Test fixture

Abstract

The utility model discloses a test fixture, which comprises a test assembly, a pressing assembly and a magnetic field assembly, and is characterized in that the test assembly comprises a unidirectional conductive part and a circuit board, the circuit board is provided with a contact point, and the unidirectional conductive part is located between a test sample and the contact point; the pressing assembly comprises an elastic assembly, and the elastic assembly is in contact with the test sample; the circuit board is connected to the magnetic field assembly which is used for providing a magnetic field environment for the test sample. When a test sample is placed on the one-way conductive part, the elastic assembly continuously applies pressure to the test sample, so that the test sample is kept on the circuit board, and the elastic assembly generates elastic deformation in the pressure applying process, so that flexible continuous pressing is realized, and the test sample is prevented from being damaged; the one-way conductive part deforms under the action of pressure, wraps the pins of the test sample, and forms a large contact area with the contact points of the circuit board, thereby avoiding error test caused by poor contact.

Description

Technical Field

[0001] The present application relates to the field of Hall component performance testing, and in particular to a testing fixture. Background Art

[0002] In current test fixtures, the pins of the test sample and the contact points on the test fixture mainly rely on the elastic deformation of the contact points to complete contact. In this case, the contact area is small, which is prone to poor contact and test abnormalities. At the same time, in order to ensure that the test sample and the test fixture are continuously and effectively connected, pressure needs to be applied to the test sample, and continuous application of pressure is likely to damage the test sample. Utility Model Content

[0003] In order to solve at least one of the above technical problems, the present application provides a test fixture, and the technical solution adopted is as follows:

[0004] The present application provides a test fixture, which includes a test component, a clamping component and a magnetic field component. The test component includes a unidirectional conductive component and a circuit board. The circuit board is provided with a contact point. The unidirectional conductive component is located between a test sample and the contact point. The pin of the test sample contacts the contact point through the unidirectional conductive component. The clamping component includes an elastic component. The elastic component contacts the test sample and presses the test sample onto the circuit board. The circuit board is connected to the magnetic field component, and the magnetic field component is used to provide a magnetic field environment for the test sample.

[0005] In some embodiments of the present application, the unidirectional conductive component includes an anisotropic conductive film.

[0006] In certain embodiments of the present application, the test assembly includes a pressure cover, which is detachably connected to the magnetic field assembly, and the pressure cover and the magnetic field assembly clamp the circuit board and the unidirectional conductive component. The pressure cover is provided with a mounting structure, and the test sample is embedded in the mounting structure so that the pins of the test sample contact the contact points through the unidirectional conductive component.

[0007] In some embodiments of the present application, the circuit board is provided with a wiring portion, the wiring portion is used to connect the circuit, and the pressure cover is provided with an avoidance portion, the avoidance portion avoids the position of the wiring portion.

[0008] In some embodiments of the present application, the magnetic field assembly includes a winding portion, the winding portion surrounds a coil, and the coil is energized to make the coil magnetic.

[0009] In certain embodiments of the present application, the magnetic field component includes a positioning portion, a positioning component is disposed between the positioning portion and the circuit board, and the circuit board is connected to the positioning portion through the positioning component.

[0010] In certain embodiments of the present application, the elastic component includes an elastic component and a pressing component that are connected to each other. The elastic component moves within the range of the mounting structure toward the test sample so that the pressing component contacts the test sample and the elastic component undergoes elastic deformation.

[0011] In certain embodiments of the present application, the clamping assembly includes a base and a movable support component, the elastic assembly is installed on the movable support component, the movable support component is movably connected to the base, the movable support component moves along the base, and drives the elastic assembly to move.

[0012] In certain embodiments of the present application, a guide assembly is provided between the movable support component and the base, and the movable support component moves along the direction of the guide assembly.

[0013] In certain embodiments of the present application, the clamping assembly includes an adjustment component, the elastic component is installed on the adjustment component, the movable support component includes a first adjustment structure, the adjustment component is detachably connected to the movable support component via the first adjustment structure, and the adjustment component can be positionally adjusted along the first adjustment structure.

[0014] The embodiments of the present application have at least the following beneficial effects: in the present application, the unidirectional conductive component is located between the test sample and the circuit board, and the test sample contacts the circuit board through the unidirectional conductive component; when the test sample is placed on the unidirectional conductive component, the elastic component continuously applies pressure to the test sample to keep the test sample on the circuit board, and the elastic component will produce elastic deformation in the process of applying pressure, thereby achieving flexible continuous compression and avoiding damage to the test sample; the unidirectional conductive component will deform under the action of pressure, wrap the pins of the test sample, and form a larger contact area with the contact points of the circuit board, thereby avoiding false detection due to poor contact.

