Test system

Abstract

The embodiment of the utility model relates to the technical field of electronics, and provides a test system which can accurately test noise signals so as to greatly improve the noise detection effect. The test system comprises a connecting device, a switch device, a detection device and a control device, the connecting device is used for acquiring a noise signal of a to-be-detected area; the switch device is used for forming a plurality of detection channels between the connecting device and the detection device; the first end of the switch device is electrically connected with the detection device; the control end of the switch device and the detection device are electrically connected with the control device. The detection device is used for detecting the power of the noise signal of the to-be-detected area acquired by each connecting piece; the control device is used for controlling the opening and closing states of the multiple detection channels of the switch device so that the multiple connecting pieces can be connected with the detection device through the different detection channels. And according to the plurality of noise signal powers detected by the detection device and the plurality of corresponding position information, a field intensity distribution diagram of the noise signals of the to-be-detected area is generated.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of electronic technologies, and particularly to a test system. Background Art

[0002] Currently, terminal devices with fixed spectra are increasingly widely used. Such devices have higher and higher requirements for the noise around radio frequency devices. Therefore, during the debugging of radio frequencies, it is necessary to detect the noise around radio frequency devices, so as to formulate targeted noise protection plans. Currently, radiation test equipment is mostly used to scan and test the terminal under test, but it is impossible to accurately scan the area where devices are densely distributed, thus affecting the noise detection effect and being unfavorable for the noise protection of devices. Utility Model Content

[0003] The embodiments of the present application provide a test system, which can accurately test noise signals, thus greatly improving the noise detection effect and being favorable for the noise protection of devices.

[0004] According to some embodiments of the present application, on the one hand, the embodiments of the present application provide a test system for testing the field strength of a region to be measured, and the test system includes: a connection device, a switching device, a detection device, and a control device;

[0005] The connection device includes a plurality of connection members arranged in an array; the first end of the switching device is electrically connected to the detection device; the control end of the switching device and the detection device are respectively electrically connected to the control device; one end of the connection member is correspondingly electrically connected to the second end of the switching device, and the other end of the connection member is used to contact the region to be measured;

[0006] The connection device is used to acquire the noise signal of the region to be measured;

[0007] The switching device is used to form a plurality of detection channels between the connection device and the detection device;

[0008] The detection device is used to detect the power of the noise signal of the region to be measured acquired by each connection member;

[0009] The control device is used to: control the opening and closing states of the plurality of detection channels of the switching device, so that the plurality of connection members are connected to the detection device through different detection channels; generate a field strength distribution map of the noise signal of the region to be measured according to the power of the plurality of noise signals detected by the detection device and the corresponding plurality of position information.

[0010] According to some embodiments of the present application, the switching device includes a single-pole multi-throw radio frequency switch.

[0011] According to some embodiments of the present application, the switching device includes N sets of switch groups connected in series, where N is a positive integer and N≥2; wherein, the first end of the first set of switch groups is electrically connected to the detection device, and the second end of the first set of switch groups is electrically connected to the first end of the second set of switch groups correspondingly;

[0012] In the case of N = 2, the second end of the second set of switch groups is electrically connected to a plurality of the connecting members correspondingly one by one;

[0013] In the case of N>2, the first end of the Mth set of switch groups is electrically connected to the second end of the (M - 1)th set of switch groups correspondingly, and the second end of the Mth set of switch groups is electrically connected to the first end of the (M + 1)th set of switch groups correspondingly; M is a positive integer and N>M≥2; the second end of the Nth set of switch groups is electrically connected to a plurality of the connecting members correspondingly one by one.

[0014] According to some embodiments of the present application, the connecting device further includes a fixing plate, and the fixing plate is provided with a plurality of through holes arranged in an array, and a plurality of the connecting members pass through the corresponding through holes.

[0015] According to some embodiments of the present application, the connecting member is fixedly connected to the fixing plate, and the connecting member includes a moving part, a spring and a fixing part connected in sequence. The moving part is used to contact the area to be measured, and the fixing part is electrically connected to the second end of the switching device correspondingly;

[0016] The moving part is used to compress the spring when a force is applied; the spring is in a free state when not compressed by the moving part, and is converted from the free state to a compressed state when compressed by the moving part.

