Test tool for integrated circuit chip

Abstract

The utility model discloses a testing tool for integrated circuit chips, which relates to the technical field of testing tools and comprises a U-shaped base, a conveying mechanism is mounted in the U-shaped base, and a plurality of adjustable placing mechanisms for the integrated circuit chips are sequentially and fixedly mounted on the outer surface of the conveying mechanism. According to the utility model, the integrated circuit chips with different sizes can be limited and conveyed through the conveying mechanism and the adjustable placing mechanism, so that the integrated circuit chips can be conveniently and continuously tested, and the working efficiency is improved; the integrated circuit chip can be automatically jacked up through the jacking mechanism, so that taking and blanking are facilitated, a spring can be compressed through the protective connection mechanism when the test probe is in contact with the integrated circuit chip, and damage caused by rigid contact between the test probe and the integrated circuit chip is avoided.

Description

Technical Field

[0001] The utility model relates to the technical field of testing tooling, in particular to a testing tooling for integrated circuit chips. Background Art

[0002] Chip is a general term for semiconductor component products. It is the carrier of integrated circuits and is made up of wafers. In today's society, integrated circuits have become ubiquitous. Computers, mobile phones and other digital appliances have become an indispensable part of the social structure. After the chips are produced, they need to be tested using test fixtures. After searching, the Chinese patent publication number CN219831306U discloses a test fixture for integrated circuit chips, including a workbench, a support column and a bracket. The test fixture for integrated circuit chips pulls the concave clamps to move the concave clamps away from each other, squeezes the first spring, places the chip to be tested on the top of the L-shaped placement table, starts the servo motor, drives the bidirectional lead screw to rotate, makes the sliders approach each other, drives the L-shaped placement table approach each other, clamps the chip, loosens the concave clamps, and clamps the chip again by resetting the first spring, thereby avoiding chip shaking and preventing deviation when manually held, making the integrated circuit chip more stable during testing, and ensuring the accuracy of the test.

[0003] Although the above technical solution can limit and clamp the integrated circuit chip to prevent the chip from shaking, it is necessary to repeatedly lock and unlock the single group of chips after each test and after the test is completed, which reduces work efficiency. The chip is located inside the fixing mechanism and is inconvenient to take out. During the test, the rigid contact between the test component and the integrated circuit chip can easily cause damage. In addition, when replacing the test component, the connecting mechanisms on both sides need to be operated separately, which increases the workload. Utility Model Content

[0004] In view of the deficiencies of the prior art, the utility model provides a testing tool for integrated circuit chips, which solves the problem of the practicability of the prior devices mentioned in the background technology.

[0005] To achieve the above purpose, the utility model is implemented through the following technical solutions: a test fixture for integrated circuit chips, comprising a U-shaped base, a conveying mechanism is installed inside the U-shaped base, a plurality of adjustable placement mechanisms for integrated circuit chips are fixedly installed in sequence on the outer surface of the conveying mechanism, a lifting mechanism matched with the adjustable placement mechanism is installed inside the U-shaped base, an L-shaped plate is fixedly installed on one side of the outer surface of the U-shaped base, a first electric push rod is fixedly installed through the top of the L-shaped plate, a protective connection mechanism is fixedly connected to the bottom end of the first electric push rod, a U-shaped frame is fixedly connected to the bottom end of the protective connection mechanism, a clamping mechanism is installed through the top of the U-shaped frame, transverse support plates are fixedly connected on both sides of the bottom end of the U-shaped frame, a mounting plate is placed between the upper surfaces of the two transverse support plates, and a plurality of test probes for testing integrated circuit chips are fixedly installed on the lower surface of the mounting plate;

[0006] The conveying mechanism includes two conveying rollers that are symmetrically connected to the inside of the U-shaped base for rotation, and two conveying belts are symmetrically connected to each other for transmission. The adjustable placement mechanism is fixedly mounted on the outer surfaces of the two conveying belts, and a motor is fixedly mounted on one side of the outer surface of the U-shaped base, and the output shaft of the motor is fixedly connected to one end of the adjacent conveying roller.

[0007] Preferably, the adjustable placement mechanism includes a placement plate, the outer surface of the placement plate is fixedly connected with rectangular frames on all sides, the two opposite rectangular frames are fixedly connected to the outer surfaces of two conveyor belts, the outer surface of the rectangular frame is rotatably connected with an adjusting screw, the outer surface of the adjusting screw is threadedly connected with a slider slidably connected to the inner wall of the rectangular frame, the top of the slider is fixedly connected with a limiting plate, which can be adjusted according to different integrated circuit chips, thereby facilitating the placement of integrated circuit chips of different specifications.

