Butterfly-shaped device testing device

Abstract

The utility model relates to a butterfly-shaped device testing device, and belongs to the technical field of photoelectric device testing. Comprising a bottom plate, a supporting seat, a locking assembly, a testing assembly and a heat dissipation plate. The supporting seat is mounted on the bottom plate, and is provided with a mounting groove for placing a butterfly-shaped device to be tested; the locking assembly is hinged to the supporting seat, and the locking assembly rotates towards the supporting seat to fix the to-be-tested butterfly-shaped device in the mounting groove; the test assembly is connected to the bottom plate and is electrically connected with the supporting seat; the heat dissipation plate is connected to the side, away from the supporting base, of the bottom plate. The technical problems that in the prior art, when a circuit board is connected through a wire for testing, the stability, reliability and service life of a testing result can be affected by conductor oxidation, aging of a device can be aggravated by heating of the device in the testing process, so that the precision of the testing device is reduced, and a pressing element of a fixing frame can be in poor contact are solved.

Description

Technical Field

[0001] The utility model belongs to the technical field of photoelectric device testing, and particularly relates to a butterfly device testing device. Background Art

[0002] In the optoelectronic field, regarding the structure of butterfly devices, the shell is usually in the shape of a cuboid with a large internal space to accommodate the complex structure inside the optoelectronic device and to realize various functions. Its structural design includes the shell and the PIN pin part. For such a device, when performing a power-on test, it is necessary to fix the shell and press each PIN pin to ensure the accuracy and reliability of the test. In the test process of the prior art, the pins of the test piece are usually fixed by welding or other methods before testing.

[0003] According to the applicant's search, it was found that the authorized patent with announcement number CN217689292U mentioned a disc-shaped device and chip test combination platform, including a rack, a butterfly device placement slot, a first gold layer, a pin pressing frame, a circuit board placement slot, a probe fixing frame, two detection probes, a chip placement slot and a second gold layer. The first gold layer is connected to the external circuit board in the circuit board placement slot through a wire through a threading hole, the external circuit board is connected to the test instrument, the switch knob is connected to the pin signal of the butterfly device to be tested, and one end of the two detection probes is respectively connected to the positive and negative poles of the chip, and the other end is respectively connected to the external test instrument.

[0004] In the process of testing butterfly devices by the above-mentioned devices represented by the prior art, there are at least the following problems:

[0005] When testing by connecting the circuit board with wires, conductor oxidation will affect the stability, reliability and service life of the test results. The heat generated by the device during the test will accelerate the aging of the device, thereby reducing the accuracy of the test device, and the fixed frame pressing components will have poor contact. Utility Model Content

[0006] The utility model provides a butterfly device testing device, which is used to solve the technical problems that in the prior art, a circuit board is connected by a wire for testing, and conductor oxidation will affect the stability, reliability and service life of the test result, and the heat generated by the device during the test will aggravate the aging of the device, thereby reducing the accuracy of the test device, and the fixing frame pressing elements will have poor contact.

[0007] In order to achieve the above object, the utility model is implemented through the following technical solutions:

[0008] A butterfly device testing device includes: a base plate, a support seat, a locking assembly, a test assembly, and a heat sink. The support seat is mounted on the base plate and is provided with a mounting groove for placing the butterfly device to be tested; the locking assembly is hinged to the support seat, the locking assembly faces the support seat, and the butterfly device to be tested is fixed in the mounting groove by the rotation of the locking assembly; the test assembly is connected to the base plate and is electrically connected to the support seat; the heat sink is connected to the side of the base plate away from the support seat.

[0009] Furthermore, the locking assembly includes: a clamping block and a buckle. The clamping block is rotatably mounted on the support seat, and the clamping block rotates toward the butterfly device to be tested to abut against the pin to be tested of the butterfly device; the buckle is rotatably mounted on an end of the support seat away from the clamping block, and when the buckle rotates toward the butterfly device to be tested, the buckle engages with the clamping block to limit the rotation of the clamping block to fix the butterfly device to be tested.

[0010] Furthermore, the locking assembly further comprises: a fixing block which is mounted on the buckle, the pressing block is provided with a groove corresponding to the fixing block, and the fixing block slides into the groove to fix the relative position between the pressing block and the buckle.

