Testing assembly and sorting machine with same

Abstract

The utility model provides a testing assembly and a sorting machine with the same, the testing assembly is used for testing a piece to be tested, and the testing assembly comprises a support frame; the testing part is arranged below the supporting frame and provided with a first light through hole in a penetrating mode, and the to-be-tested piece is located at the lower end of the first light through hole; the light source part is arranged above the testing part, the light source part is provided with a light emitting part, and the light emitting part is arranged corresponding to the first light through hole; and the temperature adjusting part is arranged between the testing part and the light source part and can adjust the temperature of the to-be-tested piece. According to the technical scheme, the problem that a chip floating test device in the related technology is difficult to consider different temperature tests and light environment tests at the same time can be effectively solved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing equipment, in particular to a testing component and a sorting machine having the same. Background Art

[0002] In the field of chip testing, the three-temperature floating test device is a special chip testing equipment used to test chips at different temperatures. This three-temperature floating test device can simulate various situations in actual use under three temperature environments: high temperature, normal temperature, and low temperature, and conduct a comprehensive performance test on the chip. During the test, the chip to be tested is placed on the three-temperature floating test device, and then the temperature is adjusted as needed to adjust the temperature of the chip to be tested. The advantage of the three-temperature floating test device is that it can simulate various temperature environments in actual use and detect the performance of the chip at different temperatures. This helps to discover and solve problems that may occur in chips at extreme temperatures and improve the reliability and stability of the product.

[0003] However, when facing some photosensitive chips that need to be tested at different temperatures, the three-temperature floating test device in the related art can only achieve the adjustment of different temperatures, but cannot provide a light test environment. Therefore, there is a problem in the art that the chip floating test device is difficult to take into account both different temperature tests and light environment tests. Utility Model Content

[0004] The main purpose of the utility model is to provide a test assembly and a sorting machine having the same, so as to solve the problem that the chip floating test device in the related art is difficult to take into account different temperature tests and light environment tests.

[0005] In order to achieve the above-mentioned purpose, according to one aspect of the utility model, a test component is provided for testing a test piece, and the test component includes: a support frame; a test part, which is arranged below the support frame and has a first light-through hole extending therethrough, and the test piece is located at the lower end of the first light-through hole; a light source part, which is arranged above the test part, and the light source part has a light-emitting part, and the light-emitting part is arranged corresponding to the first light-through hole; a temperature adjustment part, which is arranged between the test part and the light source part and can adjust the temperature of the test piece.

[0006] Furthermore, the test assembly also includes a heat insulation part arranged between the light source part and the temperature adjustment part.

[0007] Furthermore, the temperature adjustment part includes a substrate and a cooling element and a heating element arranged on the substrate.

[0008] Furthermore, the heat insulation part is a plate-like structure that is fitted with the lower end of the light source part, a second light hole is penetrated through the heat insulation part, a third light hole is penetrated through the substrate, the second light hole, the third light hole and the first light hole are connected in sequence from top to bottom, and the light output part is arranged corresponding to the second light hole.

[0009] Furthermore, a mounting hole is provided on the substrate, and the heating element includes a heating rod inserted into the mounting hole; and / or the cooling element includes a flow channel provided on the substrate and used for passing a low-temperature fluid.

[0010] Furthermore, a vacuum channel is provided on the testing part, and the vacuum channel is communicated with the first light through hole.

[0011] Furthermore, a vacuum flow channel is provided on the test part, and the vacuum flow channel is connected to the first light through hole. The test assembly also includes a first seal, a second seal and a third seal. The first seal is arranged at the connection between the light source part and the second light through hole; the second seal is arranged at the connection between the second light through hole and the third light through hole; the third seal is arranged at the connection between the third light through hole and the first light through hole.

[0012] Furthermore, the light source part and the heat insulation part form a light emitting unit, the light emitting unit is detachably connected to the temperature regulating part, and an avoidance opening is provided on the support frame to avoid the light emitting unit; and / or, a limiting groove is provided on the heat insulation part, and the light source part can cooperate with the limiting groove.

[0013] Furthermore, the test assembly also includes a cylinder connected to the support frame so that the support frame can move up and down.

