A bad point marking mechanism for a chip testing machine

Abstract

The utility model relates to the technical field of chip testers, and in particular to a bad point marking mechanism of a chip tester, including a chip tester body, which includes a base, a base is installed at the bottom end of the chip tester body, a fixing rod is installed at the side walls at both ends of the chip tester body, and a mounting block is installed on the outer wall of the fixing rod, an ink storage box is installed at one end of the top of the mounting block, and an ink inlet tube is installed at the top of the ink storage box, and a detection lamp is installed at the bottom of the mounting block. The utility model firstly meshes the gear body with the toothed disc body, so that the gear body rotates to drive the toothed disc body to rotate at the same time, and is threadedly connected with the threaded rod through the threaded hole, and through the mutual cooperation of the sliding rod and the sliding sleeve, the toothed disc body can drive the threaded rod to rise and fall inside the threaded hole through the sliding sleeve and the sliding rod while rotating, so that the height of the workbench can be adjusted by lifting the threaded rod.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testers, in particular to a bad point marking mechanism of a chip tester. Background Art

[0002] Chip is a general term for semiconductor component products. A chip is a small piece of semiconductor material on which a given functional circuit is manufactured. Usually, integrated circuits are mass-produced on a single wafer of electronic grade silicon (EGS) or other semiconductors (such as GaAs) through processes such as photolithography. The wafer is cut (cut into small pieces), each containing a copy of the circuit. Each of these components is called a chip. After the chip is processed, it needs to be tested by a chip tester. A chip tester is an electronic measuring instrument used in the field of electronics and communication technology. Therefore, a bad point marking mechanism of a chip tester is required for use;

[0003] Compared with CN214585863U, a special instrument for ultrasound department disinfection, the third motor is turned on, the third motor drives the third screw to rotate, the third screw drives the third screw block to move forward, and the third screw block drives the positive probe to move forward, so as to change the longitudinal position of the positive probe, turn on the second electric push rod, the second electric push rod pushes the stabilizing frame to move downward, so as to drive the positive probe to contact the chip, which is convenient for detecting various points of the chip. The circuit of the chip can be detected by using the negative probe and the positive probe. When the circuit is normal, the indicator light is green, and when the circuit is abnormal, the indicator light is red. People can turn on the third electric push rod, and the third electric push rod pushes the ink needle downward to mark the chip, which solves the problem that the traditional chip tester has poor use effect and is not convenient for marking bad points of the chip, but there are still certain problems, and the specific problems are as follows;

[0004] The bad pixel marking mechanism of most chip testers on the market currently makes it inconvenient for operators to position and fix the chip when testing the chip, which causes the chip to slide during testing, affecting the test effect of the chip. At the same time, the height of the chip tester cannot be adjusted, which affects the use of the bad pixel marking mechanism of the chip tester. Utility Model Content

[0005] The purpose of this section is to summarize some aspects of the embodiments of the utility model and briefly introduce some preferred embodiments. Some simplifications or omissions may be made in this section and the specification abstract and utility model name of this application to avoid blurring the purpose of this section, specification abstract and utility model name, and such simplifications or omissions cannot be used to limit the scope of the utility model.

[0006] In view of the bad pixel marking mechanism existing in most chip testers on the market mentioned above or in the prior art, it is inconvenient for operators to position and fix the chip when testing the chip, which causes the chip to slide during testing, affecting the test effect of the chip. At the same time, the height of the chip tester cannot be adjusted, which affects the use of the bad pixel marking mechanism of the chip tester. Therefore, the present utility model is proposed.

[0007] Therefore, the purpose of the utility model is to provide a bad point marking mechanism for a chip testing machine.

[0008] In order to solve the above technical problems, the utility model provides the following technical solutions: a bad point marking mechanism of a chip tester includes a chip tester body, which includes a base, the bottom end of the chip tester body is installed with a base, the side walls at both ends of the chip tester body are installed with fixing rods, and the outer wall of the fixing rod is installed with a mounting block, one end of the top of the mounting block is installed with an ink storage box, and the top of the ink storage box is installed with an ink inlet tube, the bottom end of the mounting block is installed with a detection lamp, and the bottom end of the mounting block is installed with an ink outlet tube;

