Transmission electron microscope sample punching device

Abstract

The utility model relates to the technical field of transmission electron microscope sample preparation equipment, and discloses a transmission electron microscope sample punching device, which comprises a fixing device, and the fixing device comprises a bottom plate, a vertical plate arranged on the bottom plate and a fixing plate. A bent elbow seat is arranged on the side wall of the vertical plate, and a blanking female die is arranged in the fixing plate. A first cutting edge is arranged at the top of the blanking female die, and a blanking male die matched with the blanking female die is movably arranged in a through hole of the blanking female die. A second cutting edge is arranged at the end, close to the blanking female die, of the blanking male die, a force transmission mechanism is arranged at the end, away from the blanking female die, of the blanking male die, and a handle is arranged on the force transmission mechanism. A first base plate is arranged on the fixing plate and located above the blanking female die, a discharging plate is arranged on the first base plate, a second base plate is arranged on the discharging plate, a guide plate is arranged on the top of the second base plate, and through holes are formed in the guide plate and the discharging plate in a penetrating mode. The sample punching device is compact in structure, convenient to replace and suitable for preparing transmission electron microscope samples in a laboratory environment.

Description

Technical Field

[0001] The utility model relates to the technical field of transmission electron microscope sample preparation equipment, in particular to a transmission electron microscope sample puncher. Background Art

[0002] As a high-resolution microscopy technique, transmission electron microscopy is widely used in materials science, chemistry, nanotechnology, life sciences, physics and other fields. Its working principle is to penetrate the sample with an electron beam and form an image by using the scattering and absorption of the electron beam by the internal structure of the sample. Due to the extremely short wavelength of the electron beam, the transmission electron microscope can provide atomic-level resolution, allowing users to observe the microstructure and defects of the material.

[0003] The preparation of transmission electron microscope samples is the key to the success of the experiment. The quality of the sample directly affects the clarity of the image and the accuracy of the experimental results. Therefore, the sample preparation process needs to be very fine and strictly controlled. During the preparation process, the thickness, flatness, surface roughness, etc. of the sample are all important factors that affect the final imaging quality.

[0004] Punching is a common method for preparing samples for transmission electron microscopy. The basic steps include placing the sample on the blanking die, and then punching it with the blanking punch to obtain a thin slice sample with a diameter of 3 mm. This process requires that the sample be easy to remove and have a smooth cross section to reduce damage to the sample and improve imaging quality.

[0005] However, in the actual punching process, there are some common problems. First, the sample is easily embedded in the blanking die and is not easy to remove. This is usually due to unreasonable design of the blanking die or excessive friction between the sample and the blanking die.

[0006] Secondly, an unreasonable gap between the blanking punch and the blanking die will also lead to an uneven cross section of the sample and many flashes and burrs. This is because a gap that is too large or too small will cause deformation and breakage of the sample during the stamping process. A reasonable gap can ensure that the sample deforms evenly during the stamping process and reduce the generation of flash and burrs. In order to solve this problem, it is necessary to accurately control the gap between the blanking punch and the blanking die, which usually needs to be adjusted according to the material and thickness of the sample. Utility Model Content

[0007] In view of the above-mentioned deficiencies in the prior art, the utility model provides a transmission electron microscope sample puncher which can improve the quality and efficiency of sample preparation and reduce sample damage.

[0008] In order to achieve the above-mentioned utility model object, the technical solution adopted by the utility model is: a transmission electron microscope sample puncher, including a fixing device, the fixing device includes a bottom plate, a vertical plate and a fixed plate arranged on the bottom plate, a side wall of the vertical plate is provided with an elbow seat, a blanking die is arranged inside the fixed plate, a through hole is arranged inside the blanking die, a blanking convex die matching the blanking die is movably arranged in the through hole, a first cutting edge is arranged at the top of the through hole of the blanking die, a second cutting edge is arranged at the end of the blanking convex die close to the blanking die, a force transmission mechanism is arranged at the end of the blanking convex die away from the blanking die, and a handle is arranged on the force transmission mechanism;

[0009] A first pad is arranged on the fixed plate, the first pad is located above the blanking die, a discharge plate is arranged on the first pad, a second pad is arranged on the discharge plate, a guide plate is arranged on the top of the second pad, through holes are arranged on the guide plate and the discharge plate, and the blanking punch passes through the through holes.

