Interchannel amplitude error calibration circuit of multi-channel phased array chip of millimeter wave frequency band
By combining the passive current detection module and the passive voltage detection module with the multiplier in the millimeter wave band phased array chip, the precise calibration of multi-channel amplitude error is achieved, and the problem of inaccurate beam intensity control in the millimeter wave band phased array chip is solved, and the resistance to environmental and process deviations is enhanced.
Patent Information
- Application Number
- CN202421929244.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-09
- Publication Date
- 2025-05-13
- Estimated Expiration
- 2034-08-09
AI Technical Summary
In the millimeter wave band phased array chip design, it is difficult for the prior art to achieve accurate monitoring and calibration of multi-channel amplitude errors, resulting in inaccurate beam intensity control and ineffective resistance to the negative impact of environmental and process manufacturing deviations.
The passive current detection module and the passive voltage detection module are coupled to the multiplier, and are converted into a voltage output signal through mixing and envelope low-pass filtering, and are further processed in the digital domain through ADC sampling, and the signal amplitude is controlled using a current mirror to achieve accurate calibration.
The precision calibration of multi-channel amplitude error of the millimeter wave band phased array chip is achieved, which improves the accuracy of beam intensity control and can better resist the influence of environmental and process manufacturing deviations.
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Figure CN222868057U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to an error calibration circuit in a millimeter wave frequency band, more specifically, to an inter-channel amplitude error calibration circuit of a multi-channel phased array chip in a millimeter wave frequency band. Background Art
[0002] Phased array chips require dynamic adjustment of the signal amplitude of each channel to achieve beam scanning over a wide angular range. While numerous power detection methods and design solutions exist in the lower-frequency microwave domain, these solutions are rare in millimeter-wave phased array chip design. This is because, beyond millimeter-wave frequencies, the parasitic capacitance of transistors and the inherent design limitations of inductor transformers prevent the use of amplitude error calibration methods employed in low-frequency microwave applications. Furthermore, millimeter-wave frequencies require higher accuracy for amplitude error calibration than low-frequency microwaves. Therefore, true value detection is often preferred for amplitude detection and calibration in the millimeter-wave domain.
[0003] Chinese invention patent document CN117673751A discloses a polarization-switching multi-beam multi-channel phased array chip, characterized in that it includes 2M 1-to-N power dividers, M×N single-pole double-throw switches, M×N phase-shift attenuation channels and an on-chip two-dimensional overlapping synthesis network integrated on the chip, the input and output ends on one side of the M 1-to-N power dividers are connected to M left-handed antennas in a one-to-one correspondence, and the N input and output ends on the other side of the M 1-to-N power dividers are connected to the first fixed ends of the M×N single-pole double-throw switches in a one-to-one correspondence; in addition, the input and output ends on one side of the M 1-to-N power dividers are connected to M right-handed antennas in a one-to-one correspondence, and the M 1-to-N power dividers are connected to the first fixed ends of the M×N single-pole double-throw switches in a one-to-one correspondence. The N input and output terminals on the other side of the power divider are connected one-to-one with the second fixed terminals of the M×N single-pole double-throw switches; the moving terminals of the M×N single-pole double-throw switches are connected one-to-one with the first input and output terminals of the M×N phase-shift attenuation channels, and the second input and output terminals of the M×N phase-shift attenuation channels are connected to the on-chip two-dimensional overlapping synthesis network. The on-chip two-dimensional overlapping synthesis network includes N synthesis subnetworks, with the i-th synthesis subnetwork synthesizing the signals of the i-th phase-shift attenuation channel corresponding to each of the 1-to-N power dividers, a total of M phase-shift attenuation channels, to obtain the i-th beam; where M and N are both integers greater than 1, and i is an integer from 1 to N. Clearly, this patent achieves the formation of multiple independent beams through monolithic integration. By switching between the single-pole double-throw switches and the corresponding 1-to-N power dividers connected to the left-hand or right-hand antenna, each phase-shift attenuation channel can be switched between left and right. However, this structure cannot solve the amplitude error problem in the existing low-frequency microwave field. Utility Model Content
[0004] Based on this, it is necessary to address the above-mentioned technical issues and provide an inter-channel amplitude error calibration circuit for a multi-channel phased array chip in the millimeter wave frequency band. The inter-channel amplitude error calibration circuit for a multi-channel phased array chip in the millimeter wave frequency band includes several main TX links, each of which is equipped with an amplitude detection unit. The amplitude detection unit includes a passive current detection module and a passive voltage detection module. The passive current detection module and the passive voltage detection module are coupled with a multiplier and then coupled with a filter. Due to the use of the passive current detection module and the passive voltage detection module, the current signal is ultimately converted into a voltage signal, which is multiplied (mixed) with the monitoring voltage and finally envelope low-pass filtered to obtain a voltage output signal related to the power signal, thereby achieving the monitoring purpose. Subsequently, through ADC sampling, further processing is performed in the digital domain, and the digital domain uses a current mirror to control the signal amplitude, thereby achieving the purpose of amplitude error calibration. The inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band can solve the problem that the multi-channel amplitude error of the phased array chip in the millimeter wave frequency band is difficult to monitor and difficult to monitor accurately, and realize the precise calibration of the amplitude error, so that the millimeter wave phased array chip can achieve more precise beam intensity control, and at the same time can better resist the negative impact of environmental and process manufacturing deviations.
