Ghosting detection clamp of TFT module

Abstract

The utility model discloses an afterimage detection fixture for a TFT module, which comprises a fixture box, a fixture bottom box limiting groove used for placing the TFT module is arranged in the fixture box, a fixed substrate and a movable cover plate are arranged on the fixture box, the movable cover plate is connected with the fixed substrate in a turnover manner, and the movable cover plate is connected with the fixture bottom box limiting groove in a turnover manner. And a plurality of test grids and a plurality of test light intensity sensors are arranged on the inner side wall of the movable cover plate. The test light intensity sensor is a photoresistor or a photoelectric field effect transistor sensor. Through numerical value quantization of the brightness, ghosting judgment is more objective and accurate, errors and subjectivity caused by naked eye judgment are avoided, and therefore the ghosting testing efficiency is effectively improved.

Description

Technical Field

[0001] The utility model relates to a detection tool for a TFT module, more specifically, to an afterimage detection fixture for the TFT module. Background Art

[0002] TFT displays are prone to image sticking, which requires continuous optimization of glass and software for debugging and improvement. The factory usually defines the image sticking level by visual inspection, which is prone to misjudgment due to subjective reasons and affects product quality.

[0003] Chinese invention patent document CN105139817B discloses a method for preventing image sticking on a liquid crystal display panel, comprising: periodically acquiring frame data, wherein the period of periodically acquiring the frame data is K seconds, K=1,2,3,...N, and N is a natural number; comparing whether the currently acquired frame data is the same as the previously acquired frame data, if so, setting the image sticking correction enable signal to a high level, if not, setting the image sticking correction enable signal to a low level; when the duration for which the image sticking correction enable signal continuously maintains a high level exceeds a first threshold, generating a downwardly offset correction voltage according to the original common voltage, providing the correction voltage to the liquid crystal display panel as the current common voltage and maintaining it for a correction duration before restoring it to the original common voltage. The generating of the downwardly offset correction voltage according to the original common voltage comprises: generating a downwardly offset correction voltage of at least 0.1 volt according to the original common voltage. The correction duration is greater than or equal to 5 minutes. The frame data is picture data transmitted in the form of a low voltage differential signal. The patent also discloses a device for preventing image sticking on a liquid crystal display panel, characterized in that it includes: an acquisition unit for periodically acquiring frame data, wherein the acquisition unit periodically acquires the frame data in a period of K seconds, K=1,2,3,......N, and N is a natural number; a comparison unit for comparing whether the currently acquired frame data is the same as the previously acquired frame data, and if so, setting the image sticking correction enable signal to a high level, and if not, setting the image sticking correction enable signal to a low level; a processing unit for generating a downwardly shifted correction voltage according to the original common voltage when the duration for which the image sticking correction enable signal continuously maintains a high level exceeds a first threshold, and providing the correction voltage to the liquid crystal display panel as the current common voltage and maintaining it for a correction duration before restoring it to the original common voltage. The processing unit generates a downwardly shifted correction voltage according to the original common voltage, including: generating a downwardly shifted correction voltage of at least 0.1 volt according to the original common voltage. The correction duration is greater than or equal to 5 minutes. The frame data is picture data transmitted in the form of a low voltage differential signal.

[0004] Obviously, the patent uses the acquisition unit to continuously and periodically acquire the frame data, and the unit compares and obtains the corresponding correction enable signal. When the processing unit determines that the frame data has not changed for a long time according to the correction enable signal, it provides the correction voltage to the liquid crystal display panel, thereby correcting the deflection angle of the liquid crystal molecules and preventing the liquid crystal display panel from having a residual image phenomenon. However, this structure cannot solve the existing problem of manual judgment of residual images.

