Test board and test system

Abstract

The utility model relates to the technical field of test equipment, and particularly discloses a test board and a test system, comprising a test fixture used for placing a device to be tested; and the guide pipe is used for a test ball to pass through and comprises a vertical pipe located right above the device to be tested and a horizontal pipe connected to the upper end of the vertical pipe. The test board and the test system provided by the utility model can test the sensitivity of the device to be tested.

Description

Technical Field

[0001] The utility model relates to the technical field of testing equipment, in particular to a testing platform and a testing system. Background Art

[0002] Piezoelectric sensors are sensors that convert applied force or pressure into an electrical signal. They are based on the piezoelectric effect, which is the ability of certain materials to generate an electrical charge when subjected to physical stress.

[0003] In recent years, people have begun to study the application of piezoelectric sensors in flexible bedding fabrics, with the aim of detecting physiological signs of the human body for intelligent control. In the process of detecting physiological signs of the human body, the sensitivity of the piezoelectric sensor to the change of the electrical signal generated by the pressure is very important.

[0004] Therefore, it is necessary to develop a testing device for performing sensitivity testing on piezoelectric sensors.

[0005] The above information disclosed in this Background section is included only for enhancement of understanding of the background of the present disclosure and therefore it may contain information that does not form the prior art that is currently known to a person of ordinary skill in the art. Utility Model Content

[0006] One purpose of the utility model is to provide a test bench and a test system, which can perform sensitivity test on a device to be tested.

[0007] To achieve the above objectives, on the one hand, the utility model provides a test bench, comprising:

[0008] A test fixture, wherein the test fixture is used to place the device under test;

[0009] A guide tube is provided for the test sphere to pass through, and comprises a vertical tube located directly above the device under test and a horizontal tube connected to the upper end of the vertical tube.

[0010] Optionally, an inclined tube is provided between the vertical tube and the horizontal tube.

[0011] Optionally, a ball placement window for the test ball to pass through is provided on the top surface of one end of the horizontal tube away from the vertical tube.

[0012] Optionally, the vertical tube is a telescopic tube.

[0013] Optionally, it further comprises a fixing bracket for fixing the guide tube, wherein the fixing bracket comprises a vertical pole, a cross bar sliding up and down along the vertical pole, and a locking member for locking and positioning the cross bar on the vertical pole;

[0014] Wherein, the guide tube is installed on the cross bar.

[0015] Optionally, the vertical pole is provided with scale markings.

[0016] Optionally, the guide tube is a transparent structure.

[0017] Optionally, a ball storage box for storing test balls is also included.

[0018] On the other hand, a test system is provided, comprising any of the test benches described above, and an electrical signal receiving device for acquiring changes in electrical signals generated before and after the device under test is impacted by a test ball.

[0019] Optionally, the electrical signal receiving device is electrically connected to the device under test via a wire;

[0020] or,

[0021] The test fixture of the test bench is provided with a probe assembly electrically connected to the device under test, and the electrical signal receiving device is electrically connected to the probe assembly through a wire.

[0022] The beneficial effects of the utility model are: providing a test bench and a test system, placing the device to be tested on a test fixture, placing a test sphere in a horizontal tube, and after the test sphere enters the vertical tube, it moves downward in a state of nearly free fall until it collides with the device to be tested. After the device to be tested is hit, a changing electrical signal is generated, and an electrical signal receiving device receives the electrical signal generated by the device to be tested, so as to evaluate the sensitivity of the device to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0024] Figure 1 A schematic diagram of the structure of a test system provided in an embodiment.

[0025] In the figure:

[0026] 100. test bench; 200. electric signal receiving device; 300. test sphere; 400. device to be tested;

[0027] 1. Test fixture;

[0028] 2. Guide tube; 201. Vertical tube; 202. Horizontal tube; 2021. Ball release window; 203. Inclined tube; 204. Baffle;

[0029] 3. Fixed bracket; 301. Vertical pole; 3011. Scale mark; 302. Crossbar; 303. Locking piece;

[0030] 4. Ball storage box. DETAILED DESCRIPTION

[0031] In order to make the purpose, features and advantages of the utility model more obvious and easy to understand, the technical scheme in the embodiment of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiment of the utility model. Obviously, the embodiment described below is only a part of the embodiment of the utility model, not all of the embodiments. Based on the embodiment of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0032] In the description of the present utility model, it is to be understood that when a component is considered to be "connected" to another component, it may be directly connected to the other component or there may be a centrally arranged component at the same time. When a component is considered to be "set on" another component, it may be directly set on the other component or there may be a centrally arranged component at the same time.

