ICTO.1 nuclear test system card testing device

Abstract

The utility model relates to the field of testing, and discloses an ICTO.1 nuclear test system card testing device, which comprises a direct current adjustable power supply module, a digital multimeter module, a display module, a data processing module and a data storage module, the DC adjustable power supply module is connected with the ICTO.1 nuclear test system card, and the DC adjustable power supply module, the digital multimeter module, the display module and the data storage module are respectively connected with the data processing module; the digital multimeter module is connected with the ICTO.1 nuclear measurement system clamping piece; and the digital multimeter module is used for carrying out card impedance detection and card power supply voltage detection on the ICTO.1 nuclear measurement system card. According to the technical scheme provided by the utility model, comprehensive performance test on the card of the nuclear test system can be realized.

Description

Technical Field

[0001] The utility model relates to the field of testing, in particular to an ICTO.1 nuclear testing system card component testing device. Background Art

[0002] With the continuous development and widespread application of nuclear energy technology, the safe operation of nuclear power plants has received more and more attention. In the operation of nuclear power plants, it is crucial to accurately measure the power level of the reactor, because the reactor is a key part of the nuclear power plant, and its operating status directly affects the safety and efficiency of the nuclear power plant. In order to monitor the operating status of the reactor in real time, it is necessary to rely on the nuclear measurement system, and the cards in the nuclear measurement system play a key role in signal acquisition, conversion and transmission.

[0003] However, traditional nuclear test system components may fail or degrade in performance during long-term use due to factors such as environment, temperature, and humidity, posing a potential threat to the safe operation of nuclear power plants. In order to ensure the reliability and performance of the components, they need to be tested and calibrated regularly. However, existing test devices are often complex to operate and inefficient, and the accuracy and reliability of the test results need to be improved. Utility Model Content

[0004] The purpose of the utility model is to overcome the deficiencies of the prior art and provide an ICTO.1 nuclear test system card component test device, including an ICTO.1 nuclear test system card component, including a DC adjustable power supply module, a digital multimeter module, a display module, a data processing module and a data storage module;

[0005] The DC adjustable power supply module is connected to the ICTO.1 nuclear testing system card, and the DC adjustable power supply module, digital multimeter module, display module and data storage module are respectively connected to the data processing module; the digital multimeter module is connected to the ICTO.1 nuclear testing system card; the digital multimeter module is used to perform card impedance detection and card power supply voltage detection on the ICTO.1 nuclear testing system card.

[0006] Preferably, the digital multimeter module is used to perform card impedance detection on ICTO.1 nuclear test system cards, including:

[0007] Turn off the DC adjustable power supply module, use the resistance block of the digital multimeter module, connect the red probe end of the digital multimeter module to the XC1-C32 port of the ICTO.1 nuclear test system card, and connect the black probe end of the digital multimeter module to the XC1-C31 port.

[0008] Preferably, the digital multimeter module is used to detect the power supply voltage of the ICTO.1 nuclear test system card, including:

[0009] Turn on the DC adjustable power supply module, connect the XC1-A32 and XC1-C32 ports of the ICTO.1 nuclear test system card to the power supply DC+5V±0.1V; connect the XC1-A31 and XC1-C31 ports of the ICTO.1 nuclear test system card to the power supply ground 0V;

[0010] Use the DC voltage block of the digital multimeter module, connect the red probe end of the digital multimeter module to the XC1-C32 port of the ICTO.1 nuclear test system card, and connect the black probe end of the digital multimeter module to the XC1-C31 port of the ICTO.1 nuclear test system card.

[0011] Preferably, the data storage module is used to store data collected by the digital multimeter module.

[0012] Preferably, the DC adjustable power supply adopts a model of KEITHLEY 2230G-30-1.

[0013] Preferably, the digital multimeter module adopts FLUKE.

[0014] The beneficial effect of the utility model is that through the utility model, a comprehensive performance test can be carried out on the card components of the nuclear test system, and various situations in the actual working environment can be simulated to evaluate the stability and reliability of the card components in actual operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 A schematic diagram of the principle of a ICTO.1 nuclear test system card test device

[0016] Figure 2 This is a schematic diagram of the circuit principle of the ICTO.1 nuclear test system card. DETAILED DESCRIPTION

[0017] The technical solution of the present utility model is further described in detail below in conjunction with the accompanying drawings, but the protection scope of the present utility model is not limited to the following.

[0018] In order to make the purpose, technical scheme and advantages of the utility model clearer, the utility model is further described in detail in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the utility model and are not used to limit the utility model, that is, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. The components of the embodiments of the utility model described and shown in the drawings herein can be arranged and designed in various different configurations.

[0019] Therefore, the following detailed description of the embodiments of the utility model provided in the accompanying drawings is not intended to limit the scope of the utility model claimed for protection, but merely represents selected embodiments of the utility model. Based on the embodiments of the utility model, all other embodiments obtained by those skilled in the art without making creative work are within the scope of protection of the utility model. It should be noted that relational terms such as the terms "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations.

[0020] Moreover, the terms "comprises", "includes" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or apparatus that includes a list of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or apparatus. In the absence of more restrictions, an element defined by the phrase "comprises a ..." does not exclude the presence of additional identical elements in the process, method, article or apparatus that includes the element.