[0005] Chinese invention patent document CN105913828A discloses an afterimage elimination circuit, which includes: a storage module for charging and storing charge when the display device is turned on; a control module for controlling the storage module to charge the gate low-level VGL signal terminal when the display device is turned off. The storage module is used to charge and store charge using the power line when the voltage provided by the power line of the display device is the working voltage. The storage module includes a capacitor. The capacity of the capacitor is 5-15μF. The rated voltage of the capacitor is 15-20V. The control module includes a P-channel field effect transistor and a diode; the G pole of the P-channel field effect transistor is used to connect the power line of the display device, the D pole of the P-channel field effect transistor is used to connect the VGL signal terminal, the positive pole of the diode is connected between the G pole of the P-channel field effect transistor and the power line, the negative pole of the diode is connected to the S pole of the P-channel field effect transistor, one end of the capacitor is connected between the negative pole of the diode and the S pole of the P-channel field effect transistor, and the other end of the capacitor is grounded. The rated voltage of the P-channel field effect transistor is 30-40V. The rated current of the P-channel field effect transistor is 3-4A. The rated voltage of the diode is 40-50V. The rated current of the diode is 1-2A. The P-channel field effect transistor is a P-channel metal oxide semiconductor MOS field effect transistor. The gate drive circuit includes the afterimage elimination circuit as described in any one of claims 1 to 11. Obviously, when the display device is turned off, the patent controls the storage module to charge the gate low-level VGL signal terminal in the gate drive circuit, so that when the gate drive circuit is turned off, it no longer outputs VGL to all gate lines, but a high level. All TFTs in the display device are turned on under the action of the high level, which accelerates the discharge process of the capacitor in the display device and eliminates the shutdown afterimage. The circuit structure is simple and low in cost. However, this structure cannot solve the existing problem of manual judgment of afterimage. Utility Model Content

[0006] Based on this, it is necessary to provide a TFT module afterimage detection fixture for the above technical problems. The TFT module afterimage detection fixture includes a fixture box, and the fixture box is provided with a fixture bottom box limit groove for placing the TFT module. The fixture box is provided with a fixed substrate and a movable cover plate, and the movable cover plate is flippably connected to the fixed substrate. The inner side wall of the movable cover plate is provided with a plurality of test grids and a plurality of test light intensity sensors. The test light intensity sensor is a photoresistor or a photoelectric field effect tube sensor. Through the numerical quantification of brightness, the afterimage judgment is made more objective and accurate, avoiding the errors and subjectivity caused by the naked eye judgment, thereby effectively improving the test efficiency of the afterimage.

[0007] In order to solve the above technical problems, the utility model adopts the following technical solutions:

[0008] A residual image detection fixture for a TFT module, characterized in that the residual image detection fixture for the TFT module comprises a fixture box, the fixture box is provided with a fixture bottom box limit groove for placing the TFT module, the fixture box is provided with a fixed substrate and a movable cover, the movable cover is flippably connected to the fixed substrate, and the inner side wall of the movable cover is provided with a plurality of test grids and a plurality of test light intensity sensors.

[0009] As a preferred implementation of the afterimage detection fixture for the TFT module provided by the utility model, the test light intensity sensor is a photoresistor.

[0010] As a preferred implementation of the afterimage detection fixture for the TFT module provided by the utility model, the test light intensity sensor is a photoelectric field effect tube sensor.

[0011] As a preferred implementation of the afterimage detection fixture of the TFT module provided by the utility model, a detection control board is provided in the fixture box, and the detection control board is electrically connected to the test light intensity sensor.

[0012] As a preferred implementation of the afterimage detection fixture for the TFT module provided by the utility model, a reset spring is provided on the fixed substrate, and the reset spring cooperates with the movable cover plate.

[0013] As a preferred implementation of the afterimage detection fixture for the TFT module provided by the utility model, the fixture box and the movable cover are both black.

[0014] As a preferred implementation of the afterimage detection fixture for the TFT module provided by the utility model, the test grid is covered with an opaque ink layer.

[0015] As a preferred implementation of the afterimage detection fixture for the TFT module provided by the utility model, the thickness of the ink layer is 1 mm to 2 mm.

[0016] As a preferred implementation of the afterimage detection fixture for the TFT module provided by the utility model, the test light intensity sensor is adhered to the inner wall of the movable cover plate.

[0017] As a preferred implementation of the afterimage detection fixture for the TFT module provided by the utility model, the movable cover plate is made of iron, and the test light intensity sensor is adsorbed on the movable cover plate by a magnet.

[0018] Compared with the prior art, the utility model has the following beneficial effects:

[0019] The utility model provides an afterimage detection fixture for a TFT module, which makes afterimage judgment more objective and accurate through numerical quantification of brightness, avoids errors and subjectivity caused by naked eye judgment, and thus effectively improves the test efficiency of afterimage.

