Multi-model probe type single lamp aging clamp

Abstract

The utility model relates to a multi-model probe type single lamp aging clamp, which comprises an ejector pin body, a first adjusting layer and a second adjusting layer, and is characterized in that the first adjusting layer comprises a probe adjusting layer body, and the ejector pin body is movably connected to the probe adjusting layer body; the probe adjusting layer body is also provided with an ejector pin top plate used for driving the ejector pin body to move on the probe adjusting layer body. The second adjusting layer comprises a clamping plate layer body and a clamping plate body movably connected to the clamping plate layer body, a cavity located above the ejector pin body is formed in the clamping plate layer body, and a lamp bead containing cavity is formed between the inner wall of the cavity and the side wall of the clamping plate body. According to the utility model, the ejector pin body can be driven to move by arranging the ejector pin top plate, and the clamping plate body can move on the clamping plate body to change the size of the lamp bead accommodating cavity, so that the device can be compatible with various types of lamp beads, the adaptability is increased, the financial resources are saved, the lamp beads do not need to be welded when the lamp beads are tested, and the tested lamp beads can be recycled.

Description

Technical Field

[0001] The present application relates to the field of LED aging testing, and in particular to a multi-model probe-type single-lamp aging fixture. Background Art

[0002] At present, the development of the semiconductor industry is changing with each passing day. With the continuous research of Light Emitting Diode (LED) technology, the performance of LED lamp beads tends to be small in size, low in energy consumption, long in life, etc. Before the new LED lamp beads are put into use, they need to be subjected to conventional aging, accelerated aging and light aging tests. However, the sizes of lamp beads are diverse. In terms of use alone, there are differences between indoor lamp beads and outdoor lamp beads. The existing single-lamp aging tests are all welded on the plum blossom plate. The size of the lamp bead and the size of the test fixture need to correspond to each other during the test. In actual operation, it is often necessary to make test fixtures of specific sizes for different types of lamp beads, which causes a waste of resources and extremely low fixture adaptability. Utility Model Content

[0003] The present application provides a multi-model probe-type single-lamp aging fixture, which can solve the problem in the related art that test fixtures of specific sizes need to be made for different models of lamp beads and the fixture has low adaptability.

[0004] An embodiment of the present application provides a multi-model probe-type single-lamp aging fixture, which includes: a pin body, a first adjustment layer, and a second adjustment layer, wherein the first adjustment layer includes a probe adjustment layer body, the pin body is movably connected to the probe adjustment layer body, and the probe adjustment layer body is also provided with a pin ejector plate for driving the pin body to move on the probe adjustment layer body; the second adjustment layer includes a splint layer body and a splint body movably connected to the splint layer body, the splint layer body is provided with a cavity located above the pin body, and a lamp bead accommodating cavity is formed between the inner wall of the cavity and the side wall of the splint body.

[0005] In some embodiments, the probe adjustment layer body includes: a probe adjustment layer base plate and a probe adjustment layer cover plate, wherein the probe adjustment layer cover plate is arranged above the probe adjustment layer base plate, and the ejector pin ejector plate is movably connected between the probe adjustment layer cover plate and the probe adjustment layer base plate; wherein both the probe adjustment layer cover plate and the probe adjustment layer base plate are provided with installation grooves, and the ejector pin body is penetrated into the installation grooves.

[0006] In some embodiments, the mounting groove includes: a through groove and a through hole, the probe adjustment layer cover plate and the probe adjustment layer bottom plate are both provided with a through groove, and the through groove is configured as: its size is larger than the ejector body so that the ejector body can be movably connected to the inside of the through groove; the probe adjustment layer cover plate and the probe adjustment layer bottom plate are both provided with a through hole, and the through hole is configured as: for the ejector body to pass through, and to limit the ejector body from moving circumferentially along the ejector body.

[0007] In some embodiments, at least two ejector plates are provided and stacked on the probe adjustment layer body, wherein a portion of the ejector plates is used to drive the ejector body to move in a first direction, and another portion of the ejector plates is used to move the ejector body in a second direction, and the first direction is perpendicular to the second direction.

