Test board for electronic component

Abstract

The utility model relates to the technical field of electronic component testing, and discloses a test board for electronic components, which comprises a board body, a plurality of test panels, a recording table, a collecting box and a wire hanging structure, the plurality of test panels are embedded above the board body, a dustproof plate is arranged on the board body in a sliding manner, the recording table is fixedly arranged above the board body, a pressing frame is arranged above the recording table, and the collecting box is arranged on the pressing frame. The wire hanging structure comprises wire hanging frames, buffer frames and limiting plates, the multiple wire hanging frames are fixedly arranged on the baffle at the rear end, the buffer frames are integrally formed and arranged at the two ends of the wire hanging frames, the limiting plates are arranged on the opposite sides of the buffer frames in a sliding mode, buffer grooves are formed in the buffer frames, and the limiting plates are arranged in the buffer grooves. The end of the limiting plate is connected with the inner wall of the buffer groove through a second spring, and the front end of the limiting plate is connected with a guide inclined plate. The connecting wire storage box has the advantages that dust can be effectively prevented, connecting wires can be conveniently and orderly placed and are easy to take and place, and electronic elements can be conveniently and rapidly marked, recorded and separately stored.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic component testing, in particular to a testing platform for electronic components. Background Art

[0002] A test bench is a workbench or device used to test electronic components, circuit boards or systems. It usually includes various test equipment, instruments and connecting wires to connect the components or circuits to be tested, and provide the necessary power supply, signal source and measurement functions. The main purpose of the test bench is to facilitate engineers or technicians to test, debug and verify electronic components, circuit boards or systems.

[0003] Existing electronic component test benches generally embed the test equipment into the bench body, which can save space and facilitate operation. However, the test equipment is not convenient to take out, and it is easy to accumulate dust and difficult to clean when left for a long time. In addition, when testing some electronic components, additional connecting wires are required to connect them to the test equipment. When not in use, the wires are usually stored in the drawer of the test bench, which is not convenient to take and put and is easy to get tangled together, affecting the test efficiency. In addition, after testing some smaller electronic components, it is not convenient to mark, record and classify them, which makes it impossible to quickly find the key during retesting or debugging. Utility Model Content

[0004] In order to solve the above problems, the utility model provides an electronic component test bench which can effectively prevent dust, conveniently and neatly place connecting wires and facilitate taking and placing, and conveniently and quickly mark, record and separately store electronic components.

[0005] In order to solve the above technical problems, the technical solution proposed by the utility model is: a test bench for electronic components, including a table body, a test panel, a recording table, a collection box and a hanging wire structure, a plurality of the test panels are embedded above the table body, the table body is provided with a groove matching the test panel, the table body is slidably provided with a dustproof plate above the groove, the recording table is fixed above the table body, a pressure frame is provided above the recording table, a plurality of insertion rods are connected below the pressure frame, a slot matching the insertion rod is provided on the recording table, the lower end of the insertion rod is connected to the slot through a spring, a pen slot is provided above the recording table, and the collection box is provided with two A fixing groove matching the collection box is provided above the table body, and the lower end of the collection box is stuck in the fixing groove. A limiting side platform is formed integrally with the fixing groove extending out from the edge of the upper end of the collection box. A baffle is connected at the rear end and both side edges of the table body. The wire hanging structure includes a wire hanging rack, a buffer rack and a limiting plate. Multiple wire hanging racks are fixedly arranged on the baffle plate at the rear end. The buffer rack is integrally formed at both ends of the wire hanging rack. The limiting plate is slidably arranged on the opposite side of the buffer rack. A buffer groove matching the limiting plate is provided in the buffer rack. The end of the limiting plate is connected to the inner wall of the buffer groove through a spring 2, and a guide inclined plate is connected to the front end of the limiting plate.

[0006] Furthermore, the test panels are provided in plurality and of different types.

[0007] Furthermore, fixing strips are symmetrically provided on both sides of the groove above the platform, the dustproof plate is slidably provided between the fixing strips, sliding strips are symmetrically connected on both sides of one end of the dustproof plate, a sliding groove matching the sliding strip is provided on the inner side of the fixing strip, and a handle is connected above the dustproof plate.

[0008] Furthermore, the upper wall of the recording table is a slope with a front end tilted downward.

[0009] Furthermore, the two collecting boxes are respectively a round box and a square box, and label slots are provided above the platform near the two collecting boxes.

[0010] Furthermore, the vertical cross-section of the wire hanging rack is arc-shaped, and arc-shaped support plates are symmetrically connected on both sides of the wire hanging rack.