[0017] According to some embodiments of the present application, the connecting member further includes a first insulating layer, a shielding layer and a second insulating layer that successively surround the moving part, the spring and the fixing part.

[0018] According to some embodiments of the present application, both the moving part and the fixing part are conductive wires, the spring is a conductive spring; the shielding layer is a conductive shielding layer.

[0019] According to some embodiments of the present application, the connecting member is movably connected to the fixing plate.

[0020] According to some embodiments of the present application, the connecting member is used to acquire noise signals in the microwave frequency band.

[0021] According to some embodiments of the present application, the detection device includes a spectrum analyzer, and the control device is further used to adjust the setting parameters of the detection device.

[0022] An embodiment of the present application provides a test system. In this test system, through the mutual cooperation of a connection device, a switch device, a detection device, and a control device, multiple connectors arranged in an array are used to scan and test a region to be measured, thereby greatly improving the test accuracy of noise signals and further significantly enhancing the noise detection effect. In addition, this test system can generate a two-dimensional field strength distribution map of the region to be measured, which is very beneficial for noise protection of devices. Description of the Drawings

[0023] One or more embodiments are exemplarily illustrated by pictures in the corresponding drawings. These exemplary illustrations do not constitute limitations on the embodiments. Unless otherwise stated specifically, the figures in the drawings do not constitute a proportional limitation. To more clearly illustrate the technical solutions in the embodiments of the present application or in the prior art, the following will briefly introduce the drawings required to be used in the embodiments. Obviously, the following-described drawings are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0024] Figure 1 It is a schematic structural diagram of a test system provided by an embodiment of the present application;

[0025] Figure 2 It is a schematic structural diagram of another test system provided by an embodiment of the present application;

[0026] Figure 3 It is a schematic structural diagram of a fixing plate provided by an embodiment of the present application;

[0027] Figure 4 Among them, Figure a is a schematic structural diagram of a connector, and Figure b is a schematic structural diagram of the spring in Figure a after being compressed;

[0028] Figure 5 It is a cross-sectional view of a connector provided by an embodiment of the present application. Detailed Embodiments

[0029] To make the objectives, technical solutions, and advantages of the present application clearer, the following will clearly and completely describe the technical solutions of the present application in conjunction with the specific embodiments of the present application and the corresponding drawings. Obviously, the described embodiments are only some embodiments of the present application, rather than all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present application.

[0030] In the description of the embodiments of the present application, the meaning of "at least one" is one or more, and the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0031] In the description of the embodiments of the present application, technical terms such as "first" and "second" are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity, specific order or primary-secondary relationship of the indicated technical features.

[0032] As used herein, the mention of "embodiment" means that a specific feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the present application. The phrase appears in various places in the specification and does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those skilled in the art will explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments.

[0033] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installation", "connection", "connection", "fixation", etc. should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can also be a mechanical connection or an electrical connection; it can be directly connected, or indirectly connected through an intermediate medium, and can be the communication inside two components or the interaction relationship between two components. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to specific circumstances.

[0034] The embodiments of the present application provide a test system, as shown in Figure 1 for testing the field strength of the area 1 to be tested. The test system includes: a connection device 2, a switch device 3, a detection device 4, and a control device 5. The switch device includes a control end, a first end, and a plurality of second ends. The connection device 2 includes a plurality of connection members 21 arranged in an array.

[0035] As shown in Figure 1 , the connection device 2 is used to obtain the noise signal of the area 1 to be tested. One end of the connection member 21 is electrically connected to the second end of the switch device 3 in correspondence, and the other end of the connection member 21 is used to contact the area 1 to be tested.

[0036] As shown in Figure 1 , the switch device 3 is used to form a plurality of detection channels between the connection device 2 and the detection device 4; the first end of the switch device 3 is electrically connected to the detection device 4; the control end of the switch device 3 and the detection device 4 are respectively electrically connected to the control device 5.

[0037] As shown in Figure 1 , the detection device 4 is used to detect the power of the noise signal of the area 1 to be tested obtained by each connection member 21.

[0038] As shown in Figure 1As shown, the control device 5 is configured to: control the opening and closing states of multiple detection channels of the switching device 3, so that multiple connectors 21 are connected to the detection device 4 through different detection channels; generate a field strength distribution map of the noise signals in the area to be measured according to the multiple noise signal powers and the corresponding multiple position information detected by the detection device 4.