[0014] According to another aspect of the utility model, a sorting machine is provided, which includes a loading mechanism, a testing mechanism, a receiving mechanism and a conveying mechanism. The testing mechanism includes a supporting platform for placing the test pieces and a testing assembly, and the testing assembly is the above-mentioned testing assembly.

[0015] By applying the technical solution of the utility model, the support frame is used to provide a support base for other structures supporting the test assembly, the light source part is located above the test part, the light source part has a light output part, the light source part is used to output light and provide a light test environment for the test piece, the test part is provided with a first light hole through it, the test piece is located at the lower end of the first light hole, the light output part and the first light hole are provided correspondingly, so that the light emitted from the light output part can act on the test piece through the first light hole; the temperature adjustment part is located between the test part and the light source part, the temperature adjustment part can adjust the temperature of the test piece, so that the test assembly of the present application can provide a light test environment for the test piece and adjust the temperature of the test piece, so that the test piece can be subjected to photosensitivity testing under different temperatures. Therefore, the technical solution of the present application can effectively solve the problem that the chip floating test device in the related art is difficult to take into account different temperature tests and light environment tests. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The drawings constituting part of the present application are used to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation on the present invention. In the drawings:

[0017] Figure 1 A schematic cross-sectional view of an embodiment of a sorting machine according to the utility model is shown;

[0018] Figure 2 Shows Figure 1 An enlarged schematic diagram of part A of the sorting machine;

[0019] Figure 3 Shows Figure 1 A schematic diagram of the three-dimensional structure of a sorting machine;

[0020] Figure 4 Shows Figure 3 An enlarged schematic diagram of part B of the sorting machine.

[0021] The above drawings include the following reference numerals:

[0022] d. Thickness of the insulation part;

[0023] 10. Support frame; 11. Avoid opening;

[0024] 20. Testing part; 21. First light hole; 22. Vacuum flow channel;

[0025] 30. Light source part; 31. Light emitting part;

[0026] 40. Temperature adjustment unit; 41. Base plate; 4111. Third light hole; 4112. Flow channel; 42. Refrigerant connector;

[0027] 50. heat insulation part; 51. second light-through hole; 52. limit groove; 53. first fastener; 54. avoidance groove;

[0028] 61. first sealing member; 62. second sealing member; 63. third sealing member;

[0029] 70. Loading platform;

[0030] 80. Cylinder. DETAILED DESCRIPTION

[0031] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is by no means a limitation on the utility model and its application or use. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the utility model.

[0032] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0033] Unless otherwise specifically stated, the relative arrangement, numerical expressions and numerical values ​​of the parts and steps set forth in these embodiments do not limit the scope of the utility model. At the same time, it should be understood that, for ease of description, the sizes of the various parts shown in the accompanying drawings are not drawn according to the actual proportional relationship. The technology, method and equipment known to those of ordinary skill in the relevant art may not be discussed in detail, but in appropriate cases, the technology, method and equipment should be considered as a part of the specification. In all examples shown and discussed here, any specific value should be interpreted as being merely exemplary, rather than as a limitation. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters represent similar items in the following drawings, and therefore, once a certain item is defined in an accompanying drawing, it does not need to be further discussed in subsequent drawings.

[0034] like Figure 1 as well as Figure 2 As shown, the present application provides a test component for testing a test piece. An embodiment of the test component of the present application includes: a support frame 10, a test part 20, a light source part 30, and a temperature adjustment part 40; the test part 20 is arranged below the support frame 10 and is penetrated by a first light hole 21, and the test piece is located at the lower end of the first light hole 21; the light source part 30 is arranged above the test part 20, and the light source part 30 has a light output part 31, and the light output part 31 is arranged corresponding to the first light hole 21; the temperature adjustment part 40 is arranged between the test part 20 and the light source part 30 and can adjust the temperature of the test piece.