[0009] A lifting mechanism, comprising a fixed sleeve, the fixed sleeve is mounted on the top of the base, a support plate is mounted on the top of the fixed sleeve, and support blocks are mounted on the tops of the support plates, a driving assembly is mounted on the outer wall of the fixed sleeve, a toothed disc body is mounted inside the fixed sleeve through ball rotation, and a threaded hole is provided inside the toothed disc body, a threaded rod is connected to the threaded hole, a sliding rod is mounted on the bottom end of the fixed sleeve, and a sliding sleeve is sleeved on the outer wall of the sliding rod, and the outer wall of the sliding sleeve is fixedly connected to the outer wall of the threaded rod;

[0010] The detection mechanism includes a workbench, which is installed on the top of the support block, a detection platform is installed on the top of the workbench, and through holes are opened inside the detection platform, a suction cup body is installed on the top of the through holes, a vacuum box is installed at the bottom of the workbench, a vacuum tube is installed at the bottom of the vacuum box, and a vacuum pumping mechanism is installed inside the vacuum tube.

[0011] As a preferred solution of the bad pixel marking mechanism of a chip testing machine of the utility model, the driving assembly includes a mounting box, a driving motor is installed at the bottom end of the mounting box, and a driving shaft is installed at the output end of the driving motor through a coupling, a gear body is installed at the top end of the driving shaft, and the gear body and the gear disc body are meshed with each other.

[0012] As a preferred solution of the bad point marking mechanism of a chip testing machine of the utility model, there are multiple groups of suction cup bodies with the same structure, and the multiple groups of suction cup bodies are arranged and installed in a transverse symmetrical manner.

[0013] As a preferred solution of the bad point marking mechanism of a chip tester of the utility model, wherein: the lifting mechanism has two groups of the same structure, and the two groups of lifting mechanisms and the top of the base are welded into an integrated structure.

[0014] As a preferred solution of the bad point marking mechanism of a chip testing machine of the utility model, wherein: the support plate and the support block form a U shape.

[0015] As a preferred solution of the bad point marking mechanism of a chip testing machine of the utility model, wherein; the shape of the suction cup body is conical, and the top end of the suction cup body is fixedly sealed and connected to the bottom end of the workbench.

[0016] The bad point marking mechanism of a chip testing machine of the utility model has beneficial effects: the utility model first places the chip on the top of the suction cup body, and starts the vacuum pumping mechanism to drive the vacuum tube to vacuum the suction cup body, thereby forming a negative pressure between the through hole and the inside of the suction cup body, so that the suction cup body can position and fix the chip, avoiding the chip from sliding during testing and affecting the test effect of the chip.

[0017] The bad point marking mechanism of a chip testing machine of the utility model has beneficial effects: the utility model first starts the driving motor to drive the driving shaft and the gear body to rotate, and the gear body and the toothed disc body are meshed with each other, so that the gear body rotates to drive the toothed disc body to rotate at the same time, and is threadedly connected to the threaded rod through the threaded hole, and through the mutual cooperation of the sliding rod and the sliding sleeve, the toothed disc body can drive the threaded rod to rise and fall inside the threaded hole through the sliding sleeve and the sliding rod while rotating, so that the height of the workbench can be adjusted by raising and lowering the threaded rod. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the following briefly introduces the drawings required for the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative labor. Among them:

[0019] Figure 1 The present invention is a schematic diagram of the main structure of a bad pixel marking mechanism of a chip testing machine.

[0020] Figure 2 The present invention is a schematic diagram of a fixed sleeve structure of a bad point marking mechanism of a chip testing machine.

[0021] Figure 3 The present invention is a schematic diagram of the internal structure of a fixed sleeve of a bad point marking mechanism of a chip testing machine.

[0022] Figure 4 The present invention is a schematic diagram of the internal structure of a workbench of a bad point marking mechanism of a chip testing machine.

[0023] In the accompanying drawings, the components represented by the reference numerals are listed as follows:

[0024] 1. Chip tester body; 101. Base; 102. Fixing rod; 103. Mounting block; 104. Ink storage box; 105. Ink inlet tube; 106. Ink outlet tube; 107. Detection lamp;

[0025] 2. Lifting mechanism; 201. Fixed sleeve; 2011. Toothed disc body; 2012. Threaded hole; 2013. Threaded rod; 2014. Sliding rod; 2015. Sliding sleeve; 202. Support plate; 203. Support block; 204. Driving assembly; 2041. Mounting box; 2042. Driving motor; 2043. Driving shaft; 2044. Gear body;

[0026] 3. Testing mechanism; 301. Workbench; 302. Testing platform; 303. Through hole; 304. Suction cup body; 305. Vacuum box; 306. Vacuum tube; 307. Vacuum extraction mechanism. DETAILED DESCRIPTION

[0027] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the accompanying drawings.