[0039] The area to be measured is not specifically limited. By way of example, the area to be measured may be the peripheral area of an IC (Integrated Circuit), or it may also be the PA (Power Amplifier) area, Transmitter area or LNA (Low Noise Amplifier) area on a PCB (Printed Circuit Board), etc. Of course, it may also be any other area where noise needs to be detected, which will not be listed one by one here.

[0040] The specific structures of the above-mentioned connectors, switching device and detection device are not limited, as long as the corresponding requirements are met. The type of the switching device is not limited. By way of example, it may be a radio frequency switching device.

[0041] The above control device is used to control the opening and closing states of multiple detection channels of the switching device. Here, the opening and closing states include the open state and the closed state. If a detection channel is in the open state, the connector corresponding to this detection channel cannot be connected to the detection device; if a detection channel is in the closed state, the connector corresponding to this detection channel can be connected to the detection device.

[0042] The above control device is also used to determine the multiple position information corresponding to the multiple noise signal powers, and the specific determination method is not limited. By way of example, if the switching device is provided with A detection channels (A is a positive integer), correspondingly, the connecting device includes A connectors. The control device controls the A detection channels to be closed in sequence, so that the detection device obtains the noise signals on the A connectors in sequence, and then determines the powers of the noise signals on the A connectors. Therefore, each noise signal power corresponds to a detection channel, and the detection channels and the connectors are in one-to-one correspondence. Therefore, the position information of the connectors corresponding to the powers of the respective noise signals can be determined through the detection channels. The control device can generate a two-dimensional array including power and detection channels, and the field strength distribution map of the noise signals can be conveniently obtained according to this two-dimensional array.

[0043] The above control device can be a device such as a computer, which may include an MCU (Microcontroller Unit) chip, an FPGA (Field Programmable Gate Array) chip, or an ARM (Advanced RISC Machines) chip. Of course, it may also include other types of chips.

[0044] The above test system may further include, as Figure 1 shown, a power supply device 6, which is electrically connected to the switching device 3 to supply power to the switching device 3.

[0045] The embodiment of the present application provides a test system. In this test system, through the mutual cooperation of the connection device, the switching device, the detection device, and the control device, a plurality of connectors arranged in an array are used to perform a scanning test on the area to be measured, thereby greatly improving the test accuracy of the noise signal, and further greatly enhancing the noise detection effect. In addition, the test system can generate a two-dimensional field strength distribution map of the area to be measured, which is very beneficial for the noise protection of devices.

[0046] The following provides a structure of a switching device.

[0047] In one or more embodiments, as Figure 1 shown, the switching device 3 includes a single-pole multi-throw radio frequency switch. The first end of the single-pole multi-throw radio frequency switch is electrically connected to the detection device 4, and the plurality of second ends of the single-pole multi-throw radio frequency switch are electrically connected to the plurality of connectors 21 one by one. The control end of the single-pole multi-throw radio frequency switch is electrically connected to the control device 5. Here, the specific number of throws of the single-pole multi-throw radio frequency switch can be determined according to the number of connectors. For example, if the connection device includes connectors arranged in an 8*8 array, the single-pole multi-throw radio frequency switch can be a single-pole 64-throw radio frequency switch. Figure 1 In the figure, a single-pole 12-throw radio frequency switch is taken as an example for illustration. The structure of this switching device is simple and is suitable for the case where the area of the area to be measured is small.

[0048] The following provides another structure of a switching device.

[0049] In one or more embodiments, the switching device includes N stages of switch groups connected in series, where N is a positive integer and N≥2. Among them, the first end of the first-stage switch group is electrically connected to the detection device, and the second end of the first-stage switch group is electrically connected to the first end of the second-stage switch group correspondingly. The first switch group may include a single-pole multi-throw radio frequency switch.

[0050] In the case of N = 2, referring to Figure 2As shown, the second end of the second - stage switch group is electrically connected to each of the multiple connectors one - to - one; the switch device 3 includes switch groups arranged in series in 2 stages. The second - stage switch group may include at least one single - pole multi - throw radio - frequency switch.

