A test device for transient voltage suppression diode

Abstract

The present application discloses a device for testing a transient voltage suppressor diode, including: a power module for providing power to other modules; a protection circuit arranged in the main circuit for cutting off the main circuit when the main circuit is overcurrent; a data acquisition module arranged between the protection circuit and the transient voltage suppressor diode to be tested, for providing circuit conditions for testing the transient voltage suppressor diode to be tested, and outputting relevant parameters through an output terminal test point, and connecting a test device at the output terminal test point to read and obtain the relevant parameters. The verification device of the embodiment of the present application can effectively and reliably test the board-level functions and performance of the transient voltage suppressor diode, thereby verifying whether the transient voltage suppressor diode meets the application requirements.

Description

Technical Field

[0001] The present application relates to the field of basic circuit technology, and in particular to a testing device for a transient voltage suppression diode. Background Art

[0002] Transient voltage suppressor diode is a protective electronic component that plays the role of overvoltage protection and anti-interference in electronic circuits, effectively protecting precision components in electronic circuits from damage by various surge pulses. Transient voltage suppressor diodes have the characteristics of fast response speed, large transient power, easy control of clamping voltage, and small size. They are widely used in communication equipment, instrumentation, computers and other fields. At present, major military industries and scientific research institutes use domestic transient voltage suppressor diodes when developing equipment and products. Whether the functional performance of these components can meet the needs of users needs to be verified by scientific means. According to the test data and results, transient voltage suppressor diodes that meet the application requirements are selected. Summary of the invention

[0003] The embodiment of the present application provides a transient voltage suppressor diode inspection device to solve the verification problems of the electrical characteristics, board-level working stability, thermal environment, etc. of the transient voltage suppressor diode.

[0004] The present application provides a transient voltage suppression diode inspection device, including:

[0005] A power module is used to provide power to other modules;

[0006] The protection circuit is arranged in the main circuit to cut off the main circuit in case of overcurrent;

[0007] The data acquisition module is arranged between the protection circuit and the transient voltage suppression diode to be tested, and is used to provide circuit conditions for testing the transient voltage suppression diode to be tested, and output relevant parameters through the output end test point, and the test equipment is connected to the output end test point to read and obtain the relevant parameters.

[0008] Optionally, the protection circuit is a fuse F2, one end of the fuse F2 is connected to the output end of the power module, and the other end of the fuse F2 is connected to the non-grounded end of the output end test point.

[0009] Optionally, the data acquisition module includes a capacitor C47 and a capacitor C48, and the capacitor C47 and the capacitor C48 are connected in parallel between the other end of the fuse F2 and the non-grounded end of the output test point;

[0010] The positive electrode of the transient voltage suppression diode to be tested is grounded, and the negative electrode of the transient voltage suppression diode to be tested is connected between the other end of the fuse F2 and the non-grounded end of the output test point.

[0011] Optionally, the power supply module is a DC power supply, and the power supply module is connected to one end of the fuse F2 and the negative voltage electrode U59.

[0012] Optionally, the output end test point includes a non-grounded end connected to the other end of the fuse F2, and a grounded end U58.

[0013] The verification device of the embodiment of the present application can effectively and reliably test the board-level function and performance of the transient voltage suppression diode, thereby verifying whether the transient voltage suppression diode meets the application requirements.

[0014] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present application. Also, the same reference symbols are used throughout the accompanying drawings to represent the same components. In the accompanying drawings:

[0016] Figure 1 An example of the structure of a testing device for a transient voltage suppression diode according to an embodiment of the present application;

[0017] Figure 2 This is an example of the circuit structure of a transient voltage suppression diode testing device according to an embodiment of the present application. DETAILED DESCRIPTION

[0018] The exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although the exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0019] The present application embodiment provides a transient voltage suppression diode inspection device, such as Figure 1 As shown, including:

[0020] A power module is used to provide power to other modules;

[0021] The protection circuit is arranged in the main circuit to cut off the main circuit in case of overcurrent;

[0022] The data acquisition module is arranged between the protection circuit and the transient voltage suppression diode to be tested, and is used to provide circuit conditions for testing the transient voltage suppression diode to be tested, and output relevant parameters through the output end test point, and the test equipment is connected to the output end test point to read and obtain the relevant parameters.

[0023] In some embodiments, Figure 2 As shown, the protection circuit is a fuse F2, one end of the fuse F2 is connected to the output end of the power module, and the other end of the fuse F2 is connected to the non-grounded end of the output end test point.