[0035] According to the technical solution of this embodiment, the support frame 10 is used to provide a support base for other structures supporting the test assembly, the light source unit 30 is located above the test unit 20, and the light source unit 30 has a light emitting unit 31, which is used to emit light and provide a light test environment for the test piece, the test unit 20 is provided with a first light hole 21, the test piece is located at the lower end of the first light hole 21, and the light emitting unit 31 is arranged corresponding to the first light hole 21, so that the light emitted from the light emitting unit 31 can act on the test piece through the first light hole 21; the temperature regulating unit 40 is located between the test unit 20 and the light source unit 30, and the temperature regulating unit 40 can adjust the temperature of the test piece, so that the test assembly of this embodiment can provide a light test environment for the test piece and adjust the temperature of the test piece, so that the test piece can be subjected to photosensitivity testing under different temperatures. Therefore, the technical solution of this embodiment can effectively solve the problem that the chip floating test device in the related art is difficult to take into account different temperature tests and light environment tests.

[0036] It should be noted that, in the present embodiment, the light emitting portion 31 is a light outlet disposed at the lower end of the light source portion, and the testing portion 20 and the temperature regulating portion 40 are both plate-shaped structures. “The light emitting portion 31 is disposed correspondingly to the first light through hole 21” means that the light emitting portion 31 and the first light through hole 21 can be directly in contact and conduct light, or other structures can be disposed between the light emitting portion 31 and the first light through hole 21 so that the light emitted by the light emitting portion 31 can pass through the first light through hole 21; and in the present embodiment, other structures (the second light through hole 51 and the third light through hole 4111 mentioned later) are also disposed between the light emitting portion 31 and the first light through hole 21.

[0037] like Figure 1 as well as Figure 2As shown, the test assembly further includes a heat insulating portion 50 disposed between the light source portion 30 and the temperature regulating portion 40. Specifically, in the present embodiment, the heat insulating portion 50 is also a plate-shaped structure, and the heat insulating portion 50 is located between the light source portion 30 and the temperature regulating portion 40 to separate the light source portion 30 from the temperature regulating portion 40. When the temperature regulating portion 40 adjusts the temperature of the test piece, especially when the temperature of the test piece is increased, the temperature regulating portion 40 will transfer heat to the test piece, and the heat insulating portion 50 can prevent the heat transferred by the temperature regulating portion 40 from affecting the normal operation of the light source portion 30, thereby ensuring the stability of the operation of the test assembly. The heat insulating part 50 can be made of polyetheretherketone, which is an important engineering plastic. The heat insulating part 50 can be used at a long-term working temperature of 250°C and can withstand a high temperature of 300°C in an instant. The heat insulating part 50 can maintain high strength and rigidity at high temperatures, and has excellent creep resistance, so that the heat insulating part 50 can maintain a long service life at high temperatures. In addition, the heat insulating part 50 made of polyetheretherketone also has many advantages such as corrosion resistance, hydrolysis resistance, flame retardancy, wear resistance, strong flexibility, and easy processing. The heat insulating part can also be made of other heat insulating materials, such as rock wool board, polyurethane foam material, etc., not limited to the above materials, as long as the heat insulating effect can be achieved.

[0038] like Figure 1 as well as Figure 2 As shown, the temperature adjustment unit 40 includes a substrate 41 and a cooling element and a heating element disposed on the substrate 41. Specifically, the arrangement of the cooling element and the heating element enables the temperature adjustment unit 40 to both increase the temperature of the test piece and decrease the temperature of the test piece, so that the test piece can be in a high temperature, normal temperature or low temperature state.

[0039] like Figure 1 as well as Figure 2 As shown, the heat insulation part 50 is a plate-like structure that is arranged in contact with the lower end of the light source part 30, a second light hole 51 is arranged through the heat insulation part 50, a third light hole 4111 is arranged through the substrate 41, the second light hole 51, the third light hole 4111 and the first light hole 21 are sequentially connected from top to bottom, and the light exit part 31 is arranged corresponding to the second light hole 51. Specifically, the second light hole 51, the third light hole 4111 and the first light hole 21 form a complete light channel structure, the light exit part 31 is located at the upper end of the second light hole 51 and is arranged corresponding to the second light hole 51, that is, the light exit part 31 is located at the upper end of the light channel structure; the device to be tested is located at the lower end of the first light hole 21 and is arranged corresponding to the lower end of the first light hole 21, that is, the device to be tested is located at the lower end of the light channel structure, so that the light emitted from the light exit part 31 can act on the device to be tested through the light channel structure, so that the test assembly can provide a light test environment for the device to be tested.