[0020] In addition, a reset spring can be provided on the fixed substrate, and the reset spring cooperates with the movable cover. The fixture box and the movable cover are both black. The test grid is covered with an opaque ink layer. The thickness of the ink layer is mm to mm. The reset spring can ensure that the movable cover is tightly fastened to prevent light leakage and affect the test results. Since the test grid is covered with an opaque ink layer, light leakage can be further prevented and the test accuracy can be further improved.

[0021] In addition, the movable cover plate can be made of iron, and the test light intensity sensor is adsorbed on the movable cover plate by a magnet. By utilizing the magnetic attraction, the test light intensity sensor can be quickly installed and replaced, which is convenient for testing and has low maintenance cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the scheme in the utility model, a brief introduction is given below to the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0023] Figure 1 It is a structural schematic diagram of the afterimage detection fixture of the TFT module of the utility model;

[0024] Figure 2 A structural schematic diagram of another embodiment of the movable cover plate of the afterimage detection fixture of the TFT module of the utility model;

[0025] The markings in the figure are as follows: 1. fixture box; 11. fixture bottom box limit groove; 2. fixed substrate; 21. reset spring; 3. movable cover; 30. magnet; 31. test grid; 32. test light intensity sensor; 4. detection control board. DETAILED DESCRIPTION

[0026] In order to enable those skilled in the art to better understand the solution of the utility model, the technical solution in the embodiment of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiment of the utility model. Obviously, the described embodiment is only a part of the embodiment of the utility model, not all of the embodiments. Based on the embodiment of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the utility model.

[0027] As described in the background technology, in the prior art, TFT displays are prone to image sticking, which requires continuous optimization of glass and software for debugging and improvement. The factory usually defines the image sticking level by visual inspection, which is prone to misjudgment due to subjective reasons, affecting product quality.

[0028] In order to solve this technical problem, the utility model provides a residual image detection fixture for a TFT module, comprising a fixture box 1, wherein the fixture box 1 is provided with a fixture bottom box limit groove 11 for placing the TFT module, and the fixture box 1 is provided with a fixed substrate 2 and a movable cover 3, wherein the movable cover 3 is flippably connected to the fixed substrate 2, and the inner side wall of the movable cover 3 is provided with a plurality of test grids 31 and a plurality of test light intensity sensors 32. The test light intensity sensor 32 is a photoresistor. Alternatively, the test light intensity sensor 32 is a photoelectric field effect tube sensor.

[0029] Through the above structural design, the brightness is numerically quantified to make the afterimage judgment more objective and accurate, avoiding the errors and subjectivity caused by naked eye judgment, thereby effectively improving the test efficiency of afterimage.

[0030] In order to enable those skilled in the art to better understand the present invention, the technical solutions in the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the protection scope of the present invention.

[0031] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features and technical solutions in the embodiments may be combined with each other.

[0032] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0033] like Figure 1 As shown, the afterimage detection fixture of the TFT module includes a fixture box 1, which is provided with a fixture bottom box limit groove 11 for placing the TFT module, and the fixture box 1 is provided with a fixed substrate 2 and a movable cover 3. The movable cover 3 is flippably connected to the fixed substrate 2, and the inner side wall of the movable cover 3 is provided with a plurality of test grids 31 and a plurality of test light intensity sensors 32.

[0034] It should be noted that the test light intensity sensor 32 is a photoresistor. Alternatively, the test light intensity sensor 32 is a photoelectric field effect tube sensor.

[0035] In addition, the test light intensity sensor 32 is adhered to the inner wall of the movable cover 3 .

[0036] A detection control board 4 is disposed in the fixture box 1 , and the detection control board 4 is electrically connected to the test light intensity sensor 32 .

[0037] The working mode of this embodiment is described below.

[0038] First, open the movable cover 3, place the sample S to be tested into the limit slot 11 of the bottom box of the fixture, buckle the movable cover 3, and start the detection control board 4. At this time, under normal temperature conditions, display the 5x5 checkerboard picture of the test grid 31 for 1 hour, then switch to the medium grayscale picture, and finally, detect the black and white areas after the checkerboard is switched by the test light intensity sensor 32 under the cover, and then set different thresholds. For example: the difference between the white area photosensitivity value and the medium gray photosensitivity value is greater than a, and the difference between the medium gray photosensitivity value and the black area photosensitivity value is greater than b, so as to judge the different levels of afterimage levels.