[0033] In addition, terms such as "long", "short", "inside" and "outside" indicating directions or positional relationships are based on the directions or positional relationships shown in the accompanying drawings and are only used to facilitate the description of the present invention. They do not indicate or imply that the device or component referred to must have this specific direction or operate with a specific direction structure, and should not be understood as a limitation of the present invention.

[0034] The present invention will be described in detail below in conjunction with the specific embodiments shown in the accompanying drawings. However, these embodiments do not limit the present invention, and any structural, methodological, or functional changes made by a person skilled in the art based on these embodiments are all within the scope of protection of the present invention.

[0035] The utility model provides a test bench and a test system, which are used for detecting a device to be tested, such as a piezoelectric sensor, which will generate an electrical signal change after being pressurized.

[0036] See also Figure 1 The test system provided in this embodiment includes a test bench 100 and an electrical signal receiving device 200 .

[0037] The test bench 100 includes a test fixture 1 for placing a device under test 400, a guide tube 2, a fixing bracket 3 for fixing the guide tube 2, and a ball storage box 4 for storing a plurality of test balls 300. The guide tube 2 is for the test ball 300 to pass through, and includes a vertical tube 201 located directly above the device under test 400 and a horizontal tube 202 connected to the upper end of the vertical tube 201. Furthermore, an inclined tube 203 is provided between the vertical tube 201 and the horizontal tube 202, so that the test ball 300 can be smoothly transferred from the horizontal tube 202 to the vertical tube 201.

[0038] The electrical signal receiving device 200 is used to obtain the electrical signal changes generated by the device under test 400 before and after it is hit by the test ball 300, and can be directly electrically connected to the device under test 400 through a wire (in this case, the test fixture 1 is only used to fix the device under test 400); or, the test fixture 1 of the test bench 100 is provided with a probe assembly electrically connected to the device under test 400, and the electrical signal receiving device 200 is electrically connected to the probe assembly through a wire, thereby achieving electrical connection with the device under test 400.

[0039] The test bench 100 and the test system provided in the present embodiment, after placing the device under test 400 on the test fixture 1, take out the test sphere 300 from the ball storage box 4, and then put the test sphere 300 into the horizontal tube 202. As the number of test spheres 300 in the horizontal tube 202 increases, the test sphere 300 closest to the vertical tube 201 will first enter the vertical tube 201 (of course, the test sphere 300 can also be gently moved to make the test sphere 300 enter the vertical tube 201), and move downward in a state of nearly free fall until it collides with the device under test 400. After the device under test 400 is hit, a changing electrical signal will be generated. The electrical signal receiving device 200 receives the electrical signal generated by the device under test 400, and the sensitivity of the device under test 400 can be evaluated.

[0040] Optionally, the electrical signal receiving device 200 is an oscilloscope, which can plot the electrical signal generated by the device under test 400 into an electrical signal curve. Whenever a test ball 300 hits the device under test 400, the electrical signal curve should form a peak.

[0041] If the test sphere 300 hits the device under test 400 when the height of the horizontal tube 202 is low, the device under test 400 can still generate an obvious peak, which means that the sensitivity of the device under test 400 is high; on the contrary, if the height of the horizontal tube 202 needs to be adjusted to a higher position, the test sphere 300 hits the device under test 400, and the device under test 400 can generate an obvious peak, which means that the sensitivity of the device under test 400 is low;

[0042] Furthermore, since each test sphere 300 starts to fall from the same height, theoretically, the heights of the peaks in the electrical signal curve should be similar. If the height differences between the peaks are large, it means that if the device under test 400 is used for pressure testing, the reliability of the test results is poor.

[0043] In some other embodiments, the electrical signal receiving device 200 may also be a data acquisition card for converting the analog signal generated by the device under test 400 into a digital signal for computer processing and storage, etc., which is not limited in the present invention.

[0044] In this embodiment, a ball placement window 2021 for the test ball 300 to pass through is provided on the top surface of the horizontal tube 202 away from the vertical tube 201, and a baffle 204 is provided on the end surface of the horizontal tube 202 away from the vertical tube 201 to prevent the test ball 300 from escaping from the guide tube 2. The tester can place the test ball 300 into the guide tube 2 from top to bottom, which is convenient for operation.

