Enrichment detection chip for visible components

Abstract

In the visible component enrichment detection chip, a chip main body comprises a chip main body part A, a chip main body part B and a chip main body part C; the sample accommodating cavity A is positioned in the chip main body A part, and the sample accommodating cavity B is positioned in the chip main body B part; the sample adding port is positioned in the chip main body C part; the sample accommodating cavity A is communicated with the sample adding opening; the thickness of the chip main body part A is greater than that of the chip main body part B; the thickness of the chip main body C part is greater than that of the chip main body B part; the sample accommodating cavity B is provided with an observation window for microscopic imaging or microscopic observation; the sample accommodating cavity A is communicated with the sample accommodating cavity B; the volume of the sample accommodating cavity A is larger than that of the sample accommodating cavity B; in the using state, visible components in an endoscopic sample in the sample containing cavity A are enriched in the sample containing cavity B under the action of gravity or buoyancy. When the position of the visible component enrichment detection chip is changed, the sample containing cavity B can enrich visible components gathered due to gravity or buoyancy, and gathering is convenient and high in efficiency.

Description

Technical Field

[0001] The present application belongs to the technical field of formed element analysis, and specifically relates to a formed element analysis device and chip based on microscopic sample examination. Background Art

[0002] The formed components of microscopic specimens based on formed component suspensions are different in different suspensions. Conventional suspensions such as feces, blood, and urine may have formed components floating on the top of the suspension. The content or concentration of floating formed components in the sample is usually low, but the floating formed components are very important for the composition analysis of the sample.

[0003] In the prior art, the formed elements in the suspension are usually enriched outside the chip by centrifugation or other methods, and then the enriched microscopic sample is injected into the chip for imaging and detection analysis. The whole process is inefficient. The operations in the enrichment process may introduce operational errors, which will affect the accuracy of subsequent quantitative analysis. Summary of the invention

[0004] In order to solve the problem of low efficiency of aggregation imaging analysis of floating formed elements in the prior art, this application proposes a formed element enrichment detection chip, which can achieve the aggregation of formed elements through the internal structural design of the chip and improve the aggregation efficiency of formed elements.

[0005] The technical solution of the present application to solve the above technical problems is a tangible element enrichment detection chip, including a chip body, a sample holding cavity A, a sample holding cavity B, and a sample addition port; the chip body includes a chip body A part, a chip body B part, and a chip body C part; the sample holding cavity A is located in the chip body A part, and the sample holding cavity B is located in the chip body B part; the sample addition port is located in the chip body C part; the sample holding cavity A is connected to the sample addition port, and the sample addition port is used to add a microscopic sample to the sample holding cavity A; the thickness of the chip body A part is greater than the thickness of the chip body B part; the thickness of the chip body C part is greater than The thickness of the chip body B is greater than that of the chip body B; the sample holding cavity B is provided with an observation window, which is used for microscopic imaging or microscopic observation of the microscopic sample contained in the sample holding cavity B; the sample holding cavity A is connected to the sample holding cavity B; the volume of the sample holding cavity A is larger than that of the sample holding cavity B; and it also includes one of the following features: TA1: in use, the formed components in the microscopic sample in the sample holding cavity A are enriched in the sample holding cavity B due to gravity; TA2: in use, the formed components in the microscopic sample in the sample holding cavity A are enriched in the sample holding cavity B due to buoyancy.

[0006] The above-mentioned tangible element enrichment detection chip includes an exhaust channel and an exhaust hole; the exhaust hole is used to exhaust the internal air of the sample holding cavity B or the sample holding cavity A; the exhaust channel is connected to the exhaust hole, and the exhaust channel is connected to the sample holding cavity B or the sample holding cavity A. In a horizontal placement state, the opening position of the exhaust hole is higher than the liquid level position of the internal microscopic inspection sample.

[0007] The bottom of the sample holding chamber A is lower than the bottom of the sample holding chamber B.

[0008] The height of the sample holding cavity B is less than 1 mm and greater than 0.01 mm; the height of the sample holding cavity A is greater than 2 mm.

[0009] The above-mentioned shaped element enrichment detection chip comprises a sealing device, and the above-mentioned sealing device is used to seal the above-mentioned exhaust hole or sample addition port.