[0040] In addition, in the present embodiment, a mounting hole is provided on the substrate 41, and the heating element includes a heating rod inserted in the mounting hole. Specifically, a plurality of mounting holes are provided on the side of the substrate 41, and the plurality of mounting holes are arranged at intervals, and the mounting holes are blind holes extending inward, and the heating element includes a plurality of heating rods, and the plurality of heating rods are inserted in the plurality of mounting holes one by one, and the heating rods can generate heat when powered on, so that the temperature regulating part 40 can heat the test piece. In addition, in other embodiments, the heating element can also be an electric heating wire, an electric heating film, a heating tube or a peltier effect element (peltier effect element refers to an element that can utilize the thermoelectric effect. By utilizing the thermoelectric effect, when an electric current passes through, the heat release end of the element can release heat) arranged on the substrate.

[0041] like Figure 1 as well as Figure 2 As shown, the refrigeration component includes a flow channel 4112 disposed on the substrate 41 and used to pass a cooling fluid. Specifically, the flow channel 4112 includes an introduction channel and an annular channel surrounding the outer periphery of the third light-through hole 4111, and the first end of the introduction channel is connected to the annular channel. The test assembly also includes a refrigerant connector 42 disposed outside the substrate 41, and the second end of the introduction channel is connected to the refrigerant connector 42. The cooling fluid source can be connected to the refrigerant connector 42 to pass the cooling fluid into the annular channel, so that the temperature regulating part 40 can cool the test piece. Specifically, the cooling fluid can be a refrigerant or a gaseous coolant, and the cooling fluid can be Freon, liquid nitrogen, liquid oxygen, etc. The refrigerant connector 42 is made of copper.

[0042] like Figure 2 As shown, the test part 20 is provided with a vacuum channel 22, which is in communication with the first light through hole 21. Specifically, a first end of the vacuum channel 22 is in communication with the first light through hole 21, and a second end of the vacuum channel 22 is in communication with an external negative pressure pump, so that the opening at the lower end of the first light through hole 21 can generate suction to the test piece, so that the test piece can be adsorbed on the lower end of the test part 20, thereby facilitating the transfer operation of the test assembly to the test piece.

[0043] like Figure 2As shown, the test assembly further includes a first seal 61, a second seal 62 and a third seal 63. The first seal 61 is arranged at the connection between the light source part 30 and the second light through hole 51; the second seal 62 is arranged at the connection between the second light through hole 51 and the third light through hole 4111; the third seal 63 is arranged at the connection between the third light through hole 4111 and the first light through hole 21. Specifically, the first seal 61, the second seal 62 and the third seal 63 are all sealing rings, so as to ensure the airtightness of the optical channel structure formed by the second light through hole 51, the third light through hole 4111 and the first light through hole 21, thereby ensuring the stable absorption of the test part 20 on the test object. In addition, in other embodiments, the first seal 61, the second seal 62 and the third seal 63 can also be sealing gaskets or sealing adhesive layers.

[0044] like Figures 1 to 4 As shown, the light source part 30 and the heat insulation part 50 form a light-emitting unit, and the light-emitting unit is detachably connected to the temperature regulating part 40. The support frame 10 is provided with an avoidance opening 11 to avoid the light-emitting unit. Specifically, the support frame 10 includes a rectangular mounting plate and four support columns arranged at the four corners of the rectangular mounting plate and extending downward, the temperature regulating part 40 is connected to the lower ends of the four support columns, and two adjacent support columns, the rectangular mounting plate and the temperature regulating part 40 form an avoidance opening 11, and the light-emitting unit can pass through the avoidance opening 11 so that the light-emitting unit can be connected to the temperature regulating part 40; when the test piece is a photosensitive chip, the test component is required to have both the function of adjusting the temperature of the photosensitive chip and the function of performing a light test on the photosensitive chip, that is, the light-emitting unit needs to be connected to the temperature regulating part 40; when the test piece is not a photosensitive chip, the test component is required to have only the function of adjusting the temperature of the photosensitive chip, and the light-emitting unit only needs to be disassembled from the temperature regulating part 40. Such a setting can make the test component more versatile.

