Probe test fixture

Abstract

The utility model discloses a probe test fixture which comprises a first test board and a second test board which are mutually covered together, a plurality of first through holes are arranged on the first test board, the first through holes are arranged at intervals according to a preset distance, test pieces are arranged in the first through holes, and the test pieces are arranged on the second test board. A plurality of first through holes are formed in the first test plate, the test piece is borne in the first through holes by the first test plate, a plurality of second through holes are formed in the second test plate, the second through holes are arranged at intervals according to a preset distance, and the positions of the first through holes correspond to the positions of the second through holes; and the test piece is provided with an embedding part which can be embedded and fixed with the probe. No conductive adhesive is needed between the probe and the test piece, so that the connection resistance between the probe and the test piece is lower, the test is more accurate, the service life of mechanical connection is better than the environment applicability of the conductive adhesive, and the stability of connection is not influenced due to the attenuation of the service life of the conductive adhesive.

Description

Technical Field

[0001] The utility model relates to the field of probe test fixtures, and more specifically, to a probe test fixture. Background Art

[0002] After the production of probes, it is usually necessary to test the electrical performance of the probes. Therefore, it is necessary to introduce a test fixture to place the probes on the fixture at the same time and make contact with the test piece, so that the test can be completed.

[0003] In order to ensure the electrical connectivity between the probe and the test piece, conductive glue is usually applied to the tip of the probe. However, applying conductive glue will first cause overflow or residue during the test, which is difficult to completely remove. This may interfere with subsequent tests and affect the accuracy and repeatability of the tests. Secondly, the components of the conductive glue itself may contain some tiny impurity particles. If these impurities transfer to the surface of the probe or the object under test during the test, it may affect the conductive performance or cause problems such as short circuits. Finally, if used improperly or the thickness of the conductive glue is too large, it may impose certain restrictions on the elasticity of the probe, affecting the stability of its contact pressure and contact resistance. Summary of the Utility Model

[0004] In order to solve the above problems, the utility model provides a probe test fixture, which includes a first test board and a second test board that are covered with each other. A plurality of first through holes are arranged on the first test board, and the first through holes are arranged at intervals according to a preset distance. A test piece is arranged in the first through hole, and the test piece is carried by the first test board in the first through hole. A plurality of second through holes are arranged on the second test board, and the second through holes are arranged at intervals according to a preset distance, and the positions of the first through holes correspond to the positions of the second through holes. The test piece passes through the second through hole, and a fitting part that can be fitted and fixed with the probe is arranged on the test piece.

[0005] Furthermore, the test piece includes a connecting pipe and a probe head. The top of the connecting pipe is hollow, the probe head is arranged inside the top of the connecting pipe, and the fitting part is arranged at the bottom of the connecting pipe. When the test piece is carried by the first test board in the first through hole, the fitting part is arranged in the first through hole, and the probe head passes through the second through hole and extends out of the second test board.

[0006] Furthermore, the fitting part includes an integrally formed continuous convex part and concave part.

[0007] Furthermore, a concave part is arranged on the top of the first test board, and the first through hole is arranged on the concave part.

[0008] Furthermore, a limiting ring protrudes outward on the outer wall of the connecting pipe, and the inner diameters of the first through hole and the second through hole are both smaller than the inner diameter of the limiting ring.

[0009] Furthermore, a plurality of first grooves are provided around the concave portion, first positioning members are arranged in the first grooves, and third through holes corresponding to the positions of the first positioning members are provided on the second test board.

[0010] Furthermore, a fourth through hole is provided on the first positioning member, a fifth through hole corresponding to the position of the fourth through hole is provided on the side surface of the first test board, a second positioning member is provided on the first test board, and the second positioning member sequentially passes through the fifth through hole and the fourth through hole to fix the first positioning member in the first groove.

[0011] Furthermore, a second groove is provided in the concave portion, the second groove communicates with the first groove, and the second positioning member is arranged in the second groove after sequentially passing through the fifth through hole and the fourth through hole.