[0010] The exhaust hole is located at the chip body C portion; the chip body A portion and the chip body C portion are located at two ends of the chip body B portion.

[0011] The volume ratio of the sample holding cavity A to the sample holding cavity B is greater than 5.

[0012] The height of the sample holding cavity B is less than 1 mm and greater than 0.01 mm; the height of the sample holding cavity A is greater than 2 mm; and the height of the chip at the location of the sample holding cavity B is less than 2 mm.

[0013] The chip body is composed of an upper chip cover and a lower chip body. The lower chip body includes a sample holding cavity A recess and a sample holding cavity B recess. The chip lower body and the chip upper cover are bonded or welded as a whole. The chip upper cover seals the sample holding cavity A recess and the sample holding cavity B recess to form sample holding cavity A and sample holding cavity B.

[0014] A connecting channel is provided between the microscopic sample holding cavity and the sample adding port, the connecting channel A end is connected to the sample adding port, and the connecting channel B end is connected to the sample holding cavity B; the tube diameter of the connecting channel A end is larger than the tube diameter of the connecting channel B end; the connecting channel A end and the connecting channel B end are connected in a non-linear manner in a Z shape.

[0015] One of the technical effects of the above technical solution is that the volume of sample holding cavity A is larger than that of sample holding cavity B. When the position of the tangible component enrichment detection chip is changed, sample holding cavity B can enrich the tangible components gathered due to gravity or buoyancy, and the gathering is convenient and efficient.

[0016] One of the technical effects of the above technical solution is that the volume of the sample holding cavity A is larger than that of the sample holding cavity B, which facilitates the enrichment of a large sample volume and improves the enrichment ratio.

[0017] One of the technical effects of the above technical solution is that the provision of the exhaust channel and the exhaust hole provides a channel for gas exhaust, thereby reducing the probability of bubbles appearing in the sample holding cavity B. The influence of bubbles on the enrichment of formed elements and subsequent microscopic imaging is reduced.

[0018] One of the technical effects of the above technical solution is that the bottom of the sample holding chamber A is lower than the bottom of the sample holding chamber B. Such a height difference design facilitates the enrichment of tangible components during position conversion.

[0019] One of the technical effects of the above technical solution is that the sealing device seals the above exhaust hole or sample loading port, and when the position of the formed element enrichment detection chip is changed, the microscopic sample can flow in each cavity without overflowing.

[0020] One of the technical effects of the above technical solution is that the exhaust hole is located at the C part of the chip body, and can replace the sample adding port, which is convenient for sample adding and bubble discharge.

[0021] One of the technical effects of the above technical solution is that the height of the sample accommodating cavity B is less than 1 mm and greater than 0.01 mm, which is suitable for microscopic imaging.

[0022] One of the technical effects of the above technical solution is that the height of the sample holding cavity A is greater than 2 mm, which is convenient for accommodating more microscopic samples, increases the volume ratio of the sample holding cavity A to the sample holding cavity B, and enhances the enrichment effect.

[0023] One of the technical effects of the above technical solution is that the volume ratio of the sample holding cavity A to the sample holding cavity B is greater than 5, and the volume ratio is large enough to provide a sufficient multiple enrichment effect.

[0024] One of the technical effects of the above technical solution is that the combination connection between the upper chip cover and the lower chip body facilitates chip manufacturing.

[0025] One of the technical effects of the above technical solution is that the chip body A and the chip body C are located at the two ends of the chip body B, and the chip body B can provide a space in the middle to facilitate the flow of liquid and the observation of formed components after aggregation. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 Schematic diagram of embodiment 1 of the tangible element enrichment detection chip Figure 1 ;

[0027] Figure 2 Schematic diagram of embodiment 1 of the tangible element enrichment detection chip Figure 2 ;

[0028] Figure 3 is a perspective schematic diagram of embodiment 2 of a formed element enrichment detection chip;

[0029] Figure 4 is a three-dimensional schematic diagram of embodiment 3 of the formed element enrichment detection chip;

[0030] Figure 5 Schematic diagram of the cross-section of the embodiment 3 of the shaped element enrichment detection chip Figure 1 ;