[0021] The features and performance of the present invention are further described in detail below in conjunction with the embodiments.

[0022] like Figure 1 As shown, an ICTO.1 nuclear test system card component testing device includes an ICTO.1 nuclear test system card component, including a DC adjustable power supply module, a digital multimeter module, a display module, a data processing module and a data storage module;

[0023] The DC adjustable power supply module is connected to the ICTO.1 nuclear testing system card, and the DC adjustable power supply module, digital multimeter module, display module and data storage module are respectively connected to the data processing module; the digital multimeter module is connected to the ICTO.1 nuclear testing system card; the digital multimeter module is used to perform card impedance detection and card power supply voltage detection on the ICTO.1 nuclear testing system card.

[0024] The digital multimeter module is used to perform impedance detection on ICTO.1 nuclear test system cards, including:

[0025] Turn off the DC adjustable power supply module, use the resistance block of the digital multimeter module, connect the red probe end of the digital multimeter module to the XC1-C32 port of the ICTO.1 nuclear test system card, and connect the black probe end of the digital multimeter module to the XC1-C31 port.

[0026] The digital multimeter module is used to detect the power supply voltage of the ICTO.1 nuclear test system card, including:

[0027] Turn on the DC adjustable power supply module, connect the XC1-A32 and XC1-C32 ports of the ICTO.1 nuclear test system card to the power supply DC+5V±0.1V; connect the XC1-A31 and XC1-C31 ports of the ICTO.1 nuclear test system card to the power supply ground 0V;

[0028] Use the DC voltage block of the digital multimeter module, connect the red probe end of the digital multimeter module to the XC1-C32 port of the ICTO.1 nuclear test system card, and connect the black probe end of the digital multimeter module to the XC1-C31 port of the ICTO.1 nuclear test system card.

[0029] The data storage module is used to store the data collected by the digital multimeter module. The DC adjustable power supply adopts the model of KEITHLEY 2230G-30-1. The digital multimeter module adopts FLUKE.

[0030] Specifically, the impedance test of the card; confirm that the card is not connected to the power supply. Use the resistance of the multimeter to measure the resistance between the XC1 / C32 (red test lead) port and the XC1 / C31 (black test lead) port. (+5V port to ground impedance).

[0031] Card power supply voltage test: Connect the XC1-A32 / C32 port to the power supply DC+5V±0.1V, and connect the XC1-A31 / C31 port to the power supply ground 0V. Use the multimeter DC voltage range to measure the voltage between the XC1 / C32 (red test lead) port and the XC1 / C31 (black test lead) port. Turn on the power supply, and turn off the power supply after the test is completed.

[0032] The above is only a preferred embodiment of the utility model. It should be understood that the utility model is not limited to the form disclosed herein, and should not be regarded as excluding other embodiments, but can be used in various other combinations, modifications and environments, and can be modified within the scope of the concept described herein through the above teachings or the technology or knowledge of the relevant field. The changes and modifications made by those skilled in the art do not deviate from the spirit and scope of the utility model, and should be within the scope of protection of the claims attached to the utility model.

Claims

1. An ICTO.1 nuclear test system card testing device, comprising an ICTO.1 nuclear test system card, characterized in that: It includes a DC adjustable power supply module, a digital multimeter module, a display module, a data processing module and a data storage module; The DC adjustable power supply module is connected to the ICTO.1 nuclear testing system card, and the DC adjustable power supply module, digital multimeter module, display module and data storage module are respectively connected to the data processing module; the digital multimeter module is connected to the ICTO.1 nuclear testing system card; the digital multimeter module is used to perform card impedance detection and card power supply voltage detection on the ICTO.1 nuclear testing system card.

2. The ICTO.1 nuclear test system card testing device according to claim 1, characterized in that: The digital multimeter module is used to perform impedance detection on ICTO.1 nuclear test system cards, including: Turn off the DC adjustable power supply module, use the resistance block of the digital multimeter module, connect the red probe end of the digital multimeter module to the XC1-C32 port of the ICTO.1 nuclear test system card, and connect the black probe end of the digital multimeter module to the XC1-C31 port.

3. The ICTO.1 nuclear test system card testing device according to claim 1, characterized in that: The digital multimeter module is used to detect the power supply voltage of the ICTO.1 nuclear test system card, including: Turn on the DC adjustable power supply module, connect the XC1-A32 and XC1-C32 ports of the ICTO.1 nuclear test system card to the power supply DC+5V±0.1V; connect the XC1-A31 and XC1-C31 ports of the ICTO.1 nuclear test system card to the power supply ground 0V; Use the DC voltage block of the digital multimeter module, connect the red probe end of the digital multimeter module to the XC1-C32 port of the ICTO.1 nuclear test system card, and connect the black probe end of the digital multimeter module to the XC1-C31 port of the ICTO.1 nuclear test system card.

4. The ICTO.1 nuclear test system card testing device according to claim 1, characterized in that: The data storage module is used to store data collected by the digital multimeter module.

5. The ICTO.1 nuclear test system card testing device according to claim 1, characterized in that: The model of the DC adjustable power supply is KEITHLEY 2230G-30-1.

6. The ICTO.1 nuclear test system card testing device according to claim 1, characterized in that: The digital multimeter module adopts FLUKE.

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