[0051] When N > 2, the first end of the M - th stage switch group is electrically connected to the second end of the (M - 1) - th stage switch group correspondingly, and the second end of the M - th stage switch group is electrically connected to the first end of the (M + 1) - th stage switch group correspondingly; M is a positive integer and N > M ≥ 2; the second end of the N - th stage switch group is electrically connected to each of the multiple connectors one - to - one. The switch device includes switch groups arranged in series in 3 stages or more than 3 stages. The M - th stage switch group may include at least one single - pole multi - throw radio - frequency switch.

[0052] For example, if the switch device includes switch groups arranged in series in 3 stages, that is, N = 3, the first end of the first - stage switch group is electrically connected to the detection device, and the second end of the first - stage switch group is electrically connected to the first end of the second - stage switch group correspondingly; the first end of the second - stage switch group is electrically connected to the second end of the first - stage switch group correspondingly, and the second end of the second - stage switch group is electrically connected to the first end of the third - stage switch group correspondingly; the second end of the third - stage switch group is electrically connected to each of the multiple connectors one - to - one.

[0053] It should be noted that if the first switch group includes one single - pole multi - throw radio - frequency switch and the other - stage switch groups include at least one single - pole multi - throw radio - frequency switch, the control end of each single - pole multi - throw radio - frequency switch needs to be electrically connected to the control device. If the test system further includes a power supply device, the power supply end of each single - pole multi - throw radio - frequency switch needs to be electrically connected to the power supply device.

[0054] The above - mentioned switch device can form a relatively large number of detection channels and is suitable for the case where the area of the area to be measured is relatively large.

[0055] The structure of the connection device will be described below.

[0056] In one or more embodiments, in order to fix the multiple connectors for the convenience of testing, as shown in Figure 3 the connection device further includes a fixing plate 22. The fixing plate 22 is provided with a plurality of through - holes 221 arranged in an array, and the multiple connectors pass through the corresponding through - holes.

[0057] The fixing method of the above - mentioned multiple connectors and the fixing plate is not limited. For example, the two can be fixedly connected or movably connected.

[0058] If the devices arranged in the area to be measured are different, there will be undulating situations. Then, when the connection device is placed in the area to be measured, problems such as poor contact are likely to occur, thus affecting the test. To solve this problem, in one or more embodiments, the connectors are fixedly connected to the fixing plate, as shown in Figure 4As shown in Figure a, the connecting member includes a moving part 211, a spring 212, and a fixing part 213 that are connected in sequence. The moving part 211 is used to contact the area to be measured, and the fixing part 213 is electrically connected to the second end of the switching device correspondingly.

[0059] The moving part is used to compress the spring when an external force is applied; refer to Figure 4 As shown in Figure a, the spring 212 is in a free state when not compressed by the moving part; refer to Figure 4 As shown in Figure b, it changes from the free state to a compressed state when compressed by the moving part 211.

[0060] The free state of the above-mentioned spring refers to the state where the spring is neither stretched nor compressed when not subjected to an external force.

[0061] The above-mentioned connecting member can be called a spring pin connector. When the connecting device is placed in the area to be measured, the uneven surface will cause the moving part to compress the spring upward, and the spring changes from the free state to the compressed state. At this time, refer to Figure 4 As shown, the overall length of the connecting member becomes shorter by h, and the maximum degree of spring contraction can be set according to the maximum height difference of the devices in the area to be measured.

[0062] In one or more embodiments, in order to further improve the signal transmission quality of the connecting member and further improve the test accuracy, refer to Figure 5 As shown, the connecting member further includes a first insulating layer 214, a shielding layer 215, and a second insulating layer 216 that successively surround the moving part, the spring, and the fixing part 213.

[0063] In one or more embodiments, for ease of manufacture, both the moving part and the fixing part are made of a conductive material, which can be a metal such as copper, gold, or silver; both the moving part and the fixing part can be conductive wires, the spring is a conductive spring; the shielding layer is a conductive shielding layer, and the conductive shielding layer can be a metal shielding layer.

[0064] Next, a structure of the connecting device is provided.

[0065] In order to solve the problem that the unevenness in the area to be measured causes poor contact of the connecting device, which in turn affects the test effect, in one or more embodiments, the connecting member is movably connected to the fixing plate; since the connecting member is movably connected to the fixing plate, when the connecting device is placed in the area to be measured, the uneven surface will cause the connecting member to move upward, thereby ensuring that all connecting members are in good contact with the area to be measured. The connecting member can be a thimble structure, and the thimble structure can include a metal wire, and a third insulating layer, a shielding layer, and a fourth insulating layer that successively surround the metal wire.