[0031] Figure 6 Schematic diagram of the cross-section of the embodiment 3 of the shaped element enrichment detection chip Figure 2 ;

[0032] Figure 7 is a side perspective schematic diagram of embodiment 3 of the formed element enrichment detection chip;

[0033] Figure 8 Schematic diagram of the cross-section of the embodiment 3 of the shaped element enrichment detection chip Figure 3 ;

[0034] Fig. 9 It is a schematic diagram of the decomposition state of Example 3 of the formed element enrichment detection chip. DETAILED DESCRIPTION

[0035] The content of this application is further described in detail below in conjunction with the accompanying drawings.

[0036] It should be noted that the following is a description of the preferred embodiments of the present application, which does not constitute any limitation to the present application. The description of the preferred embodiments of the present application is only an explanation of the general principles of the present application. The embodiments described in this application are only a part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0037] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. In addition, the terms "first", "second", and technical features numbered with Arabic numerals 1, 2, 3, etc., and numbers such as "A" and "B", are only used for descriptive purposes and are only for the convenience of explanation, and do not represent a sequential relationship in time or space; they cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first", "second", and numbered with Arabic numerals 1, 2, 3, etc. may explicitly or implicitly include one or more of the features. In the description of the present application, “several” means two or more than two, unless otherwise clearly and specifically defined.

[0038] like Figure 1 In an embodiment of a chip for detecting enrichment of formed elements, the chip comprises a chip body, a sample holding cavity A111, a sample holding cavity B121, and a sample adding port 131; the chip body comprises a chip body A portion 110, a chip body B portion 120, and a chip body C portion 130; the sample holding cavity A111 is located in the chip body A portion 110, the sample holding cavity B121 is located in the chip body B portion 120; the sample adding port 131 is located in the chip body C portion 130; the sample holding cavity A111 is connected to the sample adding port 131, and the sample adding port 131 is used for The microscopic sample is added into the sample holding cavity A11; the thickness of the chip body A portion 110 is greater than the thickness of the chip body B portion 120; the thickness of the chip body C portion 130 is greater than the thickness of the chip body B portion 120; the sample holding cavity B121 is provided with an observation window, and the observation window is used for microscopic imaging or microscopic observation of the microscopic sample contained in the sample holding cavity B121; the sample holding cavity A111 is connected to the sample holding cavity B121; the volume of the sample holding cavity A111 is greater than that of the sample holding cavity B121.

[0039] like Figure 1 In an embodiment of a chip for detecting enrichment of formed elements, the volume ratio of the sample holding cavity A to the volume of the sample holding cavity B is greater than 5. The height of the sample holding cavity B is less than 1 mm and greater than 0.01 mm; the height of the sample holding cavity A is greater than 2 mm; the height of the chip at the location of the sample holding cavity B is less than 2 mm.

[0040] like Figure 1 and Figure 2 In an embodiment of a formed component enrichment detection chip, in the use state, the position of the formed component enrichment detection chip is changed so that the sample holding cavity A111 is above the sample holding cavity B121, and the formed components in the microscopic sample in the sample holding cavity A111 are enriched in the sample holding cavity B121 due to the action of gravity; after enrichment, the position of the formed component enrichment detection chip is changed to a horizontal position for observation or imaging.

[0041] like Figure 1 and Figure 2 In an embodiment of a formed component enrichment detection chip, in the use state, the position of the formed component enrichment detection chip is changed so that the sample holding cavity A111 is below the sample holding cavity B121, and the formed components in the microscopic sample in the sample holding cavity A111 are enriched in the sample holding cavity B121 due to the buoyancy; after enrichment, the position of the formed component enrichment detection chip is changed to a horizontal position for observation or imaging.

[0042] like Figure 3 In an embodiment of a formed element enrichment detection chip, it includes an exhaust channel 170 and an exhaust hole 171; the exhaust hole 171 is used to exhaust the internal air of the sample holding cavity B121 or the sample holding cavity A111; the exhaust channel 170 is connected with the exhaust hole 171, and the exhaust channel 170 is connected with the sample holding cavity B121 or the sample holding cavity A111. In a horizontal placement state, the opening position of the exhaust hole 171 is higher than the liquid level position of the internal microscopic inspection sample.