[0045] Optionally, the vertical tube 201 is a telescopic tube. When the test sphere 300 needs to hit the device under test 400 at a faster speed, the vertical tube 201 is extended so that the position of the horizontal tube 202 is higher. In this way, the initial gravitational potential energy of the test sphere 300 is larger, so the speed when hitting the device under test 400 is also faster;

[0046] Similarly, when the test sphere 300 needs to hit the DUT 400 at a slower speed, the vertical tube 201 is shortened so that the horizontal tube 202 is at a lower position. In this way, the initial gravitational potential energy of the test sphere 300 is smaller, so the speed when hitting the DUT 400 is also slower.

[0047] In this embodiment, the fixing bracket 3 includes a vertical rod 301, a horizontal rod 302 that slides up and down along the vertical rod 301, and a locking member 303 (for example, the locking member 303 may be a locking bolt or a spring latch, etc.) for locking and positioning the horizontal rod 302 on the vertical rod 301; wherein the guide tube 2 is mounted on the horizontal rod 302. By loosening the locking member 303, the position of the guide tube 2 can be adjusted up and down, thereby adjusting the pressure applied by the test sphere 300 to the device under test 400.

[0048] Furthermore, a scale mark 3011 is provided on the vertical pole 301 , and the distance of the upward or downward adjustment of the horizontal pole 302 can be known according to the scale mark 3011 .

[0049] Optionally, the guide tube 2 is a transparent structure, so as to observe whether there are foreign objects in the tube that affect the free fall motion of the test sphere 300 and thus affect the test results, and it is also convenient to clean the foreign objects.

[0050] In summary, the test bench 100 and the test system provided in this embodiment have the following advantages:

[0051] ① Place the device under test 400 on the test fixture 1 and the test sphere 300 into the horizontal tube 202. After the test sphere 300 enters the vertical tube 201, it moves downward in a state of almost free fall until it collides with the device under test 400. After the device under test 400 is hit, a changing electrical signal is generated. The electrical signal receiving device 200 receives the electrical signal generated by the device under test 400, and the sensitivity of the device under test 400 can be evaluated;

[0052] ② The top surface of the horizontal tube 202 away from the end of the vertical tube 201 is provided with a ball placement window 2021 for the test ball 300 to pass through, and the tester can put the test ball 300 into the guide tube 2 from top to bottom, which is convenient for operation;

[0053] ③ The vertical tube 201 is a telescopic tube, and the height of the cross bar 302 is adjustable so as to adjust the final speed of the test ball 300.

[0054] It should be understood that although this specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each implementation mode may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

[0055] The series of detailed descriptions listed above are only specific descriptions of feasible implementation methods of the utility model. They are not intended to limit the protection scope of the utility model. Any equivalent implementation methods or changes that do not deviate from the technical spirit of the utility model should be included in the protection scope of the utility model.

Claims

1. A test bench, characterized in that: include: A test fixture (1), the test fixture (1) being used to place a device to be tested (400); A guide tube (2), the guide tube (2) being used for the test sphere (300) to pass through, comprising a vertical tube (201) located directly above the device to be tested (400) and a horizontal tube (202) connected to the upper end of the vertical tube (201).

2. The test bench according to claim 1, characterized in that: An inclined tube (203) is provided between the vertical tube (201) and the horizontal tube (202).

3. The test bench according to claim 1, characterized in that: A ball placement window (2021) for the test ball (300) to pass through is provided on the top surface of one end of the horizontal tube (202) away from the vertical tube (201).

4. The test bench according to claim 1, characterized in that: The vertical tube (201) is a telescopic tube.

5. The test bench according to claim 1, characterized in that: It also comprises a fixing bracket (3) for fixing the guide tube (2), wherein the fixing bracket (3) comprises a vertical rod (301), a horizontal rod (302) sliding up and down along the vertical rod (301), and a locking member (303) for locking and positioning the horizontal rod (302) on the vertical rod (301); Wherein, the guide tube (2) is installed on the cross bar (302).

6. The test bench according to claim 5, characterized in that: The vertical pole (301) is provided with a scale mark (3011).

7. The test bench according to claim 1, characterized in that: The guide tube (2) is a transparent structure.

8. The test bench according to claim 1, characterized in that: Also included is a ball storage box (4) for storing the test balls (300).

9. A testing system, characterized in that: The invention comprises a test bench (100) as claimed in any one of claims 1 to 8, and an electrical signal receiving device (200) for acquiring electrical signal changes generated before and after a device under test (400) is hit by a test ball (300).

10. The test system according to claim 9, characterized in that: The electrical signal receiving device (200) is electrically connected to the device under test (400) via a wire; or, The test fixture (1) of the test bench (100) is provided with a probe assembly electrically connected to the device under test (400), and the electrical signal receiving device (200) is electrically connected to the probe assembly via a wire.

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