[0010] The beneficial effects of the utility model are as follows: the bottom plate serves as the basis of the entire device and provides stable support; a plurality of mounting holes are provided on the bottom plate for fixing other components. The fixing plate is fixedly arranged on the bottom plate and connected by screws, and is used to install the blanking die and ensure its stability during the punching process. The blanking die is embedded in the fixing plate and is used for punching samples; the shape and size of the blanking die can be replaced according to the different requirements of the samples. The first pad is located above the blanking die and is used for placing the sample. The unloading plate is used to remove the hooped waste material from the blanking punch. The blanking punch is used in conjunction with the blanking die for punching samples; the size and shape of the blanking punch can be replaced according to the blanking die.

[0011] Furthermore, the above-mentioned transmission electron microscope puncher, the force transmission mechanism includes a slider movably connected to the blanking punch, the slider is arranged in a toggle seat, a first elbow arm is movably arranged on the slider through a pin, a second elbow arm is movably arranged on the toggle seat through a pin, and the first elbow arm and the second elbow arm are connected through a pin; an eccentric wheel is movably arranged at the connection between the first elbow arm and the second elbow arm, the eccentric wheel and the handle are movably connected, and the eccentric wheel and the toggle seat are connected through a pin.

[0012] The beneficial effects of adopting the above further scheme are as follows: the slider is used to transmit the movement of the handle. The elbow arm is connected to the slider and the handle to amplify the force of the handle and improve the efficiency of the sample punching. The operator manually operates the handle to drive the eccentric wheel to rotate, thereby realizing the sample punching process; the handle length can be adjusted according to actual needs to provide different operating torques. The eccentric wheel is installed at the end of the handle and provides punching force by rotation; the design of the eccentric wheel enables the rotational movement of the handle to be converted into the linear movement of the slider. The toggle seat connects the eccentric wheel, the elbow arm and the slider to coordinate the movement between the components so that the entire sample punching process proceeds smoothly.

[0013] Furthermore, in the above-mentioned transmission electron microscope sample puncher, the bottom plate and the vertical plate are connected by screws and pins, and the vertical plate and the toggle seat are connected by screws and pins.

[0014] The beneficial effect of adopting the above further solution is that the pin is used to connect the slider, the elbow arm and other moving parts to ensure the coordinated movement between the parts.

[0015] Furthermore, in the above-mentioned transmission electron microscope punch, the end of the blanking punch is cylindrical.

[0016] The beneficial effect of adopting the above further solution is that the end of the blanking punch is cylindrical, that is, the second cutting edge of the blanking punch is circular, so as to facilitate the preparation of circular sample sheets.

[0017] Furthermore, in the above-mentioned transmission electron microscope punch, the diameter of the second cutting edge at the end of the blanking punch is 3 mm.

[0018] The beneficial effect of adopting the above further solution is that the diameter of the second cutting edge at the end of the blanking punch is 3 mm, which is used to prepare samples suitable for transmission electron microscopy analysis.

[0019] Furthermore, in the above-mentioned transmission electron microscope sample puncher, a spring is arranged on the blanking punch.

[0020] The beneficial effect of adopting the above further solution is: a spring is arranged on the blanking punch to ensure that the blanking punch 6 can be reset evenly after punching.

[0021] Furthermore, in the transmission electron microscope sample puncher, an anti-skid layer is provided on the handle, and anti-skid protrusions are provided on the anti-skid layer.

[0022] The beneficial effect of adopting the above further solution is that the anti-slip protrusions can improve the safety and comfort of operation.

[0023] The beneficial effects of the utility model are as follows: the sample puncher can efficiently and accurately prepare ultra-thin samples to meet the needs of high-resolution transmission electron microscopy analysis. The sample is placed above the blanking die, and the handle drives the relevant components to perform punching operations on the sample. The sample puncher can ensure that the cross-section of the disc sample is neat, the size of the through hole of the blanking die gradually increases, and the punched disc falls directly from the bottom of the blanking die. No ejection device is required, and there is no situation where the punched disc is stuck in the blanking die. Through the punching of the sample puncher, the efficiency and quality of sample preparation can be significantly improved, and the damage and deformation generated during the sample preparation process can be reduced, thereby improving the reliability and accuracy of transmission electron microscopy analysis. The sample puncher is suitable for the preparation of high-resolution transmission electron microscopy samples in the fields of material science, chemistry, biology, physics, etc. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1It is a schematic diagram of the structure of a transmission electron microscope sample puncher;

[0025] Figure 2 It is a top view of the transmission electron microscope puncher;

[0026] Figure 3 It is a schematic diagram of the structure of the blanking die;

[0027] Figure 4 It is a structural schematic diagram of the blanking punch;

[0028] Among them: 1. bottom plate; 2. vertical plate; 3. fixed plate; 4. elbow seat; 5. blanking die; 6. blanking punch; 7. handle; 8. first pad; 9. unloading plate; 10. second pad; 11. guide plate; 12. slider; 13. first elbow arm; 14. second elbow arm; 15. eccentric wheel; 16. spring. DETAILED DESCRIPTION

[0029] The specific implementation methods of the utility model are described below to facilitate technical personnel in this technical field to understand the utility model, but it should be clear that the utility model is not limited to the scope of the specific implementation methods. For ordinary technical personnel in this technical field, as long as various changes are within the spirit and scope of the utility model defined and determined by the attached claims, these changes are obvious, and all utility model creations using the concept of the utility model are protected.