[0008] In some embodiments, the ejector body is slidably connected to the ejector ejector plate.

[0009] In some embodiments, the second adjustment layer includes: a plywood layer bottom plate and a plywood layer cover plate, wherein the plywood layer cover plate is disposed above the plywood layer bottom plate, and the plywood body is movably connected between the plywood layer cover plate and the plywood layer bottom plate; wherein both the plywood layer cover plate and the plywood layer bottom plate are provided with cavities.

[0010] In some embodiments, a slide groove is provided on the inner wall of the cavity on the bottom plate of the plywood layer, and the plywood body is slidably connected in the slide groove.

[0011] In some embodiments, a spring mounting hole is provided on the inner wall of the cavity on the bottom plate of the plywood layer. The spring mounting hole is arranged adjacent to the slide groove, and a spring is arranged in the spring mounting hole.

[0012] In some embodiments, the slide groove includes a first slide groove and a second slide groove, and the first slide groove and the second slide groove are respectively opened on two adjacent wall surfaces of the inner wall of the cavity;

[0013] The bottom wall of the first chute is located above the bottom wall of the second chute;

[0014] The clamping plate body comprises a first clamping plate slidably connected to the inside of the first sliding groove and a second clamping plate slidably connected to the inside of the second sliding groove, and a lamp bead accommodating cavity is formed between the first clamping plate, the second clamping plate and the cavity.

[0015] In some embodiments, an anti-tilt member is provided on the ejector body.

[0016] The beneficial effects brought by the technical solution provided in the embodiments of the present application include:

[0017] The embodiment of the present application provides a multi-model probe-type single-lamp aging fixture, which can drive the ejector body to move by setting an ejector pin and an ejector plate, and can move the splint body on the splint layer body to change the size of the lamp bead accommodating cavity, so that the device can be compatible with multiple models of lamp beads, increase adaptability, save financial resources, and at the same time, there is no need to weld the lamp beads when testing them, so that the tested lamp beads can be recycled. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0019] Figure 1 A schematic diagram of the overall structure provided for an embodiment of the present application;

[0020] Figure 2 A schematic diagram of the structure of the probe adjustment layer base plate provided in an embodiment of the present application;

[0021] Figure 3 A schematic diagram of the structure of the probe adjustment layer bottom plate and the ejector pin top plate provided in an embodiment of the present application;

[0022] Figure 4 A schematic diagram of the structure of the first adjustment layer provided in an embodiment of the present application;

[0023] Figure 5 An exploded view of the first adjustment layer and the plywood layer bottom plate provided in an embodiment of the present application;

[0024] Figure 6 A schematic diagram of the structure of the first adjustment layer and the sandwich layer bottom plate provided in an embodiment of the present application;

[0025] Figure 7 A schematic diagram of the structure of the first adjustment layer, the plywood body and the plywood layer bottom plate provided in an embodiment of the present application;

[0026] Figure 8 A schematic diagram of the structure of the clamp body provided in the embodiment of the present application;

[0027] Fig. 9 This is a schematic diagram of the ejector body structure provided in an embodiment of the present application.

[0028] In the figure: 1. probe adjustment layer bottom plate; 10. through groove; 11. through hole; 2. probe adjustment layer cover plate; 3. ejector body; 30. groove; 4. ejector top plate; 5. splint layer bottom plate; 50. first slide groove; 51. second slide groove; 6. splint body; 60. handle; 61. spring mounting hole; 7. splint layer cover plate; 70. adjustment groove; 71. lamp bead accommodating cavity; 8. threaded hole. DETAILED DESCRIPTION

[0029] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0030] The embodiment of the present application provides a multi-model probe-type single-lamp aging fixture, which can solve the problem in the related art that test fixtures of specific sizes need to be made for different models of lamp beads and the fixture has low adaptability.

