Enrichment detection chip for visible components

Abstract

The visible component enrichment detection chip comprises a sample accommodating cavity A and a sample accommodating cavity B, a sample adding opening is formed in the sample accommodating cavity A and is used for adding a microscopic sample into the sample accommodating cavity A; the sample accommodating cavity B is provided with an observation window, and the observation window is used for carrying out microscopic imaging or microscopic observation on the microscopic examination sample accommodated in the sample accommodating cavity B; the sample accommodating cavity A is communicated with the sample accommodating cavity B, and a microscopic examination sample can enter the sample accommodating cavity B through the sample accommodating cavity A; the volume of the sample accommodating cavity A is larger than that of the sample accommodating cavity B; visible components in the sample are endoscopically examined by the sample accommodating cavity A in the using state and are enriched in the sample accommodating cavity B; by means of the structural design in the chip, the chip can be used for gathering floating-state visible components and can also be used for gathering bottom-sinking visible components, and the gathering efficiency of low-concentration visible components is improved.

Description

Technical Field

[0001] The present application belongs to the technical field of formed component analysis, and specifically relates to a chip used for microscopic examination or analysis of formed components. Background Art

[0002] In the application of formed component analysis based on microscopic samples, i.e. formed component suspensions, the formed components in different suspensions are different. Feces, blood, and urine are three common suspensions. There are not only some formed components that sink to the bottom, but also some formed components that float on the top of the suspension. Some components are not present in high amounts and are difficult to detect. However, these low-content formed components that sink to the bottom or float are very important for the component analysis of the sample.

[0003] How to aggregate these small amounts of sinking or floating formed elements within the limited imaging area of ​​the microscopic sample and perform accurate quantitative analysis is a technical problem to be solved.

[0004] In the prior art, enrichment is usually performed outside the chip by centrifugation or other methods, and then the enriched sample is injected into the chip for imaging and detection analysis. This reduces the efficiency of the entire process. Some prior arts also perform floating enrichment by setting a large cavity ratio; however, it can usually only solve the problem of enriching floating visible components, and it is difficult to be applied to both floating and bottom-sinking chips. Summary of the invention

[0005] In order to solve the problem of low aggregation efficiency of low-concentration formed components that sink to the bottom or float in the prior art, this application proposes a formed component enrichment detection chip, which can be used for both the aggregation of floating formed components and the enrichment of sunk formed components through the internal structural design of the chip, thereby improving the aggregation efficiency of low-concentration formed components.

[0006] The technical solution of the present application to solve the above technical problems is a tangible element enrichment detection chip, including a chip body, a sample holding cavity A, a sample holding cavity B, and a sample addition port; the chip body includes a chip body A part and a chip body B part, and the thickness of the chip body A part is greater than the thickness of the chip body B part; the sample holding cavity A is located in the chip body A part, and the sample holding cavity B is located in the chip body B part; the sample holding cavity A is connected to the sample addition port, and the sample addition port is used to add a microscopic sample to the sample holding cavity A; the sample holding cavity B is provided with an observation window, and the observation window is used to observe The microscopic sample contained in the sample holding chamber B is subjected to microscopic imaging or microscopic observation; the sample holding chamber A is connected to the sample holding chamber B, and the microscopic sample can enter the sample holding chamber B through the sample holding chamber A; the volume of the sample holding chamber A is larger than that of the sample holding chamber B; and one of the following features is also included: TB1: in use state, the formed components in the microscopic sample in the sample holding chamber A are enriched in the sample holding chamber B due to gravity; TB2: in use state, the formed components in the microscopic sample in the sample holding chamber A are enriched in the sample holding chamber B due to buoyancy.

[0007] The above-mentioned tangible element enrichment detection chip also includes a connecting cavity; the connecting cavity is used to connect the sample holding cavity A with the sample holding cavity B; the area of ​​one end of the connecting cavity connected to the sample holding cavity A is larger than the area of ​​the other end of the connecting cavity connected to the sample holding cavity B.