[0008] Preferably, the lifting mechanism includes a connecting plate fixedly connected to the inside of the U-shaped base, a second electric push rod is fixedly connected to the upper surface of the connecting plate, the top of the second electric push rod is fixedly connected to a rectangular plate, and the four corner ends of the upper surface of the rectangular plate are fixedly connected to L-shaped lifting blocks that cooperate with the placement plate, so as to facilitate lifting the integrated circuit chip after testing and facilitate taking and unloading.

[0009] Preferably, the protective connecting mechanism includes a connecting block fixedly connected to the top of the U-shaped frame, the top of the connecting block is fixedly connected to a rectangular sleeve, the inside of the rectangular sleeve is fixedly connected to a spring, the top of the spring is fixedly connected to a rectangular rod, the top of the rectangular rod is fixedly connected to the bottom end of the first electric push rod, which can buffer the test probe to avoid rigid contact and damage.

[0010] Preferably, the clamping mechanism includes a screw rod symmetrically extending through and rotatably connected to both sides of the top of the U-shaped frame, the outer surface of the screw rod is threadedly connected to a movable plate slidably connected to the inner wall of the U-shaped frame, the lower surface of the movable plate is symmetrically fixedly connected to two plug rods, and the upper surface of the mounting plate is symmetrically provided with sockets matching the plug rods, so as to facilitate the installation and disassembly of the mounting plate and the test probe.

[0011] Preferably, a rotating shaft is rotatably connected to the outer surface of the connecting block, and two first bevel gears are symmetrically fixedly connected to the outer surface of the rotating shaft. The top end of the screw rod is fixedly connected to a second bevel gear meshing with the first bevel gear, and both ends of the rotating shaft are fixedly connected to knobs to facilitate driving the two screw rods to rotate.

[0012] The utility model provides a testing tool for integrated circuit chips. It has the following beneficial effects:

[0013] 1. This test tool for integrated circuit chips can limit the conveying of integrated circuit chips of different sizes through the provided conveying mechanism and the adjustable placement mechanism, so as to facilitate the continuous testing of integrated circuit chips and improve work efficiency, thereby solving the problem that the existing test tool needs to repeatedly lock and test a single group of chips and unlock and remove them, thereby reducing work efficiency.

[0014] 2. This test fixture for integrated circuit chips, through the provision of a lifting mechanism, the second electric push rod drives the rectangular plate and the L-shaped top block to move upward, so that the integrated circuit chip can be automatically lifted up, making it easier to take out the material, thereby solving the problem of the existing test fixture chip being clamped inside the fixture and being inconvenient to take out.

[0015] 3. This test tool for integrated circuit chips has a protective connection mechanism. When the test probe contacts the integrated circuit chip, the spring can be compressed to avoid damage caused by rigid contact between the test probe and the integrated circuit chip, thereby solving the problem that rigid contact between the test component and the integrated circuit chip during testing with existing test tools easily causes damage.

[0016] 4. This test fixture for integrated circuit chips, through the clamping mechanism, can simultaneously drive the movable plates and the insertion rods on both sides to rise and fall by turning any one of the knobs, thereby facilitating the installation and removal of the mounting plate and the test probe, thereby solving the problem that the existing testing work needs to operate the connection mechanisms on both sides separately to achieve the replacement of the test components, which increases the workload. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0018] Figure 2This is a schematic diagram of the internal structure of the U-shaped base of the utility model;

[0019] Figure 3 It is a structural schematic diagram of the adjustable placement mechanism of the utility model;

[0020] Figure 4 It is a structural schematic diagram of the jacking mechanism of the utility model;

[0021] Figure 5 It is a partial structural schematic diagram of the utility model;

[0022] Figure 6 It is a structural schematic diagram of the protective connection mechanism and the clamping mechanism of the utility model;

[0023] Figure 7 It is a structural schematic diagram of the movable plate and the plug-in block of the utility model;

[0024] Figure 8 It is a structural schematic diagram of the mounting plate of the utility model.