[0031] See also Figures 1 to 9 The embodiment of the present application provides a multi-model probe-type single-lamp aging fixture, which includes: a pin body 3, a first adjustment layer and a second adjustment layer, the first adjustment layer includes a probe adjustment layer body, the pin body 3 is movably connected to the probe adjustment layer body, and the probe adjustment layer body is also provided with a pin ejector plate 4 for driving the pin body 3 to move on the probe adjustment layer body; the second adjustment layer includes a plywood layer body and a plywood body 6 movably connected to the plywood layer body, the plywood layer body is provided with a cavity located above the pin body 3, and a lamp bead accommodating cavity 71 is formed between the inner wall of the cavity and the side wall of the plywood body 6.

[0032] In the present application, by setting the ejector pin ejector plate 4, the ejector body 3 can be driven to move, and the splint body 6 can be moved on the splint layer body to change the size of the lamp bead accommodating cavity 71, so that the device can be compatible with multiple models of lamp beads, increase adaptability, save financial resources, and at the same time, there is no need to weld the lamp beads when testing the lamp beads, so that the tested lamp beads can be recycled.

[0033] The ejector body 3 is arranged on the first adjustment layer, and the position of the ejector body 3 can be adjusted by moving the ejector ejector plate 4; after the lamp bead is placed in the lamp bead accommodating cavity 71, the clamping plate body 6 is used to clamp the lamp bead. Since the lamp bead accommodating cavity 71 is arranged above the ejector body 3, the ejector body 3 can connect lamp beads of different models. The ejector body 3 can touch the lamp bead for testing, without manual welding, saving manpower and improving testing efficiency.

[0034] It should be noted that, in this embodiment, Figures 1 to 7 It represents a minimum unit of the fixture, which can measure 4 lamp beads of the same type at the same time, such as 1010 lamp beads. Figures 1 to 7 It is not drawn in the figure, but it has the same structure as this unit, and can test 4 1010 lamp beads or other types of lamp beads, such as 1212 lamp beads at the same time. In this way, multiple types of lamp beads can be tested simultaneously based on one fixture. In addition, each unit can be adjusted at will, not limited to testing a certain type of lamp beads.

[0035] Take this minimum unit as an example to illustrate:

[0036] On the basis of the above embodiments, in this embodiment, the probe adjustment layer body includes: a probe adjustment layer base plate 1, a probe adjustment layer cover plate 2, the probe adjustment layer cover plate 2 is arranged above the probe adjustment layer base plate 1, and the ejector pin ejector plate 4 is movably connected between the probe adjustment layer cover plate 2 and the probe adjustment layer base plate 1.

[0037] In this embodiment, the probe adjustment layer cover plate 2 and the probe adjustment layer bottom plate 1 are both provided with mounting grooves, and there are four mounting grooves on each of the probe adjustment layer cover plate 2 and the probe adjustment layer bottom plate 1. Threaded holes 8 are also provided on the probe adjustment layer cover plate 2 and the probe adjustment layer bottom plate 1. When the probe adjustment layer cover plate 2 is disposed above the probe adjustment layer bottom plate 1, the mounting grooves and threaded holes 8 on the probe adjustment layer cover plate 2 correspond to the mounting grooves and threaded holes 8 on the probe adjustment layer bottom plate 1, respectively.

[0038] The ejector body 3 is inserted into the mounting groove, that is, the ejector body 3 is inserted into the mounting groove on the probe adjustment layer cover plate 2 and then the top end thereof extends out from the mounting groove on the probe adjustment layer bottom plate 1 .