[0024] In some embodiments, Figure 2 As shown, the data acquisition module includes a capacitor C47 and a capacitor C48, and the capacitor C47 and the capacitor C48 are connected in parallel between the other end of the fuse F2 and the non-grounded end of the output test point;

[0025] The positive electrode of the transient voltage suppression diode to be tested is grounded, and the negative electrode of the transient voltage suppression diode to be tested is connected between the other end of the fuse F2 and the non-grounded end of the output test point.

[0026] In some embodiments, the power module is a DC power supply, and the power module is connected to one end of the fuse F2 and the negative voltage electrode U59.

[0027] In some embodiments, the output test point includes a non-ground terminal connected to the other end of the fuse F2, and a ground terminal U58.

[0028] like Figure 2 As shown, when the verification circuit is working normally, the test verifies the reverse cutoff capability of the transient voltage suppression diode, as well as the overvoltage protection capability of the transient voltage suppression diode in the clamping state, and simulates the working state of the tested transient voltage suppression diode in different working environments.

[0029] Figure 2In the figure, U40 and U59 are the power input terminals, which are connected to the external power supply. U40 is the positive voltage pole and U59 is the negative voltage pole. F2 is a fuse. The fuse's withstand voltage value, fusing current and other parameters can be selected according to actual use requirements. Use a multimeter to check whether the input voltage and output voltage terminals are short-circuited to the ground. If there is no short circuit, power on the test circuit. D10 is the transient voltage suppression diode to be tested. The output terminal test points are U39 and U58. U39 and U58 can be connected to test instruments such as oscilloscopes and multimeters to collect test data to verify whether the function and performance of the transient voltage suppression diode meet the application requirements when the circuit is working normally.

[0030] Based on the inspection device of the embodiment of the present application, the verification can be completed by using the following steps:

[0031] Set the adjustable voltage output device so that the input voltage is within the corresponding range and turn off the device;

[0032] Connect the adjustable voltage output device to the power input terminal (U40 and U59), and be careful not to connect the positive and negative poles in reverse;

[0033] Connect the output terminals (U39 and U58) of the verification device to the multimeter, taking care not to connect the positive and negative poles in reverse.

[0034] Turn on the adjustable voltage output device, adjust the voltage value, observe the output voltage value measured by the multimeter, and observe whether the fuse is blown.

[0035] Connect the clamp voltage tester to the power input terminal (U40 and U59), turn on the pulse generator, apply peak current and single pulse square wave signal, record the voltage at the output terminal, and observe whether the fuse is blown.

[0036] The verification device of the embodiment of the present application can effectively and reliably test the board-level function and performance of the transient voltage suppression diode, thereby verifying whether the transient voltage suppression diode meets the application requirements.

[0037] It should be noted that in the embodiments of the present application, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "includes a ..." does not exclude the presence of other identical elements in the process, method, article or device including the element.

[0038] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0039] The embodiments of the present application are described above in conjunction with the accompanying drawings, but the present application is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Under the guidance of the present application, ordinary technicians in this field can also make many forms without departing from the purpose of the present application and the scope of protection of the claims, all of which are within the protection of the present application.

Claims

1. A transient voltage suppression diode inspection device, characterized in that: include: A power module is used to provide power to other modules; The protection circuit is arranged in the main circuit to cut off the main circuit in case of overcurrent; The data acquisition module is arranged between the protection circuit and the transient voltage suppression diode to be tested, and is used to provide circuit conditions for testing the transient voltage suppression diode to be tested, and output relevant parameters through the output end test point, and the test equipment is connected to the output end test point to read and obtain the relevant parameters.

2. The transient voltage suppressor diode testing device according to claim 1, characterized in that: The protection circuit is a fuse F2, one end of the fuse F2 is connected to the output end of the power module, and the other end of the fuse F2 is connected to the non-grounded end of the output end test point.

3. The transient voltage suppressor diode testing device according to claim 2, characterized in that: The data acquisition module includes a capacitor C47 and a capacitor C48, and the capacitor C47 and the capacitor C48 are connected in parallel between the other end of the fuse F2 and the non-grounded end of the output test point; The positive electrode of the transient voltage suppression diode to be tested is grounded, and the negative electrode of the transient voltage suppression diode to be tested is connected between the other end of the fuse F2 and the non-grounded end of the output test point.

4. The transient voltage suppressor diode testing device according to claim 2, characterized in that: The power supply module is a DC power supply, and the power supply module is connected to one end of the fuse F2 and the negative voltage electrode U59.

5. The transient voltage suppressor diode testing device according to claim 2, characterized in that: The output terminal test point includes a non-ground terminal connected to the other end of the fuse F2, and a ground terminal U58.

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