[0030] like Figure 1 As shown, this embodiment provides a transmission electron microscope sample puncher, including a fixing device, the fixing device includes a base plate 1, a vertical plate 2 and a fixing plate 3 arranged on the base plate 1, a toggle seat 4 is arranged on the side wall of the vertical plate 2, the base plate 1 and the vertical plate 2 are connected by screws and pins, and the vertical plate 2 and the toggle seat 4 are connected by screws and pins.

[0031] A blanking die 5 is arranged inside the fixed plate 3, a through hole is arranged inside the blanking die 5, a first cutting edge is arranged at the top of the through hole, and a blanking punch 6 matching the blanking die 5 is movably arranged inside the through hole. A second cutting edge is arranged near the end of the blanking punch 6 near the blanking die 5, and the end of the blanking punch 6 is cylindrical, that is, the second cutting edge is circular, and the diameter of the second cutting edge is 3mm, so as to prepare a circular sample sheet, and the first cutting edge and the second cutting edge are used to prepare samples suitable for transmission electron microscope analysis. The fixed plate 3 is firmly mounted on the bottom plate 1 by screws, and plays the role of mounting the blanking die 5. The fixed plate 3 is made of 45# steel material and can withstand the impact force during the punching process. The blanking die 5 is made of Cr12MoV and embedded in the fixed plate 3. The shape and size of the blanking die 5 can be customized and replaced according to the needs of the sample to meet the preparation needs of different samples. The surface of the blanking die 5 is finely processed to ensure the accuracy and integrity of the sample during the punching process.

[0032] A force transmission mechanism is arranged at the end of the blanking punch 6 away from the blanking die 5, a handle 7 is arranged on the force transmission mechanism, an anti-skid layer is arranged on the handle 7, and anti-skid protrusions are arranged on the anti-skid layer, which can improve the safety and comfort of operation.

[0033] A first pad 8 is provided on the fixed plate 3. The first pad 8 is located above the blanking die 5. The first pad 8 can be adjusted according to the thickness of the sample to ensure that the sample is in the best position during the punching process. A discharge plate 9 is provided on the first pad 8 to facilitate the operator to remove the waste after the punching is completed. A second pad 10 is provided on the discharge plate 9. A guide plate 11 is provided on the top of the second pad 10. Through holes are provided on the guide plate 11 and the discharge plate 9, and the blanking punch 6 passes through the through holes. A spring 16 is provided on the blanking punch 6 to ensure that the blanking punch 6 can be evenly reset after punching.

[0034] The force transmission mechanism includes a slider 12 movably connected to the blanking punch 6. The slider 12 is arranged in the toggle seat 4, and the slider 12 can move up and down along the toggle seat 4. The slider 12 is made of 45# steel and can withstand impact force and wear. The toggle seat 4 is provided with a guide groove to ensure that the slider 12 maintains linear motion during movement, avoids deviation, and ensures the accuracy of the punching. The slider 12 is provided with a first elbow arm 13 movably provided with a pin shaft, and the toggle seat 4 is provided with a second elbow arm 14 movably provided with a pin shaft. The first elbow arm 13 and the second elbow arm 14 are connected by a pin shaft; an eccentric wheel 15 is movably provided at the connection between the first elbow arm 13 and the second elbow arm 14.

[0035] The eccentric wheel 15 is movably connected to the handle 7, and the eccentric wheel 15 is connected to the elbow seat 4 by a pin. The pin is made of high-strength steel to ensure its stability and durability under high load. The elbow arm is designed as a lever structure, which achieves efficient sample punching by amplifying the force of the handle 7. The connection between the elbow arm and the slider 12 is fixed by a pin to ensure its stability during movement. The eccentric wheel 15 is installed at the end of the handle 7, and its design allows the rotational motion of the handle 7 to be converted into the linear motion of the slider 12. The eccentricity and curvature of the eccentric wheel 15 are precisely calculated to ensure that when the handle 7 applies force, the force can be transmitted smoothly to avoid damage to the sample due to excessive impact force.