[0039] On the basis of the above embodiment, in this embodiment, the installation slot includes: a through slot 10 and a through hole 11. The through slot 10 is provided on both the probe adjustment layer cover plate 2 and the probe adjustment layer bottom plate 1. The through slot 10 is configured as follows: its size is larger than the ejector body 3 so that the ejector body 3 can be movably connected to the inside of the through slot 10. Further, in this embodiment, the through slot 10 is provided with two different shapes, see Figure 2 , Figure 3 and Figure 4Shown: The length and width dimensions of one type of through slot 10 are both larger than the diameter of the ejector pin body 3, enabling the ejector pin body 3 to move within the through slot 10 in the first direction, the second direction, and the axial direction of the ejector pin body 3. For another type of through slot 10, the length dimension is larger than the diameter of the ejector pin body 3, and the width dimension is equal to the diameter of the ejector pin body 3; according to the setting direction of the through slot 10 on the probe adjustment layer cover plate 2 and the probe adjustment layer bottom plate 1, the ejector pin body 3 can move within the through slot 10 in the first direction and the axial direction of the ejector pin body 3, or can move within the through slot 10 in the second direction and the axial direction of the ejector pin body 3. Wherein, the first direction is Figure 3 the X direction shown in Figure 3 and the second direction is Figure 2 、 Figure 3 and Figure 4 the shape of the through slot 10 shown is only for illustrative purposes, and the shape of the through slot 10 is not limited thereto.

[0040] In addition, through holes 11 are provided on both the probe adjustment layer cover plate 2 and the probe adjustment layer bottom plate 1. The through holes 11 are configured to allow the ejector pin body 3 to pass through and restrict the ejector pin body 3 from moving circumferentially along the ejector pin body 3. That is to say, the through holes 11 can be set as squares, or can also be set as circles or triangles, and it is necessary to ensure that the diameter of the inscribed circle of the through holes 11 is equal to the diameter of the ejector pin body 3.

[0041] In this embodiment, one through hole 11, one through slot 10 with both length and width dimensions larger than the diameter of the ejector pin body 3, and two through slots 10 with length dimensions larger than the diameter of the ejector pin body 3 are set as a group of installation slots, and the ejector pin body 3 is provided in the through hole 11 and the three through slots 10. It should be noted that this configuration form is not unique and is only for illustrative purposes in this embodiment. Since this fixture can measure 4 lamp beads of the same model simultaneously, four groups of installation slots are provided on both the probe adjustment layer cover plate 2 and the probe adjustment layer bottom plate 1.

[0042] Based on the above embodiment, in this embodiment, in order to enable the ejector pin top plate 4 to drive the ejector pin body 3 in the four groups of installation slots to move simultaneously, as shown in Figure 3 shown, the ejector pin top plate 4 is set as a "tu" shape. That is to say, the ejector pin top plate 4 includes two horizontal plates and one vertical plate. The two horizontal plates are connected by one vertical plate, and one horizontal plate can drive the ejector pin body 3 in the adjacent two groups of installation slots to move horizontally at the same time. The horizontal direction mentioned here refers to the first direction or the second direction.

[0043] Furthermore, at least two ejector pin top plates 4 are provided and are stacked on the probe adjustment layer body. A part of the ejector pin top plates 4 is used to drive the ejector pin body 3 to move in the first direction, and another part of the ejector pin top plates 4 is used for the ejector pin body 3 to move in the second direction, and the first direction is perpendicular to the second direction.

[0044] In the present embodiment, two ejector plates 4 are stacked and arranged, and the two ejector plates 4 are placed in different directions. The two horizontal plates of one ejector plate 4 are placed along the first direction, and the vertical plate is placed along the second direction. When the ejector plate 4 moves along the second direction, the two horizontal plates can simultaneously drive part of the ejector body 3 to move along the second direction; the two horizontal plates of the other ejector plate 4 are placed along the second direction, and the vertical plate is placed along the first direction. When the ejector plate 4 moves along the first direction, the two horizontal plates can simultaneously drive part of the ejector body 3 to move along the first direction.

[0045] Furthermore, the ejector body 3 is provided with a sliding connection with the ejector ejector plate 4. Specifically, the ejector body 3 that can move in the second direction is slidably connected with the transverse plate of the ejector ejector plate 4 that moves in the first direction, and the sliding direction of the ejector body 3 is the second direction; the ejector body 3 that can move in the first direction is slidably connected with the transverse plate of the ejector ejector plate 4 that moves in the second direction, and the sliding direction of the ejector body 3 is the first direction. With this arrangement, after the ejector body 3 moves, it can return to its original position through the movement of the ejector ejector plate 4.