[0012] Compared with the prior art, the beneficial effects of the present utility model are as follows:

[0013] Since the connection between the probe and the test piece is changed to a mechanical connection, the connection between the probe and the test piece can be made more stable. Therefore, there is no longer a need for conductive adhesive between the two, resulting in a lower connection resistance between them, and thus making the test more accurate. At the same time, the service life and environmental adaptability of the mechanical connection are superior to those of the conductive adhesive, and the stability of the connection will not be affected by the attenuation of the service life of the conductive adhesive.

[0014] The additional aspects and advantages of the present utility model will be given in the following description part, and some will become obvious from the following description, or will be understood through the practice of the present utility model. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions in the embodiments of the present utility model or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present utility model. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0016] Figure 1 It is a schematic diagram of the overall structure of the present utility model;

[0017] Figure 2 It is a schematic diagram of the structure of the test piece of the present utility model;

[0018] Figure 3 It is a schematic diagram of the structure of the first test board of the present utility model;

[0019] Figure 4 It is a schematic structural view of the second test board of the present utility model;

[0020] Figure 5 It is a sectional view of the assembly between the test piece of the present utility model and the first test board and the second test board;

[0021] The reference numerals and names in the figure are as follows:

[0022] The first test board 100, the second test board 200, the first through hole 110, the test piece 300, the second through hole 210, the fitting portion 310, the connecting pipe 320, the probe 330, the protruding portion 311, the recessed portion 312, the concave portion 120, the limiting ring 321, the first groove 130, the first positioning member 140, the third through hole 220, the fourth through hole 141, the fifth through hole 150, the second positioning member 160, the second groove 170. Detailed implementation manners

[0023] Next, the technical solutions in the embodiments of the present utility model will be described clearly and completely. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without making creative efforts shall fall within the protection scope of the present utility model.

[0024] A more detailed description of the present utility model will be given. It should be understood that the specific embodiments described herein are only used to explain the present utility model and are not used to limit the present utility model. It should be noted that when an element is expressed as "fixed to" another element, it can be directly on the other element, or there can be one or more intermediate elements therebetween. When an element is expressed as "connected to" another element, it can be directly connected to the other element, or there can be one or more intermediate elements therebetween.

[0025] In the description of the present utility model, it should be noted that the orientation or positional relationship indicated by orientation words such as "front, rear, upper, lower, left, right", "lateral, vertical, perpendicular, horizontal" and "top, bottom", etc. is usually based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present utility model and simplifying the description. Without contrary description, these orientation words do not indicate and imply that the device or component referred to must have a specific orientation or be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation on the protection scope of the present utility model; the orientation words "inside, outside" refer to the inside and outside relative to the contour of each component itself. In the description of the present utility model, it should be noted that the use of words such as "first", "second", etc. to limit the components is only for the convenience of distinguishing the corresponding components. Without additional statement, the above words have no special meaning. Therefore, it should not be construed as a limitation on the protection scope of the present utility model. In the description of the embodiments of the present application, the meaning of "a plurality of" is two or more, unless otherwise specifically defined.

[0026] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by those of ordinary skill in the technical field to which the present utility model belongs. The terms used in this specification in the description of the present utility model are only for the purpose of describing specific embodiments and are not used to limit the present utility model.

[0027] In addition, the technical features involved in different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0028] Now, with reference to the drawings, a further description will be made of the preferred embodiments of the present utility model, in combination with Figure 1 and Figure 5As shown, the probe test fixture includes a first test board 100 and a second test board 200 that are covered with each other. The first test board 100 and the second test board 200 are generally made of insulating materials. A number of first through holes 110 are arranged on the first test board 100, and the first through holes 110 are arranged at intervals according to a preset distance. A test piece 300 is arranged in the first through hole 110, and the test piece 300 is carried by the first test board 100 in the first through hole 110. A number of second through holes 210 are arranged on the second test board 200, and the second through holes 210 are arranged at intervals according to a preset distance, and the positions of the first through holes 110 correspond to the positions of the second through holes 210. The test piece 300 passes through the first through hole 110 and the second through hole 210 at the same time, and a fitting portion 310 that can be fitted and fixed with a probe is arranged on the test piece 300. During the test, the diamond protrusion at the head of the probe forms a fitting and fixing with the fitting portion 310 of the test piece 300, and then the test piece 300 is pushed out of the second through hole 210, so that the test can be completed. Compared with the prior art, since the connection between the probe and the test piece 300 is changed to a mechanical connection, the connection between the probe and the test piece 300 can be made more stable. Therefore, no conductive adhesive is needed between the two, so that the connection resistance between the two is lower, and the test is more accurate. At the same time, the service life and environmental adaptability of the mechanical connection are better than those of the conductive adhesive, and the stability of the connection will not be affected by the attenuation of the service life of the conductive adhesive.