[0008] The above-mentioned shaped element enrichment detection chip includes an exhaust channel and an exhaust hole; the exhaust hole is used to exhaust the internal air of the sample holding cavity B or the sample holding cavity A; the exhaust channel is connected to the exhaust hole, and the exhaust channel is connected to the sample holding cavity B or the sample holding cavity A. In a horizontal placement state, the opening position of the exhaust hole is higher than the liquid level position of the internal microscopic inspection sample.

[0009] The above-mentioned tangible element enrichment detection chip includes any one of the following technical features: TA1: the bottom of the above-mentioned sample holding cavity A is higher than the bottom of the sample holding cavity B; TA2: the height of the above-mentioned sample holding cavity B is less than 1 mm and greater than 0.01 mm; TA3: the height of the above-mentioned sample holding cavity A is greater than 2 mm; TA4: the height of the chip at the location of the above-mentioned sample holding cavity B is less than 2 mm.

[0010] The above-mentioned shaped element enrichment detection chip comprises a sealing device, and the above-mentioned sealing device is used to seal the above-mentioned exhaust hole or sample addition port.

[0011] The above-mentioned formed component enrichment detection chip also includes a bubble containing cavity, which is connected to the sample containing cavity A or the sample containing cavity B. In use, after adding the microscopic sample, the exhaust hole or the sample addition port is closed with a sealing device, and the formed component enrichment detection chip is flipped to allow bubbles to enter the above-mentioned bubble containing cavity, so that the bubbles do not enter the sample containing cavity B.

[0012] The volume ratio of the sample holding cavity A to the volume of the sample holding cavity B is greater than 5.

[0013] The chip body is composed of the upper part of the chip and the bottom cover of the chip. The upper part of the chip includes the concave part of the sample accommodating cavity A and the concave part of the sample accommodating cavity B. The bottom cover is bonded or welded to the upper part of the chip as a whole. The bottom cover closes the concave part of the sample accommodating cavity A and the concave part of the sample accommodating cavity B to form sample accommodating cavity A and sample accommodating cavity B.

[0014] The chip bottom cover is made of a transparent material; it also includes an inner partition component, which raises the bottom of the sample containing cavity A.

[0015] The inner partition component comprises a bubble containing cavity.

[0016] One of the technical effects of the above technical solution is that the volume of the sample holding cavity A is larger than that of the sample holding cavity B. When in use, the formed component enrichment detection chip changes position, and the formed components that sink to the bottom or float are enriched in the sample holding cavity B, thereby achieving the enrichment of low-concentration formed components.

[0017] One of the technical effects of the above technical solution is that the cross-sectional area of ​​one end of the connecting cavity connected to the sample holding cavity A is larger than the cross-sectional area of ​​the other end of the connecting cavity connected to the sample holding cavity B, and when the formed element enrichment detection chip changes position, the formed elements are easier to enrich.

[0018] One of the technical effects of the above technical solution is that the bottom of the sample holding cavity A is higher than the bottom of the sample holding cavity B, and when the formed element enrichment detection chip changes position, the formed elements are more easily enriched.

[0019] One of the technical effects of the above technical solution is that the exhaust channel is connected to the sample holding cavity B and is placed horizontally. The opening position of the exhaust hole is higher than the liquid level of the internal microscopic sample, thereby avoiding the negative impact of bubble enrichment on the detection and observation of formed components.

[0020] One of the technical effects of the above technical solution is: in state A, the sample holding chamber B is located below the sample holding chamber A, and the chip is used for precipitation enrichment; in state B, the sample holding chamber B is located above the sample holding chamber A, and the chip is used for floating enrichment; one structure can be simultaneously applicable to two different enrichment methods.

[0021] One of the technical effects of the above technical solution is that the bubble containing cavity provides a buffer space for the built-in bubbles, thereby reducing the probability of bubbles appearing in the sample containing cavity B.

[0022] One of the technical effects of the above technical solution is that the sealing device seals the exhaust hole or the sample addition port, which can prevent the overflow of the microscopic sample when the formed element enrichment detection chip is changed.