[0028] In the following description, many specific details are set forth to facilitate a full understanding of the present invention, but the present invention may also be implemented in other ways different from those described herein, and those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0029] Secondly, the term "one embodiment" or "embodiment" as used herein refers to a specific feature, structure or characteristic that may be included in at least one implementation of the present invention. The term "in one embodiment" that appears in different places in this specification does not necessarily refer to the same embodiment, nor does it refer to a separate or selective embodiment that is mutually exclusive with other embodiments.

[0030] Example 1: Reference Figures 1 to 4, which is the first embodiment of the utility model, and this embodiment provides a bad point marking mechanism of a chip tester, which can realize the bad point marking mechanism of most chip testers on the market. When testing the chip, it is not convenient for the operator to position and fix the chip, which causes the chip to slide during the test, affecting the test effect of the chip. The chip tester body 1 includes a base 101, and the base 101 is installed at the bottom end of the chip tester body 1, and the side walls at both ends of the chip tester body 1 are installed with fixing rods 102, and the outer wall of the fixing rod 102 is installed with a mounting block 103, and one end of the top of the mounting block 103 is installed with an ink storage box 104, and the top of the ink storage box 104 is installed with an ink inlet tube 105, and the bottom end of the mounting block 103 is installed with a detection lamp 107, and the bottom end of the mounting block 103 is installed with an ink outlet tube 106;

[0031] The lifting mechanism 2 includes a fixed sleeve 201, which is installed on the top of the base 101. A support plate 202 is installed on the top of the fixed sleeve 201, and a support block 203 is installed on the top of the support plate 202. A driving component 204 is installed on the outer wall of the fixed sleeve 201. A toothed disc body 2011 is installed inside the fixed sleeve 201 through ball rotation, and a threaded hole 2012 is opened inside the toothed disc body 2011. The internal thread of the threaded hole 2012 is connected with a threaded rod 2013. A sliding rod 2014 is installed at the bottom end of the fixed sleeve 201, and a sliding sleeve 2015 is sleeved on the outer wall of the sliding rod 2014. The outer wall of the sliding sleeve 2015 is fixedly connected to the outer wall of the threaded rod 2013.

[0032] The driving assembly 204 includes a mounting box 2041, a driving motor 2042 is mounted at the bottom end of the mounting box 2041, and a driving shaft 2043 is mounted at the output end of the driving motor 2042 through a coupling, a gear body 2044 is mounted at the top end of the driving shaft 2043, and the gear body 2044 is meshed with the toothed disc body 2011, the lifting mechanism 2 has two groups of the same structure, and the two groups of lifting mechanisms 2 and the top end of the base 101 are welded integrated structures, and the support plate 202 and the support block 203 form a U shape.

[0033] The specific working principle is that when the height of the detection mechanism 3 needs to be adjusted, first, the driving motor 2042 is started to drive the driving shaft 2043 and the gear body 2044 to rotate, and the gear body 2044 is meshed with the toothed disc body 2011 to rotate the gear body 2044 to drive the toothed disc body 2011 to rotate at the same time, and at the same time, it is threadedly connected to the threaded rod 2013 through the threaded hole 2012, and through the mutual cooperation of the sliding rod 2014 and the sliding sleeve 2015, the toothed disc body 2011 can drive the threaded rod 2013 to rise and fall inside the threaded hole 2012 through the sliding sleeve 2015 and the sliding rod 2014 while rotating, so as to facilitate the lifting of the threaded rod 2013 to adjust the height of the workbench 301.

[0034] Example 2: Reference Figures 1 to 4 , which is the first embodiment of the utility model. This embodiment provides a bad pixel marking mechanism for a chip tester, which can solve the problem that the height of the chip tester cannot be adjusted at the same time, thereby affecting the use of the bad pixel marking mechanism of the chip tester. The detection mechanism 3 includes a workbench 301, and the workbench 301 is installed on the top of the support block 203. A detection table 302 is installed on the top of the workbench 301, and a through hole 303 is opened inside the detection table 302. A suction cup body 304 is installed on the top of the through hole 303. A vacuum box body 305 is installed at the bottom end of the workbench 301, and a vacuum tube 306 is installed at the bottom end of the vacuum box body 305. A vacuum pumping mechanism 307 is installed inside the vacuum tube 306.

