Probe structure

Abstract

The utility model provides a probe structure which is used for measuring a signal of an object to be measured. The probe structure comprises an adapter plate, a socket, a fixing assembly and a plurality of connectors. The adapter plate has a first side and a second side opposite to each other. The socket is arranged on the first side of the adapter plate and comprises a plurality of probes. The probe is electrically connected with the adapter plate. The fixing assembly is arranged on the second side of the adapter plate and used for fixing the socket on the adapter plate. The connector is arranged on the second side of the adapter plate and is electrically connected with the adapter plate. The probe structure provided by the utility model can measure a plurality of signal ports at the same time so as to improve the detection capacity.

Description

Technical Field

[0001] The utility model relates to a probe structure, in particular to a probe structure capable of measuring high-frequency signals. Background Art

[0002] Nowadays, for antenna-in-Package (AiP) or antenna-on-Board (AoB) products, high-frequency probes are used to detect high-frequency signals (such as S 11 Also called input reflection coefficient (Input reflection Coefficient), S 21 Or the forward transmission coefficient. Since the existing high-frequency probe has only one connector, each measurement can only be performed on one signal port in the sample. However, in the existing product design, each chip (or unit) has multiple signal ports, and the existing high-frequency probe is more time-consuming to measure and has the problem of insufficient detection capacity. In addition, the high-frequency probe has the disadvantages of high price, short life, and relatively fragile. Utility Model Content

[0003] The utility model provides a probe structure which can measure multiple signal ports simultaneously to improve the detection capacity.

[0004] The utility model discloses a probe structure for measuring the signal of a device under test (DUT). The probe structure includes an adapter board, a socket, a fixing component and a plurality of connectors. The adapter board has a first side and a second side opposite to each other. The socket is arranged on the first side of the adapter board and includes a plurality of probes. The probes are electrically connected to the adapter board. The fixing component is arranged on the second side of the adapter board and is used to fix the socket on the adapter board. The connector is arranged on the second side of the adapter board and is electrically connected to the adapter board.

[0005] In an embodiment of the present invention, the adapter board includes a plurality of transmission lines, and the connectors are electrically connected to the probes through the transmission lines respectively.

[0006] In an embodiment of the present invention, the socket further comprises a guide plate, and the probe passes through the guide plate to be electrically connected to the adapter board.

[0007] In an embodiment of the present invention, the material of the plate includes engineering plastics, which has the characteristic of low dielectric loss.

[0008] In an embodiment of the utility model, the fixing assembly comprises a body, a plurality of fixing members and a plurality of locking members. The body is disposed on the second side of the adapter plate, and the fixing members pass through the body, the adapter plate and the socket to position the socket on the adapter plate. The locking member passes through the socket and the adapter plate and abuts against the body to fix the socket on the adapter plate.

[0009] In an embodiment of the present invention, the connectors are separated from each other and are located on two opposite sides of the fixing assembly.

[0010] In an embodiment of the present invention, the number of the connectors is more than two.

[0011] In an embodiment of the present invention, each of the above-mentioned connectors includes a Sub-Miniature-A (SMA) connector.

[0012] In an embodiment of the present invention, the object to be tested includes a bare circuit board, such as a circuit board, a glass substrate or a carrier board.

[0013] In an embodiment of the present invention, each of the above connectors is suitable for connecting to a vector network analyzer (VNA).

[0014] Based on the above, in the probe structure of the utility model, multiple connectors and a socket are respectively arranged on opposite sides of the adapter plate, and are respectively electrically connected to the adapter plate. Therefore, compared with the high-frequency probe in the prior art that can only measure one signal port at a time, the probe structure of the utility model is provided with multiple connectors, so it can measure multiple signal ports at the same time, which can improve the detection capacity.

[0015] In order to make the above features and advantages of the present invention more obvious and easy to understand, embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 A cross-sectional schematic diagram of a signal measuring device according to an embodiment of the present utility model;

[0017] Figure 2 yes Figure 1 Schematic top view of .