[0011] Furthermore, a plurality of connection ports are provided on the bottom plate.

[0012] Furthermore, a limiting groove is provided on the bottom plate, and a plurality of positioning holes are provided in the limiting groove for fixing the butterfly-shaped device to be tested, and the two supporting seats are respectively installed on both sides of the limiting groove.

[0013] Furthermore, the test assembly includes: a lead pin. A plurality of test slots are provided in the installation slot, the lead pin is connected to the test slot, and the pin to be tested of the butterfly device abuts against the lead pin.

[0014] Furthermore, the test assembly further comprises: two groups of connectors, a connecting sleeve, and a connecting inner core. The two groups of connectors are respectively installed on both sides of the bottom plate; the connecting sleeve cover is arranged outside the connector; and the connecting inner core is inserted into the connector.

[0015] A butterfly device testing device provided by an embodiment of the utility model improves the stability of fixing the butterfly device to be tested by opening a mounting groove on the support base, and fixes the relative position between the butterfly device to be tested and the support base by hingedly connecting the locking assembly to the support base and cooperating with the mounting groove, thereby improving the accuracy of installation and positioning, and further improving the stability of the test; by electrically connecting the test assembly to the support base, the oxidation and aging problems caused by the wire connection are reduced, thereby improving the service life of the device; by installing a heat sink on the bottom plate, the influence of temperature on the device during the test is reduced, thereby improving the test accuracy and service life of the device. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0017] Figure 1 A schematic diagram of the installation structure of a butterfly device testing device and a butterfly device to be tested provided by an embodiment of the utility model;

[0018] Figure 2 A schematic diagram of the structure of a butterfly device testing device provided by an embodiment of the utility model;

[0019] Figure 3 A side view of a butterfly device testing device provided by an embodiment of the utility model;

[0020] Figure 4 A top view of a butterfly device testing device provided in an embodiment of the utility model.

[0021] In the figure:

[0022] 10-base plate; 21-support seat; 211-installation slot; 101-heat sink; 22-pressing block; 23-clip; 231-fixing block; 221-groove; 31-connector; 32-connecting sleeve; 33-connecting inner core; 102-connecting port; 103-limiting slot; 104-positioning hole; 34-lead pin; 212-test slot. DETAILED DESCRIPTION

[0023] The embodiments of the present application are described in detail below with reference to the accompanying drawings.

[0024] In the description of the present application, it should be understood that the terms "center", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0025] The terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, unless otherwise specified, "plurality" means two or more.

[0026] In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be welding, bolt connection, or riveting; it can be fixed connection, detachable connection, or integral connection; it can be mechanical connection or electrical connection; it can be directly connected or indirectly connected through an intermediate medium, or it can be internal communication between two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0027] Example:

[0028] Please refer to Figure 1 and Figure 2 As shown, this embodiment provides a butterfly device test device, including: a base plate 10, a support seat 21, a locking assembly, a test assembly, and a heat sink 101. The support seat 21 is installed on the base plate 10, and is provided with a mounting groove 211 for placing the butterfly device to be tested; the locking assembly is hinged to the support seat 21, and the locking assembly rotates toward the support seat 21 to fix the butterfly device to be tested in the mounting groove 211; the test assembly is connected to the base plate 10, and is electrically connected to the support seat 21; the heat sink 101 is connected to the side of the base plate 10 away from the support seat 21.

[0029] In this embodiment, if Figure 1As shown, a fixed space is formed between the two support seats 21, and the butterfly device to be tested is placed in the fixed space. The pins on both sides of the butterfly device to be tested are respectively placed in the mounting grooves 211 of the two support seats 21, and leads are arranged between the bottom of the mounting grooves 211 and the bottom of the support seat 21. The test component is mounted on the base plate 10, and the base plate 10 is placed horizontally. The test component and the fixed component are mounted on the upper surface of the base plate 10. The electrical connection between the test component and the support seat 21 is achieved by etching a circuit on the base plate 10, and the pins of the butterfly device to be tested are connected to the test component through the leads on the support seat 21. The relative position of the pins in the mounting grooves 211 is fixed by abutting the locking component with the pins, so as to reduce the damage to the test device caused by welding. The heat sink 101 can be specifically made of aluminum alloy and mounted on the back of the base plate 10. The heat sink 101 is fixed under the base plate 10 by copper column bolts to guide the heat generated by the device during the test, reduce the oxidation of components on the device caused by heat, and improve the service life and test accuracy.