[0025] In the figure, 1, U-shaped base; 2, conveying mechanism; 21, conveying roller; 22, conveyor belt; 23, motor; 3, adjustable placement mechanism; 31, placement plate; 32, rectangular frame; 33, screw; 34, slider; 35, limit plate; 4, lifting mechanism; 41, connecting plate; 42, second electric push rod; 43, rectangular plate; 44, L-shaped top block; 5, L-shaped plate; 6, first electric push rod; 7, protective connection mechanism; 71, connecting block; 72, rectangular sleeve; 73, spring; 74, rectangular rod; 8, U-shaped frame; 9, clamping mechanism; 91, screw; 92, moving plate; 93, plug rod; 94, socket; 95, rotating shaft; 96, first bevel gear; 97, second bevel gear; 98, knob; 10, horizontal support plate; 11, mounting plate; 12, test probe. DETAILED DESCRIPTION

[0026] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0027] Embodiment 1:

[0028] like Figures 1 to 3As shown, a test fixture for integrated circuit chips includes a U-shaped base 1, a conveying mechanism 2 is installed inside the U-shaped base 1, the conveying mechanism 2 includes two conveying rollers 21 symmetrically penetrated and rotatably connected inside the U-shaped base 1, two conveying belts 22 are symmetrically connected between the two conveying rollers 21, and the adjustable placement mechanism 3 is fixedly installed on the outer surface of the two conveying belts 22, a motor 23 is fixedly installed on one side of the outer surface of the U-shaped base 1, and the output shaft of the motor 23 is fixedly connected to one end of the adjacent conveying roller 21. The outer surface of the conveying mechanism 2 is fixedly installed with a plurality of adjustable placement mechanisms 3 for integrated circuit chips in sequence, the adjustable placement mechanism 3 includes a placement plate 31, the outer surface of the placement plate 31 is fixedly connected with a rectangular frame 32 on all sides, the two opposite rectangular frames 32 are fixedly connected to the outer surfaces of the two conveying belts 22, the outer surface of the rectangular frame 32 is penetrated and rotatably connected with an adjusting screw 33, the outer surface of the adjusting screw 33 is threadedly connected with a slider 34 slidably connected to the inner wall of the rectangular frame 32, and the top of the slider 34 is fixedly connected with a limiting plate 35.

[0029] When the adjusting screw 33 rotates, the slider 34 and the limit plate 35 can be driven to move through the thread, so as to facilitate the limiting of integrated circuit chips of different sizes. The integrated circuit chip is placed on the placement plate 31, and the motor 23 rotates to drive the conveyor roller 21 and the conveyor belt 22 to rotate, so as to drive the integrated circuit chip placed on the adjustable placement mechanism 3 to move, and the next test can be carried out directly, thereby improving work efficiency, thereby solving the problem that the existing test tooling needs to repeatedly lock and test and unlock and remove a single group of chips, thereby reducing work efficiency.

[0030] Embodiment 2:

[0031] like Figure 1 , Figure 2 and Figure 4 As shown, a lifting mechanism 4 matched with the adjustable placement mechanism 3 is installed inside the U-shaped base 1, and the lifting mechanism 4 includes a connecting plate 41 fixedly connected to the inside of the U-shaped base 1, and the upper surface of the connecting plate 41 is fixedly connected to a second electric push rod 42, and the top of the second electric push rod 42 is fixedly connected to a rectangular plate 43, and the four corner ends of the upper surface of the rectangular plate 43 are fixedly connected to an L-shaped top block 44 matched with the placement plate 31. The operation of the second electric push rod 42 drives the rectangular plate 43 and the L-shaped top block 44 to move upward, so that the integrated circuit chip can be automatically lifted up, which is convenient for taking and unloading, thereby solving the problem that the chip of the existing test tooling is clamped inside the fixture and is inconvenient to take.

[0032] Embodiment 3:

[0033] like Figure 1 , Figure 5 and Figure 6 As shown, an L-shaped plate 5 is fixedly installed on one side of the outer surface of the U-shaped base 1, and a first electric push rod 6 is fixedly installed on the top of the L-shaped plate 5. The bottom end of the first electric push rod 6 is fixedly connected to a protective connecting mechanism 7, and the protective connecting mechanism 7 includes a connecting block 71 fixedly connected to the top of the U-shaped frame 8, and the top of the connecting block 71 is fixedly connected to a rectangular sleeve 72, and the inside of the rectangular sleeve 72 is fixedly connected to a spring 73, and the top of the spring 73 is fixedly connected to a rectangular rod 74, and the top of the rectangular rod 74 is fixedly connected to the bottom end of the first electric push rod 6. When the first electric push rod 6 drives the test probe 12 to move downward, when the test probe 12 contacts the integrated circuit chip, the spring 73 can be compressed to avoid damage caused by rigid contact between the test probe 12 and the integrated circuit chip, thereby solving the problem that the rigid contact between the test component and the integrated circuit chip during testing with the existing test tooling is prone to damage.