[0029] Furthermore, on the basis of the above embodiment, as Figure 2 shown, the test piece 300 includes a connecting pipe 320 and a probe head 330. The top of the connecting pipe 320 is hollow, and the probe head 330 is arranged inside the top of the connecting pipe 320. A spring (not shown in the figure) is arranged between the probe head 330 and the connecting pipe 320, so that the probe head 330 can perform telescopic movement at the top of the connecting pipe 320. The fitting portion 310 is arranged at the bottom of the connecting pipe 320. When the test piece 300 is carried by the first test board 100 in the first through hole 110, the fitting portion 310 is arranged in the first through hole 110, and the probe head 330 passes through the second through hole 210 and extends out of the second test board 200. In this way, when the probe head can be connected to the fitting portion 310 through the first through hole 110, a fitting connection is formed between the probe and the test piece 300.

[0030] Furthermore, on the basis of the above embodiment, as Figure 2As shown, the fitting part 310 includes a continuous convex part 311 and a concave part 312 formed integrally. The convex part 311 and the concave part 312 are respectively used to fit with the diamond protrusions of the probe head to form a fitting fixation, so as to change the connection between the probe and the test piece 300 to a mechanical connection, and thus it is no longer necessary to use conductive glue between the two.

[0031] Furthermore, on the basis of the above-mentioned embodiment, in combination with Figure 3 and Figure 5 As shown, a concave part 120 is provided on the top of the first test board 100. When the first test board 100 and the second test board 200 are covered with each other, a cavity will be formed between the concave part 120 of the first test and the bottom of the second test board 200. The cavity can be used to limit the moving distance of the test piece 300, and the first through hole 110 is provided on the concave part 120.

[0032] Furthermore, on the basis of the above-mentioned embodiment, in combination with Figure 2 and Figure 5 As shown, a limiting ring 321 protrudes outward on the outer wall of the connecting pipe 320. The inner diameters of the first through hole 110 and the second through hole 210 are both smaller than the inner diameter of the limiting ring 321. When the test piece 300 is arranged in the first through hole 110, the limiting ring 321 will be stuck at the top of the first through hole 110, so as to form a bearing of the test piece 300 in the first through hole 110. At the same time, when the test piece 300 is connected to the probe, since the probe will push the test piece 300 upward, the connecting pipe 320 and the probe head 330 will be driven to move upward as a whole. Since the inner diameter of the limiting ring 321 is larger than the inner diameter of the second through hole 210, the moving distance of the limiting ring 321 will be limited between the concave part 120 of the first test board 100 and the bottom of the second test board 200, so as to limit the moving distance of the connecting pipe 320.

[0033] Furthermore, on the basis of the above-mentioned embodiment, in combination with Figure 3 and Figure 4 As shown, a plurality of first grooves 130 are provided around the concave part 120, and first positioning members 140 are arranged in the first grooves 130. A third through hole 220 corresponding to the position of the first positioning member 140 is provided on the second test board 200. When the first test board 100 and the second test board 200 are covered with each other, the first positioning member 140 is inserted into the third through hole 220 to position the installation positions between the first test board 100 and the second test board 200.