[0005] In order to solve the above technical problems, the present invention adopts the following technical solutions:
[0006] A circuit for calibrating the inter-channel amplitude error of a multi-channel phased array chip in the millimeter wave frequency band is characterized in that the circuit comprises a plurality of main body TX links, each of the main body TX links is provided with an amplitude detection unit, and the amplitude detection unit comprises a passive current detection module and a passive voltage detection module. The passive current detection module and the passive voltage detection module are coupled to a multiplier and then coupled to a filter.
[0007] As a preferred implementation of the inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band provided by the present invention, the filter is a low-pass filter.
[0008] As a preferred implementation of the inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band provided by the present invention, the passive current detection module is a current mirror.
[0009] As a preferred implementation of the inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band provided by the present invention, the amplitude detection units are all arranged at the end of the main body TX link.
[0010] As a preferred implementation of the inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band provided by the present invention, the passive current detection module and the passive voltage detection module are located on the same side of the coil of the main body TX link.
[0011] As a preferred implementation of the inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band provided by the present invention, the multiplier is a MOS switch.
[0012] As a preferred implementation of the inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band provided by the present invention, the MOS switch is a P-type MOS.
[0013] As a preferred embodiment of the inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band provided by the present invention, the output signal of the passive current detection module is coupled to the gate of the MOS switch, the output signal of the passive voltage detection module is coupled to the source of the MOS switch, and the drain of the MOS switch is coupled to the input end of the filter.
[0014] As a preferred implementation of the inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band provided by the present invention, the output signal of the filter is a voltage output signal.
[0015] As a preferred implementation of the inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band provided by the present invention, the voltage output signal is a DC signal.
[0016] Compared with the prior art, the present invention has the following beneficial effects:
[0017] The present invention provides an inter-channel amplitude error calibration circuit for a multi-channel phased array chip in the millimeter wave frequency band. Due to the use of a passive current detection module and a passive voltage detection module, the current signal is ultimately converted into a voltage signal, multiplied (mixed) with the monitoring voltage, and finally subjected to envelope low-pass filtering, ultimately obtaining a voltage output signal related to the power signal, thereby achieving the monitoring purpose. Subsequently, through ADC sampling, further processing is performed in the digital domain, and the digital domain controls the signal amplitude through a current mirror, thereby achieving the purpose of amplitude error calibration. The inter-channel amplitude error calibration circuit for a multi-channel phased array chip in the millimeter wave frequency band can solve the problem that the amplitude errors of the multi-channel phased array chips in the millimeter wave frequency band are difficult to monitor and difficult to monitor accurately, and achieve accurate calibration of the amplitude error, so that the millimeter wave phased array chip can achieve more accurate beam intensity control, while being able to better resist the negative effects of environmental and process manufacturing deviations.
[0018] In addition, the passive current detection module and the passive voltage detection module can be located on the same side of the coil of the main body TX link. Since the passive current detection module and the passive voltage detection module are located on the same side of the coil of the main body TX link, the detection error can be further reduced, thereby improving the detection accuracy.
[0019] Alternatively, the multiplier can be a MOS switch. The output signal of the passive current detection module is coupled to the gate of the MOS switch, the output signal of the passive voltage detection module is coupled to the source of the MOS switch, and the drain of the MOS switch is coupled to the input of the filter. Since the multiplier is a MOS switch, it has an ideal switching frequency, which can further reduce detection errors and thus improve detection accuracy. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] In order to more clearly illustrate the solutions in the present invention, a brief introduction will be given below to the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.