[0023] One of the technical effects of the above technical solution is that the height of the sample accommodating cavity B is less than 1 mm and greater than 0.01 mm, which is suitable for microscopic imaging.

[0024] One of the technical effects of the above technical solution is that the height of the sample holding cavity A is greater than 2 mm, which is convenient for accommodating more microscopic samples, increases the volume ratio of the sample holding cavity A to the sample holding cavity B, and enhances the enrichment effect.

[0025] One of the technical effects of the above technical solution is that the volume ratio of the sample holding cavity A to the volume ratio of the sample holding cavity B is greater than 5, which can provide a sufficient multiple enrichment effect.

[0026] One of the technical effects of the above technical solution is that the upper part of the chip and the lower part of the chip are covered, which facilitates the manufacture of the chip body.

[0027] One of the technical effects of the above technical solution is: the inner partition component raises the bottom of the sample holding cavity A, which is conducive to forming a height difference between the bottom of the sample holding cavity A and the bottom of the sample holding cavity B, and facilitates the flow of liquid. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 This is a three-dimensional schematic diagram of embodiment 1 of the formed element enrichment detection chip;

[0029] Figure 2 This is a perspective stereoscopic schematic diagram of Example 1 of a formed element enrichment detection chip;

[0030] Figure 3 2 is a top perspective schematic diagram of embodiment 1 of the formed element enrichment detection chip;

[0031] Figure 4 It is one of the side cross-sectional schematic diagrams of Example 1 in a vertically placed state;

[0032] Figure 5 is one of the side cross-sectional schematic diagrams of Example 1 in a horizontally placed state;

[0033] Figure 6 This is the second side cross-sectional schematic diagram of Example 1 in a vertically placed state;

[0034] Figure 7is a second side cross-sectional schematic diagram of embodiment 1 in a horizontally placed state;

[0035] Figure 8 This is one of the schematic diagrams of the decomposition state of the embodiment 2 of the formed element enrichment detection chip;

[0036] Fig. 9 This is the second schematic diagram of the decomposition state of the embodiment 2 of the formed element enrichment detection chip;

[0037] Fig.10 This is one of the side cross-sectional schematic diagrams of Embodiment 2 of the formed element enrichment detection chip;

[0038] Fig.11 is a schematic side cross-sectional view of a decomposed state of embodiment 2 of a formed element enrichment detection chip;

[0039] Fig.12 It is one of the side cross-sectional schematic diagrams of Example 2 in a vertically placed state;

[0040] Fig.13 is a second side cross-sectional schematic diagram of Embodiment 2 in a vertically placed state;

[0041] Fig.14 This is the second side cross-sectional schematic diagram of Example 2 in a horizontally placed state. DETAILED DESCRIPTION

[0042] The content of this application is further described in detail below in conjunction with the accompanying drawings.

[0043] It should be noted that the following is a description of the preferred embodiments of the present application, which does not constitute any limitation to the present application. The description of the preferred embodiments of the present application is only an explanation of the general principles of the present application. The embodiments described in this application are only a part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0044] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. In addition, the terms "first", "second", and technical features numbered with Arabic numerals 1, 2, 3, etc., and numbers such as "A" and "B", are only used for descriptive purposes and are only for the convenience of explanation, and do not represent a sequential relationship in time or space; they cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first", "second", and numbered with Arabic numerals 1, 2, 3, etc. may explicitly or implicitly include one or more of the features. In the description of the present application, “several” means two or more than two, unless otherwise clearly and specifically defined.