[0045] In addition, in this embodiment, the test assembly further includes a first fastener penetrating the heat insulation part 50 and the temperature adjustment part 40 from the heat insulation part 50 to the temperature adjustment part 40, and the first fastener is a fastening screw to connect the heat insulation part 50 and the temperature adjustment part 40. The test assembly further includes a second fastener penetrating the heat insulation part 50 and the light source part 30 from the heat insulation part 50 to the light source part 30, and the second fastener is a fastening screw. An avoidance groove 54 is provided on the side of the heat insulation part 50, and the second fastener connects the heat insulation part 50 and the light source part 30 through the avoidance groove 54.

[0046] like Figure 3 as well as Figure 4As shown, the heat insulation part 50 is provided with a limiting groove 52, and the light source part 30 can be limitedly matched with the limiting groove 52. Specifically, the limiting groove 52 and the light source part 30 are positioned and matched, so that the light emitting part 31 and the upper end of the second light hole 51 can be aligned, thereby ensuring that the light emitted from the light emitting part 31 can act on the test piece.

[0047] like Figure 1 As shown, the test assembly also includes a cylinder 80 connected to the support frame 10 so that the support frame 10 can move up and down. Specifically, the cylinder 80 is connected above the rectangular mounting plate so that the support frame 10 can move up and down, thereby enabling the test part 20 to move up and down.

[0048] The present application also provides a sorting machine, which includes: a loading mechanism, a testing mechanism, a receiving mechanism and a conveying mechanism, and the testing mechanism includes a carrier 70 for placing the test piece and a testing assembly, wherein the testing assembly is the above-mentioned testing assembly. The above-mentioned testing assembly can effectively solve the problem that the chip floating test device in the related art is difficult to take into account different temperature tests and light environment tests, and the sorting machine with the above-mentioned testing assembly also has the above-mentioned advantages.

[0049] By using the sorting machine of this embodiment, the overall structure of the three-temperature floating test device in the related art is changed, and the light source part is added while meeting the requirements of the test piece on the focal length of the light source.

[0050] In order to meet the thermal insulation requirements of the sorting machine, the position of the vacuum flow channel in the related technology was changed, and the vacuum flow channel on the temperature regulating part was moved to the testing part. The thickness of the temperature regulating part was reduced as much as possible, and the thickness of the thermal insulation part was increased without increasing the overall thickness to ensure the thermal insulation effect of the thermal insulation part.

[0051] Considering the limited internal space of the sorting machine and the total height limit of the sorting machine, the four light source parts of the 2*2 station are connected to the two heat insulation parts according to the station requirements, and a certain gap is left between the top of the light source part and the rectangular mounting plate to achieve quick removal of the light-emitting unit. During quick removal, the light source part and the heat insulation part can be removed from the side by loosening the first fastener and the second fastener. This quick removal method does not affect the overall accuracy of the sorting machine because the temperature adjustment part is not removed.

[0052] Specifically, the support platform 70 is a plate-like structure, and the support platform 70 is provided with a test groove corresponding to the test component and a receiving groove arranged in the test groove for receiving the test piece. The test component is composed of a cylinder 80, a support frame 10, a light source part 30, a heat insulation part 50, a temperature adjustment part 40 and a test part 20 from top to bottom. The test part 20 includes a plate-like base and a test head protruding downward relative to the plate-like base, and the test head is arranged corresponding to the first light hole 21; when it is necessary to test the test piece, the cylinder 80 causes the support frame 10 to move downward to drive the test part 20 until the plate-like base is fitted with the test groove. At this time, the test head can be extended into the receiving groove, so that the test component can test the test piece.

[0053] In the description of the present utility model, it needs to be understood that the directions or positional relationships indicated by directional words such as "front, back, up, down, left, right", "lateral, vertical, perpendicular, horizontal" and "top, bottom" are usually based on the directions or positional relationships shown in the drawings, and are only for the convenience of describing the present utility model and simplifying the description. Unless otherwise specified, these directional words do not indicate or imply that the device or element referred to must have a specific direction or be constructed and operated in a specific direction, and therefore cannot be understood as limiting the scope of protection of the present utility model; the directional words "inside and outside" refer to the inside and outside relative to the contours of each component itself.