[0046] In this embodiment, the ejector body 3 is set as an electromagnetic spring ejector, which is used to electrically connect with the lamp bead to be tested and play a conductive role. Springs are installed on the upper and lower spring grooves of the electromagnetic spring ejector to fix the electromagnetic spring ejector in the vertical direction. There is a compression force when it moves in the first and second directions. When the power is turned on, the electromagnetic controller controls the electromagnetic spring ejector to push upward to connect the lamp bead to be tested. Thrusters in the first and second directions are installed on different ejector ejector plates 4, respectively. Pushing the thrusters causes the ejector ejector plate 4 to push the electromagnetic spring ejector to move to the appropriate position in the first and second directions, thereby adjusting it to the size suitable for the lamp bead to be tested.

[0047] Furthermore, the ejector body 3 is provided with an anti-tilting member. Specifically, the anti-tilting member is a fixing rope, and a groove 30 is provided on the wall of the ejector body 3. Fig. 9 As shown, two upper and lower grooves 30 are provided on the wall of the electromagnetic spring ejector pin for hooping two fixing ropes. When the electromagnetic spring ejector pin contracts up and down, since the electromagnetic spring ejector pin is movable in the first direction and the second direction, the spring in the electromagnetic spring ejector pin expands and contracts, which may cause adjacent electromagnetic spring ejectors to no longer be in a parallel state. Therefore, the two adjacent electromagnetic spring ejectors can be pulled in parallel by the fixing rope to prevent the electromagnetic spring ejector pin from being skewed.

[0048] On the basis of the above embodiment, in this embodiment, the second adjustment layer includes: a plywood layer bottom plate 5 and a plywood layer cover plate 7 .

[0049] Specifically, the plywood layer cover plate 7 is arranged above the plywood layer bottom plate 5, and the plywood layer bottom plate 5 is arranged above the probe adjustment layer cover plate 2; threaded holes 8 are also opened on the plywood layer cover plate 7 and the plywood layer bottom plate 5. When the plywood layer cover plate 7, the plywood layer bottom plate 5, the probe adjustment layer cover plate 2, and the probe adjustment layer bottom plate 1 are stacked, the threaded holes 8 thereon correspond, and the plywood layer cover plate 7, the plywood layer bottom plate 5, the probe adjustment layer cover plate 2, and the probe adjustment layer bottom plate 1 can be connected and fixed by passing bolts through the threaded holes 8.

[0050] Furthermore, the splint body 6 is movably connected between the splint layer cover plate 7 and the splint layer bottom plate 5; wherein, the splint layer cover plate 7 and the splint layer bottom plate 5 are both provided with cavities. That is, a lamp bead accommodating cavity 71 is formed between the side wall of the splint body 6 and the cavities on the splint layer cover plate 7 and the splint layer bottom plate 5, and the size of the lamp bead accommodating cavity 71 can be adjusted when the splint body 6 is movable. It should be noted that the cavity on the splint layer bottom plate 5 is semi-open, that is, the depth of the cavity is less than the thickness of the splint layer bottom plate 5, and a through groove 10 and a through hole 11 are also provided on the bottom wall of the cavity on the splint layer bottom plate 5, and the through groove 10 and the through hole 11 correspond to the through groove 10 and the through hole 11 on the probe adjustment layer bottom plate 1 and the probe adjustment layer cover plate 2, so that the top end of the ejector body 3 can pass through the splint layer bottom plate 5. The cavity on the plywood layer cover plate 7 penetrates the plywood layer cover plate 7, so that the ejector body 3 and the lamp bead to be tested can be connected after passing through the cavity.

[0051] Furthermore, a slide groove is provided on the inner wall of the cavity on the bottom plate 5 of the plywood layer, and the plywood body 6 is slidably connected in the slide groove. In order to adjust the size of the lamp bead accommodating cavity 71 in the first direction and the second direction when the plywood body 6 is movable, the plywood body 6 is provided to include a first plywood and a second plywood. The first plywood and the second plywood are provided in different directions: one is provided along the first direction and can be moved along the second direction; the other is provided along the second direction and can be moved along the first direction.