[0045] like Figures 1 to 3 As shown, in an embodiment of a formed element enrichment detection chip, it includes a sample holding cavity A620, a sample holding cavity B630, and a connecting cavity 660; a sample adding port 610 is provided on the sample holding cavity A620, and the sample adding port 610 is used to add a microscopic sample to the sample holding cavity A620; the sample holding cavity B630 is provided with an observation window, and the observation window is used for microscopic imaging or microscopic observation of the microscopic sample contained in the sample holding cavity B; the sample holding cavity A620 is connected with the sample holding cavity B630, and the microscopic sample can enter the sample holding cavity B630 through the sample holding cavity A620; the volume of the sample holding cavity A620 is larger than that of the sample holding cavity B630; in the use state, the formed element enrichment detection chip changes position, and the formed elements in the microscopic sample in the sample holding cavity A620 are enriched in the sample holding cavity B630. The connecting cavity 660 is used to connect the sample receiving cavity A 620 with the sample receiving cavity B 630; the cross-sectional area of ​​one end of the connecting cavity 660 connected to the sample receiving cavity A 620 is larger than the cross-sectional area of ​​the other end of the connecting cavity 660 connected to the sample receiving cavity B 630. The bottom 621 of the sample receiving cavity A is higher than the bottom 631 of the sample receiving cavity B.

[0046] like Figures 1 to 3As shown, in an embodiment of a chip for detecting enrichment of formed elements, an exhaust channel 650 and an exhaust hole 670 are further included. The exhaust hole 670 is used to exhaust the air inside the sample holding cavity B630. The exhaust channel 650 is connected to the exhaust hole 670. The exhaust channel 650 is connected to the sample holding cavity B630. In a horizontally placed state, the opening position of the exhaust hole 670 is higher than the liquid level of the internal microscopic sample. One end of the sample holding cavity B630 is connected to the sample holding cavity A620, and the other end of the sample holding cavity B630 is connected to the exhaust channel 650.

[0047] like Figures 1 to 3 The exhaust channel 650 includes a closing portion 653, a connecting portion 651 and a detour portion 652. The large end of the closing portion 653 is connected to the sample holding cavity B630; the small end of the closing portion 653 is connected to the connecting portion 651, and the connecting portion 651 is connected to the detour portion 652. An exhaust hole 670 is provided at the end of the detour portion 652. The length of the detour portion 652 is equivalent to the length of the sample holding cavity A620 and the sample holding cavity B630 on the chip; the exhaust hole 670 is located close to the sample loading port 610.

[0048] like Figure 4 , the A state of the formed element enrichment detection chip, the sample holding cavity B630 is located below the sample holding cavity A620, and the formed element enrichment detection chip is used for precipitation enrichment; the horizontal position of the exhaust hole 670 is higher than the height of the microscopic inspection sample inside the chip.

[0049] like Figure 5 , in the experience Figure 4 After the shaped element enrichment detection chip is placed flat, with the sample holding cavity A620 and the sample adding port 610 facing upwards. At this time, the shaped elements enriched on the bottom are left in the sample holding cavity B630 for imaging and observation.

[0050] like Figure 6 , the formed element enrichment detection chip is in state B, the sample holding chamber B630 is located above the sample holding chamber A620, and the formed element enrichment detection chip is used for floating enrichment; the exhaust hole 670 is provided with an exhaust hole sealing device, and the exhaust hole sealing device is used to seal the exhaust hole 670. The sample port 610 is provided with a sample port sealing device 611, and the sample port sealing device 611 is used to seal the sample port 610.

[0051] like Figure 7 , in the experience Figure 6After the state, the formed element enrichment detection chip is placed flat, with the sample holding cavity A620 and the sample addition port 610 facing downward. At this time, the floating enriched formed elements are left in the sample holding cavity B630 for imaging and observation. The upper and lower surfaces of the sample holding cavity B630 are made of transparent materials and can be used for observation or imaging. The volume ratio of the sample holding cavity A620 and the sample holding cavity B630 is greater than 5. The height of the above-mentioned sample holding cavity B730 is less than 1 mm and greater than 0.01 mm; the height of the above-mentioned sample holding cavity A720 is greater than 2 mm; the height of the chip at the location of the above-mentioned sample holding cavity B720 is less than 2 mm. When microscopically imaging formed elements, the microscope objective is required to be close to the microscopic sample, and the light source requires that the thickness of the chip cannot be too thick.