[0021] Figure 1 This is a circuit connection diagram of the inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band of the present invention;
[0022] Figure 2 for Figure 1 A schematic diagram of the partial structure of the inter-channel amplitude error calibration circuit of a multi-channel phased array chip in the millimeter wave frequency band;
[0023] The markings in the figure are as follows: 1, main body TX link; 2, amplitude detection unit; 21, passive current detection module; 22, passive voltage detection module; 23, multiplier; 24, filter; S, voltage output signal. DETAILED DESCRIPTION
[0024] In order to help those skilled in the art better understand the present invention, the following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of the present invention.
[0025] As described in the background, prior art phased array chips require dynamic adjustment of the signal amplitude of each channel to achieve beam scanning over a wide angular range. While numerous power detection methods and design solutions exist in the lower-frequency microwave domain, such solutions are rare in millimeter-wave phased array chip design. This is because, beyond the millimeter-wave frequency range, the parasitic capacitance of the tube and the inherent design limitations of the inductor transformer make it impossible to directly use the amplitude error calibration methods used in low-frequency microwave applications. Furthermore, the amplitude error calibration requirements in the millimeter-wave band are higher than those in the low-frequency microwave domain. Therefore, the millimeter-wave band tends to employ true value detection methods for amplitude detection and calibration.
[0026] In order to solve this technical problem, the utility model provides an inter-channel amplitude error calibration circuit for a multi-channel phased array chip in the millimeter wave frequency band, comprising a plurality of main body TX links 1, each of which is provided with an amplitude detection unit 2, and the amplitude detection unit 2 comprises a passive current detection module 21 and a passive voltage detection module 22. After the passive current detection module 21 and the passive voltage detection module 22 are coupled with a multiplier 23, they are coupled with a filter 24.
[0027] Through the above structural design, thanks to the use of passive current detection module 21 and passive voltage detection module 22, the current signal is ultimately converted into a voltage signal, multiplied (mixed) with the monitoring voltage, and finally subjected to envelope low-pass filtering to obtain a voltage output signal S related to the power signal, thus achieving the monitoring purpose. This signal is then sampled by an ADC and further processed in the digital domain, where a current mirror is used to control the signal amplitude, thereby achieving the purpose of amplitude error calibration.
[0028] In order to enable those skilled in the art to better understand the present invention, the technical solutions in the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more precise definition of the protection scope of the present invention.
[0029] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features and technical solutions therein can be combined with each other.
[0030] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, it does not need to be further defined or explained in subsequent drawings.
[0031] like Figure 1 and Figure 2As shown, the inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band includes several main body TX links 1, and each of the main body TX links 1 is provided with an amplitude detection unit 2. The amplitude detection unit 2 includes a passive current detection module 21 and a passive voltage detection module 22. After the passive current detection module 21 and the passive voltage detection module 22 are coupled with the multiplier 23, they are coupled with the filter 24.
[0032] It should be noted that the filter 24 is a low-pass filter.
[0033] In addition, the passive current detection module 21 is a current mirror. The amplitude detection unit 2 is arranged at the end of the main body TX link 1.
[0034] The output signal of the filter 24 is a voltage output signal S. Specifically, the voltage output signal S is a DC signal.
[0035] The working mode of this embodiment is described below.
[0036] Due to the use of passive current detection module 21 and passive voltage detection module 22, the current signal is ultimately converted into a voltage signal, multiplied (mixed) with the monitoring voltage, and finally envelope low-pass filtered to obtain a voltage output signal S related to the power signal, achieving the monitoring purpose. Subsequently, through ADC sampling, further processing is performed in the digital domain, where the signal amplitude is controlled by a current mirror, thereby achieving the purpose of amplitude error calibration. This inter-channel amplitude error calibration circuit for multi-channel phased array chips in the millimeter wave band can solve the problem of difficult and difficult to accurately monitor the amplitude errors of multi-channel phased array chips in the millimeter wave band, achieving precise calibration of amplitude errors (<0.5 dB), enabling millimeter wave phased array chips to achieve more precise beam intensity control while better resisting the negative effects of environmental and process manufacturing deviations.
[0037] The inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band provided by Example 1 or 2 is further optimized. Specifically, the passive current detection module 21 and the passive voltage detection module 22 are located on the same side of the coil of the main body TX link 1.
[0038] The working mode of this embodiment is described below.
[0039] Since the passive current detection module 21 and the passive voltage detection module 22 are located on the same side of the coil of the main body TX link 1, the detection error can be further reduced, thereby improving the detection accuracy.
[0040] The inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band provided in Example 1 is further optimized. Specifically, the multiplier 23 is a MOS switch.