[0052] On this basis, the slide groove includes a first slide groove 50 and a second slide groove 51, and the first slide groove 50 and the second slide groove 51 are respectively opened on two adjacent wall surfaces of the inner wall of the cavity. Therefore, the clamp body 6 includes a first clamp slidably connected to the inside of the first slide groove 50 and a second clamp slidably connected to the inside of the second slide groove 51. In this embodiment, the bottom wall of the first slide groove 50 is arranged above the bottom wall of the second slide groove 51, that is, the first clamp in the first slide groove 50 is arranged above the second clamp in the second slide groove 51.

[0053] A first clamping plate and a second clamping plate are disposed in each cavity, and a lamp bead accommodating cavity 71 is formed by the first clamping plate, the second clamping plate and the cavity. It should be noted that the length of the first clamping plate in the first slide groove 50 that can be moved is greater than the length of the first clamping plate in the second direction, and the length of the second clamping plate in the second slide groove 51 that can be moved is greater than the length of the second clamping plate in the first direction, so that the first clamping plate and the second clamping plate have sufficient moving space.

[0054] On the basis of the above-mentioned embodiment, in this embodiment, a spring mounting hole 61 is opened on the inner wall of the cavity on the sandwich layer bottom plate 5 , the spring mounting hole 61 is arranged adjacent to the slide groove, and a spring is arranged in the spring mounting hole 61 .

[0055] A spring mounting hole 61 is provided on the first clamping plate and the inner wall of the cavity adjacent to the first slide slot 50, that is, the spring mounting hole 61 is provided on the inner wall of the cavity provided with the second slide slot 51, so that the spring is installed between the first clamping plate and the spring mounting hole 61; a spring mounting hole 61 is provided on the second clamping plate and the inner wall of the cavity adjacent to the second slide slot 51, that is, the spring mounting hole 61 is provided on the inner wall of the cavity provided with the first slide slot 50, so that the spring is installed between the second clamping plate and the spring mounting hole 61. After the first clamping plate and the second clamping plate move, the elastic deformation of the spring drives the first clamping plate and the second clamping plate to clamp the lamp beads or return to their original positions.

[0056] Furthermore, a handle 60 is fixed on the splint body 6 , and an adjustment slot 70 is also provided on the splint layer cover 7 . The handle 60 passes through the adjustment slot 70 . When the handle 60 is driven to move in the adjustment slot 70 , the handle 60 drives the splint body 6 to move.

[0057] In summary, when the device is in use, the ejector plate 4 is adjusted according to the size of the lamp bead to be tested, and a thruster is installed on the probe top plate, which can drive the probe top plate to push the electromagnetic spring ejector to move to a suitable position in the first direction and the second direction, ensuring that the four electromagnetic spring ejectors can fully contact the pins of a lamp bead; adjust the handle 60 of the splint body 6, and turn on the switch of the ejector body 3 after the spring connected to the splint body 6 expands and fixes the lamp bead, and control the electromagnetic spring ejector to contract through the electromagnetic controller, and eject the electromagnetic spring ejector to make the lamp bead to be tested conductive, and perform an aging test.

[0058] The present application does not require manual welding of the lamp bead to be tested to the plum blossom switch, thus solving the problem that all current products require welding and cannot be reused. In addition, the test fixture has adjustable size and is applicable to multiple models, thus reducing costs.

[0059] In the description of the present application, it should be noted that the terms "upper", "lower", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. Unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be a connection between the two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to the specific circumstances.

[0060] It should be noted that, in this application, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

[0061] The above description is only a specific implementation of the present application, so that those skilled in the art can understand or implement the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest range consistent with the principles and novel features applied for herein.