[0054] For ease of description, spatially relative terms such as "above", "above", "on the upper surface of", "above", etc. may be used here to describe the spatial positional relationship between a device or feature and other devices or features as shown in the figure. It should be understood that spatially relative terms are intended to include different orientations of the device in use or operation in addition to the orientation described in the figure. For example, if the device in the accompanying drawings is inverted, the device described as "above other devices or structures" or "above other devices or structures" will be positioned as "below other devices or structures" or "below other devices or structures". Thus, the exemplary term "above" can include both "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatially relative descriptions used here are interpreted accordingly.

[0055] In addition, it should be noted that the use of terms such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. If not otherwise stated, the above terms have no special meaning and therefore cannot be understood as limiting the scope of protection of the utility model.

[0056] The above description is only the preferred embodiment of the utility model, and is not intended to limit the utility model. For those skilled in the art, the utility model can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model shall be included in the protection scope of the utility model.

Claims

1. A test assembly for testing a test piece, characterized in that: The test components include: Support frame (10); A testing part (20) is arranged below the support frame (10) and is provided with a first light-through hole (21) penetrating therethrough, and the object to be tested is located at the lower end of the first light-through hole (21); A light source unit (30) is arranged above the testing unit (20), the light source unit (30) having a light emitting unit (31), the light emitting unit (31) being arranged corresponding to the first light through hole (21); A temperature adjustment unit (40) is arranged between the test unit (20) and the light source unit (30) and is capable of adjusting the temperature of the test object.

2. The test assembly according to claim 1, characterized in that The test assembly further comprises a heat insulating portion (50) arranged between the light source portion (30) and the temperature regulating portion (40).

3. The test assembly according to claim 2, characterized in that The temperature adjustment part (40) comprises a base plate (41) and a refrigeration element and a heating element arranged on the base plate (41).

4. The test assembly according to claim 3, characterized in that The heat insulation part (50) is a plate-like structure that is fitted with the lower end of the light source part (30); a second light through hole (51) is penetrated through the heat insulation part (50); a third light through hole (4111) is penetrated through the substrate (41); the second light through hole (51), the third light through hole (4111) and the first light through hole (21) are sequentially connected from top to bottom; and the light exit part (31) is correspondingly disposed to the second light through hole (51).

5. The test assembly according to claim 4, characterized in that The substrate (41) is provided with a mounting hole, and the heating element comprises a heating rod inserted into the mounting hole; and / or, The refrigeration element comprises a flow channel (4112) arranged on the base plate (41) and used for passing a cooling fluid.

6. The test assembly according to any one of claims 1 to 5, characterized in that The test portion (20) is provided with a vacuum flow channel (22), and the vacuum flow channel (22) is connected to the first light-through hole (21).

7. The test assembly according to claim 4, characterized in that The test part (20) is provided with a vacuum flow channel (22), and the vacuum flow channel (22) is connected to the first light through hole (21). The test assembly also includes a first seal (61), a second seal (62) and a third seal (63). The first seal (61) is provided at the connection between the light source part (30) and the second light through hole (51); the second seal (62) is provided at the connection between the second light through hole (51) and the third light through hole (4111); and the third seal (63) is provided at the connection between the third light through hole (4111) and the first light through hole (21).

8. The test assembly according to any one of claims 2 to 5, characterized in that The light source part (30) and the heat insulation part (50) form a light-emitting unit, the light-emitting unit is detachably connected to the temperature adjustment part (40), and the support frame (10) is provided with an avoidance opening (11) to avoid the light-emitting unit; and / or, The heat insulation portion (50) is provided with a limiting groove (52), and the light source portion (30) can be limitedly matched with the limiting groove (52).

9. The test assembly according to any one of claims 1 to 5, characterized in that The test assembly also includes a cylinder (80) connected to the support frame (10) so that the support frame (10) can move up and down.

10. A sorting machine, comprising a feeding mechanism, a testing mechanism, a receiving mechanism and a conveying mechanism, characterized in that: The testing mechanism comprises a carrying platform (70) for placing a piece to be tested and a testing component, wherein the testing component is the testing component according to any one of claims 1 to 9.

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