[0034] Embodiment 4:

[0035] like Figures 5 to 8 As shown, the bottom end of the protective connecting mechanism 7 is fixedly connected to a U-shaped frame 8, the top of the U-shaped frame 8 is penetrated by a clamping mechanism 9, both sides of the bottom end of the U-shaped frame 8 are fixedly connected to lateral support plates 10, a mounting plate 11 is placed between the upper surfaces of the two lateral support plates 10, and a plurality of test probes 12 for testing integrated circuit chips are fixedly mounted on the lower surface of the mounting plate 11, the clamping mechanism 9 includes a screw rod 91 symmetrically penetrated and rotatably connected to both sides of the top of the U-shaped frame 8, the outer surface of the screw rod 91 is threadedly connected to a movable plate 92 slidably connected to the inner wall of the U-shaped frame 8, the lower surface of the movable plate 92 is symmetrically fixedly connected to two plug rods 93, and the upper surface of the mounting plate 11 is symmetrically provided with sockets 94 matching the plug rods 93. The outer surface of the connecting block 71 is rotatably connected with a rotating shaft 95, and the outer surface of the rotating shaft 95 is symmetrically fixedly connected with two first bevel gears 96, and the top of the screw rod 91 is fixedly connected with a second bevel gear 97 meshing with the first bevel gear 96, and both ends of the rotating shaft 95 are fixedly connected with knobs 98. The rotation of the knob 98 drives the rotating shaft 95 to rotate, and the two screw rods 91 can be driven to rotate at the same time through the first bevel gear 96 and the second bevel gear 97, thereby driving the movable plates 92 and the plug rods 93 on both sides to rise and fall at the same time, thereby facilitating the installation and disassembly of the mounting plate 11 and the test probe 12, thereby solving the problem that the existing testing work needs to operate the connecting mechanisms on both sides separately to realize the replacement of the test components, which increases the workload.

[0036] Working principle: When the adjusting screw 33 rotates, the slider 34 and the limit plate 35 can be driven to move through the thread, so as to facilitate the limiting of integrated circuit chips of different sizes. The integrated circuit chip is placed on the placement plate 31, and the motor 23 rotates to drive the conveying roller 21 and the conveyor belt 22 to rotate, so as to drive the integrated circuit chip placed on the adjustable placement mechanism 3 to move, and the next test can be carried out directly, thereby improving work efficiency, thereby solving the problem that the existing test tooling needs to repeatedly lock and unlock a single group of chips to reduce work efficiency. When the first electric push rod 6 drives the test probe 12 to move downward, when the test probe 12 contacts the integrated circuit chip, the spring 73 can be compressed at this time to avoid damage caused by rigid contact between the test probe 12 and the integrated circuit chip, thereby solving the problem that the test component and the integrated circuit chip are easily damaged by rigid contact during testing with the existing test tooling. The second electric push rod 42 drives the rectangular plate 43 and the L-shaped top block 44 to move upward, so that the integrated circuit chip can be automatically lifted up, which is convenient for taking and unloading, thereby solving the problem that the chip of the existing test tooling is clamped inside the fixture and is inconvenient to take.

[0037] Rotating the knob 98 drives the rotating shaft 95 to rotate, and through the first bevel gear 96 and the second bevel gear 97, the two screw rods 91 can be driven to rotate at the same time, thereby driving the movable plate 92 and the insertion rod 93 on both sides to rise and fall at the same time, thereby facilitating the installation and disassembly of the mounting plate 11 and the test probe 12, thereby solving the problem that the existing testing work needs to operate the connection mechanisms on both sides separately to realize the replacement of the test components, thereby increasing the workload.

[0038] The above shows and describes the basic principles and main features of the utility model and the advantages of the utility model. For those skilled in the art, it is obvious that the utility model is not limited to the details of the above exemplary embodiments, and can be implemented in other specific forms without departing from the spirit or basic features of the utility model. Therefore, no matter from which point of view, the embodiments should be regarded as exemplary and non-restrictive. The scope of the utility model is defined by the attached claims rather than the above description, and it is intended to include all changes within the meaning and scope of the equivalent elements of the claims. Any figure mark in the claims should not be regarded as limiting the claims involved.