[0052] like Figure 8 and Fig. 9 As shown, in an embodiment of a chip for detecting enrichment of formed elements, the chip body is composed of a chip upper part 750 and a chip bottom cover plate 780. The chip upper part 750 includes a sample receiving cavity A recess 721, a sample receiving cavity B recess 731, and a connecting cavity recess 761. The bottom cover plate 780 is bonded or welded to the upper part of the chip 750 as a whole. The bottom cover plate 780 seals the sample receiving cavity A recess 721 and the sample receiving cavity B recess 731 to form a sample receiving cavity A 720, a sample receiving cavity B 730, and a connecting cavity 760. The chip bottom cover plate 780 is made of a transparent material; it also includes an inner partition component, which raises the bottom of the sample receiving cavity A. The inner partition component includes a bubble receiving cavity 770. The sample holding cavity A720 is provided with a sample adding port 710 for adding microscopic samples into the sample holding cavity A720 ; the chip upper portion 750 and the chip bottom 780 enclose the closed sample holding cavity A720 , the sample holding cavity B730 , and the connecting cavity 760 .

[0053] like Figure 8 and Fig. 9 As shown, the sample holding cavity B730 is provided with an observation window, and the observation window is used for microscopic imaging or microscopic observation of the microscopic sample contained in the sample holding cavity B; the sample holding cavity A720 is connected with the sample holding cavity B730, and the microscopic sample can enter the sample holding cavity B730 through the sample holding cavity A720; the volume of the sample holding cavity A720 is larger than the sample holding cavity B730; in the use state, the position of the formed element enrichment detection chip is changed, and the formed elements in the microscopic sample in the sample holding cavity A720 are enriched in the sample holding cavity B730. The connecting cavity 760 is used to connect the sample holding cavity A720 with the sample holding cavity B730; the cross-sectional area of ​​one end of the connecting cavity 760 connected to the sample holding cavity A720 is larger than the cross-sectional area of ​​the other end of the connecting cavity 760 connected to the sample holding cavity B730.

[0054] like Figures 7 to 10 As shown, in an embodiment of a chip for detecting enrichment of formed elements, a bubble containing cavity 770 is provided in the sample containing cavity A720, one end 771 of the bubble containing cavity is connected to the bottom end of the sample containing cavity A720, and the other end 772 of the bubble containing cavity extends from the bottom end of the sample containing cavity A720 toward the sample containing cavity B730 to form the bubble containing cavity 770. A sample adding port sealing device 711 is provided on the sample adding port 710, and the sample adding port sealing device 711 is used to seal the sample adding port 710. The exhaust hole is at Figures 7 to 10 Although not shown, an exhaust hole sealing device is also provided on the exhaust hole, and the exhaust hole sealing device is used to seal the exhaust hole.

[0055] like Fig.12 , the formed component enrichment detection chip is in state A, the sample holding cavity B730 is located below the sample holding cavity A720, and the formed component enrichment detection chip is used for precipitation enrichment; the end of the bubble holding cavity 770 is flush with the end of the sample holding cavity A720, and the bubbles will gather at the end of the bubble holding cavity 770.

[0056] like Fig.13 , the formed component enrichment detection chip is in state B, the sample holding chamber B730 is located above the sample holding chamber A720, and the formed component enrichment detection chip is used for floating enrichment.

[0057] like Fig.14 , in the experience Fig.12 or Fig.13 After the state is reached, the formed element enrichment detection chip is placed flat, with the sample holding cavity A720 and the sample adding port 710 facing downward. At this time, the formed elements that have settled to the bottom are left in the sample holding cavity B730 for imaging and observation. A sealing component 711 is also provided below the sample adding port 710 to seal the sample adding port 710. The upper and lower surfaces of the sample holding cavity B730 are both made of transparent materials and can be used for observation or imaging. The bubbles will gather in the bubble holding cavity 770.

[0058] Although the present application is illustrated and described according to the preferred embodiment and several alternatives, the application will not be limited by the specific description in this specification. Other additional replacement or equivalent components can also be used to practice the present application.