[0030] Further, in some implementations of this embodiment, Figures 1 to 4 As shown, the locking assembly includes: a clamping block 22 and a buckle 23. The clamping block 22 is rotatably mounted on the support seat 21, and the clamping block 22 rotates toward the butterfly device to be tested to abut against the pin to be tested of the butterfly device; the buckle 23 is rotatably mounted on the end of the support seat 21 away from the clamping block 22, and when the buckle 23 rotates toward the butterfly device to be tested, the buckle 23 clamps the clamping block 22 to limit the rotation of the clamping block 22 to fix the butterfly device to be tested.

[0031] In this embodiment, if Figure 1 As shown, the clamping block 22 is rotatably installed on one side of the support seat 21, and the buckle 23 is rotatably installed on the other side of the support seat 21. The clamping block 22 is first rotated to abut against the pin, and then the buckle 23 is rotated to fix the relative position between the clamping block 22 and the support seat 21. By installing the support seat 21, the clamping block 22 and the buckle 23 on both sides respectively, the poor contact caused by direct pressure on the butterfly device is reduced, the reliability of the fixation is improved, and thus the test accuracy is improved.

[0032] Further, in some implementations of this embodiment, Figures 1 to 4 As shown, the locking assembly further includes a fixing block 231 . The fixing block 231 is mounted on the buckle 23 , and a groove 221 corresponding to the fixing block 231 is formed on the pressing block 22 . The fixing block 231 slides into the groove 221 to fix the relative position between the pressing block 22 and the buckle 23 .

[0033] In this embodiment, if Figure 2As shown, the fixed block 231 is a limit block with a certain elasticity, which can be specifically made of plastic or rubber. By pressing the fixed block 231 into the groove 221, the rotation of the clamping block 22 relative to its own rotation axis is limited, thereby pressing the pin and the mounting groove 211, reducing the poor contact problem between the pin and the mounting groove 211. The installation of the fixed block 231 improves the stability of the clamping block 22.

[0034] Further, in some implementations of this embodiment, Figures 1 to 4 As shown, a plurality of connection ports 102 are formed on the bottom plate 10 .

[0035] In this embodiment, if Figure 4 As shown, the connection port 102 is specifically a test interface. By directly etching a circuit on the base plate 10 , multiple connection ports 102 are connected to the support base 21 through a circuit, thereby achieving communication and signal transmission between the base plate 10 and the support base 21 .

[0036] Further, in some implementations of this embodiment, Figures 1 to 4 As shown, a limiting groove 103 is provided on the bottom plate 10 , and a plurality of positioning holes 104 are provided in the limiting groove 103 for fixing the butterfly-shaped device to be tested. Two support seats 21 are respectively installed on both sides of the limiting groove 103 .

[0037] In this embodiment, if Figure 4 As shown, the limit groove 103 is a rectangular groove located in a fixed space, and a positioning hole 104 is opened in the limit groove 103. After the butterfly device is installed in the limit groove 103, the main body of the butterfly device can be fixed in the limit groove 103 by installing a fixing pin or a limit column to limit its sliding relative to the base plate 10.

[0038] Further, in some implementations of this embodiment, Figures 1 to 4 As shown, the test assembly includes: a lead pin 34. A plurality of test slots 212 are provided in the installation slot 211. The lead pin 34 is connected to the test slot 212, and the pin to be tested of the butterfly device abuts against the lead pin 34.

[0039] In this embodiment, if Figure 4 As shown, the test slot 212 is a strip slot parallel to the pin of the butterfly device, and multiple test slots 212 are spaced apart in the mounting slot 211 along a direction perpendicular to the strip slot. The bottom surface of the mounting slot 211 is clamped with a metal sheet, specifically a copper sheet. A through hole is opened in the test slot 212, and the lead pin 34 is fixed in the through hole. One end of the lead pin 34 abuts against the metal sheet in the test slot 212, and the other end abuts against the circuit on the base plate 10, thereby connecting the pin of the butterfly device with the base plate 10 and even the test component.