[0015] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become apparent from the description below, or will be learned through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The above and / or additional aspects and advantages of the present application will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0017] Figure 1 It is the test fixture of this application;

[0018] Figure 2 is an exploded view of the clamping assembly in the test fixture of the present application;

[0019] Figure 3is an exploded view of the clamping assembly in the test fixture of the present application;

[0020] Figure 4 This is the test fixture for this application Figure 3 A partial enlarged view of part I;

[0021] Figure 5 It is a structural schematic diagram of the magnetic field component in the test fixture of this application.

[0022] Reference numerals:

[0023] Test assembly 100; unidirectional conductive component 101; circuit board 102; gland 103; mounting structure 104; wiring portion 105; avoidance portion 106;

[0024] The clamping assembly 200; the elastic component 201; the pressing component 202; the base 203; the movable support component 204; the slider 205; the slide rail 206; the adjustment component 207; the first adjustment structure 208; the sleeve 209; the second adjustment structure 210;

[0025] Magnetic field assembly 300 ; coil 301 ; positioning portion 302 ; first positioning structure 303 ; second positioning structure 304 ; slot structure 305 . DETAILED DESCRIPTION

[0026] This section will combine Figures 1 to 5 Embodiments of the present application are described in detail, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and cannot be understood as limiting the present application.

[0027] In the description of the present application, it should be understood that if the terms "center", "middle", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "axial", "radial", "circumferential" and the like are used to indicate the orientation or position relationship based on the orientation or position relationship shown in the drawings, it is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. The features defined as "first" and "second" are used to distinguish the feature names, rather than having special meanings. In addition, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present application, unless otherwise specified, "multiple" means two or more.

[0028] In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0029] like Figure 1 As shown, an embodiment of the present application provides a test fixture, which includes a test assembly 100, a clamping assembly 200 and a magnetic field assembly 300. The test assembly 100 is used to place a test sample so as to test the test sample; the clamping assembly 200 is used to keep the test sample on the test assembly 100, to ensure a continuous and effective connection between the test sample and the test assembly 100, and to prevent the test sample from being separated from the test assembly 100; the magnetic field assembly 300 is used to support the test assembly 100 on the one hand to ensure the stability of the position of the test assembly 100, and on the other hand, the magnetic field assembly 300 provides a magnetic field for the test sample to meet the external environmental conditions for testing the test sample.

[0030] like Figure 2 As shown, in some examples, the test assembly 100 includes a unidirectional conductive component 101 and a circuit board 102, the circuit board 102 is provided with a plurality of contact points, and the test sample is provided with a plurality of pins. When the pins of the test sample contact the corresponding contact points respectively, the test sample is connected to the test circuit to complete the test. However, the contact area between the pins of the test sample and the contact points is limited, which can easily lead to poor contact and thus mismeasurement. The unidirectional conductive component 101 can alleviate the problem of the small contact area between the two without affecting the conduction of the test circuit.

[0031] Furthermore, the unidirectional conductive component 101 is located between the test sample and the circuit board 102, and has unidirectional conductive properties and flexibility. When the test sample is connected to the circuit board 102 in a manner where the pins correspond to the contact points, if the clamping assembly 200 applies pressure to the test sample, the pressure will be further transmitted to the unidirectional conductive component 101 through the pins of the test sample. The unidirectional conductive component 101 will deform when subjected to force, thereby wrapping the pins of the test sample and contacting the contact points with a larger contact area. Then, the pins of the test sample and the contact points of the circuit board 102 form indirect contact through the unidirectional conductive component 101, thereby avoiding poor contact caused by insufficient contact area.

[0032] In some examples, the unidirectional conductive component 101 includes an anisotropic conductive film, which is flexible and is conducive to wrapping the pins of the test sample during the test process. The anisotropic conductive film uses conductive particles to connect electrodes to make the electrodes conductive, while avoiding short circuits between adjacent electrodes, thereby achieving the purpose of unidirectional conduction.

[0033] In some examples, the test component 100 includes a pressure cover 103. When the magnetic field component 300 supports the circuit board 102 of the test component 100, the pressure cover 103 is connected to the magnetic field component 300. The magnetic field component 300 and the pressure cover 103 clamp the circuit board 102 and the unidirectional conductive component 101 to ensure that the positions of the circuit board 102 and the unidirectional conductive component 101 are stable.