[0018] Description of Reference Numerals

[0019] 10: object to be tested;

[0020] 20: vector network analyzer;

[0021] 100: probe structure;

[0022] 110: adapter board;

[0023] 111: first side;

[0024] 112: transmission line;

[0025] 113: second side;

[0026] 120: socket;

[0027] 121: upper surface;

[0028] 122: Plate;

[0029] 123: lower surface;

[0030] 124: probe;

[0031] 130: fixing component;

[0032] 132: Ontology;

[0033] 134: fixing member;

[0034] 136: Lock attachment;

[0035] 140:Connector. DETAILED DESCRIPTION

[0036] The utility model embodiment can be used in conjunction with the attached Figure 1 It is also understood that the drawings of the present invention are also considered as part of the disclosure. It should be understood that the drawings of the present invention are not drawn according to scale, and in fact, the size of the elements may be arbitrarily enlarged or reduced to clearly show the features of the present invention.

[0037] Figure 1 A cross-sectional schematic diagram of a signal measuring device according to an embodiment of the present invention. Figure 2 yes Figure 1 Please also refer to Figure 1 and Figure 2 In this embodiment, the probe structure 100 is used to measure the signal of the object to be measured 10. The probe structure 100 includes an adapter board 110, a socket 120, a fixing component 130 and a plurality of connectors (four connectors 140 are schematically shown). The adapter board 110 has a first side 111 and a second side 113 opposite to each other. The socket 120 is configured on the first side 111 of the adapter board 110 and includes a plurality of probes (six probes 124 are schematically shown). The probes 124 are electrically connected to the adapter board 110. The fixing component 130 is configured on the second side 113 of the adapter board 110 to fix the socket 120 on the adapter board 110. The connector 140 is configured on the second side 113 of the adapter board 110 and is electrically connected to the adapter board 110.

[0038] Specifically, in this embodiment, the adapter board 110 is, for example, a printed circuit board, which can be a two-layer circuit board or a multi-layer circuit board, and its impedance design must comply with 50 ohms. In this embodiment, the adapter board 110 includes a plurality of transmission lines 112, wherein the connector 140 is electrically connected to the probe 124 through the transmission lines 112. Here, the transmission line 112 is, for example, a high-frequency transmission line, and the high frequency refers to a frequency greater than 1 GHz.

[0039] Furthermore, the socket 120 of the present embodiment further includes a plate 122, wherein the plate 122 has an upper surface 121 and a lower surface 123 opposite to each other. One end of the probe 124 passes through the upper surface 121 of the plate 122 and is electrically connected to the adapter board 110, while the other end of the probe 124 passes through the plate 122 from the upper surface 121 of the plate 122 to the lower surface 123 and contacts the object under test 10, so as to measure the high-frequency signal of the object under test 10. Here, the plate 122 is, for example, a combination of a retainer and a mounting plate, wherein the material of the plate 122 is, for example, engineering plastic with low dielectric loss characteristics, but is not limited thereto, and the impedance design of the probe 124 must comply with 50 ohms. The object under test 10 is embodied as a bare circuit board, such as a carrier structure that is not packaged and used for antenna packaging, or a circuit board, a glass substrate or a carrier, which is not limited here. The high-frequency signal is, for example, S 11 or S 21 , where S 11 Indicates the return loss at port 1, which is mainly used to observe the signal reflection at the transmitting end, and can also be called the input reflection coefficient. 21 Indicates the insertion loss of the signal from port 1 to port 2. It is mainly used to observe how much signal is left at the receiving end. It is also called the forward transmission coefficient.

[0040] In addition, the fixing assembly 130 of this embodiment specifically includes a body 132, a plurality of fixing members (two fixing members 134 are schematically shown) and a plurality of locking members 136. The body 132 is disposed on the second side 113 of the adapter plate 110, and the fixing member 134 passes through the body 132, the adapter plate 110 and the socket 120 to position the socket 120 on the adapter plate 110. The locking member 136 passes through the socket 120 and the adapter plate 110 and abuts against the body 132 to fix the socket 120 on the adapter plate 110. In one embodiment, the body 132, the adapter plate 110 and the plate member 122 of the socket 120 respectively have corresponding positioning holes, and the fixing member 134 can pass through these positioning holes to position the above three, and the locking member 136 can pass through these positioning holes to fix the above three together. In one embodiment, the fixing member 134 can be, for example, a screw or a bolt, but is not limited thereto. In one embodiment, the locking member 136 may be, for example, a screw, but is not limited thereto.