[0040] Further, in some implementations of this embodiment, Figures 1 to 4 As shown, the test assembly also includes: two groups of connectors 31, a connecting sleeve 32, and a connecting inner core 33. The two groups of connectors 31 are respectively installed on both sides of the bottom plate 10; the connecting sleeve 32 is covered outside the connector 31; and the connecting inner core 33 is penetrated inside the connector 31.

[0041] In this embodiment, if Figure 2 As shown, each group of connectors 31 has four connectors 31, which are spaced apart on the side of the base plate 10. The connectors 31 are snapped onto the side of the base plate 10. The connecting inner core 33 is externally connected to the positive pole of the power supply by installing a center pin on the inner core, and is internally fixed to the base plate 10 by welding, and is connected to the etched circuit on the base plate 10. The connecting sleeve 32 is externally connected to the negative pole of the power supply or is grounded, and is internally fixed to the base plate 10 by welding, and is connected to the etched circuit on the base plate 10.

[0042] To sum up, in the process of using a butterfly device testing device to test a butterfly device, the movement of the butterfly device relative to the device is limited by opening a limit groove 103 and a positioning hole 104, and then the clamping block 22 and the buckle 23 are rotated to fix the pin in the test slot 212, and the pin is connected to the etched circuit on the base plate 10 by arranging a lead pin 34 in the support seat 21, and the grounding effect of the device is improved through the connector 31. By installing the heat sink 101, the influence of heat on the device and the butterfly device to be tested is reduced, thereby improving the test accuracy of the device and increasing the service life of the device.

[0043] The above is only a specific implementation of the utility model, but the protection scope of the utility model is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope recorded in the utility model, which should be included in the protection scope of the utility model. Therefore, the protection scope of the utility model should be based on the protection scope of the claims.

Claims

1. A butterfly device testing device, characterized in that: include: Bottom plate (10); A support seat (21) is mounted on the bottom plate (10) and is provided with a mounting groove (211) for placing a butterfly-shaped device to be tested; A locking assembly is hinged to the support seat (21), and the locking assembly is rotated toward the support seat (21) to fix the butterfly-shaped device to be tested in the installation groove (211); A test assembly connected to the base plate (10) and electrically connected to the support seat (21); A heat dissipation plate (101) is connected to a side of the bottom plate (10) facing away from the support seat (21).

2. A butterfly device testing device according to claim 1, characterized in that: The locking assembly comprises: A pressing block (22) is rotatably mounted on the support seat (21), and the pressing block (22) rotates toward the butterfly device to be tested to abut against the pin to be tested of the butterfly device; The buckle (23) is rotatably mounted on one end of the support seat (21) away from the clamping block (22); when the buckle (23) rotates toward the butterfly-shaped device to be tested, the buckle (23) is clamped on the clamping block (22) to limit the rotation of the clamping block (22) and fix the butterfly-shaped device to be tested.

3. A butterfly device testing device according to claim 2, characterized in that: The locking assembly also includes: A fixing block (231) is mounted on the buckle (23); a groove (221) corresponding to the fixing block (231) is provided on the pressing block (22); the fixing block (231) slides into the groove (221) to fix the relative position between the pressing block (22) and the buckle (23).

4. A butterfly device testing device according to claim 3, characterized in that: The bottom plate (10) is provided with a plurality of connection openings (102).

5. A butterfly device testing device according to claim 4, characterized in that: The bottom plate (10) is provided with a limiting groove (103), a plurality of positioning holes (104) are provided in the limiting groove (103), and the plurality of positioning holes (104) are used to fix the butterfly-shaped device to be tested, and the two support seats (21) are respectively installed on both sides of the limiting groove (103).

6. A butterfly device testing device according to claim 5, characterized in that: The test components include: A lead pin (34), wherein a plurality of test slots (212) are provided in the installation slot (211), the lead pin (34) is connected to the test slot (212), and the pin to be tested of the butterfly device is in contact with the lead pin (34).

7. A butterfly device testing device according to claim 6, characterized in that: The test component also includes: Two groups of connectors (31) are respectively installed on two sides of the base plate (10); A connecting sleeve (32) is disposed outside the connector (31); The connecting inner core (33) is inserted into the connector (31).

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