[0041] It should be noted that the MOS switch is a P-type MOS.
[0042] In addition, the output signal of the passive current detection module 21 is coupled to the gate of the MOS switch, the output signal of the passive voltage detection module 22 is coupled to the source of the MOS switch, and the drain of the MOS switch is coupled to the input end of the filter 24 .
[0043] The working mode of this embodiment is described below.
[0044] Since the multiplier 23 is a MOS switch, it has an ideal switching frequency, which can further reduce the detection error and thus improve the detection accuracy.
[0045] It should be noted that the English terms in the drawings of the specification are as follows:
[0046] Gain Control Unit: Gain control unit;
[0047] Gain Control: Gain adjustment;
[0048] Antenna: Antenna;
[0049] LPF: low-pass filter;
[0050] multiplier: multiplier;
[0051] V sensing: voltage sensor;
[0052] I sensing: current sensor.
[0053] In addition, the transistors are field-effect transistors or triodes. When these transistors are field-effect transistors, they can be N-type transistors (such as metal-oxide-semiconductor field-effect transistors (NMOS)), or they can be P-type metal-oxide-semiconductor field-effect transistors, complementary metal-oxide-semiconductor field-effect transistors, and other circuit structure types.
[0054] The terms "coupling" and "coupling" involved in the embodiments of this application should be understood in a broad sense. For example, they may refer to a physical direct connection, or an indirect connection achieved through electronic devices, such as a connection achieved through resistors, inductors, capacitors or other electronic devices.
[0055] In this utility model, unless otherwise specified or limited, the terms "installed," "connected," "connect," "fixed," etc. should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integration; mechanical connection, electrical connection, or communication; direct connection or indirect connection through an intermediate medium; internal communication between two elements or interaction between two elements, unless otherwise specified. For those skilled in the art, the specific meanings of the above terms in this utility model can be understood according to specific circumstances.
[0056] Obviously, the embodiments described above are only some of the embodiments of the present application, rather than all of the embodiments. The preferred embodiments of the present application are given in the accompanying drawings, but they do not limit the patent scope of the present application. The present application can be implemented in many different forms. On the contrary, the purpose of providing these embodiments is to make the understanding of the disclosure of the present application more thorough and comprehensive. Although the present application has been described in detail with reference to the aforementioned embodiments, for those skilled in the art, it is still possible to modify the technical solutions described in the aforementioned specific embodiments, or to make equivalent replacements for some of the technical features therein. Any equivalent structure made using the contents of the present application specification and the accompanying drawings, directly or indirectly used in other related technical fields, is also within the scope of patent protection of the present application.
Claims
1. A channel amplitude error calibration circuit for a multi-channel phased array chip in the millimeter wave frequency band, characterized in that: The inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band comprises a plurality of main body TX links (1), each of the main body TX links (1) is provided with an amplitude detection unit (2), the amplitude detection unit (2) comprises a passive current detection module (21) and a passive voltage detection module (22), and the passive current detection module (21) and the passive voltage detection module (22) are coupled with a multiplier (23) and then coupled with a filter (24).
2. According to the inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band as claimed in claim 1, the filter (24) is a low-pass filter.
3. The inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band according to claim 1, characterized in that: The passive current detection module (21) is a current mirror.
4. The inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band according to claim 1, characterized in that: The amplitude detection units (2) are all arranged at the end of the main body TX link (1).
5. The inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band according to claim 1, characterized in that: The passive current detection module (21) and the passive voltage detection module (22) are located on the same side of the coil of the main body TX link (1).
6. The inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band according to claim 1, characterized in that: The multiplier (23) is a MOS switch.
7. The inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band according to claim 6, characterized in that: The MOS switch is a P-type MOS.
8. The inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band according to claim 6, characterized in that: The output signal of the passive current detection module (21) is coupled to the gate of the MOS switch, the output signal of the passive voltage detection module (22) is coupled to the source of the MOS switch, and the drain of the MOS switch is coupled to the input end of the filter (24).
9. The inter-channel amplitude error calibration circuit of a multi-channel phased array chip in the millimeter wave frequency band according to claim 1, characterized in that: The output signal of the filter (24) is a voltage output signal (S).
10. The inter-channel amplitude error calibration circuit of the multi-channel phased array chip in the millimeter wave frequency band according to claim 9, characterized in that: The voltage output signal (S) is a DC signal.
Citation Information
Patent Citations
Polarizable switching multi-beam multi-channel phased array chip
CN117673751A