Claims

1. A multi-model probe-type single-lamp aging fixture, characterized in that: It includes: Ejector body (3); A first adjustment layer, the first adjustment layer comprising a probe adjustment layer body, the ejector body (3) being movably connected to the probe adjustment layer body, and the probe adjustment layer body being further provided with an ejector plate (4) for driving the ejector body (3) to move on the probe adjustment layer body; The second adjustment layer comprises a plywood layer body and a plywood body (6) movably connected to the plywood layer body, the plywood layer body is provided with a cavity located above the ejector body (3), and a lamp bead accommodating cavity (71) is formed between the inner wall of the cavity and the side wall of the plywood body (6).

2. The multi-model probe-type single-lamp aging fixture as described in claim 1, characterized in that: The probe adjustment layer body comprises: Probe adjustment layer bottom plate (1); A probe adjustment layer cover plate (2), wherein the probe adjustment layer cover plate (2) is arranged above the probe adjustment layer bottom plate (1), and the ejector pin top plate (4) is movably connected between the probe adjustment layer cover plate (2) and the probe adjustment layer bottom plate (1); Wherein, the probe adjustment layer cover plate (2) and the probe adjustment layer bottom plate (1) are both provided with mounting grooves, and the ejector body (3) is inserted into the mounting grooves.

3. The multi-model probe-type single-lamp aging fixture as described in claim 2, characterized in that: The mounting slot comprises: A through groove (10), the probe adjustment layer cover plate (2) and the probe adjustment layer bottom plate (1) are both provided with a through groove (10), and the through groove (10) is configured such that: its size is larger than the ejector body (3), so that the ejector body (3) can be movably connected to the inside of the through groove (10); A through hole (11) is provided on the probe adjustment layer cover plate (2) and the probe adjustment layer bottom plate (1), and the through hole (11) is configured to allow the ejector body (3) to pass through and to limit the ejector body (3) from moving in the circumferential direction of the ejector body (3).

4. The multi-model probe-type single-lamp aging fixture as claimed in claim 1, characterized in that: At least two ejector plates (4) are provided and are stacked on the probe adjustment layer body, wherein a portion of the ejector plates (4) is used to drive the ejector body (3) to move in a first direction, and another portion of the ejector plates (4) is used to move the ejector body (3) in a second direction, wherein the first direction is perpendicular to the second direction.

5. The multi-model probe-type single-lamp aging fixture as claimed in claim 4, characterized in that: The ejector body (3) is slidably connected to the ejector ejector plate (4).

6. The multi-model probe-type single-lamp aging fixture as claimed in claim 1, characterized in that: The second adjustment layer comprises: plywood floor (5); A plywood layer cover plate (7), wherein the plywood layer cover plate (7) is arranged above the plywood layer bottom plate (5), and the plywood body (6) is movably connected between the plywood layer cover plate (7) and the plywood layer bottom plate (5); Wherein, cavities are provided on the plywood layer cover plate (7) and the plywood layer bottom plate (5).

7. The multi-model probe-type single-lamp aging fixture as claimed in claim 6, characterized in that: A sliding groove is provided on the inner wall of the cavity on the plywood layer bottom plate (5), and the plywood body (6) is slidably connected in the sliding groove.

8. The multi-model probe-type single-lamp aging fixture as claimed in claim 7, characterized in that: A spring mounting hole (61) is provided on the inner wall of the cavity on the sandwich layer bottom plate (5); the spring mounting hole (61) is arranged adjacent to the slide groove; and a spring is arranged in the spring mounting hole (61).

9. The multi-model probe-type single-lamp aging fixture as claimed in claim 7, characterized in that: The slide groove comprises a first slide groove (50) and a second slide groove (51), wherein the first slide groove (50) and the second slide groove (51) are respectively arranged on two adjacent wall surfaces of the inner wall of the cavity; The bottom wall of the first slide groove (50) is located above the bottom wall of the second slide groove (51); The clamping plate body (6) comprises a first clamping plate slidably connected to the inside of the first sliding groove (50) and a second clamping plate slidably connected to the inside of the second sliding groove (51), and a lamp bead accommodating cavity (71) is formed between the first clamping plate, the second clamping plate and the cavity.

10. The multi-model probe-type single-lamp aging fixture as claimed in claim 1, characterized in that: An anti-tilt piece is provided on the ejector body (3).

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