[0041] It should be noted that Figure 1 The positions of the fixing member 134 , the locking member 136 and the transmission line 112 of the adapter plate 110 are only schematically shown. In fact, the positions of the fixing member 134 and the locking member 136 will avoid or bypass the position of the transmission line 112 .

[0042] In addition, please also refer to Figure 1 and Figure 2 , the connectors 140 of this embodiment are separated from each other and are located on opposite sides of the fixing assembly 130. In a top view, each connector 140 is a hollow structure, from which the second side 113 of the adapter board 110 can be seen. Preferably, the number of connectors 140 is more than two, and multiple signal ports can be measured simultaneously to improve the detection capacity. Here, each connector 140 is, for example, an ultra-small A connector, but is not limited thereto.

[0043] When the probe structure 100 is measuring, each connector 140 is suitable for connecting to the vector network analyzer 20, wherein the vector network analyzer 20 is a test instrument capable of measuring electrical network parameters, to provide a signal. The signal can pass through the connector 140 and the transmission line 112 of the adapter board 110 to the probe 124, thereby measuring the high-frequency signal on the object under test 10.

[0044] In summary, in the probe structure of the utility model, multiple connectors and a socket are respectively arranged on opposite sides of the adapter plate, and are respectively electrically connected to the adapter plate. Therefore, compared with the high-frequency probe in the prior art that can only measure one signal port at a time, the probe structure of the utility model is provided with multiple connectors, so it can measure multiple signal ports at the same time, which can improve the detection capacity.

[0045] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the utility model, rather than to limit it. Although the utility model has been described in detail with reference to the aforementioned embodiments, ordinary technicians in this field should understand that they can still modify the technical solutions recorded in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not make the essence of the corresponding technical solution deviate from the scope of the technical solution of the embodiments of the utility model.

Claims

1. A probe structure for measuring a signal of an object to be measured, characterized in that: The probe structure comprises: An adapter plate having a first side and a second side opposite to each other; a socket, disposed on the first side of the adapter board and comprising a plurality of probes, wherein the plurality of probes are electrically connected to the adapter board; a fixing assembly, disposed on the second side of the adapter board, for fixing the socket on the adapter board; and A plurality of connectors are disposed on the second side of the adapter board and are electrically connected to the adapter board.

2. The probe structure according to claim 1, characterized in that: The adapter board includes a plurality of transmission lines, and the plurality of connectors are electrically connected to the plurality of probes through the plurality of transmission lines, respectively.

3. The probe structure according to claim 1, characterized in that: The socket further includes a plate, and the plurality of probes pass through the plate to be electrically connected to the adapter board.

4. The probe structure according to claim 3, characterized in that: The material of the plate includes engineering plastic.

5. The probe structure according to claim 1, characterized in that: The fixing assembly includes a main body, a plurality of fixing parts and a plurality of locking accessories. The main body is configured on the second side of the adapter plate, and the plurality of fixing parts pass through the main body, the adapter plate and the socket to position the socket on the adapter plate. The plurality of locking accessories pass through the socket and the adapter plate and abut against the main body to fix the socket on the adapter plate.

6. The probe structure according to claim 1, characterized in that: The plurality of connectors are separated from each other and are located beside opposite sides of the fixing component.

7. The probe structure according to claim 1, characterized in that: The number of the plurality of connectors is two or more.

8. The probe structure according to claim 1, characterized in that: Each of the plurality of connectors includes a subminiature A connector.

9. The probe structure according to claim 1, characterized in that: The object to be tested includes a bare circuit board.

10. The probe structure according to claim 1, characterized in that: Each of the plurality of connectors is adapted to be connected to a vector network analyzer.

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