[0034] The gland 103 and the magnetic field assembly 300 are connected by fasteners to form a detachable connection. The replacement and maintenance of the circuit board 102 and the unidirectional conductive component 101 are achieved by disassembling the gland 103 .

[0035] Furthermore, the gland 103 is provided with a mounting structure 104, and the mounting structure 104 connects the position of the contact point corresponding to the unidirectional conductive component 101 with the external space. When the test sample is embedded in the mounting structure 104, each pin of the test sample contacts the contact point through the unidirectional conductive component 101, which is convenient for placing and replacing the test sample, and there is no need to frequently disassemble the gland 103 to replace the test sample, thereby improving work efficiency.

[0036] It is understandable that the shape of the mounting structure 104 is approximately the same as that of the test sample, thereby forming a preliminary positioning of the test sample and preventing the test sample from shaking after being embedded in the mounting structure 104, resulting in poor contact between the test sample and the circuit board 102. Specifically, the mounting structure 104 includes a mounting hole.

[0037] In some examples, the circuit board 102 needs to be connected to a circuit so that the circuit formed by the circuit board 102 and the test sample is conductive. The circuit board 102 is provided with a wiring portion 105 , and the circuit board 102 is connected to the circuit through the wiring portion 105 .

[0038] Furthermore, the gland 103 needs to reserve a space for the circuit to access the circuit board 102, so as to avoid the gland 103 and the magnetic field assembly 300 clamping and shielding the wiring portion 105. The gland 103 is provided with an escape portion 106, which escapes the position of the wiring portion 105 to avoid the connection between the circuit and the wiring portion 105 from being interfered by the gland 103. Specifically, the escape portion 106 includes a notch, which is provided at the edge of the gland 103.

[0039] like Figure 3As shown, the pressing component 200 includes an elastic component, which contacts the test sample and presses the test sample at a specific position of the circuit board 102, thereby further positioning the test sample. At the same time, the pressure applied by the elastic component to the test sample is also transmitted to the unidirectional conductive component 101, so that the unidirectional conductive component 101 wraps the pins of the test sample.

[0040] like Figure 4 As shown, in some examples, the elastic component includes an elastic component 201 and a pressing component 202, the pressing component 202 and the elastic component 201 are connected to each other, and the pressing component 202 is located close to the test sample, and the elastic component 201 is located away from the test sample.

[0041] When the test sample is embedded in the mounting structure 104 and each pin corresponds to each contact point, the elastic component moves toward the test sample until the pressing component 202 contacts the test sample. As the elastic component continues to move toward the test sample, the position of the pressing component 202 is fixed, and the elastic component 201 is deformed and provides elastic force. The elastic force generated by the elastic component 201 forms a pre-tightening force of the pressing component 202, thereby ensuring that the unidirectional conductive component 101 can wrap the pin.

[0042] At the same time, the elastic component 201 can provide a certain buffer for the pressing component 202. When the elastic component moves a large stroke, the elastic component 201 undergoes elastic deformation, converting part of the kinetic energy into elastic potential energy of the elastic component 201, thereby preventing the pressing component 202 from applying all of its force to the test sample, thereby causing damage to the test sample.

[0043] In some examples, the clamping assembly 200 includes a base 203 and a movable support member 204, the movable support member 204 is movably connected to the base 203, and the elastic member is installed on the movable support member 204. When the movable support member 204 moves relative to the base 203, the elastic member approaches or moves away from the test sample.

[0044] In some examples, a guide assembly is provided between the mobile support component 204 and the base 203, and the guide assembly determines the movement direction of the mobile support component 204, thereby determining the movement direction of the elastic component, and ensuring that the pressing component 202 accurately contacts the test sample. The guide assembly also ensures the connection between the mobile support component 204 and the base 203. It can be understood that the mobile support component 204 moves along the direction of the guide assembly.

[0045] Specifically, the elastic component includes a slider 205 and a slide rail 206. The slider 205 is disposed on the mobile support component 204, and the slide rail 206 is disposed on the base 203, or the slider 205 is disposed on the base 203, and the slide rail 206 is disposed on the mobile support component 204, and the slider 205 and the slide rail 206 are interlocked.