[0039] By numerically quantifying brightness, the judgment of afterimage is made more objective and accurate, avoiding the errors and subjectivity caused by naked eye judgment, thereby effectively improving the testing efficiency of afterimage.

[0040] The afterimage detection fixture of the TFT module provided in Example 1 is further optimized. Specifically, a reset spring 21 is provided on the fixed substrate 2 , and the reset spring 21 cooperates with the movable cover plate 3 .

[0041] It should be noted that the fixture box 1 and the movable cover plate 3 are both black.

[0042] In addition, the test grid 31 is covered with an opaque ink layer having a thickness of 1 mm to 2 mm.

[0043] The working mode of this embodiment is described below.

[0044] The return spring 21 can ensure that the movable cover plate 3 is tightly fastened to prevent light leakage and affect the test results. Since the test grid 31 is covered with an opaque ink layer, light leakage can be further prevented and the test accuracy can be further improved.

[0045] like Figure 2 As shown, the afterimage detection fixture of the TFT module provided in Example 1 or 2 is further optimized. Specifically, the movable cover plate 3 is made of iron, and the test light intensity sensor 32 is adsorbed on the movable cover plate 3 by a magnet 30.

[0046] The working mode of this embodiment is described below.

[0047] By utilizing the magnetic attraction, the test light intensity sensor 32 can be quickly installed and replaced, which is convenient for testing and has low maintenance cost.

[0048] The terms "coupling" and "coupling" involved in the embodiments of the present application should be understood in a broad sense. For example, they may refer to a direct physical connection, or an indirect connection achieved through electronic devices, such as a connection achieved through resistors, inductors, capacitors or other electronic devices.

[0049] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral one; it can be a mechanical connection, an electrical connection, or communication with each other; it can be a direct connection, or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0050] Obviously, the embodiments described above are only some embodiments of the present application, rather than all embodiments. The preferred embodiments of the present application are given in the accompanying drawings, but they do not limit the patent scope of the present application. The present application can be implemented in many different forms. On the contrary, the purpose of providing these embodiments is to make the understanding of the disclosure of the present application more thorough and comprehensive. Although the present application is described in detail with reference to the aforementioned embodiments, for those skilled in the art, it is still possible to modify the technical solutions recorded in the aforementioned specific implementation methods, or to replace some of the technical features therein with equivalents. Any equivalent structure made using the contents of the specification and drawings of this application, directly or indirectly used in other related technical fields, is similarly within the scope of patent protection of this application.

Claims

1. A fixture for detecting residual image of a TFT module, characterized in that: The afterimage detection fixture of the TFT module comprises a fixture box (1), wherein the fixture box (1) is provided with a fixture bottom box limiting groove (11) for placing the TFT module, and the fixture box (1) is provided with a fixed substrate (2) and a movable cover (3), wherein the movable cover (3) is flippably connected to the fixed substrate (2), and the inner side wall of the movable cover (3) is provided with a plurality of test grids (31) and a plurality of test light intensity sensors (32).

2. The afterimage detection fixture for TFT module according to claim 1, characterized in that: The test light intensity sensor (32) is a photoresistor.

3. The afterimage detection fixture for TFT module according to claim 1, characterized in that: The test light intensity sensor (32) is a photoelectric field effect tube sensor.

4. The afterimage detection fixture for TFT module according to claim 1, characterized in that: The fixture box (1) is provided with a detection control board (4), and the detection control board (4) is electrically connected to the test light intensity sensor (32).

5. The afterimage detection fixture for TFT module according to claim 1, characterized in that: A return spring (21) is provided on the fixed substrate (2), and the return spring (21) cooperates with the movable cover plate (3).

6. The afterimage detection fixture of the TFT module according to claim 1, characterized in that: The fixture box (1) and the movable cover plate (3) are both black.

7. The afterimage detection fixture for TFT module according to claim 1, characterized in that: The test grid (31) is covered with a light-proof ink layer.

8. The image sticking detection fixture for TFT module according to claim 7, characterized in that: The thickness of the ink layer is 1 mm to 2 mm.

9. The afterimage detection fixture of the TFT module according to claim 1, characterized in that: The test light intensity sensor (32) is adhered to the inner wall of the movable cover plate (3).

10. The afterimage detection fixture of the TFT module according to claim 1, characterized in that: The movable cover plate (3) is made of iron, and the test light intensity sensor (32) is adsorbed on the movable cover plate (3) via a magnet (30).

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