Claims

1. A chip for detecting enrichment of tangible elements, characterized in that: It includes a chip body, a sample holding cavity A, a sample holding cavity B, and a sample adding port; The chip body comprises a chip body A portion and a chip body B portion, wherein the thickness of the chip body A portion is greater than the thickness of the chip body B portion; The sample holding cavity A is located in the chip body A portion, and the sample holding cavity B is located in the chip body B portion; The sample holding cavity A is connected to the sample adding port, and the sample adding port is used to add the microscopic examination sample into the sample holding cavity A; The sample containing cavity B is provided with an observation window, and the observation window is used for microscopic imaging or microscopic observation of the microscopic sample contained in the sample containing cavity B; The sample holding chamber A is connected to the sample holding chamber B, and the microscopic sample can enter the sample holding chamber B through the sample holding chamber A; The volume of the sample holding chamber A is larger than that of the sample holding chamber B; Also includes one of the following features: TB1: In use, the formed elements in the sample under microscopic examination in the sample holding chamber A are enriched in the sample holding chamber B due to gravity; TB2: In use, the formed elements in the microscopic sample in sample holding chamber A are enriched in sample holding chamber B due to buoyancy.

2. The tangible element enrichment detection chip according to claim 1, characterized in that: It also includes a connecting cavity; the connecting cavity is used to connect the sample holding cavity A with the sample holding cavity B; the area of ​​one end of the connecting cavity connected to the sample holding cavity A is larger than the area of ​​the other end of the connecting cavity connected to the sample holding cavity B.

3. The tangible element enrichment detection chip according to claim 1, characterized in that: Including exhaust passages and exhaust holes; The exhaust hole is used to exhaust the internal air of the sample holding cavity B or the sample holding cavity A; The exhaust channel is connected to the exhaust hole, and the exhaust channel is connected to the sample holding cavity B or the sample holding cavity A. In a horizontally placed state, the opening position of the exhaust hole is higher than the liquid level position of the internal microscopic inspection sample.

4. The tangible element enrichment detection chip according to claim 1, characterized in that: Include any of the following technical features: TA1: the bottom of the sample holding chamber A is higher than the bottom of the sample holding chamber B; TA2: The height of the sample holding cavity B is less than 1 mm and greater than 0.01 mm; TA3: The height of the sample holding cavity A is greater than 2 mm; TA4: The chip height at the location of the sample holding cavity B is less than 2 mm.

5. The tangible element enrichment detection chip according to claim 3, characterized in that: A sealing device is included, and the sealing device is used to seal the exhaust hole or the sample addition port.

6. The tangible element enrichment detection chip according to claim 5, characterized in that: It also includes a bubble containing cavity, which is connected to the sample containing cavity A or the sample containing cavity B; In the use state, after adding the microscopic sample, the exhaust hole or the sample addition port is closed with a sealing device, and the bubbles are allowed to enter the bubble containing cavity by flipping the formed element enrichment detection chip, so that the bubbles do not enter the sample containing cavity B.

7. The tangible element enrichment detection chip according to claim 1, characterized in that: The volume ratio of the sample holding cavity A to the volume of the sample holding cavity B is greater than 5.

8. The tangible element enrichment detection chip according to claim 1, characterized in that: The chip body is composed of the upper part of the chip and the bottom cover of the chip. The upper part of the chip includes the concave part of the sample accommodating cavity A and the concave part of the sample accommodating cavity B. The bottom cover is bonded or welded to the upper part of the chip as a whole. The bottom cover closes the concave part of the sample accommodating cavity A and the concave part of the sample accommodating cavity B to form sample accommodating cavity A and sample accommodating cavity B.

9. The tangible element enrichment detection chip according to claim 8, characterized in that: The chip bottom cover is made of a transparent material; it also includes an inner partition component, which raises the bottom of the sample containing cavity A.

10. The tangible element enrichment detection chip according to claim 9, characterized in that: The inner partition component includes a bubble containing cavity.

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