[0066] There is no limit to the band of the noise signal that the above-mentioned connector can obtain. At present, microwave band devices are widely used. In one or more embodiments, the connector is used to obtain a noise signal in the microwave band.

[0067] In one or more embodiments, for the convenience of testing, the detection device includes a spectrum analyzer or a power meter; for the convenience of controlling the detection device, the above control device is further used to adjust the setting parameters of the detection device, thereby replacing the manual adjustment of the setting parameters of the detection device, and the operation is more flexible.

[0068] Those of ordinary skill in the art can understand that the above embodiments are specific embodiments for implementing the present application. In actual applications, various changes can be made to its form and details without departing from the spirit and scope of the present application. Any person skilled in the art can make various changes and modifications without departing from the spirit and scope of the present application. Therefore, the protection scope of the present application should be subject to the scope defined by the claims.

Claims

1. A testing system, characterized in that: Used to test the field strength of the area to be tested, the test system includes: a connecting device, a switching device, a detection device and a control device; The connecting device comprises a plurality of connecting members arranged in an array; a first end of the switch device is electrically connected to the detection device; a control end of the switch device and the detection device are electrically connected to the control device respectively; one end of the connecting member is electrically connected to a second end of the switch device, and the other end of the connecting member is used to contact the area to be detected; The connecting device is used to obtain the noise signal of the area to be measured; The switch device is used to form a plurality of detection channels between the connecting device and the detection device; The detection device is used to detect the power of the noise signal of the area to be tested obtained by each of the connecting members; The control device is used to: control the opening and closing states of the multiple detection channels of the switch device so that the multiple connecting parts are connected to the detection device through different detection channels; and generate a field strength distribution diagram of the noise signal of the area to be tested based on the multiple noise signal powers detected by the detection device and the corresponding multiple position information.

2. The test system according to claim 1, characterized in that: The switch device includes a single-pole multi-throw radio frequency switch.

3. The test system according to claim 1, characterized in that: The switch device comprises N stages of switch groups arranged in series, N is a positive integer and N≥2; wherein a first end of a first stage switch group is electrically connected to the detection device, and a second end of the first stage switch group is electrically connected to a first end of a second stage switch group correspondingly; In the case of N=2, the second end of the second-stage switch group is electrically connected to the plurality of connecting members in a one-to-one correspondence; When N>2, the first end of the Mth level switch group is electrically connected to the second end of the M-1th level switch group, and the second end of the Mth level switch group is electrically connected to the first end of the M+1th level switch group; M is a positive integer and N>M≥2; the second end of the Nth level switch group is electrically connected to the multiple connecting members one by one.

4. The test system according to claim 1, characterized in that: The connecting device further comprises a fixing plate, the fixing plate is provided with a plurality of through holes arranged in an array, and a plurality of the connecting members pass through the corresponding through holes.

5. The test system according to claim 4, characterized in that: The connecting member is fixedly connected to the fixing plate, the connecting member comprises a moving part, a spring and a fixing part connected in sequence, the moving part is used to contact the area to be tested, and the fixing part is electrically connected to the second end of the switch device accordingly; The moving part is used to compress the spring when subjected to external force; the spring is used to be in a free state when not being compressed by the moving part, and to be converted from the free state to a contracted state when being compressed by the moving part.

6. The test system according to claim 5, characterized in that: The connecting member further includes a first insulating layer, a shielding layer and a second insulating layer which sequentially surround the moving part, the spring and the fixed part.

7. The test system according to claim 6, characterized in that: The moving part and the fixed part are both conductive wires, the spring is a conductive spring, and the shielding layer is a conductive shielding layer.

8. The test system according to claim 4, characterized in that: The connecting member is movably connected to the fixing plate.

9. The test system according to claim 1, characterized in that: The connecting piece is used to obtain noise signals in the microwave frequency band.

10. The test system according to claim 1, characterized in that: The detection device includes a spectrum analyzer or a power meter, and the control device is also used to adjust the setting parameters of the detection device.

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