Eight-station three-temperature test scanning device

Abstract

The utility model relates to an eight-station three-temperature test scanning device, which comprises a multipath control board, an integrated circuit sorting machine and an integrated circuit test machine, the multipath control board comprises a communication signal scanning module and a test circuit switching module, and the integrated circuit test machine comprises an I / F communication card and a test module. The integrated circuit sorting machine comprises a SITESET port and an I / F communication card, the communication signal scanning module is respectively connected with the I / F communication card in the integrated circuit testing machine and the I / F communication card in the integrated circuit sorting machine, and the testing circuit switching module is respectively connected with the SITESET port and the testing module. The device is designed autonomously, and can complete at most eight-station parallel testing under the configuration of one testing machine. For special condition requirements, eight stations do not need to be fully opened, and the number and the type of the test stations can be arbitrarily specified according to actual requirements.

Description

Technical Field

[0001] The utility model relates to the technical field of temperature detection, in particular to an eight-station three-temperature testing scanning device. Background Art

[0002] In semiconductor testing, there are three main indicators for evaluating the quality of integrated circuit testing: effectiveness, reliability, and cost-effectiveness. In the usual test scheme: serial and parallel testing, both have requirements for the board resources or number of testers. While improving the test efficiency, the equipment cost also increases. For semiconductor three-temperature testing, the equipment temperature rise and fall process is slower than normal temperature testing, and it is necessary to improve the parallel testing capability to improve efficiency. According to the conventional test scheme, more testers need to be equipped. Taking our company's case as an example, eight stations need to be equipped with eight testers. This approach has the following main defects: 1. The cost of test hardware increases. 2. The test area occupies a greatly increased area, which is not conducive to machine operation and on-site management. Utility Model Content

[0003] The utility model provides an eight-station three-temperature test scanning device to solve the problems mentioned in the prior art, such as high test hardware cost and large test area occupation area.

[0004] In order to achieve the above-mentioned purpose, the utility model provides the following technical solutions: an eight-station three-temperature test scanning device, comprising a multi-channel control board, an integrated circuit sorter and an integrated circuit tester, the multi-channel control board comprising a communication signal scanning module and a test circuit switching module, the integrated circuit tester comprising an I / F communication card and a test module, the integrated circuit sorter comprising a SITE_SET port and an I / F communication card, the communication signal scanning module is respectively connected to the I / F communication card inside the integrated circuit tester and the I / F communication card inside the integrated circuit sorter, and the test circuit switching module is respectively connected to the SITE_SET port and the test module.

[0005] As a further technical solution of the utility model: the multi-channel control board also includes an interface unit.

[0006] As a further technical solution of the present invention: the interface unit includes two parts: a communication interface and a test interface.

[0007] As a further technical solution of the present utility model: the communication interface adopts a DB25 connector.

[0008] As a further technical solution of the utility model: the test interface is connected to eight test stations of the sorting machine.

[0009] As a further technical solution of the utility model: the test line switching module is implemented by the HT2803 chip control, each HT2803 controls one line switching, the sorting machine sends signals to the HT2803 in turn, and the corresponding HT2803 sends the driving signal of the corresponding channel to the line switching execution unit after receiving the signal.

[0010] As a further technical solution of the utility model: the circuit switching execution of the test circuit switching module is realized by an OMRON G6A-274P DPDT signal relay.

[0011] In the above technical solution, the technical effects and advantages provided by the utility model are:

[0012] 1. This device is independently designed and can complete up to eight-station parallel testing under the configuration of one test machine.

[0013] 2. If due to special circumstances, it is not necessary to open all eight stations, the number and type of test stations can be arbitrarily specified according to actual needs. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is the principle block diagram of the utility model;

[0015] Figure 2 This is a test flow chart of the utility model;

[0016] Figure 3 This is a schematic diagram of the interface principle of the utility model;

[0017] Figure 4 This is a circuit diagram of the interface unit of the utility model;

[0018] Figure 5 This is a circuit diagram of one of the line switching modules of the utility model. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0020] It should be noted that the terms “vertical”, “horizontal”, “up”, “down”, “left”, “right” and similar expressions used in this document are only for illustrative purposes and do not represent the only implementation method.