[0046] In addition, both sides of the slide rail 206 and the slider 205 are provided with contraction parts, the contraction parts on both sides of the slide rail 206 gradually decrease in the direction close to the edge of the slide rail 206, and the contraction parts on both sides of the slider 205 gradually decrease in the direction close to the moving support component 204, and the contraction parts of the slide rail 206 and the slider 205 fit each other. Then, the slider 205 can move along the axial direction of the slide rail 206, and the slider 205 is prevented from moving along the radial direction of the slide rail 206, so as to prevent the slider 205 from accidentally leaving the slide rail 206.

[0047] The slider 205 is detachably connected to the mobile support component 204. The mobile support component 204 is provided with a second adjustment structure 210, which extends along the axial direction of the slide rail 206. The slider 205 is connected to the second adjustment structure 210 through a fastener. When the position of the slider 205 needs to be adjusted, the corresponding fastener is loosened, and the slider 205 can adjust its position along the second adjustment structure 210. Specifically, the second adjustment structure 210 includes an adjustment slot.

[0048] In some examples, the pressing assembly 200 includes an adjusting component 207, and the elastic component is mounted on the adjusting component 207. When the movable support component 204 moves relative to the base 203, the adjusting component 207 gradually approaches the test sample, or gradually moves away from the test sample. Therefore, the elastic component also gradually approaches or moves away from the test sample.

[0049] In order to ensure that the elastic component can accurately reach the test sample, the movable support component 204 is provided with an extension portion, the extension portion extends into the range of the test component 100, and the adjustment component 207 is provided on the extension portion.

[0050] At the same time, the position of the adjustment component 207 on the extension portion can be adjusted to further ensure that the elastic component is in a position corresponding to the test sample.

[0051] Specifically, the extension of the mobile support member 204 is provided with a first adjustment structure 208, the adjustment member 207 is detachably connected to the mobile support member 204, the first adjustment structure 208 extends along the radial direction of the slide rail 206, and the adjustment member 207 is connected to the first adjustment structure 208 through a fastener. When the position of the adjustment member 207 needs to be adjusted, the corresponding fastener is loosened, and the adjustment member 207 can adjust its position along the first adjustment structure 208. Specifically, the first adjustment structure 208 includes an adjustment slot.

[0052] In addition, in order to ensure the connection between the elastic component and the adjusting component 207 , the adjusting component 207 is provided with a sleeve 209 , and the elastic component 201 and the pressing component 202 are arranged in the sleeve 209 .

[0053] like Figure 5 As shown, in some examples, the circuit board 102 is connected to a magnetic field assembly 300 , and the magnetic field assembly 300 provides a magnetic field environment for the test sample.

[0054] The magnetic field component 300 includes a winding portion, and a coil 301 is wound around the winding portion. The number of turns of the coil 301 is set according to demand. When the coil 301 is energized, the coil 301 has magnetism.

[0055] In some examples, the magnetic field assembly 300 includes a positioning portion 302, and the positioning portion 302 is used to support the circuit board 102. Specifically, the positioning portion 302 and the winding portion are integrally formed. To ensure that the position of the circuit board 102 on the positioning portion 302 is stable, a positioning assembly is provided between the positioning portion 302 and the circuit board 102, and the circuit board 102 is connected to the positioning portion 302 through the positioning assembly.

[0056] Furthermore, the positioning assembly includes a first positioning structure 303 and a second positioning structure 304. The first positioning structure 303 is arranged on the positioning portion 302, and the second positioning structure 304 is arranged on the circuit board 102. The first positioning structure 303 is plugged into the second positioning structure 304, thereby avoiding position changes of the circuit board 102 on the positioning portion 302, and ensuring that the test sample can accurately correspond to the contact point on the circuit board 102.

[0057] The first positioning structure 303 includes a positioning pin, and the second positioning structure 304 includes a positioning hole. The positioning pin is inserted into the positioning hole to complete the positioning of the circuit board 102 .

[0058] At the same time, the positioning portion 302 is provided with a groove structure 305, the width of the groove structure 305 is approximately the same as the width of the circuit board 102, when the second positioning structure 304 of the circuit board 102 is plugged into the first positioning structure 303 of the positioning portion 302, the circuit board 102 is embedded in the groove structure 305, further positioning the circuit board 102.

[0059] In addition, in order to make the magnetic field assembly 300 and the test assembly 100 adapt to the height of the clamping assembly 200 , a supporting portion is provided at one end of the magnetic field assembly 300 away from the test assembly 100 .