[0011] Compared with the prior art, the utility model has the following advantages: a slidable dustproof plate facilitates dustproof protection of the test panel after the test is completed, effectively preventing dust from entering the test area; the wire hanging rack can be used to hang the connecting wire, and the limiting plate can be used to achieve stable suspension of the connecting wire, which is convenient for neat placement and storage, and convenient for direct placement; the setting of the guide inclined plate facilitates the smooth placement of the connecting wire into the wire hanging rack; the setting of the recording table facilitates the recording of the test conditions of the electronic components and the marking of the electronic components, and the pressing frame can fix the paper; the pen slot is convenient for placing the writing pen, which is conducive to rapid recording and marking; the setting of two collection boxes and label slots of different shapes can be used to separately place electronic components with different test results, and is convenient for rapid distinction. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 It is a three-dimensional diagram of the utility model;

[0013] Figure 2 It is a top view of the utility model;

[0014] Figure 3 It is the front view of the utility model;

[0015] Figure 4 It is a three-dimensional diagram of the dustproof plate part of the utility model;

[0016] Figure 5 It is a side view structural schematic diagram of the recording table part of the utility model;

[0017] Figure 6 It is a three-dimensional diagram of the wire hanging structure of the utility model;

[0018] Figure 7 It is a side structural schematic diagram of the wire hanging structure part of the utility model.

[0019] As shown in the figure: 1. Table body; 2. Test panel; 3. Recording table; 4. Collection box; 5. Dustproof plate; 6. Press frame; 7. Insert rod; 8. Spring 1; 9. Limiting side table; 10. Baffle; 11. Wire hanging rack; 12. Buffer rack; 13. Limiting plate; 14. Spring 2; 15. Guide inclined plate; 16. Fixing bar; 17. Sliding bar; 18. Handle; 19. Label slot; 20. Arc support plate; 21. Pen slot. DETAILED DESCRIPTION

[0020] The utility model is further described in detail below in conjunction with the accompanying drawings.

[0021] Combined with Figure 1 , Attachment Figure 2A test bench for electronic components includes a table body 1, a test panel 2, a recording table 3, a collection box 4 and a hanging wire structure. A plurality of the test panels 2 are embedded above the table body 1. The test panels 2 are provided in plurality and of different types, which is convenient for testing electronic components with different design requirements and has a wide range of uses.

[0022] Combined with Figure 1 , Attachment Figure 2 , Attachment Figure 3 , Attachment Figure 4 The platform 1 is provided with a groove matching the test panel 2, and a dustproof plate 5 is slidably provided on the platform 1 above the groove. Fixed bars 16 are symmetrically provided on both sides of the groove above the platform 1, and the dustproof plate 5 is slidably provided between the fixed bars 16. Slide bars 17 are symmetrically connected on both sides of one end of the dustproof plate 5, and a sliding groove matching the slide bar 17 is provided on the inner side of the fixed bar 16. A handle 18 is connected above the dustproof plate 5 to facilitate and stably move the dustproof plate 5.

[0023] Combined with Figure 1 , Attachment Figure 2 , Attachment Figure 3 , Attachment Figure 5 The recording table 3 is fixed on the top of the table body 1, a pressure frame 6 is provided on the top of the recording table 3, and a plurality of insertion rods 7 are connected below the pressure frame 6. A slot matching the insertion rod 7 is provided on the recording table 3, and the lower end of the insertion rod 7 is connected to the slot through a spring 8. A pen groove 21 is provided on the top of the recording table 3, and the upper wall of the recording table 3 is a slope with a downward inclination at the front end, which can better meet the writing angle requirements of the tester and is convenient for writing.

[0024] Combined with Figure 1 , Attachment Figure 2 , Attachment Figure 3 There are two collection boxes 4, and a fixing groove matching the collection box 4 is provided on the top of the table body 1. The lower end of the collection box 4 is inserted into the fixing groove. The upper edge of the collection box 4 extends out of the fixing groove and is integrally formed with a limiting side table 9. The two collection boxes 4 are respectively a round box and a square box. Label grooves 19 are provided near the two collection boxes 4 on the top of the table body 1. Collection boxes 4 of different shapes can be distinguished to a greater extent with the label grooves 19, thereby avoiding the wrong placement of electronic components and facilitating accurate classification.

[0025] Combined with Figure 1 , Attachment Figure 2 , Attachment Figure 3 , Attachment Figure 6 , Attachment Figure 7, a baffle 10 is connected at the rear end and both side edges of the upper body 1, and the wire hanging structure includes a wire hanging frame 11, a buffer frame 12 and a limit plate 13. A plurality of wire hanging frames 11 are fixedly arranged on the baffle 10 at the rear end, and the buffer frame 12 is integrally formed and arranged at both ends of the wire hanging frame 11. The limit plate 13 is slidably arranged on the opposite side of the buffer frame 12. A buffer groove matching the limit plate 13 is arranged in the buffer frame 12. The end of the limit plate 13 is connected to the inner wall of the buffer groove through a spring 14, and a guide inclined plate 15 is connected to the front end of the limit plate 13. The vertical section of the wire hanging frame 11 is an arc shape, and arc support plates 20 are symmetrically connected on both sides of the wire hanging frame 11. The arc support plates 20 facilitate the drooping placement of the ends of the connecting wires, improve the space utilization rate, and at the same time avoid excessive bending, which is safe and practical.