[0035] There are multiple groups of suction cup bodies 304 of the same structure, and the multiple groups of suction cup bodies 304 are arranged and installed in a transverse symmetrical manner. The shape of the suction cup body 304 is conical, and the top end of the suction cup body 304 is fixedly sealed and connected to the bottom end of the workbench 301.

[0036] The specific working principle is that when the chip needs to be positioned and fixed, the chip is first placed on the top of the suction cup body 304, and the vacuum mechanism 307 is started to drive the vacuum tube 306 to evacuate the suction cup body 304, so that negative pressure is formed inside the through hole 303 and the suction cup body 304, so that the suction cup body 304 can position and fix the chip to prevent the chip from sliding during testing and affecting the test effect of the chip.

[0037] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A bad pixel marking mechanism for a chip testing machine, characterized in that: include, A chip tester body (1) comprises a base (101), the base (101) being installed at the bottom of the chip tester body (1), fixing rods (102) being installed at the side walls at both ends of the chip tester body (1), and a mounting block (103) being installed at the outer wall of the fixing rod (102), an ink storage box (104) being installed at one end of the top of the mounting block (103), and an ink inlet tube (105) being installed at the top of the ink storage box (104), a detection lamp (107) being installed at the bottom of the mounting block (103), and an ink outlet tube (106) being installed at the bottom of the mounting block (103); The lifting mechanism (2) comprises a fixed sleeve (201), the fixed sleeve (201) being mounted on the top of a base (101), a support plate (202) being mounted on the top of the fixed sleeve (201), and a support block (203) being mounted on the top of each support plate (202), a driving assembly (204) being mounted on the outer wall of the fixed sleeve (201), a toothed disc body (2011) being mounted inside the fixed sleeve (201) through ball rotation, and a threaded hole (2012) being provided inside the toothed disc body (2011), a threaded rod (2013) being connected to the inner thread of the threaded hole (2012), a sliding rod (2014) being mounted on the outer wall of the sliding rod (2014), and a sliding sleeve (2015) being sleeved on the outer wall of the sliding sleeve (2015), and the outer wall of the sliding sleeve (2015) being fixedly connected to the outer wall of the threaded rod (2013); The detection mechanism (3) comprises a workbench (301), wherein the workbench (301) is mounted on the top of a support block (203), a detection platform (302) is mounted on the top of the workbench (301), and a through hole (303) is provided inside the detection platform (302), a suction cup body (304) is mounted on the top of the through hole (303), a vacuum box (305) is mounted on the bottom of the workbench (301), and a vacuum tube (306) is mounted on the bottom of the vacuum box (305), and a vacuum pumping mechanism (307) is mounted inside the vacuum tube (306).

2. A bad pixel marking mechanism for a chip testing machine as claimed in claim 1, characterized in that: The driving assembly (204) comprises a mounting box (2041), a driving motor (2042) being mounted at the bottom end of the mounting box (2041), a driving shaft (2043) being mounted at the output end of the driving motor (2042) via a coupling, a gear body (2044) being mounted at the top end of the driving shaft (2043), and the gear body (2044) and the toothed disc body (2011) being meshed with each other.

3. The bad pixel marking mechanism of a chip testing machine as claimed in claim 1, characterized in that: The suction cup main bodies (304) are of the same structure and are provided in multiple groups, and the multiple groups of suction cup main bodies (304) are arranged and installed in a transversely symmetrical manner.

4. The bad pixel marking mechanism of a chip testing machine as claimed in claim 1, characterized in that: The lifting mechanisms (2) are of the same structure and there are two groups, and the two groups of lifting mechanisms (2) and the top of the base (101) are welded into an integrated structure.

5. The bad pixel marking mechanism of a chip testing machine as claimed in claim 1, characterized in that: The support plate (202) and the support block (203) form a U shape.

6. The bad pixel marking mechanism of a chip testing machine as claimed in claim 1, characterized in that: The suction cup body (304) is in a conical shape, and the top end of the suction cup body (304) is fixedly and sealedly connected to the bottom end of the workbench (301).

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