[0043] like Figure 3 In an embodiment of a tangible element enrichment detection chip, the bottom 113 of the sample holding cavity A is lower than the bottom 123 of the sample holding cavity B. The height of the sample holding cavity B 121 is less than 1 mm and greater than 0.01 mm; the height of the sample holding cavity A 111 is greater than 2 mm.

[0044] Some embodiments not shown in the drawings further include a sealing device, which is used to seal the exhaust hole or the sample addition port.

[0045] like Figure 3 In an embodiment of a tangible element enrichment detection chip, the exhaust hole is located in the C portion 130 of the chip body.

[0046] like Figure 3 In the illustrated embodiment, the exhaust hole and the sample loading port are interchangeable; the exhaust hole 131 is located at the C portion of the chip body, and the exhaust hole 131 and the sample loading port 171 can form a mutually interchangeable effect, facilitating sample loading and bubble discharge.

[0047] like Figures 4 to 9In an embodiment of a chip for detecting enrichment of formed elements, the chip comprises a chip body 300, a sample holding cavity A311, a sample holding cavity B321, and a sample adding port 331; the chip body comprises a chip body A portion 310, a chip body B portion 320, and a chip body C portion 330; the sample holding cavity A311 is located in the chip body A portion 310, the sample holding cavity B321 is located in the chip body B portion 320; the sample adding port 331 is located in the chip body C portion 330; the sample holding cavity A311 is connected to the sample adding port 331, and the sample adding port 331 is connected to the sample adding port 331. Used to add microscopic samples to the sample holding cavity A311; the thickness of the chip body A part 310 is greater than the thickness of the chip body B part 320; the thickness of the chip body C part 330 is greater than the thickness of the chip body B part 320; the sample holding cavity B321 is provided with an observation window, and the observation window is used for microscopic imaging or microscopic observation of the microscopic sample contained in the sample holding cavity B321; the sample holding cavity A311 is connected to the sample holding cavity B321; the volume of the sample holding cavity A311 is greater than that of the sample holding cavity B321. The chip body A part 310 and the chip body C part 330 are located at both ends of the chip body B part 320.

[0048] like Figures 4 to 9 In an embodiment of a chip for detecting enrichment of formed elements, a chip body 300 is composed of a chip upper cover plate 360 ​​and a chip lower body 390. The chip lower body 390 includes a sample holding cavity A recess 391 and a sample holding cavity B recess 392. The chip lower body 390 and the chip upper cover plate 360 ​​are bonded or welded as a whole. The chip upper cover plate 360 ​​closes the sample holding cavity A recess 391 and the sample holding cavity B recess 392 to form a sample holding cavity A 311 and a sample holding cavity B 321.

[0049] like Figures 4 to 9 In an embodiment of a chip for detecting enrichment of formed elements, the chip lower body 390 includes an exhaust channel groove 395; when the chip lower body 390 and the chip upper cover plate 360 ​​are bonded or welded as a whole, the exhaust channel groove 395 and the chip upper cover plate 360 ​​enclose an exhaust channel. The exhaust channel is connected to the exhaust hole 371, and the exhaust hole 371 is used to exhaust the internal air of the sample holding cavity B321 or the sample holding cavity A311; the exhaust channel 371 is connected to the sample holding cavity B321 or the sample holding cavity A311, and in a horizontally placed state, the opening position of the exhaust hole 371 is higher than the liquid level of the internal microscopic inspection sample.

[0050] like Figure 7, D1 is a schematic diagram of the position of the microscopic sample liquid level in the sample holding cavity B321 or the sample holding cavity A311; the number 351 in the figure is a connecting channel between the sample holding cavity B321 and the sample injection port 331, the connecting channel A end 3511 is connected to the sample injection port 331, and the connecting channel B end 3512 is connected to the sample holding cavity B321; the tube diameter of the connecting channel A end 3511 is larger than the tube diameter of the connecting channel B end 3512; the connecting channel A end 3511 and the connecting channel B end 3512 are connected in a Z-shaped non-linear manner.