[0034] Furthermore, on the basis of the above-mentioned embodiment, in combination with Figure 3 and Figure 4As shown, a fourth through-hole 141 is provided on the first positioning member 140, a fifth through-hole 150 corresponding to the position of the fourth through-hole 141 is provided on the side surface of the first test board 100, a second positioning member 160 is provided on the first test board 100, and the second positioning member 160 sequentially passes through the fifth through-hole 150 and the fourth through-hole 141 to fix the first positioning member 140 in the first groove 130. This can make the connection between the first positioning member 140 and the first groove 130 more stable, thereby making the installation and positioning between the first test board 100 and the second test board 200 more accurate.

[0035] Furthermore, on the basis of the above-mentioned embodiment, in combination with Figure 3 and Figure 4 As shown, a second groove 170 is provided in the concave portion 120, the second groove 170 communicates with the first groove 130, and the second positioning member 160 is disposed in the second groove 170 after sequentially passing through the fifth through-hole 150 and the fourth through-hole 141.

[0036] Details of the above exemplary embodiments, and the present invention can be implemented in other specific forms without departing from the spirit or basic characteristics of the present invention. Therefore, in any regard, the embodiments should be regarded as exemplary and non-limiting. The scope of the present invention is defined by the appended claims rather than the above description. Therefore, all changes falling within the meaning and scope of the equivalent elements of the claims are intended to be embraced within the present invention.

Claims

1. A probe test fixture, characterized in that: The invention comprises a first test board (100) and a second test board (200) which are covered with each other, a plurality of first through holes (110) are arranged on the first test board (100), the first through holes (110) are arranged at a preset distance interval, a test piece (300) is arranged in the first through hole (110), the test piece (300) is carried by the first test board (100) in the first through hole (110), a plurality of second through holes (210) are arranged on the second test board (200), the second through holes (210) are arranged at a preset distance interval, the positions of the first through holes (110) correspond to the positions of the second through holes (210), the test piece (300) passes through the second through holes (210), and an interlocking portion (310) which can be interlocked and fixed with a probe is arranged on the test piece (300).

2. The probe test fixture according to claim 1, characterized in that: The test piece (300) comprises a connecting tube (320) and a probe (330); the top of the connecting tube (320) is hollow; the probe (330) is arranged in the top of the connecting tube (320); the fitting portion (310) is arranged at the bottom of the connecting tube (320); when the test piece (300) is supported by the first test plate (100) in the first through hole (110), the fitting portion (310) is arranged in the first through hole (110), and the probe (330) passes through the second through hole (210) and extends out of the second test plate (200).

3. The probe test fixture according to claim 2, characterized in that: The engaging portion (310) comprises a continuous convex portion (311) and a concave portion (312) formed in one piece.

4. The probe test fixture according to claim 2, characterized in that: An inner recess (120) is arranged on the top of the first test plate (100), and the first through hole (110) is arranged on the inner recess (120).

5. The probe test fixture according to claim 4, characterized in that: A limiting ring (321) protrudes outward from the outer wall of the connecting pipe (320), and the inner diameters of the first through hole (110) and the second through hole (210) are both smaller than the inner diameter of the limiting ring (321).

6. The probe test fixture according to claim 4, characterized in that: A plurality of first grooves (130) are arranged around the inner recess (120), a first positioning member (140) is arranged in the first groove (130), and a third through hole (220) corresponding to the position of the first positioning member (140) is arranged on the second test plate (200).

7. The probe test fixture according to claim 6, characterized in that: A fourth through hole (141) is provided on the first positioning member (140), a fifth through hole (150) corresponding to the position of the fourth through hole (141) is provided on the side of the first test board (100), and a second positioning member (160) is provided on the first test board (100), and the second positioning member (160) passes through the fifth through hole (150) and the fourth through hole (141) in sequence to fix the first positioning member (140) in the first groove (130).

8. The probe test fixture according to claim 7, characterized in that: A second groove (170) is arranged in the inner recess (120), the second groove (170) is communicated with the first groove (130), and the second positioning member (160) is arranged in the second groove (170) after passing through the fifth through hole (150) and the fourth through hole (141) in sequence.

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