface of the mounting frame (1), a first sliding block is slidably connected in the second sliding groove (102), and the second connecting rod (7) is fixedly connected to the first sliding block via a first bolt (8).

3. The optical inspection component for silicon wafer appearance used in the solar cell texturing process according to claim 1, characterized in that: A first sliding groove (101) is provided on one side surface of the mounting frame (1), a second sliding block is slidably connected in the first sliding groove (101), and the cross bar (4) is fixedly connected to the second sliding block via a second bolt (10).

4. The optical inspection component for silicon wafer appearance used in the solar cell texturing process according to claim 3, characterized in that: A pair of protrusions (401) are fixedly connected to a side wall of the cross bar (4) away from the mounting frame (1), and the lighting device (3) is rotatably connected between the pair of protrusions (401).

5. The optical inspection assembly for silicon wafer appearance used in the solar cell texturing process according to claim 4, characterized in that: The lighting device (3) is provided with a first threaded hole (302), the protrusion (401) is provided with a first through hole (4011) matching the first threaded hole (302), a first bolt (8) is threadedly connected between the protrusion (401) and the lighting device (3), and the first bolt (8) passes through the first through hole (4011) and is threadedly connected to the first threaded hole (302).

6. The optical inspection component for silicon wafer appearance used in the solar cell texturing process according to claim 1, characterized in that: A circular block (301) is fixedly connected to the side wall of the lighting device (3), and a first connecting rod (5) for supporting a reflective structure (9) is slidably connected inside the circular block (301).

7. The optical inspection component for the appearance of silicon wafers used in the solar cell texturing process according to claim 6, characterized in that: The reflective structure (9) and the first connecting rod (5) are rotatably connected.

8. The optical inspection assembly for the appearance of silicon wafers used in the solar cell texturing process according to claim 7, characterized in that: The first connecting rod (5) comprises a first rod body (501) and a second rod body (502), and the first rod body (501) and the second rod body (502) are rotatably connected.

9. The optical inspection assembly for silicon wafer appearance used in the solar cell texturing process according to claim 8, characterized in that: A second threaded hole (5011) is formed at one end of the first connecting rod (5) away from the reflective structure (9), and a blocking block (6) matching the second threaded hole (5011) is threadedly connected to the first connecting rod (5).

10. The optical inspection component for silicon wafer appearance used in the solar cell texturing process according to claim 6, characterized in that: The reflective structure (9) is one of a convex mirror, a concave mirror or a plane mirror.

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