[0051] like Figure 8 , D2 is a schematic diagram of the position of the microscopic sample liquid level in the sample holding chamber B321 or the sample holding chamber A311; Figure 8 The formed element enrichment detection chip is in a tilted state.

[0052] like Fig. 9 , D3 is a schematic diagram of the position of the bonding line between the chip lower body 390 and the chip upper cover 360.

[0053] Although the present application is illustrated and described according to the preferred embodiment and several alternatives, the application will not be limited by the specific description in this specification. Other additional replacement or equivalent components can also be used to practice the present application.

Claims

1. A chip for detecting enrichment of tangible elements, characterized in that: It includes a chip body, a sample holding cavity A, a sample holding cavity B, and a sample adding port; The chip body includes a chip body A part, a chip body B part, and a chip body C part; The sample holding cavity A is located in the chip body A portion, and the sample holding cavity B is located in the chip body B portion; The sample injection port is located in the C part of the chip body; The sample holding cavity A is connected to the sample adding port, and the sample adding port is used to add the microscopic examination sample into the sample holding cavity A; The thickness of the chip body A portion is greater than the thickness of the chip body B portion; The thickness of the chip body C portion is greater than the thickness of the chip body B portion; The sample holding cavity B is provided with an observation window, and the observation window is used for microscopic imaging or microscopic observation of the microscopic sample held inside the sample holding cavity B; The sample holding chamber A is connected to the sample holding chamber B; The volume of the sample holding chamber A is larger than that of the sample holding chamber B; Also includes one of the following features: TA1: In use, the formed elements in the sample under microscopic examination in sample holding chamber A are enriched in sample holding chamber B due to gravity; TA2: In use, the formed elements in the microscopic sample in sample holding chamber A are enriched in sample holding chamber B due to buoyancy.

2. The tangible element enrichment detection chip according to claim 1, characterized in that: Including exhaust passages and exhaust holes; The exhaust hole is used to exhaust the internal air of the sample holding cavity B or the sample holding cavity A; The exhaust channel is connected to the exhaust hole, and the exhaust channel is connected to the sample holding cavity B or the sample holding cavity A. In a horizontally placed state, the opening position of the exhaust hole is higher than the liquid level position of the internal microscopic inspection sample.

3. The tangible element enrichment detection chip according to claim 1, characterized in that: The bottom of the sample holding cavity A is lower than the bottom of the sample holding cavity B.

4. The tangible element enrichment detection chip according to claim 1, characterized in that: The height of the sample holding cavity B is less than 1 mm and greater than 0.01 mm; the height of the sample holding cavity A is greater than 2 mm.

5. The tangible element enrichment detection chip according to claim 2, characterized in that: A sealing device is included, and the sealing device is used to seal the exhaust hole or the sample addition port.

6. The tangible element enrichment detection chip according to claim 5, characterized in that: The exhaust hole is located at the chip body C portion; the chip body A portion and the chip body C portion are located at two ends of the chip body B portion.

7. The tangible element enrichment detection chip according to claim 1, characterized in that: The volume ratio of the sample holding cavity A to the volume of the sample holding cavity B is greater than 5.

8. The tangible element enrichment detection chip according to claim 1, characterized in that: The height of the sample holding cavity B is less than 1 mm and greater than 0.01 mm; The height of the sample holding cavity A is greater than 2 mm; The chip height at the location of the sample holding cavity B is less than 2 mm.

9. The tangible element enrichment detection chip according to claim 1, characterized in that: The chip body is composed of an upper chip cover and a lower chip body. The lower chip body includes a sample holding cavity A recess and a sample holding cavity B recess. The chip lower body and the chip upper cover are bonded or welded as a whole. The chip upper cover seals the sample holding cavity A recess and the sample holding cavity B recess to form sample holding cavity A and sample holding cavity B.

10. The tangible element enrichment detection chip according to claim 1, characterized in that: A connecting channel is provided between the sample holding cavity B and the sample adding port, the connecting channel A end is connected to the sample adding port, and the connecting channel B end is connected to the sample holding cavity B; the diameter of the connecting channel A end is larger than the diameter of the connecting channel B end; The connection channel A end and the connection channel B end are connected in a non-linear manner in a Z shape.

Images