[0021] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field of the present invention; the terms used in the specification of the present invention are only for the purpose of describing specific implementation methods and are not intended to limit the present invention; the term "and / or" used herein includes any and all combinations of one or more related listed items.

[0022] The utility model provides Figure 1-5 The schematic diagram shown is specifically an eight-station three-temperature test scanning device, including a multi-channel control board, an integrated circuit sorter and an integrated circuit tester, the multi-channel control board includes a communication signal scanning module and a test circuit switching module, the integrated circuit tester includes an I / F communication card and a test module, the integrated circuit sorter includes a SITE_SET port and an I / F communication card, the communication signal scanning module is respectively connected to the I / F communication card inside the integrated circuit tester and the I / F communication card inside the integrated circuit sorter, and the test circuit switching module is respectively connected to the SITE_SET port and the test module.

[0023] Among them, the multi-channel control board also includes an interface unit. The communication interface is responsible for the communication connection between the test machine and the sorting machine. It uses a DB25 connector. The test interface is connected to the eight test stations of the sorting machine. Each station uses a group of BNC2*3 connectors. The line switching unit is controlled by the HT2803 chip. Each HT2803 controls one line switching. The sorting machine sends a signal to the HT2803 in turn. After receiving the signal, the corresponding HT2803 sends the driving signal of the corresponding channel to the line switching execution unit. The line switching execution is realized by the OMRON G6A-274P DPDT signal relay;

[0024] Here’s how it works:

[0025] The test operation process is as follows:

[0026] 1. During the test, connect the test lines of the eight stations of the sorting machine to the parallel input ports on the multi-channel control board in sequence according to the block diagram.

[0027] 2. The test circuit serial output port of the multi-channel control board is connected to the test machine.

[0028] 3. The station selection signal line of the sorting machine is connected to the SITE_SET port of the multi-channel control board.

[0029] 4. Start the machine to complete eight automatic tests.

[0030] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be considered exemplary and non-restrictive in all respects, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention.

[0031] In addition, it should be understood that although this specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This narrative method of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment have also been appropriately combined to form other implementation modes that are easy for those skilled in the art to understand.

Claims

1. An eight-station three-temperature test scanning device, comprising a multi-channel control board, an integrated circuit sorter and an integrated circuit tester, characterized in that: The multi-channel control board includes a communication signal scanning module and a test circuit switching module, the integrated circuit tester includes an I / F communication card and a test module, the integrated circuit sorter includes a SITE_SET port and an I / F communication card, the communication signal scanning module is respectively connected to the I / F communication card inside the integrated circuit tester and the I / F communication card inside the integrated circuit sorter, and the test circuit switching module is respectively connected to the SITE_SET port and the test module.

2. The eight-station three-temperature test scanning device according to claim 1, characterized in that: The multi-channel control board also includes an interface unit.

3. The eight-station three-temperature test scanning device according to claim 2, characterized in that: The interface unit includes two parts: a communication interface and a test interface.

4. The eight-station three-temperature test scanning device according to claim 3, characterized in that: The communication interface adopts a DB25 connector.

5. The eight-station three-temperature test scanning device according to claim 3, characterized in that: The test interface is connected to eight test stations of the sorting machine.

6. The eight-station three-temperature test scanning device according to claim 1, characterized in that: The test line switching module is implemented by the control of the HT2803 chip. Each HT2803 controls the switching of one line. The sorting machine sends signals to the HT2803 in turn. After receiving the signal, the corresponding HT2803 sends the driving signal of the corresponding channel to the line switching execution unit.

7. The eight-station three-temperature test scanning device according to claim 6, characterized in that: The circuit switching of the test circuit switching module is implemented by an OMRON G6A-274P DPDT signal relay.

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