[0060] In some examples, the test assembly 100 is located at the top of the magnetic field assembly 300, the mounting structure 104 on the gland 103 opens vertically upward, the support portion is located at the bottom of the magnetic field assembly 300, and the clamping assembly 200 is arranged in parallel with the test assembly 100 and the magnetic field assembly 300. The elastic assembly is located at the top of the test assembly 100, and the mobile support component 204 moves vertically relative to the base 203 to drive the elastic assembly to approach or move away from the test sample.

[0061] During use, the mobile support component 204 is raised to a height to avoid the installation space of the test component 100; the circuit board 102 is connected to the positioning portion 302 through the cooperation of the first positioning structure 303 and the second positioning structure 304 and the slot structure 305; the unidirectional conductive component 101 is placed on the top of the contact point of the circuit board 102, and the circuit board 102 is wired; the pressure cover 103 covers the top of the circuit board 102 and is connected to the positioning portion 302. At this time, the contact points of the circuit board 102 are within the range of the mounting structure 104 of the pressure cover 103; the test sample is embedded in the mounting structure 104, and the pins of the test sample are respectively in contact with the contact points of the circuit board 102; the mobile support component 204 is lowered in height, the pressing component 202 contacts the test sample, and the elastic component 201 produces elastic deformation, and the pins of the test sample are wrapped by the unidirectional conductive component 101 and contact the contact points of the circuit board 102 with a larger contact area, thereby ensuring the reliability of the test process.

[0062] In the description of this specification, if the reference terms "one embodiment", "some examples", "some embodiments", "illustrative embodiment", "example", "specific example", or "some examples" appear, it means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0063] The above describes the implementation methods of the present application in detail in conjunction with the accompanying drawings, but the present application is not limited to the above implementation methods. Various changes can be made within the knowledge scope of ordinary technicians in the technical field without departing from the purpose of the present application.

Claims

1. A test fixture, characterized in that: include: A test assembly, the test assembly comprising a unidirectional conductive component and a circuit board, the circuit board being provided with a contact point, the unidirectional conductive component being between the test sample and the contact point, and the pin of the test sample being in contact with the contact point through the unidirectional conductive component; A pressing component, the pressing component comprising an elastic component, the elastic component contacts the test sample and presses the test sample onto the circuit board; A magnetic field component, the circuit board is connected to the magnetic field component, and the magnetic field component is used to provide a magnetic field environment for the test sample.

2. The test fixture according to claim 1, characterized in that: The unidirectional conductive component includes an anisotropic conductive film.

3. The test fixture according to claim 1, characterized in that: The test assembly includes a pressure cover, which is detachably connected to the magnetic field assembly. The pressure cover and the magnetic field assembly clamp the circuit board and the unidirectional conductive component. The pressure cover is provided with a mounting structure, and the test sample is embedded in the mounting structure so that the pins of the test sample contact the contact points through the unidirectional conductive component.

4. The test fixture according to claim 3, characterized in that: The circuit board is provided with a wiring portion, and the wiring portion is used to connect the circuit. The pressure cover is provided with an avoidance portion, and the avoidance portion avoids the position of the wiring portion.

5. The test fixture according to claim 1, characterized in that: The magnetic field assembly includes a winding portion, a coil is wound around the winding portion, and the coil is energized to make the coil magnetic.

6. The test fixture according to claim 5, characterized in that: The magnetic field component includes a positioning portion, a positioning component is arranged between the positioning portion and the circuit board, and the circuit board is connected to the positioning portion through the positioning component.

7. The test fixture according to claim 3, characterized in that: The elastic component includes an elastic component and a pressing component that are connected to each other. The elastic component moves in a direction close to the test sample within the range of the mounting structure so that the pressing component contacts the test sample and the elastic component undergoes elastic deformation.

8. The test fixture according to claim 7, characterized in that: The clamping assembly includes a base and a movable support component, the elastic assembly is installed on the movable support component, the movable support component is movably connected to the base, the movable support component moves along the base, and drives the elastic assembly to move.

9. The test fixture according to claim 8, characterized in that: A guide assembly is arranged between the movable support component and the base, and the movable support component moves along the direction of the guide assembly.

10. The test fixture according to claim 9, characterized in that: The clamping assembly includes an adjusting component, the elastic component is installed on the adjusting component, the movable supporting component includes a first adjusting structure, the adjusting component is detachably connected to the movable supporting component via the first adjusting structure, and the adjusting component can be positionally adjusted along the first adjusting structure.

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