[0026] The specific implementation mode of the utility model is as follows: the electronic component to be tested is placed on the table body 1, and according to the specific needs of the electronic component, it is selected to be directly connected to the test panel 2 or to be connected using a connecting wire. If a connecting wire is needed, the connecting wire can be removed from the wire hanging rack 11, the dustproof plate 5 is pulled open, and the electronic component is connected to the test panel 2. Before the test, the pressing frame 6 is first lifted upward, and the insertion rod 7 moves with the pressing frame 6 and drives the spring 8 to extend, and the recording paper and label paper are placed under the pressing frame 6, and the pressing frame 6 is released. The spring 8 drives the pressing frame 6 to reset, and the pressing frame 6 fixes the recording paper and label paper on the recording table 3, and the prepared pen is placed in the pen slot 21, and a non-stick label is pasted in the label slot 19 corresponding to each collection box 4. With the label of the test result, during the test, you can pick up a pen at any time to record the test situation and write the label. After the test is completed, stick the corresponding label on the electronic component, and put the electronic component into the corresponding collection box 4 according to the test result. After the test is completed, remove the connecting wire and put the connecting wire into the wire hanging rack 11 between the two guide inclined plates 15. During the process, the limit plate 13 is squeezed by the connecting wire and moves into the buffer rack 12. At the same time, the spring 2 14 is compressed. Until the connecting wire is completely placed in the wire hanging rack 11, the limit plate 13 is reset under the action of the spring 2 14 to achieve blocking and fixing of the connecting wire. The two ends of the connecting wire are drooped and stored along the arc-shaped support plate 20, and finally the dustproof plate 5 is closed.

[0027] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the term "connection" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0028] The above describes the utility model and its implementation methods, which are not restrictive. The drawings show only one implementation method of the utility model, and the actual structure is not limited thereto. In short, if ordinary technicians in this field are inspired by it and design structural methods and embodiments similar to the technical solution without creativity without departing from the purpose of the invention of the utility model, they should all fall within the protection scope of the utility model.

Claims

1. A test bench for electronic components, comprising a bench body (1), a test panel (2), a recording table (3), a collection box (4) and a wire hanging structure, characterized in that: A plurality of the test panels (2) are embedded above the table (1); a groove matching the test panel (2) is provided on the table (1); a dustproof plate (5) is slidably provided above the groove on the table (1); the recording table (3) is fixed above the table (1); a pressure frame (6) is provided above the recording table (3); a plurality of insertion rods (7) are connected below the pressure frame (6); a slot matching the insertion rod (7) is provided on the recording table (3); the lower end of the insertion rod (7) is connected to the slot via a spring (8); a pen slot (21) is provided above the recording table (3); two collection boxes (4) are provided; a fixing slot matching the collection box (4) is provided above the table (1); the lower end of the collection box (4) is snapped into the fixing slot The upper edge of the collecting box (4) extends out of a fixed groove and is integrally formed with a limiting side table (9). The upper rear end and both side edges of the platform body (1) are connected with baffles (10). The wire hanging structure comprises a wire hanging frame (11), a buffer frame (12) and a limiting plate (13). A plurality of wire hanging frames (11) are fixedly arranged on the baffle (10) at the rear end. The buffer frame (12) is integrally formed and arranged at both ends of the wire hanging frame (11). The limiting plate (13) is slidably arranged on the opposite side of the buffer frame (12). A buffer groove matching the limiting plate (13) is arranged in the buffer frame (12). The end of the limiting plate (13) is connected to the inner wall of the buffer groove through a spring 2 (14). The front end of the limiting plate (13) is connected with a guide inclined plate (15).

2. The electronic component test bench according to claim 1, characterized in that: The test panels (2) are provided in plurality and of different types.

3. The electronic component test bench according to claim 1, characterized in that: A fixing strip (16) is symmetrically arranged on both sides of the groove above the platform (1); the dustproof plate (5) is slidably arranged between the fixing strips (16); a sliding strip (17) is symmetrically connected to both sides of one end of the dustproof plate (5); a sliding groove matching the sliding strip (17) is arranged on the inner side of the fixing strip (16); and a handle (18) is connected to the top of the dustproof plate (5).

4. The electronic component test bench according to claim 1, characterized in that: The upper wall of the recording table (3) is a slope with a front end tilted downward.

5. The electronic component test bench according to claim 1, characterized in that: The two collection boxes (4) are respectively a round box and a square box, and label slots (19) are provided above the platform (1) near the two collection boxes (4).

6. The electronic component test bench according to claim 1, characterized in that: The vertical cross section of the wire hanging frame (11) is in the shape of an arc, and arc-shaped support plates (20) are symmetrically connected on both sides of the wire hanging frame (11).

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