[0039] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. A test fixture for integrated circuit chips, comprising a U-shaped base (1), characterized in that: A conveying mechanism (2) is installed inside the U-shaped base (1), and a plurality of adjustable placement mechanisms (3) for integrated circuit chips are fixedly installed on the outer surface of the conveying mechanism (2) in sequence. A lifting mechanism (4) matched with the adjustable placement mechanism (3) is installed inside the U-shaped base (1), and an L-shaped plate (5) is fixedly installed on one side of the outer surface of the U-shaped base (1). A first electric push rod (6) is fixedly installed through the top of the L-shaped plate (5), and a protective connection mechanism (7) is fixedly connected to the bottom end of the first electric push rod (6). A U-shaped frame (8) is fixedly connected to the bottom end of the protective connection mechanism (7), and a clamping mechanism (9) is installed through the top of the U-shaped frame (8). Both sides of the bottom end of the U-shaped frame (8) are fixedly connected with transverse support plates (10), and a mounting plate (11) is placed between the upper surfaces of the two transverse support plates (10). A plurality of test probes (12) for testing integrated circuit chips are fixedly installed on the lower surface of the mounting plate (11); The conveying mechanism (2) comprises two conveying rollers (21) symmetrically penetrating and rotatably connected inside the U-shaped base (1); two conveying belts (22) are symmetrically transmission-connected between the two conveying rollers (21); the adjustable placement mechanism (3) is fixedly mounted on the outer surfaces of the two conveying belts (22); a motor (23) is fixedly mounted on one side of the outer surface of the U-shaped base (1); and an output shaft of the motor (23) is fixedly connected to one end of an adjacent conveying roller (21).

2. A test fixture for integrated circuit chips according to claim 1, characterized in that: The adjustable placement mechanism (3) comprises a placement plate (31), the outer surface of the placement plate (31) is fixedly connected with rectangular frames (32) all around, two opposite rectangular frames (32) are fixedly connected with the outer surfaces of two conveyor belts (22), an adjusting screw (33) is rotatably connected through the outer surface of the rectangular frame (32), the outer surface of the adjusting screw (33) is threadedly connected with a slider (34) slidably connected to the inner wall of the rectangular frame (32), and the top end of the slider (34) is fixedly connected with a limiting plate (35).

3. A test fixture for integrated circuit chips according to claim 2, characterized in that: The lifting mechanism (4) comprises a connecting plate (41) fixedly connected to the inside of the U-shaped base (1); a second electric push rod (42) is fixedly connected to the upper surface of the connecting plate (41); a rectangular plate (43) is fixedly connected to the top end of the second electric push rod (42); and L-shaped lifting blocks (44) matching the placement plate (31) are fixedly connected to the four corner ends of the upper surface of the rectangular plate (43).

4. A test fixture for integrated circuit chips according to claim 1, characterized in that: The protective connection mechanism (7) comprises a connection block (71) fixedly connected to the top of the U-shaped frame (8); the top of the connection block (71) is fixedly connected to a rectangular sleeve (72); the interior of the rectangular sleeve (72) is fixedly connected to a spring (73); the top of the spring (73) is fixedly connected to a rectangular rod (74); the top of the rectangular rod (74) is fixedly connected to the bottom end of the first electric push rod (6).

5. A test fixture for integrated circuit chips according to claim 4, characterized in that: The clamping mechanism (9) comprises a screw rod (91) symmetrically passing through and rotatably connected to both sides of the top of the U-shaped frame (8); the outer surface of the screw rod (91) is threadedly connected to a movable plate (92) slidably connected to the inner wall of the U-shaped frame (8); the lower surface of the movable plate (92) is symmetrically fixedly connected to two insertion rods (93); and the upper surface of the mounting plate (11) is symmetrically provided with insertion holes (94) matching the insertion rods (93).

6. A test fixture for integrated circuit chips according to claim 5, characterized in that: A rotating shaft (95) is rotatably connected to the outer surface of the connecting block (71), two first bevel gears (96) are symmetrically fixedly connected to the outer surface of the rotating shaft (95), a second bevel gear (97) meshing with the first bevel gear (96) is fixedly connected to the top end of the screw rod (91), and knobs (98) are fixedly connected to both ends of the rotating shaft (95).

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