[0036] The toggle seat 4 connects the eccentric wheel 15 and the elbow arm. The design of the toggle seat 4 takes into account the transmission of force and the coordination of movement to ensure that the entire punching process proceeds smoothly. The toggle seat 4 is fixed to the vertical plate 2 by screws and pins. The vertical plate 2 is installed at one end of the bottom plate 1, providing a supporting structure for the entire device to ensure the stability of each component during operation.

[0037] During the operation, the operator holds the handle 7 and applies force downward, and the handle 7 drives the eccentric wheel 15 to rotate. The eccentric wheel 15 pushes the elbow arm through the elbow seat 4, and the elbow arm amplifies the force of the handle 7 and transmits the movement to the slider 12. The slider 12 moves up and down in the guide groove of the guide plate 11, driving the blanking punch 6 to punch the sample. After the sample is punched, the waste material is discharged through the discharge plate 9. The whole operation process is simple and efficient.

[0038] In addition, the components of the utility model are easy to disassemble and replace, and are suitable for sample preparation requirements of different types and sizes. Its simple structural design not only reduces the manufacturing cost, but also improves the convenience and safety of operation. Through manual operation, the use of complex electrical equipment is avoided, the failure rate and maintenance cost are reduced, and it is particularly suitable for use in transmission electron microscope sample preparation rooms.

[0039] The above description is a specific implementation of the utility model. Through the detailed description of each component, the structure and operation mode of the utility model are clarified. Based on the above implementation, those skilled in the art can make various equivalent substitutions or improvements without departing from the scope of the technical solution of the utility model, and these equivalent substitutions or improvements should be included in the protection scope of the utility model.

[0040] The transmission electron microscope sample puncher provided by the utility model has a compact structure, is easy to replace, and is simple to operate. It is suitable for efficient preparation of transmission electron microscope samples in various laboratory environments and has wide industrial applicability and promotion value.

Claims

1. A transmission electron microscope sample puncher, characterized in that: The fixing device comprises a bottom plate (1), a vertical plate (2) and a fixed plate (3) arranged on the bottom plate (1); a toggle seat (4) is arranged on the side wall of the vertical plate (2); a blanking die (5) is arranged inside the fixed plate (3); a through hole is arranged inside the blanking die (5); a blanking punch (6) matching the blanking die (5) is movably arranged in the through hole; a first cutting edge is arranged at the top of the through hole of the blanking die (5); a second cutting edge is arranged at the end of the blanking punch (6) close to the blanking die (5); a force transmission mechanism is arranged at the end of the blanking punch (6) away from the blanking die (5); a handle (7) is arranged on the force transmission mechanism; A first pad (8) is arranged on the fixed plate (3), the first pad (8) is located above the blanking die (5), a discharge plate (9) is arranged on the first pad (8), a second pad (10) is arranged on the discharge plate (9), a guide plate (11) is arranged on the top of the second pad (10), through holes are arranged through the guide plate (11) and the discharge plate (9), and the blanking punch (6) passes through the through holes.

2. The transmission electron microscope sample puncher according to claim 1, characterized in that: The force transmission mechanism comprises a slider (12) movably connected to the blanking punch (6), the slider (12) being arranged in a toggle seat (4), a first elbow arm (13) being movably arranged on the slider (12) via a pin, a second elbow arm (14) being movably arranged on the toggle seat (4) via a pin, the first elbow arm (13) and the second elbow arm (14) being connected via a pin; an eccentric wheel (15) being movably arranged at the connection between the first elbow arm (13) and the second elbow arm (14), the eccentric wheel (15) being movably connected to a handle (7), and the eccentric wheel (15) and the toggle seat (4) being connected via a pin.

3. The transmission electron microscope sample puncher according to claim 1, characterized in that: The bottom plate (1) and the vertical plate (2) are connected via screws and pins, and the vertical plate (2) and the toggle seat (4) are connected via screws and pins.

4. The transmission electron microscope sample puncher according to claim 1, characterized in that: The end of the blanking punch (6) is cylindrical.

5. The transmission electron microscope sample puncher according to claim 1, characterized in that: The diameter of the second cutting edge at the end of the blanking punch (6) is 3 mm.

6. The transmission electron microscope sample puncher according to claim 1, characterized in that: A spring (16) is arranged on the blanking punch (6).

7. The transmission electron microscope sample puncher according to claim 1, characterized in that: An anti-skid layer is provided on the handle (7), and an anti-skid protrusion is provided on the anti-skid layer.

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